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DE60130146D1 - Esd-schutzeinrichtungen - Google Patents

Esd-schutzeinrichtungen

Info

Publication number
DE60130146D1
DE60130146D1 DE60130146T DE60130146T DE60130146D1 DE 60130146 D1 DE60130146 D1 DE 60130146D1 DE 60130146 T DE60130146 T DE 60130146T DE 60130146 T DE60130146 T DE 60130146T DE 60130146 D1 DE60130146 D1 DE 60130146D1
Authority
DE
Germany
Prior art keywords
terminals
switching element
esd protection
pair
protecting
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE60130146T
Other languages
English (en)
Other versions
DE60130146T2 (de
Inventor
Roy A Colclaser
James R Spehar
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
NXP BV
Original Assignee
NXP BV
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by NXP BV filed Critical NXP BV
Publication of DE60130146D1 publication Critical patent/DE60130146D1/de
Application granted granted Critical
Publication of DE60130146T2 publication Critical patent/DE60130146T2/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D89/00—Aspects of integrated devices not covered by groups H10D84/00 - H10D88/00
    • H10D89/60—Integrated devices comprising arrangements for electrical or thermal protection, e.g. protection circuits against electrostatic discharge [ESD]
    • H10D89/601—Integrated devices comprising arrangements for electrical or thermal protection, e.g. protection circuits against electrostatic discharge [ESD] for devices having insulated gate electrodes, e.g. for IGFETs or IGBTs
    • H10D89/811—Integrated devices comprising arrangements for electrical or thermal protection, e.g. protection circuits against electrostatic discharge [ESD] for devices having insulated gate electrodes, e.g. for IGFETs or IGBTs using FETs as protective elements
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03K—PULSE TECHNIQUE
    • H03K17/00—Electronic switching or gating, i.e. not by contact-making and –breaking
    • H03K17/08—Modifications for protecting switching circuit against overcurrent or overvoltage
    • H03K17/081—Modifications for protecting switching circuit against overcurrent or overvoltage without feedback from the output circuit to the control circuit
    • H03K17/0812—Modifications for protecting switching circuit against overcurrent or overvoltage without feedback from the output circuit to the control circuit by measures taken in the control circuit
    • H03K17/08126—Modifications for protecting switching circuit against overcurrent or overvoltage without feedback from the output circuit to the control circuit by measures taken in the control circuit in bipolar transitor switches
    • H—ELECTRICITY
    • H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
    • H10D89/00—Aspects of integrated devices not covered by groups H10D84/00 - H10D88/00
    • H10D89/60—Integrated devices comprising arrangements for electrical or thermal protection, e.g. protection circuits against electrostatic discharge [ESD]
    • H10D89/601—Integrated devices comprising arrangements for electrical or thermal protection, e.g. protection circuits against electrostatic discharge [ESD] for devices having insulated gate electrodes, e.g. for IGFETs or IGBTs
    • H10D89/911—Integrated devices comprising arrangements for electrical or thermal protection, e.g. protection circuits against electrostatic discharge [ESD] for devices having insulated gate electrodes, e.g. for IGFETs or IGBTs using passive elements as protective elements

Landscapes

  • Semiconductor Integrated Circuits (AREA)
  • Metal-Oxide And Bipolar Metal-Oxide Semiconductor Integrated Circuits (AREA)
  • Amplifiers (AREA)
  • Control Of Eletrric Generators (AREA)
  • Emergency Protection Circuit Devices (AREA)
DE60130146T 2000-12-07 2001-11-23 Esd-schutzeinrichtungen Expired - Lifetime DE60130146T2 (de)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US09/733,518 US6507471B2 (en) 2000-12-07 2000-12-07 ESD protection devices
US733518 2000-12-07
PCT/EP2001/013744 WO2002047166A2 (en) 2000-12-07 2001-11-23 Esd protection devices

Publications (2)

Publication Number Publication Date
DE60130146D1 true DE60130146D1 (de) 2007-10-04
DE60130146T2 DE60130146T2 (de) 2008-05-21

Family

ID=24947952

Family Applications (1)

Application Number Title Priority Date Filing Date
DE60130146T Expired - Lifetime DE60130146T2 (de) 2000-12-07 2001-11-23 Esd-schutzeinrichtungen

Country Status (6)

Country Link
US (1) US6507471B2 (de)
EP (1) EP1356524B1 (de)
JP (1) JP2004515923A (de)
AT (1) ATE371268T1 (de)
DE (1) DE60130146T2 (de)
WO (1) WO2002047166A2 (de)

Families Citing this family (36)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US6650165B1 (en) * 2002-05-02 2003-11-18 Micrel, Incorporated Localized electrostatic discharge protection for integrated circuit input/output pads
US6861711B2 (en) * 2003-01-03 2005-03-01 Micrel, Incorporated Thick gate oxide transistor and electrostatic discharge protection utilizing thick gate oxide transistors
US6888710B2 (en) * 2003-01-03 2005-05-03 Micrel, Incorporated Insulated gate bipolar transistor and electrostatic discharge cell protection utilizing insulated gate bipolar transistors
US6864537B1 (en) 2003-01-03 2005-03-08 Micrel, Incorporated Thick gate oxide transistor and electrostatic discharge protection utilizing thick gate oxide transistors
US6882224B1 (en) * 2003-04-03 2005-04-19 Xilinx, Inc. Self-biasing for common gate amplifier
US7616414B2 (en) * 2003-04-25 2009-11-10 Broadcom Corporation ESD protection circuit for high speed signaling including T/R switches
US6970337B2 (en) * 2003-06-24 2005-11-29 Linear X Systems Inc. High-voltage low-distortion input protection current limiter
US7167331B1 (en) 2003-10-23 2007-01-23 Marvell International Ltd. Electrostatic discharge protection circuit for magneto-resistive read elements
US7286328B1 (en) 2003-10-23 2007-10-23 Marvell International Ltd. Electrostatic discharge protection circuit for preamps connected to magneto-resistive read elements
DE102004004789B3 (de) * 2004-01-30 2005-03-03 Infineon Technologies Ag ESD-Schutzschaltkreis für eine elektronische Schaltung mit mehreren Versorgungsspannungen
US20050254158A1 (en) * 2004-05-13 2005-11-17 Kuehne Stephen C ESD protection for differential mode magnetic transducer
JP3874776B2 (ja) * 2004-10-15 2007-01-31 ローム株式会社 演算増幅器
DE102004052868B4 (de) * 2004-11-02 2007-02-08 Infineon Technologies Ag Integrierte Schaltkreis-Anordnung und Schaltkreis-Array
US8144441B2 (en) * 2006-08-30 2012-03-27 Triquint Semiconductor, Inc. Electrostatic discharge protection circuit for compound semiconductor devices and circuits
US7974053B2 (en) * 2008-05-29 2011-07-05 Amazing Microelectronic Corp ESD protection circuit for differential I/O pair
US7826188B2 (en) * 2008-06-17 2010-11-02 International Business Machines Corporation Methods, design structures, and systems for current mode logic (CML) differential driver ESD protection circuitry
US8823417B2 (en) * 2008-07-09 2014-09-02 Siemens Industry, Inc. Combination AC/DC peak detector and signal type discriminator
US7880195B2 (en) * 2008-12-08 2011-02-01 United Microelectronics Corp. Electrostatic discharge protection device and related circuit
US20110089902A1 (en) * 2009-10-21 2011-04-21 K2 Energy Solutions, Inc. Circuitry for balancing charging of series connected battery cells
US8417196B2 (en) 2010-06-07 2013-04-09 Skyworks Solutions, Inc. Apparatus and method for directional coupling
US8656761B2 (en) * 2011-05-27 2014-02-25 General Electric Company Systems and methods for use in providing a sensor signal independent of ground
CN102957136B (zh) * 2011-08-19 2015-01-14 登丰微电子股份有限公司 具有冲击电流保护的负载驱动电路
US9373955B2 (en) 2012-01-09 2016-06-21 Skyworks Solutions, Inc. Devices and methods related to electrostatic discharge-protected CMOS switches
CN104145391B (zh) 2012-02-15 2017-08-08 高通股份有限公司 用于差分输入/输出接口的电涌保护
US9762052B2 (en) * 2013-03-15 2017-09-12 Taiwan Semiconductor Manufacturing Company, Ltd. Circuit and method of electrically decoupling nodes
US9929698B2 (en) * 2013-03-15 2018-03-27 Qualcomm Incorporated Radio frequency integrated circuit (RFIC) charged-device model (CDM) protection
US10026729B2 (en) * 2014-03-12 2018-07-17 Mediatek Inc. Surge-protection circuit and surge-protection method
US9882377B2 (en) 2015-01-28 2018-01-30 International Business Machines Corporation Electrostatic discharge protection solutions
TWI591795B (zh) 2016-05-09 2017-07-11 瑞昱半導體股份有限公司 靜電放電保護電路
CN107369672A (zh) * 2016-05-12 2017-11-21 瑞昱半导体股份有限公司 静电放电保护电路
TWI627809B (zh) * 2017-01-25 2018-06-21 瑞昱半導體股份有限公司 靜電放電防護電路
US10547312B2 (en) * 2017-03-15 2020-01-28 Silicon Laboratories Inc. Wide voltage range input interface
TWI654733B (zh) * 2018-06-04 2019-03-21 茂達電子股份有限公司 靜電放電保護電路
CN110198028B (zh) * 2019-05-13 2021-08-24 深圳市华星光电半导体显示技术有限公司 静电防护电路
US11664741B2 (en) * 2019-07-25 2023-05-30 Susan Rhodes System and method for AC power control
US11398468B2 (en) * 2019-12-12 2022-07-26 Micron Technology, Inc. Apparatus with voltage protection mechanism

Family Cites Families (9)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3879640A (en) * 1974-02-11 1975-04-22 Rca Corp Protective diode network for MOS devices
US4044313A (en) * 1976-12-01 1977-08-23 Rca Corporation Protective network for an insulated-gate field-effect (IGFET) differential amplifier
US4206418A (en) * 1978-07-03 1980-06-03 Rca Corporation Circuit for limiting voltage differential in differential amplifiers
JPS55154809A (en) * 1979-05-23 1980-12-02 Toshiba Corp Input protecting circuit of operational amplifier
US4940907A (en) * 1989-01-19 1990-07-10 Ford Motor Company Precision CMOS comparator with hysteresis
KR930702811A (ko) * 1990-10-12 1993-09-09 죤 에버레트 벤슨 회로 보호 장치 및 유니트
US5311083A (en) 1993-01-25 1994-05-10 Standard Microsystems Corporation Very low voltage inter-chip CMOS logic signaling for large numbers of high-speed output lines each associated with large capacitive loads
US5574618A (en) * 1994-02-17 1996-11-12 Harris Corporation ESD protection using SCR clamping
US5862031A (en) * 1997-11-26 1999-01-19 Analog Devices, Inc. ESD protection circuit for integrated circuits having a bipolar differential input

Also Published As

Publication number Publication date
ATE371268T1 (de) 2007-09-15
US20020071230A1 (en) 2002-06-13
WO2002047166A3 (en) 2003-08-07
EP1356524A2 (de) 2003-10-29
DE60130146T2 (de) 2008-05-21
EP1356524B1 (de) 2007-08-22
US6507471B2 (en) 2003-01-14
WO2002047166A2 (en) 2002-06-13
JP2004515923A (ja) 2004-05-27

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Legal Events

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8364 No opposition during term of opposition