DE60100114D1 - Filter zur Einspeisung von datenabhängigem Jitter und Pegelgeräusch - Google Patents
Filter zur Einspeisung von datenabhängigem Jitter und PegelgeräuschInfo
- Publication number
- DE60100114D1 DE60100114D1 DE60100114T DE60100114T DE60100114D1 DE 60100114 D1 DE60100114 D1 DE 60100114D1 DE 60100114 T DE60100114 T DE 60100114T DE 60100114 T DE60100114 T DE 60100114T DE 60100114 D1 DE60100114 D1 DE 60100114D1
- Authority
- DE
- Germany
- Prior art keywords
- filters
- level noise
- feeding data
- dependent jitter
- jitter
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
- 230000001419 dependent effect Effects 0.000 title 1
Classifications
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04L—TRANSMISSION OF DIGITAL INFORMATION, e.g. TELEGRAPHIC COMMUNICATION
- H04L1/00—Arrangements for detecting or preventing errors in the information received
- H04L1/20—Arrangements for detecting or preventing errors in the information received using signal quality detector
- H04L1/205—Arrangements for detecting or preventing errors in the information received using signal quality detector jitter monitoring
Landscapes
- Engineering & Computer Science (AREA)
- Quality & Reliability (AREA)
- Computer Networks & Wireless Communication (AREA)
- Signal Processing (AREA)
- Dc Digital Transmission (AREA)
- Maintenance And Management Of Digital Transmission (AREA)
- Filters And Equalizers (AREA)
- Manipulation Of Pulses (AREA)
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| EP01108337A EP1162739B1 (de) | 2001-04-03 | 2001-04-03 | Filter zur Einspeisung von datenabhängigem Jitter und Pegelgeräusch |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| DE60100114D1 true DE60100114D1 (de) | 2003-04-10 |
| DE60100114T2 DE60100114T2 (de) | 2003-10-02 |
Family
ID=8177025
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| DE60100114T Expired - Lifetime DE60100114T2 (de) | 2001-04-03 | 2001-04-03 | Filter zur Einspeisung von datenabhängigem Jitter und Pegelgeräusch |
Country Status (4)
| Country | Link |
|---|---|
| US (1) | US6961745B2 (de) |
| EP (1) | EP1162739B1 (de) |
| JP (1) | JP4208046B2 (de) |
| DE (1) | DE60100114T2 (de) |
Families Citing this family (22)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US7184469B2 (en) | 2003-02-06 | 2007-02-27 | Verigy Pte. Ltd. | Systems and methods for injection of test jitter in data bit-streams |
| EP1508813B1 (de) * | 2003-08-20 | 2007-01-31 | Agilent Technologies, Inc. | Spektrale Jitter-Analyse mit Jitter-Modulation-Wellenform-Analyse |
| US7203460B2 (en) * | 2003-10-10 | 2007-04-10 | Texas Instruments Incorporated | Automated test of receiver sensitivity and receiver jitter tolerance of an integrated circuit |
| US7136773B2 (en) * | 2003-12-16 | 2006-11-14 | Advantest Corporation | Testing apparatus and testing method |
| JP2005233933A (ja) * | 2004-01-19 | 2005-09-02 | Nec Electronics Corp | 組合せ試験方法及び試験装置 |
| JP2006025114A (ja) * | 2004-07-07 | 2006-01-26 | Kawasaki Microelectronics Kk | 通信装置 |
| US7239969B2 (en) | 2004-11-09 | 2007-07-03 | Guide Technology, Inc. | System and method of generating test signals with injected data-dependent jitter (DDJ) |
| WO2006063361A2 (en) | 2004-12-08 | 2006-06-15 | Guide Technology | Periodic jitter (pj) measurement methodology |
| JP4811902B2 (ja) * | 2004-12-24 | 2011-11-09 | ルネサスエレクトロニクス株式会社 | 半導体装置および半導体装置のテスト方法 |
| US7313496B2 (en) * | 2005-02-11 | 2007-12-25 | Advantest Corporation | Test apparatus and test method for testing a device under test |
| US8327204B2 (en) * | 2005-10-27 | 2012-12-04 | Dft Microsystems, Inc. | High-speed transceiver tester incorporating jitter injection |
| US20070121711A1 (en) * | 2005-11-30 | 2007-05-31 | Offord Glen E | PLL with programmable jitter for loopback serdes testing and the like |
| US7681091B2 (en) * | 2006-07-14 | 2010-03-16 | Dft Microsystems, Inc. | Signal integrity measurement systems and methods using a predominantly digital time-base generator |
| US7813297B2 (en) * | 2006-07-14 | 2010-10-12 | Dft Microsystems, Inc. | High-speed signal testing system having oscilloscope functionality |
| US7849374B1 (en) * | 2006-10-11 | 2010-12-07 | Ltx Corporation | Testing a transceiver |
| EP2115940A2 (de) * | 2007-02-09 | 2009-11-11 | DFT Microsystems, Inc. | System und verfahren zur testung der physischen schicht serieller hochgeschwindigkeitsverbindungen in deren einsatzumgebungen |
| US8255188B2 (en) * | 2007-11-07 | 2012-08-28 | Guidetech, Inc. | Fast low frequency jitter rejection methodology |
| US20090158100A1 (en) * | 2007-12-13 | 2009-06-18 | Advantest Corporation | Jitter applying circuit and test apparatus |
| US7843771B2 (en) * | 2007-12-14 | 2010-11-30 | Guide Technology, Inc. | High resolution time interpolator |
| US7917319B2 (en) * | 2008-02-06 | 2011-03-29 | Dft Microsystems Inc. | Systems and methods for testing and diagnosing delay faults and for parametric testing in digital circuits |
| JP5210840B2 (ja) * | 2008-12-10 | 2013-06-12 | 株式会社アドバンテスト | ジッタ印加装置および試験装置 |
| JP5716604B2 (ja) | 2011-08-08 | 2015-05-13 | 富士通株式会社 | 回路シミュレータプログラム,装置およびアイパターン生成方法 |
Family Cites Families (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| GB2146205B (en) * | 1983-09-03 | 1987-06-24 | Marconi Instruments Ltd | Jitter circuits assessing jitter performance |
| US5121342A (en) * | 1989-08-28 | 1992-06-09 | Network Communications Corporation | Apparatus for analyzing communication networks |
| DE69031201T2 (de) * | 1989-09-29 | 1998-02-19 | Toshiba Kawasaki Kk | Phasensynchrone Regeleinrichtung zur Herstellung eines Referenztaktsignals in einem Plattenantriebssystem |
| US5309428A (en) * | 1993-01-11 | 1994-05-03 | John Fluke Mfg. Co., Inc. | Token ring local area network testing apparatus for phase jitter testing |
| US5751766A (en) * | 1995-04-27 | 1998-05-12 | Applied Signal Technology, Inc. | Non-invasive digital communications test system |
| US6076175A (en) * | 1997-03-31 | 2000-06-13 | Sun Microsystems, Inc. | Controlled phase noise generation method for enhanced testability of clock and data generator and recovery circuits |
-
2001
- 2001-04-03 EP EP01108337A patent/EP1162739B1/de not_active Expired - Lifetime
- 2001-04-03 DE DE60100114T patent/DE60100114T2/de not_active Expired - Lifetime
- 2001-10-11 US US09/975,431 patent/US6961745B2/en not_active Expired - Lifetime
-
2002
- 2002-04-03 JP JP2002101844A patent/JP4208046B2/ja not_active Expired - Lifetime
Also Published As
| Publication number | Publication date |
|---|---|
| EP1162739A1 (de) | 2001-12-12 |
| JP4208046B2 (ja) | 2009-01-14 |
| US6961745B2 (en) | 2005-11-01 |
| DE60100114T2 (de) | 2003-10-02 |
| JP2002368827A (ja) | 2002-12-20 |
| EP1162739B1 (de) | 2003-03-05 |
| US20020174159A1 (en) | 2002-11-21 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| 8364 | No opposition during term of opposition | ||
| 8327 | Change in the person/name/address of the patent owner |
Owner name: VERIGY (SINGAPORE) PTE. LTD., SINGAPORE, SG |
|
| R082 | Change of representative |
Ref document number: 1162739 Country of ref document: EP Representative=s name: SCHOPPE, ZIMMERMANN, STOECKELER, ZINKLER & PARTNER |