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DE60100007D1 - Verfahren zur Analyse eines Programms zum Testen elektronischer Bauteile - Google Patents

Verfahren zur Analyse eines Programms zum Testen elektronischer Bauteile

Info

Publication number
DE60100007D1
DE60100007D1 DE60100007T DE60100007T DE60100007D1 DE 60100007 D1 DE60100007 D1 DE 60100007D1 DE 60100007 T DE60100007 T DE 60100007T DE 60100007 T DE60100007 T DE 60100007T DE 60100007 D1 DE60100007 D1 DE 60100007D1
Authority
DE
Germany
Prior art keywords
program
electronic components
analyzing
testing
software tool
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Fee Related
Application number
DE60100007T
Other languages
English (en)
Other versions
DE60100007T2 (de
Inventor
M Philippe Lejeune
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
BEALACH NO BO FINNE TEO TA GAL
Original Assignee
BEALACH NO BO FINNE TEO TA GAL
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by BEALACH NO BO FINNE TEO TA GAL filed Critical BEALACH NO BO FINNE TEO TA GAL
Application granted granted Critical
Publication of DE60100007D1 publication Critical patent/DE60100007D1/de
Publication of DE60100007T2 publication Critical patent/DE60100007T2/de
Anticipated expiration legal-status Critical
Expired - Fee Related legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/008—Reliability or availability analysis
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F2201/00—Indexing scheme relating to error detection, to error correction, and to monitoring
    • G06F2201/88—Monitoring involving counting

Landscapes

  • Engineering & Computer Science (AREA)
  • Quality & Reliability (AREA)
  • Theoretical Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Debugging And Monitoring (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)
  • Investigating, Analyzing Materials By Fluorescence Or Luminescence (AREA)
  • Stored Programmes (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Test And Diagnosis Of Digital Computers (AREA)
DE60100007T 2000-03-14 2001-03-14 Verfahren zum Analysieren einer Test-Software Expired - Fee Related DE60100007T2 (de)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
FR0003267A FR2806495A1 (fr) 2000-03-14 2000-03-14 Procede d'analyse d'un logiciel de test

Publications (2)

Publication Number Publication Date
DE60100007D1 true DE60100007D1 (de) 2002-08-22
DE60100007T2 DE60100007T2 (de) 2003-02-20

Family

ID=8848078

Family Applications (1)

Application Number Title Priority Date Filing Date
DE60100007T Expired - Fee Related DE60100007T2 (de) 2000-03-14 2001-03-14 Verfahren zum Analysieren einer Test-Software

Country Status (9)

Country Link
US (1) US20010052116A1 (de)
EP (1) EP1134661B1 (de)
JP (1) JP2001326265A (de)
CN (1) CN1316715A (de)
AT (1) ATE220809T1 (de)
CA (1) CA2340981A1 (de)
DE (1) DE60100007T2 (de)
FR (1) FR2806495A1 (de)
SG (1) SG91342A1 (de)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US20050071516A1 (en) * 2003-09-30 2005-03-31 International Business Machines Corporation Method and apparatus to autonomically profile applications
US20060129892A1 (en) * 2004-11-30 2006-06-15 Microsoft Corporation Scenario based stress testing
US20080222501A1 (en) * 2007-03-06 2008-09-11 Microsoft Corporation Analyzing Test Case Failures
EP2670030B1 (de) 2011-01-28 2019-03-13 Nippon Steel & Sumitomo Metal Corporation Herstellungsverfahren für den spiralförmigen kern einer elektrischen drehmaschine sowie vorrichtung zur herstellung des spiralförmigen kerns einer elektrischen drehmaschine

Family Cites Families (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3763474A (en) * 1971-12-09 1973-10-02 Bell Telephone Labor Inc Program activated computer diagnostic system
US5355320A (en) * 1992-03-06 1994-10-11 Vlsi Technology, Inc. System for controlling an integrated product process for semiconductor wafers and packages
US5655074A (en) * 1995-07-06 1997-08-05 Bell Communications Research, Inc. Method and system for conducting statistical quality analysis of a complex system
US5724260A (en) * 1995-09-06 1998-03-03 Micron Electronics, Inc. Circuit for monitoring the usage of components within a computer system
DE19739380A1 (de) * 1997-09-09 1999-03-11 Abb Research Ltd Verfahren zum Test eines Leitsystems

Also Published As

Publication number Publication date
US20010052116A1 (en) 2001-12-13
ATE220809T1 (de) 2002-08-15
JP2001326265A (ja) 2001-11-22
EP1134661A1 (de) 2001-09-19
CN1316715A (zh) 2001-10-10
DE60100007T2 (de) 2003-02-20
SG91342A1 (en) 2002-09-17
FR2806495A1 (fr) 2001-09-21
CA2340981A1 (en) 2001-09-14
EP1134661B1 (de) 2002-07-17

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Legal Events

Date Code Title Description
8364 No opposition during term of opposition
8339 Ceased/non-payment of the annual fee