DE60034623D1 - Röntgenbilddetektorsystem - Google Patents
RöntgenbilddetektorsystemInfo
- Publication number
- DE60034623D1 DE60034623D1 DE60034623T DE60034623T DE60034623D1 DE 60034623 D1 DE60034623 D1 DE 60034623D1 DE 60034623 T DE60034623 T DE 60034623T DE 60034623 T DE60034623 T DE 60034623T DE 60034623 D1 DE60034623 D1 DE 60034623D1
- Authority
- DE
- Germany
- Prior art keywords
- ray image
- image detector
- detector system
- ray
- image
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Lifetime
Links
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
- H10F39/10—Integrated devices
- H10F39/12—Image sensors
- H10F39/18—Complementary metal-oxide-semiconductor [CMOS] image sensors; Photodiode array image sensors
- H10F39/189—X-ray, gamma-ray or corpuscular radiation imagers
- H10F39/1898—Indirect radiation image sensors, e.g. using luminescent members
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10F—INORGANIC SEMICONDUCTOR DEVICES SENSITIVE TO INFRARED RADIATION, LIGHT, ELECTROMAGNETIC RADIATION OF SHORTER WAVELENGTH OR CORPUSCULAR RADIATION
- H10F39/00—Integrated devices, or assemblies of multiple devices, comprising at least one element covered by group H10F30/00, e.g. radiation detectors comprising photodiode arrays
- H10F39/10—Integrated devices
- H10F39/12—Image sensors
- H10F39/18—Complementary metal-oxide-semiconductor [CMOS] image sensors; Photodiode array image sensors
- H10F39/189—X-ray, gamma-ray or corpuscular radiation imagers
- H10F39/1892—Direct radiation image sensors
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP8308899 | 1999-03-26 | ||
| JP08308899A JP3838806B2 (ja) | 1999-03-26 | 1999-03-26 | 信号増倍x線撮像装置 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| DE60034623D1 true DE60034623D1 (de) | 2007-06-14 |
| DE60034623T2 DE60034623T2 (de) | 2007-12-27 |
Family
ID=13792440
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| DE60034623T Expired - Lifetime DE60034623T2 (de) | 1999-03-26 | 2000-03-24 | Röntgenbilddetektorsystem |
Country Status (4)
| Country | Link |
|---|---|
| US (1) | US6403965B1 (de) |
| EP (1) | EP1043777B1 (de) |
| JP (1) | JP3838806B2 (de) |
| DE (1) | DE60034623T2 (de) |
Families Citing this family (29)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2001313384A (ja) * | 2000-04-28 | 2001-11-09 | Shimadzu Corp | 放射線検出器 |
| KR100763137B1 (ko) * | 2000-12-29 | 2007-10-02 | 엘지.필립스 엘시디 주식회사 | 엑스-선 검출소자 및 그의 제조방법 |
| KR100683526B1 (ko) * | 2000-12-29 | 2007-02-15 | 엘지.필립스 엘시디 주식회사 | 엑스-선 검출소자 및 그의 제조방법 |
| US6737653B2 (en) * | 2001-03-12 | 2004-05-18 | Lg. Philips Lcd Co., Ltd. | X-ray detector and method of fabricating therefore |
| JP2003050280A (ja) * | 2001-08-03 | 2003-02-21 | Konica Corp | 放射線画像検出器 |
| CN1316634C (zh) * | 2001-10-03 | 2007-05-16 | 株式会社东芝 | X光平面检测器 |
| FI20021255L (fi) * | 2002-06-27 | 2003-12-28 | Metorex Internat Oy | Suoraan konversioon perustuva kuvaava röntgendetektori |
| JP4153783B2 (ja) * | 2002-12-09 | 2008-09-24 | 株式会社東芝 | X線平面検出器 |
| JP4323827B2 (ja) * | 2003-02-14 | 2009-09-02 | キヤノン株式会社 | 固体撮像装置及び放射線撮像装置 |
| US20040246355A1 (en) * | 2003-06-06 | 2004-12-09 | Ji Ung Lee | Storage capacitor array for a solid state radiation imager |
| US6950493B2 (en) * | 2003-06-25 | 2005-09-27 | Besson Guy M | Dynamic multi-spectral CT imaging |
| JP4269859B2 (ja) * | 2003-09-10 | 2009-05-27 | 株式会社島津製作所 | 放射線検出器 |
| US20050056829A1 (en) * | 2003-09-17 | 2005-03-17 | Green Michael C. | Reducing dark current of photoconductor using heterojunction that maintains high x-ray sensitivity |
| US7126128B2 (en) * | 2004-02-13 | 2006-10-24 | Kabushiki Kaisha Toshiba | Flat panel x-ray detector |
| GB0517741D0 (en) * | 2005-08-31 | 2005-10-12 | E2V Tech Uk Ltd | Image sensor |
| US7524711B2 (en) * | 2005-10-20 | 2009-04-28 | Hannstar Display Corp. | Method of manufacturing an image TFT array for an indirect X-ray sensor and structure thereof |
| KR101218089B1 (ko) * | 2007-12-07 | 2013-01-18 | 엘지디스플레이 주식회사 | 디지털 엑스레이 디텍터 및 그 제조방법 |
| JP2010011158A (ja) * | 2008-06-27 | 2010-01-14 | Fujifilm Corp | 検出素子 |
| JP2010034343A (ja) * | 2008-07-30 | 2010-02-12 | Sumitomo Chemical Co Ltd | 半導体装置の製造方法および半導体装置 |
| JP5744861B2 (ja) | 2009-06-17 | 2015-07-08 | ザ、リージェンツ、オブ、ザ、ユニバーシティー、オブ、ミシガン | フラットパネルx線イメージャ内のフォトダイオード及び他のセンサ構造、並びに薄膜電子工学を利用したフラットパネルx線イメージャ内のフォトダイオード及び他のセンサ構造のトポロジー均一性の改善方法 |
| US8878137B2 (en) * | 2011-10-13 | 2014-11-04 | Varian Medical Systems, Inc. | Photo detector of an X-ray imager |
| JP2014225527A (ja) * | 2013-05-15 | 2014-12-04 | キヤノン株式会社 | 検出装置、及び、検出システム |
| JP2015061041A (ja) * | 2013-09-20 | 2015-03-30 | 株式会社東芝 | 放射線検出器および放射線検出装置 |
| JP6443667B2 (ja) * | 2014-05-23 | 2018-12-26 | パナソニックIpマネジメント株式会社 | 撮像装置 |
| JP6260787B2 (ja) | 2014-05-23 | 2018-01-17 | パナソニックIpマネジメント株式会社 | 撮像装置 |
| CN106653789A (zh) * | 2017-01-04 | 2017-05-10 | 京东方科技集团股份有限公司 | X射线探测器及其制造方法 |
| EP3422413A1 (de) * | 2017-06-26 | 2019-01-02 | Nederlandse Organisatie voor toegepast- natuurwetenschappelijk onderzoek TNO | Photodetektoranordnung und verfahren zur herstellung davon sowie bildgebungsvorrichtung mit der photodetektoranordnung |
| CN114902081A (zh) * | 2020-02-26 | 2022-08-12 | 深圳帧观德芯科技有限公司 | 辐射检测器 |
| KR20230124908A (ko) * | 2021-01-06 | 2023-08-28 | 소니 세미컨덕터 솔루션즈 가부시키가이샤 | 수광 소자 및 측거 시스템 |
Family Cites Families (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5164809A (en) * | 1989-04-21 | 1992-11-17 | The Regents Of The University Of Calif. | Amorphous silicon radiation detectors |
| US5192634A (en) * | 1990-02-07 | 1993-03-09 | Dai Nippon Printing Co., Ltd. | A-selenium-tellurium photosensitive member and electrostatic information recording method |
| US5198673A (en) | 1992-01-23 | 1993-03-30 | General Electric Company | Radiation image detector with optical gain selenium photosensors |
| DE4227096A1 (de) * | 1992-08-17 | 1994-02-24 | Philips Patentverwaltung | Röntgenbilddetektor |
| EP0778983B1 (de) * | 1994-07-27 | 2000-05-31 | 1294339 Ontario, Inc. | Bildwandlersystem |
-
1999
- 1999-03-26 JP JP08308899A patent/JP3838806B2/ja not_active Expired - Fee Related
-
2000
- 2000-03-23 US US09/533,934 patent/US6403965B1/en not_active Expired - Lifetime
- 2000-03-24 EP EP00105969A patent/EP1043777B1/de not_active Expired - Lifetime
- 2000-03-24 DE DE60034623T patent/DE60034623T2/de not_active Expired - Lifetime
Also Published As
| Publication number | Publication date |
|---|---|
| US6403965B1 (en) | 2002-06-11 |
| EP1043777A3 (de) | 2003-12-17 |
| JP3838806B2 (ja) | 2006-10-25 |
| EP1043777B1 (de) | 2007-05-02 |
| JP2000275348A (ja) | 2000-10-06 |
| DE60034623T2 (de) | 2007-12-27 |
| EP1043777A2 (de) | 2000-10-11 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| 8364 | No opposition during term of opposition |