DE1931604C - Circuit arrangement for an electronic inspection circuit in telecommunications switching systems - Google Patents

Description

I 931 604 J.

1 2

The invention concerns a circuit arrangement dependent on the test condition in part 0

for an electronic test circuit for the generation of arranged transistor bridged and thus ineffective

iiiul evaluation of voltage jumps depending on and rushed in the checked state

t-igkeit uini Aufprüfzusland in Fernmeldevermitt- further in part U provided transistor the first

auxiliary systems. 5 transistor is blocked, whereby the second Zener

In switching technology, the diode is generally used.

The demand for the neglecting state of the L.eit- The mode of operation of the [Ir (UuIuHg is to be checked in the following and precautions to be taken, which are explained in more detail on the basis of the drawings.
so double occupancy can be avoided. Home viewing made by a request

llieil'iir or for similar purposes are already ^anl0 for a free channel via terminal / CJ. goes out

iiitlniiiiL'Lii became known. So contains the Verprüf- is shown in FIG

circuit L-iiur circuit arrangement (German interpretation terminals K L and K 2 negative potential to the as

writing 1 146 127) a relay C and a parallel AND gate acting diodes D 1 and Dl placed,

Circuit from a Rclaisnachbildung DR and one that blocks these two diodes. This means that the

MeLiselialtimi !, which in turn contains relays, where- ^l 5 resistance R I Miiitispoteiitial effective that over

the need to test the transistor T L via relay condenser II 2.

clocks is switched on to the Viclfach circuit. For this transistor 71 is now the test

Seven voltage sources are required for operation. core - c-core - positive potential supplied. Located

Also in other known arrangements (German now at the other end of the test wire via part B,

Auslegeschriftcn i 165 677; I 170 476; 1165 677 and ³⁰ the test clamp K 4 (Fig. 2), Miiius potential on,

1 165 676) the switching times are generated by electrical

ineehanischen relay bridged and for the operation stands - in part Λ on the working resistance R 7 and

several sources of voltage are required. in part B at the working resistance R 16 a gap

In a further arrangement (German design drop, known as the base-emitter voltage

writing I 005 567) a simultaneous checking ^a5 transistor TΛ or the transistor T7 is sonicated.

vcihindered by generation of fault current. Eye- At the same time, the requirement works with plus-pot-

aiiL.i no-h introduces a circuit arrangement tinl via the terminal K i to the arrangement.

(German Auslegesehrifi I 0 ° 5 889), which with clcktro- The durchgesclmltete transistor Ti switches over

iiiechani-jlieii relays, selectors and .Schaltverzöge- the diode D 12 and the resistor RS the Tranrorn works. A circuit; lordering (German ³⁰ sistorT2, which with the plus potential of K 3

Auslegeschrift 1 187 276) works with selectors and transistor T4 oilTnet via resistor R 6,

Relay, whereby a transistor circuit to select the in turn via the diode D II and the Widcr-

serves the voltage offered. For the operation stand Λ 5 keeps the transistor Γ2 open. That’s a

four to seven voltages are required. Self-holding switched that lasts as long as that

The known arrangements include, for ^GRO-35 Plus potential across the Anforcierungsklemme Ki an-1.Vn part ZusatzschaUungen to the actual up-stands, thus the part Λ of FIG. 1 is independently prüf circle for bridging relay switching times of the state of Prüfader. At the same time the transistor T4 and the diode D lfli is and the resulting creeping Spaniiungs- the counter transitions from one state to ilen other and the allocator to this position, is stopped and the associated risk of simultaneous ⁴ ° through the diode D 13 and the resistor R Il the double occupancy. In addition, transistors TS are diirchchtct for the most part, which are used via the resistor relays, which increase the timing «13 (the latter to limit the current). Potential to the Viclfach circuit at point P of the

The discovery presents the task that is required.

To accelerate such test processes significantly, In part B (Fig. 2) the following happens at the same time: (1. i.e. to create an electronic test circuit, As already mentioned, basically no relay or similar switching R 16 for the Transistor Γ7 which is used for switching through, which is controlled by an electronic counter required base emitter voltage and switches lcr, but which can also be manually applied to this transistor for test purposes via the resistor II 15, The transistor T7 provides the criterion for evaluating the occupancy in two parts (A and 0). A subsequent circuit is divided and in one part by a transistor circuit, not shown, provides a circuit depending on the status "occupied" has been created via terminal K 5 positive potential request. ₃₅ tial and opened via the resistance changes to R 19 and R 18

According to the invention, the object is the transistor 78, which in turn has negative potential in the

solved by that the electronic Aufprüfkreis puts point D to the test wire. So are over the

an electronic counter is controlled that terminal K 4 and the following switching means during

The test circuit consists of two parts, the switching processes of which are still occurring during the test.

Through-connection exclusively through semiconductor building blocks and the occupancy time is only from

elements, so by one arranged in part Λ depending on the requirement.

Holding circuit with three transistors takes place and that in addition the diirchgeschaltcte transistor blocks

Zener diodes are the same in both circles - in the first T 7 via the resistor R 14 the bridging

Circle a Z-diode and in the second circle a white transistor T6 for the Z-diode D 19, which are arranged as a result of the other Z-diode, the sum of which becomes effective.

voltage> the operating voltage, and that as a result of the circuitry mentioned in part Λ

Continuous state - i.e. when the line is unoccupied - the last transistor TS and the first Zener diode effective on part B are effective and the second Zener diode through Zener diode D 19 is created on the multiple circuit (in

Claims (3)

I 931 point P) a voltage jump. In your now switched circuit, the resistance Il 13 in part A determines the current and thus the level of the voltage at point / '. This voltage UhiLS is so high that it does not overcome the reference voltage clcv Zener diode D 16 'in a part / 1' arranged in parallel. A further inspection is therefore impossible. Since this also applies to the first tested part A, self-healing is required for the transistors 7'2 and TΛ. ['atciitunsprüche: 1. Circuit arrangement for an electronic Aufprüfkreis for generating and evaluating Spaniumgsspräid as a function of Aufprüfstaid in Fernmeldevcnniltluiigslinlugcn, characterized in that the electronic AufprüfUreis is controlled by an electronic counter that the Aufprüfkreis consists of two parts (/ 1 and ß) whose ao Switching through exclusively through semiconductor components, for example through a holding circuit with three transistors (T2; T 4 and 751, which is disordered in part A ) and the same Zener diodes in the two circles (/ 1 and U) - in the first circuit [A) ^ 5 a Zener diode (D 16) and in the second circle (/?) a Zener diode (/) I ¹ )) - are arranged, animals Siuiiinenspnnung Ξ> the Uetriebsspanuung, and that in the idle state - ie with inanimate line - the The first Zener diode (L) In) is effective and the second Zener diode (D I ¹ J) is bridged by a transistor (T6), which is dependent on the test condition and is located in the part, and is thus switched ineffective and in the tested state If the state is blocked by another liansiitor (7'7) provided in part U , the transistor (Γ6) is blocked, whereby the second zener diode (/.) 10) comes into effect. -. Circuit arrangement for an electronic test circuit according to Claim I, characterized in that the in part. ·! Arranged holding circuit depending on the requirement and switches at the same time with '''-m checking process and which stops the counter after finding a free channel and applies potential to the multiple circuit at point P and the coupling point'.; see through. 3. Circuit arrangement for an electronic Aufprüfkreis according to claim L and 2, characterized characterized in that the control of the arrangement instead of via the counter and the Transistor (Tl) also specifically via a test switch can be carried out manually. In addition 1 Hlatt drawings