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DE10392706B8 - Schnelle Kombinations-Mehrfachmodus-Ionisierungsquelle für Massenspektrometer - Google Patents

Schnelle Kombinations-Mehrfachmodus-Ionisierungsquelle für Massenspektrometer Download PDF

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Publication number
DE10392706B8
DE10392706B8 DE10392706.9T DE10392706T DE10392706B8 DE 10392706 B8 DE10392706 B8 DE 10392706B8 DE 10392706 T DE10392706 T DE 10392706T DE 10392706 B8 DE10392706 B8 DE 10392706B8
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DE
Germany
Prior art keywords
ionization source
mass spectrometers
combination multi
fast combination
mode ionization
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Expired - Lifetime
Application number
DE10392706.9T
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English (en)
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DE10392706B4 (de
DE10392706T5 (de
Inventor
Michael Balogh
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Waters Technologies Corp
Original Assignee
Waters Technologies Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
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First worldwide family litigation filed litigation Critical https://patents.darts-ip.com/?family=29712170&utm_source=google_patent&utm_medium=platform_link&utm_campaign=public_patent_search&patent=DE10392706(B8) "Global patent litigation dataset” by Darts-ip is licensed under a Creative Commons Attribution 4.0 International License.
Application filed by Waters Technologies Corp filed Critical Waters Technologies Corp
Publication of DE10392706T5 publication Critical patent/DE10392706T5/de
Application granted granted Critical
Publication of DE10392706B4 publication Critical patent/DE10392706B4/de
Publication of DE10392706B8 publication Critical patent/DE10392706B8/de
Anticipated expiration legal-status Critical
Expired - Lifetime legal-status Critical Current

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Classifications

    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00Particle spectrometers or separator tubes
    • H01J49/02Details
    • H01J49/10Ion sources; Ion guns
    • H01J49/16Ion sources; Ion guns using surface ionisation, e.g. field-, thermionic- or photo-emission
    • H01J49/168Ion sources; Ion guns using surface ionisation, e.g. field-, thermionic- or photo-emission field ionisation, e.g. corona discharge
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N27/00Investigating or analysing materials by the use of electric, electrochemical, or magnetic means
    • G01N27/26Investigating or analysing materials by the use of electric, electrochemical, or magnetic means by investigating electrochemical variables; by using electrolysis or electrophoresis
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00Particle spectrometers or separator tubes
    • H01J49/02Details
    • H01J49/10Ion sources; Ion guns
    • H01J49/14Ion sources; Ion guns using particle bombardment, e.g. ionisation chambers
    • H01J49/145Ion sources; Ion guns using particle bombardment, e.g. ionisation chambers using chemical ionisation
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00Particle spectrometers or separator tubes
    • H01J49/02Details
    • H01J49/10Ion sources; Ion guns
    • H01J49/16Ion sources; Ion guns using surface ionisation, e.g. field-, thermionic- or photo-emission
    • H01J49/161Ion sources; Ion guns using surface ionisation, e.g. field-, thermionic- or photo-emission using photoionisation, e.g. by laser
    • HELECTRICITY
    • H01ELECTRIC ELEMENTS
    • H01JELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J49/00Particle spectrometers or separator tubes
    • H01J49/02Details
    • H01J49/10Ion sources; Ion guns
    • H01J49/16Ion sources; Ion guns using surface ionisation, e.g. field-, thermionic- or photo-emission
    • H01J49/165Electrospray ionisation

Landscapes

  • Physics & Mathematics (AREA)
  • Chemical & Material Sciences (AREA)
  • Engineering & Computer Science (AREA)
  • Plasma & Fusion (AREA)
  • Analytical Chemistry (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Health & Medical Sciences (AREA)
  • Molecular Biology (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Electrochemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Optics & Photonics (AREA)
  • Electron Tubes For Measurement (AREA)
  • Other Investigation Or Analysis Of Materials By Electrical Means (AREA)
DE10392706.9T 2002-05-31 2003-05-30 Schnelle Kombinations-Mehrfachmodus-Ionisierungsquelle für Massenspektrometer Expired - Lifetime DE10392706B8 (de)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US38541902P 2002-05-31 2002-05-31
US60/385,419 2002-05-31
PCT/US2003/016892 WO2003102537A2 (en) 2002-05-31 2003-05-30 A high speed combination multi-mode ionization source for mass spectrometers

Publications (3)

Publication Number Publication Date
DE10392706T5 DE10392706T5 (de) 2005-06-09
DE10392706B4 DE10392706B4 (de) 2016-09-29
DE10392706B8 true DE10392706B8 (de) 2017-02-16

Family

ID=29712170

Family Applications (1)

Application Number Title Priority Date Filing Date
DE10392706.9T Expired - Lifetime DE10392706B8 (de) 2002-05-31 2003-05-30 Schnelle Kombinations-Mehrfachmodus-Ionisierungsquelle für Massenspektrometer

Country Status (6)

Country Link
US (4) US20070164209A1 (de)
JP (1) JP5073168B2 (de)
AU (1) AU2003247434A1 (de)
DE (1) DE10392706B8 (de)
GB (2) GB2425399B (de)
WO (1) WO2003102537A2 (de)

Families Citing this family (41)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
GB2425399B (en) * 2002-05-31 2007-03-14 Waters Investments Ltd A high speed combination multi-mode ionization source for mass spectrometers
US7078681B2 (en) 2002-09-18 2006-07-18 Agilent Technologies, Inc. Multimode ionization source
US7091483B2 (en) 2002-09-18 2006-08-15 Agilent Technologies, Inc. Apparatus and method for sensor control and feedback
US6646257B1 (en) * 2002-09-18 2003-11-11 Agilent Technologies, Inc. Multimode ionization source
WO2004034011A2 (en) * 2002-10-10 2004-04-22 Universita' Degli Studi Di Milano Ionization source for mass spectrometry analysis
WO2005059942A2 (en) 2003-12-12 2005-06-30 Semequip, Inc. Method and apparatus for extending equipment uptime in ion implantation
DE102004002729B4 (de) 2004-01-20 2008-11-27 Bruker Daltonik Gmbh Ionisierung desorbierter Analytmoleküle bei Atmosphärendruck
US20060038122A1 (en) * 2004-08-19 2006-02-23 Linden H B Ion source with adjustable ion source pressure combining ESI-, FI-, FD-, LIFDI- and MALDI-elements as well as hybrid intermediates between ionization techniques for mass spectrometry and/or electron paramagnetic resonance spectrometry
US7034291B1 (en) * 2004-10-22 2006-04-25 Agilent Technologies, Inc. Multimode ionization mode separator
US20060255261A1 (en) 2005-04-04 2006-11-16 Craig Whitehouse Atmospheric pressure ion source for mass spectrometry
US7812308B2 (en) 2005-09-16 2010-10-12 Shimadzu Corporation Mass spectrometer
JP2008209293A (ja) * 2007-02-27 2008-09-11 Hitachi High-Tech Science Systems Corp 液体クロマトグラフ質量分析計
WO2009039382A1 (en) 2007-09-21 2009-03-26 Semequip. Inc. Method for extending equipment uptime in ion implantation
US8294091B2 (en) * 2008-05-07 2012-10-23 Waters Technologies Corporation Methods and apparatus for performing gas and liquid mass spectrometry
WO2010093943A1 (en) * 2009-02-12 2010-08-19 Ibis Biosciences, Inc. Ionization probe assemblies
CA2771467A1 (en) * 2009-08-19 2011-02-24 Mcgill University Methods and systems for the quantitative chemical speciation of heavy metals and other toxic pollutants
US20130161502A1 (en) * 2010-05-12 2013-06-27 Schlumberger Technology Corporation Method for analysis of the chemical composition of the heavy fraction of petroleum
US8759757B2 (en) 2010-10-29 2014-06-24 Thermo Finnigan Llc Interchangeable ion source for electrospray and atmospheric pressure chemical ionization
TWI488216B (zh) * 2013-04-18 2015-06-11 Univ Nat Sun Yat Sen 多游離源的質譜游離裝置及質譜分析系統
WO2015029449A1 (ja) * 2013-08-30 2015-03-05 アトナープ株式会社 分析装置
US10236171B2 (en) * 2013-09-20 2019-03-19 Micromass Uk Limited Miniature ion source of fixed geometry
CN104882351B (zh) * 2015-05-23 2017-01-11 浙江大学 基于常压等离子体的多模式离子源工作装置及应用
CN108074793B (zh) * 2016-11-17 2019-11-12 中国科学院大连化学物理研究所 一种多组分样品分析的多模式质谱电离源
US10823714B2 (en) 2016-12-29 2020-11-03 Thermo Finnigan Llc Simplified source control interface
JP6824062B2 (ja) * 2017-02-14 2021-02-03 日本電子株式会社 イオン化法選択支援装置及び方法
WO2018183677A1 (en) * 2017-03-29 2018-10-04 Perkinelmer Health Sciences, Inc. Cooling devices and instruments including them
US11049711B2 (en) 2017-06-03 2021-06-29 Shimadzu Corporation Ion source for mass spectrometer
CA3089347C (en) * 2018-01-23 2023-06-27 Perkinelmer Health Sciences, Inc. Triple quadrupole mass spectrometers configured to detect mrm transitions of pesticide residues
GB2576077B (en) 2018-05-31 2021-12-01 Micromass Ltd Mass spectrometer
GB201808890D0 (en) 2018-05-31 2018-07-18 Micromass Ltd Bench-top time of flight mass spectrometer
GB201808892D0 (en) 2018-05-31 2018-07-18 Micromass Ltd Mass spectrometer
WO2019229463A1 (en) 2018-05-31 2019-12-05 Micromass Uk Limited Mass spectrometer having fragmentation region
GB201808932D0 (en) 2018-05-31 2018-07-18 Micromass Ltd Bench-top time of flight mass spectrometer
GB201808936D0 (en) 2018-05-31 2018-07-18 Micromass Ltd Bench-top time of flight mass spectrometer
GB201808894D0 (en) 2018-05-31 2018-07-18 Micromass Ltd Mass spectrometer
GB201808949D0 (en) 2018-05-31 2018-07-18 Micromass Ltd Bench-top time of flight mass spectrometer
GB201808893D0 (en) 2018-05-31 2018-07-18 Micromass Ltd Bench-top time of flight mass spectrometer
GB201808912D0 (en) 2018-05-31 2018-07-18 Micromass Ltd Bench-top time of flight mass spectrometer
US11488816B2 (en) * 2018-09-11 2022-11-01 Lg Energy Solution, Ltd. Interface unit
CN109950127A (zh) * 2019-04-12 2019-06-28 江苏汭博医疗科技有限公司 一种电喷雾离子源辅助增强装置
SG10202104695RA (en) * 2020-05-05 2021-12-30 Micromass Ltd An atmospheric pressure ionisation source

Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3901369A1 (de) * 1988-01-18 1989-07-27 Matsushita Electric Works Ltd Verfahren zur herstellung einer doppelt diffundierten metall-oxid-halbleiter-feldeffekt-transistorvorrichtung sowie durch dieses verfahren hergestellte vorrichtung
JPH08236064A (ja) * 1995-02-28 1996-09-13 Shimadzu Corp 液体クロマトグラフ質量分析装置
WO1999013492A1 (en) * 1997-09-12 1999-03-18 Analytica Of Branford, Inc. Multiple sample introduction mass spectrometry
WO2001033605A2 (en) * 1999-10-29 2001-05-10 Rijksuniversiteit Groningen Atmospheric pressure photoionization (appi): a new ionization method for liquid chromatography-mass spectrometry
US20020019056A1 (en) * 2000-04-17 2002-02-14 Bori Shushan Method of analyzing dicarboxylic acids

Family Cites Families (48)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS5291494A (en) * 1976-01-28 1977-08-01 Hitachi Ltd Mass spectrometer
US4377745A (en) * 1978-12-01 1983-03-22 Cherng Chang Mass spectrometer for chemical ionization, electron impact ionization and mass spectrometry/mass spectrometry operation
US4531056A (en) 1983-04-20 1985-07-23 Yale University Method and apparatus for the mass spectrometric analysis of solutions
JPH07118295B2 (ja) 1985-10-30 1995-12-18 株式会社日立製作所 質量分析計
US4861988A (en) * 1987-09-30 1989-08-29 Cornell Research Foundation, Inc. Ion spray apparatus and method
JP2834136B2 (ja) * 1988-04-27 1998-12-09 株式会社日立製作所 質量分析計
US4977320A (en) * 1990-01-22 1990-12-11 The Rockefeller University Electrospray ionization mass spectrometer with new features
US5206594A (en) * 1990-05-11 1993-04-27 Mine Safety Appliances Company Apparatus and process for improved photoionization and detection
US5015845A (en) * 1990-06-01 1991-05-14 Vestec Corporation Electrospray method for mass spectrometry
JPH04109160A (ja) * 1990-08-29 1992-04-10 Hitachi Ltd 超臨界クロマトグラフ/質量分析装置
US5171990A (en) * 1991-05-17 1992-12-15 Finnigan Corporation Electrospray ion source with reduced neutral noise and method
US5352892A (en) * 1992-05-29 1994-10-04 Cornell Research Foundation, Inc. Atmospheric pressure ion interface for a mass analyzer
US5668370A (en) * 1993-06-30 1997-09-16 Hitachi, Ltd. Automatic ionization mass spectrometer with a plurality of atmospheric ionization sources
JP2002157971A (ja) * 1993-06-30 2002-05-31 Hitachi Ltd 質量分析計及び質量分析方法
JP3271431B2 (ja) * 1993-06-30 2002-04-02 株式会社日立製作所 質量分析計
JP3087548B2 (ja) * 1993-12-09 2000-09-11 株式会社日立製作所 液体クロマトグラフ結合型質量分析装置
AU1932095A (en) * 1994-02-28 1995-09-11 Analytica Of Branford, Inc. Multipole ion guide for mass spectrometry
US5750988A (en) * 1994-07-11 1998-05-12 Hewlett-Packard Company Orthogonal ion sampling for APCI mass spectrometry
US6653626B2 (en) * 1994-07-11 2003-11-25 Agilent Technologies, Inc. Ion sampling for APPI mass spectrometry
US6294779B1 (en) * 1994-07-11 2001-09-25 Agilent Technologies, Inc. Orthogonal ion sampling for APCI mass spectrometry
JP2924703B2 (ja) * 1995-04-26 1999-07-26 株式会社日立製作所 質量分析計
GB9525507D0 (en) * 1995-12-14 1996-02-14 Fisons Plc Electrospray and atmospheric pressure chemical ionization mass spectrometer and ion source
JP3204062B2 (ja) * 1995-12-26 2001-09-04 株式会社島津製作所 液体クロマトグラフ質量分析装置
US5808308A (en) * 1996-05-03 1998-09-15 Leybold Inficon Inc. Dual ion source
US5869831A (en) * 1996-06-27 1999-02-09 Yale University Method and apparatus for separation of ions in a gas for mass spectrometry
US5753910A (en) * 1996-07-12 1998-05-19 Hewlett-Packard Company Angled chamber seal for atmospheric pressure ionization mass spectrometry
US5736741A (en) * 1996-07-30 1998-04-07 Hewlett Packard Company Ionization chamber and mass spectrometry system containing an easily removable and replaceable capillary
AU4338997A (en) * 1996-09-10 1998-04-02 Analytica Of Branford, Inc. Improvements to atmospheric pressure ion sources
EP1023742A4 (de) * 1997-10-15 2006-03-22 Analytica Of Branford Inc Gebogene einlassvorrichtung für massenspektrometer
JP2000227417A (ja) * 1999-02-04 2000-08-15 Hitachi Ltd 質量分析方法及び装置
US7109476B2 (en) * 1999-02-09 2006-09-19 Syagen Technology Multiple ion sources involving atmospheric pressure photoionization
US6410914B1 (en) * 1999-03-05 2002-06-25 Bruker Daltonics Inc. Ionization chamber for atmospheric pressure ionization mass spectrometry
US6586731B1 (en) * 1999-04-12 2003-07-01 Mds Inc. High intensity ion source apparatus for mass spectrometry
GB2349270B (en) * 1999-04-15 2002-02-13 Hitachi Ltd Mass analysis apparatus and method for mass analysis
US6407382B1 (en) * 1999-06-04 2002-06-18 Technispan Llc Discharge ionization source
US20030038236A1 (en) * 1999-10-29 2003-02-27 Russ Charles W. Atmospheric pressure ion source high pass ion filter
US6583407B1 (en) * 1999-10-29 2003-06-24 Agilent Technologies, Inc. Method and apparatus for selective ion delivery using ion polarity independent control
SE9904318D0 (sv) * 1999-11-29 1999-11-29 Amersham Pharm Biotech Ab Method and device for electrospray ionisation
US6998605B1 (en) * 2000-05-25 2006-02-14 Agilent Technologies, Inc. Apparatus for delivering ions from a grounded electrospray assembly to a vacuum chamber
US6590205B2 (en) * 2000-08-10 2003-07-08 Anelva Corporation Ionization method for mass spectrometry and mass spectrometry apparatus
US6646256B2 (en) * 2001-12-18 2003-11-11 Agilent Technologies, Inc. Atmospheric pressure photoionization source in mass spectrometry
GB2425399B (en) * 2002-05-31 2007-03-14 Waters Investments Ltd A high speed combination multi-mode ionization source for mass spectrometers
US6646257B1 (en) * 2002-09-18 2003-11-11 Agilent Technologies, Inc. Multimode ionization source
JP3787549B2 (ja) * 2002-10-25 2006-06-21 株式会社日立ハイテクノロジーズ 質量分析装置及び質量分析方法
US7015466B2 (en) * 2003-07-24 2006-03-21 Purdue Research Foundation Electrosonic spray ionization method and device for the atmospheric ionization of molecules
US7034291B1 (en) * 2004-10-22 2006-04-25 Agilent Technologies, Inc. Multimode ionization mode separator
US7145136B2 (en) * 2004-12-17 2006-12-05 Varian, Inc. Atmospheric pressure ionization with optimized drying gas flow
US7449683B2 (en) * 2005-09-28 2008-11-11 Battelle Memorial Institute Method and apparatus for high-order differential mobility separations

Patent Citations (5)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
DE3901369A1 (de) * 1988-01-18 1989-07-27 Matsushita Electric Works Ltd Verfahren zur herstellung einer doppelt diffundierten metall-oxid-halbleiter-feldeffekt-transistorvorrichtung sowie durch dieses verfahren hergestellte vorrichtung
JPH08236064A (ja) * 1995-02-28 1996-09-13 Shimadzu Corp 液体クロマトグラフ質量分析装置
WO1999013492A1 (en) * 1997-09-12 1999-03-18 Analytica Of Branford, Inc. Multiple sample introduction mass spectrometry
WO2001033605A2 (en) * 1999-10-29 2001-05-10 Rijksuniversiteit Groningen Atmospheric pressure photoionization (appi): a new ionization method for liquid chromatography-mass spectrometry
US20020019056A1 (en) * 2000-04-17 2002-02-14 Bori Shushan Method of analyzing dicarboxylic acids

Non-Patent Citations (1)

* Cited by examiner, † Cited by third party
Title
Maschinenübersetzung der JP 08-236064 A

Also Published As

Publication number Publication date
US20070164209A1 (en) 2007-07-19
US20090008569A1 (en) 2009-01-08
JP2005528746A (ja) 2005-09-22
AU2003247434A8 (en) 2003-12-19
WO2003102537A2 (en) 2003-12-11
US20060219891A1 (en) 2006-10-05
WO2003102537A3 (en) 2004-04-29
GB2425399B (en) 2007-03-14
GB0426190D0 (en) 2004-12-29
GB2406705B (en) 2006-09-27
US20060237663A1 (en) 2006-10-26
GB0609224D0 (en) 2006-06-21
GB2425399A (en) 2006-10-25
JP5073168B2 (ja) 2012-11-14
DE10392706B4 (de) 2016-09-29
GB2406705A (en) 2005-04-06
US7820980B2 (en) 2010-10-26
DE10392706T5 (de) 2005-06-09
AU2003247434A1 (en) 2003-12-19

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