CN203858336U - Lane change test device - Google Patents

Abstract

The utility model discloses a trade formula testing arrangement that says, including an at least first transfer way, an at least second transfer way, a loader, an at least bears lift seat, an at least test lift seat and an at least tester. Through the design of first, two transfer passageways can reduce testing arrangement is in the shared space in coplanar, utilizes moreover bear the lift seat and the cooperation of test lift seat will the semiconductor carrier plate is arranged in good time first, two transfer passageways can avoid the semiconductor carrier plate is in first, two take place the situation of pausing midway, effectively shorten test speed.

Description

Lane change test device

technical field

The utility model relates to a test device, in particular to a lane-changing test device for optical test circuit boards.

Background technique

With the development of science and technology, electronic products have become necessary equipment for life and work, such as mobile phones, computers, tablets, etc., and the motherboard is an indispensable and important component of mobile phones, computers, and tablets. During the process, each component on the motherboard needs to be tested to determine whether it is functioning properly.

Generally, each component on the motherboard needs to undergo various tests, so the motherboard to be tested needs to be transported to a specific location for testing through a conveyor belt, and then transported to the next location for processing. However, the conveyor belts are all in the same One plane transports the main board, if the path of the conveyor belt is longer, it takes up more space, and the main board must move in the space, causing the latter board to wait for the test of the previous board to be completed before continuing to be transported by the conveyor belt. In some cases, the stoppage of the conveyor belt will affect the speed of its test.

Therefore, in the process of testing the motherboard, the test device used is very important. The quality of the test device is related to the speed of the test of the motherboard. If the operation and process of the test device used are complicated, the measurement If the speed is too slow, it will affect the delivery time and pay a large cost.

Therefore, it is necessary to provide an improved lane-changing test device to solve the problems existing in the prior art.

Utility model content

In view of this, the utility model provides a lane-changing test device to solve the problem of too slow measurement speed caused by the complicated operation and process of the existing test device.

The main purpose of the utility model is to provide a lane-changing testing device, which uses the design of the upper and lower two-layer conveying lanes to reduce the occupied space and avoid the stoppage of the conveying lanes to shorten the test speed.

In order to achieve the aforementioned purpose of the utility model, an embodiment of the utility model provides a lane-changing test device for testing at least one semiconductor carrier board, the lane-changing test device includes at least one first conveying lane, at least one A second conveying path, a carrier, at least one carrying lifting seat, at least one testing lifting seat and at least one tester, the second conveying path is arranged above the first conveying path, and the carrier is located on the second conveying path Between the first conveying lane and the second conveying lane, it is used for inputting, outputting, clamping and horizontally moving the semiconductor carrier board, and the load lifting seat is arranged in the first conveying lane for lifting and lowering the semiconductor carrier board , to match the level of the carrier or the first conveying lane, the test lifting seat is arranged on one side of the first conveying lane, and is used to lift the semiconductor carrier to match the first The horizontal height of the conveying path or the second conveying path, the tester is arranged above the test lifting seat.

In an embodiment of the present utility model, the lane-changing testing device includes two left-right paralleled first conveying lanes, two left-right paralleled said second conveying lanes, and two testers, wherein The two first conveying lanes and the two second conveying lanes are located between the two testers.

In one embodiment of the present utility model, the lane-changing test device includes two load lifting seats and two test lift seats, wherein the load lift seats are respectively arranged on each of the first conveying In the lanes, the test lifting seats are respectively arranged on one side of each of the first conveying lanes.

In an embodiment of the present invention, the lane-changing test device further includes at least one position-limiting seat, which is correspondingly arranged above the test lifting seat, and is used to block and fix the test lifting seat at a highest position.

In an embodiment of the present utility model, the limit seat has two blocking pieces and two locking slots, and the locking slots are respectively formed on the two blocking pieces, and are used for locking on the two sides of the semiconductor carrier board. edge.

In one embodiment of the present utility model, the tester has a forward and backward movement module, a lateral movement module and an optical test module, the front and rear movement modules and the transverse movement module are respectively used to drive the optical The test module moves back and forth and laterally.

In an embodiment of the present invention, the test lifting base has a pair of auxiliary conveying belts for horizontally moving the semiconductor carrier to the second conveying lane.

In an embodiment of the present invention, the lane-changing testing device further includes a traversing conveyor belt for driving the carrier to move horizontally between the first conveying lane and the second conveying lane.

In an embodiment of the present invention, the carrier has two bearing seats, and the two bearing seats are used to clamp the semiconductor carrier.

In an embodiment of the present invention, the carrier further has two carrying conveyor belts, respectively disposed on the two carrying seats, for transferring the semiconductor carrier.

In one embodiment of the present invention, the semiconductor carrier has a circuit board and several packaging components, the circuit board is used to be placed on the carrying conveyor belt, and the packaging components are arranged on the circuit board .

As mentioned above, the lane-changing test device of the present invention can reduce the space occupied on the same plane through the design of the first and second conveying lanes, and utilize the cooperation of the bearing lifting base and the testing lifting base to move the The timely arrangement of the semiconductor carrier on the first and second conveying lanes can avoid the situation that the semiconductor carrier stops in the middle of the first and second conveying lanes, and can effectively shorten the test speed.

Description of drawings

Fig. 1 is a perspective view of a lane-changing test device according to an embodiment of the present invention.

Fig. 2 is a side view of a lane-changing test device according to an embodiment of the present invention.

Fig. 3 is a side view from another angle of the lane-changing test device according to an embodiment of the present invention.

4 to 13 are schematic views of the use state of the lane-changing test device according to an embodiment of the present invention.

Detailed ways

The following descriptions of the various embodiments refer to the accompanying drawings to illustrate specific embodiments in which the present invention can be implemented. Furthermore, the direction terms mentioned in the present utility model, such as up, down, top, bottom, front, back, left, right, inside, outside, side, surrounding, central, horizontal, transverse, vertical, longitudinal, axial , radial direction, the uppermost layer or the lowermost layer, etc., are only directions for referring to the attached drawings. Therefore, the used directional terms are used to illustrate and understand the present invention, but not to limit the present invention.

Please refer to FIGS. 1 to 3, a lane-changing test device 100 according to an embodiment of the present invention is used to test one or more semiconductor substrates 101. The semiconductor substrate 101 has a circuit board 102 and several packages. Components 103, the packaging components 103 (such as memory, packaging IC, etc.) are arranged on the circuit board 102, and the lane-changing test device 100 includes two first delivery lanes 21, two second delivery lanes 22, a Carrier 23, two load lifting seats 24, two test lifting seats 25, two testers 26, two limit seats 27 and a traverse conveyor belt 28, wherein the two first conveying lanes 21 and the two second conveying lanes 22. Two load lifting seats 24, two test lifting seats 25, two testers 26 and two limit seats 27 are arranged side by side in Figures 2 and 4 (some components are omitted in Figure 4), but only It is one, and the number of its components is not limited by this embodiment. The utility model will describe the detailed structure, assembly relationship and operating principle of each component of the assembly device in detail below.

1 to 3 and 4, each of the second conveying lanes 22 is arranged above the corresponding first conveying lane 21, and the two first conveying lanes 21 and the two second conveying lanes 22 are both Located between the two testers 26, the carrying lifting base 24 is respectively arranged in each of the first delivery lanes 21, and the test lifting base 25 is respectively arranged in one of each of the first delivery lanes 21. side.

1 to 3 and 4, the carrier 23 is located between the first conveying lane 21 and the second conveying lane 22, and is used for inputting, outputting, clamping and horizontally moving the semiconductor carrier 101. , the carrier 23 has two carrying seats 231 and two carrying conveyor belts 232, the two carrying seats 231 are used to clamp the semiconductor carrier 101, and the two carrying conveyor belts 232 are respectively arranged on the two carrying seats 231 for transferring the semiconductor carrier 101 .

1 to 3 and 4, each of the load lifting seats 24 is arranged in the first conveying path 21, and the semiconductor carrier 101 is lifted and lowered by a pneumatic cylinder, so that when the load lifting seats 24 are raised, It is matched to the level of the carrier 23 , and the level of the first conveying path 21 is matched to the level of the first conveying path 21 when the carrier lifter 24 descends.

1 to 3 and 4, each of the test lifting seats 25 is arranged on one side of the first conveying path 21, and the semiconductor carrier 101 is raised and lowered by a pneumatic cylinder to make the test lifting seats 25 rise. When the test lifting base 25 descends, it matches the horizontal height of the second conveying path 22 . In addition, the test lifting base 25 has a pair of auxiliary conveyor belts 251 (only one of which is shown in FIG. Conveyor Road 21.

Continue referring to Fig. 1 to 3 and shown in 4, each described tester 26 is arranged on the top of described test lifting seat, and described tester 26 has a front and rear movement module 261, a lateral movement module 262 and an optical test module. Group 263 , the forward and backward moving module 261 is used to drive the optical testing module 263 to move forward and backward, and the lateral moving module 262 is used to drive the optical testing module 263 to move laterally.

1 to 3 and 4, the limit seat 27 is correspondingly arranged above the test lift seat 25, so as to block and fix the test lift seat 25 at a highest position, and each limit seat 27 has two blocking pieces 271 and two locking slots 272 , wherein the locking slots 272 are respectively formed on the two blocking pieces 271 for locking on two side edges of the circuit board 102 of the semiconductor carrier 101 .

1 to 3 and 4, the traverse conveyor belt 28 is arranged on the outside of the first conveying path 21 to drive the carrier 23 on the first conveying path 21 and the second conveying path 22. to move horizontally.

According to the above-mentioned structure, as shown in FIG. 4, the semiconductor carrier 101 is placed on the carrier 23, so that the carrier conveyor belt 232 moves and positions the circuit board 102, and then the carrier 23 is moved by the carrier 23. Driven by the traversing conveyor belt 28, it moves to the left for positioning; as shown in FIG. Seat 231, making the lifting and lowering seat 24 carry the semiconductor carrier board 101, and descend to a level matching the first conveying path 21, so that the first conveying path 21 carries the semiconductor carrier substrate 101; As shown in FIG. 6, the first conveying lane 21 transfers the semiconductor carrier board 101 to the test lifting base 25, so that the test lifting base 25 carries the semiconductor carrier board 101; as shown in FIG. 7 , the test lifting seat 25 immediately rises to match the level of the second conveying path 22, and performs an optical test on the packaged components 103 of the semiconductor carrier 101 through the optical test module 263, to be tested After completion, the auxiliary conveyor belt 251 of the test lifter 25 will transfer the semiconductor carrier board 101 to the second conveying lane 22, so that the second conveying lane 22 carries the semiconductor carrier board 101; 8, the semiconductor carrier board 101 is moved to the right by the second conveying path 22, and the semiconductor carrier board 101 is transferred to the test lifting base 25, so that the test lifting base 25 carries The semiconductor carrier 101; as shown in FIG. 9 , the optical test module 263 is used to perform an optical test on the packaging element 103 of the semiconductor carrier 101. After the test is completed, the test lifter 25 will descend To match the level of the first conveying lane 21, at this time, the auxiliary conveying belt 251 of the test lifting stand 25 will transfer the semiconductor carrier board 101 to the first conveying lane 21, so that the first conveying lane 21 A conveyor 21 carries the semiconductor carrier 101; as shown in FIG. The semiconductor carrier 101 rises to match the level of the carrier 23. At this time, the carrier 23 will fold the two bearing seats 231 so that the two bearing seats 231 clamp the semiconductor carrier. 101, at the same time, the bearing lifting seat 24 is lowered and returned to its original position; finally, the carrier 23 will move in sequence to output the semiconductor carrier board 101 as shown in Figures 12, 4 and 13, so that the semiconductor carrier board 101 Proceed to the next procedure.

In addition, during the test, as shown in FIG. 3 , the test lifter 25 will push up the semiconductor carrier 101 to a highest position and lean against the two blocking pieces 271. At this time, the The locking slot 272 is engaged with the two side edges of the circuit board 102 of the semiconductor carrier 101 , so that the circuit board 102 can be kept horizontal, so that the optical test module 263 can be tested.

Through the above-mentioned design, the design of the first conveying path 21 and the second conveying path 22 can not only reduce the space occupied on the same plane, but also utilize the cooperation of the load lifting seat 24 and the test lifting seat 25 to lift the The semiconductor carrier board 101 is arranged in the first conveying lane 21 or the second conveying lane 22 in a timely manner, which can avoid the situation that the semiconductor carrier board 101 stops midway in the first conveying lane 21 or the second conveying lane 22 , which can effectively shorten the test speed. In addition, through the design of the limit seat 27 , the circuit board 102 can be kept horizontal, thereby reducing the occurrence of test errors of the optical test module 263 .

The utility model has been described by the above-mentioned relevant embodiments, but the above-mentioned embodiments are only examples for implementing the utility model. It must be pointed out that the disclosed embodiments do not limit the scope of the present invention. On the contrary, modifications and equivalent arrangements included in the spirit and scope of the claims are included in the scope of the present invention.

Claims (11)

1. A lane-changing test device for testing at least one semiconductor carrier, characterized in that: the lane-changing test device comprises: at least one first conveying lane; at least one second conveying lane arranged above the first conveying lane; a carrier, located between the first conveying lane and the second conveying lane, for inputting, outputting, clamping and horizontally moving the semiconductor carrier; At least one loading and unloading seat is arranged in the first conveying lane, and is used for lifting and lowering the semiconductor carrier to match the level of the carrier or the first conveying lane; and at least one test lifter, arranged on one side of the first conveying lane, for lifting and lowering the semiconductor carrier to match the level of the first conveying lane or the second conveying lane; and At least one tester is arranged above the test lifting base. 2. The lane-changing testing device according to claim 1, characterized in that: the lane-changing testing device comprises two left and right side-by-side first conveying lanes, and two left-right and left-right parallel described second conveying lanes and two testers, wherein the two first conveying lanes and the two second conveying lanes are located between the two testers. 3. The lane-changing test device according to claim 2, wherein the lane-changing test device comprises two load lifting seats and two test lift seats, wherein the load lifting seats are respectively It is arranged in each of the first conveying lanes, and the test lifting seats are respectively arranged on one side of each of the first conveying lanes. 4. The lane-changing test device according to claim 1, characterized in that: the lane-changing test device also includes at least one limit seat, which is correspondingly arranged above the test lifting seat, for the test The lifting seat is blocked and fixed at a highest position. 5. The lane-changing test device according to claim 4, characterized in that: the limit seat has two baffles and two card slots, and the card slots are respectively formed on the two baffles for engagement on the two side edges of the semiconductor carrier. 6. The lane-changing test device as claimed in claim 1, wherein the tester has a forward and backward movement module, a lateral movement module and an optical test module, and the front and rear movement module and the transverse movement The modules are respectively used to drive the optical test module to move back and forth and laterally. 7 . The lane-changing testing device according to claim 1 , wherein a pair of auxiliary conveying belts are provided on the test lifting base for horizontally moving the semiconductor carrier board to the second conveying lane. 8 . 8. The lane-changing testing device according to claim 1, characterized in that: the lane-changing testing device further comprises a traversing conveyor belt for driving the carrier between the first conveying lane and the second conveying lane. Horizontal movement between conveyor lanes. 9 . The lane-changing test device according to claim 1 , wherein the carrier has two bearing seats, and the two bearing seats are used to clamp the semiconductor carrier. 10 . The lane-changing testing device according to claim 9 , wherein the carrier further has two carrying conveyor belts, respectively disposed on the two carrying seats, for transferring the semiconductor carrier. 11 . 11. The lane-changing test device as claimed in claim 10, wherein the semiconductor carrier board has: a circuit board for placing on the carrying conveyor belt; and several packaging components arranged on the circuit board.