CN1715019A - Protective belt cutting method and device for semiconductor wafer - Google Patents
Protective belt cutting method and device for semiconductor wafer Download PDFInfo
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- CN1715019A CN1715019A CN200510081866.0A CN200510081866A CN1715019A CN 1715019 A CN1715019 A CN 1715019A CN 200510081866 A CN200510081866 A CN 200510081866A CN 1715019 A CN1715019 A CN 1715019A
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Abstract
一种半导体晶圆的保护带切断方法,使刀头沿着半导体晶圆的外周相对走行,沿着晶圆外形将贴附于半导体晶圆表面的保护带切开,沿着外周上具有定位用凹口的半导体晶圆的外周,使刀头相对走行,在该刀头正在相对走行的过程中的凹入形成于晶圆外周的凹口的前半部,使刀头自转转动以使其刀尖面向晶圆中心。而在凹口的后半部,使刀头自转转动以使其刀尖面向晶圆外周。
A method for cutting a protective tape of a semiconductor wafer. The cutter head runs relatively along the outer periphery of the semiconductor wafer, cuts the protective tape attached to the surface of the semiconductor wafer along the shape of the wafer, and has a positioning function along the outer periphery. The outer periphery of the semiconductor wafer of the notch, so that the cutter head travels relatively, and the indentation is formed in the front half of the notch on the outer periphery of the wafer during the process of the relative travel of the cutter head, so that the cutter head rotates by itself to make its tip Facing the center of the wafer. And in the second half of the notch, the cutter head is rotated by itself so that its tip faces the outer periphery of the wafer.
Description
技术领域technical field
本发明涉及沿着半导体晶圆的外周使刀头相对走行、将贴附于半导体晶圆表面上的保护带沿着晶圆外形切开用的方法及装置。The invention relates to a method and a device for cutting a protective tape attached on the surface of a semiconductor wafer along the outer circumference of the semiconductor wafer by making the cutter head relatively run along the outer periphery of the semiconductor wafer.
背景技术Background technique
以往,作为保护带的切断装置,已知有一种以下的结构:即、在将保护带供给·贴附在载置保持于工作台的晶圆表面上之后,在将刀头刺透保护带的状态下,通过使工作台回转,沿着晶圆的外周使刀头相对走行,将保护带沿着晶圆外周进行切断(例如、参照日本专利特开2004-25402号公报)。Conventionally, as a cutting device for a protective tape, a structure is known in which after the protective tape is supplied and attached to the surface of a wafer placed and held on a stage, a blade is pierced through the protective tape. In this state, by rotating the table and moving the cutter head along the outer periphery of the wafer relative to each other, the protective tape is cut along the outer periphery of the wafer (for example, refer to Japanese Patent Application Laid-Open No. 2004-25402).
一般来讲,在晶圆的外周形成有定位用的定位平面(日文:オリエンテ一ションフラット)和凹口。在具有定位平面的晶圆的场合,通过使刀头滑动变位到晶圆中心侧等,可以沿着直线的定位平面相对走行。但是,由于晶圆外周所形成的凹口是一种周向的宽度和半径方向的深度约为数mm的小的形状,故在该凹口的形成部位上,刀头会沿着晶圆圆周方向而通过。由此,在保护带的一部分面对凹口内部的状态下进行带子切断处理。Generally, a positioning plane (Japanese: Oriente-Sionflat) and a notch for positioning are formed on the outer periphery of the wafer. In the case of a wafer having a positioning plane, by sliding and displacing the bit to the center of the wafer, etc., it is possible to move relatively along the linear positioning plane. However, since the notch formed on the outer periphery of the wafer has a small shape with a circumferential width and a depth in the radial direction of about several millimeters, at the formation site of the notch, the cutter head will move along the wafer circumferential direction. And pass. Thus, the tape cutting process is performed with a part of the protective tape facing the inside of the notch.
然而,面对凹口内部的保护带部分因其粘合面是露出的状态,故在基底处理工序中发生的粉尘附在凹口内部露出的粘合面上,被附着的粉尘在其后的处理工序中脱落,有可能污损周围。又,凹口内部的保护带部分一旦被粉尘盖住,则会成为光学性检测凹口进行晶圆对位时的障碍。However, since the adhesive surface of the protective tape facing the inside of the notch is exposed, dust generated during the surface treatment process adheres to the exposed adhesive surface inside the notch, and the adhered dust is deposited on the subsequent If it comes off during the handling process, it may stain the surrounding area. In addition, once the protective tape inside the notch is covered with dust, it will become an obstacle when optically detecting the notch for wafer alignment.
发明内容Contents of the invention
鉴于以上的事实,本发明的主要目的在于,在带凹口的半导体晶圆的保护带切断处理中,保护带在凹口的内部不会露出很多地残留,可抑制粉尘的附着等。In view of the above facts, the main object of the present invention is to suppress the adhesion of dust and the like without leaving much of the protective tape exposed inside the notch during the protective tape cutting process of the notched semiconductor wafer.
为了实现上述目的,本发明采用了以下的结构。In order to achieve the above objects, the present invention employs the following structures.
一种半导体晶圆的保护带切断方法,使刀头沿着半导体晶圆的外周相对走行,沿着晶圆外形将贴附于半导体晶圆表面的保护带切开,上述方法包括以下的过程:A method for cutting off a protective tape of a semiconductor wafer, the cutter head is relatively run along the outer periphery of the semiconductor wafer, and the protective tape attached to the surface of the semiconductor wafer is cut along the shape of the wafer. The method includes the following processes:
沿着在外周具有定位用凹口的半导体晶圆的外周、使刀头相对走行的刀头走行过程;A tool head running process in which the tool heads move relative to each other along the outer periphery of the semiconductor wafer having positioning notches on the outer periphery;
所述刀头走行过程中、在凹入形成于晶圆外周的凹口的前半部使刀头自转转动以使其刀尖面向晶圆中心的第1自转转动过程;During the running process of the cutter head, the first half of the cutter head is made to rotate by itself in the first half of the notch formed on the outer periphery of the wafer so that the cutter head faces the center of the wafer;
在凹口的后半部、使刀头自转转动以使其刀尖面向晶圆外周的第2自转转动过程。In the second half of the notch, the cutter head is rotated by itself so that the tip of the cutter faces the outer periphery of the wafer during the second rotation.
采用本发明的半导体晶圆的保护带切断方法,一旦刀头到达凹口形成部位就会自转,刀尖进入凹口的内部。即,残留于凹口内部的保护带部分很少,露出的粘合面也不大。According to the method for cutting the protective tape of the semiconductor wafer according to the present invention, once the cutter head reaches the notch forming part, it will rotate by itself, and the cutter head will enter the inside of the notch. That is, the portion of the protective tape remaining inside the notch is small, and the exposed adhesive surface is not large.
这样,在经过了保护带切断处理的晶圆的凹口内部所残留的保护带部分的粘合面上,可抑制研磨粉尘等的附着,故在其后的工序中,能有效地抑制由粉尘脱落而污染周围的情况。In this way, on the adhesive surface of the protective tape portion remaining inside the notch of the wafer that has undergone the protective tape cutting process, the adhesion of grinding dust and the like can be suppressed, so in the subsequent process, it can be effectively suppressed. fall off and contaminate the surrounding environment.
又,在刀头走行过程中,既可以使刀头沿着半导体晶圆的外周走行,或者也可以将刀头固定,使所述半导体晶圆绕中心轴转动,并且,在第1自转转动过程和第2自转转动过程中,一边使半导体晶圆转动一边使刀头以靠近刀头的背面边缘位置的轴心为中心进行自转。Again, in the process of cutter head walking, both the cutter head can be made to walk along the periphery of the semiconductor wafer, or the cutter head can be fixed to make the semiconductor wafer rotate around the central axis, and, in the first rotation process And in the second rotation process, while rotating the semiconductor wafer, the cutter head is rotated around the axis near the back edge of the cutter head.
又,最好是包含有变更刀头旋转半径的变更过程。采用这一方法,能根据半导体晶圆的外形来变更·调整刀头的旋转半径。Also, it is preferable to include a changing process of changing the radius of rotation of the cutter head. With this method, the radius of rotation of the tool head can be changed and adjusted according to the shape of the semiconductor wafer.
又,在刀头走行过程、第1自转转动过程和第2自转转动过程中,最好是向刀头的刀尖赋于弹性力,以使其靠近半导体晶圆的中心轴。Also, it is preferable to apply an elastic force to the tip of the tool head so as to approach the center axis of the semiconductor wafer during the tool head traveling process, the first autorotation rotation process and the second autorotation rotation process.
又,为了实现上述目的,本发明采用了以下的结构。Moreover, in order to achieve the above objects, the present invention employs the following configurations.
一种半导体晶圆的保护带切断装置,使刀头沿着半导体晶圆的外周相对走行,沿着晶圆外形将贴附于半导体晶圆表面的保护带切开,上述装置包括以下的要素:A protective tape cutting device for a semiconductor wafer, which makes the cutter head run relatively along the outer periphery of the semiconductor wafer, and cuts the protective tape attached to the surface of the semiconductor wafer along the shape of the wafer. The above-mentioned device includes the following elements:
与穿通晶圆中心的轴心平行、以靠近刀头的背面边缘位置的轴心为中心、并可自转地支承所述刀头的支承装置;A supporting device that is parallel to the axis passing through the center of the wafer, centered on the axis near the back edge of the cutter head, and rotatably supports the cutter head;
沿着外周上具有定位用凹口的半导体晶圆的外周、使刀头相对走行的刀头走行装置;A tool head running device that moves the tool head relative to the outer periphery of the semiconductor wafer having a notch for positioning on the outer periphery;
在凹入形成于晶圆外周的凹口的前半部使刀头自转转动以使其刀尖面向晶圆中心、而在凹口的后半部使刀头自转转动以使其刀尖面向晶圆外周的刀头自转转动装置。Rotate the tool head so that its tip faces the center of the wafer in the first half of the notch recessed and formed on the outer periphery of the wafer, and turn the bit so that its tip faces the wafer in the second half of the notch The cutter head on the outer periphery rotates automatically.
采用上述结构,由于在凹口的前半部,使刀头自转转动以使其刀尖面向晶圆中心,进入凹口的内部,而在凹口的后半部,刀头一边反向自转转动以使其刀尖面向晶圆外周、一边前进,因此,残留于凹口内部的保护带部分很少,露出的粘合面也不大。Adopt the above-mentioned structure, because in the first half of the notch, the cutter head is rotated by itself so that the tip of the cutter faces the center of the wafer and enters the inside of the notch, while in the second half of the notch, the cutter head rotates in the opposite direction to Since the tip of the knife advances while facing the outer periphery of the wafer, there is little protective tape remaining inside the notch, and the exposed bonding surface is not large.
这样,残留于凹口内部的保护带部分很少,露出的粘合面也不大。其结果,在残留于凹口内部的保护带部分的粘合面上,可抑制研磨粉尘等的附着,故在其后的工序中,不会因粉尘脱落而污损周围,不会成为凹口部分的光学性检测的障碍。In this way, the portion of the protective tape remaining inside the notch is very small, and the exposed bonding surface is not large. As a result, on the adhesive surface of the protective tape portion remaining inside the notch, the adhesion of grinding dust, etc., can be suppressed, so in the subsequent process, the surrounding area will not be stained by the dust falling off, and the notch will not be formed. Some obstacles to optical detection.
又,作为刀头走行装置,例如可以列举出:在半导体晶圆的周围具有使刀头旋转的第1驱动装置的结构;或者包含有保持半导体晶圆的保持装置和使保持装置围绕该保持装置所保持的半导体晶圆的中心轴进行转动的第2驱动装置的结构等。Also, as the tool head traveling device, for example, it can be enumerated: a structure that has a first driving device that rotates the tool head around the semiconductor wafer; or includes a holding device that holds the semiconductor wafer and makes the holding device surround the holding device The structure of the second driving device that rotates the central axis of the held semiconductor wafer, etc.
又,本发明的半导体晶圆的保护带切断装置,最好是包含有调节刀头旋转半径的调节装置。采用这种结构,可根据半导体晶圆的外形来变更·调整刀头的旋转半径。Furthermore, the device for cutting the protective tape of the semiconductor wafer according to the present invention preferably includes an adjusting device for adjusting the radius of rotation of the cutter head. With this structure, the radius of rotation of the tool head can be changed and adjusted according to the shape of the semiconductor wafer.
并且,最好是向刀头的刀尖赋于弹性力,以使其靠近半导体晶圆的中心轴。Furthermore, it is preferable to apply elastic force to the tip of the bit so as to approach the center axis of the semiconductor wafer.
附图说明Description of drawings
为了说明发明,图示了现在认为较好的若干种形态,但希望理解成不是将发明限定成图示那样的结构及方法。In order to explain the invention, some forms considered to be preferable at present are shown in the drawings, but it should be understood that the invention is not limited to the configurations and methods shown in the drawings.
图1为表示本发明一实施例的保护带贴附装置整体的立体图。Fig. 1 is a perspective view showing the whole of a protective tape sticking device according to an embodiment of the present invention.
图2为带子切断机构的主视图。Fig. 2 is a front view of the tape cutting mechanism.
图3为带子切断机构要部的立体图。Fig. 3 is a perspective view of main parts of the tape cutting mechanism.
图4为带子切断机构要部的俯视图。Fig. 4 is a plan view of main parts of the tape cutting mechanism.
图5为带子切断机构要部的侧视图。Fig. 5 is a side view of main parts of the tape cutting mechanism.
图6为实施例装置的动作说明图。Fig. 6 is an explanatory diagram of the operation of the device of the embodiment.
图7为实施例装置的动作说明图。Fig. 7 is an explanatory diagram of the operation of the device of the embodiment.
图8为实施例装置的动作说明图。Fig. 8 is an explanatory diagram of the operation of the device of the embodiment.
图9为实施例装置的动作说明图。Fig. 9 is an explanatory diagram of the operation of the device of the embodiment.
图10为表示凹口部位的带子切断动作的俯视图。Fig. 10 is a plan view showing the tape cutting operation at the notch portion.
具体实施方式Detailed ways
下面参照附图说明本发明的一实施例。An embodiment of the present invention will be described below with reference to the drawings.
图1为表示保护带贴附装置整体结构的立体图。该保护带贴附装置包括:装填有收容半导体晶圆(以下简称为「晶圆」)W的盒体C的晶圆供给/回收部1;具有机械臂2的晶圆搬送机构3;基准台4;载置晶圆W进行吸附保持的夹台5;向晶圆W供给表面保护用的保护带T的带子供给部6;从来自带子供给部6所供给的带分离层的保护带T将分离层s剥离回收的分离层回收部7;将保护带T贴附在载置于夹台5上被吸附保持的晶圆W上的贴附单元8;将贴附于晶圆W上的保护带T沿着晶圆W的外形进行切开·切断的带子切断机构9;将贴附于晶圆W的切断处理后的无用带T’进行剥离的剥离单元10;以及将由剥离单元10剥离的无用带T’进行卷装回收的带子回收部11等,下面说明上述的各构造部及其机构方面的具体结构。Fig. 1 is a perspective view showing the overall structure of a protective tape sticking device. The protective tape attaching device includes: a wafer supply/
在晶圆供给/回收部1上可以并列地装填2台盒体C。各盒体C中,分多层地收容着以水平姿势插入的、配线图案面向上方的许多枚晶圆W。Two cassettes C can be loaded in parallel in the wafer supply/
装备于晶圆搬送机构3上的机械臂2,可水平地进行进退移动,同时可使整体驱动旋转及升降。在机械臂2的前端,具有马蹄形的真空吸附式的晶圆保持部2a,将晶圆保持部2a插入多层收容于盒体C中的晶圆W相互之间的间隙中,从背面将晶圆W吸附保持,将被吸附保持的晶圆W从盒体C引出,按照基准台4、夹台5和晶圆供给/回收部1的顺序进行搬送。The mechanical arm 2 equipped on the wafer transfer mechanism 3 can move forward and backward horizontally, and at the same time can drive the whole body to rotate and lift. At the front end of the robot arm 2, there is a horseshoe-shaped vacuum suction wafer holding part 2a. The wafer holding part 2a is inserted into the gap between the wafers W stored in the cassette C in multiple layers, and the wafer is held from the back. The wafer W is sucked and held, and the sucked and held wafer W is pulled out from the cassette body C, and transported in the order of the reference table 4 , the clamp table 5 , and the wafer supply/
基准台4的作用是将由晶圆搬送机构3搬入载置的晶圆W,按照其外周所形成的凹口n进行对位。The role of the reference table 4 is to align the wafer W carried in and placed by the wafer transfer mechanism 3 according to the notch n formed on its outer periphery.
夹台5的作用是对从晶圆搬送机构3移载来的、以规定位置对准的姿势所载置的晶圆W进行真空吸附。如图2所示,在该夹台5的上面形成有刀头走行槽13,该刀头走行槽13的作用是使装备于后述带子切断机构9上的刀头12沿着晶圆W外形进行旋转移动来将保护带T切断。The role of the chucking table 5 is to vacuum-suction the wafer W transferred from the wafer transfer mechanism 3 and placed in a posture aligned with a predetermined position. As shown in FIG. 2 , a cutter
返回图1,带子供给部6的结构是将从供给卷绕架14拉出的带分离层的保护带T引导·卷装在导辊15组上,将分离层s剥离后的保护带T导向贴附单元8。在该供给卷绕架14上施加有适度的回转阻力,不容许带子过量地拉出。Returning to FIG. 1, the structure of the
分离层回收部7,对卷装着从保护带T剥离后的分离层s的回收卷绕架16朝卷装方向进行回转驱动。The separation layer recovery unit 7 drives the
如图6所示,在贴附单元8中设置有水平状向前的贴附辊17,通过滑动引导机构18以及未图示的螺纹送进式的驱动机构进行左右水平的往复驱动。As shown in FIG. 6 , a horizontally forward attaching
在剥离单元10中设置有水平状向前的剥离辊19,通过滑动引导机构18以及未图示的螺纹送进式的驱动机构进行左右水平的往复驱动。The peeling
带子回收部11,对卷装着无用带T’的回收卷绕架20朝卷装方向进行回转驱动。The
如图1所示,带子切断机构9基本上是在可驱动升降的可动台21的下部,沿位于夹台5中心处的纵向轴心X周围并列装备着可驱动旋转的1对支承臂22。在该支承臂22的游端侧所设置的刀具单元23上,安装着刀尖向下的刀头12,通过使支承臂22绕纵向轴心X进行旋转,刀头12沿着晶圆W的外周走行,将保护带T切开。其详细的构造如图2~图6所示。As shown in Figure 1, the
如图2所示,通过使电机24正反回转驱动,可动台21沿着纵向导轨25进行螺纹送进式升降。沿所述纵向轴心X周围可转动地装备于该可动台21的游端部上的转动轴26,通过2根皮带28与配备于可动台21上面的电机27减速连动,通过电机27的动作使转动轴26低速地朝规定方向转动。在从该转动轴26向下方延伸的支承构件29的下端部,贯通支承着可水平方向滑动调节的支承臂22,通过支承臂22的滑动调节,可根据晶圆直径来变更调节刀头12的离纵向轴心X的距离、即刀头12的旋转半径。As shown in FIG. 2 , by driving the
转动轴26、电机27和皮带28构成了本发明的刀头走行装置和第1驱动装置。又,支承臂22相当于本发明的调节装置。
如图3所示,在支承臂22的游端部固定着托架30。在该托架30上安装·支承着刀具单元23。刀具单元23包括:沿纵向轴心Y周围、在一定的小范围内可转动地支承于托架30上的转动构件31;与转动构件31的端部下面连结的纵壁状的支承托架32;与支承托架32的侧面连结的刀具支承构件33;被支承于刀具支承构件33上的托架34;安装在该托架34上的刀具夹座35等。刀头12与刀具夹座35的侧面螺纹连结。As shown in FIG. 3 , a
如图4所示,在转动构件31的上方,配备有通过将长孔36与凸起37的卡合而与转动构件31一体回转的操作凸缘38。通过气缸39使该操作凸缘38转动,可变更刀具单元23的整体相对支承臂22的围绕纵向轴心Y的姿势,可在规定的小范围内调整刀头12相对走行方向的角度。As shown in FIG. 4 , above the rotating
相对于刀具支承构件33,托架34可滑动移动地被支承在支承臂22的长度方向(图5中的图纸表背方向)上,同时通过未图示的弹簧朝靠近纵向轴心X的方向施加滑动力。With respect to the
刀具夹座35被支承在托架34上,围绕穿通刀头12的背面边缘的纵向轴心Z可自转,同时利用弹簧41,对刀头12的刀尖施加靠近纵向轴心X方向的转动力。另外,弹簧41相当于本发明的弹性体。作为弹性体不限定于弹簧,例如也可使用树脂性的皮带或橡胶等。The
可转动地支承刀具单元23的托架30相当于本发明的支承装置,转动构件31、长孔36、凸起37、气缸39和弹簧41构成了本发明的刀头自转转动装置。The
下面参照图6~图9,对使用上述实施例装置将保护带T贴附于晶圆W的表面用的一连串基本动作作出说明。Next, a series of basic operations for attaching the protective tape T to the surface of the wafer W using the apparatus of the above embodiment will be described with reference to FIGS. 6 to 9 .
一旦发出贴附指令,首先,晶圆搬送机构3的机械臂2向载置·装填于晶圆供给/回收部1的盒体C移动,晶圆保持部2a被插入至收容于盒体C中的晶圆相互之间的间隙中。机械臂2通过该晶圆保持部2a将晶圆W从背面(下面)吸附保持而搬出,将取出后的晶圆W移载于基准台4上。Once the sticking command is issued, first, the robot arm 2 of the wafer transfer mechanism 3 moves to the cassette C placed and loaded in the wafer supply/
载置在基准台4上的晶圆W,利用晶圆W外周所形成的凹口n进行对位。对位后的晶圆W再次由机械臂2搬出而被载置在夹台5上。The wafer W placed on the reference table 4 is aligned using the notches n formed on the outer periphery of the wafer W. As shown in FIG. The aligned wafer W is carried out again by the robot arm 2 and placed on the
载置在夹台5上的晶圆W被吸附保持,形成了其中心正位于夹台5的中心处的位置对准的状态。此时如图6所示,贴附单元8和剥离单元10处于左侧的初始位置待机,而带子切断机构9的刀头12处于上方的初始位置待机。The wafer W placed on the
如图6中的假想线所示,贴附单元8的贴附辊17下降,并且,一边由该贴附辊17将保护带T向下方按压一边在晶圆W上向前方(图6中的右方)转动,由此将保护带T贴附在晶圆W的整个表面上。As shown by the imaginary line in FIG. 6, the attaching
如图7所示,当贴附单元8到达终端位置时,正在上方待机的刀头12下降,在夹台5的刀头走行槽13中刺透保护带T。As shown in FIG. 7 , when the attaching unit 8 reaches the terminal position, the
如图8所示,当刀头12下降到规定的切断高度位置而停止时,支承臂22朝规定的方向回转,刀头12随之绕纵向轴心X进行旋转移动,沿着晶圆外形将保护带T切断。As shown in FIG. 8, when the
在沿晶圆W的外周的带子切断结束时,如图9所示,刀头12上升到原来的待机位置,接着,剥离单元10一边向前方移动一边将在晶圆W上切开·切断而残留的无用带T’卷起进行剥离。When the cutting of the tape along the outer periphery of the wafer W is completed, as shown in FIG. The remaining useless tape T' is rolled up and peeled off.
当剥离单元10到达剥离作业的结束位置时,剥离单元10和贴附单元8反向移动而返回初始位置。此时,无用带T’被卷装在回收卷绕架20上,同时从带子供给部6拉出一定量的保护带T。When the peeling
带子贴附动作一旦结束,在解除了夹台5上的吸附之后,经过了贴附处理的晶圆W被移载到机械臂2的晶圆保持部2a上,并插入晶圆供给/回收部1的盒体C中而被回收。Once the tape attaching operation is completed, the attached wafer W is transferred to the wafer holding part 2a of the robot arm 2 after the suction on the clamp table 5 is released, and inserted into the wafer supply/recovery part. 1 box C and be recovered.
以上是结束了1次的带子贴附处理,其后依次重复以上的动作。The above is the end of one tape sticking process, and the above operations are sequentially repeated thereafter.
在上述保护带贴附工序中的带子切断工序中,晶圆W外周所形成的凹口n处的带子切断按照以下方法来进行。另外,凹口n被凹入弯曲成周向的开放宽度4~5mm、深度3mm左右。In the tape cutting step in the protective tape attaching step described above, the tape cutting at the notch n formed on the outer periphery of the wafer W is performed as follows. In addition, the notch n is concavely bent to have an opening width of 4 to 5 mm in the circumferential direction and a depth of about 3 mm.
刀头12在晶圆W的凹口n以外的周缘部上前进期间,如图10(a)所示,通过气缸39的杆的伸长,刀头12相对晶圆W的外周缘,以适度的切入倾斜角度在周向上滑接移动。当刀头12到达凹口n上边侧的端部时,气缸39的杆收缩,由此,刀头12朝内侧方向形成自转自如的状态。如图10(b)所示,从晶圆W的外周缘脱离的刀头12,其刀尖在刀头旋转中心方向上利用弹性力一边自转一边前进,刀尖咬入凹口n内继续前进。当刀尖到达凹口n的底部附近时,在刀头12前进的同时再次使气缸39的杆伸长,由此,刀头12反向自转,向晶圆外周移行(参照图10(c))。刀头12一旦到达凹口n下边侧的端部,其后如图10(d)所示,刀头12重新沿着晶圆W的外周缘前进。During the advancement of the
这样,通过刀头12自转,咬入凹口n进行移动,并在凹口n的后半部反向自转,凹口n内的保护带T被挖出,凹口n内所切剩下的残留带t很少。In this way, by the rotation of the
本发明也可实施以下那样的形态。The present invention can also be implemented in the following forms.
(1)也可利用脉冲电机等的作动器来使刀具夹座35自转驱动。该场合,根据预先输入的程序,将刀头12控制成沿着凹口n的内缘一边自转一边移动,由此可进一步减少凹口n内的残留带t。(1) An actuator such as a pulse motor may be used to drive the
(2)本发明的方法,也可在使晶圆W相对刀头12回转来进行带子切断的形态下实施。实现该结构时,只要利用例如电机等的驱动装置来使吸附保持晶圆W的夹台5回转即可。该结构的场合,电机相当于本发明的第2驱动装置。(2) The method of the present invention can also be implemented in a state where the wafer W is rotated relative to the
本发明在不脱离其思想或本质的情况下,可实施其它的具体形态,因此,作为表示发明的范围,不单纯是以上的说明,应当参照后附的权利要求。The present invention can be implemented in other specific forms without departing from the idea or essence thereof. Therefore, the appended claims should be referred to in addition to the above description to show the scope of the invention.
Claims (10)
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2004195679A JP4640763B2 (en) | 2004-07-01 | 2004-07-01 | Semiconductor wafer protective tape cutting method and protective tape cutting device |
| JP2004195679 | 2004-07-01 |
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| Publication Number | Publication Date |
|---|---|
| CN1715019A true CN1715019A (en) | 2006-01-04 |
| CN100471632C CN100471632C (en) | 2009-03-25 |
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| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CNB2005100818660A Expired - Fee Related CN100471632C (en) | 2004-07-01 | 2005-07-01 | Protective tape cutting method and protective tape cutting device of semiconductor wafer |
Country Status (4)
| Country | Link |
|---|---|
| JP (1) | JP4640763B2 (en) |
| KR (1) | KR101140052B1 (en) |
| CN (1) | CN100471632C (en) |
| TW (1) | TWI330582B (en) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101447407B (en) * | 2007-11-26 | 2012-05-02 | 日东电工株式会社 | Method for cutting protective tape of semiconductor wafer and protective tape cutting device |
| CN108607828A (en) * | 2016-12-12 | 2018-10-02 | 宁波方太厨具有限公司 | A kind of efficient gel resin finishing machine |
Families Citing this family (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP4890868B2 (en) * | 2006-01-18 | 2012-03-07 | リンテック株式会社 | Sheet cutting device and cutting method |
| JP5160297B2 (en) * | 2008-05-02 | 2013-03-13 | 日東電工株式会社 | Cutter blade cleaning method, cutter blade cleaning device, and adhesive tape attaching device having the same |
| JP5180762B2 (en) * | 2008-09-30 | 2013-04-10 | パナソニック株式会社 | Method for forming protective film on wafer |
| JP2013230532A (en) * | 2012-05-01 | 2013-11-14 | Nitto Denko Corp | Protective tape cutting method and protective tape cutting apparatus of semiconductor wafer |
| TWI631607B (en) * | 2017-08-09 | 2018-08-01 | 志聖工業股份有限公司 | Film cutting device and film cutting method thereof |
| JP7681414B2 (en) * | 2021-03-25 | 2025-05-22 | 株式会社ディスコ | Protective sheet attachment device |
Family Cites Families (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS62236738A (en) * | 1986-04-07 | 1987-10-16 | 日東電工株式会社 | Method of punching film for protecting thin board |
| JPH0536657A (en) * | 1991-07-29 | 1993-02-12 | Nitto Denko Corp | Protective tape cutting device for semiconductor wafer |
| JP2001345252A (en) * | 2000-05-30 | 2001-12-14 | Hyper Photon Systens Inc | Laser cutter |
-
2004
- 2004-07-01 JP JP2004195679A patent/JP4640763B2/en not_active Expired - Fee Related
-
2005
- 2005-05-27 KR KR1020050044777A patent/KR101140052B1/en not_active Expired - Fee Related
- 2005-06-30 TW TW094122027A patent/TWI330582B/en not_active IP Right Cessation
- 2005-07-01 CN CNB2005100818660A patent/CN100471632C/en not_active Expired - Fee Related
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101447407B (en) * | 2007-11-26 | 2012-05-02 | 日东电工株式会社 | Method for cutting protective tape of semiconductor wafer and protective tape cutting device |
| CN108607828A (en) * | 2016-12-12 | 2018-10-02 | 宁波方太厨具有限公司 | A kind of efficient gel resin finishing machine |
Also Published As
| Publication number | Publication date |
|---|---|
| KR101140052B1 (en) | 2012-05-07 |
| JP4640763B2 (en) | 2011-03-02 |
| TW200615102A (en) | 2006-05-16 |
| CN100471632C (en) | 2009-03-25 |
| TWI330582B (en) | 2010-09-21 |
| JP2006015453A (en) | 2006-01-19 |
| KR20060048128A (en) | 2006-05-18 |
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