CN1766595B - Method and device for improving absorptivity and emissivity in infrared thermal wave nondestructive testing - Google Patents
Method and device for improving absorptivity and emissivity in infrared thermal wave nondestructive testing Download PDFInfo
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- CN1766595B CN1766595B CN 200510125666 CN200510125666A CN1766595B CN 1766595 B CN1766595 B CN 1766595B CN 200510125666 CN200510125666 CN 200510125666 CN 200510125666 A CN200510125666 A CN 200510125666A CN 1766595 B CN1766595 B CN 1766595B
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- infrared thermal
- thermal wave
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- wave nondestructive
- emissivity
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Abstract
The invention relates to an infrared thermal wave nondestructive testing technology, in particular to a method and a device for improving the surface absorptivity and emissivity of a tested object in the infrared thermal wave nondestructive testing process. The method is characterized in that in the infrared thermal wave nondestructive testing process, a functional film with good visible light absorptivity and infrared emissivity is selected to wrap a tested object, and the functional film is tightly contacted with the tested object by a method of pumping air between the surface of the tested object and the film. The device for realizing the method is characterized in that the anti-reflection vacuum bag is formed by the functional film, and the vacuum bag is provided with an air exhaust hole and a buckle for sealing. The invention can realize that the detected object is not stained completely in the detection process, and simultaneously can improve the absorptivity and the infrared emissivity of the detected object to visible light, thereby greatly improving the detection effect of infrared thermal wave nondestructive detection on the object which has higher surface reflectivity and can not be painted, and being suitable for the infrared thermal wave nondestructive detection of easily corroded or precise aerospace and aviation devices.
Description
Technical field
The present invention relates to the infrared thermal wave Dynamic Non-Destruction Measurement, especially in infrared thermal wave Non-Destructive Testing process, improve the method and the device thereof of testee surface absorptivity and emissivity.
Background technology
The infrared thermal wave Dynamic Non-Destruction Measurement is based on the heat wave theory, the detected material surface is heated, utilize equipment such as thermal infrared imager to write down the variation of body surface temperature, come have the kind of zero defect and defective and character to distinguish interior of articles by interpretation to surface temperature field.Infrared thermal wave detection technique and traditional thermal imaging one is remarkable, and different what be exactly that its adopts is defective under the ACTIVE CONTROL formula heating technique drive surface.Adopting under the situation of visible light as the thermal excitation source, for some surperficial visible light strong reflection objects (as most of metal), often need carry out spray treatment to its surface, improve the visible-light absorptivity and the infrared emittance on testee surface.But for some corrosion-vulnerable or accurate space flight, aviation device, this kind anti-reflex treated can cause pollution to a certain degree even damages the testee surface, has limited the application in this respect of infrared thermal wave Dynamic Non-Destruction Measurement.
Summary of the invention
For overcoming this testee surface treatment method of spraying testee is caused stained deficiency, the invention provides the method and the device that improve testee surface visible-light absorptivity and infrared emittance in a kind of infrared thermal wave Non-Destructive Testing, it can guarantee object to be detected is not had fully stained, thereby is applicable to the infrared thermal wave Non-Destructive Testing to perishable or accurate space flight, aviation device.
The present invention realizes by the following technical solutions:
In infrared thermal wave Non-Destructive Testing process, select function film for use with better visible-light absorptivity and infrared emittance, wrap up or the covering testee, and functional membrane is closely contacted with testee by the method that air between testee surface and the film is taken out.
At the difference of testee size, the invention provides two kinds of devices of realizing said method.
Device 1: be independent of the vacuum film covering device of detection system, promptly with the antireflection vacuum bag of aspirating hole.At first object to be detected is put into the antireflection vacuum bag during use and also sealed,, vacuum bag and detected material surface is closely contacted by the air in the aspirating hole extraction vacuum bag, and then the infrared thermal wave detection system detection of the testee of the above-mentioned processing of process.
Vacuum bag can adopt elasticity and the higher thin polymer film of ductility/strength, and require this polymkeric substance that visible-light absorptivity and infrared emittance are preferably arranged, do not possess higher visible-light absorptivity and infrared emittance can spray anti reflection paint thereon as film.
Device 2: on the basis of existing infrared thermal wave nondestructive detection system, the flashlamp shade is improved.Increasing a rubber skirt between flashlamp shade and testee surface encloses, shape and size that rubber skirt is placed port and flashlamp shade lower port match, can connect together, the lower port that rubber skirt is enclosed is opened wide, and match with the surface configuration and the radian of testee, rubber skirt puts and leaves aspirating hole.In measuring process, the lower port of rubber skirt cover is placed on the surface of testee, film is covered the upper port that rubber skirt is enclosed, the upper port that the lower port of flashlamp shade and rubber skirt are enclosed connects together then, simultaneously film is blocked, extract out between film and the testee surface by checking matter surface, film and rubber skirt by aspirating hole then and enclose air in the confined space that forms, make film closely be attached on the testee surface.Requiring used rubber skirt to enclose will have certain elasticity, and its effect has two: the one, and fixed film; The 2nd, between film and testee surface, form a confined space.Place out aspirating hole in rubber skirt, can extract the air between film and the measured object out, film is closely contacted with the testee surface.
Second kind of device is applicable to and detects large-area object or carry out the outfield detection, it is that original detection system flashlamp shade is improved the device that obtains, can design shape and lower limb radian that rubber skirt is enclosed according to the shape of object to be detected, make it better and the testee applying.
Two kinds of devices all need to extract out gas in the sealing area, can utilize mobile equilibrium to keep film to contact with the tight of testee surface in testing process.
The present invention can realize in the testing process that object to be detected is not had stained the time fully, can also improve absorptivity and the infrared emittance of testee, thereby improve the detection effect of infrared thermal wave Non-Destructive Testing and can not the spray paint object handled higher greatly surface reflectivity to visible light.
Description of drawings
Fig. 1 is the vacuum film covering device synoptic diagram that is independent of detection system;
Fig. 2 is for improving the assembling synoptic diagram of vacuum film covering device in the infrared thermal wave nondestructive detection system of back;
Fig. 3 is for improving the diagrammatic cross-section of vacuum film covering device in the infrared thermal wave nondestructive detection system of back.
Embodiment
The present invention is described in further detail below in conjunction with accompanying drawing.
Embodiment 1: for the vacuum film covering device that is independent of detection system, referring to Fig. 1, at first will choose the vacuum bag 1 of appropriate materials, the material that requires vacuum bag 1 is elasticity and the higher thin polymer film of ductility/strength, has visible-light absorptivity and infrared emittance preferably.Detected material 2 pack into the vacuum bag 1 interior buckle 4 of also using with vacuum bag 1 sealing, by the air in the aspirating hole 3 extraction vacuum bags 1, no air-gap and closely contacting between the film that makes vacuum bag 1 and the detected material 2, aspirating hole 3 is connected to vacuum extractor by tracheae 5.If will further improve the visible-light absorptivity and the infrared emittance on film surface, can carry out even spray treatment on the surface of film.
Embodiment 2: the vacuum film covering device in the infrared thermal wave nondestructive detection system is referring to Fig. 2 and Fig. 3.Between flashlamp shade 6 and testee surface 12, increase a rubber skirt and enclose 9, making rubber skirt encloses 9 elastomeric material certain elasticity should be arranged, rubber skirt enclose the shape of 9 upper port and size and flashlamp shade 6 lower port shape and size be complementary, rubber skirt is enclosed the shape and the radian of 9 lower port need be according to the shape and the design of surperficial radian of test specimen.Enclose in rubber skirt and to have aspirating hole 10 on 9.Film 8 is covered rubber skirt enclose 9 upper port, then the lower port of flashlamp shade 6 is inserted rubber skirt and enclose 9 upper port, simultaneously film 8 is blocked, in measuring process, the lower port of rubber skirt cover 9 is placed on the testee surface 12, between detected material surface 12 and film 8, enclose 9 like this and just form a confined space by checking matter surface 12, film 8 and rubber skirt, the air of extracting out in the confined space by aspirating hole 10 makes film 8 closely be attached on the testee surface 12 then.Detecting mouth 7 is openings of placing the thermal imaging system camera lens, and flashlamp 11 is as the thermal excitation source of infrared thermal wave Non-Destructive Testing.
Claims (1)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 200510125666 CN1766595B (en) | 2005-12-02 | 2005-12-02 | Method and device for improving absorptivity and emissivity in infrared thermal wave nondestructive testing |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN 200510125666 CN1766595B (en) | 2005-12-02 | 2005-12-02 | Method and device for improving absorptivity and emissivity in infrared thermal wave nondestructive testing |
Related Child Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CNA2008101678577A Division CN101368920A (en) | 2005-12-02 | 2005-12-02 | Device for Improving Absorptivity and Emissivity in Infrared Thermal Wave Nondestructive Testing |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN1766595A CN1766595A (en) | 2006-05-03 |
| CN1766595B true CN1766595B (en) | 2010-07-28 |
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| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN 200510125666 Expired - Fee Related CN1766595B (en) | 2005-12-02 | 2005-12-02 | Method and device for improving absorptivity and emissivity in infrared thermal wave nondestructive testing |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN1766595B (en) |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103675020B (en) * | 2013-12-18 | 2016-04-20 | 工业和信息化部电子第五研究所 | Electronic package emissivity detection system |
| CN103822942B (en) * | 2014-02-28 | 2016-08-17 | 武汉理工大学 | Active xenon lamp array harmonic wave heat exciter |
Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1065024A (en) * | 1992-04-09 | 1992-10-07 | 天津市硅酸盐研究所 | Fast heating far-infrared therapeutic bag |
| US5745238A (en) * | 1992-12-22 | 1998-04-28 | International Business Machines Corporation | Apparatus and method for non-destructive inspection and/or measurement |
| CN1620603A (en) * | 2002-01-23 | 2005-05-25 | 马雷纳系统有限公司 | Employing infrared thermography for defect detection and analysis |
-
2005
- 2005-12-02 CN CN 200510125666 patent/CN1766595B/en not_active Expired - Fee Related
Patent Citations (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN1065024A (en) * | 1992-04-09 | 1992-10-07 | 天津市硅酸盐研究所 | Fast heating far-infrared therapeutic bag |
| US5745238A (en) * | 1992-12-22 | 1998-04-28 | International Business Machines Corporation | Apparatus and method for non-destructive inspection and/or measurement |
| CN1620603A (en) * | 2002-01-23 | 2005-05-25 | 马雷纳系统有限公司 | Employing infrared thermography for defect detection and analysis |
Non-Patent Citations (3)
| Title |
|---|
| JP特开2000-46772A 2000.02.18 |
| 李艳红等.碳纤维复合材料的红外热波检测.激光与红外35 4.2005,35(4),262-264. |
| 李艳红等.碳纤维复合材料的红外热波检测.激光与红外35 4.2005,35(4),262-264. * |
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| Publication number | Publication date |
|---|---|
| CN1766595A (en) | 2006-05-03 |
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Granted publication date: 20100728 Termination date: 20211202 |