CN1249038A - 磁传感器 - Google Patents
磁传感器 Download PDFInfo
- Publication number
- CN1249038A CN1249038A CN98802893A CN98802893A CN1249038A CN 1249038 A CN1249038 A CN 1249038A CN 98802893 A CN98802893 A CN 98802893A CN 98802893 A CN98802893 A CN 98802893A CN 1249038 A CN1249038 A CN 1249038A
- Authority
- CN
- China
- Prior art keywords
- circuit
- magnetic sensor
- resistance
- temperature coefficient
- signal processing
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Images
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N—ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10N50/00—Galvanomagnetic devices
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R33/00—Arrangements or instruments for measuring magnetic variables
- G01R33/02—Measuring direction or magnitude of magnetic fields or magnetic flux
- G01R33/06—Measuring direction or magnitude of magnetic fields or magnetic flux using galvano-magnetic devices
- G01R33/07—Hall effect devices
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
- G01D3/00—Indicating or recording apparatus with provision for the special purposes referred to in the subgroups
- G01D3/028—Indicating or recording apparatus with provision for the special purposes referred to in the subgroups mitigating undesired influences, e.g. temperature, pressure
- G01D3/036—Indicating or recording apparatus with provision for the special purposes referred to in the subgroups mitigating undesired influences, e.g. temperature, pressure on measuring arrangements themselves
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Measuring Magnetic Variables (AREA)
- Hall/Mr Elements (AREA)
- Geophysics And Detection Of Objects (AREA)
Abstract
Description
Claims (9)
Applications Claiming Priority (4)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP4637697 | 1997-02-28 | ||
| JP46376/1997 | 1997-02-28 | ||
| JP17211497 | 1997-06-27 | ||
| JP172114/1997 | 1997-06-27 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN1249038A true CN1249038A (zh) | 2000-03-29 |
| CN1124494C CN1124494C (zh) | 2003-10-15 |
Family
ID=26386487
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN98802893A Expired - Lifetime CN1124494C (zh) | 1997-02-28 | 1998-02-27 | 磁传感器 |
Country Status (9)
| Country | Link |
|---|---|
| US (1) | US6448768B1 (zh) |
| EP (1) | EP0964259B1 (zh) |
| JP (1) | JP3362858B2 (zh) |
| KR (1) | KR100338611B1 (zh) |
| CN (1) | CN1124494C (zh) |
| AT (1) | ATE310249T1 (zh) |
| DE (1) | DE69832368T2 (zh) |
| TW (1) | TW422994B (zh) |
| WO (1) | WO1998038519A1 (zh) |
Cited By (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN101937063A (zh) * | 2010-08-11 | 2011-01-05 | 上海腾怡半导体有限公司 | 磁场传感器 |
| CN102460199A (zh) * | 2009-06-30 | 2012-05-16 | 旭化成微电子株式会社 | 磁传感器 |
| CN107305240A (zh) * | 2016-04-20 | 2017-10-31 | 德昌电机(深圳)有限公司 | 磁传感器集成电路、电机组件及应用设备 |
| CN111208452A (zh) * | 2019-11-07 | 2020-05-29 | 中国计量大学 | 一种用于多铁性磁传感器的直读式读出系统 |
Families Citing this family (50)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE19913074C2 (de) * | 1999-03-23 | 2001-07-26 | Wacker Werke Kg | Bodenverdichtungsvorrichtung mit Servosteuerung |
| US6693033B2 (en) | 2000-02-10 | 2004-02-17 | Motorola, Inc. | Method of removing an amorphous oxide from a monocrystalline surface |
| US6392257B1 (en) | 2000-02-10 | 2002-05-21 | Motorola Inc. | Semiconductor structure, semiconductor device, communicating device, integrated circuit, and process for fabricating the same |
| WO2001093336A1 (en) | 2000-05-31 | 2001-12-06 | Motorola, Inc. | Semiconductor device and method for manufacturing the same |
| US6501973B1 (en) | 2000-06-30 | 2002-12-31 | Motorola, Inc. | Apparatus and method for measuring selected physical condition of an animate subject |
| US6555946B1 (en) | 2000-07-24 | 2003-04-29 | Motorola, Inc. | Acoustic wave device and process for forming the same |
| WO2002009187A2 (en) | 2000-07-24 | 2002-01-31 | Motorola, Inc. | Heterojunction tunneling diodes and process for fabricating same |
| WO2002016955A2 (en) * | 2000-08-18 | 2002-02-28 | Motorola, Inc. | Compound semiconductor hall sensor |
| US6638838B1 (en) | 2000-10-02 | 2003-10-28 | Motorola, Inc. | Semiconductor structure including a partially annealed layer and method of forming the same |
| US6501121B1 (en) | 2000-11-15 | 2002-12-31 | Motorola, Inc. | Semiconductor structure |
| US20020096683A1 (en) | 2001-01-19 | 2002-07-25 | Motorola, Inc. | Structure and method for fabricating GaN devices utilizing the formation of a compliant substrate |
| US6673646B2 (en) | 2001-02-28 | 2004-01-06 | Motorola, Inc. | Growth of compound semiconductor structures on patterned oxide films and process for fabricating same |
| DE10145657C1 (de) * | 2001-03-10 | 2002-10-10 | Automation Hans Nix Gmbh & Co | Verfahren zur Eliminierung von Fehlereinflüssen bei dem Einsatz von Magnetfeld-Sensoren zur Schichtdickenmessung |
| WO2002082551A1 (en) | 2001-04-02 | 2002-10-17 | Motorola, Inc. | A semiconductor structure exhibiting reduced leakage current |
| US6709989B2 (en) | 2001-06-21 | 2004-03-23 | Motorola, Inc. | Method for fabricating a semiconductor structure including a metal oxide interface with silicon |
| US6992321B2 (en) | 2001-07-13 | 2006-01-31 | Motorola, Inc. | Structure and method for fabricating semiconductor structures and devices utilizing piezoelectric materials |
| US6646293B2 (en) | 2001-07-18 | 2003-11-11 | Motorola, Inc. | Structure for fabricating high electron mobility transistors utilizing the formation of complaint substrates |
| US7019332B2 (en) | 2001-07-20 | 2006-03-28 | Freescale Semiconductor, Inc. | Fabrication of a wavelength locker within a semiconductor structure |
| US6693298B2 (en) | 2001-07-20 | 2004-02-17 | Motorola, Inc. | Structure and method for fabricating epitaxial semiconductor on insulator (SOI) structures and devices utilizing the formation of a compliant substrate for materials used to form same |
| US6855992B2 (en) | 2001-07-24 | 2005-02-15 | Motorola Inc. | Structure and method for fabricating configurable transistor devices utilizing the formation of a compliant substrate for materials used to form the same |
| US6667196B2 (en) | 2001-07-25 | 2003-12-23 | Motorola, Inc. | Method for real-time monitoring and controlling perovskite oxide film growth and semiconductor structure formed using the method |
| US6594414B2 (en) | 2001-07-25 | 2003-07-15 | Motorola, Inc. | Structure and method of fabrication for an optical switch |
| US6585424B2 (en) | 2001-07-25 | 2003-07-01 | Motorola, Inc. | Structure and method for fabricating an electro-rheological lens |
| US6589856B2 (en) | 2001-08-06 | 2003-07-08 | Motorola, Inc. | Method and apparatus for controlling anti-phase domains in semiconductor structures and devices |
| US6639249B2 (en) | 2001-08-06 | 2003-10-28 | Motorola, Inc. | Structure and method for fabrication for a solid-state lighting device |
| US20030034491A1 (en) | 2001-08-14 | 2003-02-20 | Motorola, Inc. | Structure and method for fabricating semiconductor structures and devices for detecting an object |
| US6673667B2 (en) | 2001-08-15 | 2004-01-06 | Motorola, Inc. | Method for manufacturing a substantially integral monolithic apparatus including a plurality of semiconductor materials |
| US20030071327A1 (en) | 2001-10-17 | 2003-04-17 | Motorola, Inc. | Method and apparatus utilizing monocrystalline insulator |
| US6916717B2 (en) | 2002-05-03 | 2005-07-12 | Motorola, Inc. | Method for growing a monocrystalline oxide layer and for fabricating a semiconductor device on a monocrystalline substrate |
| US7317313B2 (en) * | 2002-11-14 | 2008-01-08 | Measurement Specialties, Inc. | Magnetic encoder apparatus |
| US7169619B2 (en) | 2002-11-19 | 2007-01-30 | Freescale Semiconductor, Inc. | Method for fabricating semiconductor structures on vicinal substrates using a low temperature, low pressure, alkaline earth metal-rich process |
| US6885065B2 (en) | 2002-11-20 | 2005-04-26 | Freescale Semiconductor, Inc. | Ferromagnetic semiconductor structure and method for forming the same |
| US6965128B2 (en) | 2003-02-03 | 2005-11-15 | Freescale Semiconductor, Inc. | Structure and method for fabricating semiconductor microresonator devices |
| US7020374B2 (en) | 2003-02-03 | 2006-03-28 | Freescale Semiconductor, Inc. | Optical waveguide structure and method for fabricating the same |
| US7768048B2 (en) * | 2003-09-09 | 2010-08-03 | Asahi Kasei Emd Corporation | Infrared sensor IC, and infrared sensor and manufacturing method thereof |
| US7217981B2 (en) * | 2005-01-06 | 2007-05-15 | International Business Machines Corporation | Tunable temperature coefficient of resistance resistors and method of fabricating same |
| US7630159B2 (en) * | 2005-05-27 | 2009-12-08 | Agere Systems Inc. | Resistance mode comparator for determining head resistance |
| CN101331385B (zh) * | 2005-12-16 | 2011-11-30 | 旭化成电子材料元件株式会社 | 位置检测装置 |
| JP2008151530A (ja) * | 2006-12-14 | 2008-07-03 | Denso Corp | 磁界検出用半導体集積回路 |
| JP4940965B2 (ja) * | 2007-01-29 | 2012-05-30 | 株式会社デンソー | 回転センサ及び回転センサ装置 |
| KR101046029B1 (ko) * | 2010-04-23 | 2011-07-01 | 삼성전기주식회사 | 홀 소자 및 자기 센서 회로 |
| CN102445671B (zh) * | 2010-10-13 | 2015-12-16 | 北京中科信电子装备有限公司 | 一种霍尔器件误差补偿电路 |
| JP6073705B2 (ja) * | 2013-02-26 | 2017-02-01 | エスアイアイ・セミコンダクタ株式会社 | ヒューズ回路及び半導体集積回路装置 |
| US9322840B2 (en) * | 2013-07-01 | 2016-04-26 | Infineon Technologies Ag | Resistive element |
| US9910088B2 (en) | 2013-12-26 | 2018-03-06 | Allegro Microsystems, Llc | Methods and apparatus for sensor diagnostics including programmable self-test signals |
| JP6370620B2 (ja) * | 2014-06-27 | 2018-08-08 | エイブリック株式会社 | 磁気センサ |
| US10527703B2 (en) | 2015-12-16 | 2020-01-07 | Allegro Microsystems, Llc | Circuits and techniques for performing self-test diagnostics in a magnetic field sensor |
| CN107167164B (zh) * | 2016-03-08 | 2020-11-06 | 艾普凌科有限公司 | 磁传感器和磁传感器装置 |
| JP6994843B2 (ja) * | 2017-04-28 | 2022-01-14 | エイブリック株式会社 | 磁気センサ回路 |
| JP7200760B2 (ja) * | 2019-03-08 | 2023-01-10 | Tdk株式会社 | 磁気抵抗効果デバイス及び磁気アレイ |
Family Cites Families (15)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US4371837A (en) | 1979-11-13 | 1983-02-01 | American Can Company | Temperature compensated input power and output offset circuits for a hall effect transducer |
| JPS61226982A (ja) | 1985-04-01 | 1986-10-08 | Asahi Chem Ind Co Ltd | ハイブリツド・ホ−ルic |
| DE3827606A1 (de) * | 1987-08-18 | 1989-03-02 | Kostal Leopold Gmbh & Co Kg | Temperaturkompensationsschaltung fuer einen hall-generator |
| JP2565528B2 (ja) | 1988-01-22 | 1996-12-18 | 株式会社日立製作所 | ヒステリシスコンパレータ回路 |
| JPH01214784A (ja) | 1988-02-23 | 1989-08-29 | Fujitsu Ltd | 磁気検出装置及びそのバイアス磁界設定方法 |
| JPH0238920A (ja) | 1988-07-29 | 1990-02-08 | Nec Corp | 温度補正形増幅回路 |
| JPH0336979A (ja) | 1989-06-30 | 1991-02-18 | Fanuc Ltd | 可変リラクタンス型acサーボモータ制御方式 |
| DE4030085A1 (de) * | 1990-09-22 | 1992-03-26 | Philips Patentverwaltung | Auswerteschaltung fuer einen magnetoresistiven drehzahlsensor o. dgl. |
| JPH06289111A (ja) | 1993-04-02 | 1994-10-18 | Stanley Electric Co Ltd | ホール素子の駆動回路 |
| JPH08139386A (ja) | 1994-11-11 | 1996-05-31 | Mitsubishi Electric Corp | 波形整形回路 |
| JPH08194040A (ja) * | 1995-01-18 | 1996-07-30 | Mitsubishi Electric Corp | 磁電変換装置 |
| JPH0954149A (ja) * | 1995-08-17 | 1997-02-25 | Mitsubishi Electric Corp | 半導体磁電変換装置 |
| US6100680A (en) * | 1996-01-17 | 2000-08-08 | Allegro Microsystems, Inc. | Detecting the passing of magnetic articles using a transducer-signal detector having a switchable dual-mode threshold |
| JPH09318387A (ja) * | 1996-05-30 | 1997-12-12 | Mitsubishi Electric Corp | 検出装置 |
| US5831426A (en) * | 1996-08-16 | 1998-11-03 | Nonvolatile Electronics, Incorporated | Magnetic current sensor |
-
1998
- 1998-02-27 US US09/380,315 patent/US6448768B1/en not_active Expired - Lifetime
- 1998-02-27 WO PCT/JP1998/000841 patent/WO1998038519A1/ja not_active Ceased
- 1998-02-27 JP JP53752398A patent/JP3362858B2/ja not_active Expired - Lifetime
- 1998-02-27 DE DE69832368T patent/DE69832368T2/de not_active Expired - Lifetime
- 1998-02-27 CN CN98802893A patent/CN1124494C/zh not_active Expired - Lifetime
- 1998-02-27 AT AT98905712T patent/ATE310249T1/de not_active IP Right Cessation
- 1998-02-27 EP EP98905712A patent/EP0964259B1/en not_active Expired - Lifetime
- 1998-02-27 KR KR1019997007899A patent/KR100338611B1/ko not_active Expired - Lifetime
- 1998-02-27 TW TW087102951A patent/TW422994B/zh not_active IP Right Cessation
Cited By (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN102460199A (zh) * | 2009-06-30 | 2012-05-16 | 旭化成微电子株式会社 | 磁传感器 |
| CN102460199B (zh) * | 2009-06-30 | 2014-01-08 | 旭化成微电子株式会社 | 磁传感器 |
| US8963545B2 (en) | 2009-06-30 | 2015-02-24 | Asahi Kasei Microdevices Corporation | Magnetic sensor |
| CN101937063A (zh) * | 2010-08-11 | 2011-01-05 | 上海腾怡半导体有限公司 | 磁场传感器 |
| CN107305240A (zh) * | 2016-04-20 | 2017-10-31 | 德昌电机(深圳)有限公司 | 磁传感器集成电路、电机组件及应用设备 |
| CN111208452A (zh) * | 2019-11-07 | 2020-05-29 | 中国计量大学 | 一种用于多铁性磁传感器的直读式读出系统 |
Also Published As
| Publication number | Publication date |
|---|---|
| JP3362858B2 (ja) | 2003-01-07 |
| US20020021126A1 (en) | 2002-02-21 |
| DE69832368D1 (de) | 2005-12-22 |
| EP0964259B1 (en) | 2005-11-16 |
| KR100338611B1 (ko) | 2002-05-27 |
| EP0964259A4 (en) | 2000-11-22 |
| WO1998038519A1 (fr) | 1998-09-03 |
| ATE310249T1 (de) | 2005-12-15 |
| DE69832368T2 (de) | 2006-08-03 |
| US6448768B1 (en) | 2002-09-10 |
| KR20000075825A (ko) | 2000-12-26 |
| TW422994B (en) | 2001-02-21 |
| CN1124494C (zh) | 2003-10-15 |
| EP0964259A1 (en) | 1999-12-15 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C06 | Publication | ||
| PB01 | Publication | ||
| C10 | Entry into substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| C41 | Transfer of patent application or patent right or utility model | ||
| TA01 | Transfer of patent application right |
Effective date of registration: 20010613 Applicant after: Asahi Kasei Electronics Co., Ltd. Applicant after: Asahi Kasei Kogyo K. K. Applicant before: Asahi Kasei Electronics Co., Ltd. Applicant before: Asahi Kasei Kogyo K. K. |
|
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant | ||
| ASS | Succession or assignment of patent right |
Owner name: ASAHI KASEI EMD CORP. Free format text: FORMER OWNER: ASAHI KASEI CORPORATION Effective date: 20040407 |
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| C41 | Transfer of patent application or patent right or utility model | ||
| TR01 | Transfer of patent right |
Effective date of registration: 20040407 Address after: Tokyo, Japan Co-patentee after: Asahi Chemical Ind Patentee after: Asahi Kasei Electronics Co., Ltd. Address before: Tokyo, Japan Co-patentee before: Asahi Kasei Kogyo K. K. Patentee before: Asahi Kasei Electronics Co., Ltd. |
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Owner name: ASAHI KASEI EMD CORP. Free format text: FORMER OWNER: ASAHI KASEI ELECTRONICS CO. LTD.; ASAHI KASEI EMD CORP. Effective date: 20071130 |
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| C41 | Transfer of patent application or patent right or utility model | ||
| TR01 | Transfer of patent right |
Effective date of registration: 20071130 Address after: Tokyo, Japan, Japan Patentee after: Asahi Chemical Ind Address before: Tokyo Co-patentee before: Asahi Chemical Ind Patentee before: Asahi Electronics Co., Ltd. |
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| CX01 | Expiry of patent term |
Granted publication date: 20031015 |
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| CX01 | Expiry of patent term |