CN111858197A

CN111858197A - Device, system and method for supporting multiple SSD tests

Info

Publication number: CN111858197A
Application number: CN202010540577.7A
Authority: CN
Inventors: 詹毕旺
Original assignee: Individual
Current assignee: Individual
Priority date: 2020-06-15
Filing date: 2020-06-15
Publication date: 2020-10-30

Abstract

The invention relates to a testing device supporting multiple SSD tests, which comprises a control board and a test board, wherein the control board and the test board are detachably mounted with each other, the test board is used for mounting an SSD product to be tested, the control board is in communication connection with an external host through Ethernet and comprises a software running module, a control module and an interface module, the software running module is used for providing a running environment for testing software, and the control module is used for identifying the type of the SSD product and controlling the interface module to configure an interface into a corresponding type; during testing, the SSD product is firstly installed on the test board, the test board is inserted into the control board, the control module identifies the type of the SSD product in the test board, the interface module is controlled to configure the interface into a corresponding type, then the software operation module is started, and the test software carries out read-write test on the SSD product in the operation environment provided by the software operation module.

Description

Device, system and method for supporting multiple SSD tests

Technical Field

The present invention relates to the field of SSD testing, and in particular, to an apparatus, system, and method for supporting multiple SSD tests.

Background

SSD products are various in types, and can be divided into SATA interfaces and PCIe interfaces by interface protocol division; PCIe interfaces SSD can be further classified into AIC (Add-In-Card), m.2, U2, EDSFF, and sip (system In package) products according to their physical interface forms. Each SSD testing process involves multiple testing sites, and how to implement the requirement of supporting different SSD tests and different testing sites is a difficult problem in the industry.

The conventional SSD testing technical architecture is mainly realized in a mode of 'a server workstation + a slave PC + a control board', wherein the server workstation is responsible for managing each slave PC, configuring test software and test parameters, and downloading the configured test software to the slave PC; the slave PC tests the corresponding SSD based on specific test software, returns test data to the server workstation and displays the test data in a graphical interface; and the control board is provided with an SSD product for completing the analysis of the data command issued by the PC end, executing corresponding operation and returning test data to the slave PC. The slave PCs are in data communication with the server workstation through Ethernet, the slave PCs are connected with the control board through PCIe high-speed cables relative to an SSD test protocol part, and Ethernet serial port switching, USB serial port switching and PCIE serial port switching are needed for communication in order to control some related circuits of the SSD test;

The prior art scheme and the defects thereof are as follows:

(1) PC or motherboard test based solutions: because the PC mainboard is not specially designed for SSD test and can not meet all SSD test requirements, such as hot plugging, voltage and current monitoring, limited slot number, the need of adapter cards and the like, the scheme can only carry out SSD verification stage test in a laboratory, is not suitable for mass production or reliability test and can not meet the test requirements of each site of the SSD.

(2) The scheme based on the PC + test platform is as follows: the main functions of the test platform comprise a control function and an interface conversion function, and the PC is directly connected with the SSD on the test platform through a high-speed cable. Because the PC is not specially customized for testing the SSD, the PC or the motherboard is usually only reserved with the pcie x16 and pcie x8 slots, and only two SSDs can be externally connected, regardless of pcie x8, pcie x4, or pcie x2, this scheme also faces the problem of low test density, and cannot be applied to the test in the mass production stage, and in the reliability test stage, the SSD cannot be heated alone to test the reliability of the SSD at high temperature.

(3) PC + test platform (with PCIE Switch) based scheme: the scheme improves the testing density of a single SSD product, but the whole testing platform needs to be redesigned for testing multiple SSD products, so that the testing cost is increased, and meanwhile, the testing environment temperature is not controllable due to large heat productivity of the mainboard and the mainboard does not have a PCIe Hotplug function; the occupied area is too large, manual intervention is too much especially in the mass production stage, and the operation of factory operators is difficult.

Disclosure of Invention

The present invention aims to overcome the defects of the prior art, and provides a device, a system and a method for supporting multiple SSD tests, which can be flexibly configured to be disassembled, support the tests of multiple SSD products, can meet the test requirements of each test site, do not need to be redesigned, and effectively reduce the test cost.

The purpose of the invention can be realized by the following technical scheme:

the test device is characterized by comprising a control board and a test board which are detachably mounted with each other, wherein the test board is used for mounting an SSD product to be tested, the control board is in communication connection with an external host through Ethernet and comprises a software operation module, a control module and an interface module which are connected with each other, the software operation module is used for providing an operation environment for test software, and the control module is used for identifying the type of the SSD product and controlling the interface module to configure the interface into a corresponding type;

during testing, the SSD product is firstly installed on the test board, the test board is inserted into the control board, the control module identifies the type of the SSD product in the test board, the interface module is controlled to configure the interface into a corresponding type, then the software running module is started, and the test software carries out read-write test on the SSD product in the running environment provided by the software running module.

In the invention, the same testing device can support the testing of various SSD products, the control board and the testing board are connected through the inter-board connector and are directly inserted and installed, when the testing of different SSD products is performed, only the testing board needs to be replaced, when the testing board loaded with the SSD products is inserted into the control board, the control board can intelligently identify the type of the inserted SSD products and is configured into different PCIe interfaces, the testing device can be repeatedly utilized, redesign is not needed, and the testing cost is effectively reduced.

Preferably, the software running module includes an industrial personal computer, the control module includes an MCU chip, the interface module includes a PCIe Switch chip, the industrial personal computer is configured to provide a running environment for the test software, the MCU chip is configured to read the type of the SSD product on the test board, and configure the PCIe Switch chip interface into a corresponding type, and the PCIe Switch chip is configured to implement a PCIe Switch function and an SSD hot plug function.

In the invention, the control panel is preferably assembled by adopting a plurality of panels, and specifically comprises a motherboard, an MCU (microprogrammed control unit) panel, a power panel and an industrial personal computer, wherein a PCIe Switch chip is arranged on the motherboard, the MCU chip is arranged on the MCU panel, the power panel and the industrial personal computer are respectively inserted on the motherboard, and the power panel provides different power sources for each path. However, the MCU chip, the PCIe Switch chip, the industrial personal computer, the power supply module, and the like may be integrated on the same board, and only when a function of a certain board has a problem or needs to be upgraded, the whole control board needs to be redesigned.

Further preferably, the configuring the PCIe Switch chip interface into the corresponding type specifically includes:

the PCIe Switch chip interface is configured as a PCIe ex2, PCIe ex4, or PCIe ex8 interface.

In the preferred scheme, tests of SSD products with different channel numbers such as PCIe interfaces PCIEX2, PCIEX4 and PCIEX8 and different physical interfaces such as AIC, U2, M.2, EDSFF, SiP (chip level), Dual Port and the like can be realized, and the application range is wide.

Preferably, the control board is further provided with an FPGA chip, the FPGA chip is used for replacing an industrial personal computer, an MCU chip and/or a PCIe Switch chip to realize functions of the FPGA chip, the FPGA chip is integrated with a plurality of IP cores, the IP cores are respectively used for providing a running environment for test software, reading a type of an SSD product on the test board and configuring an interface of the FPGA chip into a corresponding type, and the IP cores include a CPU IP, a PCIe Switch IP and an ethernet IP.

Further, the interface configuration type of the FPGA chip includes a pci ex8, a pci ex4, a pci ex2, or a SATA interface.

In the preferred scheme, when the FPGA chip replaces the PCIe Switch chip, not only the testing of SSD products with different channel numbers including PCIe interfaces PCIe 2, PCIe 4, PCIe 8, and different physical interfaces such as AIC, U2, m.2, EDSFF, SiP (chip level), Dual Port, and the like, but also the testing of SSD products with SATA interfaces can be implemented, thereby further expanding the application range.

Preferably, the industrial computer be the X86 mainboard, the X86 mainboard be connected with the control panel through standard connector, the industrial computer adopts the modularization and installs on the control panel with the support plate form, has improved the product integration greatly, does not need external cable, has reduced high-speed signal loss.

Preferably, the test board is only provided with an SSD product slot, the test board and the control board are connected by an inter-board connector and directly inserted for installation, the control module determines whether the test board is inserted and determines the type of the SSD product by reading a value of a TCB _ HWID [3:0] hardware pin, each BIT in the TCB _ HWID [3:0] signal includes a low level state, a High level state and a High level state, and the corresponding values are 0, 1 and High Z, respectively.

A system supporting multiple SSD tests comprises a switch, a host, a server and one or more test units, wherein the one or more test units are respectively connected with the host in an Ethernet mode through the switch, the host is connected with the server through the switch, and the test unit is the test device.

The whole system is based on the minimum test unit (i.e. the test device mentioned above), and can be flexibly assembled into different test systems by flexibly increasing or decreasing the number of test units in the face of different test sites and different customer requirements related to SSD products. Meanwhile, each test unit in the system is connected with the host or the server through the switch, and each test unit is arranged with a unique IP address, so that various test instructions can be remotely issued to the target test unit, and various problems possibly encountered in the factory test process can be conveniently diagnosed.

A test method supporting multiple kinds of SSD test devices according to claim 1, comprising the steps of:

s1: inserting a test board carrying an SSD product to be tested into a control board;

s2: the control module identifies the type of the SSD product in the test board and controls the interface module to configure the interface into a corresponding type;

s3: and starting the software running module, and performing read-write test on the SSD product by the test software in the running environment provided by the software running module.

Preferably, for a scheme in which the software running module includes an industrial personal computer, the control module includes an MCU chip, and the interface module includes a PCIe Switch chip, the step S2 specifically includes:

S201: the MCU detects whether a test board is inserted, if so, the step S202 is executed;

s202: the MCU detects the type of the SSD product to be tested;

s203: the MCU configures a PCIe Switch chip interface into a PCIex2 interface, a PCIex4 interface or a PCIex8 interface according to the detected SSD product type;

s204: the MCU resets the PCIe Switch chip and checks whether the power supply is normal, if so, the step S3 is executed;

the step S3 specifically includes: the industrial personal computer is started, and the test software carries out read-write test on the SSD product in the running environment provided by the industrial personal computer.

Preferably, for the scheme of replacing an industrial personal computer, an MCU chip and/or a PCIe Switch chip by the FPGA chip, a plurality of IP cores are integrated on the FPGA chip, and the IP cores comprise a CPU IP, a PCIe Switch IP and an Ethernet IP;

when the FPGA chip replaces the MCU chip and the PCIe Switch chip, the step S203 specifically includes: loading the corresponding PCIe Switch IP into the FPGA through the Ethernet, and configuring an FPGA chip interface into a PCIex8, a PCIex4, a PCIex2 or a SATA interface;

when the FPGA chip replaces the industrial personal computer, the step S3 specifically includes: and loading the CPU IP into the FPGA through the Ethernet to provide an operating environment for the test software, and performing read-write test on the SSD product by the test software.

Further, the detecting the type of the SSD product to be tested specifically includes: detecting the SSD product type through a hardware pin or detecting the SSD product type through software. The hardware detection mainly judges different SSD types according to different hardware pins, and the software detection mainly judges different SSD types by reading data in the test board EEPROM through an I2C interface, an SPI interface or other interfaces.

Compared with the prior art, the invention has the following advantages:

1) various SSD tests are supported: in the testing device, the control board and the testing board are connected and communicated through the board, the testing board only needs to be replaced when the testing board loaded with the SSD products is inserted into the control board, the control board can intelligently identify the type of the inserted SSD and configure the SSD into different PCIe interfaces when the testing board loaded with the SSD products is inserted into the control board, the testing can be repeatedly utilized, redesign is not needed, and the testing cost is effectively reduced;

2) the integration level is high: the testing device adopts a modularized industrial personal computer and is arranged on the control panel in a carrier plate mode, so that the product integration level is greatly improved, and the SSD testing environment and the SSD detection are simultaneously realized on one unit;

3) flexible configuration, detachability and simplification: in the test system, on the basis of the minimum test unit, different test sites and different customer requirements related to the SSD product can be met, the test units can be flexibly increased and reduced, different test systems are assembled, and the test efficiency is improved;

4) Can be remotely operated: each test unit in the test system is connected with the host or the server through the switch, and each test unit is arranged with a unique IP address, so that various test instructions can be remotely issued to the target test unit, and various problems possibly encountered in the test process of a factory can be conveniently diagnosed;

5) the test consistency is improved: the test system is based on the minimum test unit and is suitable for each test stage of the SSD product, including the development and verification stage of an engineer, so that the test consistency is ensured, and the test inconsistency caused by the replacement of different test equipment is avoided.

Drawings

FIG. 1 is a schematic structural diagram of a test apparatus in embodiment 1 of the present invention;

FIG. 2 is a schematic diagram of a test system according to the present invention;

FIG. 3 is a schematic diagram of signal transmission of the testing method in embodiment 1 of the present invention;

FIG. 4 is a diagram showing a test structure in example 2 of the present invention;

FIG. 5 is a block diagram of the template of the present invention;

FIG. 6 is a structural diagram of the test board of the present invention.

Detailed Description

The invention is described in detail below with reference to the figures and specific embodiments. It is to be understood that the embodiments described are only a few embodiments of the present invention, and not all embodiments. All other embodiments, which can be obtained by a person skilled in the art without any inventive step based on the embodiments of the present invention, shall fall within the scope of protection of the present invention.

Examples

The SSD product can be divided into SATA and PCIe (NVMe) according to the mainstream of an interface protocol, wherein the SSD product of the PCIe interface can be divided into PCIe x2, PCIe x4, PCIe x 8 and the like according to the difference of PCIe channels, and can be divided into AIC, EDSFF, U2, M.2, SiP (BGA package) and the like according to the difference of physical package interfaces; meanwhile, in the actual testing process of the SSD product, different testing sites are involved, including the card opening, the Burn-in test, the reliability test, the function test and the later product configuration of the SSD, the problems of operation convenience and practicability, the testing cost and the like in the mass production stage of a factory need to be considered, and in the face of the test requirements of various SSD products and the SSD test, various testing sites are involved, as shown in FIG. 2, in the invention, based on the minimum test unit, a test system which can adapt to each test site and various SSD product types is formed, the system comprises a switch, a host, a server and one or more test units, wherein the one or more test units are respectively connected with the host through the switch in an Ethernet mode, the host is connected with the server through the switch so as to analyze later test data, and each test unit is an independent test device.

The whole test system is based on the minimum test unit, and the test requirements of each station can be met only by increasing or decreasing the number of the minimum test units according to the requirements of different test stations. For example, in the early stage of engineer verification, one minimum test unit can meet the requirement of the engineer for verification test, and in the later stages of small-batch test, reliability test, mass production test and the like, the number of the minimum test units needs to be increased according to the actual requirement, so that flexible configuration and detachability are realized, and the test consistency is achieved.

In the present invention, the test unit (test apparatus) can adopt the following two schemes.

Example 1

As shown in fig. 1, 5 and 6, in this embodiment, the testing apparatus includes a control board and a testing board detachably mounted to each other, the testing board has almost no active device, and is only used as an SSD carrier board for mounting an SSD product to be tested, the control board adopts a modular industrial computer + MCU + PCIe Switch architecture, includes an industrial computer, an MCU chip and a PCIe Switch chip, and is in communication connection with an external host through an ethernet. In this embodiment, the control panel adopts the equipment of multiple boards to form, specifically include the motherboard, the MCU board, power strip and industrial computer, PCIe Switch chip sets up on the motherboard, the MCU chip sets up on the MCU board, power strip and industrial computer insert respectively and locate on the motherboard, the power strip provides different powers for the system, wherein, the industrial computer adopts the X86 mainboard, be connected with the motherboard through standard connector and regard as the environment platform of test software operation, and be connected with the Switch chip on the motherboard through the PCIe passageway, MCU is used for realizing data acquisition such as voltage current temperature and handles, SSD configuration and relevant power control function, read the type of SSD product on the test panel, and configure PCIe Switch chip into corresponding type, PCIe Switch chip is used for realizing PCIe Switch function. The control board of the invention uses PCIe Switch function, mainly tests various PCIe products, including different interfaces of PCIex2, PCIex4, PCIex8, etc.

Different functional modules are designed into independent circuit boards and are mounted on the motherboard in the form of a carrier plate, so that later-stage maintenance and system design upgrading of products are facilitated, the whole body is pulled without movement, the reliability is improved, and the device cost and the test cost are greatly reduced.

At the batch production test stage of mill, only need operating personnel to change the survey test panel that carries SSD, whole process need not artificial intervention, really improves operation convenience, the practicality in batch production stage and has realized testing intellectuality.

The embodiment can realize the test of different channel numbers including PCIe interfaces PCIe 2, PCIe 4, PCIe 8, and the like, and different physical interface SSD products such as AIC, U2, m.2, EDSFF, SiP (chip level), Dual Port, and the like, and has a wide application range.

The process of testing different SSD products by the testing device comprises the following steps:

s2: identifying the SSD product type in the test board, and configuring a PCIe Switch chip interface into a corresponding type;

the method specifically comprises the following steps:

s202: the MCU detects the type of the SSD product to be tested;

The detection of the type of the SSD product to be tested can be realized through hardware pin detection or software detection. Different SSD types are judged mainly according to different hardware pins through hardware detection, and different SSD types are judged by mainly reading data in the test board EEPROM through an I2C interface, an SPI interface or other interfaces through software detection.

S203: the MCU configures the PCIe Switch chip into a PCIex2 interface, a PCIex4 interface or a PCIex8 interface according to the detected SSD product type;

s204: the MCU resets the PCIe Switch chip and checks whether the power is normal, if so, the step S3 is executed.

S3: the industrial personal computer is started, and the test software carries out read-write test on the SSD product in the running environment provided by the industrial personal computer.

As shown in fig. 3, in the testing process, the MCU on the control board determines whether the testing board is inserted and the type of SSD product to be tested according to the read signal TCB _ HWID [3:0], and for the TCB _ HWID [3:0] signal, each BIT has three states: 0. 1 and High Z (High impedance), wherein the four bits have a combined status of 81, in practical application, the TCB _ HWID [3:0] is pulled High on the motherboard, that is, when no test board is inserted, the value of the TCB _ HWID is constantly [1:1:1:1], and in addition, each SSD product is assigned with a unique TCB _ HWID, that is, the rest 80 values of the TCB _ HWID are assigned to different types of SSD products, the MCU determines whether the test board is inserted by reading the value of the TCB _ HWID to be [1111], determines the type of the corresponding SSD product by reading the specific value of the TCB _ HWID, and configures the PCIe Switch chip interface accordingly.

In this embodiment, a mass production m.2ssd test is taken as an example to give a specific implementation process:

when an operator inserts a test board with an M.2SSD into a control board, an MCU on the control board detects that the value of a signal TCB _ HWID [3:0] is [1:1:1:0], the MCU judges that the test board is inserted and is M.2SSD, then the MCU configures 8 PCIex2 for a PCIe Switch chip, resets the PCIe Switch chip, triggers an industrial personal computer to start up, and then upper-layer test software starts various read-write tests on the SSD.

In this embodiment, the industrial personal computer selects an industrial personal computer with 16 pcie x1 channels, and the pcie x16 from the industrial personal computer can be divided into 8 pcie x2, 4 pcie x4, or 2 pcie x8 through PCIESWITCH, so that the test of 8 pcie x2 products can be realized.

Example 2

As a more preferable scheme, an FPGA chip may be used to replace an industrial personal computer, an MCU chip, and/or a PCIe Switch chip, specifically: a plurality of IP cores including a CPU IP, a PCIe Switch IP, an Ethernet IP and the like are integrated in an FPGA chip, and when the corresponding functions are needed, the corresponding IP is loaded into the FPGA through the Ethernet and the QSPI.

As shown in fig. 4, an embodiment in which all the core functions of the control board are implemented by an FPGA is provided, that is, only an FPGA chip is provided on the control board, and other embodiments in which a part of the core functions are replaced by the FPGA chip may be provided according to this embodiment, in this embodiment, a CPU IP, a PCIe Switch IP, and an ethernet IP are integrated on the FPGA chip, and are respectively used to provide a running environment for test software, read a type of an SSD product on the test board, and configure an interface of the FPGA chip into a corresponding type, and the rest is the same as embodiment 1, that is, the FPGA is used to replace and implement the CPU function, the PCIe to-SATA function, the PCIe Switch function, and the control function, and in this embodiment, the interface of the FPGA chip may be configured as a PCIe 8, a PCIe 4, a PCIe ex2, or a. Therefore, the testing of SSD products with different channel numbers such as PCIe interfaces PCIEX2, PCIEX4 and PCIEX8 and different physical interfaces such as AIC, U2, M.2, EDSFF, SiP (chip level), Dual Port and the like can be realized, the testing of SSD products with SATA interfaces can also be realized, and the application range can be further expanded.

Correspondingly, in the test process, when a test board carrying different SSD products is inserted into the control board, the control board loads the corresponding PCIe Switch IP into the FPGA through the Ethernet SPI according to the detected types of the SSD products, configures an FPGA chip interface into a PCIe x8, PCIe x4, PCIe x2 or SATA interface, and provides a running environment for the test software by loading the CPU IP into the FPGA through the Ethernet after checking the power supply is normal, so that the read-write test of the SSD products by the test software is realized, and the rest parts are the same as those in the implementation 1.

In consideration of the particularity of various test requirements involved from the beginning verification to the factory mass production test of the SSD, the invention supports various SSD one-stop test schemes, and focuses on a hardware architecture scheme of test equipment. It is clear that the described examples are also only a part of all examples, and not all test site examples involved in SSD testing.

While the invention has been described with reference to specific embodiments, the invention is not limited thereto, and those skilled in the art can easily conceive of various equivalent modifications or substitutions within the technical scope of the invention. Therefore, the protection scope of the present invention shall be subject to the protection scope of the claims.

Claims

1. The test device is characterized by comprising a control board and a test board which are detachably mounted with each other, wherein the test board is used for mounting an SSD product to be tested, the control board is in communication connection with an external host through Ethernet and comprises a software operation module, a control module and an interface module which are connected with each other, the software operation module is used for providing an operation environment for test software, and the control module is used for identifying the type of the SSD product and controlling the interface module to configure the interface into a corresponding type;

2. The testing device supporting multiple SSD tests according to claim 1, wherein the software running module comprises an industrial personal computer, the control module comprises an MCU chip, the interface module comprises a PCIe Switch chip, the industrial personal computer is used for providing a running environment for the test software, the MCU chip is used for reading the type of the SSD product on the test board and configuring a PCIe Switch chip interface into a corresponding type, and the PCIe Switch chip is used for realizing a PCIe Switch function and an SSD Hotpug function;

the configuration of the PCIe Switch chip interface into the corresponding type specifically includes: the PCIe Switch chip interface is configured as a PCIe ex2, PCIe ex4, or PCIe ex8 interface.

3. The testing device supporting multiple SSD tests as claimed in claim 2, wherein said control board is provided with an FPGA chip, said FPGA chip is used to provide a running environment for testing software, read the type of SSD product on the test board and/or configure the FPGA chip interface to a corresponding type, said FPGA chip is integrated with multiple IP cores, said IP cores include CPU IP, PCIe Switch IP and Ethernet IP;

The configuration of the FPGA chip interface into the corresponding type specifically includes: the FPGA chip interface is configured to be a PCIex8, a PCIex4, a PCIex2 or a SATA interface.

4. The device of claim 2, wherein the control board comprises a motherboard, an MCU board, a power board and an industrial personal computer, the PCIe Switch chip is arranged on the motherboard, the MCU chip is arranged on the MCU board, the power board and the industrial personal computer are respectively inserted on the motherboard, and the power board comprises a first power board and a second power board for providing power.

5. The device of claim 3, wherein the test board is only provided with SSD product slots, the test board and the control board are connected through an inter-board connector and directly inserted and installed, the control module determines whether the test board is inserted and determines the SSD product type by reading the value of the TCB _ HWID [3:0] hardware pin, each BIT in the TCB _ HWID [3:0] signal comprises a low level state, a High level state and a High level state, and the corresponding values are 0, 1 and High Z, respectively.

6. A system for supporting multiple kinds of SSD tests, comprising a switch, a host, a server and one or more test units, wherein the one or more test units are respectively connected with the host in an Ethernet mode through the switch, the host is connected with the server through the switch, and the test unit is the test device according to any one of claims 1 to 5.

7. A test method of supporting multiple kinds of SSD test devices according to claim 1, comprising the steps of:

8. The testing method according to claim 7, wherein the software running module comprises an industrial personal computer, the control module comprises an MCU chip, the interface module comprises a PCIe Switch chip, and the step S2 specifically comprises:

s202: the MCU detects the type of the SSD product to be tested;

9. The test method supporting multiple SSD tests according to claim 8, wherein an FPGA chip is further arranged on the control board, multiple IP cores are integrated on the FPGA chip, and the IP cores comprise a CPU IP, a PCIeSwitch IP and an Ethernet IP;

10. The method according to claim 8 or 9, wherein the detecting the type of SSD product to be tested specifically comprises: detecting the SSD product type through a hardware pin or detecting the SSD product type through software.