CN111239636A - A power test system - Google Patents

Abstract

The invention discloses a power supply test system which comprises a communication test interface module, a test power supply and a test main control device. The test main control equipment generates a test instruction to the test power supply after receiving the test waveform parameters; the test power supply generates a test waveform according to the test instruction, and the test waveform is superposed into a power supply grid of the unified storage array through the communication test interface module so as to simulate different power supply scenes of the unified storage array; the unified storage array monitors a power interface signal of the hardware of the unified storage array and sends the power interface signal to the test main control equipment through the communication test interface module; and the test main control equipment performs quality analysis on the power interface signal to obtain a power test result of the unified storage array. Therefore, different power supply scenes of the unified storage array can be simulated independently, the power performance of the unified storage array can be tested independently under different power supply scenes, and the independent testing mode is time-saving and labor-saving, so that the product development period is shortened, and the product development cost is reduced.

Description

A power test system

technical field

The invention relates to the field of power supply testing, in particular to a power supply testing system.

Background technique

In the era of big data, higher requirements are placed on the reliability of the unified storage array, especially the power supply quality of the power supply of the unified storage array (obtained by the grid rectification). At present, the performance test of the power supply of the unified storage array is usually carried out during the design and development stage of the unified storage array to ensure the reliability of the power supply of the unified storage array. In the prior art, developers usually use test tools to manually test the power interface signals of the unified storage array in different power supply scenarios, and analyze the power supply performance according to the power interface signals. However, manual testing is time-consuming and labor-intensive, resulting in a long product development cycle and high product development costs.

Therefore, how to provide a solution to the above technical problem is a problem that those skilled in the art need to solve at present.

SUMMARY OF THE INVENTION

The purpose of the present invention is to provide a power supply test system, which can independently simulate different power supply scenarios of the unified storage array, and independently test the power supply performance of the unified storage array under different power supply scenarios. Development cycle, reducing product development costs.

In order to solve the above-mentioned technical problems, the present invention provides a power supply test system, including:

A communication test interface module connected to the unified storage array; the unified storage array is used to monitor the power interface signal of its own hardware, and send the power interface signal to the test master control device through the communication test interface module;

a test power supply connected to the communication test interface module, used for generating a test waveform according to the test instruction, and superimposing the test waveform into the power supply grid of the unified storage array through the communication test interface module;

The test main control device, which is respectively connected with the communication test interface module and the test power supply, is used to generate a test instruction to the test power supply after receiving the test waveform parameters; perform quality analysis on the power supply interface signal, and obtain the Describe the power test results of the unified storage array.

Preferably, the test power supply includes a rectifier, three inverters with the same structure, and a controller; wherein:

The input end of the rectifier is connected to the AC power supply, the output end of the rectifier is respectively connected to the input ends of the three inverters, and the midpoint of the first bridge arm of one inverter is connected to the communication test interface module It is connected with the A-phase line of the power supply grid, the midpoint of the first bridge arm of the second inverter is connected with the B-phase line of the power supply grid through the communication test interface module, and the third inverter is connected to the B-phase line of the power supply grid. The midpoint of one bridge arm is connected to the C-phase line of the power supply grid through the communication test interface module, and the midpoints of the second bridge arms of the three inverters are all connected to the power supply grid through the communication test interface module the N line connection;

The controller is configured to control the rectifier and the inverter to perform a current conversion operation according to the test instruction, so as to generate a test waveform and superimpose it on the power supply grid of the unified storage array.

Preferably, the test power supply further includes a filter circuit connected to the inverter one by one; the filter circuit includes a filter inductor and a filter capacitor; wherein:

The first end of the filter inductor is connected to the midpoint of the first bridge arm of the corresponding inverter, the second end of the filter inductor is connected to the first end of the filter capacitor, and the common end is connected to the communication test interface module It is connected with the corresponding phase line of the power supply grid, and the second end of the filter capacitor is connected with the middle point of the second bridge arm of the corresponding inverter.

Preferably, the filter capacitor is a capacitor with an adjustable capacitance value;

Correspondingly, the controller is further configured to adjust the capacitance value of the filter capacitor according to the cutoff frequency demand value of the test waveform.

Preferably, the test waveform parameters include voltage, frequency, phase, crest factor, and waveform duration of the test waveform.

Preferably, the test main control device is specifically configured to use the SMBus waveform intelligent analysis algorithm to perform quality analysis on the power interface signal to obtain the power test result of the unified storage array.

Preferably, the power test system further includes:

a human-computer interaction device connected to the test main control device, used for delivering test waveform parameters to the test main control device;

Correspondingly, the test main control device is further configured to feed back the power test result to the human-computer interaction device for the user to view.

Preferably, the human-computer interaction device is also connected to the test power supply;

Correspondingly, the human-computer interaction device is also used for programming the test power supply.

The invention provides a power test system, which includes a communication test interface module, a test power supply and a test main control device. The test main control device generates a test command to the test power supply after receiving the test waveform parameters; the test power supply generates a test waveform according to the test command, and superimposes the test waveform into the power supply grid of the unified storage array through the communication test interface module to simulate a unified Different power supply scenarios of the storage array; unified storage array monitors the power interface signal of its own hardware, and sends the power interface signal to the test main control device through the communication test interface module; the test main control device analyzes the quality of the power interface signal and obtains unified storage Power test results for the array. It can be seen that the present application can independently simulate different power supply scenarios of the unified storage array, and independently test the power performance of the unified storage array under different power supply scenarios. The independent testing method saves time and effort, thereby shortening the product development cycle and reducing product development costs. .

Description of drawings

In order to illustrate the technical solutions in the embodiments of the present invention more clearly, the following briefly introduces the prior art and the accompanying drawings required in the embodiments. Obviously, the drawings in the following description are only some of the present invention. In the embodiments, for those of ordinary skill in the art, other drawings can also be obtained according to these drawings without any creative effort.

1 is a schematic structural diagram of a power supply testing system provided by an embodiment of the present invention;

2 is a schematic structural diagram of a test power supply provided by an embodiment of the present invention;

FIG. 3 is a schematic structural diagram of another power supply testing system provided by an embodiment of the present invention.

Detailed ways

The core of the invention is to provide a power supply test system, which can independently simulate different power supply scenarios of the unified storage array, and independently test the power supply performance of the unified storage array under different power supply scenarios. Development cycle, reducing product development costs.

In order to make the purposes, technical solutions and advantages of the embodiments of the present invention clearer, the technical solutions in the embodiments of the present invention will be clearly and completely described below with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments These are some embodiments of the present invention, but not all embodiments. Based on the embodiments of the present invention, all other embodiments obtained by those of ordinary skill in the art without creative efforts shall fall within the protection scope of the present invention.

Please refer to FIG. 1 . FIG. 1 is a schematic structural diagram of a power supply testing system according to an embodiment of the present invention.

The power test system includes:

A communication test interface module 1 connected to the unified storage array; the unified storage array is used to monitor the power interface signal of its own hardware, and send the power interface signal to the test main control device 3 through the communication test interface module 1;

The test power supply 2 connected with the communication test interface module 1 is used to generate a test waveform according to the test instruction, and superimpose the test waveform into the power supply grid of the unified storage array through the communication test interface module 1;

The test main control device 3 connected to the communication test interface module 1 and the test power supply 2 respectively is used to generate a test command to the test power supply 2 after receiving the test waveform parameters; to analyze the quality of the power supply interface signals to obtain the power supply of the unified storage array Test Results.

Specifically, the power test system of the present application includes a communication test interface module 1, a test power source 2 and a test main control device 3, and its working principle is:

When the power supply test is performed on the unified storage array, firstly, the test waveform parameters are delivered to the test master control device 3 according to the test requirements of the unified storage array. After receiving the test waveform parameters, the test main control device 3 generates a test command including the test waveform parameters, and sends the test command to the test power supply 2 . After the test power supply 2 receives the test command, it extracts the test waveform parameters from the test command, and generates a test waveform conforming to the test waveform parameters according to the test waveform parameters, and then superimposes the test waveform to the unified storage array through the communication test interface module 1. in the power grid.

It should be noted that the test waveform is equivalent to simulating interference signals in the power supply grid of the unified storage array, thereby simulating different power supply scenarios of the unified storage array. The unified storage array itself has power supply anti-interference performance, and the signal input from the power interface of the hardware in the unified storage array has already been processed by anti-interference. The signal quality of the power supply interface of the hardware in the unified storage array reflects the power performance of the unified storage array.

In the current power supply scenario, the unified storage array monitors the power interface signal of its own hardware, and sends the power interface signal to the test main control device 3 through the communication test interface module 1 . After receiving the power interface signal, the test main control device 3 performs quality analysis on the power interface signal, and uses the quality analysis result as the power test result of the unified storage array, thereby obtaining the power performance of the unified storage array.

The invention provides a power test system, which includes a communication test interface module, a test power supply and a test main control device. The test main control device generates a test command to the test power supply after receiving the test waveform parameters; the test power supply generates a test waveform according to the test command, and superimposes the test waveform into the power supply grid of the unified storage array through the communication test interface module to simulate a unified Different power supply scenarios of the storage array; unified storage array monitors the power interface signal of its own hardware, and sends the power interface signal to the test main control device through the communication test interface module; the test main control device analyzes the quality of the power interface signal and obtains unified storage Power test results for the array. It can be seen that the present application can independently simulate different power supply scenarios of the unified storage array, and independently test the power performance of the unified storage array under different power supply scenarios. The independent testing method saves time and effort, thereby shortening the product development cycle and reducing product development costs. .

On the basis of the above-mentioned embodiment:

Please refer to FIG. 2 , which is a schematic structural diagram of a test power supply according to an embodiment of the present invention.

As an optional embodiment, the test power supply 2 includes a rectifier, three inverters with the same structure, and a controller; wherein:

The input end of the rectifier is connected to the AC power supply, and the output end of the rectifier is connected to the input ends of the three inverters respectively, and the midpoint of the first bridge arm of one inverter is connected to the A phase line of the power supply grid through the communication test interface module 1 Connection, the midpoint of the first bridge arm of the second inverter is connected to the B phase line of the power supply grid through the communication test interface module 1, and the midpoint of the first bridge arm of the third inverter is connected to the communication test interface module 1. The C-phase line of the power supply grid is connected, and the midpoints of the second bridge arms of the three inverters are connected to the N line (neutral line) of the power supply grid through the communication test interface module 1;

The controller is used to control the rectifier and the inverter to perform current conversion work according to the test instruction, so as to generate a test waveform and superimpose it on the power supply grid of the unified storage array.

Specifically, the test power supply 2 of the present application includes a rectifier, three inverters and a controller (for example, a DSP (Digital Signal Processor, digital signal processing) is selected), and its working principle is:

The controller is used to control the rectifier (Q1-Q4) to convert the input AC power into DC power, such as controlling the rectifier to stabilize the input AC180-264V at DC400V, and input the DC power to each inverter (can be at the output end of the rectifier and the inverter). A capacitor for filtering and voltage regulation is added between the input terminals of the inverter; the controller is also used to control each inverter (Q5-Q8) to convert the input DC power into AC power, and convert the AC power output by each inverter into one One is superimposed on each phase line of the power supply grid of the unified storage array to simulate different power supply scenarios of the unified storage array.

As an optional embodiment, the test power supply 2 further includes a filter circuit that is connected to the inverter one by one; the filter circuit includes a filter inductor L and a filter capacitor C; wherein:

The first end of the filter inductor L is connected to the midpoint of the first bridge arm of the corresponding inverter, the second end of the filter inductor L is connected to the first end of the filter capacitor C, and the common end is connected to the power supply grid through the communication test interface module 1. Corresponding to the phase line connection, the second end of the filter capacitor C is connected to the midpoint of the second bridge arm of the corresponding inverter.

Further, the test power supply 2 of the present application further includes an LC filter circuit for filtering the output signal of the inverter, so that the test power supply 2 outputs a test waveform that is more in line with the test waveform parameters.

As an optional embodiment, the filter capacitor is a capacitor with an adjustable capacitance value;

Correspondingly, the controller is further configured to adjust the capacitance value of the filter capacitor according to the required value of the cutoff frequency of the test waveform.

Specifically, the capacitance value of the filter capacitor of the present application is set to be adjustable, and different capacitance values of the filter capacitor correspond to different cutoff frequencies of the test waveform, so the controller can adjust the capacitance value of the filter capacitor according to the required value of the cutoff frequency of the test waveform.

As an optional embodiment, the test waveform parameters include voltage, frequency, phase, crest factor, and waveform duration of the test waveform.

Specifically, the test waveform parameters of the present application include parameters such as voltage, frequency, phase, crest factor, and waveform duration of the test waveform, specifically the voltage, frequency, phase, crest factor, and waveform duration corresponding to each phase waveform of the test waveform. and other parameters.

In addition, in order to make the test power supply 2 output a test waveform that is more in line with the test waveform parameters, the controller of the present application can adopt an all-digital PID (Proportion-Integral-Differential, Proportion-Integral-Differential, Proportion-Integral-Differential) closed-loop control algorithm: output to the test power supply 2 The actual test waveform is sampled, and the error between the target test waveform and the actual test waveform is obtained, and then the error is adjusted by the all-digital PID (different proportional, integral and differential control parameters are called according to different states) to obtain the control signal of the inverter. In order to control the inverter to output a test waveform that is more in line with the test waveform parameters.

As an optional embodiment, the test main control device 3 is specifically configured to use the SMBus waveform intelligent analysis algorithm to perform quality analysis on the power interface signal to obtain the power test result of the unified storage array.

Specifically, the test main control device 3 of the present application can use the SMBus (System Management Bus, system management bus) waveform intelligent analysis algorithm to perform quality analysis on the power interface signal, and obtain the power test result of the unified storage array. SMBus is a control bus for power management tasks that saves device pin count.

Please refer to FIG. 3 , which is a schematic structural diagram of another power supply testing system provided by an embodiment of the present invention.

As an optional embodiment, the power test system further includes:

The human-computer interaction device 4 connected with the test main control device 3 is used to issue test waveform parameters to the test main control device 3;

Correspondingly, the test main control device 3 is also used to feed back the power test result to the human-computer interaction device 4 for the user to view.

Further, the power supply test system of the present application also includes a human-computer interaction device 4, and its working principle is:

The human-computer interaction device 4 includes a keyboard matrix, an LCD (Liquid Crystal Display, liquid crystal display) display interface and a main controller. The user inputs the test waveform parameters through the keyboard matrix according to the test requirements; the main controller obtains the test waveform parameters input by the user through the keyboard matrix, and sends the test waveform parameters to the test main control device 3 for use by the test main control device 3 .

Moreover, the test main control device 3 also feeds back the power test results to the main controller of the human-computer interaction device 4; after receiving the power test results, the main controller controls the LCD display interface to display the power test results for the user to view.

As an optional embodiment, the human-computer interaction device 4 is also connected to the test power supply 2;

Correspondingly, the human-computer interaction device 4 is also used to program the test power supply 2 .

Further, the human-computer interaction device 4 of the present application is also connected to the test power source 2 to program the test power source 2 , so as to further improve the function of the test power source 2 .

It should also be noted that, in this specification, relational terms such as first and second, etc. are only used to distinguish one entity or operation from another entity or operation, and do not necessarily require or imply these entities or operations. There is no such actual relationship or sequence between operations. Moreover, the terms "comprising", "comprising" or any other variation thereof are intended to encompass a non-exclusive inclusion such that a process, method, article or device that includes a list of elements includes not only those elements, but also includes not explicitly listed or other elements inherent to such a process, method, article or apparatus. Without further limitation, an element qualified by the phrase "comprising a..." does not preclude the presence of additional identical elements in a process, method, article or apparatus that includes the element.

Professionals may further realize that the units and algorithm steps of each example described in conjunction with the embodiments disclosed herein can be implemented in electronic hardware, computer software, or a combination of the two, in order to clearly illustrate the possibilities of hardware and software. Interchangeability, the above description has generally described the components and steps of each example in terms of functionality. Whether these functions are performed in hardware or software depends on the specific application and design constraints of the technical solution. Skilled artisans may implement the described functionality using different methods for each particular application, but such implementations should not be considered beyond the scope of the present invention.

The steps of a method or algorithm described in conjunction with the embodiments disclosed herein may be directly implemented in hardware, a software module executed by a processor, or a combination of the two. A software module can be placed in random access memory (RAM), internal memory, read only memory (ROM), electrically programmable ROM, electrically erasable programmable ROM, registers, hard disk, removable disk, CD-ROM, or any other in the technical field. in any other known form of storage medium.

The above description of the disclosed embodiments enables any person skilled in the art to make or use the present invention. Various modifications to these embodiments will be readily apparent to those skilled in the art, and the generic principles defined herein may be implemented in other embodiments without departing from the spirit or scope of the invention. Thus, the present invention is not intended to be limited to the embodiments shown herein, but is to be accorded the widest scope consistent with the principles and novel features disclosed herein.

Claims (8)

1. a power supply test system, is characterized in that, comprises: A communication test interface module connected to the unified storage array; the unified storage array is used to monitor the power interface signal of its own hardware, and send the power interface signal to the test master control device through the communication test interface module; a test power supply connected to the communication test interface module, used for generating a test waveform according to the test instruction, and superimposing the test waveform into the power supply grid of the unified storage array through the communication test interface module; The test main control device, which is respectively connected with the communication test interface module and the test power supply, is used to generate a test instruction to the test power supply after receiving the test waveform parameters; perform quality analysis on the power supply interface signal, and obtain the Describe the power test results of the unified storage array. 2. The power supply testing system according to claim 1, wherein the testing power supply comprises a rectifier, three inverters with the same structure, and a controller; wherein: The input end of the rectifier is connected to the AC power supply, the output end of the rectifier is respectively connected to the input ends of the three inverters, and the midpoint of the first bridge arm of one inverter is connected to the communication test interface module It is connected with the A-phase line of the power supply grid, the midpoint of the first bridge arm of the second inverter is connected with the B-phase line of the power supply grid through the communication test interface module, and the third inverter is connected to the B-phase line of the power supply grid. The midpoint of one bridge arm is connected to the C-phase line of the power supply grid through the communication test interface module, and the midpoints of the second bridge arms of the three inverters are all connected to the power supply grid through the communication test interface module the N line connection; The controller is configured to control the rectifier and the inverter to perform a current conversion operation according to the test instruction, so as to generate a test waveform and superimpose it on the power supply grid of the unified storage array. 3. The power supply testing system according to claim 2, wherein the testing power supply further comprises a filter circuit connected to the inverter one by one; the filter circuit comprises a filter inductor and a filter capacitor; wherein: The first end of the filter inductor is connected to the midpoint of the first bridge arm of the corresponding inverter, the second end of the filter inductor is connected to the first end of the filter capacitor, and the common end is connected to the communication test interface module It is connected with the corresponding phase line of the power supply grid, and the second end of the filter capacitor is connected with the middle point of the second bridge arm of the corresponding inverter. 4. The power supply testing system according to claim 3, wherein the filter capacitor is a capacitor with an adjustable capacitance value; Correspondingly, the controller is further configured to adjust the capacitance value of the filter capacitor according to the cutoff frequency demand value of the test waveform. 5. The power supply test system according to claim 1, wherein the test waveform parameters include voltage, frequency, phase, crest factor, and waveform duration of the test waveform. 6. The power supply test system according to claim 1, wherein the test main control device is specifically used to perform quality analysis on the power interface signal by using an SMBus waveform intelligent analysis algorithm to obtain the power supply of the unified storage array Test Results. 7. The power supply testing system according to any one of claims 1-6, wherein the power supply testing system further comprises: a human-computer interaction device connected to the test main control device, used for delivering test waveform parameters to the test main control device; Correspondingly, the test main control device is further configured to feed back the power test result to the human-computer interaction device for the user to view. 8. The power supply testing system according to claim 7, wherein the human-computer interaction device is further connected to the testing power supply; Correspondingly, the human-computer interaction device is also used for programming the test power supply.

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