CN110178039A - 用于测试光电装置的设备和操作所述设备的方法 - Google Patents
用于测试光电装置的设备和操作所述设备的方法 Download PDFInfo
- Publication number
- CN110178039A CN110178039A CN201880006861.7A CN201880006861A CN110178039A CN 110178039 A CN110178039 A CN 110178039A CN 201880006861 A CN201880006861 A CN 201880006861A CN 110178039 A CN110178039 A CN 110178039A
- Authority
- CN
- China
- Prior art keywords
- optoelectronic device
- thermal
- optoelectronic
- stage
- operable
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Granted
Links
Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2855—Environmental, reliability or burn-in testing
- G01R31/2872—Environmental, reliability or burn-in testing related to electrical or environmental aspects, e.g. temperature, humidity, vibration, nuclear radiation
- G01R31/2874—Environmental, reliability or burn-in testing related to electrical or environmental aspects, e.g. temperature, humidity, vibration, nuclear radiation related to temperature
- G01R31/2875—Environmental, reliability or burn-in testing related to electrical or environmental aspects, e.g. temperature, humidity, vibration, nuclear radiation related to temperature related to heating
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
- G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
- G01R1/0433—Sockets for IC's or transistors
- G01R1/0441—Details
- G01R1/0458—Details related to environmental aspects, e.g. temperature
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
- G01R1/02—General constructional details
- G01R1/04—Housings; Supporting members; Arrangements of terminals
- G01R1/0408—Test fixtures or contact fields; Connectors or connecting adaptors; Test clips; Test sockets
- G01R1/0433—Sockets for IC's or transistors
- G01R1/0441—Details
- G01R1/0466—Details concerning contact pieces or mechanical details, e.g. hinges or cams; Shielding
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2855—Environmental, reliability or burn-in testing
- G01R31/2856—Internal circuit aspects, e.g. built-in test features; Test chips; Measuring material aspects, e.g. electro migration [EM]
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
- G01R31/28—Testing of electronic circuits, e.g. by signal tracer
- G01R31/2851—Testing of integrated circuits [IC]
- G01R31/2855—Environmental, reliability or burn-in testing
- G01R31/286—External aspects, e.g. related to chambers, contacting devices or handlers
- G01R31/2863—Contacting devices, e.g. sockets, burn-in boards or mounting fixtures
Landscapes
- Engineering & Computer Science (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Environmental & Geological Engineering (AREA)
- General Engineering & Computer Science (AREA)
- Health & Medical Sciences (AREA)
- Toxicology (AREA)
- Testing Of Individual Semiconductor Devices (AREA)
- Semiconductor Lasers (AREA)
- Testing Of Optical Devices Or Fibers (AREA)
- Investigating Or Analyzing Materials Using Thermal Means (AREA)
- Tests Of Electronic Circuits (AREA)
- Testing Resistance To Weather, Investigating Materials By Mechanical Methods (AREA)
Abstract
Description
Claims (16)
Applications Claiming Priority (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US201762445842P | 2017-01-13 | 2017-01-13 | |
| US62/445,842 | 2017-01-13 | ||
| PCT/SG2018/050010 WO2018132064A1 (en) | 2017-01-13 | 2018-01-09 | Apparatus for testing an optoelectronic device and method of operating the same |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN110178039A true CN110178039A (zh) | 2019-08-27 |
| CN110178039B CN110178039B (zh) | 2021-10-26 |
Family
ID=62840510
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201880006861.7A Active CN110178039B (zh) | 2017-01-13 | 2018-01-09 | 用于测试光电装置的设备和操作所述设备的方法 |
Country Status (5)
| Country | Link |
|---|---|
| US (1) | US10908208B2 (zh) |
| EP (1) | EP3568706B1 (zh) |
| CN (1) | CN110178039B (zh) |
| TW (1) | TWI743290B (zh) |
| WO (1) | WO2018132064A1 (zh) |
Citations (15)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| EP1491868A1 (en) * | 2003-06-26 | 2004-12-29 | Samsung Electronics Co., Ltd. | Cooled opto-electric detector |
| DE10393691T5 (de) * | 2002-11-08 | 2005-11-17 | Finisar Corp., Sunnyvale | Temperatur- und Jitterkompensatonssteuerungsschaltung und -verfahren für Faseroptikvorrichtung |
| US20050259706A1 (en) * | 2002-11-19 | 2005-11-24 | Zhang Yong S | High speed optoelectronic subassembly and package for optical devices |
| CN2764980Y (zh) * | 2004-12-27 | 2006-03-15 | 日扬电子科技(上海)有限公司 | 光电设备用干式真空泵冷却系统 |
| CN101057114A (zh) * | 2004-10-22 | 2007-10-17 | 纳诺库勒斯公司 | 光电子装置的瞬时热电冷却 |
| US20070268038A1 (en) * | 2006-05-17 | 2007-11-22 | Southern Taiwan University Of Technology | Method for analyzing the reliability of optoelectronic elements rapidly |
| CN101187689A (zh) * | 2007-12-10 | 2008-05-28 | 杭州浙大三色仪器有限公司 | 测量半导体发光器件用的温控座 |
| CN201110883Y (zh) * | 2007-12-05 | 2008-09-03 | 杭州浙大三色仪器有限公司 | 半导体发光器件热性能测量装置 |
| JP2011237350A (ja) * | 2010-05-12 | 2011-11-24 | Showa Denko Kk | 発光部品試験モジュールおよび発光部品試験装置 |
| CN202101835U (zh) * | 2011-04-08 | 2012-01-04 | 佛山科学技术学院 | 一种大功率白光led温度特性测量实验装置 |
| CN102565001A (zh) * | 2010-12-30 | 2012-07-11 | 上海龙天信息科技有限公司 | 光电露点仪散热系统 |
| KR101311923B1 (ko) * | 2012-01-31 | 2013-10-14 | 주식회사 에타맥스 | 발광다이오드 테스트 모듈 |
| CN204666576U (zh) * | 2014-01-29 | 2015-09-23 | 罗斯蒙特分析公司 | 过程分析装置、导热管系统和维持部件的大致恒定温度的系统 |
| US20160005906A1 (en) * | 2014-07-03 | 2016-01-07 | MH Solar Co. LTD. | Optoelectronic Thermal Interfaces for 3-Dimensional Billet Devices, Including Vertical Multijunction Photovoltaic Receivers Using Heat Sinked Anode/Billet/Cathode For High Intensity Beaming and Wireless Power Transmission |
| EP2867686B1 (en) * | 2012-06-29 | 2016-08-17 | Eles Semiconductor Equipment S.P.A. | Test board with local thermal conditioning elements |
Family Cites Families (10)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US5911897A (en) * | 1997-01-13 | 1999-06-15 | Micro Control Company | Temperature control for high power burn-in for integrated circuits |
| US6971793B2 (en) * | 2003-03-21 | 2005-12-06 | Asm Assembly Automation Ltd. | Test handler temperature monitoring system |
| US7042240B2 (en) * | 2004-02-27 | 2006-05-09 | Wells-Cti, Llc | Burn-in testing apparatus and method |
| US9766285B2 (en) * | 2012-06-29 | 2017-09-19 | Eles Semiconductor Equipment S.P.A. | Test board with local thermal conditioning elements |
| US9400291B2 (en) * | 2012-08-31 | 2016-07-26 | Intel Corporation | Integrated circuit test temperature control mechanism |
| EP2983001B1 (en) * | 2013-04-01 | 2020-11-04 | SIRC Co., Ltd. | Sensor element with temperature compensating function, and magnetic sensor and electric power measuring device which use same |
| DE102014106069B4 (de) * | 2014-04-30 | 2023-02-16 | Pictiva Displays International Limited | Optoelektronische Bauelementevorrichtung, Verfahren zum Herstellen einer optoelektronischen Bauelementevorrichtung und Betriebsverfahren einer optoelektronischen Bauelementevorrichtung |
| CN105588958B (zh) * | 2016-01-22 | 2018-10-09 | 中山大学 | 一种快速多功能电子元器件温度特性测量仪器及测试腔体 |
| EP3315963A1 (de) * | 2016-10-26 | 2018-05-02 | Fuchs Petrolub SE | Probenaufnahmeelement, analysenset und verfahren zur analyse eines liquids, insbesondere einer kühlschmierstoffemulsion |
| US10677836B2 (en) * | 2016-12-29 | 2020-06-09 | Sensor Electronic Technology, Inc. | Optoelectronic device with semiconductor heterostructure and stress controlling structure to exert stress onto layers of the heterostructure |
-
2018
- 2018-01-09 EP EP18739026.5A patent/EP3568706B1/en active Active
- 2018-01-09 US US16/472,141 patent/US10908208B2/en active Active
- 2018-01-09 CN CN201880006861.7A patent/CN110178039B/zh active Active
- 2018-01-09 WO PCT/SG2018/050010 patent/WO2018132064A1/en not_active Ceased
- 2018-01-12 TW TW107101204A patent/TWI743290B/zh active
Patent Citations (15)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| DE10393691T5 (de) * | 2002-11-08 | 2005-11-17 | Finisar Corp., Sunnyvale | Temperatur- und Jitterkompensatonssteuerungsschaltung und -verfahren für Faseroptikvorrichtung |
| US20050259706A1 (en) * | 2002-11-19 | 2005-11-24 | Zhang Yong S | High speed optoelectronic subassembly and package for optical devices |
| EP1491868A1 (en) * | 2003-06-26 | 2004-12-29 | Samsung Electronics Co., Ltd. | Cooled opto-electric detector |
| CN101057114A (zh) * | 2004-10-22 | 2007-10-17 | 纳诺库勒斯公司 | 光电子装置的瞬时热电冷却 |
| CN2764980Y (zh) * | 2004-12-27 | 2006-03-15 | 日扬电子科技(上海)有限公司 | 光电设备用干式真空泵冷却系统 |
| US20070268038A1 (en) * | 2006-05-17 | 2007-11-22 | Southern Taiwan University Of Technology | Method for analyzing the reliability of optoelectronic elements rapidly |
| CN201110883Y (zh) * | 2007-12-05 | 2008-09-03 | 杭州浙大三色仪器有限公司 | 半导体发光器件热性能测量装置 |
| CN101187689A (zh) * | 2007-12-10 | 2008-05-28 | 杭州浙大三色仪器有限公司 | 测量半导体发光器件用的温控座 |
| JP2011237350A (ja) * | 2010-05-12 | 2011-11-24 | Showa Denko Kk | 発光部品試験モジュールおよび発光部品試験装置 |
| CN102565001A (zh) * | 2010-12-30 | 2012-07-11 | 上海龙天信息科技有限公司 | 光电露点仪散热系统 |
| CN202101835U (zh) * | 2011-04-08 | 2012-01-04 | 佛山科学技术学院 | 一种大功率白光led温度特性测量实验装置 |
| KR101311923B1 (ko) * | 2012-01-31 | 2013-10-14 | 주식회사 에타맥스 | 발광다이오드 테스트 모듈 |
| EP2867686B1 (en) * | 2012-06-29 | 2016-08-17 | Eles Semiconductor Equipment S.P.A. | Test board with local thermal conditioning elements |
| CN204666576U (zh) * | 2014-01-29 | 2015-09-23 | 罗斯蒙特分析公司 | 过程分析装置、导热管系统和维持部件的大致恒定温度的系统 |
| US20160005906A1 (en) * | 2014-07-03 | 2016-01-07 | MH Solar Co. LTD. | Optoelectronic Thermal Interfaces for 3-Dimensional Billet Devices, Including Vertical Multijunction Photovoltaic Receivers Using Heat Sinked Anode/Billet/Cathode For High Intensity Beaming and Wireless Power Transmission |
Also Published As
| Publication number | Publication date |
|---|---|
| US20190324081A1 (en) | 2019-10-24 |
| TW201840983A (zh) | 2018-11-16 |
| EP3568706A1 (en) | 2019-11-20 |
| EP3568706A4 (en) | 2020-01-01 |
| US10908208B2 (en) | 2021-02-02 |
| CN110178039B (zh) | 2021-10-26 |
| WO2018132064A1 (en) | 2018-07-19 |
| EP3568706B1 (en) | 2023-05-10 |
| TWI743290B (zh) | 2021-10-21 |
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| CP03 | Change of name, title or address |
Address after: Shinka ha Patentee after: Ames Osram Asia Pacific Pte. Ltd. Country or region after: Singapore Address before: Shinka ha Patentee before: Sensors Singapore Private Ltd. Country or region before: Singapore Address after: Shinka ha Patentee after: Sensors Singapore Private Ltd. Country or region after: Singapore Address before: 26 Woodland Loop, Singapore City, Singapore Patentee before: HEPTAGON MICRO OPTICS Pte. Ltd. Country or region before: Singapore |
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