CN110008074A - The method, device and equipment of automatic test inquiry hardware information high-level interface - Google Patents

Abstract

The embodiment of the invention discloses method, apparatus, equipment and the computer readable storage mediums of a kind of automatic test inquiry hardware information high-level interface.Wherein, method includes obtaining hardware instance to be tested, determines the corresponding query interface of hardware instance to be tested；According to the return value of the modification data field modification query interface in the modification instruction received, and it is redirected in default virtual file, so as to obtain modified return value when reading virtual file, according to the matching result of default desired value and modified return value, test result is generated.The application, which is realized, inquires hardware information high-level interface by software mode automatic test, hardware environment is simulated to come in the form of software, to which upper layer software (applications) code and bottom hardware are isolated, quickly and effectively, testing efficiency is improved, test accuracy rate is enhanced, hardware environment is isolated, to the damage problem of hardware when effectively avoiding conventional authentication upper layer software (applications) interface, research and development cost is advantageously reduced.

Description

Method, device and device for automatic test query hardware information upper interface

technical field

Embodiments of the present invention relate to the technical field of storage hardware fault detection, and in particular, to a method, apparatus, device, and computer-readable storage medium for automated testing to query an upper-layer interface of hardware information.

Background technique

With the rapid development of cloud computing and big data, users have higher and higher requirements for storage products. It is very necessary for the entire storage system to detect hardware failures and repair them quickly.

Currently, the query for some hardware FRU (Field Replace Unit, field replaceable unit) information of the underlying equipment is obtained through the command line provided by the software. However, when verifying the validity of the command line, manual hardware operations are generally required. For example, to verify the presence status of a fan in the storage device, the fan module needs to be manually pulled out, and the query command is manually executed continuously until the field representing the presence status of the query command is updated to offline. This method of manually querying the upper-layer interface of the hardware is time-consuming and labor-intensive, resulting in low efficiency of the entire hardware fault detection.

SUMMARY OF THE INVENTION

The embodiments of the present disclosure provide a method, apparatus, device and computer-readable storage medium for querying an upper-layer interface of hardware information by automated testing, which realizes the querying of an upper-layer interface of hardware information by automatic testing, and improves the efficiency of querying an upper-layer interface of hardware information.

In order to solve the above-mentioned technical problems, the embodiments of the present invention provide the following technical solutions:

One aspect of the embodiments of the present invention provides a method for automatically testing an upper-layer interface for querying hardware information, including:

Obtain the hardware instance to be tested, and determine the query interface corresponding to the hardware instance to be tested;

Modify the return value of the query interface according to the received modification instruction, and redirect to the preset virtual file;

Read the virtual file to obtain the modified return value, and generate a test result according to the matching result between the preset expected value and the modified return value;

Wherein, the expected value is the same as the modified data field in the modification instruction.

Optionally, after generating the test result according to the preset expected value and the modified return value, the method further includes:

The test results are recorded in a log.

Optionally, after obtaining the hardware instance to be tested, the method further includes:

Write the hardware instance to be tested to a preset specific file.

Optionally, the modified return value obtained by reading the virtual file is:

Read the virtual file according to the preset frequency to get the modified return value.

Optionally, generating the test result according to the matching result between the preset expected value and the modified return value includes:

If the preset expected value and the modified return value are the same, the generated test result is that the test passed;

If the preset expected value and the modified return value are different, the generated test result is that the test fails.

Another aspect of the embodiments of the present invention provides a device for automatically testing an upper-layer interface for querying hardware information, including:

a hardware instance information acquisition module to be tested, configured to acquire the hardware instance to be tested, and to determine a query interface corresponding to the hardware instance to be tested;

The underlying data modification module is used to modify the return value of the query interface according to the received modification instruction, and redirect to the preset virtual file;

An automated test module, used to read the virtual file to obtain the modified return value, and generate a test result according to the matching result between the preset expected value and the modified return value; the expected value is the same as the modified data field in the modification instruction .

Optionally, the automated testing module is a module that reads the virtual file according to a preset frequency to obtain a modified return value.

Optionally, the automated test module is also used to generate a test result that passes the test if the preset expected value and the modified return value are the same; if the preset expected value and the modified return value are different, The generated test result is that the test fails.

An embodiment of the present invention also provides a device for automatically testing an upper-layer interface for querying hardware information, including a processor, where the processor is configured to implement the upper-layer interface for automatic testing and querying hardware information as described in any preceding item when executing a computer program stored in a memory steps of the method.

Finally, an embodiment of the present invention further provides a computer-readable storage medium, where a program for querying an upper-layer interface of hardware information by an automated test is stored thereon, and the program for querying an upper-layer interface of hardware information by an automated test is stored by a processor During execution, the steps of implementing the method for automatically testing the upper-layer interface for querying hardware information as described in any of the preceding items are implemented.

The advantage of the technical solution provided by this application is that the upper-layer interface of hardware information is automatically tested and inquired through software, and the hardware environment is simulated in software, thereby isolating the upper-layer software code from the underlying hardware. When verifying the functions of the upper-layer software, not only can Avoid the problem of manually changing the configuration hardware environment and environment variables when verifying hardware information, and can also automatically verify the whole process, realize software simulation of hardware problems, and automate software function script testing, which is fast and effective, greatly improving test efficiency and enhancing test accuracy. It also helps to enhance the quality of storage products; in addition, the software and hardware environments are isolated to effectively avoid the problem of hardware damage during traditional verification of upper-layer software interfaces, which is conducive to reducing R&D costs.

In addition, the embodiments of the present invention also provide a corresponding implementation device, device, and computer-readable storage medium for the method of querying the upper-layer interface of hardware information for automated testing, which further makes the method more practical, and the device, device, and computer can Reading storage media has corresponding advantages.

It is to be understood that the foregoing general description and the following detailed description are exemplary only and do not limit the present disclosure.

Description of drawings

In order to illustrate the technical solutions of the embodiments of the present invention or related technologies more clearly, the following briefly introduces the accompanying drawings that are used in the description of the embodiments or related technologies. Obviously, the drawings in the following description are only the present invention. For some embodiments of the present invention, for those of ordinary skill in the art, other drawings can also be obtained from these drawings without any creative effort.

1 is a schematic flowchart of a method for an automated test querying an upper-layer interface for hardware information provided by an embodiment of the present invention;

FIG. 2 is a schematic flowchart of another method for automatically testing an upper-layer interface for querying hardware information provided by an embodiment of the present invention;

3 is a structural diagram of a specific implementation of an apparatus for an automated test querying an upper-layer interface for hardware information provided by an embodiment of the present invention;

FIG. 4 is a structural diagram of another specific implementation of an apparatus for an automated test querying an upper-layer interface of hardware information provided by an embodiment of the present invention.

Detailed ways

In order to make those skilled in the art better understand the solution of the present invention, the present invention will be further described in detail below with reference to the accompanying drawings and specific embodiments. Obviously, the described embodiments are only some, but not all, embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by those of ordinary skill in the art without creative efforts shall fall within the protection scope of the present invention.

The terms "first", "second", "third", "fourth", etc. in the description and claims of the present application and the above drawings are used to distinguish different objects, rather than to describe a specific order. . Furthermore, the terms "comprising" and "having" and any variations thereof are intended to cover non-exclusive inclusion. For example, a process, method, system, product or device comprising a series of steps or elements is not limited to the listed steps or elements, but may include unlisted steps or elements.

After introducing the technical solutions of the embodiments of the present invention, various non-limiting implementations of the present application are described in detail below.

Referring first to FIG. 1, FIG. 1 is a schematic flowchart of a method for an automated test querying an upper-layer interface for hardware information provided by an embodiment of the present invention. The embodiment of the present invention may include the following content:

S101: Obtain a hardware instance to be tested, and determine a query interface corresponding to the hardware instance to be tested.

The hardware instance to be tested is the information of the tested hardware, that is, the hardware test instance, including the hardware type and test information (test items), and the test information is the item of the hardware to be tested. For example, if the hardware to be tested is a fan, and the item to be tested is in-position status information, the hardware instance to be tested is in the in-position status of the fan.

The query of hardware information corresponds to a fixed command, and the queried information is returned by the fixed upper-layer interface information. For example, for the presence information of a specific fan, there will be a corresponding low-level query interface. For example, the information about the in-position status of the fan (eg offline) is returned by the upper layer interface A, and the query interface corresponding to the hardware instance to be tested determined in S101 is A.

S102: Modify the return value of the query interface according to the received modification instruction, and redirect to a preset virtual file.

The R&D personnel modify the software code corresponding to the real hardware environment, and the system receives the modification instructions input by the R&D personnel, and according to the modification data fields contained in the modification instructions, modifies the underlying incoming data (that is, the return value of the query interface). The return value is modified to modify the data field. For example, if the fan is expected to be offline, the R&D personnel will send an instruction to modify the return value of the query interface to offline, that is to say, modify the data segment to be offline. When the system receives the modification instruction, it will The data incoming through the interface is modified to be offline.

The virtual file is a preset file, and the return value of the modified underlying interface is directed to the virtual file in real time, that is to say, the system redirects the modified return value to the virtual file every time after modifying the return value of the query interface. middle.

S103: Read the virtual file to obtain the modified return value, and generate a test result according to the matching result between the preset expected value and the modified return value.

The expected value is the same as the modified data field in the modification instruction, that is to say, after the modification instruction is successfully executed and the upper interface of the hardware information is queried by the automatic test, the return value of the modified interface is the same as the expected value.

At regular intervals, the hardware instance to be tested can be checked once, that is, the test is automatically executed at regular intervals to query the upper-layer interface of hardware information, and the validity of the upper-layer software can be automatically verified. By reading the return value directed to the virtual file in S102 according to a preset frequency (for example, every 0.5h), and matching the return value with the expected value, the upper-layer interface of automatic test query hardware information is realized. If the preset expected value and the modified return value are the same, the test passes; if the preset expected value and the modified return value are different, the test fails, and the test result can be recorded in the log.

The whole process can be realized by writing a script, the hardware instance to be tested is written into the script, and a virtual file is created in the script, and the underlying incoming data is modified and redirected to the virtual file, so that the tester can The test script can be executed like a fool, without the need to manually configure the hardware environment, change the environment variables, and improve the test efficiency

The log can record the entire test process. Considering that the log capacity occupies too much memory and may affect the system operation, only the test results and test time can be recorded, so that the R&D personnel can directly check the log to verify the validity of the last software function. , does not need to rely on the real underlying hardware information, and there is no change and configuration of the hardware, avoiding the operation of the underlying firmware device, only need to run the test script at the beginning, and the intermediate process does not need to be concerned at all.

For example, if the hardware instance to be tested is the presence information of the fan, there will be a corresponding low-level query interface, and the return value must also indicate the presence. The return value of its query interface can be modified to be non-existent and redirected to a specific file. By periodically reading a specific file, the field corresponding to the pre-modified upper layer can be obtained and matched with the expected value. If the final field of the upper layer is consistent with the expected field, then test Pass, otherwise, the test fails, so as to realize the automatic test query hardware information upper interface.

In the technical solution provided by the embodiment of the present invention, the upper-layer interface of hardware information is automatically tested and inquired through software, and the hardware environment is simulated in software, thereby isolating the upper-layer software code from the underlying hardware. When verifying the function of the upper-layer software, not only It can avoid the problem of manually changing the configuration hardware environment and environment variables when verifying hardware information, and can also automatically verify the whole process, realize software simulation of hardware problems, and automate software function script testing, which is fast and effective, greatly improving test efficiency and enhancing the test. The accuracy rate is also conducive to enhancing the quality of storage products; in addition, the hardware and software environments are isolated to effectively avoid the problem of hardware damage when traditionally verifying upper-layer software interfaces, which is conducive to reducing R&D costs.

The present application also provides another embodiment, please refer to FIG. 2 , FIG. 2 is a schematic flowchart of another method for an automated test querying an upper-layer interface of hardware information provided by an embodiment of the present invention, which may be applied to a storage system, for example, and may include The following:

S201: Obtain the hardware instance to be tested, write the hardware instance to be tested to a preset specific file, and determine a query interface corresponding to the hardware instance to be tested.

S202: Modify the return value of the query interface according to the received modification instruction, and redirect to a preset virtual file.

S203: Read the virtual file according to the preset frequency to obtain the modified return value.

The setting of the preset frequency can be determined according to the actual situation, which is not limited in this application.

S204: If the preset expected value and the modified return value are the same, the generated test result is that the test passes.

S205: If the preset expected value and the modified return value are different, the generated test result is that the test fails.

S206: Record the test result in the log.

For the same methods or steps in the embodiments of the present invention as the above-mentioned embodiments, reference may be made to the descriptions of the above-mentioned embodiments, and details are not repeated here.

As can be seen from the above, the embodiment of the present invention automatically tests and queries the upper-layer interface of hardware information through software, and simulates the hardware environment in software, thereby isolating the upper-layer software code from the underlying hardware, which is fast and effective, improves the test efficiency, and enhances the test. Accuracy rate, isolates the software and hardware environment, effectively avoids the problem of hardware damage when traditionally verifying the upper-layer software interface, and helps reduce R&D costs; R&D personnel can directly query the log records to check the availability of software functions, thereby improving the code function testing of developers. efficiency.

The embodiment of the present invention also provides a corresponding implementation device for the method of querying the upper-layer interface of hardware information by automated testing, which further makes the method more practical. The following describes the device for querying the upper-layer interface of hardware information by automated testing provided by the embodiments of the present invention. The device for querying the upper-layer interface of hardware information by automatic testing described below and the method for querying the upper-layer interface of hardware information by automatic testing described above may refer to each other correspondingly.

Referring to FIG. 3, FIG. 3 is a structural diagram of an apparatus for an automated test querying an upper-layer interface for hardware information provided by an embodiment of the present invention under a specific implementation manner, and the apparatus may include:

The hardware instance information acquisition module 301 is configured to acquire the hardware instance to be tested, and determine the query interface corresponding to the hardware instance to be tested.

The underlying data modification module 302 is configured to modify the return value of the query interface according to the received modification instruction, and redirect to a preset virtual file.

The automated test module 303 is configured to read the virtual file to obtain the modified return value, and generate a test result according to the matching result between the preset expected value and the modified return value; the expected value is the same as the modified data field in the modification instruction.

Optionally, in some implementations of this embodiment, referring to FIG. 4 , for example, the apparatus may further include a log recording module 304, configured to record the test result in a log.

Optionally, in other implementations of this embodiment, the automated testing module 303 may also be a module that reads a virtual file according to a preset frequency to obtain a modified return value.

In addition, the automated test module 303 can also be used to generate a test result that passes the test if the preset expected value and the modified return value are the same; if the preset expected value and the modified return value are different, the generated test result to fail the test.

The functions of each functional module of the apparatus for automatically testing and querying the upper-layer interface of hardware information according to the embodiment of the present invention can be specifically implemented according to the methods in the above method embodiments, and the specific implementation process can refer to the relevant descriptions of the above method embodiments, which are not described here. Repeat.

As can be seen from the above, the embodiment of the present invention automatically tests and queries the upper-layer interface of hardware information through software, and simulates the hardware environment in software, thereby isolating the upper-layer software code from the underlying hardware, which is fast and effective, improves the test efficiency, and enhances the test. Accuracy, isolates the software and hardware environment, effectively avoids the problem of damage to the hardware when traditionally verifying the upper-layer software interface, and helps reduce R&D costs.

The embodiment of the present invention also provides a device for automatically testing an upper-layer interface for querying hardware information, which may specifically include:

memory for storing computer programs;

The processor is configured to execute the computer program to implement the steps of the method for automatically testing the method for querying the upper-layer interface of hardware information according to any one of the above embodiments.

The functions of each functional module of the device for automatically testing and querying the upper-layer interface of hardware information according to the embodiment of the present invention can be specifically implemented according to the methods in the above method embodiments, and the specific implementation process can refer to the relevant descriptions of the above method embodiments, which are not described here. Repeat.

As can be seen from the above, the embodiment of the present invention automatically tests and queries the upper-layer interface of hardware information through software, and simulates the hardware environment in software, thereby isolating the upper-layer software code from the underlying hardware, which is fast and effective, improves the test efficiency, and enhances the test. Accuracy, isolates the software and hardware environment, effectively avoids the problem of damage to the hardware when traditionally verifying the upper-layer software interface, and helps reduce R&D costs.

An embodiment of the present invention further provides a computer-readable storage medium, which stores a program for querying an upper-layer interface of hardware information by an automated test. The steps of the automated testing method for querying the upper-layer interface for hardware information.

The functions of each functional module of the computer-readable storage medium according to the embodiments of the present invention may be specifically implemented according to the methods in the foregoing method embodiments, and the specific implementation process may refer to the relevant descriptions of the foregoing method embodiments, which will not be repeated here.

As can be seen from the above, the embodiment of the present invention automatically tests and queries the upper-layer interface of hardware information through software, and simulates the hardware environment in software, thereby isolating the upper-layer software code from the underlying hardware, which is fast and effective, improves the test efficiency, and enhances the test. Accuracy, isolates the software and hardware environment, effectively avoids the problem of damage to the hardware when traditionally verifying the upper-layer software interface, and helps reduce R&D costs.

The various embodiments in this specification are described in a progressive manner, and each embodiment focuses on the differences from other embodiments, and the same or similar parts between the various embodiments may be referred to each other. As for the device disclosed in the embodiment, since it corresponds to the method disclosed in the embodiment, the description is relatively simple, and the relevant part can be referred to the description of the method.

Professionals may further realize that the units and algorithm steps of each example described in conjunction with the embodiments disclosed herein can be implemented in electronic hardware, computer software, or a combination of the two, in order to clearly illustrate the possibilities of hardware and software. Interchangeability, the above description has generally described the components and steps of each example in terms of functionality. Whether these functions are performed in hardware or software depends on the specific application and design constraints of the technical solution. Skilled artisans may implement the described functionality using different methods for each particular application, but such implementations should not be considered beyond the scope of the present invention.

The steps of a method or algorithm described in conjunction with the embodiments disclosed herein may be directly implemented in hardware, a software module executed by a processor, or a combination of the two. A software module can be placed in random access memory (RAM), internal memory, read only memory (ROM), electrically programmable ROM, electrically erasable programmable ROM, registers, hard disk, removable disk, CD-ROM, or any other in the technical field. in any other known form of storage medium.

The method, apparatus, device, and computer-readable storage medium for an automated test querying an upper-layer interface for hardware information provided by the present invention have been described above in detail. The principles and implementations of the present invention are described herein by using specific examples, and the descriptions of the above embodiments are only used to help understand the method and the core idea of the present invention. It should be pointed out that for those skilled in the art, without departing from the principle of the present invention, several improvements and modifications can also be made to the present invention, and these improvements and modifications also fall within the protection scope of the claims of the present invention.

Claims (10)

1. a kind of method of automatic test inquiry hardware information high-level interface characterized by comprising

Hardware instance to be tested is obtained, determines the corresponding query interface of the hardware instance to be tested；

According to the return value of query interface described in the modification instruction modification received, and it is redirected in default virtual file；

It reads the virtual file and obtains modified return value, according to the matching knot of default desired value and modified return value Fruit generates test result；

Wherein, the desired value is identical as modification data field in modification instruction.

2. the method for automatic test inquiry hardware information high-level interface according to claim 1, which is characterized in that described According to default desired value and modified return value, after generating test result, further includes:

The test result is recorded in log.

3. the method for automatic test inquiry hardware information high-level interface according to claim 2, which is characterized in that described After obtaining hardware instance to be tested, further includes:

The hardware instance to be tested is written to default specific file.

4. special according to claim 1 to the method for the inquiry hardware information high-level interface of automatic test described in 3 any one Sign is that the reading virtual file obtains modified return value are as follows:

Virtual file, which is read, according to predeterminated frequency obtains modified return value.

5. the method for automatic test inquiry hardware information high-level interface according to claim 4, which is characterized in that described According to the matching result of default desired value and modified return value, generating test result includes:

If the default desired value is identical with modified return value, the test result generated is that test passes through；

If the default desired value and modified return value be not identical, the test result generated is that test does not pass through.

6. a kind of device of automatic test inquiry hardware information high-level interface characterized by comprising

Hardware instance data obtaining module to be tested determines the hardware instance to be tested for obtaining hardware instance to be tested Corresponding query interface；

Bottom data modified module for the return value of the query interface according to the modification instruction modification received, and is reset To into default virtual file；

Automatic test module obtains modified return value for reading the virtual file, according to default desired value and repairs The matching result of return value after changing generates test result；Data field phase is modified in the desired value and modification instruction Together.

7. the device of automatic test inquiry hardware information high-level interface according to claim 6, which is characterized in that described Automatic test module is to read the virtual file according to predeterminated frequency to obtain the module of modified return value.

8. the device of automatic test inquiry hardware information high-level interface according to claim 7, which is characterized in that described If it is identical with modified return value that automatic test module is also used to the default desired value, the test result generated is to survey It pinged；If the default desired value and modified return value be not identical, the test result generated is that test does not pass through.

9. a kind of equipment of automatic test inquiry hardware information high-level interface, which is characterized in that including processor, the processing Device is for realizing that the automatic test as described in any one of claim 1 to 5 is looked into when executing the computer program stored in memory The step of asking the method for hardware information high-level interface.

10. a kind of computer readable storage medium, which is characterized in that be stored with automation on the computer readable storage medium The program of the program of test query hardware information high-level interface, the automatic test inquiry hardware information high-level interface is processed The step of the method for automatic test inquiry hardware information high-level interface as described in any one of claim 1 to 5 is realized when device executes Suddenly.