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CN118816747A - Optical device, optical detection method and optical device design method - Google Patents

Optical device, optical detection method and optical device design method Download PDF

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CN118816747A
CN118816747A CN202310419993.5A CN202310419993A CN118816747A CN 118816747 A CN118816747 A CN 118816747A CN 202310419993 A CN202310419993 A CN 202310419993A CN 118816747 A CN118816747 A CN 118816747A
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image capturing
projection
unit
range
detected
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余良彬
王涌锋
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Jianwei Technology Co ltd
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01BMEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00Measuring arrangements characterised by the use of optical techniques
    • G01B11/24Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures

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  • Length Measuring Devices By Optical Means (AREA)

Abstract

一种光学装置、光学检测方法及光学装置设计方法,所述光学检测方法适用于运用在光学装置。所述光学装置包含界定投射范围的投射单元、界定取像范围的取像单元,及电连接所述投射单元及所述取像单元的处理单元,所述取像范围与所述投射范围各定义出长轴及长度小于所述长轴的短轴。所述投射单元朝待测物沿入射路径投射光束,并经所述待测物反射后沿反射路径进入所述取像单元,且所述入射路径或所述反射路径于待测平面的投影平行于所述投射范围或所述取像范围之短轴的延伸方向。借此,可以避免发生局部过曝的光点出现于有效取像范围内,进而降低无效的观察区域,以提升量测效能。

An optical device, an optical detection method, and an optical device design method, wherein the optical detection method is suitable for use in an optical device. The optical device includes a projection unit that defines a projection range, an imaging unit that defines an imaging range, and a processing unit electrically connected to the projection unit and the imaging unit, wherein the imaging range and the projection range each define a major axis and a minor axis whose length is less than the major axis. The projection unit projects a light beam toward the object to be measured along an incident path, and after being reflected by the object to be measured, the light beam enters the imaging unit along a reflection path, and the projection of the incident path or the reflection path on the plane to be measured is parallel to the extension direction of the minor axis of the projection range or the imaging range. In this way, it is possible to avoid the occurrence of locally overexposed light spots within the effective imaging range, thereby reducing the invalid observation area to improve the measurement performance.

Description

光学装置、光学检测方法及光学装置设计方法Optical device, optical detection method and optical device design method

技术领域Technical Field

本发明涉及一种光学装置及检测方法,特别是涉及一种光学装置、光学检测方法及光学装置设计方法。The present invention relates to an optical device and a detection method, and in particular to an optical device, an optical detection method and an optical device design method.

背景技术Background Art

近年来,非接触式光学检测应用范围越来越广泛,尤其是以三角测量的方法进行的三维检测装置。惟,当待测物表面为镜面时,在镜头收光角度范围内,部分信号光线依照反射定律经所述待测物表面反射,使能量集中进入光学系统,造成相机局部过曝,因此影像上可见明显灰阶值饱和之亮点,进而影响检测功能。另外,目前业界亦有三维检测装置通过玻璃隔板量测待测物的量测需求,由于玻璃隔板的表面平整,因此会有部分光束依照反射定律进入三维检测装置,而有前述局部过曝现象(参阅图1)的产生。In recent years, the application scope of non-contact optical detection has become more and more extensive, especially the three-dimensional detection device based on the triangulation method. However, when the surface of the object to be tested is a mirror, within the range of the lens's light collection angle, part of the signal light is reflected by the surface of the object to be tested according to the law of reflection, so that the energy is concentrated into the optical system, causing the camera to be partially overexposed. Therefore, bright spots with obvious grayscale saturation can be seen on the image, which in turn affects the detection function. In addition, there is also a demand in the industry for three-dimensional detection devices to measure the object to be tested through a glass partition. Since the surface of the glass partition is flat, part of the light beam will enter the three-dimensional detection device according to the law of reflection, resulting in the aforementioned local overexposure phenomenon (see Figure 1).

参阅图2与图4,一种现有的三维检测仪器1,主要包含一投射出结构光的投射装置11,及一接收来自一待测件13反射之结构光且收光半角为γ1的取像装置12,所述取像装置12的光轴与所述投射装置11的光轴之间的夹角为α1,且自所述待测件13所反射之光束的反射路径于待测平面的投影垂直于取像范围15之短轴的延伸方向,所述取像范围15之短轴定义为四边形两对边中心连线长度中,长度较短的连线。其中,图2中绘制出的光路为依照反射定律(入射角θi等于反射角θr)的光路,因此经所述光路进入所述取像装置12会产生局部过曝的光点。根据图2所述投射装置11的投射范围14是四边形、所述取像装置12的取像范围15为四边形,绘制出图4的示意图,其中,定义一有效取像范围16为自所述投射装置11于平面的投影中心向外延伸D1的范围,β1为所述投射装置11到所述有效取像范围16边界的角度,D1为局部过曝光点至投射装置11于平面的投影中心之间的距离。图4中,由于局部过曝光点的位置位于所述待测件13的边界内,因此会影响检测结果。Referring to FIG. 2 and FIG. 4 , an existing three-dimensional detection instrument 1 mainly includes a projection device 11 for projecting structured light, and an imaging device 12 for receiving structured light reflected from a test piece 13 and having a light receiving half angle of γ1. The angle between the optical axis of the imaging device 12 and the optical axis of the projection device 11 is α1, and the projection of the reflection path of the light beam reflected from the test piece 13 on the test plane is perpendicular to the extension direction of the short axis of the imaging range 15. The short axis of the imaging range 15 is defined as the shorter connecting line in the length of the connecting line between the centers of two opposite sides of the quadrilateral. Among them, the light path drawn in FIG. 2 is a light path according to the law of reflection (the incident angle θi is equal to the reflection angle θr), so a light spot with local overexposure will be generated when entering the imaging device 12 through the light path. According to FIG. 2 , the projection range 14 of the projection device 11 is a quadrilateral, and the imaging range 15 of the imaging device 12 is a quadrilateral, and a schematic diagram of FIG. 4 is drawn, wherein an effective imaging range 16 is defined as a range extending outward from the projection center of the projection device 11 on the plane to D1, β1 is the angle from the projection device 11 to the boundary of the effective imaging range 16, and D1 is the distance from the local overexposure point to the projection center of the projection device 11 on the plane. In FIG. 4 , since the position of the local overexposure point is within the boundary of the test piece 13, it will affect the detection result.

参阅图3与图5,一般来说,为了提升Z轴分辨率并扩大所述有效取像范围16至少包含所述待测件13的尺寸(其边长之半为D2),用户一般会增加所述投射装置11与所述取像装置12之间的夹角α2,以增加β2,使有效取像范围16扩大而解决局部过曝之问题。惟,此方式除了会导致所述三维检测仪器1的体积增加外,此方式也会因为需要较小光圈(即缩小γ1)才能提供足够的景深,而容易导致检测时亮度不足的问题。Referring to FIG. 3 and FIG. 5 , generally speaking, in order to improve the Z-axis resolution and expand the effective imaging range 16 to at least include the size of the test object 13 (half of its side length is D2), the user generally increases the angle α2 between the projection device 11 and the imaging device 12 to increase β2, thereby expanding the effective imaging range 16 and solving the problem of partial overexposure. However, this method not only increases the volume of the three-dimensional detection instrument 1, but also requires a smaller aperture (i.e., reduces γ1) to provide sufficient depth of field, which easily leads to insufficient brightness during detection.

发明内容Summary of the invention

本发明之其中一目的在于提供一种提升检测效率的光学装置。One of the objectives of the present invention is to provide an optical device for improving detection efficiency.

本发明的光学装置在一些实施态样中,适用于量测待测物,并包含投射单元、取像单元,及处理单元。In some embodiments, the optical device of the present invention is suitable for measuring an object to be measured, and includes a projection unit, an imaging unit, and a processing unit.

所述投射单元用于投射光束至所述待测物并界定投射范围。The projection unit is used for projecting a light beam to the object to be measured and defining a projection range.

所述取像单元用于接收自所述待测物反射之光束并界定取像范围,所述取像范围与所述投射范围各定义出长轴及长度小于所述长轴的短轴,所述投射单元朝所述待测物沿入射路径投射光束,并经所述待测物反射后沿反射路径进入所述取像单元,且所述入射路径于待测平面的投影平行于所述投射范围之短轴的延伸方向,或所述反射路径于所述待测平面的投影平行于所述取像范围之短轴的延伸方向。The imaging unit is used to receive the light beam reflected from the object to be measured and define an imaging range. The imaging range and the projection range each define a major axis and a minor axis whose length is smaller than the major axis. The projection unit projects the light beam along an incident path toward the object to be measured, and the light beam enters the imaging unit along a reflection path after being reflected by the object to be measured. The projection of the incident path on the plane to be measured is parallel to the extension direction of the minor axis of the projection range, or the projection of the reflection path on the plane to be measured is parallel to the extension direction of the minor axis of the imaging range.

所述处理单元电连接所述投射单元及所述取像单元,所述处理单元收到触发信号后驱动所述投射单元投射所述光束,并驱动所述取像单元接收到自所述待测物反射之光束。The processing unit is electrically connected to the projection unit and the imaging unit. After receiving a trigger signal, the processing unit drives the projection unit to project the light beam and drives the imaging unit to receive the light beam reflected from the object to be measured.

在一些实施态样中,所述处理单元驱动所述投射单元投射光束持续投射期间,并驱动所述取像单元接收反射之光束持续取像期间。In some implementations, the processing unit drives the projection unit to project the light beam for a projection period, and drives the imaging unit to receive the reflected light beam for an imaging period.

在一些实施态样中,所述处理单元驱动所述投射单元投射光束持续投射期间,并在开始取像时间驱动所述取像单元接收反射之光束。In some implementations, the processing unit drives the projection unit to project the light beam for a continuous projection period, and drives the imaging unit to receive the reflected light beam at the start of imaging.

在一些实施态样中,所述取像范围与所述投射范围是四边形,其中两对边的中心连线定义出所述长轴,另两对边的中心连线定义出所述短轴。In some implementations, the imaging range and the projection range are quadrilaterals, wherein a line connecting the centers of two pairs of sides defines the major axis, and a line connecting the centers of the other two pairs of sides defines the minor axis.

在一些实施态样中,所述投射单元与所述取像单元界定出有效取像范围,所述有效取像范围大于所述取像范围。In some implementations, the projection unit and the imaging unit define an effective imaging range, and the effective imaging range is larger than the imaging range.

在一些实施态样中,由所述投射单元与所述取像单元界定之有效取像范围与所述投射单元与所述待测物的距离、所述取像单元与所述待测物的距离,及所述投射单元与所述取像单元的夹角有关。In some implementations, the effective imaging range defined by the projection unit and the imaging unit is related to the distance between the projection unit and the object to be measured, the distance between the imaging unit and the object to be measured, and the angle between the projection unit and the imaging unit.

在一些实施态样中,由所述投射单元与所述取像单元界定之有效取像范围之边长的一半其中,R1为所述投射单元与所述待测物的距离,R2为所述取像单元与所述待测物的距离,θ为所述投射单元与所述取像单元的夹角。In some embodiments, half of the side length of the effective imaging range defined by the projection unit and the imaging unit Wherein, R1 is the distance between the projection unit and the object to be measured, R2 is the distance between the imaging unit and the object to be measured, and θ is the angle between the projection unit and the imaging unit.

在一些实施态样中,所述投射范围大于且包含所述取像范围,且由所述投射单元与所述取像单元界定之有效取像范围大于且包含所述取像范围。In some implementations, the projection range is larger than and includes the imaging range, and the effective imaging range defined by the projection unit and the imaging unit is larger than and includes the imaging range.

本发明之其中一目的在于提供一种提升检测效率的光学检测方法。One of the objectives of the present invention is to provide an optical detection method for improving detection efficiency.

本发明的光学检测方法在一些实施态样中,适用于运用在光学装置对设置于待测平面上的待测物进行测量,所述光学装置包含用于投射光束至所述待测物并界定投射范围的投射单元,及用于接收自所述待测物反射之光束并界定取像范围的取像单元,所述投射单元与所述取像范围各定义出长轴及长度小于所述长轴的短轴,所述光学检测方法包含以下步骤:In some embodiments, the optical detection method of the present invention is suitable for measuring an object to be measured disposed on a plane to be measured using an optical device, wherein the optical device comprises a projection unit for projecting a light beam to the object to be measured and defining a projection range, and an imaging unit for receiving a light beam reflected from the object to be measured and defining an imaging range, wherein the projection unit and the imaging range each define a major axis and a minor axis whose length is less than the major axis, and the optical detection method comprises the following steps:

测量步骤:所述投射单元朝所述待测物沿入射路径投射光束,并经所述待测物反射后沿反射路径进入所述取像单元,且所述入射路径于所述待测平面的投影平行于所述投射范围之短轴的延伸方向,或所述反射路径于所述待测平面的投影平行于所述取像范围之短轴的延伸方向。Measuring steps: the projection unit projects a light beam toward the object to be measured along an incident path, and after being reflected by the object to be measured, the light beam enters the imaging unit along a reflection path, and the projection of the incident path on the plane to be measured is parallel to the extension direction of the short axis of the projection range, or the projection of the reflection path on the plane to be measured is parallel to the extension direction of the short axis of the imaging range.

在一些实施态样中,所述投射范围与所述取像范围是四边形,其中两对边的中心连线定义出所述长轴,另两对边的中心连线定义出所述短轴。In some implementations, the projection range and the imaging range are quadrilaterals, wherein a line connecting the centers of two pairs of sides defines the major axis, and a line connecting the centers of the other two pairs of sides defines the minor axis.

在一些实施态样中,所述投射单元与所述取像单元界定出有效取像范围,所述有效取像范围大于所述取像范围。In some implementations, the projection unit and the imaging unit define an effective imaging range, and the effective imaging range is larger than the imaging range.

在一些实施态样中,由所述投射单元与所述取像单元界定之有效取像范围与所述投射单元与所述待测物的距离、所述取像单元与所述待测物的距离,及所述投射单元与所述取像单元的夹角有关。In some implementations, the effective imaging range defined by the projection unit and the imaging unit is related to the distance between the projection unit and the object to be measured, the distance between the imaging unit and the object to be measured, and the angle between the projection unit and the imaging unit.

在一些实施态样中,由所述投射单元与所述取像单元界定之有效取像范围之边长的一半其中,R1为所述投射单元与所述待测物的距离,R2为所述取像单元与所述待测物的距离,θ为所述投射单元与所述取像单元的夹角。In some embodiments, half of the side length of the effective imaging range defined by the projection unit and the imaging unit Wherein, R1 is the distance between the projection unit and the object to be measured, R2 is the distance between the imaging unit and the object to be measured, and θ is the angle between the projection unit and the imaging unit.

在一些实施态样中,所述投射范围大于且包含所述取像范围,且由所述投射单元与所述取像单元界定之有效取像范围大于且包含所述取像范围。In some implementations, the projection range is larger than and includes the imaging range, and the effective imaging range defined by the projection unit and the imaging unit is larger than and includes the imaging range.

本发明之另一目的在于提供一种提升光学装置之检测效率的光学装置设计方法。Another object of the present invention is to provide an optical device design method for improving the detection efficiency of the optical device.

本发明的光学装置设计方法在一些实施态样中,所述光学装置包含用于投射光束至待测物并界定投射范围的投射单元,及用于接收自所述待测物反射之光束并界定取像范围的取像单元,所述取像范围定义出长轴及长度小于所述长轴的短轴,所述光学装置设计方法包含计算步骤、判断步骤,及测量步骤。In some embodiments of the optical device design method of the present invention, the optical device includes a projection unit for projecting a light beam to the object to be measured and defining a projection range, and an imaging unit for receiving a light beam reflected from the object to be measured and defining an imaging range, wherein the imaging range defines a major axis and a minor axis whose length is less than the major axis. The optical device design method includes a calculation step, a judgment step, and a measurement step.

所述计算步骤根据所述投射单元与所述待测物的距离、所述取像单元与所述待测物的距离,及所述投射单元与所述取像单元的夹角计算出有效取像范围。The calculation step calculates an effective imaging range according to the distance between the projection unit and the object to be measured, the distance between the imaging unit and the object to be measured, and the angle between the projection unit and the imaging unit.

所述判断步骤根据所述计算步骤所计算出的有效取像范围,判断所述取像范围是否不大于所述有效取像范围的边长,如判断结果为是,进行下一步骤。The judging step judges whether the imaging range is not greater than the side length of the effective imaging range according to the effective imaging range calculated in the calculating step, and if the judging result is yes, proceeds to the next step.

所述测量步骤中,所述投射单元朝所述待测物沿入射路径投射光束,并经所述待测物反射后沿反射路径进入所述取像单元,所述入射路径或所述反射路径于待测平面的投影平行于所述短轴的延伸方向。In the measuring step, the projection unit projects a light beam toward the object to be measured along an incident path, and after being reflected by the object to be measured, the light beam enters the imaging unit along a reflection path, and the projection of the incident path or the reflection path on the plane to be measured is parallel to the extension direction of the short axis.

在一些实施态样中,还包含设置步骤:调整所述投射单元与所述待测物的距离、所述取像单元与所述待测物的距离,及所述投射单元与所述取像单元的夹角其中至少一者,如所述判断步骤结果为否,则进行所述设置步骤及所述计算步骤。In some implementations, a setting step is also included: adjusting at least one of the distance between the projection unit and the object to be measured, the distance between the imaging unit and the object to be measured, and the angle between the projection unit and the imaging unit. If the result of the judgment step is no, the setting step and the calculation step are performed.

本发明具有以下功效:当所述待测物为长方体或类似之长形物时,由于不发生局部过曝的有效取像范围只与平行所述入射路径或所述反射路径之方向有关,与垂直于所述入射路径或所述反射路径之方向无关,因此,通过设计光路使所述入射路径或所述反射路径于所述待测平面的投影平行于所述短轴的延伸方向,用户只须考量将所述待测物的短边位于所述有效取像范围内,就不会有局部过曝现象,因此,就能提升成像的有效观察区域,借以提升测量效率。The present invention has the following effects: when the object to be measured is a rectangular parallelepiped or a similar long object, since the effective imaging range in which local overexposure does not occur is only related to the direction parallel to the incident path or the reflection path, and has nothing to do with the direction perpendicular to the incident path or the reflection path, therefore, by designing the optical path so that the projection of the incident path or the reflection path on the plane to be measured is parallel to the extension direction of the short axis, the user only needs to consider placing the short side of the object to be measured within the effective imaging range, and there will be no local overexposure phenomenon, so that the effective observation area of the imaging can be increased, thereby improving the measurement efficiency.

附图说明BRIEF DESCRIPTION OF THE DRAWINGS

本发明之其他的特征及功效,将于参照附图的实施方式中清楚地呈现,其中:Other features and effects of the present invention will be clearly presented in the embodiments with reference to the accompanying drawings, in which:

图1是现有三维检测仪器量测时发生过曝情形之照片;FIG1 is a photograph showing an overexposure condition during measurement by a conventional three-dimensional detection instrument;

图2与图3分别是所述现有三维检测仪器于不同设置状况的侧视示意图;2 and 3 are schematic side views of the prior art three-dimensional detection apparatus in different settings;

图4是对应于图2之设置情形下的有效区域及待测件的顶视示意图;FIG4 is a top view of the effective area and the DUT corresponding to the configuration of FIG2 ;

图5是对应于图3之设置情形下的有效区域及待测件的顶视示意图;FIG5 is a top view schematically showing the effective area and the DUT under the arrangement corresponding to FIG3 ;

图6是本发明光学装置的方块图;FIG6 is a block diagram of an optical device of the present invention;

图7是本发明光学装置设计方法的实施例的流程图;7 is a flow chart of an embodiment of an optical device design method of the present invention;

图8是所述光学装置的侧视示意图;FIG8 is a schematic side view of the optical device;

图9是对应于图8的顶视示意图;FIG9 is a schematic top view corresponding to FIG8;

图10是另一实施态样的顶视示意图;FIG10 is a top view of another embodiment;

图11是所述光学装置的光路示意图;FIG11 is a schematic diagram of the optical path of the optical device;

图12~图14是根据所述实施例中的计算步骤所使用的运算式所绘制的关系图;12 to 14 are relationship diagrams drawn according to the calculation formulas used in the calculation steps of the embodiment;

图15A及图15B是顶视示意图,分别说明运用现有检测方式以及本发明光学检测方法检测I/O元件的情形。15A and 15B are top view schematic diagrams respectively illustrating the situations of detecting I/O components using the conventional detection method and the optical detection method of the present invention.

具体实施方式DETAILED DESCRIPTION

参阅图6、图8与图9,本发明光学装置设计方法之一实施例。所述光学装置2包含一用于投射一光束至一待测物23并界定一投射范围24的投射单元21、一用于接收自所述待测物23反射之光束并界定一取像范围25的取像单元22,及一电连接所述投射单元21及所述取像单元22的处理单元26。Referring to Figures 6, 8 and 9, an embodiment of the optical device design method of the present invention, the optical device 2 comprises a projection unit 21 for projecting a light beam to an object to be measured 23 and defining a projection range 24, an imaging unit 22 for receiving the light beam reflected from the object to be measured 23 and defining an imaging range 25, and a processing unit 26 electrically connected to the projection unit 21 and the imaging unit 22.

参阅8、图9与图10,在本实施例的其中一实施态样中,所述投射单元21于待测平面上的一投射范围24为四边形,具体来说是矩形,所述取像单元22于所述待测平面上的一取像范围25为四边形,具体来说为其中两边平行的梯形。补充说明的是,前述梯形中的一对平行边的长短是根据投射方向而有变化,并不以此限定本发明之范围。在本实施例的其他态样中,如果所述投射单元21的入射面不垂直投射面时,所述投射范围24即为四边形(任二边皆不会平行)。参阅图10,在本实施例的另一变化态样中,所述投射单元21与所述取像单元22的位置互换。另补充说明的是,在本实施例中,所述投射范围24会包含且涵盖所述取像范围25,但不应以此为限。进一步说明的是,所述投射范围24与所述取像范围25各定义出一长轴及一长度小于所述长轴的短轴,其中两对边的中心连线定义出所述长轴,另两对边的中心连线定义出所述短轴。Referring to FIG8, FIG9 and FIG10, in one of the implementation modes of the present embodiment, a projection range 24 of the projection unit 21 on the plane to be measured is a quadrilateral, specifically a rectangle, and an imaging range 25 of the imaging unit 22 on the plane to be measured is a quadrilateral, specifically a trapezoid with two sides parallel. It should be supplemented that the length of a pair of parallel sides in the aforementioned trapezoid varies according to the projection direction, and the scope of the present invention is not limited thereto. In other modes of the present embodiment, if the incident surface of the projection unit 21 is not perpendicular to the projection surface, the projection range 24 is a quadrilateral (no two sides are parallel). Referring to FIG10, in another variation of the present embodiment, the positions of the projection unit 21 and the imaging unit 22 are interchanged. It should also be supplemented that, in the present embodiment, the projection range 24 will include and cover the imaging range 25, but it should not be limited thereto. It is further explained that the projection range 24 and the imaging range 25 each define a long axis and a short axis whose length is shorter than the long axis, wherein the center line of two pairs of sides defines the long axis, and the center line of the other two pairs of sides defines the short axis.

定义一有效取像范围20为自所述投射单元21于所述待测平面的投影中心O向外延伸Δ的范围,其中,符合反射定律且进入所述取像单元22的局部过曝光点会形成于距离O点Δ处。An effective imaging range 20 is defined as a range extending outward by Δ from the projection center O of the projection unit 21 on the measured plane, wherein a local overexposure point that complies with the law of reflection and enters the imaging unit 22 is formed at a distance Δ from point O.

补充说明的是,所述光束可以但不限于是结构光。所述投射单元21可包含一个或多个投影器(图未示),所述取像单元22可包含一个或多个摄影镜头(图未示)。It is additionally noted that the light beam may be, but is not limited to, structured light. The projection unit 21 may include one or more projectors (not shown), and the imaging unit 22 may include one or more camera lenses (not shown).

具体来说,在本实施例中,所述待测物23为表面平整的高反光材质,例如为具有一镜面的待测物23,在本实施例的其中一实施态样中,所述待测物23整体由高反光材质组成,在本实施例的其他实施态样中,所述待测物23的表面为高反光材质。但所述待测物23的材质不以前述为限。Specifically, in this embodiment, the object to be tested 23 is a highly reflective material with a flat surface, for example, an object to be tested 23 with a mirror surface, in one implementation of this embodiment, the object to be tested 23 is entirely composed of a highly reflective material, and in other implementations of this embodiment, the surface of the object to be tested 23 is a highly reflective material. However, the material of the object to be tested 23 is not limited to the above.

参阅图6与图8,所述处理单元26在收到一触发信号后驱动所述投射单元21投射所述光束,并驱动所述取像单元22接收到自所述待测物23反射之光束。6 and 8 , the processing unit 26 drives the projection unit 21 to project the light beam after receiving a trigger signal, and drives the imaging unit 22 to receive the light beam reflected from the object to be measured 23 .

在本实施例中,所述处理单元26是外接的计算机,在本实施例的其他变化态样中,所述处理单元26也可以是具有中央处理器的主机板,例如但不限于是由英国树莓派基金会开发的树莓派(Raspberry Pi)。所述处理单元26可通过信号连接一输入装置(图未示,例如:键盘、按钮等)以接收所述触发信号。而所述触发信号可以是来自计算机的键盘的按键信号,也可以是来自另一电连接所述处理单元26的自动化控制设备,不限于此。In this embodiment, the processing unit 26 is an external computer. In other variations of this embodiment, the processing unit 26 may also be a motherboard with a central processing unit, such as but not limited to the Raspberry Pi developed by the British Raspberry Pi Foundation. The processing unit 26 may be connected to an input device (not shown, such as a keyboard, button, etc.) through a signal to receive the trigger signal. The trigger signal may be a key signal from a computer keyboard, or may be from another automated control device electrically connected to the processing unit 26, but is not limited thereto.

在本实施例的其中一实施态样中,所述取像单元22的镜头是自动关闭的,所述处理单元26驱动所述投射单元21投射光束一持续投射期间,并在一开始取像时间驱动所述取像单元22接收反射之光束。具体来说,考量到所述投射单元21光束稳定性,所述处理单元26先驱动所述投射单元21开启,于所述光束稳定后的所述开始取像时间再驱动所述取像单元22开启并接收反射之光束,当所述取像单元22的镜头于曝光时间结束而自动关闭后,所述处理单元26再控制关闭所述投射单元21。In one implementation of the present embodiment, the lens of the image capturing unit 22 is automatically closed, the processing unit 26 drives the projection unit 21 to project a light beam for a continuous projection period, and drives the image capturing unit 22 to receive the reflected light beam at the beginning of the image capturing time. Specifically, considering the stability of the light beam of the projection unit 21, the processing unit 26 first drives the projection unit 21 to turn on, and then drives the image capturing unit 22 to turn on and receive the reflected light beam at the beginning of the image capturing time after the light beam is stable. When the lens of the image capturing unit 22 is automatically closed at the end of the exposure time, the processing unit 26 controls the projection unit 21 to be closed.

在本实施例的另一实施态样中,所述取像单元22的启闭皆受所述处理单元26控制,即所述处理单元26驱动所述投射单元21投射光束所述持续投射期间,并驱动所述取像单元22接收反射之光束一持续取像期间。较佳的是,考量到所述投射单元21光束稳定性,所述处理单元26先驱动所述投射单元21开启,于所述光束稳定后再驱动所述取像单元22开启并接收反射之光束所述持续取像期间后,再控制依序关闭所述取像单元22及所述投射单元21。In another implementation of the present embodiment, the opening and closing of the image capturing unit 22 are all controlled by the processing unit 26, that is, the processing unit 26 drives the projection unit 21 to project the light beam for the continuous projection period, and drives the image capturing unit 22 to receive the reflected light beam for a continuous image capturing period. Preferably, considering the light beam stability of the projection unit 21, the processing unit 26 first drives the projection unit 21 to open, and then drives the image capturing unit 22 to open and receive the reflected light beam for the continuous image capturing period after the light beam is stable, and then controls to close the image capturing unit 22 and the projection unit 21 in sequence.

参阅图7、图8与图9,所述光学装置设计方法包含一设置步骤101、一计算步骤102、一判断步骤103,及一测量步骤104。7 , 8 and 9 , the optical device design method includes a setting step 101 , a calculation step 102 , a determination step 103 , and a measurement step 104 .

<设置步骤><Setting steps>

调整所述投射单元21与所述待测物23的距离、所述取像单元22与所述待测物23的距离、所述投射单元21与所述取像单元22的夹角其中至少一者。At least one of the distance between the projection unit 21 and the object to be measured 23 , the distance between the imaging unit 22 and the object to be measured 23 , and the angle between the projection unit 21 and the imaging unit 22 is adjusted.

在本实施例的其中一实施态样中,所述设置步骤101指的是重新架设所述光学装置2。In one implementation of this embodiment, the setting step 101 refers to re-setting the optical device 2 .

<计算步骤><Calculation steps>

所述计算步骤102:运用所述投射单元21与所述待测物23的距离、所述取像单元22与所述待测物23的距离,及所述投射单元21与所述取像单元22的夹角,计算出所述有效取像范围20。The calculation step 102 is to calculate the effective imaging range 20 by using the distance between the projection unit 21 and the object to be measured 23 , the distance between the imaging unit 22 and the object to be measured 23 , and the angle between the projection unit 21 and the imaging unit 22 .

详细来说,所述计算步骤102运用的运算式1为其中,Δ为有效取像范围20之边长的一半,R1为所述投射单元21与所述待测物23的距离,R2为所述取像单元22与所述待测物23的距离,θ为所述投射单元21与所述取像单元22的夹角。Specifically, the calculation step 102 uses the equation 1: Wherein, Δ is half of the side length of the effective imaging range 20 , R 1 is the distance between the projection unit 21 and the object to be measured 23 , R 2 is the distance between the imaging unit 22 and the object to be measured 23 , and θ is the angle between the projection unit 21 and the imaging unit 22 .

进一步来说,所述有效取像范围20的边长的一半,指的是所述有效取像范围20的边界与所述投射单元21于所述待测平面上的投影中心之距离。Specifically, half of the side length of the effective imaging range 20 refers to the distance between the boundary of the effective imaging range 20 and the projection center of the projection unit 21 on the plane to be measured.

补充说明的是,所述运算式1的推导过程请参图11,首先要说明的是,O点为所述待测物23的中心,A点为所述投射单元21的镜头中心,B点为所述取像单元22的镜头中心,C点为光束符合反射定律的反射位置,即对称线段以通过C点的垂直线(法线)作为对称轴。D点为B点以水平线为对称轴所对称之位置,E点为延长线与经过D点之水平线的交界处。此外,线段长度即为△(有效取像范围20的边长的一半),线段长度即为R1线段长度即为R2It is to be supplemented that the derivation process of the operation formula 1 is shown in FIG11 . First of all, it should be noted that point O is the center of the object to be measured 23, point A is the lens center of the projection unit 21, point B is the lens center of the imaging unit 22, and point C is the reflection position of the light beam in accordance with the law of reflection, that is, Symmetrical line segment The vertical line (normal line) passing through point C is used as the axis of symmetry. Point D is the position of point B symmetrically with the horizontal line as the axis of symmetry. Point E is The intersection of the extended line and the horizontal line passing through point D. In addition, The length of the line segment is △ (half the length of the side of the effective imaging range 20). The length of the line segment is R 1 , The length of the line segment is R 2 .

由于△CAO与△DAE是相似三角形,因此,经三角函数切换Δ×(R1+R2×cosθ)=R1×R2sinθ,所以求得运算式1。Since △CAO and △DAE are similar triangles, therefore, By converting the trigonometric function, Δ×(R 1 +R 2 ×cosθ)=R 1 ×R 2 sinθ, the calculation formula 1 is obtained.

我们根据所述计算步骤102所运用的计算式,得出下表的数据,其中,在本实施例的实施态样中,R1=300mm,R2=270mm、300mm、319.5mm及360mm,即R1:R2分别为1:0.9、1:1、1:1.065、1:1.2。其中Φ为所述投射单元21至所述有效取像范围20之边界与通过所述投射单元中心之一垂直线的夹角(即图11中的∠OAC)According to the calculation formula used in the calculation step 102, we obtain the data in the following table, where, in the implementation of this embodiment, R1 = 300mm, R2 = 270mm, 300mm, 319.5mm and 360mm, that is, R1: R2 are 1: 0.9, 1: 1, 1: 1.065, 1: 1.2 respectively. Where Φ is the angle between the boundary of the projection unit 21 to the effective imaging range 20 and a vertical line passing through the center of the projection unit (i.e. ∠OAC in FIG. 11 )

由上表及图12~图14,我们可以了解到Φ与θ、Δ与Φ,以及Δ与θ的关系在θ=20°~30°之间皆呈线性,且图11~图13中各趋势线的标准差R2皆等于1,表示Φ、θ与Δ三者间的关系是容易准确预测的。因此,在本实施例的其中一实施态样中,亦可以预先于前述之处理单元(图未示)预存三者间的线性关系计算式,当用户调整改变所述投射单元21与所述取像单元22之间的夹角θ时,可以直接运用前述的线性关系计算式进行计算,相较于前述的运算式1,更可以节省计算资源,并提升计算效率。From the above table and Figures 12 to 14, we can understand that the relationship between Φ and θ, Δ and Φ, and Δ and θ are all linear between θ = 20° and 30°, and the standard deviation R 2 of each trend line in Figures 11 to 13 is all equal to 1, indicating that the relationship between Φ, θ and Δ is easy to accurately predict. Therefore, in one of the implementations of this embodiment, the linear relationship calculation formula between the three can also be pre-stored in the aforementioned processing unit (not shown). When the user adjusts and changes the angle θ between the projection unit 21 and the imaging unit 22, the aforementioned linear relationship calculation formula can be directly used for calculation. Compared with the aforementioned calculation formula 1, it can save computing resources and improve computing efficiency.

<判断步骤103><Judgment Step 103>

根据所述计算步骤102所计算出的有效取像范围20,判断所述取像范围25是否不大于所述有效取像范围20,如判断结果为是,进行后述之测量步骤104。According to the effective imaging range 20 calculated in the calculation step 102 , it is determined whether the imaging range 25 is not larger than the effective imaging range 20 . If the determination result is yes, the measurement step 104 described later is performed.

如所述判断步骤103结果为否,则返回进行所述设置步骤101及所述计算步骤102。If the result of the determination step 103 is no, the process returns to the setting step 101 and the calculation step 102 .

补充说明的是,由于所述有效取像范围20是可以通过所述计算步骤102计算得出,因此,也可以设计所述有效取像范围大于所述投射范围24,端看用户的需求而定。It is additionally noted that, since the effective imaging range 20 can be calculated through the calculation step 102 , the effective imaging range can also be designed to be larger than the projection range 24 , depending on the needs of the user.

进一步说明的是,所述计算步骤102与所述判断步骤103可由人工计算,或是利用所述光学装置2的一处理单元(图未示)进行,例如:所述处理单元接收来自一输入件(图未示)的参数(R1、R2、θ),并根据预存的运算式1进行计算。It is further explained that the calculation step 102 and the judgment step 103 can be calculated manually or performed using a processing unit (not shown) of the optical device 2. For example, the processing unit receives parameters (R1, R2, θ) from an input component (not shown) and performs calculations based on a pre-stored equation 1.

<测量步骤104><Measurement Step 104>

所述投射单元21朝所述待测物23沿一入射路径投射光束,并经所述待测物23反射后沿一反射路径进入所述取像单元22,所述反射路径于所述待测平面的投影平行于所述取像范围25之短轴的延伸方向。The projection unit 21 projects a light beam toward the object 23 along an incident path, and after being reflected by the object 23 , the light beam enters the imaging unit 22 along a reflection path. The projection of the reflection path on the plane to be measured is parallel to the extension direction of the short axis of the imaging range 25 .

参阅图10,在本实施的另一实施态样中,所述投射单元21(参图8)与所述取像单元22(参图8)的位置互换,因此,所述入射路径于所述待测平面的投影平行于所述投射范围24之短轴的延伸方向。Referring to FIG. 10 , in another embodiment of the present invention, the positions of the projection unit 21 (see FIG. 8 ) and the imaging unit 22 (see FIG. 8 ) are interchanged, so that the projection of the incident path on the plane to be measured is parallel to the extension direction of the short axis of the projection range 24 .

由于运算式1中的Δ只与R1、R2及θ有关,也就是所述有效取像范围20只与平行所述入射路径或所述反射路径之方向有关,与垂直于所述入射路径或所述反射路径之方向无关,因此,当所述待测物23的表面为长方形或其他长宽比不等于一之长条状时,用户只须考量将所述待测物23的待测短边231(参图15B)位于所述有效取像范围内,使所述待测物23的待测短边231皆位于所述有效取像范围20内,而能提升成像的有效观察区域,借以提升测量效率。较佳的是,如设计有效取像范围20包含且涵盖所述投射范围24或所述取像范围25,用户在进行检测时只要确认所述待测物23尺寸在所述投射范围24或所述取像范围25内即可以进行检测。Since Δ in equation 1 is only related to R1, R2, and θ, that is, the effective imaging range 20 is only related to the direction parallel to the incident path or the reflected path, and has nothing to do with the direction perpendicular to the incident path or the reflected path. Therefore, when the surface of the object to be tested 23 is a rectangle or other strip with an aspect ratio not equal to one, the user only needs to consider placing the short side 231 to be tested of the object to be tested 23 (see FIG. 15B ) within the effective imaging range, so that the short side 231 to be tested of the object to be tested 23 is all within the effective imaging range 20, which can increase the effective observation area of imaging, thereby improving measurement efficiency. Preferably, if the effective imaging range 20 is designed to include and cover the projection range 24 or the imaging range 25, the user can perform the detection as long as the size of the object to be tested 23 is within the projection range 24 or the imaging range 25.

进一步说明的是,在相同的待测物尺寸(即图4的待测件13尺寸等于本实施例之待测物23尺寸)以及相同的有效取像范围下(图4的有效范围16相同于本实施例之有效取像范围20,即图4的D1等于图9的Δ),使用本实施例的测量步骤,即可以让整个取像范围25位于所述有效取像范围20内,因此不会局部过曝,借此解决局部过曝所导致的量测问题。It is further explained that, under the same size of the object to be measured (i.e., the size of the object to be measured 13 in FIG. 4 is equal to the size of the object to be measured 23 in this embodiment) and the same effective imaging range (the effective range 16 in FIG. 4 is equal to the effective imaging range 20 in this embodiment, i.e., D1 in FIG. 4 is equal to Δ in FIG. 9 ), using the measurement steps of this embodiment, the entire imaging range 25 can be located within the effective imaging range 20, so there will be no local overexposure, thereby solving the measurement problem caused by local overexposure.

详细来说,使用上会有以下状况:Specifically, the following situations may occur during use:

1.当所述计算步骤102所计算出所述取像范围25的边长不大于所述有效取像范围20的边长(即所述判断步骤103判断结果为是),即可以进行所述测量步骤104。接下来进行如所述待测物23的待测短边231小于所述有效取像范围20的边长,则可以进行所述测量步骤104。1. When the side length of the imaging range 25 calculated in the calculation step 102 is not greater than the side length of the effective imaging range 20 (i.e., the judgment result of the judgment step 103 is yes), the measurement step 104 can be performed. Next, if the short side 231 of the object 23 to be measured is smaller than the side length of the effective imaging range 20, the measurement step 104 can be performed.

2.当所述计算步骤102所计算出所述取像范围25的边长小于所述有效取像范围20的边长(即所述判断步骤103判断结果为否),则进行设置步骤101,用户可以调整所述投射单元21与所述待测物23的距离、所述取像单元22与所述待测物23的距离,及所述投射单元21与所述取像单元22的夹角其中至少一者,以扩大所述有效取像范围20,使所述待测物23的待测短边231位于所述有效取像范围20内。接着即可以进行所述测量步骤104。接下来进行如所述待测物23的待测短边231小于所述有效取像范围20的边长,则可以进行所述测量步骤104。2. When the side length of the imaging range 25 calculated in the calculation step 102 is smaller than the side length of the effective imaging range 20 (i.e., the judgment result of the judgment step 103 is no), the setting step 101 is performed, and the user can adjust at least one of the distance between the projection unit 21 and the object to be measured 23, the distance between the imaging unit 22 and the object to be measured 23, and the angle between the projection unit 21 and the imaging unit 22 to expand the effective imaging range 20 so that the short side 231 to be measured of the object to be measured 23 is located within the effective imaging range 20. Then, the measuring step 104 can be performed. Next, if the short side 231 to be measured of the object to be measured 23 is smaller than the side length of the effective imaging range 20, the measuring step 104 can be performed.

值得说明的是,当通过前述光学装置设计方法设计出所述光学装置2后,即可以供检测业者进行一光学检测方法,所述光学检测方法适用于运用在所述光学装置2对设置于所述待测平面上的所述待测物23进行测量,并只包含前述的测量步骤104。It is worth noting that, after the optical device 2 is designed by the aforementioned optical device design method, it can be provided to the inspection industry for an optical inspection method. The optical inspection method is suitable for using the optical device 2 to measure the object to be measured 23 set on the plane to be measured, and only includes the aforementioned measurement step 104.

综上所述,本发明光学装置、光学检测方法及光学装置设计方法,由于不发生局部过曝的有效取像范围20只与平行所述入射路径或所述反射路径之方向有关,与垂直于所述入射路径或所述反射路径之方向无关,因此,通过设计光路使所述入射路径或所述反射路径于所述待测平面的投影平行于所述取像范围25或所述投射范围24短轴的延伸方向,用户只须考量将所述待测物23的短边位于所述有效取像范围20内,因此不会发生局部过曝情形,提升成像的有效观察区域,借以提升测量效率,所以确实能达成本发明之目的。In summary, the optical device, optical detection method and optical device design method of the present invention, since the effective imaging range 20 without local overexposure is only related to the direction parallel to the incident path or the reflection path, and has nothing to do with the direction perpendicular to the incident path or the reflection path, therefore, by designing the optical path so that the projection of the incident path or the reflection path on the plane to be measured is parallel to the extension direction of the short axis of the imaging range 25 or the projection range 24, the user only needs to consider placing the short side of the object to be measured 23 within the effective imaging range 20, so that local overexposure will not occur, the effective observation area of the imaging is increased, and the measurement efficiency is improved, so the purpose of the present invention can be achieved.

补充说明的是,由于电子零件检测的需求渐增,由于电性接点的材质多为铜或其他高导电的金属,其表面的光学性质类似镜面的特征而有前述局部过曝的现象产生,此外,我们亦了解到成像的杂讯发生位置会发生在平行于投射(或取像)方向上的电性接点边界。参阅图15A及图15B,所述待测物23为电子元件且具有多个呈长条状的电性接点230。为了使所述待测物23具有更多的电性接点230以提升其运算效能,每个电性接点230的长度延伸方向平行于所述待测物23的待测短边231。参阅图15A,如采用现有技术的检测方法,所述反射路径于所述待测平面的投影垂直于所述取像范围25之短轴的延伸方向,其信号杂讯比(SNR)会正相关于参阅图15B,惟如采本发明的光学检测方法,由于所述反射路径于所述待测平面的投影平行于所述取像范围25之短轴的延伸方向,因此信号杂讯比(SNR)会正相关于明显高于传统现有的检测方式。综上述,通过本发明的光学检测方法检测所述待测物23时,能有效提高信号杂讯比(SNR),降低杂讯的比例。It should be supplemented that, due to the increasing demand for electronic component inspection, and because the material of the electrical contacts is mostly copper or other highly conductive metals, the optical properties of their surfaces are similar to the characteristics of mirrors, resulting in the aforementioned local overexposure phenomenon. In addition, we also understand that the imaging noise occurs at the electrical contact boundary parallel to the projection (or imaging) direction. Referring to Figures 15A and 15B, the object to be tested 23 is an electronic component and has a plurality of electrical contacts 230 in the form of long strips. In order to make the object to be tested 23 have more electrical contacts 230 to improve its computing performance, the length extension direction of each electrical contact 230 is parallel to the short side 231 of the object to be tested 23. Referring to Figure 15A, if the detection method of the prior art is adopted, the projection of the reflection path on the plane to be tested is perpendicular to the extension direction of the short axis of the imaging range 25, and its signal-to-noise ratio (SNR) will be positively correlated to 15B, however, if the optical detection method of the present invention is adopted, since the projection of the reflection path on the plane to be measured is parallel to the extension direction of the short axis of the imaging range 25, the signal-to-noise ratio (SNR) will be positively correlated to In summary, when the optical detection method of the present invention is used to detect the object to be detected 23, the signal-to-noise ratio (SNR) can be effectively improved and the proportion of noise can be reduced.

以上所述者,只为本发明的实施例而已,当不能以此限定本发明实施的范围,即凡依本发明权利要求书及说明书内容所作的简单的等效变化与修饰,皆仍属本发明的范围。The above are only embodiments of the present invention and should not be used to limit the scope of the present invention. That is, any simple equivalent changes and modifications made according to the claims and description of the present invention are still within the scope of the present invention.

Claims (16)

1. An optical device suitable for measuring an object to be measured, comprising: the optical device includes:
the projection unit is used for projecting a light beam to the object to be detected and defining a projection range;
The image capturing unit is used for receiving the light beam reflected by the object to be detected and defining an image capturing range, the image capturing range and the projection range respectively define a long axis and a short axis with the length smaller than the long axis, the projection unit projects the light beam towards the object to be detected along an incident path, the light beam is reflected by the object to be detected and enters the image capturing unit along a reflection path, and the projection of the incident path on a plane to be detected is parallel to the extending direction of the short axis of the projection range, or the projection of the reflection path on the plane to be detected is parallel to the extending direction of the short axis of the image capturing range; and
The processing unit is electrically connected with the projection unit and the image capturing unit, and drives the projection unit to project the light beam after receiving the trigger signal and drives the image capturing unit to receive the light beam reflected by the object to be detected.
2. The optical device of claim 1, wherein: the processing unit drives the projection unit to project the light beam for a continuous projection period, and drives the image capturing unit to receive the reflected light beam for an image capturing period.
3. The optical device of claim 1, wherein: the processing unit drives the projection unit to project the light beam for a continuous projection period, and drives the image capturing unit to receive the reflected light beam at the time of starting image capturing.
4. The optical device of claim 1, wherein: the image capturing range and the projection range are quadrangles, wherein the central connecting lines of two opposite sides define the long axis, and the central connecting lines of the other two opposite sides define the short axis.
5. The optical device of claim 1, wherein: the projection unit and the image capturing unit define an effective image capturing range, and the effective image capturing range is larger than the image capturing range.
6. The optical device of claim 1, wherein: the effective image capturing range defined by the projection unit and the image capturing unit is related to the distance between the projection unit and the object to be detected, the distance between the image capturing unit and the object to be detected, and the included angle between the projection unit and the image capturing unit.
7. The optical device of claim 1, wherein: half of the side length of the effective image capturing range defined by the projection unit and the image capturing unitWherein R1 is the distance between the projection unit and the object to be detected, R2 is the distance between the projection unit and the object to be detected, and θ is the included angle between the projection unit and the image capturing unit.
8. The optical device of claim 1, wherein: the projection range is larger than and comprises the image capturing range, and the effective image capturing range defined by the projection unit and the image capturing unit is larger than and comprises the image capturing range.
9. An optical detection method, suitable for measuring an object to be measured disposed on a plane to be measured by using an optical device, the optical device includes a projection unit for projecting a light beam to the object to be measured and defining a projection range, and an image capturing unit for receiving the light beam reflected from the object to be measured and defining an image capturing range, the image capturing range and the projection range each define a long axis and a short axis with a length smaller than the long axis, and the optical detection method is characterized in that: the optical detection method comprises the following steps:
the measuring step comprises the following steps: the projection unit projects light beams towards the object to be detected along an incident path, the light beams are reflected by the object to be detected and enter the image capturing unit along a reflection path, and the projection of the incident path on the plane to be detected is parallel to the extending direction of the short axis of the projection range, or the projection of the reflection path on the plane to be detected is parallel to the extending direction of the short axis of the image capturing range.
10. The optical detection method according to claim 9, wherein: the image capturing range and the projection range are quadrangles, wherein the central connecting lines of two opposite sides define the long axis, and the central connecting lines of the other two opposite sides define the short axis.
11. The optical detection method according to claim 9, wherein: the projection unit and the image capturing unit define an effective image capturing range, and the effective image capturing range is larger than the image capturing range.
12. The optical detection method according to claim 9, wherein: the effective image capturing range defined by the projection unit and the image capturing unit is related to the distance between the projection unit and the object to be detected, the distance between the image capturing unit and the object to be detected, and the included angle between the projection unit and the image capturing unit.
13. The optical detection method according to claim 9, wherein: half of the side length of the effective image capturing range defined by the projection unit and the image capturing unitWherein R1 is the distance between the projection unit and the object to be detected, R2 is the distance between the image capturing unit and the object to be detected, and θ is the included angle between the projection unit and the image capturing unit.
14. The optical detection method according to claim 9, wherein: the projection range is larger than and comprises the image capturing range, and the effective image capturing range defined by the projection unit and the image capturing unit is larger than and comprises the image capturing range.
15. An optical device design method, the optical device includes a projection unit for projecting a light beam to an object to be measured and defining a projection range, and an image capturing unit for receiving the light beam reflected from the object to be measured and defining an image capturing range, the image capturing range defining a long axis and a short axis having a length smaller than the long axis, the optical device design method is characterized in that: the optical device design method comprises the following steps:
The calculation steps are as follows: calculating an effective image capturing range according to the distance between the projection unit and the object to be detected, the distance between the image capturing unit and the object to be detected and the included angle between the projection unit and the image capturing unit;
judging: judging whether the image capturing range is not larger than the effective image capturing range according to the effective image capturing range calculated in the calculating step, if so, carrying out the next step;
The measuring step comprises the following steps: the projection unit projects light beams towards the object to be detected along an incident path, the light beams are reflected by the object to be detected and enter the image capturing unit along a reflecting path, and the projection of the incident path or the reflecting path on the plane to be detected is parallel to the extending direction of the short axis.
16. The method of designing an optical device according to claim 15, wherein: the method further comprises the setting step of: and adjusting at least one of the distance between the projection unit and the object to be detected, the distance between the image capturing unit and the object to be detected and the included angle between the projection unit and the image capturing unit, and if the result of the judging step is negative, performing the setting step and the calculating step.
CN202310419993.5A 2023-04-19 2023-04-19 Optical device, optical detection method and optical device design method Pending CN118816747A (en)

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