CN118801882B - Analog-to-digital conversion device, digital signal calibration method and device - Google Patents
Analog-to-digital conversion device, digital signal calibration method and device Download PDFInfo
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Abstract
The analog-to-digital conversion equipment comprises a plurality of stages of analog-to-digital conversion modules, wherein a comparison module is connected between each stage of analog-to-digital conversion modules, secondary voltage sampling signals which cannot be accurately processed by a previous stage of analog-to-digital conversion module are calculated through the comparison module and input to a next stage of analog-to-digital conversion module for continuous processing, calibration coefficients of all previous analog-to-digital conversion modules are determined based on the next analog-to-digital conversion module, calibrated conversion numbers output by all analog-to-digital conversion modules are calculated by a digital logic processing module to be digital representations corresponding to voltage sampling signals, and finally, the digital representation effect of a single analog-to-digital converter with high resolution can be realized by utilizing a plurality of analog-to-digital conversion modules with low resolution, and the precision of the single analog-to-digital converter can be reached through the precision of the calibrated digital representation.
Description
Technical Field
The present disclosure relates to the field of integrated circuits, and in particular, to an analog-to-digital conversion device, a method and an apparatus for calibrating a digital signal.
Background
Analog-to-Digital Converter (ADC) is an electronic device that converts a continuous Analog signal (e.g., voltage, current, sound signal, etc.) into a discrete digital signal. By sampling and quantizing analog signals to digital signals, a computer or digital processing system is able to process and store the digital signals.
The key performance of an analog-to-digital converter is resolution, the higher the resolution, the more accurately the analog-to-digital converter can capture subtle voltage changes and provide a more accurate digitized representation. The related art generally improves the processing accuracy of an analog-to-digital converter by improving the resolution of the analog-to-digital converter. However, the resolution of an analog-to-digital converter is positively correlated with its circuit scale and design complexity. Therefore, increasing the resolution of the analog-to-digital converter, while providing an increase in processing accuracy, introduces a number of design, cost, and performance challenges.
Disclosure of Invention
In order to overcome the problems in the related art, the present specification provides an analog-to-digital conversion device, a method and a device for calibrating a digital signal.
According to a first aspect of embodiments of the present disclosure, there is provided an analog-to-digital conversion apparatus, the apparatus including a digital logic processing module, a plurality of analog-to-digital conversion modules, and at least one comparison module, each analog-to-digital conversion module being sequentially connected to each comparison module at intervals and a least significant bit value LSB of a subsequent analog-to-digital conversion module being smaller than an LSB of a previous analog-to-digital conversion module, each analog-to-digital conversion module being respectively connected to the digital logic processing module, wherein:
the first analog-to-digital conversion module is used for receiving a voltage sampling signal, outputting a conversion number corresponding to the voltage sampling signal to the digital logic processing module, outputting a voltage conversion signal corresponding to the conversion number to the first comparison module, and outputting a minimum voltage conversion signal representing the LSB (least significant bit) of the voltage conversion signal to the next analog-to-digital conversion module;
The first comparison module is used for receiving the voltage sampling signal, and respectively inputting a difference value between the voltage sampling signal and the voltage conversion signal output by the first analog-to-digital conversion module as a secondary voltage sampling signal to a next analog-to-digital conversion module and a next comparison module of the comparison module;
Each comparison module except the first comparison module is respectively used for outputting the difference value of the secondary voltage sampling signal output by the last comparison module and the voltage conversion signal output by the last analog-to-digital conversion module to the next analog-to-digital conversion module and the next comparison module of the comparison module as a new secondary voltage sampling signal;
Each analog-to-digital conversion module except the first analog-to-digital conversion module is respectively used for outputting a minimum voltage digital corresponding to the minimum voltage conversion signal and a converted digital corresponding to the secondary voltage sampling signal to the digital logic processing module, outputting a voltage conversion signal corresponding to the converted digital to the next comparison module and outputting a minimum voltage conversion signal representing the LSB (least significant bit) size to the next analog-to-digital conversion module according to the minimum voltage conversion signal output by the last analog-to-digital conversion module and the secondary voltage sampling signal output by the last comparison module;
The digital logic processing module is used for determining a calibration coefficient of the conversion number output by at least one analog-digital conversion module before the analog-digital conversion module according to the minimum voltage number output by each analog-digital conversion module except the first analog-digital conversion module and the LSB of the last analog-digital conversion module based on the received conversion number and the minimum voltage number, and performing calibration processing on the conversion number output by the at least one analog-digital conversion module based on the calibration coefficient to obtain a calibrated conversion number, and determining the sum of all the calibrated conversion numbers and the uncalibrated conversion number as a digital representation corresponding to the voltage sampling signal.
According to a second aspect of embodiments of the present specification, there is provided a method of calibrating a digital signal, the method being applied to a digital logic processing module in an analog to digital conversion apparatus as described in the first aspect, comprising:
Obtaining conversion numbers and minimum voltage numbers respectively input by all analog-to-digital conversion modules;
For each analog-to-digital conversion module except the first analog-to-digital conversion module, determining a calibration coefficient of conversion numbers output by at least one analog-to-digital conversion module before the analog-to-digital conversion module according to the minimum voltage number output by the analog-to-digital conversion module and the LSB of the last analog-to-digital conversion module;
And carrying out calibration processing on the conversion numbers output by the at least one analog-to-digital conversion module based on the calibration coefficients to obtain calibrated conversion numbers, and determining the sum of all the calibrated conversion numbers and the uncalibrated conversion numbers as a digital representation corresponding to the voltage sampling signals received by the analog-to-digital conversion equipment.
According to a third aspect of embodiments of the present specification, there is provided a calibration apparatus for digital signals, the apparatus being applied to a digital logic processing module in an analog to digital conversion device as described in the first aspect, the apparatus comprising:
The acquisition module is used for acquiring the conversion number and the minimum voltage number which are respectively input by each analog-to-digital conversion module;
The calibration coefficient determining module is used for determining the calibration coefficient of the conversion number output by at least one analog-to-digital conversion module before the analog-to-digital conversion module according to the minimum voltage number output by each analog-to-digital conversion module except the first analog-to-digital conversion module and the LSB of the last analog-to-digital conversion module;
And the digital representation calibration module is used for carrying out calibration processing on the conversion numbers output by the at least one analog-to-digital conversion module based on the calibration coefficients to obtain calibrated conversion numbers, and determining the sum of all the calibrated conversion numbers and the uncalibrated conversion numbers as a digital representation corresponding to the voltage sampling signals received by the analog-to-digital conversion equipment.
According to a fourth aspect of embodiments of the present specification, there is provided an electronic device comprising a memory, a processor and a computer program stored on the memory and executable on the processor, the processor implementing the steps of the method according to the second aspect when the program is executed.
According to a fifth aspect of embodiments of the present description, there is provided a computer readable storage medium having stored thereon a computer program which when executed by a processor performs the steps of the method according to the second aspect.
The technical scheme provided by the embodiment of the specification can comprise the following beneficial effects:
The analog-digital conversion equipment designed by the scheme comprises a plurality of stages of analog-digital conversion modules, wherein a comparison module is connected between the analog-digital conversion modules, secondary voltage sampling signals which cannot be accurately processed by the analog-digital conversion module at the previous stage are calculated through the comparison module and are input to the analog-digital conversion module at the next stage for continuous processing, calibration coefficients of all the analog-digital conversion modules before the analog-digital conversion modules are determined based on the analog-digital conversion modules at the next stage, calibrated conversion numbers output by all the analog-digital conversion modules are calculated by a digital logic processing module to be digital representations corresponding to the voltage sampling signals, and finally, the digital representation effect of a single analog-digital converter with high resolution can be realized by utilizing a plurality of analog-digital conversion modules with low resolution is ensured, and the precision of the single analog-digital converter can be reached through the precision of the calibrated digital representations.
It is to be understood that both the foregoing general description and the following detailed description are exemplary and explanatory only and are not restrictive of the disclosure.
Drawings
The accompanying drawings, which are incorporated in and constitute a part of this specification, illustrate embodiments consistent with the specification and together with the description, serve to explain the principles of the specification.
Fig. 1 is a schematic diagram of an analog-to-digital conversion apparatus including two analog-to-digital conversion modules according to an exemplary embodiment of the present specification.
Fig. 2 is a schematic diagram of an analog-to-digital conversion process performed by an analog-to-digital conversion apparatus including two analog-to-digital conversion modules according to an exemplary embodiment of the present disclosure.
Fig. 3 is a schematic diagram of an analog-to-digital conversion apparatus comprising two analog-to-digital conversion modules determining calibration coefficients according to an exemplary embodiment of the present disclosure.
Fig. 4 is a schematic structural diagram of an analog-to-digital conversion apparatus including three analog-to-digital conversion modules according to an exemplary embodiment of the present specification.
Fig. 5 is a schematic diagram of an analog-to-digital conversion process performed by an analog-to-digital conversion apparatus including three analog-to-digital conversion modules according to an exemplary embodiment of the present disclosure.
Fig. 6 is a schematic diagram of an analog-to-digital conversion apparatus including three analog-to-digital conversion modules determining calibration coefficients according to an exemplary embodiment of the present disclosure.
Fig. 7 is a flow chart illustrating a method of calibrating a digital signal according to an exemplary embodiment of the present disclosure.
Fig. 8 is a schematic structural view of an electronic device according to an exemplary embodiment of the present specification.
Fig. 9 is a block diagram of a digital signal calibration apparatus according to an exemplary embodiment of the present disclosure.
Detailed Description
The key performance of an analog-to-digital converter is resolution, the higher the resolution, the more accurately the analog-to-digital converter can capture subtle voltage changes and provide a more accurate digitized representation. The related art generally improves conversion accuracy of an analog-to-digital converter by improving resolution of the analog-to-digital converter. However, the resolution of an analog-to-digital converter is positively correlated with its circuit scale and design complexity. Therefore, increasing the resolution of the analog-to-digital converter, while providing an increase in conversion accuracy, introduces a number of design, cost, and performance challenges.
Aiming at the technical problems, the technical scheme provides analog-to-digital conversion equipment which realizes the high conversion precision of a single high-resolution analog-to-digital converter by the mutual cooperation of the analog-to-digital converters with multi-level coarse resolutions.
Specifically, the analog-to-digital conversion device comprises a digital logic processing module, a plurality of analog-to-digital conversion modules and at least one comparison module, wherein each analog-to-digital conversion module is sequentially connected with each comparison module at intervals, the least significant bit value LSB of the latter analog-to-digital conversion module is smaller than the LSB of the former analog-to-digital conversion module, and each analog-to-digital conversion module is respectively connected with the digital logic processing module, wherein:
the first analog-to-digital conversion module is used for receiving a voltage sampling signal, outputting a conversion number corresponding to the voltage sampling signal to the digital logic processing module, outputting a voltage conversion signal corresponding to the conversion number to the first comparison module, and outputting a minimum voltage conversion signal representing the LSB (least significant bit) of the voltage conversion signal to the next analog-to-digital conversion module;
The first comparison module is used for receiving the voltage sampling signal, and respectively inputting a difference value between the voltage sampling signal and the voltage conversion signal output by the first analog-to-digital conversion module as a secondary voltage sampling signal to a next analog-to-digital conversion module and a next comparison module of the comparison module;
Each comparison module except the first comparison module is respectively used for outputting the difference value of the secondary voltage sampling signal output by the last comparison module and the voltage conversion signal output by the last analog-to-digital conversion module to the next analog-to-digital conversion module and the next comparison module of the comparison module as a new secondary voltage sampling signal;
Each analog-to-digital conversion module except the first analog-to-digital conversion module is respectively used for outputting a minimum voltage digital corresponding to the minimum voltage conversion signal and a converted digital corresponding to the secondary voltage sampling signal to the digital logic processing module, outputting a voltage conversion signal corresponding to the converted digital to the next comparison module and outputting a minimum voltage conversion signal representing the LSB (least significant bit) size to the next analog-to-digital conversion module according to the minimum voltage conversion signal output by the last analog-to-digital conversion module and the secondary voltage sampling signal output by the last comparison module;
The digital logic processing module is used for determining a calibration coefficient of the conversion number output by at least one analog-digital conversion module before the analog-digital conversion module according to the minimum voltage number output by each analog-digital conversion module except the first analog-digital conversion module and the LSB of the last analog-digital conversion module based on the received conversion number and the minimum voltage number, and performing calibration processing on the conversion number output by the at least one analog-digital conversion module based on the calibration coefficient to obtain a calibrated conversion number, and determining the sum of all the calibrated conversion numbers and the uncalibrated conversion number as a digital representation corresponding to the voltage sampling signal.
In order to facilitate easier understanding of the inventive concept of the present solution by a person skilled in the art, an analog-to-digital conversion apparatus comprising two analog-to-digital conversion modules and comprising three analog-to-digital conversion modules will be illustrated below, respectively, so that a person skilled in the art can undoubtedly deduce on the basis of this structure the design structure of the analog-to-digital conversion apparatus comprising n analog-to-digital conversion modules, n being equal to or greater than 4.
As shown in fig. 1, fig. 1 is a schematic structural diagram of an analog-to-digital conversion apparatus including two analog-to-digital conversion modules according to an embodiment of the present specification. The analog-to-digital conversion apparatus 1 includes an analog-to-digital conversion module 10A, an analog-to-digital conversion module 10B, a comparison module 11A, and a digital logic processing module 12. The input end of the analog-to-digital conversion module 10A receives the voltage sampling signal 01 obtained by external sampling. The first output terminal of the analog-to-digital conversion module 10A outputs the voltage conversion signal 03 to the first input terminal of the comparison module 11A. The second output of the analog-to-digital conversion module 10A outputs the minimum voltage conversion signal 04 to the first input of the analog-to-digital conversion module 10B. The third output of the analog-to-digital conversion module 10A outputs the converted number 02 to a first input of the digital logic processing module 12. A second input terminal of the comparison module 11A receives the externally sampled voltage sampling signal 01. The output of the comparison module 11A outputs the secondary voltage sampling signal 05 to a second input of the analog-to-digital conversion module 10B. The analog-to-digital conversion module 10B outputs the converted number 06 and the minimum voltage number 07 to a second input of the digital logic processing module 12.
It will be appreciated that although the operation of the analog to digital conversion apparatus 1 of fig. 1 involves both calculating the calibration coefficients of the analog to digital conversion module 10A to be calibrated and converting the voltage sample signal 01 into a digital representation of the two operating logic portions. In practice, the two working logic parts can be performed independently of each other, and the work flow for calculating the calibration coefficient is not dependent on the work flow of analog-to-digital conversion. Therefore, the calibration coefficients of the analog-to-digital conversion module 10A to be calibrated may be calculated first and then stored in the digital logic processing module 12, and the stored calibration coefficients may be directly acquired when the workflow of converting the voltage sampling signal 01 into a digital representation is performed without synchronously performing the workflow of calculating the calibration coefficients of the analog-to-digital conversion module 10A to be calibrated.
To facilitate understanding of the present solution, the following description separately describes the processing logic of these two parts:
As shown in fig. 2, it is assumed that the calibration coefficient of the analog-to-digital conversion module 10A to be calibrated has been calculated in advance and stored in the digital logic processing module 12, and the operation of the analog-to-digital conversion device 1 to convert the sampled voltage sampling signal 01 into a digital representation may be as follows:
The analog-to-digital conversion module 10A receives the voltage sampling signal 01, outputs a converted number 02 corresponding to the voltage sampling signal 01 to the digital logic processing module 12, and outputs a voltage conversion signal 03 corresponding to the converted number 02 to the comparison module 11A. It will be appreciated that the voltage sample signal 01 is a discrete voltage signal obtained by sampling an input analog voltage signal, and may be represented by converting the discrete voltage signal into a corresponding digital signal by the analog-to-digital conversion module 10A. Of course, a follower may be provided on the analog-to-digital conversion apparatus 1 for receiving the original voltage sample signal and processing the original voltage sample signal via the follower to obtain the voltage sample signal 01. The present description does not limit the manner in which the voltage sample signal 01 is obtained.
The meaning of the converted number output by any analog-to-digital conversion module referred to in this specification may be a digital representation of the voltage signal input converted by the analog-to-digital conversion module. And the meaning of the voltage conversion signal may be an analog voltage signal generated by the analog-to-digital conversion module to represent the magnitude of the voltage represented by the converted number. For example, the meaning of the converted number 02 in this scheme may be a digital representation of the output of the analog-to-digital conversion module 10A for the voltage sample signal 01. The voltage conversion signal 03 may be an analog voltage signal of a voltage level represented by the conversion number 02 generated by the analog-to-digital conversion module 10A.
Illustratively, taking the type of analog-to-digital conversion module as a successive approximation register analog-to-digital converter as an example, the successive approximation register analog-to-digital converter (or successive approximation ADC) internally includes an analog-to-digital converter DAC and a SAR register. The DAC generates corresponding voltage conversion signals according to the conversion numbers of the SAR register, compares the voltage conversion signals with the voltage sampling signals, and continuously adjusts the conversion numbers in the SAR register according to the comparison result to obtain the conversion numbers corresponding to the voltage sampling signals. For example, the value of the sampled voltage signal is 2.1V, the current conversion number in the SAR register is 001, the voltage conversion signal output by the current corresponding DAC is 1V, the bit of the conversion number of the SAR register is increased to 010 due to the fact that 1V is smaller than 2V, the voltage conversion signal output by the DAC is increased to 2V, the bit value of the current conversion number of the SAR register is continuously adjusted to 011 due to the fact that 2V is smaller than 2.1V, the voltage conversion signal output by the DAC is continuously increased to 3V, and the conversion number output by the SAR register can be 010 due to the fact that 3V is larger than 2.1V, and the value of the voltage conversion signal output by the DAC and corresponding to the conversion number is 2V.
The comparison module 11A receives the voltage sampling signal 01 and the voltage conversion signal 03 output by the analog-to-digital conversion module 10A, and outputs a difference between the voltage sampling signal 01 and the voltage conversion signal 03 as a secondary voltage sampling signal 05 to the analog-to-digital conversion module 10B. It can be understood that the difference between the voltage sampling signal 01 and the voltage converting signal 03 is always within the range of one error unit LSB of the analog-to-digital conversion module 10A, and the secondary voltage sampling signal 05 within the error range which cannot be accurately processed by the analog-to-digital conversion module 10A can be continuously output to the analog-to-digital conversion module 10B with higher conversion accuracy for further processing by performing a difference operation. Similarly, a new secondary voltage sample signal within an error range that the analog-to-digital conversion module 10B cannot accurately process can be continuously output to the next analog-to-digital conversion module for further processing. Similarly, the next analog-to-digital conversion module can output the new secondary voltage sampling signal in the error range which cannot be processed accurately to the next analog-to-digital conversion module for further processing.
The LSB of the analog-to-digital conversion module 10B may be smaller than the LSB of the analog-to-digital conversion module 10A so that the analog-to-digital conversion module 10B may more accurately process the secondary voltage sampling signal 05 that the analog-to-digital conversion module 10A cannot accurately convert. The analog-to-digital conversion module 10B outputs the converted number 06 corresponding to the secondary voltage sampling signal 05 to the digital logic processing module 12.
The digital logic processing module 12 may determine a digital representation of the voltage sample signal 01 based on the received conversion number 02 and conversion number 06, i.e. conversion number 02 the calibration factor + conversion number 06. The calibration coefficient may be a ratio of an actual value to a theoretical value of the minimum voltage conversion signal generated by the analog-to-digital conversion module 10A measured by the analog-to-digital conversion module 10B, for improving the accuracy of the converted number 02 determined based on the minimum voltage conversion signal. The specific calculation manner of the calibration coefficient is not described in this embodiment, and specific reference is made to an embodiment specifically describing the calibration coefficient.
Illustratively, assume that the voltage of voltage sample signal 01 is 9.77V in magnitude. The digital logic processing module 12 stores a calibration factor of 1.11 for the analog to digital conversion module 10A. The analog-to-digital conversion module 10A can handle a voltage range of [0,10V ] and LSB of 1V. The analog-to-digital conversion module 10B can handle a voltage range of [0,2V ] and LSB of 0.01V. The converted number 02 output by the analog-to-digital conversion module 10A may be a digital representation representing a size of 9V, and the generated voltage conversion signal 03 corresponding to the converted number 02 is output to the comparison module 11A, the comparison module 11A may output a difference value of 0.77V between the voltage sampling signal 01 of 9.77V and the voltage conversion signal 03 of analog 9V as the secondary voltage sampling signal 05 to the analog-to-digital conversion module 10B, the converted number 06 output by the analog-to-digital conversion module 10B may be a digital representation representing a size of 0.77V, and the final digital logic processing module 12 determines that the size of the digital representation corresponding to the voltage sampling signal 01 is 9v×1.11+0.77V.
In the example given above, the voltage conversion signal 03 generated by the analog-to-digital conversion module 10A may not be of the corresponding size indicated by the conversion number 02 due to the analog-to-digital conversion module 10A being affected by the external extreme temperature or the aging of the element. For example, the conversion number 02 indicates a voltage of 9V, and the voltage conversion signal 03 actually generated based on the conversion number 02 may drift by 8.9V, 9.2V, or the like, and is not the same as the 9V voltage indicated by the conversion number 02. Therefore, the error magnitude of the converted number 02, which is determined based on the comparison of the voltage conversion signal 03 with the voltage sampling signal 01, is within the LSB range of the analog-to-digital conversion module 10A, i.e., within 1V range. Therefore, if the converted digital 02 is not calibrated, even if the error range of the converted digital of the analog-to-digital conversion module 10B is within 0.01V, the combined digital representation still cannot reach the accuracy of 0.01V, so that the error range of the digital representation corresponding to the voltage sampling signal 01 determined after the digital logic processing module 12 combines the converted digital outputted by the two modules is still within 1V. The analog-digital conversion module 10B with the error range of 0.01V is further used for calibrating the conversion number 02 of the analog-digital conversion module 10A with the error range of 1V, so that the error range is adjusted to be 0.01V, and finally the total error range of the digital representation corresponding to the voltage sampling signal 01 is 0.01V.
Assuming that a single analog-to-digital converter with LSB of 0.01V and voltage range of 0,11V is desired, the required resolution is up to 1100. The LSB of the analog-to-digital conversion module 10A of the analog-to-digital conversion apparatus 1 of this example is 1V, and the voltage range is [0,10V ], so its resolution is 10 stages. The LSB of the analog-to-digital conversion module 10B is 0.01 and the voltage range is [0,2V ], so that the resolution is 200 stages. It will be appreciated that the analog to digital conversion apparatus 1 can achieve the digital representation effect of a single analog to digital converter of resolution 1100 by always sharing two analog to digital conversion modules of resolution up to 210 and the accuracy of the digital representation after calibration can also reach the accuracy level of the single analog to digital converter.
Next, how to determine the calibration coefficients of the analog-to-digital conversion module 10A is described:
As shown in fig. 3, the analog-to-digital conversion module 10A outputs the minimum voltage conversion signal 04 representing the LSB size thereof to the analog-to-digital conversion module 10B, and the analog-to-digital conversion module 10B outputs the minimum voltage number 07 corresponding to the minimum voltage conversion signal 04 to the digital logic processing module 12. The digital logic processing module 12 determines the calibration coefficients of the analog-to-digital conversion module 10A based on the LSB of the analog-to-digital conversion module 10A and the minimum voltage number 07. Illustratively, the calibration coefficient may be a ratio of the minimum voltage number 07 to the LSB of the analog-to-digital conversion module 10A.
In an illustrated embodiment, the calibration coefficients of the analog-to-digital conversion module 10A may alternatively be redetermined at preset time intervals in the manner illustrated in fig. 3, and the calibration coefficient updates stored to the digital logic processing module 12. Alternatively, the calibration coefficients of the analog-to-digital conversion module 10A may be determined each time the analog-to-digital conversion apparatus 1 is started up, and updated and stored to the digital logic processing module 12. The present description does not limit the timing of determining the calibration coefficient of the analog-to-digital conversion module 10A.
Next, the structure of the analog-to-digital conversion apparatus including three or more analog-to-digital conversion modules will be described.
As shown in fig. 4, fig. 4 is a schematic structural diagram of an analog-to-digital conversion apparatus including three analog-to-digital conversion modules shown in the embodiment of the present specification, and the analog-to-digital conversion apparatus 2 includes a digital logic processing module 12, an analog-to-digital conversion module 10A, an analog-to-digital conversion module 10B, an analog-to-digital conversion module 10C, a comparison module 11A, and a comparison module 11B. Each analog-to-digital conversion module is connected with each comparison module at intervals in sequence, and the least significant bit value LSB of the latter analog-to-digital conversion module is smaller than the LSB of the former analog-to-digital conversion module. For example, the LSB of analog-to-digital conversion module 10C is smaller than the LSB of analog-to-digital conversion module 10B, and the LSB of analog-to-digital conversion module 10B is smaller than the LSB of analog-to-digital conversion module 10A.
Specifically, the input of the analog-to-digital conversion module 10A receives the voltage sampling signal 01. A first output of the analog-to-digital conversion module 10A outputs the converted number 02A to a first input of the digital logic processing module 12. The second output of the analog-to-digital conversion module 10A outputs the minimum voltage conversion signal 04A to the first input of the analog-to-digital conversion module 10B. The third output terminal of the analog-to-digital conversion module 10A outputs the voltage conversion signal 03A to the first input terminal of the comparison module 11A. A second input of the comparison module 11A receives the voltage sample signal 01. The first output of the comparison module 11A outputs the secondary voltage sampling signal 05A to the second input of the analog-to-digital conversion module 10B. The second output terminal of the comparison module 11A outputs the secondary voltage sampling signal 05A to the comparison module 11B. The first output of the analog-to-digital conversion module 10B outputs the converted number 02B and the minimum voltage number 07B to a second input of the digital logic processing module 12. The second output terminal of the analog-to-digital conversion module 10B outputs the voltage conversion signal 03B to the second input terminal of the comparison module 11B. The third output terminal of the analog-to-digital conversion module 10B outputs the minimum voltage conversion signal 04B to the first input terminal of the analog-to-digital conversion module 10C. The comparison module 11B outputs the secondary voltage sampling signal 05B to a second input of the analog-to-digital conversion module 10C. The output of the analog-to-digital conversion module 10C outputs the converted number 02C and the minimum voltage number 07C to a third input of the digital logic processing module 12.
As in the description of the analog-to-digital conversion apparatus 1 described above, the present specification will describe two parts of the analog-to-digital conversion process and the calibration process of the analog-to-digital conversion apparatus 2 separately:
Because the LSB of the analog-to-digital conversion module of the next stage is smaller than the LSB of the analog-to-digital conversion module of the previous stage, the analog-to-digital conversion module of the next stage can be utilized to calibrate the conversion numbers output by all the analog-to-digital conversion modules in front of the analog-to-digital conversion module of the next stage. For example, the analog-to-digital conversion module 10C may be used to calibrate the converted number 02B output by the analog-to-digital conversion module 10B, and the analog-to-digital conversion module 10B and/or the analog-to-digital conversion module 10C may be used to calibrate the converted number 02A output by the analog-to-digital conversion module 10A.
As shown in fig. 5, assuming that the calibration coefficients of the analog-to-digital conversion module 10A and the analog-to-digital conversion module 10B to be calibrated have been calculated in advance and stored in the digital logic processing module 12, the operation of the analog-to-digital conversion device 2 to convert the sampled voltage sampling signal 01 into a digital representation may be as follows:
The analog-to-digital conversion module 10A receives the sampled voltage sampling signal 01 and outputs a corresponding converted digital 02A to the digital logic processing module 12, and outputs a voltage conversion signal 03A corresponding to the converted digital 02A to the comparison module 11A. The comparison module 11A receives the sampled voltage sampling signal 01 and the voltage conversion signal 03A, and outputs a difference between the voltage sampling signal 01 and the voltage conversion signal 03A as a secondary voltage sampling signal 05A to the analog-to-digital conversion module 10B and the comparison module 11B. The analog-to-digital conversion module 10B outputs the converted digital 02B corresponding to the secondary voltage sampling signal 05A to the digital logic processing module 12, and outputs the voltage converted signal 03B corresponding to the converted digital 02B to the comparison module 11B. The comparison module 11B outputs the difference between the secondary voltage sampling signal 05A and the voltage conversion signal 03B as a new secondary voltage sampling signal 05B to the analog-to-digital conversion module 10C. The analog-to-digital conversion module 10C outputs the converted number 02C corresponding to the secondary voltage sampling signal 05B to the digital logic processing module 12.
The digital logic processing module 12 obtains the stored calibration coefficient corresponding to the analog-to-digital conversion module 10A, performs calibration processing on the conversion number 02A to obtain a calibrated conversion number 02A, obtains the calibration coefficient corresponding to the analog-to-digital conversion module 10B, performs calibration processing on the conversion number 02B to obtain a calibrated conversion number 02B, and then uses the sum of the calibrated conversion number 02A, the calibrated conversion number 02B and the conversion number 02C as a digital representation corresponding to the voltage sampling signal 01 received by the analog-to-digital conversion device 2.
For example, assuming that the voltage of the voltage sampling signal 01 is 9.77V, the calibration coefficient of the analog-to-digital conversion module 10A stored in the digital logic processing module 12 is 1.1, and the calibration coefficient of the analog-to-digital conversion module 10B is 1.2. The analog-to-digital conversion module 10A can handle a voltage range of [0,10V ] and LSB of 1V. The analog-to-digital conversion module 10B can handle a voltage range of [0,2V ] and LSB of 0.1V. The analog-to-digital conversion module 10C can handle a voltage range of [0,0.2V ] and LSB of 0.01V. The converted number 02A output from the analog-to-digital conversion module 10A is a digital representation of a size of 9V, and the voltage conversion signal 03A is an analog voltage signal of a size of 9V. The comparison module 11A outputs the difference 0.77V between the received voltage sampling signal 01 of 9.77V and the voltage conversion signal 03A of 9V as the secondary voltage sampling signal 05A to the analog-to-digital conversion module 10B and the comparison module 11B, respectively. The analog-to-digital conversion module 10B outputs the converted number 02B corresponding to the secondary voltage sampling signal 05A of 0.77V to the digital logic processing module 12, and outputs the voltage conversion signal 03B representing the magnitude of 0.7V to the comparison module 11B. The comparison module 11B outputs the difference value 0.07V between the received secondary voltage signal 05A of 0.77V and the converted voltage signal 03B of 0.7V as a new secondary voltage sampling signal 05B to the analog-to-digital conversion module 10C. The analog-to-digital conversion module 10C outputs the generated converted digital 02C corresponding to the secondary voltage sampling signal 05B to the digital logic processing module 12. The digital logic processing module 12 may finally determine that the digital representation corresponding to the voltage sampling signal 01 is 9v1.1+0.7v1.2+0.07 v.
Assuming that a single analog-to-digital converter with LSB of 0.01V and voltage range of 0,11V is desired, the required resolution is up to 1100. The resolution of the analog-to-digital conversion module 10A, the analog-to-digital conversion module 10B, and the analog-to-digital conversion module 10C of the analog-to-digital conversion apparatus 2 of this example are 10 stages, 20 stages, and 20 stages, respectively. It will be appreciated that the analog to digital conversion apparatus 2 can achieve the digital representation of a single analog to digital converter of resolution 1100 using a total of three analog to digital conversion modules of resolution up to 50 and with a calibrated accuracy to the accuracy level of the single analog to digital converter.
It should be noted that, as described above, the analog-to-digital conversion apparatus 1 and the analog-to-digital conversion apparatus 2 are designed to meet the accuracy requirement of 0.01V, and the number of analog-to-digital conversion modules of the analog-to-digital conversion apparatus 2 is greater than that of the analog-to-digital conversion apparatus 1 but the total resolution of the analog-to-digital conversion apparatus 2 is lower than that of the analog-to-digital conversion apparatus 1. Therefore, the number of analog-to-digital conversion modules and the resolution requirement in the analog-to-digital conversion device can be determined by those skilled in the art according to the actual application requirements, and the present specification does not limit this.
Next, how to determine the calibration coefficients of the analog-to-digital conversion module 10A and the analog-to-digital conversion module 10B is described:
As shown in fig. 6, the analog-to-digital conversion module 10A outputs a minimum voltage conversion signal 04A representing the LSB size thereof to the analog-to-digital conversion module 10B, and the analog-to-digital conversion module 10B outputs a minimum voltage number 07B corresponding to the minimum voltage conversion signal 04A to the digital logic processing module 12. The analog-to-digital conversion module 10B outputs the minimum voltage conversion signal 04B representing the LSB size thereof to the analog-to-digital conversion module 10C, and the analog-to-digital conversion module 10C outputs the minimum voltage number 07C corresponding to the minimum voltage conversion signal 04B to the digital logic processing module 12. The digital logic processing module 12 may determine the calibration coefficients of the analog-to-digital conversion module 10A and the analog-to-digital conversion module 10B based on the first LSB of the analog-to-digital conversion module 10A, the second LSB of the analog-to-digital conversion module 10B, the minimum voltage number 07B, and the minimum voltage number 07C.
In an illustrated embodiment, for each analog-to-digital conversion module other than the first analog-to-digital conversion module, the ratio of the minimum voltage number output by the analog-to-digital conversion module to the LSB of the last analog-to-digital conversion module may be determined as the calibration coefficient for the converted number output by at least one analog-to-digital conversion module preceding the analog-to-digital conversion module. For example, the ratio of the minimum voltage number 07B to the converted number 02A for the output of the analog-to-digital conversion module 10B may be determined as the calibration coefficient of the analog-to-digital conversion module 10A. For example, the ratio of the minimum voltage number 07C to the converted number 02B output for the analog-to-digital conversion module 10C may be determined as the calibration coefficients of the analog-to-digital conversion module 10A and the analog-to-digital conversion module 10B preceding it. For example, assuming that the ratio of the minimum voltage number 07B to the first LSB is 1.1 and the ratio of the minimum voltage number 07C to the second LSB is 1.2, 1.1 and 1.2 may be used as the calibration coefficients of the analog-to-digital conversion module 10A and 1.2 may be used as the calibration coefficients of the analog-to-digital conversion module 10B.
In an embodiment, the conversion number output by the analog-to-digital conversion module to be calibrated and at least one calibration coefficient corresponding to the conversion number may be multiplied continuously to obtain a calibrated conversion number corresponding to the analog-to-digital conversion module. For example, calibrating the analog-to-digital conversion module 10A based on the analog-to-digital conversion module 10B results in a calibration coefficient of 1.1, and calibrating the analog-to-digital conversion module 10B based on the analog-to-digital conversion module 10C results in a calibration coefficient of 1.2. Thus, the final calibration coefficient of the analog-to-digital conversion module 10B may be 1.1x1.2, and the final calibration coefficient may be multiplied by the conversion number 02A to obtain the calibrated conversion number 02A. Similarly, if the analog-to-digital conversion apparatus further includes an analog-to-digital conversion module n and an analog-to-digital conversion module n-1, the analog-to-digital conversion module 10C is calibrated based on the analog-to-digital conversion module n-1 to obtain the calibration coefficient x, and the analog-to-digital conversion module n-1 is calibrated based on the analog-to-digital conversion module n to obtain the calibration coefficient y. The final calibration coefficient of the analog-to-digital conversion module 10A may be 1.1×1.2×y, the final calibration coefficient of the analog-to-digital conversion module 10B is 1.2×y, the final calibration coefficient of the analog-to-digital conversion module 10C is x×y, and the final calibration coefficient of the analog-to-digital conversion module n-1 is y.
The above is only an exemplary description of an analog-to-digital conversion device 1 comprising two analog-to-digital conversion modules and an analog-to-digital conversion device 2 comprising three analog-to-digital conversion modules, it being understood that an analog-to-digital conversion device comprising n analog-to-digital conversion modules, n being equal to or greater than 4, can be deduced without doubt by a person skilled in the art on the basis of this description.
In an embodiment shown, since all but the last analog-to-digital conversion module needs to output the voltage conversion signal, all or other modules other than the last analog-to-digital conversion module may be analog-to-digital converters with output voltage conversion signal function, for example, the DAC of the successive approximation register analog-to-digital converter has output voltage conversion signal function, so the analog-to-digital converter type may be selected.
In an embodiment, the comparison module in this embodiment is mainly used for performing a subtraction function, i.e. subtracting two received voltage signals, so that a subtracter can be selected as the comparison module. Of course, a comparator other than the one including the subtracting function may be selected as the comparing module, which is not limited in any way in the present specification.
In an embodiment shown, the maximum value of the reference voltage of each analog-to-digital conversion module except the first analog-to-digital conversion module is not less than twice the least significant bit value of the previous analog-to-digital conversion module to ensure that the next analog-to-digital conversion module can calibrate the error of the previous comparison module. Since the voltage range that can be handled by the latter analog-to-digital conversion module depends on the least significant bit value of its preceding analog-to-digital conversion module, it is preferable that the maximum value of the reference voltage of each analog-to-digital conversion module other than the first analog-to-digital conversion module is set equal to twice the least significant bit value of its preceding analog-to-digital conversion module.
As shown in fig. 7, fig. 7 is a flowchart illustrating a method for calibrating a digital signal according to an exemplary embodiment, which may be applied to the digital logic processing module 12 of fig. 1 or fig. 2, including the following steps 701-703:
Step 701, obtaining conversion numbers and minimum voltage numbers respectively input by each analog-to-digital conversion module.
Step 702, for each analog-to-digital conversion module except the first analog-to-digital conversion module, determining a calibration coefficient of the conversion number output by at least one analog-to-digital conversion module before the analog-to-digital conversion module according to the minimum voltage number output by the analog-to-digital conversion module and the LSB of the last analog-to-digital conversion module.
And 703, performing calibration processing on the conversion numbers output by the at least one analog-to-digital conversion module based on the calibration coefficients to obtain calibrated conversion numbers, and determining the sum of all the calibrated conversion numbers and the uncalibrated conversion numbers as a digital representation corresponding to the voltage sampling signals received by the analog-to-digital conversion equipment.
In this embodiment, by calibrating the converted numbers output by the low-precision analog-to-digital conversion modules based on the high-precision analog-to-digital conversion modules, errors of the converted numbers indirectly caused by offset errors of the voltage conversion signals generated by the low-precision analog-to-digital conversion modules can be eliminated, so that the precision of the converted numbers output by the low-precision analog-to-digital conversion modules is improved, and the overall precision of the digital representation determined based on the converted numbers output by the analog-to-digital conversion modules is improved as a whole.
Corresponding to the embodiments of the aforementioned method, the present specification also provides embodiments of the apparatus and the terminal to which it is applied.
As shown in fig. 8, fig. 8 is a schematic structural diagram of an electronic device 800 according to an exemplary embodiment shown in the present specification. At the hardware level, the device includes a processor 802, an internal bus 804, a network interface 806, memory 808, and non-volatile storage 810, although other hardware required for the service is possible. One or more embodiments of the present description may be implemented in a software-based manner, such as by the processor 802 reading a corresponding computer program from the non-volatile memory 810 into the memory 808 and then running. Of course, in addition to software implementation, one or more embodiments of the present disclosure do not exclude other implementation manners, such as a logic device or a combination of software and hardware, etc., that is, the execution subject of the following processing flow is not limited to each logic module, but may also be a hardware or logic device.
As shown in fig. 9, fig. 9 is a calibration device for digital signals according to an exemplary embodiment of the present disclosure, which may be applied to the electronic device 800 shown in fig. 8 to implement the technical solution of the present disclosure. The device comprises:
an obtaining module 902, configured to obtain the conversion number and the minimum voltage number respectively input by each analog-to-digital conversion module;
A calibration coefficient determining module 904, configured to determine, for each analog-to-digital conversion module except for the first analog-to-digital conversion module, a calibration coefficient of a conversion number output by at least one analog-to-digital conversion module before the analog-to-digital conversion module according to the minimum voltage number output by the analog-to-digital conversion module and the LSB of the last analog-to-digital conversion module;
The digital representation calibration module 906 is configured to perform calibration processing on the conversion numbers output by the at least one analog-to-digital conversion module based on the calibration coefficients to obtain calibrated conversion numbers, and determine a sum of all the calibrated conversion numbers and uncalibrated conversion numbers as a digital representation corresponding to the voltage sampling signal received by the analog-to-digital conversion device.
The implementation process of the functions and roles of each module in the above device is specifically shown in the implementation process of the corresponding steps in the above method, and will not be described herein again.
For the device embodiments, reference is made to the description of the method embodiments for the relevant points, since they essentially correspond to the method embodiments. The apparatus embodiments described above are merely illustrative, wherein the modules illustrated as separate components may or may not be physically separate, and the components shown as modules may or may not be physical, i.e., may be located in one place, or may be distributed over a plurality of network modules. Some or all of the modules may be selected according to actual needs to achieve the purposes of the present description. Those of ordinary skill in the art will understand and implement the present invention without undue burden.
The present specification also provides a computer readable storage medium having stored thereon a computer program which when executed by a processor implements the steps of the aforementioned digital signal calibration method provided by the present application.
In particular, computer-readable media suitable for storing computer program instructions and data include all forms of non-volatile memory, media and memory devices, including by way of example semiconductor memory devices (e.g., EPROM, EEPROM, and flash memory devices), magnetic disks (e.g., internal hard disk or removable disks), magneto-optical disks, and CD-ROM and DVD-ROM disks.
Claims (10)
1. The analog-to-digital conversion device is characterized by comprising a digital logic processing module, a plurality of analog-to-digital conversion modules and at least one comparison module, wherein each analog-to-digital conversion module is connected with each comparison module at intervals in sequence, the least significant bit value LSB of the latter analog-to-digital conversion module is smaller than the LSB of the former analog-to-digital conversion module, and each analog-to-digital conversion module is respectively connected with the digital logic processing module, wherein:
the first analog-to-digital conversion module is used for receiving a voltage sampling signal, outputting a conversion number corresponding to the voltage sampling signal to the digital logic processing module, outputting a voltage conversion signal corresponding to the conversion number to the first comparison module, and outputting a minimum voltage conversion signal representing the LSB (least significant bit) of the voltage conversion signal to the next analog-to-digital conversion module;
The first comparison module is used for receiving the voltage sampling signal, and respectively inputting a difference value between the voltage sampling signal and the voltage conversion signal output by the first analog-to-digital conversion module as a secondary voltage sampling signal to a next analog-to-digital conversion module and a next comparison module of the comparison module;
Each comparison module except the first comparison module is respectively used for outputting the difference value of the secondary voltage sampling signal output by the last comparison module and the voltage conversion signal output by the last analog-to-digital conversion module to the next analog-to-digital conversion module and the next comparison module of the comparison module as a new secondary voltage sampling signal;
Each analog-to-digital conversion module except the first analog-to-digital conversion module is respectively used for outputting a minimum voltage digital corresponding to the minimum voltage conversion signal and a converted digital corresponding to the secondary voltage sampling signal to the digital logic processing module, outputting a voltage conversion signal corresponding to the converted digital to the next comparison module and outputting a minimum voltage conversion signal representing the LSB (least significant bit) size to the next analog-to-digital conversion module according to the minimum voltage conversion signal output by the last analog-to-digital conversion module and the secondary voltage sampling signal output by the last comparison module;
The digital logic processing module is used for determining a calibration coefficient of the conversion number output by at least one analog-digital conversion module before the analog-digital conversion module according to the minimum voltage number output by each analog-digital conversion module except the first analog-digital conversion module and the LSB of the last analog-digital conversion module based on the received conversion number and the minimum voltage number, and performing calibration processing on the conversion number output by the at least one analog-digital conversion module based on the calibration coefficient to obtain a calibrated conversion number, and determining the sum of all the calibrated conversion numbers and the uncalibrated conversion number as a digital representation corresponding to the voltage sampling signal.
2. The apparatus of claim 1, wherein the device comprises a plurality of sensors,
All analog-to-digital conversion modules or other analog-to-digital conversion modules except the last analog-to-digital conversion module are successive approximation register analog-to-digital converters.
3. The apparatus of claim 1, wherein the comparison module is a subtractor.
4. The apparatus of claim 1, wherein a maximum value of the reference voltage of each analog-to-digital conversion module other than the first analog-to-digital conversion module is not less than twice a least significant bit value of its previous analog-to-digital conversion module.
5. The apparatus of claim 1, wherein the determining the calibration coefficient of the conversion number output by at least one analog-to-digital conversion module before the analog-to-digital conversion module based on the minimum voltage number output by the analog-to-digital conversion module and the LSB of the last analog-to-digital conversion module comprises:
And determining the ratio of the minimum voltage number output by the analog-to-digital conversion module to the LSB of the last analog-to-digital conversion module as a calibration coefficient of the conversion number output by at least one analog-to-digital conversion module before the analog-to-digital conversion module.
6. The apparatus of claim 5, wherein the performing a calibration process on the conversion numbers output by the at least one analog-to-digital conversion module based on the calibration coefficients to obtain calibrated conversion numbers comprises:
And for each analog-to-digital conversion module in the at least one analog-to-digital conversion module, continuously multiplying the conversion number output by the analog-to-digital conversion module with at least one calibration coefficient corresponding to the conversion number to obtain a calibrated conversion number corresponding to the analog-to-digital conversion module.
7. A method of calibrating a digital signal, the method being applied to a digital logic processing module in an analog to digital conversion apparatus as claimed in any of claims 1 to 6, the method comprising:
Obtaining conversion numbers and minimum voltage numbers respectively input by all analog-to-digital conversion modules;
For each analog-to-digital conversion module except the first analog-to-digital conversion module, determining a calibration coefficient of conversion numbers output by at least one analog-to-digital conversion module before the analog-to-digital conversion module according to the minimum voltage number output by the analog-to-digital conversion module and the LSB of the last analog-to-digital conversion module;
And carrying out calibration processing on the conversion numbers output by the at least one analog-to-digital conversion module based on the calibration coefficients to obtain calibrated conversion numbers, and determining the sum of all the calibrated conversion numbers and the uncalibrated conversion numbers as a digital representation corresponding to the voltage sampling signals received by the analog-to-digital conversion equipment.
8. A digital signal calibration apparatus for use in a digital logic processing module in an analog to digital conversion device according to any one of claims 1 to 6, the apparatus comprising:
The acquisition module is used for acquiring the conversion number and the minimum voltage number which are respectively input by each analog-to-digital conversion module;
The calibration coefficient determining module is used for determining the calibration coefficient of the conversion number output by at least one analog-to-digital conversion module before the analog-to-digital conversion module according to the minimum voltage number output by each analog-to-digital conversion module except the first analog-to-digital conversion module and the LSB of the last analog-to-digital conversion module;
And the digital representation calibration module is used for carrying out calibration processing on the conversion numbers output by the at least one analog-to-digital conversion module based on the calibration coefficients to obtain calibrated conversion numbers, and determining the sum of all the calibrated conversion numbers and the uncalibrated conversion numbers as a digital representation corresponding to the voltage sampling signals received by the analog-to-digital conversion equipment.
9. An electronic device comprising a memory, a processor and a computer program stored on the memory and executable on the processor, characterized in that the processor implements the steps of the method of claim 7 when executing the program.
10. A computer readable storage medium, on which a computer program is stored, characterized in that the program, when being executed by a processor, implements the steps of the method according to claim 7.
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