CN102818815B - Thermal vacuum outgassing testing apparatus - Google Patents
Thermal vacuum outgassing testing apparatus Download PDFInfo
- Publication number
- CN102818815B CN102818815B CN201210290607.9A CN201210290607A CN102818815B CN 102818815 B CN102818815 B CN 102818815B CN 201210290607 A CN201210290607 A CN 201210290607A CN 102818815 B CN102818815 B CN 102818815B
- Authority
- CN
- China
- Prior art keywords
- plate
- cooling plate
- vacuum
- collecting
- test device
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Active
Links
Images
Landscapes
- Investigating Strength Of Materials By Application Of Mechanical Stress (AREA)
- Sampling And Sample Adjustment (AREA)
Abstract
本发明公开了一种热真空释气试验装置,主要包括真空罩(内含释气收集装置、样品槽等)、真空抽气系统、高低温保障系统、温度真空度测控系统以及辅助系统,真空抽气系统提供试验设备需要的真空度,高低温保障系统分别为高温装置和低温循环装置,提供加热样品125±1℃和收集板25±1℃的温度需要。本发明装置保证了冷量在收集板和冷却板之间的有效传导,收集板与冷却板温度一致,温度均匀,并采用双排并列结构,避免了释放出来的气体互相干扰,操作快捷、方便,进而提高了试验结果的准确性。
The invention discloses a thermal vacuum outgassing test device, which mainly includes a vacuum cover (including a outgassing collection device, a sample tank, etc.), a vacuum pumping system, a high and low temperature protection system, a temperature and vacuum degree measurement and control system, and an auxiliary system. The exhaust system provides the vacuum degree required by the test equipment, and the high and low temperature protection system is a high temperature device and a low temperature circulation device respectively, which provide the temperature requirements for heating samples at 125±1°C and collecting plates at 25±1°C. The device of the invention ensures the effective conduction of cold energy between the collecting plate and the cooling plate, the temperature of the collecting plate and the cooling plate is consistent and uniform, and adopts a double-row parallel structure, which avoids the mutual interference of released gases, and is quick and convenient to operate , thereby improving the accuracy of the test results.
Description
技术领域 technical field
本发明涉及一种试验设备,尤其涉及一种热真空释气试验装置。 The present invention relates to a test equipment, in particular to a thermal vacuum outgassing test device.
背景技术 Background technique
现有技术中的热真空释气试验装置采取两排立式结构的试验装置,如图1所示,每排装置分别由样品槽(加热器)、冷却板、收集箱及收集板等组成。每排装置分别有12个样品槽,对应有12个收集板及收集箱。试验装置安装在直径为260mm钟罩的真空系统的底板上,采用一个专用的穿通式环状基座,并靠底板支撑。收集箱、收集板与冷却板的连接结构是试验设备的关键。收集箱是由隔板与冷却板构成的空间组成;收集板底部焊接螺钉,与冷却板之间通过螺钉、螺母连接。另一种热真空释气试验装置,如图2所示,每层装置分别由样品槽(加热器)、冷却板、收集箱及收集板等组成。每层装置分别有12个样品槽,对应有12个收集板及收集箱。收集箱由隔栅和盖板组成,收集板位于隔栅之内,收集板由位于收集板正下方的磁铁吸引固定。现有技术的不足之处在于:真空罩为细长结构,真空抽气系统位于真空罩的底部,抽口较小,不利于高真空的建立;样品槽为650×50×25的立式结构,且样品槽需要设置加热装置,安装后的样品槽与收集箱之间只有0.75mm间距,加工及定位精度很难保证。尤其是收集板的温度25±1℃需要绝对的保证,其温度的准确性直接决定材料热真空释气试验的成败。而收集板的温度来自于冷却板冷量传导,决定于与冷却板的接触面积与接触状态。为了保证收集板与冷却板的良好接触,收集板背面设计一螺钉结构。收集板是一个直径达33mm、厚度只有0.65mm的钢板,不论收集板与螺钉之间采用何种结构方式,均会影响收集板的平面度,进而影响收集板与冷却板的贴合状态,影响收集板温度及均匀性。同时,收集板背面设计一螺钉结构,对应的冷却板相应处需要开设螺钉让位孔,影响收集板与冷却板的接触传热面积,也影响收集板温度及均匀性。采用上下两层结构,真空系统的抽气口位于真空罩底法兰的中间位置,上层试验材料释放出来的气体难免不被下层收集板捕获,进而影响试验的准确性。收集板位于隔栅之内,隔栅通过槽口卡接与冷板之上。隔栅之内的空间为49.25×49.25,高度为11.95,收集板直径33,厚度0.65,试验结束后取出收集板这个薄片较为困难。收集板的固定采用磁力吸引方式,磁铁通过螺钉固定于冷却板上,相应的冷却板上设置台阶孔,导致收集板与冷却板的接触面积减小,影响传热效果。受磁铁面积的限制,磁铁对收集板的作用面积有限,而收集板是一个厚度只有0.65的薄板,这就影响了收集板与冷却板的贴合程度,进而影响收集板的温度,影响试验结果的准确性。收集板、收集箱与样品槽出气孔之间有严格的同轴度要求,此种技术路线收集板定位困难,即便冷却板加工浅的凹坑用于定位,受加工刀具影响凹坑周边根部难以清根,进而影响收集板与冷却板的贴合程度。 The thermal vacuum outgassing test device in the prior art adopts two rows of vertical test devices, as shown in Figure 1, each row of devices is composed of a sample tank (heater), a cooling plate, a collection box, and a collection plate. Each row of devices has 12 sample slots, corresponding to 12 collection plates and collection boxes. The test device is installed on the bottom plate of the vacuum system with a diameter of 260mm bell jar, adopts a dedicated through-type ring base, and is supported by the bottom plate. The connection structure of the collection box, the collection plate and the cooling plate is the key to the test equipment. The collecting box is composed of a space formed by a partition and a cooling plate; screws are welded at the bottom of the collecting plate, and are connected with the cooling plate by screws and nuts. Another thermal vacuum outgassing test device is shown in Figure 2. Each layer of the device is composed of a sample tank (heater), a cooling plate, a collection box, and a collection plate. Each layer of the device has 12 sample slots, corresponding to 12 collection plates and collection boxes. The collection box is composed of a grille and a cover plate, the collection plate is located inside the grille, and the collection plate is attracted and fixed by a magnet directly below the collection plate. The disadvantages of the prior art are: the vacuum cover is a slender structure, the vacuum pumping system is located at the bottom of the vacuum cover, and the suction port is small, which is not conducive to the establishment of high vacuum; the sample tank is a vertical structure of 650×50×25 , and the sample tank needs to be equipped with a heating device. The distance between the installed sample tank and the collection box is only 0.75mm, and the processing and positioning accuracy are difficult to guarantee. In particular, the temperature of the collecting plate at 25±1°C needs to be absolutely guaranteed, and the accuracy of the temperature directly determines the success or failure of the thermal vacuum outgassing test of the material. The temperature of the collecting plate comes from the cold conduction of the cooling plate, which is determined by the contact area and contact state with the cooling plate. In order to ensure good contact between the collecting plate and the cooling plate, a screw structure is designed on the back of the collecting plate. The collecting plate is a steel plate with a diameter of 33mm and a thickness of only 0.65mm. No matter what structure is used between the collecting plate and the screw, it will affect the flatness of the collecting plate, and then affect the bonding state of the collecting plate and the cooling plate. Collection plate temperature and uniformity. At the same time, a screw structure is designed on the back of the collecting plate, and a screw relief hole needs to be opened at the corresponding place of the corresponding cooling plate, which affects the contact heat transfer area between the collecting plate and the cooling plate, and also affects the temperature and uniformity of the collecting plate. The upper and lower two-layer structure is adopted, and the exhaust port of the vacuum system is located in the middle of the bottom flange of the vacuum cover. The gas released from the upper layer of test materials will inevitably not be captured by the lower layer of collecting plate, which will affect the accuracy of the test. The collecting plate is located in the grille, and the grille is clamped on the cold plate through the notch. The space inside the grid is 49.25×49.25, the height is 11.95, the diameter of the collection plate is 33, and the thickness is 0.65. It is difficult to take out the thin piece of the collection plate after the test. The collecting plate is fixed by magnetic attraction, the magnet is fixed on the cooling plate by screws, and the corresponding cooling plate is provided with stepped holes, which reduces the contact area between the collecting plate and the cooling plate and affects the heat transfer effect. Limited by the area of the magnet, the magnet has a limited area of action on the collecting plate, and the collecting plate is a thin plate with a thickness of only 0.65, which affects the degree of bonding between the collecting plate and the cooling plate, which in turn affects the temperature of the collecting plate and affects the test results accuracy. There are strict coaxiality requirements between the collecting plate, the collecting box and the air outlet of the sample tank. It is difficult to locate the collecting plate in this technical route. Clear the roots, and then affect the degree of fit between the collecting plate and the cooling plate.
发明内容 Contents of the invention
本发明目的就是为了弥补已有技术的缺陷,提供一种设计结构简单,温度均匀的热真空释气试验装置。 The object of the present invention is to provide a thermal vacuum outgassing test device with simple design and uniform temperature in order to remedy the defects of the prior art.
本发明是通过以下技术方案实现的: The present invention is achieved through the following technical solutions:
一种热真空释气试验装置,包括有操作台和安装在操作台上方的真空罩,所述的操作台下方分别有加热板温度控制系统、冷却板温度控制系统、充气装置和真空系统,温度控制系统分别精准控制加热板和冷却板的温度,真空系统提供试验时所需要的真空度,在试验结束后充气装置向真空罩内回充干燥洁净的氮气,所述的真空罩内有操作装置,所述的操作装置包括有两个相同的装置且采用双排并列结构分布在同一操作板上,每个装置均包括有加热板和冷却板,所述的冷却板通过支撑柱安装在操作板上,所述的加热板通过绝热支撑机构支撑于冷却板上,所述的加热板上设有六孔位样品槽,每个样品槽上方均盖有盖板,样品槽侧壁上设有加热器,在冷却板上对应每个样品槽的位置分别设有收集板,每个收集板分别由一压板凹槽定位,所述的压板为圆形开口双耳状,内部凹槽为阶梯状,凹槽深度小于收集板厚度,起到压紧的作用,保证收集板与冷却板的良好接触,所述的装置还包括有收集箱,所述的收集箱罩在每块压板的外侧,并固定在冷却板上,所述的收集箱顶盖上对应每个样品槽的位置开有六个孔。 A thermal vacuum outgassing test device, comprising an operating table and a vacuum cover installed above the operating table, a heating plate temperature control system, a cooling plate temperature control system, an inflating device and a vacuum system are respectively arranged below the operating table, and the temperature The control system accurately controls the temperature of the heating plate and the cooling plate respectively. The vacuum system provides the vacuum degree required for the test. After the test, the inflator refills the dry and clean nitrogen into the vacuum cover. There is an operating device in the vacuum cover , the operating device includes two identical devices and is distributed on the same operating board in a double-row parallel structure, each device includes a heating plate and a cooling plate, and the cooling plate is installed on the operating board through a support column On the above, the heating plate is supported on the cooling plate through the heat-insulating support mechanism. The heating plate is provided with six-hole sample slots, each sample slot is covered with a cover plate, and the side wall of the sample slot is provided with a heating plate. The cooling plate is equipped with a collecting plate at the position corresponding to each sample groove, and each collecting plate is positioned by a pressing plate groove. The pressing plate is in the shape of a double ear with a circular opening, and the inner groove is stepped. The depth of the groove is smaller than the thickness of the collecting plate, which plays a role of pressing to ensure good contact between the collecting plate and the cooling plate. The device also includes a collecting box, which is covered on the outside of each pressing plate and fixed On the cooling plate, six holes are opened on the top cover of the collection box corresponding to each sample slot.
所述的热真空释气试验装置,其特征在于:所述的样品槽形状为高脚杯状。 The thermal vacuum outgassing test device is characterized in that: the shape of the sample tank is a goblet shape.
所述的热真空释气试验装置,其特征在于:所述的压板是由定位螺钉定位并固定的,所述的定位螺钉的圆柱部分一部分定位压板,另一部分旋入冷却板,用于压板与冷却板的定位,旋松或压紧压板时,只需要旋转半圈定位螺钉,即可操作压板,达到快速装配缩短时间的目的。 The thermal vacuum outgassing test device is characterized in that: the pressure plate is positioned and fixed by a set screw, a part of the cylindrical part of the set screw positions the pressure plate, and the other part is screwed into the cooling plate for the pressure plate and For the positioning of the cooling plate, when loosening or tightening the pressing plate, it only needs to rotate half a turn of the positioning screw to operate the pressing plate, achieving the purpose of quick assembly and shortening the time.
所述的热真空释气试验装置,其特征在于:所述的收集箱顶板边缘两侧分别开有定位孔,销钉穿过定位孔与冷却板定位,由半圆头螺钉紧固,操作时,只要旋转半圈半圆头螺钉即可取下收集箱。 The thermal vacuum outgassing test device is characterized in that: positioning holes are respectively opened on both sides of the edge of the top plate of the collection box, the pins pass through the positioning holes and the cooling plate to be positioned, and are fastened by half-head screws. During operation, as long as Twist the button head screw half a turn to remove the collection box.
所述的热真空释气试验装置,其特征在于:所述的压板的双耳为半圆弧状,其中一个开口向上,一个开口向下,当旋紧一侧定位螺钉时,摩擦力有使压板靠近另一侧定位螺钉的趋势。 The thermal vacuum outgassing test device is characterized in that: the two ears of the pressing plate are in the shape of a semicircle, one of which opens upwards and the other opens downwards, when one side positioning screw is tightened, the frictional force makes the pressing plate close to Tendency for set screws on the other side.
所述的收集板采用铝合金整体加工而成,减少拼接结构所引起的装配误差,因收集箱为细长薄壁件,加工过程中极易变形,实际加工中采用多次热处理工艺,从而保证了零件的设计精度,冷却板及加热板上的所有孔均在精密的数控机床上加工完成,保证了各孔之间的位置精度要求。 The collection plate is integrally processed by aluminum alloy, which reduces the assembly error caused by the splicing structure. Because the collection box is a slender and thin-walled part, it is easy to deform during processing. Multiple heat treatment processes are used in actual processing to ensure To ensure the design accuracy of the parts, all the holes on the cooling plate and heating plate are processed on the precision CNC machine tool, which ensures the position accuracy requirements between the holes.
本发明的优点是:本发明装置保证了冷量在收集板和冷却板之间的有效传导,收集板与冷却板温度一致,温度均匀,并采用双排并列结构,避免了释放出来的气体互相干扰,操作快捷、方便,进而提高了试验结果的准确性。 The advantages of the present invention are: the device of the present invention ensures the effective conduction of cold energy between the collecting plate and the cooling plate, the temperature of the collecting plate and the cooling plate is consistent and uniform, and adopts a double-row parallel structure, which avoids the mutual interaction of released gases. Interference, fast and convenient operation, thereby improving the accuracy of test results.
附图说明 Description of drawings
图1为第一种现有技术的装置示意图。 Fig. 1 is a schematic diagram of a device of the first prior art.
图2为第二种现有技术的装置示意图。 Fig. 2 is a schematic diagram of a second prior art device.
图3为本发明装置示意图。 Fig. 3 is a schematic diagram of the device of the present invention.
图4为本发明装置部分放大示意图。 Fig. 4 is a partially enlarged schematic view of the device of the present invention.
图5为压板示意图。 Figure 5 is a schematic diagram of the pressing plate.
图6为压板安装示意图。 Figure 6 is a schematic diagram of the installation of the pressure plate.
图7为收集箱结构示意图。 Fig. 7 is a schematic diagram of the structure of the collection box.
具体实施方式 Detailed ways
如图3、4所示,一种热真空释气试验装置,包括有操作台8和安装在操作台8上方的真空罩3,所述的操作台8下方分别有加热板温度控制系统4、冷却板温度控制系统5、充气装置6和真空系统7,温度控制系统分别精准控制加热板1和冷却板2的温度,真空系统7提供试验时所需要的真空度,在试验结束后充气装置6向真空罩3内回充干燥洁净的氮气,所述的真空罩3内有操作装置,所述的操作装置包括有两个相同的装置且采用双排并列结构分布在同一操作板8上,所述的冷却板2通过支撑柱9安装在操作板8上,所述的加热板1通过绝热支撑机构10支撑于冷却板2上,所述的加热板1上设有六孔位样品槽11,每个样品槽11上方均盖有盖板12,样品槽11侧壁上设有加热器,在冷却板1上对应每个样品槽11的位置分别设有收集板13,每个收集板13分别由一压板15凹槽定位,如图5所示,所述的压板15为圆形开口双耳状,内部凹槽为阶梯状,凹槽深度小于收集板13厚度,起到压紧的作用,保证收集板13与冷却板2的良好接触,所述的装置还包括有收集箱16,所述的收集箱16罩在每块压板15的外侧,并固定在冷却板2上,所述的收集箱16顶盖上对应每个样品槽11的位置开有六个孔19。
As shown in Figures 3 and 4, a thermal vacuum outgassing test device includes an operating table 8 and a
所述的热真空释气试验装置,其特征在于:所述的样品槽11形状为高脚杯状。 The thermal vacuum outgassing test device is characterized in that the sample tank 11 is in the shape of a goblet.
所述的热真空释气试验装置,其特征在于:如图6所示,所述的压板15是由定位螺钉14定位并固定的,所述的定位螺钉14的圆柱部分一部分定位压板15,另一部分旋入冷却板2,用于压板15与冷却板2的定位,旋松或压紧压板15时,只需要旋转半圈定位螺钉14,即可操作压板15,达到快速装配缩短时间的目的。
Described thermal vacuum outgassing test device is characterized in that: as shown in Figure 6, described
所述的热真空释气试验装置,其特征在于:如图7所示,所述的收集箱16顶板边缘两侧分别开有定位孔20,销钉18穿过定位孔20与冷却板2定位,由半圆头螺钉17紧固,操作时,只要旋转半圈半圆头螺钉17即可取下收集箱16。
The thermal vacuum outgassing test device is characterized in that: as shown in Figure 7, positioning holes 20 are respectively arranged on both sides of the edge of the top plate of the
所述的热真空释气试验装置,其特征在于:所述的压板15的双耳为半圆弧状,其中一个开口向上,一个开口向下,当旋紧一侧定位螺钉14时,摩擦力有使压板靠近另一侧定位螺钉14的趋势。
The thermal vacuum outgassing test device is characterized in that: the two ears of the
Claims (5)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201210290607.9A CN102818815B (en) | 2012-08-16 | 2012-08-16 | Thermal vacuum outgassing testing apparatus |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201210290607.9A CN102818815B (en) | 2012-08-16 | 2012-08-16 | Thermal vacuum outgassing testing apparatus |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| CN102818815A CN102818815A (en) | 2012-12-12 |
| CN102818815B true CN102818815B (en) | 2014-06-18 |
Family
ID=47303063
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201210290607.9A Active CN102818815B (en) | 2012-08-16 | 2012-08-16 | Thermal vacuum outgassing testing apparatus |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN102818815B (en) |
Families Citing this family (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN103674754B (en) * | 2013-12-03 | 2016-03-16 | 上海卫星装备研究所 | A kind of device for testing sample venting |
| RU170886U1 (en) * | 2016-09-01 | 2017-05-12 | Федеральное государственное бюджетное образовательное учреждение высшего образования "Национальный исследовательский Мордовский государственный университет им. Н.П. Огарёва" | DEVICE FOR NON-DESTRUCTIVE TESTING OF TEMPERATURE CONDUCTIVITY OF THERMAL COMPENSATORS OF POWER SEMICONDUCTOR DEVICES |
Family Cites Families (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CH662421A5 (en) * | 1983-07-13 | 1987-09-30 | Suisse Horlogerie Rech Lab | PIEZOELECTRIC CONTAMINATION DETECTOR. |
| JPS62207931A (en) * | 1986-03-07 | 1987-09-12 | Agency Of Ind Science & Technol | Absolute gas emission quantity measuring device and evaluating method for material using same |
| US6125687A (en) * | 1998-08-20 | 2000-10-03 | International Business Machines Corporation | Apparatus for measuring outgassing of volatile materials from an object |
| CN201555797U (en) * | 2009-11-25 | 2010-08-18 | 北京圣涛平试验工程技术研究院有限责任公司 | Thermal vacuum test device |
| CN201666862U (en) * | 2010-03-26 | 2010-12-08 | 中国电子技术标准化研究所 | Thermal vacuum outgassing test device |
| CN202939141U (en) * | 2012-08-16 | 2013-05-15 | 安徽万瑞冷电科技有限公司 | Thermal vacuum outgassing test device |
-
2012
- 2012-08-16 CN CN201210290607.9A patent/CN102818815B/en active Active
Also Published As
| Publication number | Publication date |
|---|---|
| CN102818815A (en) | 2012-12-12 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| CN101750427B (en) | Temperature controlling sample holder capable of adjusting incident ion energy and monitoring ion flux in real time | |
| CN202939141U (en) | Thermal vacuum outgassing test device | |
| JP2010212425A (en) | Shower head and plasma processing apparatus | |
| CN102818815B (en) | Thermal vacuum outgassing testing apparatus | |
| JP2011258614A5 (en) | ||
| CN104634811A (en) | Non-contact vibrationless low-temperature solid interface thermal resistance testing arrangement | |
| CN102436251B (en) | Constant-temperature air bath device and method for detecting temperature controller thereof and testing aging of temperature controller | |
| CN204991666U (en) | Device is born to negative pressure | |
| CN201666862U (en) | Thermal vacuum outgassing test device | |
| CN110137130A (en) | A kind of dry etching systems size conversion pallet | |
| CN211469156U (en) | Food detection sampling storage box | |
| CN219449859U (en) | Pump cover assembly and its PVD vacuum equipment | |
| TWI805297B (en) | Gas-water separation apparatus and hydrogen exhaust monitoring system base on fuel cell | |
| CN203100971U (en) | Built-in vacuum degree detecting device for vacuum insulation board | |
| CN202066735U (en) | Automatic translation and lifting type trapping and desorbing device | |
| CN202126849U (en) | First mirror sample irradiating support | |
| CN212342582U (en) | Hydrogen krypton acid gas phase etching equipment | |
| CN214474654U (en) | Temperature control system of probe station | |
| CN204068866U (en) | Back electrode structure battery test bench | |
| CN209820907U (en) | Detection apparatus for VOC homogenization is dry | |
| CN203467097U (en) | Master-circuit-and-drive-circuit-isolation housing for levitation controller of medium-low-speed magnetically-levitated train | |
| CN102735523A (en) | Automatic translation and lifting type trapping and desorbing device and manufacturing method of same | |
| CN203481201U (en) | Substrate positioning and lifting device for plasma etching equipment | |
| CN208811392U (en) | A kind of prewelding jig of GPP chip | |
| CN219226220U (en) | Sample loading device for laser analysis of gas mass spectrometer |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| C06 | Publication | ||
| PB01 | Publication | ||
| C10 | Entry into substantive examination | ||
| SE01 | Entry into force of request for substantive examination | ||
| C14 | Grant of patent or utility model | ||
| GR01 | Patent grant |