CN109001208A - 一种显示面板的缺陷定位装置及缺陷定位方法 - Google Patents
一种显示面板的缺陷定位装置及缺陷定位方法 Download PDFInfo
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- CN109001208A CN109001208A CN201810520532.6A CN201810520532A CN109001208A CN 109001208 A CN109001208 A CN 109001208A CN 201810520532 A CN201810520532 A CN 201810520532A CN 109001208 A CN109001208 A CN 109001208A
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
- G01N2021/8854—Grading and classifying of flaws
- G01N2021/8861—Determining coordinates of flaws
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
- G01N2021/8854—Grading and classifying of flaws
- G01N2021/8861—Determining coordinates of flaws
- G01N2021/8864—Mapping zones of defects
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/8851—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges
- G01N2021/8887—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges based on image processing techniques
- G01N2021/8893—Scan or image signal processing specially adapted therefor, e.g. for scan signal adjustment, for detecting different kinds of defects, for compensating for structures, markings, edges based on image processing techniques providing a video image and a processed signal for helping visual decision
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/89—Investigating the presence of flaws or contamination in moving material, e.g. running paper or textiles
- G01N21/8901—Optical details; Scanning details
- G01N2021/8908—Strip illuminator, e.g. light tube
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/95—Investigating the presence of flaws or contamination characterised by the material or shape of the object to be examined
- G01N2021/9513—Liquid crystal panels
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2201/00—Features of devices classified in G01N21/00
- G01N2201/06—Illumination; Optics
- G01N2201/061—Sources
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2201/00—Features of devices classified in G01N21/00
- G01N2201/10—Scanning
- G01N2201/102—Video camera
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- Computer Vision & Pattern Recognition (AREA)
- Signal Processing (AREA)
- Physics & Mathematics (AREA)
- Health & Medical Sciences (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Biochemistry (AREA)
- General Health & Medical Sciences (AREA)
- General Physics & Mathematics (AREA)
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- Pathology (AREA)
- Control Of Indicators Other Than Cathode Ray Tubes (AREA)
Abstract
Description
Claims (8)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201810520532.6A CN109001208A (zh) | 2018-05-28 | 2018-05-28 | 一种显示面板的缺陷定位装置及缺陷定位方法 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN201810520532.6A CN109001208A (zh) | 2018-05-28 | 2018-05-28 | 一种显示面板的缺陷定位装置及缺陷定位方法 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| CN109001208A true CN109001208A (zh) | 2018-12-14 |
Family
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Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| CN201810520532.6A Pending CN109001208A (zh) | 2018-05-28 | 2018-05-28 | 一种显示面板的缺陷定位装置及缺陷定位方法 |
Country Status (1)
| Country | Link |
|---|---|
| CN (1) | CN109001208A (zh) |
Cited By (12)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109580636A (zh) * | 2018-12-03 | 2019-04-05 | 深圳市华星光电半导体显示技术有限公司 | 显示面板缺陷标记工具 |
| CN110296998A (zh) * | 2019-06-06 | 2019-10-01 | 武汉精立电子技术有限公司 | 一种3d面板的缺陷检测系统及方法 |
| CN110596139A (zh) * | 2019-08-26 | 2019-12-20 | 武汉精立电子技术有限公司 | 一种屏缺陷检测方法和系统 |
| CN111006852A (zh) * | 2019-12-16 | 2020-04-14 | 广东谨诺科技有限公司 | 一种用于tft/oled检测的背光源模组 |
| CN111504221A (zh) * | 2020-05-15 | 2020-08-07 | 苏州精濑光电有限公司 | 一种网板图像追焦装置及其方法 |
| CN111624200A (zh) * | 2020-05-28 | 2020-09-04 | 苏州精濑光电有限公司 | 缺陷检测方法以及装置 |
| CN112213327A (zh) * | 2019-07-09 | 2021-01-12 | 陕西坤同半导体科技有限公司 | 一种显示面板人员检测辅助方法及系统 |
| CN112419970A (zh) * | 2020-12-16 | 2021-02-26 | 安徽熙泰智能科技有限公司 | 一种Micro-LED像素修复设备及修复方法 |
| CN113345328A (zh) * | 2021-05-28 | 2021-09-03 | Tcl华星光电技术有限公司 | 显示面板Mura修补方法 |
| CN113744252A (zh) * | 2021-09-07 | 2021-12-03 | 全芯智造技术有限公司 | 用于标记和检测缺陷的方法、设备、存储介质和程序产品 |
| CN114279683A (zh) * | 2021-11-22 | 2022-04-05 | 浙江大华技术股份有限公司 | 显示屏用自动化检测平台及其方法和led显示屏 |
| WO2022246643A1 (zh) * | 2021-05-25 | 2022-12-01 | 京东方科技集团股份有限公司 | 图像获取方法及装置、存储介质 |
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| WO2004008501A1 (en) * | 2002-07-12 | 2004-01-22 | Jeol Usa, Inc. | Method for detection and relocation of wafer defects |
| CN1954204A (zh) * | 2004-05-14 | 2007-04-25 | 光子动力学公司 | 使用按需自动光学检查子系统的改进的tft液晶显示器面板检查方法 |
| US20070105245A1 (en) * | 2005-11-10 | 2007-05-10 | Hitachi High-Technologies Corporation | Wafer inspection data handling and defect review tool |
| US7266235B2 (en) * | 2000-11-09 | 2007-09-04 | Hitachi, Ltd. | Pattern inspection method and apparatus |
| CN101836099A (zh) * | 2007-08-27 | 2010-09-15 | 夏普株式会社 | 显示控制装置、检查系统、显示控制方法、程序以及记录有该程序的计算机可读取的记录介质 |
| CN101996543A (zh) * | 2009-08-25 | 2011-03-30 | 日本麦可罗尼克斯股份有限公司 | 缺陷像素地址检测方法以及检测装置 |
| CN102460106A (zh) * | 2009-06-18 | 2012-05-16 | 夏普株式会社 | 显示面板的缺陷检查方法和缺陷检查装置 |
| CN102461153A (zh) * | 2009-06-09 | 2012-05-16 | 索尼公司 | 控制装置、相机系统和程序 |
| CN102998823A (zh) * | 2012-12-06 | 2013-03-27 | 京东方科技集团股份有限公司 | 点灯检查设备的偏光片支撑部件及点灯检查设备 |
| CN103261104A (zh) * | 2010-12-15 | 2013-08-21 | 旭硝子株式会社 | 玻璃板、玻璃板的检查方法、及玻璃板的制造方法 |
| CN104655641A (zh) * | 2015-01-31 | 2015-05-27 | 华南理工大学 | 一种高精密全自动fpc缺陷检测装置及检测工艺 |
| CN106405894A (zh) * | 2016-11-15 | 2017-02-15 | 南京华东电子信息科技股份有限公司 | 一种液晶面板缺陷自动定位方法 |
| CN106469532A (zh) * | 2015-08-17 | 2017-03-01 | 株式会社弘益技术 | 显示面板亮灯检查方法 |
| CN206906740U (zh) * | 2017-06-12 | 2018-01-19 | 昆山龙腾光电有限公司 | 显示面板测试装置 |
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2018
- 2018-05-28 CN CN201810520532.6A patent/CN109001208A/zh active Pending
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| Publication number | Priority date | Publication date | Assignee | Title |
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| US7266235B2 (en) * | 2000-11-09 | 2007-09-04 | Hitachi, Ltd. | Pattern inspection method and apparatus |
| US20020113234A1 (en) * | 2001-02-21 | 2002-08-22 | Hirohito Okuda | Method and system for inspecting electronic circuit pattern |
| WO2004008501A1 (en) * | 2002-07-12 | 2004-01-22 | Jeol Usa, Inc. | Method for detection and relocation of wafer defects |
| CN1954204A (zh) * | 2004-05-14 | 2007-04-25 | 光子动力学公司 | 使用按需自动光学检查子系统的改进的tft液晶显示器面板检查方法 |
| US20070105245A1 (en) * | 2005-11-10 | 2007-05-10 | Hitachi High-Technologies Corporation | Wafer inspection data handling and defect review tool |
| CN101836099A (zh) * | 2007-08-27 | 2010-09-15 | 夏普株式会社 | 显示控制装置、检查系统、显示控制方法、程序以及记录有该程序的计算机可读取的记录介质 |
| CN102461153A (zh) * | 2009-06-09 | 2012-05-16 | 索尼公司 | 控制装置、相机系统和程序 |
| CN102460106A (zh) * | 2009-06-18 | 2012-05-16 | 夏普株式会社 | 显示面板的缺陷检查方法和缺陷检查装置 |
| CN101996543A (zh) * | 2009-08-25 | 2011-03-30 | 日本麦可罗尼克斯股份有限公司 | 缺陷像素地址检测方法以及检测装置 |
| CN103261104A (zh) * | 2010-12-15 | 2013-08-21 | 旭硝子株式会社 | 玻璃板、玻璃板的检查方法、及玻璃板的制造方法 |
| CN102998823A (zh) * | 2012-12-06 | 2013-03-27 | 京东方科技集团股份有限公司 | 点灯检查设备的偏光片支撑部件及点灯检查设备 |
| CN104655641A (zh) * | 2015-01-31 | 2015-05-27 | 华南理工大学 | 一种高精密全自动fpc缺陷检测装置及检测工艺 |
| CN106469532A (zh) * | 2015-08-17 | 2017-03-01 | 株式会社弘益技术 | 显示面板亮灯检查方法 |
| CN106405894A (zh) * | 2016-11-15 | 2017-02-15 | 南京华东电子信息科技股份有限公司 | 一种液晶面板缺陷自动定位方法 |
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Cited By (15)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| CN109580636A (zh) * | 2018-12-03 | 2019-04-05 | 深圳市华星光电半导体显示技术有限公司 | 显示面板缺陷标记工具 |
| CN110296998A (zh) * | 2019-06-06 | 2019-10-01 | 武汉精立电子技术有限公司 | 一种3d面板的缺陷检测系统及方法 |
| CN112213327A (zh) * | 2019-07-09 | 2021-01-12 | 陕西坤同半导体科技有限公司 | 一种显示面板人员检测辅助方法及系统 |
| CN110596139A (zh) * | 2019-08-26 | 2019-12-20 | 武汉精立电子技术有限公司 | 一种屏缺陷检测方法和系统 |
| CN111006852A (zh) * | 2019-12-16 | 2020-04-14 | 广东谨诺科技有限公司 | 一种用于tft/oled检测的背光源模组 |
| CN111006852B (zh) * | 2019-12-16 | 2022-03-18 | 广东谨诺科技有限公司 | 一种大尺寸tft/oled显示面板检测平台 |
| CN111504221A (zh) * | 2020-05-15 | 2020-08-07 | 苏州精濑光电有限公司 | 一种网板图像追焦装置及其方法 |
| CN111624200A (zh) * | 2020-05-28 | 2020-09-04 | 苏州精濑光电有限公司 | 缺陷检测方法以及装置 |
| CN112419970A (zh) * | 2020-12-16 | 2021-02-26 | 安徽熙泰智能科技有限公司 | 一种Micro-LED像素修复设备及修复方法 |
| WO2022246643A1 (zh) * | 2021-05-25 | 2022-12-01 | 京东方科技集团股份有限公司 | 图像获取方法及装置、存储介质 |
| CN115803610A (zh) * | 2021-05-25 | 2023-03-14 | 京东方科技集团股份有限公司 | 图像获取方法及装置、存储介质 |
| US12229943B2 (en) | 2021-05-25 | 2025-02-18 | Chengdu Boe Optoelectronics Technology Co., Ltd. | Method and apparatus for acquiring images, and storage medium thereof |
| CN113345328A (zh) * | 2021-05-28 | 2021-09-03 | Tcl华星光电技术有限公司 | 显示面板Mura修补方法 |
| CN113744252A (zh) * | 2021-09-07 | 2021-12-03 | 全芯智造技术有限公司 | 用于标记和检测缺陷的方法、设备、存储介质和程序产品 |
| CN114279683A (zh) * | 2021-11-22 | 2022-04-05 | 浙江大华技术股份有限公司 | 显示屏用自动化检测平台及其方法和led显示屏 |
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Effective date of registration: 20200828 Address after: No.7 Tianyou Road, Qixia District, Nanjing City, Jiangsu Province Applicant after: NANJING CEC PANDA FPD TECHNOLOGY Co.,Ltd. Address before: Nanjing Crystal Valley Road in Qixia District of Nanjing City Tianyou 210033 Jiangsu province No. 7 Applicant before: NANJING CEC PANDA FPD TECHNOLOGY Co.,Ltd. Applicant before: NANJING CEC PANDA LCD TECHNOLOGY Co.,Ltd. Applicant before: NANJING HUADONG ELECTRONICS INFORMATION & TECHNOLOGY Co.,Ltd. |
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