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CN107682076A - A kind of test device for improving multi-standard multi-path-apparatus testing efficiency - Google Patents

A kind of test device for improving multi-standard multi-path-apparatus testing efficiency Download PDF

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Publication number
CN107682076A
CN107682076A CN201710931131.5A CN201710931131A CN107682076A CN 107682076 A CN107682076 A CN 107682076A CN 201710931131 A CN201710931131 A CN 201710931131A CN 107682076 A CN107682076 A CN 107682076A
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CN
China
Prior art keywords
ports
fdd
information source
frequency
selection
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Pending
Application number
CN201710931131.5A
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Chinese (zh)
Inventor
余旭阳
邓雄
薛晓静
刘永飘
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Wuhan Hongxin Telecommunication Technologies Co Ltd
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Wuhan Hongxin Telecommunication Technologies Co Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
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Priority to CN201710931131.5A priority Critical patent/CN107682076A/en
Publication of CN107682076A publication Critical patent/CN107682076A/en
Pending legal-status Critical Current

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    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04BTRANSMISSION
    • H04B10/00Transmission systems employing electromagnetic waves other than radio-waves, e.g. infrared, visible or ultraviolet light, or employing corpuscular radiation, e.g. quantum communication
    • H04B10/07Arrangements for monitoring or testing transmission systems; Arrangements for fault measurement of transmission systems
    • HELECTRICITY
    • H04ELECTRIC COMMUNICATION TECHNIQUE
    • H04WWIRELESS COMMUNICATION NETWORKS
    • H04W24/00Supervisory, monitoring or testing arrangements

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  • Engineering & Computer Science (AREA)
  • Computer Networks & Wireless Communication (AREA)
  • Signal Processing (AREA)
  • Physics & Mathematics (AREA)
  • Electromagnetism (AREA)
  • Testing Electric Properties And Detecting Electric Faults (AREA)

Abstract

The invention discloses a kind of test device for improving multi-standard multi-path-apparatus testing efficiency, belong to technical field of photo communication.Including 8 information source modules, 1 blower module and 1 baseband module, 8 information source modules can produce 8 kinds of standards, 12 kinds of signal sources, the blower module carries temperature sense, when equipment running temperature to set thresholding, voluntarily start the radiating for being responsible for whole device, the baseband module connects with 8 information source modules respectively, is responsible for control display screen work, port selection, frequency selection, adjustment selection, amplitude selection, numeral key functional areas.Multi-standard optical fiber distribution system access unit directly docks the test device according to corresponding standard and frequency range, wiring need not be changed during test can complete whole tests, test operation and plant maintenance are simple, modulating signal source quantity is reduced during use, reaching reduces the purpose that testing cost improves testing efficiency.Selection can be carried out from 8 information source modules and forms the device according to test needs, specific aim, flexibility is strong.

Description

A kind of test device for improving multi-standard multi-path-apparatus testing efficiency
Technical field
The present invention relates to technical field of photo communication, more particularly to a kind of survey for improving multi-standard multi-path-apparatus testing efficiency Trial assembly is put.
Background technology
Information source at this stage is largely single system single channel or multi-standard single-pass configuration, is limited in information source channel Under the premise of complete the optical fiber distribution system radio frequency testing and have following defect:
First, it is more that the system testing demand information source is completed at this stage, and environmental structure is complicated
Completing the test environment that the system testing is built needs 12 signal sources, need to support different frequency and possess not With the option of debud mode, it is low that test environment builds efficiency, and information source cumulative cost is high, in general mechanism for testing and equipment vendors without Method adapts to.
2nd, interference effect test result between information source
The system type is more, frequency range is more, modulation system is complicated, can not be solved by the additional isolator mode of separate unit information source merely Certainly bring interference between information source into;For equipment side, different frequency effects is when nonlinear circuit or device, between frequency mutually Intermodulation Interference produced by effect;Frequency compounding can also produce new Intermodulation Interference between instrument and equipment, when information source needs combining When, Intermodulation Interference can be also produced between information source, and introducing interference in this in Complicated Testing System can not eliminate, eventually shadow Ring test result accuracy.
3rd, separate test operation is numerous and diverse between information source
Because between more information sources can only the selection of independently-powered, frequency and modulation system independent control, when completing the system testing Complex operation, easily error, separate unit information source break down to test and interrupted, and it is dumb to can configure selection.
At this stage traditional test environment build as shown in Figure 2.
Need to open all downlink input end signals in addition to the descending information source of this standard in test, distinguished with frequency spectrograph Bottom in the working band of each working frequency range output end of descending full load up-link is tested to make an uproar power.The fully loaded input of near-end MU equipment , it is necessary to which 12 signal sources send the different frequency of respective channel and corresponding debugging signal simultaneously during downstream signal, the survey is built The test instrumentation that test ring border needs requires extremely complex.
The signal source that completing test needs requires as follows
The content of the invention
Present invention application provides a kind of test device for improving multi-standard multi-path-apparatus testing efficiency.Whole device by One 220V power supply is unified to power, and the power module can provide ten road 12V~2A power supplys outputs, be supplied respectively to 10 modules Electricity.Multi-standard optical fiber distribution system access unit directly docks the test device, nothing during test according to corresponding standard and frequency range Wiring, which need to be changed, can complete whole tests, and test operation and plant maintenance are simple.
A kind of test device for improving multi-standard multi-path-apparatus testing efficiency, including 8 information source modules, 1 fan mould Block and 1 baseband module, 8 information source modules can produce GSM900, CDMA800, WCDMA2100, DCS1800, telecommunications FDD-LTE2100 (supporting MIMO), telecommunications FDD-LTE1800 (supporting MIMO), UNICOM FDD-LTE1800 (supporting MIMO), TD- LTE2300 (supporting MIMO) information source, the blower module carries temperature sense, when equipment running temperature to set thresholding, Voluntarily start the radiating for being responsible for whole device, the baseband module connects with 8 information source modules respectively, is responsible for control display screen work Work, port selection, frequency selects, adjustment selects, amplitude selects, numeral key functional areas.
Wherein, the generation principle of the signal of eight kinds of standards is consistent caused by 8 information source modules, is all by numeral Baseband signal is analog baseband signal by the method migration that phase shift is carried out to carrier wave, is then again converted to analog baseband signal Rf modulated signal exports.
Wherein, the single information source module produces circuit used by modulated signal, including:Digital processing unit, Yi Jiyu Connection integrated circuit, the output end of integrated circuit is divided into two-way, wherein being connected with the first digital analog converter, in turn all the way One wave filter, the first frequency mixer, another way are connected with the second digital analog converter, the second wave filter, the second frequency mixer in turn;
Also include first carrier generator, signal synthesizer, the first carrier generator with wherein all the way in it is described First frequency mixer connects, and is then mixed 90 ° of the phase-shifting carrier wave that first carrier generator exports with described second in another way Device connects, and first frequency mixer, the output end of the second frequency mixer are all connected to signal synthesizer;
Also include the 3rd wave filter, three-mixer, the second carrier generator, amplifier, higher order filter, the signal Synthesizer output end connects the 3rd wave filter, the output end of the 3rd wave filter and second carrier generator it is defeated Go out end and be all connected with the input of three-mixer, the output end connection amplifier of the three-mixer, the amplifier it is defeated Go out end connection higher order filter, the output end of the higher order filter is connected to Devices to test for modulated signal output and corresponds to information source Input port.
Wherein, higher frequency is produced by phase-locked loop frequency combiner circuit, changed inside device by potentiometer knob Tunable capacitor, so that output stability is high, frequency range is wider, the adjustable modulated signal of amplitude.
Wherein, described device external interface reserves TRIG, PATT TRIG, 10Mhz OUT, EVENT, for the device and Other extraneous test equipments are synchronous, and DEBUG/LAN mouths operate for device maintenance upgrade.
Wherein, the front panel of described device includes waveform selection display screen, functional areas button, the functional areas button, bag Include port select button 1-12, frequency select button 1-12, adjustment select button 1-12, amplitude select button 1-12.
Wherein, the rear board of described device includes CDMA ports, DCS ports, the ports 1 of FDD-LTE (U) 1800, UNICOM 1800FDD ports // optional, the ports 2 of FDD-LTE (U) 1800, UNICOM 1800FDD ports // optional, WCDMA ports, TD- SCDMA ports, the ports 1 of FDD-LTE (T) 1800, telecommunications 1800FDD ports // optional, the ports 2 of FDD-LTE (T) 1800, telecommunications 1800FDD ports // optional, the TD-LTE ports optional E/D/F of 1//frequency range, the TD-LTE ports optional E/D/F of 2//frequency range, FDD- The ports 1 of LTE (T) 2100, telecommunications 2100FDD ports // optional, ports 2 of FDD-LTE (T) 2100, telecommunications 2100FDD ports // can Choosing, synchronous port EVENT1, synchronous port PATT TRIG, 10MHZ OUT, TRIG OUT, LAN port, DEBUG ports, power supply Switch, power input.
Beneficial effect:
A kind of test device for improving multi-standard multi-path-apparatus testing efficiency of the present invention.Whole device is by one 220V power supplys are unified to power, and the power module can provide ten road 12V~2A power supplys outputs, be powered respectively to 10 modules. Multi-standard optical fiber distribution system access unit directly docks the test device according to corresponding standard and frequency range, without more during test Changing-over line can complete whole tests, and test operation and plant maintenance are simple.8 information source moulds export by higher order filter, protect The pure of each information source is demonstrate,proved, reduces and introduces interference.Unified power management, all information source modules of strong control are switched on and off.
Brief description of the drawings
Fig. 1 is that the test equipment application scenarios that the present invention applies introduce topological diagram.
Fig. 2 is that former traditional test device completes the test block diagram.
Fig. 3 is that test device of the present invention completes the test block diagram.
Fig. 4 is that single information source module produces modulated signal schematic diagram.
Fig. 5 is the schematic diagram that 12 kinds of modulated signals are incorporated into a test device.
Fig. 6 is the front panel figure of test device of the present invention.
Fig. 7 is the rear board figure of test device of the present invention.
Embodiment
Technical solution of the present invention is described in detail below in conjunction with drawings and examples.
As shown in figure 1, optical fiber distribution system (optical distribution system) be it is a kind of support multisystem, Multi service access, using digitizing technique, indoor and outdoor covering of the backbone route based on bearing optical fiber transmission of wireless signals and distribution Solution.The complication system radio frequency testing is completed, need to provide can meet that 2G, 3G, 4G information source could be carried out simultaneously.
Modulating signal source quantity is reduced during use the invention aims to test, reaching, which reduces testing cost, carries The purpose of high testing efficiency.
A kind of test device for improving multi-standard multi-path-apparatus testing efficiency of the present invention, including 8 information source moulds Block, 1 blower module and 1 baseband module, 8 information source modules can produce GSM900, CDMA800, WCDMA2100, DCS1800, telecommunications FDD-LTE2100 (supporting MIMO), telecommunications FDD-LTE1800 (supporting MIMO), UNICOM FDD-LTE1800 (supporting MIMO), TD-LTE2300 (supporting MIMO) information source, the blower module carries temperature sense, when equipment running temperature During to set thresholding, voluntarily start the radiating for being responsible for whole device, the baseband module connects with 8 information source modules respectively, bears Blame control display screen work, port selection, frequency selection, adjustment selection, amplitude selection, numeral key functional areas.
It should be noted that selection can be carried out from 8 information source modules and forms the dress according to test needs, specific aim Put, flexibility is strong.
Signal is converted into different communication standards by each functional module, to meet multisystem testing requirement.
The generation principle of the signal of eight kinds of standards is consistent, is all digital baseband signal typically by being moved to carrier wave The method migration of phase (Phase Shift) is analog baseband signal, and analog baseband signal then is converted into radio-frequency modulations letter again Number output.
It is as shown in Figure 4 that single information source module produces modulated signal principle.Including:Digital processing unit, and be attached thereto Integrated circuit, the output end of integrated circuit are divided into two-way, wherein being connected with the first digital analog converter, the first filtering in turn all the way Device, the first frequency mixer, another way are connected with the second digital analog converter, the second wave filter, the second frequency mixer in turn;
Also include first carrier generator, signal synthesizer, the first carrier generator with wherein all the way in it is described First frequency mixer connects, and is then mixed 90 ° of the phase-shifting carrier wave that first carrier generator exports with described second in another way Device connects, and first frequency mixer, the output end of the second frequency mixer are all connected to signal synthesizer;
Also include the 3rd wave filter, three-mixer, the second carrier generator, amplifier, higher order filter, the signal Synthesizer output end connects the 3rd wave filter, the output end of the 3rd wave filter and second carrier generator it is defeated Go out end and be all connected with the input of three-mixer, the output end connection amplifier of the three-mixer, the amplifier it is defeated Go out end connection higher order filter, the output end of the higher order filter is connected to Devices to test for modulated signal output and corresponds to information source Input port.
Digital baseband signal passes through DSP Digital Signal Processing, into baseband-modem module, is generated and simulated by digital-to-analogue conversion Signal, orthogonal i/q signal after conversion carry out up-conversion, phase shift, combining output, again and is actually needed by prime wave filter Rf modulated signal mixing amplification, is most output to Devices to test through higher order filter afterwards.Wherein phase-locked loop frequency combiner circuit produces Raw higher frequency, tunable capacitor is changed by potentiometer knob inside device, with output stability is high, frequency range is wider, The adjustable modulated signal of amplitude.
12 kinds of modulated signals are incorporated into a test device schematic diagram such as Fig. 5.
Different modulated signals are incorporated into a test device according to the difference of debud mode and frequency, each intermodule uses The higher order filter of high-isolation, Signal separator to different radio frequency port 1--12 is exported respectively.
The front panel general introduction of the present apparatus is as shown in Figure 6.It is described as follows:
1st, port selection knob (1--12) // tape-select switch
2nd, frequency selection knob (1--12) // band frequency switching
3rd, modulation selection knob (1--12) // band modulation switch
4th, amplitude selection knob (1--12) // band magnitude switch
5th, digital function area // numeral and unit selection
6th, waveform selection display screen // information source configuration or calling
The rear board general introduction of the present apparatus is as shown in Figure 7.It is described as follows for each port:
1st, CDMA ports
2nd, DCS ports
3rd, UNICOM 1800FDD ports of FDD-LTE (U) 1800 port 1 // optional
4th, UNICOM 1800FDD ports of FDD-LTE (U) 1800 port 2 // optional
5th, WCDMA ports
6th, TD-SCDMA ports
7th, telecommunications 1800FDD ports of FDD-LTE (T) 1800 port 1 // optional
8th, telecommunications 1800FDD ports of FDD-LTE (T) 1800 port 2 // optional
9th, the optional E/D/F of 1 // frequency range of TD-LTE ports
10th, the optional E/D/F of 2 // frequency range of TD-LTE ports
11st, telecommunications 2100FDD ports of FDD-LTE (T) 2100 port 1 // optional
12nd, telecommunications 2100FDD ports of FDD-LTE (T) 2100 port 2 // optional
13rd, synchronous port EVENT1
14th, synchronous port PATT TRIG
15、10MHZ OUT
16、TRIG OUT
17th, LAN port
18th, DEBUG ports
19th, power switch
20th, power input
8 information source moulds export by higher order filter, ensure the pure of each information source, reduce and introduce interference.Multi-standard optical fiber Compartment system access unit directly docks the test device according to corresponding standard and frequency range, and port selection knob adjustment information source is opened Close, standard selection knob can adjust information source standard, frequency selection knob adjustment respective frequencies, amplitude selection knob selection information source width Spend size.Each port can independent control, wiring need not be changed during test can complete whole tests, test operation and equipment dimension Shield is simple.It is same for device and test equipment/frequency spectrograph that external interface reserves TRIG, PATT TRIG, 10Mhz OUT, EVENT Step, DEBUG/LAN mouths are used for the operation such as device maintenance upgrade.
By taking the highway device of eight mould 12 that current steel tower company requires as an example, built significantly using test environment after the device Degree simplifies.Information source moduleization can select a certain piece or several pieces in 8 information source modules to realize flexible configuration, module according to demand Between high-isolation also reduce simultaneously and bring interference between signal source into, improve dry between test accuracy more actual response multisystem Disturb.Unified power management, all information source modules of strong control are switched on and off.Tested using the multisystem after apparatus of the present invention Environment is as shown in Figure 3.
Specific embodiment described herein is only to spirit explanation for example of the invention.Technology belonging to the present invention is led The technical staff in domain can be made various modifications or supplement to described specific embodiment or be replaced using similar mode Generation, but without departing from the spiritual of the present invention or surmount scope defined in appended claims.

Claims (7)

1. a kind of test device for improving multi-standard multi-path-apparatus testing efficiency, it is characterised in that including 8 information source modules, 1 Individual blower module and 1 baseband module, 8 information source modules can produce GSM900, CDMA800, WCDMA2100, DCS1800, telecommunications FDD-LTE2100(Support MIMO), telecommunications FDD-LTE1800(Support MIMO), UNICOM FDD-LTE1800 (Support MIMO)、TD-LTE2300(Support MIMO)Information source, the blower module carries temperature sense, when equipment running temperature During to set thresholding, voluntarily start the radiating for being responsible for whole device, the baseband module connects with 8 information source modules respectively, bears Blame control display screen work, port selection, frequency selection, adjustment selection, amplitude selection, numeral key functional areas.
2. a kind of test device for improving multi-standard multi-path-apparatus testing efficiency according to claim 1, its feature exist In the generation principle of the signal of eight kinds of standards is consistent caused by 8 information source modules, is all to lead to digital baseband signal It is analog baseband signal to cross to the method migration of carrier wave progress phase shift, and analog baseband signal then is converted into radio-frequency modulations letter again Number output.
3. a kind of test device for improving multi-standard multi-path-apparatus testing efficiency according to claim 2, its feature exist In, the single information source module produces circuit used by modulated signal, including:Digital processing unit, and the collection being attached thereto Into circuit, the output end of integrated circuit is divided into two-way, wherein be connected with turn all the way the first digital analog converter, the first wave filter, First frequency mixer, another way are connected with the second digital analog converter, the second wave filter, the second frequency mixer in turn;
Also include first carrier generator, signal synthesizer, the first carrier generator with wherein all the way in described first Frequency mixer connects, and then connects 90 ° of the phase-shifting carrier wave that first carrier generator exports with second frequency mixer in another way Connect, first frequency mixer, the output end of the second frequency mixer are all connected to signal synthesizer;
Also include the 3rd wave filter, three-mixer, the second carrier generator, amplifier, higher order filter, the signal synthesis Device output end connects the 3rd wave filter, the output end of the 3rd wave filter and the output end of second carrier generator It is all connected with the input of three-mixer, the output end connection amplifier of the three-mixer, the output end of the amplifier Higher order filter is connected, the output end of the higher order filter is connected to Devices to test for modulated signal output and corresponds to information source input Port.
4. a kind of test device for improving multi-standard multi-path-apparatus testing efficiency according to claim 1, its feature exist In, higher frequency is produced by phase-locked loop frequency combiner circuit, tunable capacitor is changed by potentiometer knob inside device, with Output stability is high, frequency range is wider, the adjustable modulated signal of amplitude.
5. a kind of test device for improving multi-standard multi-path-apparatus testing efficiency according to claim 1, its feature exist In described device external interface reserves TRIG, PATT TRIG, 10Mhz OUT, EVENT, for the device and other extraneous surveys It is synchronous to try equipment, DEBUG/LAN mouths operate for device maintenance upgrade.
6. a kind of test device for improving multi-standard multi-path-apparatus testing efficiency according to claim 1, its feature exist In the front panel of described device includes waveform selection display screen, functional areas button, the functional areas button, including port selection Button 1-12, frequency select button 1-12, adjustment select button 1-12, amplitude select button 1-12.
7. a kind of test device for improving multi-standard multi-path-apparatus testing efficiency according to claim 1, its feature exist In the rear board of described device includes CDMA ports, DCS ports, the ports 1 of FDD-LTE (U) 1800, the FDD ports of UNICOM 1800 // optional, the ports 2 of FDD-LTE (U) 1800, the FDD ports of UNICOM 1800 // optional, WCDMA ports, TD-SCDMA ports, The ports 1 of FDD-LTE (T) 1800, the FDD ports of telecommunications 1800 // optional, the ports 2 of FDD-LTE (T) 1800, the FDD of telecommunications 1800 Port // optional, the TD-LTE ports optional E/D/F of 1//frequency range, the TD-LTE ports optional E/D/F of 2 // frequency range, FDD- The ports 1 of LTE (T) 2100, the FDD ports of telecommunications 2100 // optional, the ports 2 of FDD-LTE (T) 2100, the FDD ports of telecommunications 2100 // optional, synchronous port EVENT1, synchronous port PATT TRIG, 10MHZ OUT, TRIG OUT, LAN port, DEBUG ends Mouthful, power switch, power input.
CN201710931131.5A 2017-10-09 2017-10-09 A kind of test device for improving multi-standard multi-path-apparatus testing efficiency Pending CN107682076A (en)

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Application publication date: 20180209