BRPI1012070A2 - "dispositivo semicondutor" - Google Patents
"dispositivo semicondutor"Info
- Publication number
- BRPI1012070A2 BRPI1012070A2 BRPI1012070A BRPI1012070A BRPI1012070A2 BR PI1012070 A2 BRPI1012070 A2 BR PI1012070A2 BR PI1012070 A BRPI1012070 A BR PI1012070A BR PI1012070 A BRPI1012070 A BR PI1012070A BR PI1012070 A2 BRPI1012070 A2 BR PI1012070A2
- Authority
- BR
- Brazil
- Prior art keywords
- semiconductor device
- semiconductor
- Prior art date
Links
- 239000004065 semiconductor Substances 0.000 title 1
Classifications
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D86/00—Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D30/00—Field-effect transistors [FET]
- H10D30/60—Insulated-gate field-effect transistors [IGFET]
- H10D30/67—Thin-film transistors [TFT]
- H10D30/6729—Thin-film transistors [TFT] characterised by the electrodes
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D86/00—Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates
- H10D86/40—Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates characterised by multiple TFTs
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D86/00—Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates
- H10D86/40—Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates characterised by multiple TFTs
- H10D86/441—Interconnections, e.g. scanning lines
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D86/00—Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates
- H10D86/40—Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates characterised by multiple TFTs
- H10D86/60—Integrated devices formed in or on insulating or conducting substrates, e.g. formed in silicon-on-insulator [SOI] substrates or on stainless steel or glass substrates characterised by multiple TFTs wherein the TFTs are in active matrices
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D89/00—Aspects of integrated devices not covered by groups H10D84/00 - H10D88/00
- H10D89/60—Integrated devices comprising arrangements for electrical or thermal protection, e.g. protection circuits against electrostatic discharge [ESD]
- H10D89/601—Integrated devices comprising arrangements for electrical or thermal protection, e.g. protection circuits against electrostatic discharge [ESD] for devices having insulated gate electrodes, e.g. for IGFETs or IGBTs
- H10D89/611—Integrated devices comprising arrangements for electrical or thermal protection, e.g. protection circuits against electrostatic discharge [ESD] for devices having insulated gate electrodes, e.g. for IGFETs or IGBTs using diodes as protective elements
-
- G—PHYSICS
- G02—OPTICS
- G02F—OPTICAL DEVICES OR ARRANGEMENTS FOR THE CONTROL OF LIGHT BY MODIFICATION OF THE OPTICAL PROPERTIES OF THE MEDIA OF THE ELEMENTS INVOLVED THEREIN; NON-LINEAR OPTICS; FREQUENCY-CHANGING OF LIGHT; OPTICAL LOGIC ELEMENTS; OPTICAL ANALOGUE/DIGITAL CONVERTERS
- G02F1/00—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics
- G02F1/01—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour
- G02F1/13—Devices or arrangements for the control of the intensity, colour, phase, polarisation or direction of light arriving from an independent light source, e.g. switching, gating or modulating; Non-linear optics for the control of the intensity, phase, polarisation or colour based on liquid crystals, e.g. single liquid crystal display cells
- G02F1/133—Constructional arrangements; Operation of liquid crystal cells; Circuit arrangements
- G02F1/136—Liquid crystal cells structurally associated with a semi-conducting layer or substrate, e.g. cells forming part of an integrated circuit
- G02F1/1362—Active matrix addressed cells
- G02F1/136204—Arrangements to prevent high voltage or static electricity failures
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2009145795 | 2009-06-18 | ||
| PCT/JP2010/059736 WO2010147032A1 (ja) | 2009-06-18 | 2010-06-09 | 半導体装置 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| BRPI1012070A2 true BRPI1012070A2 (pt) | 2018-06-12 |
Family
ID=43356353
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| BRPI1012070A BRPI1012070A2 (pt) | 2009-06-18 | 2010-06-09 | "dispositivo semicondutor" |
Country Status (7)
| Country | Link |
|---|---|
| US (1) | US8921857B2 (pt) |
| EP (1) | EP2445011B1 (pt) |
| JP (1) | JP5406295B2 (pt) |
| CN (1) | CN102804388B (pt) |
| BR (1) | BRPI1012070A2 (pt) |
| RU (1) | RU2501117C2 (pt) |
| WO (1) | WO2010147032A1 (pt) |
Families Citing this family (65)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| WO2010058581A1 (ja) * | 2008-11-20 | 2010-05-27 | シャープ株式会社 | シフトレジスタ |
| WO2010134486A1 (ja) * | 2009-05-20 | 2010-11-25 | シャープ株式会社 | シフトレジスタ |
| US9373414B2 (en) * | 2009-09-10 | 2016-06-21 | Beijing Boe Optoelectronics Technology Co., Ltd. | Shift register unit and gate drive device for liquid crystal display |
| EP2348531B1 (en) * | 2010-01-26 | 2021-05-26 | Samsung Electronics Co., Ltd. | Thin film transistor and method of manufacturing the same |
| KR101838628B1 (ko) * | 2010-03-02 | 2018-03-14 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 펄스 신호 출력 회로 및 시프트 레지스터 |
| DE112011100749B4 (de) * | 2010-03-02 | 2015-06-11 | Semiconductor Energy Laboratory Co., Ltd. | Impulssignal-Ausgangsschaltung und Schieberegister |
| KR101828961B1 (ko) | 2010-03-02 | 2018-02-13 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 펄스 신호 출력 회로 및 시프트 레지스터 |
| TWI415052B (zh) * | 2010-12-29 | 2013-11-11 | Au Optronics Corp | 開關裝置與應用該開關裝置之移位暫存器電路 |
| US8643007B2 (en) * | 2011-02-23 | 2014-02-04 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device |
| JP2012209543A (ja) * | 2011-03-11 | 2012-10-25 | Semiconductor Energy Lab Co Ltd | 半導体装置 |
| KR101537458B1 (ko) * | 2011-04-08 | 2015-07-16 | 샤프 가부시키가이샤 | 반도체 장치 및 표시 장치 |
| JP6076617B2 (ja) * | 2011-05-13 | 2017-02-08 | 株式会社半導体エネルギー研究所 | 表示装置 |
| KR101952570B1 (ko) * | 2011-05-13 | 2019-02-27 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 반도체 장치 및 그 제작 방법 |
| US8718224B2 (en) | 2011-08-05 | 2014-05-06 | Semiconductor Energy Laboratory Co., Ltd. | Pulse signal output circuit and shift register |
| KR20130043063A (ko) * | 2011-10-19 | 2013-04-29 | 가부시키가이샤 한도오따이 에네루기 켄큐쇼 | 반도체 장치 및 반도체 장치의 제작 방법 |
| US8962386B2 (en) * | 2011-11-25 | 2015-02-24 | Semiconductor Energy Laboratory Co., Ltd. | Semiconductor device and method for manufacturing the same |
| TWI493685B (zh) | 2012-02-10 | 2015-07-21 | E Ink Holdings Inc | 主動陣列基板上之靜電防護結構 |
| US9159288B2 (en) * | 2012-03-09 | 2015-10-13 | Apple Inc. | Gate line driver circuit for display element array |
| US9223161B2 (en) * | 2012-04-20 | 2015-12-29 | Sharp Kabushiki Kaisha | Display device |
| US9817032B2 (en) * | 2012-05-23 | 2017-11-14 | Semiconductor Energy Laboratory Co., Ltd. | Measurement device |
| US8704232B2 (en) | 2012-06-12 | 2014-04-22 | Apple Inc. | Thin film transistor with increased doping regions |
| US9065077B2 (en) | 2012-06-15 | 2015-06-23 | Apple, Inc. | Back channel etch metal-oxide thin film transistor and process |
| US8987027B2 (en) | 2012-08-31 | 2015-03-24 | Apple Inc. | Two doping regions in lightly doped drain for thin film transistors and associated doping processes |
| US9685557B2 (en) | 2012-08-31 | 2017-06-20 | Apple Inc. | Different lightly doped drain length control for self-align light drain doping process |
| US8748320B2 (en) | 2012-09-27 | 2014-06-10 | Apple Inc. | Connection to first metal layer in thin film transistor process |
| US8999771B2 (en) | 2012-09-28 | 2015-04-07 | Apple Inc. | Protection layer for halftone process of third metal |
| US9201276B2 (en) | 2012-10-17 | 2015-12-01 | Apple Inc. | Process architecture for color filter array in active matrix liquid crystal display |
| KR101995714B1 (ko) * | 2012-12-28 | 2019-07-04 | 엘지디스플레이 주식회사 | 표시장치 |
| US9001297B2 (en) | 2013-01-29 | 2015-04-07 | Apple Inc. | Third metal layer for thin film transistor with reduced defects in liquid crystal display |
| WO2014132799A1 (ja) * | 2013-02-26 | 2014-09-04 | シャープ株式会社 | 表示装置 |
| US9088003B2 (en) | 2013-03-06 | 2015-07-21 | Apple Inc. | Reducing sheet resistance for common electrode in top emission organic light emitting diode display |
| US9590113B2 (en) * | 2013-03-19 | 2017-03-07 | Applied Materials, Inc. | Multilayer passivation or etch stop TFT |
| KR102046997B1 (ko) * | 2013-04-04 | 2019-11-21 | 삼성디스플레이 주식회사 | 박막 트랜지스터 및 유기 발광 표시 장치 |
| US9287406B2 (en) | 2013-06-06 | 2016-03-15 | Macronix International Co., Ltd. | Dual-mode transistor devices and methods for operating same |
| JP2015109424A (ja) * | 2013-10-22 | 2015-06-11 | 株式会社半導体エネルギー研究所 | 半導体装置、該半導体装置の作製方法、及び該半導体装置に用いるエッチング溶液 |
| US9510454B2 (en) * | 2014-02-28 | 2016-11-29 | Qualcomm Incorporated | Integrated interposer with embedded active devices |
| JP6274968B2 (ja) | 2014-05-16 | 2018-02-07 | ローム株式会社 | 半導体装置 |
| JP5968372B2 (ja) * | 2014-07-17 | 2016-08-10 | 学校法人 龍谷大学 | 磁場センサー |
| JP6459271B2 (ja) * | 2014-07-23 | 2019-01-30 | Tianma Japan株式会社 | イメージセンサ及びその駆動方法 |
| US10276122B2 (en) * | 2014-10-28 | 2019-04-30 | Sharp Kabushiki Kaisha | Unit shift register circuit, shift register circuit, control method for unit shift register circuit, and display device |
| TWI581317B (zh) * | 2014-11-14 | 2017-05-01 | 群創光電股份有限公司 | 薄膜電晶體基板及具備該薄膜電晶體基板之顯示面板 |
| JP6693885B2 (ja) * | 2014-11-20 | 2020-05-13 | 株式会社半導体エネルギー研究所 | 半導体装置 |
| JP2016225587A (ja) * | 2015-05-29 | 2016-12-28 | 株式会社神戸製鋼所 | 酸化物半導体層を含む薄膜トランジスタ |
| JP2017103408A (ja) | 2015-12-04 | 2017-06-08 | 株式会社ジャパンディスプレイ | 表示装置 |
| KR102474698B1 (ko) * | 2015-12-30 | 2022-12-05 | 엘지디스플레이 주식회사 | 게이트 드라이버 및 이를 포함하는 액정표시장치 |
| CN105609138A (zh) * | 2016-01-04 | 2016-05-25 | 京东方科技集团股份有限公司 | 一种移位寄存器、栅极驱动电路、显示面板及显示装置 |
| CN105552134A (zh) * | 2016-01-20 | 2016-05-04 | 中国科学院物理研究所 | 场效应二极管 |
| WO2017150443A1 (ja) * | 2016-03-02 | 2017-09-08 | シャープ株式会社 | アクティブマトリクス基板、およびアクティブマトリクス基板を備えた液晶表示装置 |
| CN205621414U (zh) * | 2016-04-26 | 2016-10-05 | 京东方科技集团股份有限公司 | 静电放电电路、阵列基板和显示装置 |
| JP2017212295A (ja) * | 2016-05-24 | 2017-11-30 | 東芝メモリ株式会社 | 半導体装置 |
| CN109314317B (zh) * | 2016-06-10 | 2020-10-23 | 夏普株式会社 | 扫描天线 |
| CN106959562B (zh) * | 2017-05-09 | 2021-01-08 | 惠科股份有限公司 | 一种显示面板 |
| JP7064309B2 (ja) * | 2017-10-20 | 2022-05-10 | 株式会社ジャパンディスプレイ | ダイオード、トランジスタ、およびこれらを有する表示装置 |
| JP6600017B2 (ja) * | 2018-01-09 | 2019-10-30 | ローム株式会社 | 半導体装置 |
| WO2019157865A1 (zh) * | 2018-02-14 | 2019-08-22 | 京东方科技集团股份有限公司 | 移位寄存器单元、栅极驱动电路、显示装置及驱动方法 |
| US11398542B2 (en) * | 2018-03-26 | 2022-07-26 | Sharp Kabushiki Kaisha | Method for manufacturing display device and display device including ESD countermeasure |
| WO2019234893A1 (ja) * | 2018-06-07 | 2019-12-12 | 堺ディスプレイプロダクト株式会社 | 薄膜トランジスタおよびその製造方法 |
| WO2019234892A1 (ja) * | 2018-06-07 | 2019-12-12 | 堺ディスプレイプロダクト株式会社 | 薄膜トランジスタおよびその製造方法 |
| WO2019234891A1 (ja) * | 2018-06-07 | 2019-12-12 | 堺ディスプレイプロダクト株式会社 | 薄膜トランジスタおよびその製造方法 |
| US20210234048A1 (en) * | 2018-06-07 | 2021-07-29 | Sakai Display Products Corporation | Thin-film transistor and manufacturing method therefor |
| WO2020116263A1 (ja) * | 2018-12-04 | 2020-06-11 | 日立オートモティブシステムズ株式会社 | 半導体装置およびそれを用いた車載用電子制御装置 |
| KR102840163B1 (ko) * | 2020-08-25 | 2025-07-29 | 엘지디스플레이 주식회사 | 디스플레이 장치 |
| CN113437099B (zh) * | 2021-05-13 | 2023-10-31 | 北京大学深圳研究生院 | 光电探测器及其制造方法及相应的光电探测方法 |
| CN115881716A (zh) * | 2021-09-28 | 2023-03-31 | 美垦半导体技术有限公司 | 功率器件 |
| CN115951512B (zh) * | 2022-12-28 | 2025-07-15 | 广州华星光电半导体显示技术有限公司 | 显示面板 |
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| JPS6179259A (ja) * | 1984-09-26 | 1986-04-22 | Seiko Instr & Electronics Ltd | 薄膜トランジスタ装置 |
| JPS63220289A (ja) | 1987-03-10 | 1988-09-13 | 日本電気株式会社 | 薄膜トランジスタアレイ |
| JPH01218070A (ja) * | 1988-02-26 | 1989-08-31 | Matsushita Electron Corp | Mosトランジスタ |
| JPH05304171A (ja) | 1992-04-27 | 1993-11-16 | Toshiba Corp | 薄膜トランジスタ |
| JP3429034B2 (ja) | 1992-10-07 | 2003-07-22 | シャープ株式会社 | 半導体膜の製造方法 |
| EP0592227A3 (en) | 1992-10-07 | 1995-01-11 | Sharp Kk | Manufacture of a thin film transistor and production of a liquid crystal display device. |
| GB9226890D0 (en) | 1992-12-23 | 1993-02-17 | Philips Electronics Uk Ltd | An imaging device |
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| JPH0887893A (ja) | 1994-09-19 | 1996-04-02 | Fujitsu Ltd | 半導体記憶装置 |
| JP3090081B2 (ja) * | 1997-03-12 | 2000-09-18 | 日本電気株式会社 | 半導体装置 |
| TW405243B (en) * | 1998-02-25 | 2000-09-11 | Koninkl Philips Electronics Nv | Semiconductor device comprising a mos transistor |
| JP2001028424A (ja) * | 1999-07-13 | 2001-01-30 | Sanyo Electric Co Ltd | 半導体装置とその製造方法 |
| JP4089858B2 (ja) | 2000-09-01 | 2008-05-28 | 国立大学法人東北大学 | 半導体デバイス |
| KR100752602B1 (ko) * | 2001-02-13 | 2007-08-29 | 삼성전자주식회사 | 쉬프트 레지스터와, 이를 이용한 액정 표시 장치 |
| JP3989763B2 (ja) * | 2002-04-15 | 2007-10-10 | 株式会社半導体エネルギー研究所 | 半導体表示装置 |
| JP2005142494A (ja) * | 2003-11-10 | 2005-06-02 | Toshiba Corp | 半導体集積回路 |
| JP4207858B2 (ja) * | 2004-07-05 | 2009-01-14 | セイコーエプソン株式会社 | 半導体装置、表示装置及び電子機器 |
| TWI271847B (en) * | 2004-12-08 | 2007-01-21 | Au Optronics Corp | Electrostatic discharge protection circuit and method of electrostatic discharge protection |
| US7746299B2 (en) * | 2005-01-31 | 2010-06-29 | Toshiba Matsushita Display Technology Co., Ltd. | Display, array substrate, and method of driving display |
| JP4987309B2 (ja) | 2005-02-04 | 2012-07-25 | セイコーインスツル株式会社 | 半導体集積回路装置とその製造方法 |
| US7687327B2 (en) * | 2005-07-08 | 2010-03-30 | Kovio, Inc, | Methods for manufacturing RFID tags and structures formed therefrom |
| RU2308146C2 (ru) * | 2005-12-13 | 2007-10-10 | Общество с ограниченной ответственностью "Юник Ай Сиз" | Устройство защиты выводов интегральных схем со структурой мдп от электростатических разрядов |
| KR101404542B1 (ko) * | 2006-05-25 | 2014-06-09 | 삼성디스플레이 주식회사 | 액정 표시 장치 |
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| JP2008140489A (ja) | 2006-12-04 | 2008-06-19 | Seiko Epson Corp | シフトレジスタ、走査線駆動回路、データ線駆動回路、電気光学装置及び電子機器 |
| JP2008297297A (ja) | 2007-06-04 | 2008-12-11 | Hoyu Co Ltd | 毛髪処理用組成物 |
| JP5317712B2 (ja) * | 2008-01-22 | 2013-10-16 | 株式会社半導体エネルギー研究所 | 半導体装置及び半導体装置の作製方法 |
| KR101529575B1 (ko) * | 2008-09-10 | 2015-06-29 | 삼성전자주식회사 | 트랜지스터, 이를 포함하는 인버터 및 이들의 제조방법 |
| WO2010058581A1 (ja) | 2008-11-20 | 2010-05-27 | シャープ株式会社 | シフトレジスタ |
| WO2010095401A1 (ja) * | 2009-02-19 | 2010-08-26 | シャープ株式会社 | 半導体装置および表示装置 |
-
2010
- 2010-06-09 WO PCT/JP2010/059736 patent/WO2010147032A1/ja not_active Ceased
- 2010-06-09 JP JP2011519742A patent/JP5406295B2/ja not_active Expired - Fee Related
- 2010-06-09 BR BRPI1012070A patent/BRPI1012070A2/pt not_active IP Right Cessation
- 2010-06-09 US US13/378,375 patent/US8921857B2/en active Active
- 2010-06-09 RU RU2012101613/28A patent/RU2501117C2/ru not_active IP Right Cessation
- 2010-06-09 EP EP10789407.3A patent/EP2445011B1/en active Active
- 2010-06-09 CN CN201080027155.4A patent/CN102804388B/zh not_active Expired - Fee Related
Also Published As
| Publication number | Publication date |
|---|---|
| RU2501117C2 (ru) | 2013-12-10 |
| RU2012101613A (ru) | 2013-07-27 |
| EP2445011A1 (en) | 2012-04-25 |
| EP2445011A4 (en) | 2013-07-24 |
| JPWO2010147032A1 (ja) | 2012-12-06 |
| JP5406295B2 (ja) | 2014-02-05 |
| WO2010147032A1 (ja) | 2010-12-23 |
| US8921857B2 (en) | 2014-12-30 |
| CN102804388A (zh) | 2012-11-28 |
| US20120087460A1 (en) | 2012-04-12 |
| EP2445011B1 (en) | 2018-01-10 |
| CN102804388B (zh) | 2016-08-03 |
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| B350 | Update of information on the portal [chapter 15.35 patent gazette] |