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BRPI0406196A - Retentor de amostra para análise de fluorescência por raios-x, método para analisar a fluorescência por raios-x, e, espectrÈmetro de fluorescência por raios-x - Google Patents

Retentor de amostra para análise de fluorescência por raios-x, método para analisar a fluorescência por raios-x, e, espectrÈmetro de fluorescência por raios-x

Info

Publication number
BRPI0406196A
BRPI0406196A BR0406196-9A BRPI0406196A BRPI0406196A BR PI0406196 A BRPI0406196 A BR PI0406196A BR PI0406196 A BRPI0406196 A BR PI0406196A BR PI0406196 A BRPI0406196 A BR PI0406196A
Authority
BR
Brazil
Prior art keywords
ray fluorescence
sample
liquid sample
sample retainer
liquid
Prior art date
Application number
BR0406196-9A
Other languages
English (en)
Inventor
Takao Moriyama
Michiko Inoue
Original Assignee
Rigaku Ind Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Rigaku Ind Corp filed Critical Rigaku Ind Corp
Publication of BRPI0406196A publication Critical patent/BRPI0406196A/pt
Publication of BRPI0406196B1 publication Critical patent/BRPI0406196B1/pt

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
    • G01N23/22—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material
    • G01N23/223—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by measuring secondary emission from the material by irradiating the sample with X-rays or gamma-rays and by measuring X-ray fluorescence
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N2223/00—Investigating materials by wave or particle radiation
    • G01N2223/07—Investigating materials by wave or particle radiation secondary emission
    • G01N2223/076—X-ray fluorescence

Landscapes

  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)
  • Sampling And Sample Adjustment (AREA)

Abstract

"RETENTOR DE AMOSTRA PARA ANáLISE DE FLUORESCêNCIA POR RAIOS-X, MéTODO PARA ANALISAR A FLUORESCêNCIA POR RAIOS-X, E, ESPECTRÈMETRO DE FLUORESCêNCIA POR RAIOS-X". Um retentor de amostra para análise de fluorescência por raios-X é utilizado no pré-tratamento de uma amostra líquida e na realização análise de fluorescência por raios-X do componente contido. O fundo é suprimido e o limite de detecção pode ser melhorado de forma suficiente pela geração de raios-X fluorescentes de uma intensidade elevada sejam emitidos de maneira uniforme. O retentor de amostra (5) utilizado no pré-tratamento de uma amostra líquida (1) e na realização análise de fluorescência por raios-X do componente contido compreende um pedestal em forma de anel (2); um filme hidrofóbico (3) de uma espessura menor do que 10 <109>m e que tem uma porção periférica (3a) mantida pelo pedestal (2) e também tendo uma porção transmissora de raios-X (3b), e um elemento tipo folha absorvedor de líquido (4) de espessura de 1 a 100 <109>m aplicado à porção de transmissão (3b) do filme hidrofóbico (3). A amostra líquida (1) é distribuída em gotas sobre o elemento absorvedor de líquido (4) e secada, conseq³entemente retendo o componente contido.
BRPI0406196-9A 2003-08-01 2004-03-31 Retentor de amostra para análise de fluorescência por raios-x, método para analisar a fluorescência por raios-x, e, espectrômetro de fluorescência por raios-x BRPI0406196B1 (pt)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2003-285041 2003-08-01
JP2003285041 2003-08-01
PCT/JP2004/004736 WO2005012889A1 (ja) 2003-08-01 2004-03-31 蛍光ｘ線分析用試料保持具ならびにそれを用いる蛍光ｘ線分析方法および装置

Publications (2)

Publication Number Publication Date
BRPI0406196A true BRPI0406196A (pt) 2005-08-09
BRPI0406196B1 BRPI0406196B1 (pt) 2015-09-01

Family

ID=34113861

Family Applications (1)

Application Number Title Priority Date Filing Date
BRPI0406196-9A BRPI0406196B1 (pt) 2003-08-01 2004-03-31 Retentor de amostra para análise de fluorescência por raios-x, método para analisar a fluorescência por raios-x, e, espectrômetro de fluorescência por raios-x

Country Status (10)

Country Link
US (1) US7016463B2 (pt)
EP (1) EP1650559B1 (pt)
JP (1) JP3793829B2 (pt)
KR (1) KR100713742B1 (pt)
CN (1) CN100552443C (pt)
AT (1) ATE373820T1 (pt)
BR (1) BRPI0406196B1 (pt)
DE (1) DE602004009082T2 (pt)
RU (1) RU2308024C2 (pt)
WO (1) WO2005012889A1 (pt)

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DE102007039000B4 (de) * 2007-05-21 2009-01-22 Terrachem Gmbh Analysenlabor Verfahren für die Probenpräparation flüssiger oder pastöser Stoffe zur Messung mittels Röntgenfluoreszenz und dafür geeigneter Probenkörper
JP5059520B2 (ja) * 2007-08-27 2012-10-24 株式会社リガク 試料乾燥装置
JP4838821B2 (ja) * 2008-03-18 2011-12-14 株式会社リガク 蛍光ｘ線分析用試料保持具ならびにそれを用いる蛍光ｘ線分析方法および装置
JP5938708B2 (ja) * 2011-10-17 2016-06-22 株式会社リガク 蛍光ｘ線分析用の較正試料ならびにそれを備える蛍光ｘ線分析装置およびそれを用いる蛍光ｘ線分析方法
JP2015152388A (ja) * 2014-02-13 2015-08-24 株式会社日立ハイテクサイエンス Ｘ線分析用サンプルホルダ及びサンプル設置用治具
JP6498491B2 (ja) * 2015-03-27 2019-04-10 中部電力株式会社 溶液中に含まれる金属成分の簡易濃度分析方法
EP3078964B1 (en) * 2015-04-09 2017-05-24 Honeywell International Inc. Relative humidity sensor and method
JP2016223836A (ja) * 2015-05-28 2016-12-28 王子ホールディングス株式会社 高塩試料中の金属の分析方法
CN104880477B (zh) * 2015-06-19 2017-12-01 金川集团股份有限公司 一种混合铜精矿多元素的x荧光联测分析法
JP6421724B2 (ja) * 2015-08-27 2018-11-14 住友金属鉱山株式会社 蛍光ｘ線分析装置を用いた試料溶液の定量分析方法
JP6746436B2 (ja) * 2016-08-30 2020-08-26 日本電子株式会社 分析方法
CN106338534B (zh) * 2016-09-13 2019-04-12 中钢集团马鞍山矿山研究院有限公司 采用x射线荧光光谱仪快速测定萤石中氟化钙含量的方法
CN106290438B (zh) * 2016-09-13 2019-04-12 中钢集团马鞍山矿山研究院有限公司 一种x射线荧光光谱熔融法测定萤石中氟化钙含量的方法
SE540371C2 (en) * 2017-02-06 2018-08-21 Orexplore Ab A sample holder for holding a drill core sample or drill cuttings, an apparatus and system comprising the holder
KR101921726B1 (ko) * 2017-03-07 2019-02-13 가부시키가이샤 리가쿠 시료 회수 장치, 시료 회수 방법 및 이들을 이용한 형광 x선 분석 장치
CN108709901B (zh) * 2018-08-10 2025-01-07 中国原子能科学研究院 一种用于全反射x光荧光光谱仪直接测量滤膜载大气颗粒的压环装置
KR102470128B1 (ko) * 2019-05-15 2022-11-22 주식회사 엘지화학 전지의 xrd 측정용 스테이지 장치
RU205232U1 (ru) * 2020-12-03 2021-07-05 Федеральное государственное бюджетное образовательное учреждение высшего образования «Московский государственный университет имени М.В.Ломоносова» (МГУ) Держатель образцов для регистрации спектров рентгеновского поглощения в инертной атмосфере
RU203691U1 (ru) * 2020-12-25 2021-04-15 федеральное государственное автономное образовательное учреждение высшего образования "Санкт-Петербургский политехнический университет Петра Великого" (ФГАОУ ВО "СПбПУ") Держатель образца для проведения рентгеноструктурных измерений в широком температурном диапазоне, с возможностью одновременного приложения к образцу одноосной деформации растяжения и электрического поля
RU205420U1 (ru) * 2020-12-30 2021-07-14 Федеральное государственное бюджетное образовательное учреждение высшего образования "Московский государственный университет имени М.В.Ломоносова" (МГУ) Держатель образцов для регистрации спектров рентгеновского поглощения в инертной атмосфере
CN113447510B (zh) * 2021-06-25 2022-07-05 宁夏大学 一种水质中微量元素含量的原位连续检测装置
CN115931942A (zh) * 2022-12-08 2023-04-07 中国铝业股份有限公司 一种x射线荧光光谱测定样品及其制备方法
JP7716116B2 (ja) * 2023-03-31 2025-07-31 株式会社リガク 試料パウチセル及び蛍光ｘ線分析方法
CN116626006A (zh) * 2023-06-02 2023-08-22 杭州奥盛仪器有限公司 样本检测分析装置及方法

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Also Published As

Publication number Publication date
EP1650559B1 (en) 2007-09-19
RU2005110658A (ru) 2005-09-10
US20050232393A1 (en) 2005-10-20
EP1650559A4 (en) 2006-08-23
WO2005012889A1 (ja) 2005-02-10
CN1820195A (zh) 2006-08-16
RU2308024C2 (ru) 2007-10-10
JP3793829B2 (ja) 2006-07-05
ATE373820T1 (de) 2007-10-15
KR100713742B1 (ko) 2007-05-02
JPWO2005012889A1 (ja) 2006-09-21
EP1650559A1 (en) 2006-04-26
CN100552443C (zh) 2009-10-21
KR20060002731A (ko) 2006-01-09
US7016463B2 (en) 2006-03-21
BRPI0406196B1 (pt) 2015-09-01
DE602004009082D1 (de) 2007-10-31
DE602004009082T2 (de) 2008-01-24

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Legal Events

Date Code Title Description
B25A Requested transfer of rights approved

Owner name: RIGAKU CORPORATION (JP)

Free format text: TRANSFERIDO POR FUSAO DE: RIGAKU INDUSTRIAL CORPORATION

B06A Patent application procedure suspended [chapter 6.1 patent gazette]
B09A Decision: intention to grant [chapter 9.1 patent gazette]
B16A Patent or certificate of addition of invention granted [chapter 16.1 patent gazette]

Free format text: PRAZO DE VALIDADE: 10 (DEZ) ANOS CONTADOS A PARTIR DE 01/09/2015, OBSERVADAS AS CONDICOES LEGAIS.

B21F Lapse acc. art. 78, item iv - on non-payment of the annual fees in time

Free format text: REFERENTE A 15A ANUIDADE.

B24J Lapse because of non-payment of annual fees (definitively: art 78 iv lpi, resolution 113/2013 art. 12)

Free format text: EM VIRTUDE DA EXTINCAO PUBLICADA NA RPI 2508 DE 29-01-2019 E CONSIDERANDO AUSENCIA DE MANIFESTACAO DENTRO DOS PRAZOS LEGAIS, INFORMO QUE CABE SER MANTIDA A EXTINCAO DA PATENTE E SEUS CERTIFICADOS, CONFORME O DISPOSTO NO ARTIGO 12, DA RESOLUCAO 113/2013.