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AU2003286421A1 - Polishing method - Google Patents

Polishing method

Info

Publication number
AU2003286421A1
AU2003286421A1 AU2003286421A AU2003286421A AU2003286421A1 AU 2003286421 A1 AU2003286421 A1 AU 2003286421A1 AU 2003286421 A AU2003286421 A AU 2003286421A AU 2003286421 A AU2003286421 A AU 2003286421A AU 2003286421 A1 AU2003286421 A1 AU 2003286421A1
Authority
AU
Australia
Prior art keywords
polishing method
polishing
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
Application number
AU2003286421A
Inventor
Hiroshi Biwata
Mikihiko Masaki
Nobuyuki Takahashi
Hiroomi Torii
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Ebara Corp
Original Assignee
Ebara Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Ebara Corp filed Critical Ebara Corp
Publication of AU2003286421A1 publication Critical patent/AU2003286421A1/en
Abandoned legal-status Critical Current

Links

Classifications

    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24BMACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B37/00Lapping machines or devices; Accessories
    • B24B37/27Work carriers
    • B24B37/30Work carriers for single side lapping of plane surfaces
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10PGENERIC PROCESSES OR APPARATUS FOR THE MANUFACTURE OR TREATMENT OF DEVICES COVERED BY CLASS H10
    • H10P52/00Grinding, lapping or polishing of wafers, substrates or parts of devices
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B24GRINDING; POLISHING
    • B24BMACHINES, DEVICES, OR PROCESSES FOR GRINDING OR POLISHING; DRESSING OR CONDITIONING OF ABRADING SURFACES; FEEDING OF GRINDING, POLISHING, OR LAPPING AGENTS
    • B24B37/00Lapping machines or devices; Accessories
    • B24B37/04Lapping machines or devices; Accessories designed for working plane surfaces
    • B24B37/042Lapping machines or devices; Accessories designed for working plane surfaces operating processes therefor

Landscapes

  • Engineering & Computer Science (AREA)
  • Mechanical Engineering (AREA)
  • Finish Polishing, Edge Sharpening, And Grinding By Specific Grinding Devices (AREA)
  • Mechanical Treatment Of Semiconductor (AREA)
AU2003286421A 2002-12-10 2003-12-03 Polishing method Abandoned AU2003286421A1 (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2002-358771 2002-12-10
JP2002358771A JP2004193289A (en) 2002-12-10 2002-12-10 Polishing method
PCT/JP2003/015460 WO2004053966A1 (en) 2002-12-10 2003-12-03 Polishing method

Publications (1)

Publication Number Publication Date
AU2003286421A1 true AU2003286421A1 (en) 2004-06-30

Family

ID=32500909

Family Applications (1)

Application Number Title Priority Date Filing Date
AU2003286421A Abandoned AU2003286421A1 (en) 2002-12-10 2003-12-03 Polishing method

Country Status (8)

Country Link
US (1) US20050054272A1 (en)
EP (1) EP1595281A1 (en)
JP (1) JP2004193289A (en)
KR (1) KR20050084767A (en)
CN (1) CN1685482A (en)
AU (1) AU2003286421A1 (en)
TW (1) TW200420380A (en)
WO (1) WO2004053966A1 (en)

Families Citing this family (14)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2005268566A (en) * 2004-03-19 2005-09-29 Ebara Corp Head structure of substrate holding mechanism of chemical mechanical polishing device
JP4787063B2 (en) * 2005-12-09 2011-10-05 株式会社荏原製作所 Polishing apparatus and polishing method
JP5248127B2 (en) * 2008-01-30 2013-07-31 株式会社荏原製作所 Polishing method and polishing apparatus
JP5336799B2 (en) * 2008-09-24 2013-11-06 東京エレクトロン株式会社 Chemical mechanical polishing apparatus, chemical mechanical polishing method and control program
US8939815B2 (en) * 2011-02-21 2015-01-27 Taiwan Semiconductor Manufacturing Company, Ltd. Systems providing an air zone for a chucking stage
JP5697207B2 (en) * 2011-04-19 2015-04-08 浜井産業株式会社 Double-side polishing apparatus and polishing method
TWI613037B (en) 2011-07-19 2018-02-01 荏原製作所股份有限公司 Honing method
US9308622B2 (en) * 2013-10-18 2016-04-12 Seagate Technology Llc Lapping head with a sensor device on the rotating lapping head
US9744642B2 (en) 2013-10-29 2017-08-29 Taiwan Semiconductor Manufacturing Co., Ltd. Slurry feed system and method of providing slurry to chemical mechanical planarization station
JP6882017B2 (en) * 2017-03-06 2021-06-02 株式会社荏原製作所 Polishing method, polishing equipment, and substrate processing system
US10593603B2 (en) * 2018-03-16 2020-03-17 Sandisk Technologies Llc Chemical mechanical polishing apparatus containing hydraulic multi-chamber bladder and method of using thereof
CN112792735B (en) * 2021-01-20 2022-04-05 北京科技大学 Clamp for inhibiting generation and expansion of grinding and polishing cracks of diamond film and using method
JP2023086404A (en) * 2021-12-10 2023-06-22 株式会社荏原製作所 Substrate cleaning equipment and substrate polishing equipment
CN117549211A (en) * 2023-12-26 2024-02-13 山东有研艾斯半导体材料有限公司 Edge polishing method for improving edge liquid marks of silicon wafer

Family Cites Families (12)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPH07201786A (en) * 1994-01-05 1995-08-04 Sumitomo Electric Ind Ltd Polishing method and polishing apparatus for compound semiconductor substrate
JPH08267357A (en) * 1995-03-31 1996-10-15 Nec Corp Abrasive device of substrate and abrasive method thereof
JP3705670B2 (en) * 1997-02-19 2005-10-12 株式会社荏原製作所 Polishing apparatus and method
US5957751A (en) * 1997-05-23 1999-09-28 Applied Materials, Inc. Carrier head with a substrate detection mechanism for a chemical mechanical polishing system
US6398621B1 (en) * 1997-05-23 2002-06-04 Applied Materials, Inc. Carrier head with a substrate sensor
JPH11254311A (en) * 1998-03-09 1999-09-21 Super Silicon Kenkyusho:Kk Method of preventing breakage of thin work during polishing
US6132294A (en) * 1998-09-28 2000-10-17 Siemens Aktiengesellschaft Method of enhancing semiconductor wafer release
JP2001023939A (en) * 1999-07-07 2001-01-26 Seiko Epson Corp Polishing method and method for manufacturing semiconductor device
US6663466B2 (en) * 1999-11-17 2003-12-16 Applied Materials, Inc. Carrier head with a substrate detector
JP2001334458A (en) * 2000-05-26 2001-12-04 Ebara Corp Polishing method
JP2002252190A (en) * 2001-02-22 2002-09-06 Toshiba Corp Semiconductor substrate polishing method and semiconductor substrate polishing apparatus
US6905392B2 (en) * 2003-06-30 2005-06-14 Freescale Semiconductor, Inc. Polishing system having a carrier head with substrate presence sensing

Also Published As

Publication number Publication date
KR20050084767A (en) 2005-08-29
WO2004053966A1 (en) 2004-06-24
JP2004193289A (en) 2004-07-08
US20050054272A1 (en) 2005-03-10
CN1685482A (en) 2005-10-19
TW200420380A (en) 2004-10-16
EP1595281A1 (en) 2005-11-16

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Legal Events

Date Code Title Description
MK6 Application lapsed section 142(2)(f)/reg. 8.3(3) - pct applic. not entering national phase