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AU2002239275A1 - Tapped delay line high speed register - Google Patents

Tapped delay line high speed register

Info

Publication number
AU2002239275A1
AU2002239275A1 AU2002239275A AU3927502A AU2002239275A1 AU 2002239275 A1 AU2002239275 A1 AU 2002239275A1 AU 2002239275 A AU2002239275 A AU 2002239275A AU 3927502 A AU3927502 A AU 3927502A AU 2002239275 A1 AU2002239275 A1 AU 2002239275A1
Authority
AU
Australia
Prior art keywords
high speed
delay line
tapped delay
line high
speed register
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
Application number
AU2002239275A
Inventor
John J. Drinkard
Galen Knode
Ed Oltman
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Omron Scientific Technologies Inc
Original Assignee
Scientific Technologies Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Scientific Technologies Inc filed Critical Scientific Technologies Inc
Publication of AU2002239275A1 publication Critical patent/AU2002239275A1/en
Abandoned legal-status Critical Current

Links

Classifications

    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R13/00Arrangements for displaying electric variables or waveforms
    • G01R13/20Cathode-ray oscilloscopes
    • G01R13/22Circuits therefor
    • G01R13/34Circuits for representing a single waveform by sampling, e.g. for very high frequencies
    • G01R13/345Circuits for representing a single waveform by sampling, e.g. for very high frequencies for displaying sampled signals by using digital processors by intermediate A.D. and D.A. convertors (control circuits for CRT indicators)
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2851Testing of integrated circuits [IC]
    • G01R31/2882Testing timing characteristics
    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28Testing of electronic circuits, e.g. by signal tracer
    • G01R31/30Marginal testing, e.g. by varying supply voltage
    • G01R31/3016Delay or race condition test, e.g. race hazard test

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Optical Radar Systems And Details Thereof (AREA)
  • Measurement Of Unknown Time Intervals (AREA)
AU2002239275A 2000-11-28 2001-11-20 Tapped delay line high speed register Abandoned AU2002239275A1 (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US09/728,567 2000-11-28
US09/728,567 US6493653B1 (en) 2000-11-28 2000-11-28 Tapped delay line high speed register
PCT/US2001/043290 WO2002045213A2 (en) 2000-11-28 2001-11-20 Tapped delay line high speed register

Publications (1)

Publication Number Publication Date
AU2002239275A1 true AU2002239275A1 (en) 2002-06-11

Family

ID=24927375

Family Applications (1)

Application Number Title Priority Date Filing Date
AU2002239275A Abandoned AU2002239275A1 (en) 2000-11-28 2001-11-20 Tapped delay line high speed register

Country Status (5)

Country Link
US (1) US6493653B1 (en)
EP (1) EP1397699B1 (en)
AU (1) AU2002239275A1 (en)
ES (1) ES2441205T3 (en)
WO (1) WO2002045213A2 (en)

Families Citing this family (28)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7839178B2 (en) * 2002-08-20 2010-11-23 Seagate Technology Llc High speed digital phase/frequency comparator for phase locked loops
US7020567B2 (en) * 2002-10-31 2006-03-28 Finisar Corporation System and method of measuring a signal propagation delay
US7961559B2 (en) * 2003-11-13 2011-06-14 International Business Machines Corporation Duty cycle measurement circuit for measuring and maintaining balanced clock duty cycle
US7400555B2 (en) * 2003-11-13 2008-07-15 International Business Machines Corporation Built in self test circuit for measuring total timing uncertainty in a digital data path
US20070103141A1 (en) * 2003-11-13 2007-05-10 International Business Machines Corporation Duty cycle measurment circuit for measuring and maintaining balanced clock duty cycle
US6933754B2 (en) * 2003-11-13 2005-08-23 International Business Machines Corp. Clock gated power supply noise compensation
DE102004022911B4 (en) * 2004-05-10 2012-03-01 Sick Ag signal sampling
DE102004022912A1 (en) * 2004-05-10 2005-12-08 Ibeo Automobile Sensor Gmbh Method and device for distance measurement
EP1882959A1 (en) * 2006-07-17 2008-01-30 Leica Geosystems AG Optical distance measuring method and corresponding optical range finder
US7593831B2 (en) * 2006-08-04 2009-09-22 Agere Systems Inc. Method and apparatus for testing delay lines
DE102006049935B4 (en) * 2006-10-19 2009-12-17 Ingenieurbüro Spies GbR (vertretungsberechtigte Gesellschafter: Hans Spies, Martin Spies, 86558 Hohenwart) Pulse propagation time sensor
US7965384B2 (en) * 2007-09-27 2011-06-21 Omron Scientific Technologies, Inc. Clutter rejection in active object detection systems
FI20085665A0 (en) 2008-06-27 2008-06-27 Oulun Yliopisto Method and apparatus for measuring distance
US8300284B2 (en) * 2008-10-22 2012-10-30 Omron Scientific Technologies, Inc. Apparatus and method for pattern-based configuration of optical sensing systems
DE102009015832B4 (en) 2009-04-01 2023-09-28 HELLA GmbH & Co. KGaA Distance measuring device and method for carrying out distance measurements using the same
KR102123196B1 (en) 2011-09-13 2020-06-16 오에스아이 옵토일렉트로닉스 Improved laser rangefinder sensor
CN103488074B (en) * 2013-09-13 2016-02-10 电子科技大学 A kind of amplitude variation signal transit time measurement device
DE102015103472B4 (en) 2015-03-10 2021-07-15 Sick Ag Distance measuring sensor and method for detecting and determining the distance of objects
US9872346B2 (en) 2015-05-15 2018-01-16 Cypress Semiconductor Corporation Phase controller apparatus and methods
US10591600B2 (en) 2015-11-30 2020-03-17 Luminar Technologies, Inc. Lidar system with distributed laser and multiple sensor heads
US10545240B2 (en) 2017-03-28 2020-01-28 Luminar Technologies, Inc. LIDAR transmitter and detector system using pulse encoding to reduce range ambiguity
US10007001B1 (en) 2017-03-28 2018-06-26 Luminar Technologies, Inc. Active short-wave infrared four-dimensional camera
CN107144780B (en) * 2017-06-30 2019-10-11 上海华虹宏力半导体制造有限公司 ATE power supply test channel expansion structure and its test application method
CN110809722B (en) 2017-07-20 2023-05-26 深圳市大疆创新科技有限公司 System and method for optical distance measurement
KR102266456B1 (en) * 2019-07-24 2021-07-14 현대모비스 주식회사 Lidar system and signal processing method thereof
CN113467220B (en) * 2021-07-06 2023-04-07 北京合锐赛尔电力科技股份有限公司 Laser time setting device, method and system for fault indicator
CN115856852A (en) * 2022-11-30 2023-03-28 苏州匾福光电科技有限责任公司 Laser communication ranging method, device and system
CN116300377B (en) * 2023-03-06 2023-09-08 深圳市镭神智能系统有限公司 Time-to-digital converter and laser radar

Family Cites Families (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US5317219A (en) 1991-09-30 1994-05-31 Data Delay Devices, Inc. Compensated digital delay circuit
US5552878A (en) * 1994-11-03 1996-09-03 Mcdonnell Douglas Corporation Electronic vernier for laser range finder
US6108071A (en) * 1997-12-12 2000-08-22 Laser Atlanta Speed and position measurement system
US6137566A (en) * 1999-02-24 2000-10-24 Eoo, Inc. Method and apparatus for signal processing in a laser radar receiver

Also Published As

Publication number Publication date
EP1397699A2 (en) 2004-03-17
EP1397699B1 (en) 2013-10-09
ES2441205T3 (en) 2014-02-03
US6493653B1 (en) 2002-12-10
WO2002045213A2 (en) 2002-06-06
WO2002045213A3 (en) 2003-12-24

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