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AU2001289124A1 - A testing device for semiconductor components and a method of using the device - Google Patents

A testing device for semiconductor components and a method of using the device

Info

Publication number
AU2001289124A1
AU2001289124A1 AU2001289124A AU8912401A AU2001289124A1 AU 2001289124 A1 AU2001289124 A1 AU 2001289124A1 AU 2001289124 A AU2001289124 A AU 2001289124A AU 8912401 A AU8912401 A AU 8912401A AU 2001289124 A1 AU2001289124 A1 AU 2001289124A1
Authority
AU
Australia
Prior art keywords
semiconductor components
testing device
testing
semiconductor
components
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
Application number
AU2001289124A
Inventor
Roy Russell Brown
Jeffrey S. Hughes
Mark D. Norris
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Motorola Solutions Inc
Original Assignee
Motorola Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Motorola Inc filed Critical Motorola Inc
Publication of AU2001289124A1 publication Critical patent/AU2001289124A1/en
Abandoned legal-status Critical Current

Links

Classifications

    • H10P72/7402—
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/282—Testing of electronic circuits specially adapted for particular applications not provided for elsewhere
    • G01R31/2831—Testing of materials or semi-finished products, e.g. semiconductor wafers or substrates
    • H10P72/78—
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R1/00—Details of instruments or arrangements of the types included in groups G01R5/00 - G01R13/00 and G01R31/00
    • G01R1/02—General constructional details
    • G01R1/04—Housings; Supporting members; Arrangements of terminals
    • H10P72/7416—

Landscapes

  • Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • General Engineering & Computer Science (AREA)
  • Condensed Matter Physics & Semiconductors (AREA)
  • Manufacturing & Machinery (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Power Engineering (AREA)
  • Testing Or Measuring Of Semiconductors Or The Like (AREA)
  • Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
AU2001289124A 2000-09-29 2001-09-18 A testing device for semiconductor components and a method of using the device Abandoned AU2001289124A1 (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
US09675994 2000-09-29
US09/675,994 US6541989B1 (en) 2000-09-29 2000-09-29 Testing device for semiconductor components and a method of using the device
PCT/US2001/029078 WO2002029856A2 (en) 2000-09-29 2001-09-18 A testing device for semiconductor components and a method of using the same

Publications (1)

Publication Number Publication Date
AU2001289124A1 true AU2001289124A1 (en) 2002-04-15

Family

ID=24712774

Family Applications (1)

Application Number Title Priority Date Filing Date
AU2001289124A Abandoned AU2001289124A1 (en) 2000-09-29 2001-09-18 A testing device for semiconductor components and a method of using the device

Country Status (4)

Country Link
US (1) US6541989B1 (en)
AU (1) AU2001289124A1 (en)
TW (1) TW516145B (en)
WO (1) WO2002029856A2 (en)

Families Citing this family (28)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US8268114B2 (en) * 2001-09-28 2012-09-18 Shin-Etsu Handotai Co., Ltd. Workpiece holder for polishing, workpiece polishing apparatus and polishing method
JP4201564B2 (en) * 2001-12-03 2008-12-24 日東電工株式会社 Semiconductor wafer transfer method and semiconductor wafer transfer apparatus using the same
US20030213716A1 (en) * 2002-05-17 2003-11-20 Brian Cleaver Wafer shipping and storage container
EP1652228A2 (en) * 2003-08-08 2006-05-03 Infineon Technologies AG Device for stabilising thin discs
DE102004018249B3 (en) * 2004-04-15 2006-03-16 Infineon Technologies Ag Method for processing a workpiece on a workpiece carrier
TWD115746S1 (en) * 2005-09-08 2007-03-01 東京應化工業股份有限公司 Supporting plate
TWD119070S1 (en) * 2005-09-08 2007-09-21 東京應化工業股份有限公司 Support plate
DE102006031434B4 (en) * 2006-07-07 2019-11-14 Erich Thallner Handling device and handling method for wafers
CN103003932A (en) * 2010-07-23 2013-03-27 Ev集团有限责任公司 Handling equipment for handling wafers
US20120206892A1 (en) * 2011-02-10 2012-08-16 Apple Inc. Circular interposers
US9474156B2 (en) * 2011-02-10 2016-10-18 Apple Inc. Interposer connectors with alignment features
US9033740B2 (en) 2011-04-25 2015-05-19 Apple Inc. Interposer connectors
KR101801264B1 (en) * 2011-06-13 2017-11-27 삼성전자주식회사 Apparatus of manufacturing semiconductor and Method for packaging semiconductor using the same
TWI493203B (en) * 2012-05-23 2015-07-21 Advantest Corp A test vehicle, a good judgment device, and a good judgment method
JP6374642B2 (en) * 2012-11-28 2018-08-15 株式会社日本マイクロニクス Probe card and inspection device
TWI583968B (en) * 2013-05-30 2017-05-21 旺矽科技股份有限公司 Electrical test equipment
AT514514A1 (en) * 2013-06-28 2015-01-15 Stefan Dipl Ing Pargfrieder Apparatus and method for electrical testing of product substrates
CN104377101B (en) 2013-08-14 2017-08-08 Fei 公司 Circuit for charged particle beam system is popped one's head in
JP6266386B2 (en) * 2014-03-10 2018-01-24 新日本無線株式会社 Semiconductor test system
US10147630B2 (en) * 2014-06-11 2018-12-04 John Cleaon Moore Sectional porous carrier forming a temporary impervious support
US10354905B2 (en) 2015-03-11 2019-07-16 Nv Bekaert Sa Carrier for temporary bonded wafers
WO2016142240A1 (en) * 2015-03-11 2016-09-15 Nv Bekaert Sa Carrier for temporary bonded wafers
US9917000B2 (en) * 2015-10-01 2018-03-13 Infineon Technologies Ag Wafer carrier, method for manufacturing the same and method for carrying a wafer
US10699934B2 (en) 2015-10-01 2020-06-30 Infineon Technologies Ag Substrate carrier, a processing arrangement and a method
TWI661207B (en) * 2016-09-26 2019-06-01 旺矽科技股份有限公司 Chip probing equipment
JP6726296B2 (en) * 2016-10-27 2020-07-22 三井化学東セロ株式会社 Electronic device manufacturing method, electronic device manufacturing adhesive film, and electronic component testing device
CN109906385A (en) * 2016-10-27 2019-06-18 三井化学东赛璐株式会社 Method for manufacturing electronic device, adhesive film for manufacturing electronic device, and electronic component testing device
US11808808B2 (en) * 2021-12-08 2023-11-07 International Business Machines Corporation Testing a single chip in a wafer probing system

Family Cites Families (17)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US4778326A (en) 1983-05-24 1988-10-18 Vichem Corporation Method and means for handling semiconductor and similar electronic devices
JPH06105753B2 (en) 1984-03-27 1994-12-21 日東電工株式会社 Semiconductor wafer processing method
US4667944A (en) 1985-08-29 1987-05-26 Vichem Corporation Means for handling semiconductor die and the like
US4711014A (en) 1985-08-29 1987-12-08 Vichem Corporation Method for handling semiconductor die and the like
US5186238A (en) * 1991-04-25 1993-02-16 International Business Machines Corporation Liquid film interface cooling chuck for semiconductor wafer processing
US5336649A (en) 1991-06-04 1994-08-09 Micron Technology, Inc. Removable adhesives for attachment of semiconductor dies
US5440241A (en) * 1992-03-06 1995-08-08 Micron Technology, Inc. Method for testing, burning-in, and manufacturing wafer scale integrated circuits and a packaged wafer assembly produced thereby
DE4232404A1 (en) 1992-09-26 1994-03-31 Diehl Gmbh & Co Testing integrated circuit chip on substrate - involves temporarily sticking substrate carrying chip onto adaptor during testing
JPH0778864A (en) 1993-09-06 1995-03-20 Toshiba Corp Semiconductor manufacturing apparatus and method of manufacturing semiconductor device
US6577148B1 (en) * 1994-08-31 2003-06-10 Motorola, Inc. Apparatus, method, and wafer used for testing integrated circuits formed on a product wafer
JP3457477B2 (en) * 1995-09-06 2003-10-20 日本碍子株式会社 Electrostatic chuck
US5703493A (en) 1995-10-25 1997-12-30 Motorola, Inc. Wafer holder for semiconductor applications
US5682731A (en) 1996-03-15 1997-11-04 Vichem Corporation Tape carrier for electronic and electrical parts
US5885353A (en) * 1996-06-21 1999-03-23 Micron Technology, Inc. Thermal conditioning apparatus
US5769237A (en) 1996-07-15 1998-06-23 Vichem Corporation Tape carrier for electronic and electrical parts
EP0837333A3 (en) * 1996-10-18 1999-06-09 Tokyo Electron Limited Apparatus for aligning a semiconductor wafer with an inspection contactor
EP0915499B1 (en) * 1997-11-05 2011-03-23 Tokyo Electron Limited Semiconductor wafer holding apparatus

Also Published As

Publication number Publication date
WO2002029856A2 (en) 2002-04-11
US6541989B1 (en) 2003-04-01
TW516145B (en) 2003-01-01
WO2002029856A3 (en) 2002-06-27

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