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AU2001285859A1 - Method and device for testing the operativeness of printed circuit boards - Google Patents

Method and device for testing the operativeness of printed circuit boards

Info

Publication number
AU2001285859A1
AU2001285859A1 AU2001285859A AU8585901A AU2001285859A1 AU 2001285859 A1 AU2001285859 A1 AU 2001285859A1 AU 2001285859 A AU2001285859 A AU 2001285859A AU 8585901 A AU8585901 A AU 8585901A AU 2001285859 A1 AU2001285859 A1 AU 2001285859A1
Authority
AU
Australia
Prior art keywords
current
circuit boards
testing
operativeness
printed circuit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
Application number
AU2001285859A
Inventor
Jurgen Stengel
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Botest Systems GmbH
Original Assignee
Botest Systems GmbH
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Botest Systems GmbH filed Critical Botest Systems GmbH
Publication of AU2001285859A1 publication Critical patent/AU2001285859A1/en
Abandoned legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/2801—Testing of printed circuits, backplanes, motherboards, hybrid circuits or carriers for multichip packages [MCP]
    • G01R31/2805—Bare printed circuit boards
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer

Landscapes

  • Engineering & Computer Science (AREA)
  • General Engineering & Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Computer Hardware Design (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Testing Of Short-Circuits, Discontinuities, Leakage, Or Incorrect Line Connections (AREA)
  • Tests Of Electronic Circuits (AREA)
  • Selective Calling Equipment (AREA)

Abstract

A process for testing circuit boards for serviceability is designed such that a flexible layer ( 2 ) that is initially impermeable to current is placed directly on at least one side of the circuit board ( 1 ), making contact, and it is dynamically connected to a current conductor ( 3 ), the layer ( 2 ) is then energized and then a current passage is partially created at the contact points that delimit the respective conductor path ( 5 ) that is to be tested, and then the flow of current in the conductor path ( 5 ) is measured using the current conductor ( 3 ).
AU2001285859A 2000-08-05 2001-08-01 Method and device for testing the operativeness of printed circuit boards Abandoned AU2001285859A1 (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
DE10038313 2000-08-05
DE10038313A DE10038313A1 (en) 2000-08-05 2000-08-05 Method and device for checking the functionality of printed circuit boards
PCT/EP2001/008882 WO2002012911A1 (en) 2000-08-05 2001-08-01 Method and device for testing the operativeness of printed circuit boards

Publications (1)

Publication Number Publication Date
AU2001285859A1 true AU2001285859A1 (en) 2002-02-18

Family

ID=7651468

Family Applications (1)

Application Number Title Priority Date Filing Date
AU2001285859A Abandoned AU2001285859A1 (en) 2000-08-05 2001-08-01 Method and device for testing the operativeness of printed circuit boards

Country Status (12)

Country Link
US (1) US7129720B2 (en)
EP (1) EP1317674B1 (en)
JP (1) JP2004506205A (en)
KR (1) KR100750400B1 (en)
CN (1) CN1170167C (en)
AT (1) ATE330232T1 (en)
AU (1) AU2001285859A1 (en)
CA (1) CA2420119C (en)
DE (2) DE10038313A1 (en)
ES (1) ES2272531T3 (en)
IL (2) IL154252A0 (en)
WO (1) WO2002012911A1 (en)

Families Citing this family (4)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
AT507322B1 (en) * 2008-10-07 2011-07-15 Nanoident Technologies Ag SWITCHING DEVICE FOR ELECTRICAL CONTACT TESTING
DE102015105075A1 (en) * 2015-04-01 2016-10-06 Infineon Technologies Ag current sensor
CN105338729B (en) * 2015-10-28 2018-09-04 北大方正集团有限公司 A kind of circuit board and its screened film Grounding detection method and detection device
CN118464111B (en) * 2024-05-08 2025-03-14 毅嘉电子（苏州）有限公司 An artificial intelligence-based flexible printed circuit board LED test and analysis system

Family Cites Families (10)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
EP0286814A3 (en) * 1987-03-31 1990-03-21 Siemens Aktiengesellschaft Addressing device
US5032788A (en) 1989-06-26 1991-07-16 Digital Equipment Corp. Test cell for non-contact opens/shorts testing of electrical circuits
US5177437A (en) * 1990-08-08 1993-01-05 Photon Dynamics, Inc. High-density optically-addressable circuit board probe panel and method for use
JP2613980B2 (en) * 1991-02-28 1997-05-28 シャープ株式会社 Active matrix substrate inspection apparatus and active matrix substrate inspection method
JP2730295B2 (en) * 1991-01-21 1998-03-25 日本電気株式会社 Board inspection equipment
EP0508062B1 (en) * 1991-04-10 1995-07-19 atg test systems GmbH Method and device for testing an arrangement of electrical conductors
US5357194A (en) * 1993-06-28 1994-10-18 Orbotech Ltd. Testing bed and apparatus including same for testing printed circuit boards and other like articles
JPH07140209A (en) * 1993-09-20 1995-06-02 Fujitsu Ltd Circuit wiring board inspection device and inspection method thereof
US6369591B1 (en) * 1999-01-14 2002-04-09 Maniatech Incorporated Apparatus and method using photoelectric effect for testing electrical traces
US6590398B1 (en) * 2000-07-06 2003-07-08 Honeywell Advanced Circuits, Inc. Fixture-less bare board tester

Also Published As

Publication number Publication date
ATE330232T1 (en) 2006-07-15
CA2420119A1 (en) 2003-02-04
KR20030029125A (en) 2003-04-11
KR100750400B1 (en) 2007-08-17
CA2420119C (en) 2009-12-22
DE50110170D1 (en) 2006-07-27
DE10038313A1 (en) 2002-02-21
IL154252A0 (en) 2003-09-17
US20040251889A1 (en) 2004-12-16
IL154252A (en) 2007-12-03
JP2004506205A (en) 2004-02-26
CN1446317A (en) 2003-10-01
EP1317674A1 (en) 2003-06-11
US7129720B2 (en) 2006-10-31
WO2002012911A1 (en) 2002-02-14
ES2272531T3 (en) 2007-05-01
EP1317674B1 (en) 2006-06-14
CN1170167C (en) 2004-10-06

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