[go: up one dir, main page]

AU2001277755A1 - Device and method for processing substrate - Google Patents

Device and method for processing substrate

Info

Publication number
AU2001277755A1
AU2001277755A1 AU2001277755A AU7775501A AU2001277755A1 AU 2001277755 A1 AU2001277755 A1 AU 2001277755A1 AU 2001277755 A AU2001277755 A AU 2001277755A AU 7775501 A AU7775501 A AU 7775501A AU 2001277755 A1 AU2001277755 A1 AU 2001277755A1
Authority
AU
Australia
Prior art keywords
processing substrate
substrate
processing
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Abandoned
Application number
AU2001277755A
Inventor
Koji Homma
Hiroshi Shinriki
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Tokyo Electron Ltd
Original Assignee
Tokyo Electron Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tokyo Electron Ltd filed Critical Tokyo Electron Ltd
Publication of AU2001277755A1 publication Critical patent/AU2001277755A1/en
Abandoned legal-status Critical Current

Links

Classifications

    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C16/00Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
    • C23C16/44Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
    • C23C16/4412Details relating to the exhausts, e.g. pumps, filters, scrubbers, particle traps
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C16/00Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
    • C23C16/22Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the deposition of inorganic material, other than metallic material
    • C23C16/30Deposition of compounds, mixtures or solid solutions, e.g. borides, carbides, nitrides
    • C23C16/40Oxides
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C16/00Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
    • C23C16/22Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the deposition of inorganic material, other than metallic material
    • C23C16/30Deposition of compounds, mixtures or solid solutions, e.g. borides, carbides, nitrides
    • C23C16/40Oxides
    • C23C16/401Oxides containing silicon
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C16/00Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
    • C23C16/44Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
    • C23C16/455Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for introducing gases into reaction chamber or for modifying gas flows in reaction chamber
    • C23C16/45523Pulsed gas flow or change of composition over time
    • C23C16/45525Atomic layer deposition [ALD]
    • C23C16/45544Atomic layer deposition [ALD] characterized by the apparatus
    • C23C16/45548Atomic layer deposition [ALD] characterized by the apparatus having arrangements for gas injection at different locations of the reactor for each ALD half-reaction
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C16/00Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
    • C23C16/44Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
    • C23C16/455Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for introducing gases into reaction chamber or for modifying gas flows in reaction chamber
    • C23C16/45561Gas plumbing upstream of the reaction chamber
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C16/00Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
    • C23C16/44Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
    • C23C16/455Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for introducing gases into reaction chamber or for modifying gas flows in reaction chamber
    • C23C16/45563Gas nozzles
    • CCHEMISTRY; METALLURGY
    • C23COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
    • C23CCOATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
    • C23C16/00Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
    • C23C16/44Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
    • C23C16/455Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating characterised by the method used for introducing gases into reaction chamber or for modifying gas flows in reaction chamber
    • C23C16/45563Gas nozzles
    • C23C16/45578Elongated nozzles, tubes with holes
    • YGENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10TECHNICAL SUBJECTS COVERED BY FORMER USPC
    • Y10STECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
    • Y10S438/00Semiconductor device manufacturing: process
    • Y10S438/935Gas flow control

Landscapes

  • Chemical & Material Sciences (AREA)
  • General Chemical & Material Sciences (AREA)
  • Chemical Kinetics & Catalysis (AREA)
  • Engineering & Computer Science (AREA)
  • Materials Engineering (AREA)
  • Mechanical Engineering (AREA)
  • Metallurgy (AREA)
  • Organic Chemistry (AREA)
  • Inorganic Chemistry (AREA)
  • Chemical Vapour Deposition (AREA)
  • Container, Conveyance, Adherence, Positioning, Of Wafer (AREA)
AU2001277755A 2000-08-11 2001-08-10 Device and method for processing substrate Abandoned AU2001277755A1 (en)

Applications Claiming Priority (3)

Application Number Priority Date Filing Date Title
JP2000245193 2000-08-11
JP2000-245193 2000-08-11
PCT/JP2001/006908 WO2002015243A1 (en) 2000-08-11 2001-08-10 Device and method for processing substrate

Publications (1)

Publication Number Publication Date
AU2001277755A1 true AU2001277755A1 (en) 2002-02-25

Family

ID=18735763

Family Applications (1)

Application Number Title Priority Date Filing Date
AU2001277755A Abandoned AU2001277755A1 (en) 2000-08-11 2001-08-10 Device and method for processing substrate

Country Status (7)

Country Link
US (1) US6806211B2 (en)
EP (1) EP1308992A4 (en)
KR (1) KR100531629B1 (en)
CN (1) CN1256755C (en)
AU (1) AU2001277755A1 (en)
TW (1) TW511185B (en)
WO (1) WO2002015243A1 (en)

Families Citing this family (103)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
KR100565032B1 (en) * 2001-03-29 2006-03-30 가부시키가이샤 도요다 쥬오 겐큐쇼 Manufacturing apparatus and manufacturing method of silicon structure
WO2003049173A1 (en) * 2001-12-07 2003-06-12 Tokyo Electron Limited Nitriding method for insulation film, semiconductor device and production method for semiconductor device, substrate treating device and substrate treating method
US7220312B2 (en) * 2002-03-13 2007-05-22 Micron Technology, Inc. Methods for treating semiconductor substrates
JP4099092B2 (en) 2002-03-26 2008-06-11 東京エレクトロン株式会社 Substrate processing apparatus, substrate processing method, and high-speed rotary valve
KR100810783B1 (en) * 2002-03-26 2008-03-06 동경 엘렉트론 주식회사 Substrate processing apparatus and substrate processing method
KR100753696B1 (en) * 2002-03-26 2007-08-30 동경 엘렉트론 주식회사 Substrate processing unit, substrate processing method and high speed rotary valve
US7160577B2 (en) 2002-05-02 2007-01-09 Micron Technology, Inc. Methods for atomic-layer deposition of aluminum oxides in integrated circuits
JP2004047634A (en) * 2002-07-10 2004-02-12 Tokyo Electron Ltd Film forming method and film forming apparatus
US6921702B2 (en) 2002-07-30 2005-07-26 Micron Technology Inc. Atomic layer deposited nanolaminates of HfO2/ZrO2 films as gate dielectrics
JP2004079753A (en) * 2002-08-16 2004-03-11 Tokyo Electron Ltd Method for manufacturing semiconductor device
JP4113755B2 (en) * 2002-10-03 2008-07-09 東京エレクトロン株式会社 Processing equipment
US7101813B2 (en) 2002-12-04 2006-09-05 Micron Technology Inc. Atomic layer deposited Zr-Sn-Ti-O films
JP4180948B2 (en) * 2003-03-24 2008-11-12 東京エレクトロン株式会社 Substrate processing apparatus, substrate processing method, and gas nozzle
US7135369B2 (en) 2003-03-31 2006-11-14 Micron Technology, Inc. Atomic layer deposited ZrAlxOy dielectric layers including Zr4AlO9
WO2004094694A2 (en) * 2003-04-23 2004-11-04 Genus, Inc. Collection of unused precursors in ald
US7537662B2 (en) * 2003-04-29 2009-05-26 Asm International N.V. Method and apparatus for depositing thin films on a surface
US6784083B1 (en) * 2003-06-03 2004-08-31 Micron Technology, Inc. Method for reducing physisorption during atomic layer deposition
US7020981B2 (en) * 2003-10-29 2006-04-04 Asm America, Inc Reaction system for growing a thin film
JP4399517B2 (en) * 2004-01-05 2010-01-20 株式会社堀場製作所 Film forming apparatus and film forming method
US7309395B2 (en) * 2004-03-31 2007-12-18 Dielectric Systems, Inc. System for forming composite polymer dielectric film
JP2005322668A (en) * 2004-05-06 2005-11-17 Renesas Technology Corp Film deposition equipment and film deposition method
US20080017613A1 (en) * 2004-07-09 2008-01-24 Sekisui Chemical Co., Ltd. Method for processing outer periphery of substrate and apparatus thereof
JP4718141B2 (en) * 2004-08-06 2011-07-06 東京エレクトロン株式会社 Thin film forming method and thin film forming apparatus
US7081421B2 (en) 2004-08-26 2006-07-25 Micron Technology, Inc. Lanthanide oxide dielectric layer
US7494939B2 (en) 2004-08-31 2009-02-24 Micron Technology, Inc. Methods for forming a lanthanum-metal oxide dielectric layer
US7588988B2 (en) * 2004-08-31 2009-09-15 Micron Technology, Inc. Method of forming apparatus having oxide films formed using atomic layer deposition
WO2006049055A1 (en) * 2004-11-01 2006-05-11 Hitachi Kokusai Electric Inc. Substrate processing equipment and semiconductor device manufacturing method
US7235501B2 (en) 2004-12-13 2007-06-26 Micron Technology, Inc. Lanthanum hafnium oxide dielectrics
US7560395B2 (en) 2005-01-05 2009-07-14 Micron Technology, Inc. Atomic layer deposited hafnium tantalum oxide dielectrics
KR100697280B1 (en) * 2005-02-07 2007-03-20 삼성전자주식회사 Pressure regulating method of semiconductor manufacturing equipment
JP4790291B2 (en) * 2005-03-10 2011-10-12 東京エレクトロン株式会社 Substrate processing method, recording medium, and substrate processing apparatus
US7687409B2 (en) 2005-03-29 2010-03-30 Micron Technology, Inc. Atomic layer deposited titanium silicon oxide films
JP2006303152A (en) * 2005-04-20 2006-11-02 Fuji Electric Holdings Co Ltd Epitaxial film forming apparatus and epitaxial film forming method
KR100717813B1 (en) 2005-06-30 2007-05-11 주식회사 하이닉스반도체 Capacitors with nanomixed dielectric films and methods for manufacturing the same
US7927948B2 (en) 2005-07-20 2011-04-19 Micron Technology, Inc. Devices with nanocrystals and methods of formation
JPWO2007043709A1 (en) * 2005-10-14 2009-04-23 日本電気株式会社 Semiconductor device manufacturing method and manufacturing apparatus thereof
US7592251B2 (en) 2005-12-08 2009-09-22 Micron Technology, Inc. Hafnium tantalum titanium oxide films
US7972974B2 (en) 2006-01-10 2011-07-05 Micron Technology, Inc. Gallium lanthanide oxide films
US7709402B2 (en) 2006-02-16 2010-05-04 Micron Technology, Inc. Conductive layers for hafnium silicon oxynitride films
US20070218702A1 (en) * 2006-03-15 2007-09-20 Asm Japan K.K. Semiconductor-processing apparatus with rotating susceptor
US7727908B2 (en) 2006-08-03 2010-06-01 Micron Technology, Inc. Deposition of ZrA1ON films
US7776765B2 (en) 2006-08-31 2010-08-17 Micron Technology, Inc. Tantalum silicon oxynitride high-k dielectrics and metal gates
US7544604B2 (en) 2006-08-31 2009-06-09 Micron Technology, Inc. Tantalum lanthanide oxynitride films
US7605030B2 (en) 2006-08-31 2009-10-20 Micron Technology, Inc. Hafnium tantalum oxynitride high-k dielectric and metal gates
US7759747B2 (en) 2006-08-31 2010-07-20 Micron Technology, Inc. Tantalum aluminum oxynitride high-κ dielectric
KR20080027009A (en) * 2006-09-22 2008-03-26 에이에스엠지니텍코리아 주식회사 Atomic layer deposition apparatus and multilayer film deposition method using the same
JP4299863B2 (en) * 2007-01-22 2009-07-22 エルピーダメモリ株式会社 Manufacturing method of semiconductor device
US8048226B2 (en) * 2007-03-30 2011-11-01 Tokyo Electron Limited Method and system for improving deposition uniformity in a vapor deposition system
US20080241384A1 (en) * 2007-04-02 2008-10-02 Asm Genitech Korea Ltd. Lateral flow deposition apparatus and method of depositing film by using the apparatus
JP2008311385A (en) * 2007-06-14 2008-12-25 Hitachi High-Technologies Corp Substrate processing equipment
JP5347294B2 (en) * 2007-09-12 2013-11-20 東京エレクトロン株式会社 Film forming apparatus, film forming method, and storage medium
US7964040B2 (en) * 2007-11-08 2011-06-21 Applied Materials, Inc. Multi-port pumping system for substrate processing chambers
US8282735B2 (en) * 2007-11-27 2012-10-09 Asm Genitech Korea Ltd. Atomic layer deposition apparatus
US7655543B2 (en) * 2007-12-21 2010-02-02 Asm America, Inc. Separate injection of reactive species in selective formation of films
JP2009203488A (en) * 2008-02-26 2009-09-10 Mitsui Eng & Shipbuild Co Ltd Thin-film-forming apparatus
US20100269365A1 (en) * 2008-05-16 2010-10-28 Miller Kenneth C System and Method for Alternating Fluid Flow
US8298628B2 (en) 2008-06-02 2012-10-30 Air Products And Chemicals, Inc. Low temperature deposition of silicon-containing films
WO2010003266A1 (en) * 2008-07-09 2010-01-14 Oerlikon Solar Ip Ag, Trübbach Remote plasma cleaning method and apparatus for applying said method
JP5107185B2 (en) * 2008-09-04 2012-12-26 東京エレクトロン株式会社 Film forming apparatus, substrate processing apparatus, film forming method, and recording medium recording program for executing this film forming method
FI122940B (en) * 2009-02-09 2012-09-14 Beneq Oy reaction chamber
RU2532953C2 (en) 2009-02-20 2014-11-20 Омрон Хэлткэа Ко., Лтд. Biological information measuring device, method for measuring biological information and body composition measuring device
JP4523661B1 (en) * 2009-03-10 2010-08-11 三井造船株式会社 Atomic layer deposition apparatus and thin film forming method
JP5131240B2 (en) * 2009-04-09 2013-01-30 東京エレクトロン株式会社 Film forming apparatus, film forming method, and storage medium
JP5181100B2 (en) * 2009-04-09 2013-04-10 東京エレクトロン株式会社 Substrate processing apparatus, substrate processing method, and storage medium
JP5560093B2 (en) * 2009-06-30 2014-07-23 株式会社日立国際電気 Substrate processing apparatus, semiconductor device manufacturing method, and substrate manufacturing method
JP5287592B2 (en) * 2009-08-11 2013-09-11 東京エレクトロン株式会社 Deposition equipment
JP5257328B2 (en) * 2009-11-04 2013-08-07 東京エレクトロン株式会社 Substrate processing apparatus, substrate processing method, and storage medium
JP5396264B2 (en) * 2009-12-25 2014-01-22 東京エレクトロン株式会社 Deposition equipment
KR20120034341A (en) * 2010-10-01 2012-04-12 주식회사 원익아이피에스 Cleaning method for substrate processing apparatus
CN102468105B (en) * 2010-11-01 2015-09-02 北京北方微电子基地设备工艺研究中心有限责任公司 Inductance coupled plasma device
US8133349B1 (en) * 2010-11-03 2012-03-13 Lam Research Corporation Rapid and uniform gas switching for a plasma etch process
JP5642531B2 (en) * 2010-12-22 2014-12-17 東京エレクトロン株式会社 Substrate processing apparatus and substrate processing method
JP5631728B2 (en) * 2010-12-28 2014-11-26 株式会社アルバック Insulating film forming method and insulating film forming apparatus
US9512520B2 (en) * 2011-04-25 2016-12-06 Applied Materials, Inc. Semiconductor substrate processing system
US9062375B2 (en) 2011-08-17 2015-06-23 Asm Genitech Korea Ltd. Lateral flow atomic layer deposition apparatus and atomic layer deposition method using the same
KR101984997B1 (en) * 2011-08-17 2019-09-04 에이에스엠케이 주식회사 Lateral_flow atomic layer deposition apparatus and atomic layer deposition method using the same
US20130113085A1 (en) * 2011-11-04 2013-05-09 Applied Materials, Inc. Atomic Layer Deposition Of Films Using Precursors Containing Hafnium Or Zirconium
JP2013151720A (en) * 2012-01-25 2013-08-08 Ulvac Japan Ltd Vacuum film forming apparatus
KR102030038B1 (en) * 2012-08-21 2019-10-10 세메스 주식회사 Apparatus for Processing Substrate
WO2014158410A1 (en) * 2013-03-13 2014-10-02 Applied Materials, Inc Acoustically-monitored semiconductor substrate processing systems and methods
CN107557758A (en) * 2013-05-01 2018-01-09 应用材料公司 For controlling the injection and discharge design of epitaxial deposition chamber flow
JP5895929B2 (en) * 2013-12-25 2016-03-30 ウシオ電機株式会社 Light irradiation device
KR102363899B1 (en) 2014-01-13 2022-02-15 어플라이드 머티어리얼스, 인코포레이티드 Self-aligned double patterning with spatial atomic layer deposition
JP6020483B2 (en) 2014-02-14 2016-11-02 トヨタ自動車株式会社 Surface treatment apparatus and surface treatment method
US9920425B2 (en) * 2014-08-13 2018-03-20 Toshiba Memory Corporation Semiconductor manufacturing apparatus and manufacturing method of semiconductor device
JP6062413B2 (en) 2014-11-28 2017-01-18 株式会社日立国際電気 Substrate processing apparatus, semiconductor device manufacturing method, and program
US9963782B2 (en) * 2015-02-12 2018-05-08 Asm Ip Holding B.V. Semiconductor manufacturing apparatus
US10961621B2 (en) * 2015-06-04 2021-03-30 Svagos Technik, Inc. CVD reactor chamber with resistive heating and substrate holder
US9625379B2 (en) * 2015-07-15 2017-04-18 International Business Machines Corporation Gas sensor with integrated optics and reference cell
JP5947435B1 (en) * 2015-08-27 2016-07-06 株式会社日立国際電気 Substrate processing apparatus, semiconductor device manufacturing method, program, and recording medium
KR102477302B1 (en) * 2015-10-05 2022-12-13 주성엔지니어링(주) Substrate treatment apparatus having exhaust gas cracker and exhaust gas treatment method of the same
GB2564399A (en) * 2017-07-06 2019-01-16 Edwards Ltd Improvements in or relating to pumping line arrangements
JP6968993B2 (en) 2017-10-06 2021-11-24 アプライド マテリアルズ インコーポレイテッドApplied Materials, Incorporated Methods and precursors for selective deposition of metal films
SG11202007004QA (en) * 2018-03-14 2020-08-28 Kokusai Electric Corp Substrate processing apparatus, method of manufacturing semiconductor device, and program
CN112368802B (en) * 2018-07-31 2025-02-28 应用材料公司 Method and apparatus for ALD process
US11078568B2 (en) * 2019-01-08 2021-08-03 Applied Materials, Inc. Pumping apparatus and method for substrate processing chambers
JP6925548B1 (en) * 2020-07-08 2021-08-25 信越化学工業株式会社 Manufacturing method and film forming equipment for gallium oxide semiconductor film
US20220084794A1 (en) * 2020-09-16 2022-03-17 Applied Materials, Inc. Plasma chamber with a multiphase rotating modulated cross-flow
KR102522687B1 (en) * 2020-10-20 2023-04-18 에이피시스템 주식회사 Thin film processing apparatus
KR20230025590A (en) * 2021-08-13 2023-02-22 삼성디스플레이 주식회사 Exhausting method, exhausting system, and substrate treating apparatus including the exhausting system
US20230057145A1 (en) * 2021-08-23 2023-02-23 Applied Materials, Inc. Plasma chamber with a multiphase rotating cross-flow with uniformity tuning
US20230162950A1 (en) * 2021-11-22 2023-05-25 Applied Materials, Inc. Plasma chamber with a multiphase rotating gas cross-flow and peripheral conductance control rings
US12505988B2 (en) * 2022-06-07 2025-12-23 Applied Materials, Inc. Plasma chamber with gas cross-flow, microwave resonators and a rotatable pedestal for multiphase cyclic deposition

Family Cites Families (22)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3660179A (en) * 1970-08-17 1972-05-02 Westinghouse Electric Corp Gaseous diffusion technique
JPS4942858U (en) * 1972-07-19 1974-04-15
JPS5516624B2 (en) 1972-09-01 1980-05-06
US6113701A (en) * 1985-02-14 2000-09-05 Semiconductor Energy Laboratory Co., Ltd. Semiconductor device, manufacturing method, and system
JPH0230119A (en) 1988-07-20 1990-01-31 Matsushita Electric Ind Co Ltd Vapor phase growth equipment
JP2712367B2 (en) * 1988-09-09 1998-02-10 富士通株式会社 Method and apparatus for forming thin film
US5006363A (en) * 1988-12-08 1991-04-09 Matsushita Electric Industries Co., Ltd. Plasma assited MO-CVD of perooskite dalectric films
JP2734197B2 (en) 1990-11-21 1998-03-30 富士電機株式会社 Vapor phase growth equipment
JP2790009B2 (en) 1992-12-11 1998-08-27 信越半導体株式会社 Method and apparatus for growing silicon epitaxial layer
JP3338884B2 (en) * 1993-09-20 2002-10-28 株式会社日立製作所 Semiconductor processing equipment
JP3264096B2 (en) 1994-05-20 2002-03-11 ソニー株式会社 Horizontal vapor phase growth apparatus and horizontal heat treatment apparatus
JPH0982696A (en) * 1995-09-18 1997-03-28 Toshiba Corp Semiconductor device manufacturing method and semiconductor manufacturing device
JP3279466B2 (en) * 1995-12-06 2002-04-30 株式会社日立製作所 Semiconductor wafer processing apparatus and semiconductor device
US5994676A (en) * 1996-01-31 1999-11-30 Sgs-Thomson Microelectronics S.A. Method for calibrating the temperature of an epitaxy reactor
US5895530A (en) * 1996-02-26 1999-04-20 Applied Materials, Inc. Method and apparatus for directing fluid through a semiconductor processing chamber
US6132552A (en) * 1998-02-19 2000-10-17 Micron Technology, Inc. Method and apparatus for controlling the temperature of a gas distribution plate in a process reactor
JPH11302829A (en) * 1998-04-16 1999-11-02 Ebara Corp Vacuum chamber contamination preventive apparatus for vacuum apparatus
JP2000012470A (en) * 1998-06-19 2000-01-14 Shin Etsu Handotai Co Ltd Vapor-phase growth system
WO2000008680A1 (en) * 1998-08-03 2000-02-17 Nec Corporation Vapor growth method for metal oxide dielectric film and vapor growth device for metal oxide dielectric material
JP2000054145A (en) 1998-08-04 2000-02-22 Komatsu Ltd Surface treatment equipment
JP3980840B2 (en) * 2001-04-25 2007-09-26 東京エレクトロン株式会社 Vapor growth apparatus and vapor growth film forming method
US6677250B2 (en) * 2001-08-17 2004-01-13 Micron Technology, Inc. CVD apparatuses and methods of forming a layer over a semiconductor substrate

Also Published As

Publication number Publication date
TW511185B (en) 2002-11-21
WO2002015243A1 (en) 2002-02-21
KR20030023750A (en) 2003-03-19
EP1308992A1 (en) 2003-05-07
EP1308992A4 (en) 2006-01-18
CN1256755C (en) 2006-05-17
CN1446373A (en) 2003-10-01
KR100531629B1 (en) 2005-11-29
US20040026037A1 (en) 2004-02-12
US6806211B2 (en) 2004-10-19

Similar Documents

Publication Publication Date Title
AU2001277755A1 (en) Device and method for processing substrate
SG106599A1 (en) Substrate processing apparatus and substrate processing method
SG94851A1 (en) Substrate processing apparatus and substrate processing method
AU2001247753A1 (en) Method and apparatus for integrated-battery devices
AU7458301A (en) Information processing device and processing method
EP1130626A3 (en) Method and apparatus for manufacturing semiconductor device
SG105487A1 (en) Substrate processing apparatus and substrate processing method
AU6871400A (en) Method and device for processing material
SG105523A1 (en) Substrate processing system and substrate processing method
AU2002222639A1 (en) Processing method and processing apparatus
AU2003242422A1 (en) Substrate processing device and substrate processing method
AU2002354143A1 (en) Substrate processing method and substrate processing apparatus
AU2001294188A1 (en) Device and method for manufacturing semiconductor
AU2003284537A1 (en) Substrate processing method and substrate processing device
AU2001232960A1 (en) Methods and apparatus for processing insulating substrates
AU5974700A (en) Device for processing data and corresponding method
SG104267A1 (en) Substrate processing apparatus and substrate processing method
AU2002339366A1 (en) Method and device for processing mail
SG91902A1 (en) Substrate processing method and substrate processing apparatus
AU2002219222A1 (en) Device and method for changing lines
AU7248701A (en) Method and device for processing sheet-like articles
AU2001259609A1 (en) Method and apparatus for sorting semiconductor devices
AU2002220786A1 (en) Method and device for making secure data processing
AU4065401A (en) Device and method for ultrasonic processing
AU2002362799A1 (en) Method for processing flat products and device for carrying out said method