AT521734A3 - Edge stripping system and method for treating a substrate - Google Patents
Edge stripping system and method for treating a substrate Download PDFInfo
- Publication number
- AT521734A3 AT521734A3 ATA50814/2019A AT508142019A AT521734A3 AT 521734 A3 AT521734 A3 AT 521734A3 AT 508142019 A AT508142019 A AT 508142019A AT 521734 A3 AT521734 A3 AT 521734A3
- Authority
- AT
- Austria
- Prior art keywords
- substrate
- treating
- arms
- stripping system
- edge stripping
- Prior art date
Links
Classifications
-
- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/16—Coating processes; Apparatus therefor
- G03F7/168—Finishing the coated layer, e.g. drying, baking, soaking
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- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/26—Processing photosensitive materials; Apparatus therefor
- G03F7/42—Stripping or agents therefor
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- G—PHYSICS
- G03—PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
- G03F—PHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
- G03F7/00—Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
- G03F7/16—Coating processes; Apparatus therefor
- G03F7/162—Coating on a rotating support, e.g. using a whirler or a spinner
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- H10P70/60—
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- H10P70/20—
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- H10P72/0406—
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- H10P72/0424—
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- H10P72/0448—
Landscapes
- General Physics & Mathematics (AREA)
- Physics & Mathematics (AREA)
- Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
- Engineering & Computer Science (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Cleaning Or Drying Semiconductors (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- Manufacturing & Machinery (AREA)
- Computer Hardware Design (AREA)
- Power Engineering (AREA)
- Coating Apparatus (AREA)
- Cleaning By Liquid Or Steam (AREA)
- Manufacturing Of Printed Wiring (AREA)
- Photosensitive Polymer And Photoresist Processing (AREA)
- Materials For Photolithography (AREA)
Abstract
Beschrieben ist ein Randwulstbeseitigungssystem (10) zur Behandlung eines Substrats (12), das einen Randwulstbeseitigungskopf (20) mit einem Hauptkörper (22) und zwei von dem Hauptkörper (22) hervorstehende Arme (24) umfasst. Die Arme (24) sind voneinander beabstandet und definieren dazwischen einen Aufnahmeraum (26) für die Unterbringung eines zu behandelnden Substrats (12). Die vorstehenden Arme (24) weisen jeweils eine Funktionsfläche (36) auf, die zueinander gewandt sind, und wobei die Funktionsflächen (36) jeweils mindestens einen Fluidauslass (38) aufweisen. Darüber hinaus ist ein Verfahren zur Behandlung eines Substrats (12) beschrieben.A bead removal system (10) for treating a substrate (12) is described which includes a bead removal head (20) having a main body (22) and two arms (24) protruding from the main body (22). The arms (24) are spaced from one another and define a receiving space (26) therebetween for accommodating a substrate (12) to be treated. The protruding arms (24) each have a functional surface (36) facing one another, and the functional surfaces (36) each having at least one fluid outlet (38). In addition, a method for treating a substrate (12) is described.
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| NL2021701A NL2021701B1 (en) | 2018-09-25 | 2018-09-25 | Edge bead removal system and method of treating a substrate |
Publications (3)
| Publication Number | Publication Date |
|---|---|
| AT521734A2 AT521734A2 (en) | 2020-04-15 |
| AT521734A3 true AT521734A3 (en) | 2021-11-15 |
| AT521734B1 AT521734B1 (en) | 2022-06-15 |
Family
ID=64427162
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| ATA50814/2019A AT521734B1 (en) | 2018-09-25 | 2019-09-24 | Edge bead system and method for treating a substrate |
Country Status (8)
| Country | Link |
|---|---|
| US (1) | US20200096867A1 (en) |
| JP (1) | JP2020092252A (en) |
| KR (1) | KR20200035364A (en) |
| CN (1) | CN110941152A (en) |
| AT (1) | AT521734B1 (en) |
| DE (1) | DE102019125661A1 (en) |
| NL (1) | NL2021701B1 (en) |
| TW (1) | TWI824015B (en) |
Families Citing this family (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP6967637B1 (en) * | 2020-07-30 | 2021-11-17 | 中外炉工業株式会社 | Edge flattening device and coating drying system including the device |
| WO2022031268A1 (en) * | 2020-08-04 | 2022-02-10 | Applied Materials, Inc. | Apparatus for removing photoresist off of photomask |
| US12138732B2 (en) * | 2020-12-14 | 2024-11-12 | Applied Materials, Inc. | Polishing system apparatus and methods for defect reduction at a substrate edge |
| US20220269177A1 (en) * | 2021-02-23 | 2022-08-25 | Tokyo Electron Limited | Sensor technology integration into coating track |
| CN117497435A (en) * | 2022-07-21 | 2024-02-02 | 长鑫存储技术有限公司 | Semiconductor structure processing method, processing device and processing system |
| DE102023126128A1 (en) * | 2023-09-26 | 2025-03-27 | Osiris International GmbH | Decoating device and method for decoating uneven substrates |
Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6062288A (en) * | 1997-04-28 | 2000-05-16 | Tokyo Electron Limited | Processing apparatus |
| WO2002049085A1 (en) * | 2000-12-15 | 2002-06-20 | K.C.Tech Co., Ltd. | Apparatus for cleaning the edges of wafers |
| US20080081110A1 (en) * | 2006-09-30 | 2008-04-03 | Tokyo Electron Limited | Apparatus and method for removing an edge bead of a spin-coated layer |
| US20090211604A1 (en) * | 2008-02-22 | 2009-08-27 | Tokyo Electron Limited | System and Method For Removing Edge-Bead Material |
Family Cites Families (7)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH1131654A (en) * | 1997-07-14 | 1999-02-02 | Dainippon Screen Mfg Co Ltd | Treatment apparatus for end edge of substrate |
| JPH11260702A (en) * | 1998-03-13 | 1999-09-24 | Advanced Display Inc | Wafer edge cleaning apparatus and manufacture of liquid crystal display apparatus using the apparatus |
| US6453916B1 (en) * | 2000-06-09 | 2002-09-24 | Advanced Micro Devices, Inc. | Low angle solvent dispense nozzle design for front-side edge bead removal in photolithography resist process |
| JP4043382B2 (en) * | 2003-02-28 | 2008-02-06 | 東京エレクトロン株式会社 | Coating film removing method and apparatus |
| JP4734063B2 (en) * | 2005-08-30 | 2011-07-27 | 東京エレクトロン株式会社 | Substrate cleaning apparatus and substrate cleaning method. |
| JP2008060302A (en) * | 2006-08-31 | 2008-03-13 | Sokudo:Kk | Substrate processing equipment |
| CN102655949B (en) * | 2009-09-22 | 2014-08-06 | 第一太阳能有限公司 | System and method for tracking and removing coating from an edge of a substrate |
-
2018
- 2018-09-25 NL NL2021701A patent/NL2021701B1/en active
-
2019
- 2019-09-24 TW TW108134465A patent/TWI824015B/en active
- 2019-09-24 AT ATA50814/2019A patent/AT521734B1/en active
- 2019-09-24 DE DE102019125661.5A patent/DE102019125661A1/en active Pending
- 2019-09-25 JP JP2019174131A patent/JP2020092252A/en active Pending
- 2019-09-25 CN CN201910912190.7A patent/CN110941152A/en active Pending
- 2019-09-25 US US16/582,806 patent/US20200096867A1/en not_active Abandoned
- 2019-09-25 KR KR1020190118136A patent/KR20200035364A/en not_active Abandoned
Patent Citations (4)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US6062288A (en) * | 1997-04-28 | 2000-05-16 | Tokyo Electron Limited | Processing apparatus |
| WO2002049085A1 (en) * | 2000-12-15 | 2002-06-20 | K.C.Tech Co., Ltd. | Apparatus for cleaning the edges of wafers |
| US20080081110A1 (en) * | 2006-09-30 | 2008-04-03 | Tokyo Electron Limited | Apparatus and method for removing an edge bead of a spin-coated layer |
| US20090211604A1 (en) * | 2008-02-22 | 2009-08-27 | Tokyo Electron Limited | System and Method For Removing Edge-Bead Material |
Also Published As
| Publication number | Publication date |
|---|---|
| DE102019125661A1 (en) | 2020-03-26 |
| AT521734B1 (en) | 2022-06-15 |
| JP2020092252A (en) | 2020-06-11 |
| NL2021701B1 (en) | 2020-05-07 |
| US20200096867A1 (en) | 2020-03-26 |
| KR20200035364A (en) | 2020-04-03 |
| CN110941152A (en) | 2020-03-31 |
| AT521734A2 (en) | 2020-04-15 |
| TWI824015B (en) | 2023-12-01 |
| TW202030775A (en) | 2020-08-16 |
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