AR107319A1 - Método independiente de posición de objeto para medir el grosor de recubrimientos depositados sobre objetos curvos en movimiento a altas velocidades - Google Patents
Método independiente de posición de objeto para medir el grosor de recubrimientos depositados sobre objetos curvos en movimiento a altas velocidadesInfo
- Publication number
- AR107319A1 AR107319A1 ARP170100043A ARP170100043A AR107319A1 AR 107319 A1 AR107319 A1 AR 107319A1 AR P170100043 A ARP170100043 A AR P170100043A AR P170100043 A ARP170100043 A AR P170100043A AR 107319 A1 AR107319 A1 AR 107319A1
- Authority
- AR
- Argentina
- Prior art keywords
- thickness
- measure
- movement
- high speeds
- object position
- Prior art date
Links
- 238000000034 method Methods 0.000 title abstract 2
- 239000011248 coating agent Substances 0.000 abstract 2
- 238000000576 coating method Methods 0.000 abstract 2
Classifications
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
- G01B11/06—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
- G01B11/0616—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of coating
- G01B11/0625—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of coating with measurement of absorption or reflection
- G01B11/0633—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of coating with measurement of absorption or reflection using one or more discrete wavelengths
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
- G01B11/026—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness by measuring distance between sensor and object
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
- G01B11/06—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
- G01B11/0691—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of objects while moving
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B21/00—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
- G01B21/02—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness
- G01B21/06—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness specially adapted for measuring length or width of objects while moving
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
- G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
- G01N21/255—Details, e.g. use of specially adapted sources, lighting or optical systems
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/8422—Investigating thin films, e.g. matrix isolation method
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/8422—Investigating thin films, e.g. matrix isolation method
- G01N2021/8427—Coatings
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
- G01N21/84—Systems specially adapted for particular applications
- G01N21/88—Investigating the presence of flaws or contamination
- G01N21/90—Investigating the presence of flaws or contamination in a container or its contents
- G01N21/9054—Inspection of sealing surface and container finish
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Biochemistry (AREA)
- Life Sciences & Earth Sciences (AREA)
- Chemical & Material Sciences (AREA)
- Analytical Chemistry (AREA)
- Health & Medical Sciences (AREA)
- General Health & Medical Sciences (AREA)
- Immunology (AREA)
- Pathology (AREA)
- Mathematical Physics (AREA)
- Spectroscopy & Molecular Physics (AREA)
- Length Measuring Devices By Optical Means (AREA)
Abstract
Métodos y aparatos para medir un grosor de un recubrimiento sobre un objeto en movimiento. Se dirige la luz hacia el objeto en una ubicación predeterminada sobre el objeto de tal manera que una porción de la luz interactúa con el objeto. Se capturan las intensidades máximas 1D y/o 2D para por lo menos un canal de longitud de onda que se produce por la porción de la luz que interactúa con el objeto. Una intensidad promedio medida del canal de longitud de onda y/o intensidades y sus derivados aritméticos de múltiples geometrías de canal de longitud de onda se convierten en valores de grosor 1D (ponderado) y/o 2D. Con base en estos valores se evalúa una aceptabilidad del recubrimiento y se calcula el grosor.
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US201662275912P | 2016-01-07 | 2016-01-07 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| AR107319A1 true AR107319A1 (es) | 2018-04-18 |
Family
ID=59273931
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| ARP170100043A AR107319A1 (es) | 2016-01-07 | 2017-01-06 | Método independiente de posición de objeto para medir el grosor de recubrimientos depositados sobre objetos curvos en movimiento a altas velocidades |
Country Status (7)
| Country | Link |
|---|---|
| US (1) | US10788314B2 (es) |
| EP (1) | EP3400430A4 (es) |
| CN (1) | CN108474732B (es) |
| AR (1) | AR107319A1 (es) |
| MX (1) | MX389629B (es) |
| TW (1) | TWI731020B (es) |
| WO (1) | WO2017120161A1 (es) |
Families Citing this family (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US10871386B1 (en) * | 2017-06-21 | 2020-12-22 | Mark Buntain | Sensor mount |
| JP6368408B1 (ja) * | 2017-08-08 | 2018-08-01 | Ckd株式会社 | ブリスタ包装機 |
| DE102018103171A1 (de) * | 2017-11-23 | 2019-05-23 | Tdk Electronics Ag | Verfahren zum Bestimmen von Eigenschaften einer Beschichtung auf einer transparenten Folie, Verfahren zur Herstellung einer Kondensatorfolie und Einrichtung zum Bestimmen von Eigenschaften einer Beschichtung auf einer transparenten Folie |
| US11067476B2 (en) * | 2018-02-21 | 2021-07-20 | Schneider Gmbh & Co. Kg | Apparatus and method for measuring at least one optically effective object |
| JP7502328B2 (ja) * | 2019-04-12 | 2024-06-18 | ビーエーエスエフ コーティングス ゲゼルシャフト ミット ベシュレンクテル ハフツング | プローブ表面のコーティングの検査方法 |
| CN111076673B (zh) * | 2019-11-27 | 2024-05-24 | 中国科学院金属研究所 | 一种非接触式轮廓仪管材样品快捷定位装置及操作方法 |
| US11137343B2 (en) * | 2019-12-10 | 2021-10-05 | Trustees Of Boston University | Apparatus and method for biomolecular analysis |
| IL273779B2 (en) * | 2020-04-02 | 2024-10-01 | Yehuda Hai Vidal | Method and apparatus for mapping and ranging based on coherent-time comparison |
| FR3116118B1 (fr) * | 2020-11-12 | 2024-07-12 | Exelsius | Dispositif de caractérisation de l’état de réticulation d’un matériau d’un objet. |
| CN116603716B (zh) * | 2023-04-28 | 2024-03-29 | 宁波市融嘉轻合金科技有限公司 | 一种压铸件表面处理方法、系统、智能终端及存储介质 |
| CN120293982B (zh) * | 2025-03-04 | 2025-11-04 | 泸州川玻科技有限公司 | 一种玻璃瓶表面喷涂质量检测方法 |
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| US4651568A (en) | 1984-08-30 | 1987-03-24 | Kirin Beer Kabushiki Kaisha | Glass bottle inspection |
| US4748329A (en) * | 1987-02-17 | 1988-05-31 | Canadian Patents And Development Ltd. | Method for on-line thickness monitoring of a transparent film |
| CA2034162A1 (en) * | 1990-02-23 | 1991-08-24 | Akira Inoue | Method and apparatus for measuring the thickness of a coating |
| GB9219450D0 (en) * | 1992-09-15 | 1992-10-28 | Glaverbel | Thin film thickness monitoring and control |
| DE69627328T2 (de) * | 1995-06-14 | 2004-02-12 | Kirin Beer K.K. | Verfahren und vorrichtungen zur prüfung von beschichtungen |
| US5619330A (en) | 1995-12-22 | 1997-04-08 | Thomson Consumer Electronics, Inc. | Method and apparatus for determining thickness of an OPC layer on a CRT faceplate panel |
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| TW428079B (en) * | 1998-12-24 | 2001-04-01 | Sharp Kk | Thickness measurement apparatus of thin film using light interference method |
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-
2017
- 2017-01-04 CN CN201780006021.6A patent/CN108474732B/zh not_active Expired - Fee Related
- 2017-01-04 MX MX2018008322A patent/MX389629B/es unknown
- 2017-01-04 WO PCT/US2017/012087 patent/WO2017120161A1/en not_active Ceased
- 2017-01-04 EP EP17736210.0A patent/EP3400430A4/en not_active Withdrawn
- 2017-01-04 US US16/065,837 patent/US10788314B2/en not_active Expired - Fee Related
- 2017-01-06 AR ARP170100043A patent/AR107319A1/es active IP Right Grant
- 2017-01-06 TW TW106100477A patent/TWI731020B/zh not_active IP Right Cessation
Also Published As
| Publication number | Publication date |
|---|---|
| US10788314B2 (en) | 2020-09-29 |
| TW201734407A (zh) | 2017-10-01 |
| MX389629B (es) | 2025-03-20 |
| EP3400430A4 (en) | 2019-11-06 |
| CN108474732B (zh) | 2022-04-15 |
| US20190011251A1 (en) | 2019-01-10 |
| WO2017120161A1 (en) | 2017-07-13 |
| MX2018008322A (es) | 2018-09-21 |
| EP3400430A1 (en) | 2018-11-14 |
| CN108474732A (zh) | 2018-08-31 |
| TWI731020B (zh) | 2021-06-21 |
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Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| FG | Grant, registration |