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MX2018008322A - Metodo independiente de la posicion del objeto para medir el espesor de recubrimientos depositados en objetos curvados moviendose a altas velocidades. - Google Patents

Metodo independiente de la posicion del objeto para medir el espesor de recubrimientos depositados en objetos curvados moviendose a altas velocidades.

Info

Publication number
MX2018008322A
MX2018008322A MX2018008322A MX2018008322A MX2018008322A MX 2018008322 A MX2018008322 A MX 2018008322A MX 2018008322 A MX2018008322 A MX 2018008322A MX 2018008322 A MX2018008322 A MX 2018008322A MX 2018008322 A MX2018008322 A MX 2018008322A
Authority
MX
Mexico
Prior art keywords
thickness
measure
object position
high rates
objects moving
Prior art date
Application number
MX2018008322A
Other languages
English (en)
Other versions
MX389629B (es
Inventor
E Moeller Gunter
Y Korotkov Roman
C Smith Ryan
Original Assignee
Arkema Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Arkema Inc filed Critical Arkema Inc
Publication of MX2018008322A publication Critical patent/MX2018008322A/es
Publication of MX389629B publication Critical patent/MX389629B/es

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/06—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
    • G01B11/0616—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of coating
    • G01B11/0625—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of coating with measurement of absorption or reflection
    • G01B11/0633—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of coating with measurement of absorption or reflection using one or more discrete wavelengths
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/026—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness by measuring distance between sensor and object
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
    • G01B11/06—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
    • G01B11/0691—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of objects while moving
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B21/00—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant
    • G01B21/02—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness
    • G01B21/06—Measuring arrangements or details thereof, where the measuring technique is not covered by the other groups of this subclass, unspecified or not relevant for measuring length, width, or thickness specially adapted for measuring length or width of objects while moving
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17—Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/25—Colour; Spectral properties, i.e. comparison of effect of material on the light at two or more different wavelengths or wavelength bands
    • G01N21/255—Details, e.g. use of specially adapted sources, lighting or optical systems
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/8422—Investigating thin films, e.g. matrix isolation method
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/8422—Investigating thin films, e.g. matrix isolation method
    • G01N2021/8427—Coatings
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00—Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/84—Systems specially adapted for particular applications
    • G01N21/88—Investigating the presence of flaws or contamination
    • G01N21/90—Investigating the presence of flaws or contamination in a container or its contents
    • G01N21/9054—Inspection of sealing surface and container finish

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Biochemistry (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Health & Medical Sciences (AREA)
  • General Health & Medical Sciences (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Mathematical Physics (AREA)
  • Spectroscopy & Molecular Physics (AREA)
  • Length Measuring Devices By Optical Means (AREA)

Abstract

Se proporcionan métodos y aparatos para medir un espesor de un recubrimiento en un objeto en movimiento. La luz se dirige hacia el objeto en una ubicación predeterminada en el objeto tal que una porción de la luz interactúa con el objeto. Intensidades máximas 1D y/o 2D para al menos un canal de longitud de onda se captura que se produce por la porción de la luz que interactúa con el objeto. Una intensidad promedio medida del canal de longitud de onda e/o intensidades y sus derivados aritméticos de geometrías de canal de longitud de onda múltiple se convierte en valores de espesor 1D (promediado) y/o 2D. Con base en estos valores una aceptabilidad del recubrimiento es evaluada y el espesor calculado.
MX2018008322A 2016-01-07 2017-01-04 Metodo independiente de la posicion del objeto para medir el espesor de recubrimientos depositados en objetos curvados moviendose a altas velocidades. MX389629B (es)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US201662275912P 2016-01-07 2016-01-07
PCT/US2017/012087 WO2017120161A1 (en) 2016-01-07 2017-01-04 Object position independent method to measure the thickness of coatings deposited on curved objects moving at high rates

Publications (2)

Publication Number Publication Date
MX2018008322A true MX2018008322A (es) 2018-09-21
MX389629B MX389629B (es) 2025-03-20

Family

ID=59273931

Family Applications (1)

Application Number Title Priority Date Filing Date
MX2018008322A MX389629B (es) 2016-01-07 2017-01-04 Metodo independiente de la posicion del objeto para medir el espesor de recubrimientos depositados en objetos curvados moviendose a altas velocidades.

Country Status (7)

Country Link
US (1) US10788314B2 (es)
EP (1) EP3400430A4 (es)
CN (1) CN108474732B (es)
AR (1) AR107319A1 (es)
MX (1) MX389629B (es)
TW (1) TWI731020B (es)
WO (1) WO2017120161A1 (es)

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CN120293982B (zh) * 2025-03-04 2025-11-04 泸州川玻科技有限公司 一种玻璃瓶表面喷涂质量检测方法

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Also Published As

Publication number Publication date
US10788314B2 (en) 2020-09-29
TW201734407A (zh) 2017-10-01
MX389629B (es) 2025-03-20
EP3400430A4 (en) 2019-11-06
CN108474732B (zh) 2022-04-15
US20190011251A1 (en) 2019-01-10
WO2017120161A1 (en) 2017-07-13
EP3400430A1 (en) 2018-11-14
CN108474732A (zh) 2018-08-31
AR107319A1 (es) 2018-04-18
TWI731020B (zh) 2021-06-21

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