[go: up one dir, main page]

NO20061073L - Kapasitansdeteksjonskrets og fremgangsmate for kapasitansdeteksjon - Google Patents

Kapasitansdeteksjonskrets og fremgangsmate for kapasitansdeteksjon

Info

Publication number
NO20061073L
NO20061073L NO20061073A NO20061073A NO20061073L NO 20061073 L NO20061073 L NO 20061073L NO 20061073 A NO20061073 A NO 20061073A NO 20061073 A NO20061073 A NO 20061073A NO 20061073 L NO20061073 L NO 20061073L
Authority
NO
Norway
Prior art keywords
capacitance detection
diodes
detection circuit
signal line
capacitance
Prior art date
Application number
NO20061073A
Other languages
English (en)
Norwegian (no)
Inventor
Masami Yakabe
Original Assignee
Tokyo Electron Ltd
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Tokyo Electron Ltd filed Critical Tokyo Electron Ltd
Publication of NO20061073L publication Critical patent/NO20061073L/no

Links

Classifications

    • H—ELECTRICITY
    • H04—ELECTRIC COMMUNICATION TECHNIQUE
    • H04R—LOUDSPEAKERS, MICROPHONES, GRAMOPHONE PICK-UPS OR LIKE ACOUSTIC ELECTROMECHANICAL TRANSDUCERS; DEAF-AID SETS; PUBLIC ADDRESS SYSTEMS
    • H04R3/00—Circuits for transducers, loudspeakers or microphones
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
    • G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
    • G01R27/26—Measuring inductance or capacitance; Measuring quality factor, e.g. by using the resonance method; Measuring loss factor; Measuring dielectric constants ; Measuring impedance or related variables

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Acoustics & Sound (AREA)
  • Signal Processing (AREA)
  • General Physics & Mathematics (AREA)
  • Measurement Of Resistance Or Impedance (AREA)
  • Amplifiers (AREA)
  • Semiconductor Integrated Circuits (AREA)
NO20061073A 2003-08-06 2006-03-06 Kapasitansdeteksjonskrets og fremgangsmate for kapasitansdeteksjon NO20061073L (no)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
JP2003287991A JP3693665B2 (ja) 2003-08-06 2003-08-06 容量検出回路及び容量検出方法
PCT/JP2004/011577 WO2005015246A1 (ja) 2003-08-06 2004-08-05 容量検出回路及び容量検出方法

Publications (1)

Publication Number Publication Date
NO20061073L true NO20061073L (no) 2006-05-05

Family

ID=34131497

Family Applications (1)

Application Number Title Priority Date Filing Date
NO20061073A NO20061073L (no) 2003-08-06 2006-03-06 Kapasitansdeteksjonskrets og fremgangsmate for kapasitansdeteksjon

Country Status (8)

Country Link
US (1) US7557590B2 (ja)
EP (1) EP1686383A4 (ja)
JP (1) JP3693665B2 (ja)
KR (1) KR100655258B1 (ja)
CN (1) CN100478691C (ja)
NO (1) NO20061073L (ja)
TW (1) TWI266061B (ja)
WO (1) WO2005015246A1 (ja)

Families Citing this family (32)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
TWI240403B (en) * 2004-04-29 2005-09-21 Via Tech Inc Electrostatic discharge protection circuit
KR20070078522A (ko) * 2006-01-27 2007-08-01 삼성전자주식회사 표시 장치 및 액정 표시 장치
JP4816487B2 (ja) * 2007-02-13 2011-11-16 アイシン精機株式会社 静電容量検出装置
US8711129B2 (en) * 2007-01-03 2014-04-29 Apple Inc. Minimizing mismatch during compensation
US8049732B2 (en) 2007-01-03 2011-11-01 Apple Inc. Front-end signal compensation
CN101281220B (zh) * 2008-01-02 2010-09-29 清华大学 电容检测电路及其电容式传感器接口电路芯片
TWI383310B (zh) * 2008-03-14 2013-01-21 Tpo Displays Corp 控制方法、電路及電子系統
DE102008057823A1 (de) * 2008-11-18 2010-08-19 Ident Technology Ag Kapazitives Sensorsystem
EP2299284A1 (en) * 2009-09-18 2011-03-23 ABB Technology AG Method, capacitance meter, and computer program product for improved capacitance measurement
JP2011170616A (ja) * 2010-02-18 2011-09-01 On Semiconductor Trading Ltd 静電容量型タッチセンサ
CN102193695A (zh) * 2010-03-05 2011-09-21 启迪科技股份有限公司 触控面板测试设备及其检测装置
EP2413149A1 (en) * 2010-07-29 2012-02-01 Imec Capacitance measurement in microchips
US8688393B2 (en) * 2010-07-29 2014-04-01 Medtronic, Inc. Techniques for approximating a difference between two capacitances
US8860455B2 (en) * 2010-12-24 2014-10-14 Intel Corporation Methods and systems to measure a signal on an integrated circuit die
US8780512B2 (en) * 2011-04-01 2014-07-15 Neurosky, Inc. Low leakage ESD structure for non-contact bio-signal sensors
US8933712B2 (en) 2012-01-31 2015-01-13 Medtronic, Inc. Servo techniques for approximation of differential capacitance of a sensor
CN102749525B (zh) * 2012-06-05 2015-05-20 泰凌微电子（上海）有限公司 电容检测方法及电容检测电路
KR101497586B1 (ko) * 2012-07-05 2015-03-02 호쿠토 덴시 고교 가부시키가이샤 정전용량형의 수분 검출 장치
CN103969468B (zh) * 2013-01-29 2019-03-15 北京哲朗科技有限公司 微机械加速度计小电容补偿方法
US10260983B2 (en) * 2014-01-20 2019-04-16 Lear Corporation Apparatus and method for diagnostics of a capacitive sensor with plausibility check
EP3123816B1 (de) * 2014-03-24 2017-12-27 BSH Hausgeräte GmbH Gargerätevorrichtung mit selbststeuernder überbrückungseinheit
CN104316087B (zh) * 2014-09-30 2017-01-18 广东合微集成电路技术有限公司 一种电容式传感器的测量电路
US9706312B2 (en) * 2014-12-16 2017-07-11 Stmicroelectronics S.R.L. Sensing circuit and method of detecting an electrical signal generated by a microphone
JP6832207B2 (ja) * 2017-03-29 2021-02-24 東京エレクトロン株式会社 静電容量測定用の測定器
JP6960831B2 (ja) * 2017-11-17 2021-11-05 エイブリック株式会社 センサ装置
CN108168580B (zh) * 2017-12-21 2020-05-08 中国科学院上海微系统与信息技术研究所 一种用于硅基mems电容式传感器的防静电结构
TWI645200B (zh) * 2018-01-04 2018-12-21 國立彰化師範大學 非接觸式靜電量測裝置
CN108519541A (zh) * 2018-04-23 2018-09-11 珠海深圳清华大学研究院创新中心 一种检测电路及检测设备
US11698276B2 (en) * 2018-12-10 2023-07-11 Aisin Corporation Capacitance sensor
CN110823316B (zh) * 2019-10-25 2021-10-01 德阳市新泰自动化仪表有限公司 具有屏蔽干扰功能的电容信号检测电路
KR102793461B1 (ko) * 2020-01-16 2025-04-10 삼성디스플레이 주식회사 정전기 방전 보호 회로 및 이를 포함하는 유기 발광 표시 장치
WO2025028142A1 (ja) * 2023-08-02 2025-02-06 株式会社村田製作所 回路装置、センサ装置及び判定装置

Family Cites Families (20)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US3646538A (en) * 1969-10-27 1972-02-29 Rosemount Eng Co Ltd Transducer circuitry for converting a capacitance signal to a dc current signal
US5285120A (en) * 1988-09-15 1994-02-08 Rockwell International Corporation Broadband phase splitter
JPH05335493A (ja) 1992-05-28 1993-12-17 Sanyo Electric Co Ltd 入力保護回路
CN1048555C (zh) * 1993-05-29 2000-01-19 黄良兆 电感、电容检测电路及多参数测试仪
GB9422911D0 (en) * 1994-11-14 1995-01-04 Moonstone Technology Ltd Capacitive touch detectors
ATE190405T1 (de) * 1995-01-18 2000-03-15 Carlo Gavazzi Services Ag Kapazitiver sensor
US6151967A (en) * 1998-03-10 2000-11-28 Horizon Technology Group Wide dynamic range capacitive transducer
US6005439A (en) * 1998-07-09 1999-12-21 National Semiconductor Corporation Unity gain signal amplifier
US6271060B1 (en) * 1999-09-13 2001-08-07 Vishay Intertechnology, Inc. Process of fabricating a chip scale surface mount package for semiconductor device
US6724324B1 (en) * 2000-08-21 2004-04-20 Delphi Technologies, Inc. Capacitive proximity sensor
JP2002100761A (ja) * 2000-09-21 2002-04-05 Mitsubishi Electric Corp シリコンｍｏｓｆｅｔ高周波半導体デバイスおよびその製造方法
CA2360031C (en) * 2000-10-30 2006-06-20 Thomas & Betts International, Inc. Capacitive test point voltage and phasing detector
US7102366B2 (en) * 2001-02-09 2006-09-05 Georgia-Pacific Corporation Proximity detection circuit and method of detecting capacitance changes
US6894324B2 (en) 2001-02-15 2005-05-17 United Microelectronics Corp. Silicon-on-insulator diodes and ESD protection circuits
TW475250B (en) 2001-03-14 2002-02-01 Taiwan Semiconductor Mfg ESD protection circuit to be used in high-frequency input/output port with low capacitance load
DE10134680A1 (de) * 2001-07-20 2003-02-06 Endress & Hauser Gmbh & Co Kg Schaltungsanrdnung für einen kapazitiven Sensor
JP2003075486A (ja) 2001-09-06 2003-03-12 Sumitomo Metal Ind Ltd インピーダンス検出回路及び静電容量検出回路とその方法
US6950514B2 (en) * 2002-03-06 2005-09-27 Intersil Americas Inc. Voltage reference filter for subscriber line interface circuit
US7315438B2 (en) * 2003-06-10 2008-01-01 Seiko Epson Corporation Technique to reduce ESD loading capacitance
JP4455201B2 (ja) * 2004-07-20 2010-04-21 富士通マイクロエレクトロニクス株式会社 検出回路

Also Published As

Publication number Publication date
TWI266061B (en) 2006-11-11
JP2005055362A (ja) 2005-03-03
WO2005015246A1 (ja) 2005-02-17
US20080150553A1 (en) 2008-06-26
EP1686383A4 (en) 2007-09-26
KR20060024345A (ko) 2006-03-16
JP3693665B2 (ja) 2005-09-07
US7557590B2 (en) 2009-07-07
TW200508619A (en) 2005-03-01
CN100478691C (zh) 2009-04-15
KR100655258B1 (ko) 2006-12-11
EP1686383A1 (en) 2006-08-02
CN1826534A (zh) 2006-08-30

Similar Documents

Publication Publication Date Title
NO20061073L (no) Kapasitansdeteksjonskrets og fremgangsmate for kapasitansdeteksjon
DK1219967T3 (da) Impedansdetektionskredslöb, impedansdetektor og fremgangsmåde til detektion af impedans
DE60326392D1 (de) Pwm-led-regler mit abtast- und haltefunktion
RU2008127878A (ru) Устройство обработки сигнала пьезоэлектрического преобразователя
TW200511700A (en) Switching power supply
JPS6410704A (en) High frequency detecting circuit
NO20032014D0 (no) Impedans deteksjonskrets og elektrostatisk kapasitans deteksjonskrets
NO20032013L (no) Impedansdeteksjonskrets, metode derav og elektrostatisk kapasitansdeteksjonskrets
NO20032011D0 (no) Elektrostatisk kapasitansdetekteringskrets, elektrostatisk kapasitansdetekteringsanordning og mikrofonanordning
TW200614846A (en) Signal amplifying circuit and acceleration sensor having the same
NO20032015L (no) Anordning og fremgangsmate for sensorkapasitansdeteksjon
KR910007238A (ko) 증폭 회로
DE3260920D1 (en) Sliding class a broadband linear amplifier with low power consumption, and circuit comprising at least one such amplifier
TW415068B (en) Detection circuit
CN201210089Y (zh) 热释电红外传感器
CN115765649A (zh) 电流放大电路及其驱动方法、环境光检测电路和显示面板
CA2292714A1 (en) Constant current power supply over a wide range of input voltages
RU2007144027A (ru) Высокочастотный усилитель на транзисторе по схеме с общей базой
DE50008276D1 (de) Symmetrierschaltungsanordnung
ATE431645T1 (de) Erfassung von rf-leistung einer verstärkervorrichtung
CN112485494A (zh) 一种基于三极管的电流检测电路
RU2399916C1 (ru) Согласующее устройство с двухпроводным интерфейсом для пьезодатчика
SE9101459D0 (sv) Limiterande foerstaerkare
SUN Application of class-D power amplifier in underwater sound projector(Abstract Only)
CN204902856U (zh) 一种具有放大电路的光电传感器

Legal Events

Date Code Title Description
FC2A Withdrawal, rejection or dismissal of laid open patent application