JP4455201B2 - 検出回路 - Google Patents
検出回路 Download PDFInfo
- Publication number
- JP4455201B2 JP4455201B2 JP2004212025A JP2004212025A JP4455201B2 JP 4455201 B2 JP4455201 B2 JP 4455201B2 JP 2004212025 A JP2004212025 A JP 2004212025A JP 2004212025 A JP2004212025 A JP 2004212025A JP 4455201 B2 JP4455201 B2 JP 4455201B2
- Authority
- JP
- Japan
- Prior art keywords
- signal
- circuit
- oscillation
- detection circuit
- oscillator
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Expired - Fee Related
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Classifications
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01P—MEASURING LINEAR OR ANGULAR SPEED, ACCELERATION, DECELERATION, OR SHOCK; INDICATING PRESENCE, ABSENCE, OR DIRECTION, OF MOVEMENT
- G01P15/00—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration
- G01P15/02—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses
- G01P15/08—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses with conversion into electric or magnetic values
- G01P15/125—Measuring acceleration; Measuring deceleration; Measuring shock, i.e. sudden change of acceleration by making use of inertia forces using solid seismic masses with conversion into electric or magnetic values by capacitive pick-up
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01C—MEASURING DISTANCES, LEVELS OR BEARINGS; SURVEYING; NAVIGATION; GYROSCOPIC INSTRUMENTS; PHOTOGRAMMETRY OR VIDEOGRAMMETRY
- G01C19/00—Gyroscopes; Turn-sensitive devices using vibrating masses; Turn-sensitive devices without moving masses; Measuring angular rate using gyroscopic effects
- G01C19/56—Turn-sensitive devices using vibrating masses, e.g. vibratory angular rate sensors based on Coriolis forces
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01D—MEASURING NOT SPECIALLY ADAPTED FOR A SPECIFIC VARIABLE; ARRANGEMENTS FOR MEASURING TWO OR MORE VARIABLES NOT COVERED IN A SINGLE OTHER SUBCLASS; TARIFF METERING APPARATUS; MEASURING OR TESTING NOT OTHERWISE PROVIDED FOR
- G01D5/00—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable
- G01D5/12—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable using electric or magnetic means
- G01D5/14—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable using electric or magnetic means influencing the magnitude of a current or voltage
- G01D5/24—Mechanical means for transferring the output of a sensing member; Means for converting the output of a sensing member to another variable where the form or nature of the sensing member does not constrain the means for converting; Transducers not specially adapted for a specific variable using electric or magnetic means influencing the magnitude of a current or voltage by varying capacitance
-
- G—PHYSICS
- G01—MEASURING; TESTING
- G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
- G01R27/00—Arrangements for measuring resistance, reactance, impedance, or electric characteristics derived therefrom
- G01R27/02—Measuring real or complex resistance, reactance, impedance, or other two-pole characteristics derived therefrom, e.g. time constant
- G01R27/26—Measuring inductance or capacitance; Measuring quality factor, e.g. by using the resonance method; Measuring loss factor; Measuring dielectric constants ; Measuring impedance or related variables
- G01R27/2605—Measuring capacitance
Landscapes
- Physics & Mathematics (AREA)
- General Physics & Mathematics (AREA)
- Engineering & Computer Science (AREA)
- Radar, Positioning & Navigation (AREA)
- Remote Sensing (AREA)
- Gyroscopes (AREA)
- Measurement Of Resistance Or Impedance (AREA)
- Measuring Fluid Pressure (AREA)
Description
Up1_M: PN1−ΔCP1
Down1_P: PN1+ΔCP1
Up2_P: PN2+ΔCP2
Down2_M: PN2−ΔCP2
となる。
=(PN1+PN2+ΔCP1+ΔCP2)−(PN1+PN2−ΔCP1−ΔCP2)
=2(ΔCP1+ΔCP2)
即ち、発振回路121及び122の発振パルス数PN1及びPN2のそれぞれの値に依存することなく、コリオリの力による発振パルス数の変化分だけを計算により取り出すことが可能となる。従って、製造ばらつき等により発振回路121と発振回路122とで発振周波数に差が生じた場合であっても、簡単な計算により製造ばらつき等に起因する誤差を取り除くことが可能である。
51、52 バッファ
53 位相比較器
54 チャージポンプ
55 ローパスフィルタ
56 カウンタ
57 基準電圧発生回路
58 スイッチ
59 サンプルホールド回路
121、122 発振回路
123、124 カウンタ
125 ALU
126 制御回路
127 記憶回路
Claims (5)
- センサの第1の容量と第2の容量との容量値の差を検出する検出回路であって、
発振信号を生成する発振器と、
該発振器に結合され、該第1の容量で遅延された該発振信号と該第2の容量で遅延された該発振信号との位相差に応じた信号を出力する位相比較器と、
該位相比較器に結合され、該位相差に応じた信号を該発振信号の所定数サイクルの期間分積分した信号を出力する積分回路と、
該積分回路に結合され、該積分した信号を該期間の終了タイミングでサンプルしホールドした信号を出力するサンプルホールド回路と、
基準信号を出力する基準信号発生回路と、
該センサを駆動する駆動信号を生成する発振回路と、
該発振回路に結合され、該駆動信号に応じたタイミング信号を出力する制御回路と、
該制御回路に結合され、該サンプルしホールドした信号に対する該第1の容量で遅延された該発振信号の効果と該第2の容量で遅延された該発振信号との効果とを該タイミング信号に応じて入れ替える切り替え回路と、
該発振器と該発振回路とは同期しており、該制御回路は該駆動信号が切り替わるタイミングで停止信号を出力し、該サンプルしホールドした信号に対する該発振信号の効果を該停止信号に応じて一時的に遮断する遮断回路と
を備え、
前記サンプルホールド回路が前記積分した信号をホールドした後に前記積分回路の出力を前記基準信号にリセットすること
を特徴とする検出回路。 - 該発振器と該発振回路とは同期しており、該制御回路は該駆動信号に応じた制御信号を出力し、該制御信号により該期間のタイミングを指示することを特徴とする請求項1記載の検出回路。
- 該制御回路は該センサの錘の運動方向が第1の方向から第2の方向に反転するタイミングで停止信号を出力し、前記遮断回路は、該サンプルしホールドした信号に対する該発振信号の効果を該停止信号に応じて一時的に遮断することを特徴とする請求項1記載の検出回路。
- 前記位相差に応じた信号を第1信号に変換するチャージポンプ回路を含み、
前記積分回路は前記第1信号を積分すること
を特徴とする請求項1乃至3何れか一項記載の検出回路。 - 前記所定数をカウントしてカウント信号を出力するカウンタと、
前記カウント信号に基づいて前記基準信号を前記積分回路の出力に供給するスイッチと、
を含むことを特徴とする請求項1乃至4何れか一項記載の検出回路。
Priority Applications (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2004212025A JP4455201B2 (ja) | 2004-07-20 | 2004-07-20 | 検出回路 |
| US10/981,795 US7119555B2 (en) | 2004-07-20 | 2004-11-05 | Circuit for detecting difference in capacitance |
| US11/520,757 US7250773B2 (en) | 2004-07-20 | 2006-09-14 | Circuit for detecting difference in capacitance |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2004212025A JP4455201B2 (ja) | 2004-07-20 | 2004-07-20 | 検出回路 |
Related Child Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2009230531A Division JP5003740B2 (ja) | 2009-10-02 | 2009-10-02 | 検出回路 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| JP2006030082A JP2006030082A (ja) | 2006-02-02 |
| JP4455201B2 true JP4455201B2 (ja) | 2010-04-21 |
Family
ID=35656454
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP2004212025A Expired - Fee Related JP4455201B2 (ja) | 2004-07-20 | 2004-07-20 | 検出回路 |
Country Status (2)
| Country | Link |
|---|---|
| US (2) | US7119555B2 (ja) |
| JP (1) | JP4455201B2 (ja) |
Families Citing this family (21)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP3693665B2 (ja) * | 2003-08-06 | 2005-09-07 | 東京エレクトロン株式会社 | 容量検出回路及び容量検出方法 |
| KR100934222B1 (ko) * | 2007-08-29 | 2009-12-29 | 한국전자통신연구원 | 고해상도의 정전용량-시간 변환 회로 |
| JP4975824B2 (ja) * | 2007-10-18 | 2012-07-11 | パイオニア株式会社 | 静電容量検出装置 |
| JP5083287B2 (ja) * | 2009-09-11 | 2012-11-28 | セイコーエプソン株式会社 | 検出装置、物理量測定装置及び電子機器 |
| TWI392877B (zh) | 2009-11-17 | 2013-04-11 | Ili Technology Corp | 電容感測電路以及電容差異感測方法 |
| JP5225410B2 (ja) * | 2011-03-02 | 2013-07-03 | 日本航空電子工業株式会社 | 容量検出装置、抵抗検出装置 |
| CN102221362B (zh) * | 2011-04-12 | 2012-11-14 | 浙江大学 | 一种光纤陀螺输出延迟时间的测量装置及其方法 |
| KR20130028346A (ko) * | 2011-09-09 | 2013-03-19 | 삼성전기주식회사 | 가속도 측정장치 및 가속도 측정방법 |
| CN103376366B (zh) * | 2012-04-16 | 2016-08-24 | 西门子公司 | 一种测量电容值的方法和设备 |
| DE102012224081A1 (de) | 2012-12-20 | 2014-06-26 | Continental Teves Ag & Co. Ohg | Sensor zum Erfassen einer Drehrate eines Objektes |
| EP2746729A1 (en) | 2012-12-20 | 2014-06-25 | GN Store Nord A/S | An assembly and a method of determining a change in capacitance |
| CN106415203A (zh) | 2014-06-26 | 2017-02-15 | 路梅戴尼科技公司 | 用于从来自传感器的非线性周期信号提取系统参数的系统和方法 |
| EP3298414A1 (en) | 2015-05-20 | 2018-03-28 | Lumedyne Technologies Incorporated | Extracting inertial information from nonlinear periodic signals |
| DE102015008485A1 (de) * | 2015-07-01 | 2017-01-05 | Leopold Kostal Gmbh & Co. Kg | Verfahren zum Messen eines Kapazitätswertes |
| US20170153266A1 (en) * | 2015-11-30 | 2017-06-01 | Lumedyne Technologies Incorporated | Systems and methods for determining inertial parameters using integration |
| US10234477B2 (en) | 2016-07-27 | 2019-03-19 | Google Llc | Composite vibratory in-plane accelerometer |
| US10466067B2 (en) | 2017-01-19 | 2019-11-05 | The Boeing Company | System and method for gyro rate computation for a Coriolis Vibrating Gyroscope |
| US11531424B2 (en) * | 2017-09-07 | 2022-12-20 | Cypress Semiconductor Corporation | Nano-power capacitance-to-digital converter |
| CN110208607B (zh) * | 2019-07-05 | 2021-07-13 | 杭州西湖电子研究所 | 一种相对电容比的检测方法 |
| KR20210096957A (ko) * | 2020-01-29 | 2021-08-06 | 삼성전기주식회사 | 공통잡음 저감기능을 갖는 포스 센싱 장치 및 전기 기기 |
| WO2023080424A1 (ko) * | 2021-11-05 | 2023-05-11 | 삼성전자주식회사 | 센서 데이터를 획득하는 방법 및 장치 |
Family Cites Families (17)
| Publication number | Priority date | Publication date | Assignee | Title |
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| FR2208121B1 (ja) * | 1972-11-29 | 1978-12-29 | Commissariat Energie Atomique | |
| US3895293A (en) * | 1973-07-14 | 1975-07-15 | Elma Hans Schmidbauer | Method and system for furnishing an indication of the deviation of the actual frequency of a low frequency signal from a nominal frequency |
| JPH0697246B2 (ja) * | 1991-07-25 | 1994-11-30 | 株式会社ジャルコ | Pll回路を用いた浮遊容量の変化検出方法 |
| US5394097A (en) * | 1992-11-24 | 1995-02-28 | Bechtel; Friend K. | Dielectric sensor |
| JP3410164B2 (ja) * | 1993-07-13 | 2003-05-26 | 株式会社日立メディコ | インバータ式x線高電圧装置 |
| JP3216955B2 (ja) * | 1994-05-31 | 2001-10-09 | 株式会社日立製作所 | 容量式センサ装置 |
| US5691646A (en) * | 1994-12-07 | 1997-11-25 | Mitutoya Corporation | Capacitance-type displacement measuring device with electrodes having spiral patterns |
| DE19524387C1 (de) * | 1995-07-04 | 1996-11-07 | Siemens Ag | Schaltungsanordnung und Verfahren zum Messen eines Kapazitätsunterschiedes zwischen einer ersten Kapazität C1 und einer zweiten Kapazität C2 |
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| US6304091B1 (en) * | 1998-02-10 | 2001-10-16 | Immersion Corporation | Absolute position sensing by phase shift detection using a variable capacitor |
| JP4075022B2 (ja) * | 1998-06-24 | 2008-04-16 | アイシン精機株式会社 | 角速度センサ |
| US6257057B1 (en) * | 1998-12-16 | 2001-07-10 | L-3 Communications Corporation | Epitaxial coriolis rate sensor |
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-
2004
- 2004-07-20 JP JP2004212025A patent/JP4455201B2/ja not_active Expired - Fee Related
- 2004-11-05 US US10/981,795 patent/US7119555B2/en not_active Expired - Lifetime
-
2006
- 2006-09-14 US US11/520,757 patent/US7250773B2/en not_active Expired - Fee Related
Also Published As
| Publication number | Publication date |
|---|---|
| JP2006030082A (ja) | 2006-02-02 |
| US7119555B2 (en) | 2006-10-10 |
| US20060017449A1 (en) | 2006-01-26 |
| US7250773B2 (en) | 2007-07-31 |
| US20070007971A1 (en) | 2007-01-11 |
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