[go: up one dir, main page]

NL1036273A1 - Lithographic apparatus and method of cleaning a surface of an immersion lithographic apparatus. - Google Patents

Lithographic apparatus and method of cleaning a surface of an immersion lithographic apparatus. Download PDF

Info

Publication number
NL1036273A1
NL1036273A1 NL1036273A NL1036273A NL1036273A1 NL 1036273 A1 NL1036273 A1 NL 1036273A1 NL 1036273 A NL1036273 A NL 1036273A NL 1036273 A NL1036273 A NL 1036273A NL 1036273 A1 NL1036273 A1 NL 1036273A1
Authority
NL
Netherlands
Prior art keywords
lithographic apparatus
cleaning
immersion
immersion lithographic
lithographic
Prior art date
Application number
NL1036273A
Other languages
English (en)
Inventor
Anthonius Martinus Cornelis Jong
Hans Jansen
Josephus Cornelius Johan Vugts
Jacques Cor Johan Van De Donck
Teunis Cornelis Van Den Dool
Gerrit Oosterhuis
Original Assignee
Asml Netherlands Bv
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Asml Netherlands Bv filed Critical Asml Netherlands Bv
Publication of NL1036273A1 publication Critical patent/NL1036273A1/nl

Links

Classifications

    • BPERFORMING OPERATIONS; TRANSPORTING
    • B08CLEANING
    • B08BCLEANING IN GENERAL; PREVENTION OF FOULING IN GENERAL
    • B08B3/00Cleaning by methods involving the use or presence of liquid or steam
    • B08B3/02Cleaning by the force of jets or sprays
    • BPERFORMING OPERATIONS; TRANSPORTING
    • B08CLEANING
    • B08BCLEANING IN GENERAL; PREVENTION OF FOULING IN GENERAL
    • B08B5/00Cleaning by methods involving the use of air flow or gas flow
    • B08B5/02Cleaning by the force of jets, e.g. blowing-out cavities
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70Microphotolithographic exposure; Apparatus therefor
    • G03F7/70216Mask projection systems
    • G03F7/70341Details of immersion lithography aspects, e.g. exposure media or control of immersion liquid supply
    • GPHYSICS
    • G03PHOTOGRAPHY; CINEMATOGRAPHY; ANALOGOUS TECHNIQUES USING WAVES OTHER THAN OPTICAL WAVES; ELECTROGRAPHY; HOLOGRAPHY
    • G03FPHOTOMECHANICAL PRODUCTION OF TEXTURED OR PATTERNED SURFACES, e.g. FOR PRINTING, FOR PROCESSING OF SEMICONDUCTOR DEVICES; MATERIALS THEREFOR; ORIGINALS THEREFOR; APPARATUS SPECIALLY ADAPTED THEREFOR
    • G03F7/00Photomechanical, e.g. photolithographic, production of textured or patterned surfaces, e.g. printing surfaces; Materials therefor, e.g. comprising photoresists; Apparatus specially adapted therefor
    • G03F7/70Microphotolithographic exposure; Apparatus therefor
    • G03F7/708Construction of apparatus, e.g. environment aspects, hygiene aspects or materials
    • G03F7/70908Hygiene, e.g. preventing apparatus pollution, mitigating effect of pollution or removing pollutants from apparatus
    • G03F7/70925Cleaning, i.e. actively freeing apparatus from pollutants, e.g. using plasma cleaning

Landscapes

  • Physics & Mathematics (AREA)
  • Engineering & Computer Science (AREA)
  • Health & Medical Sciences (AREA)
  • Epidemiology (AREA)
  • Public Health (AREA)
  • General Physics & Mathematics (AREA)
  • Plasma & Fusion (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Atmospheric Sciences (AREA)
  • Environmental & Geological Engineering (AREA)
  • Exposure Of Semiconductors, Excluding Electron Or Ion Beam Exposure (AREA)
  • Exposure And Positioning Against Photoresist Photosensitive Materials (AREA)
NL1036273A 2007-12-18 2008-12-03 Lithographic apparatus and method of cleaning a surface of an immersion lithographic apparatus. NL1036273A1 (nl)

Applications Claiming Priority (1)

Application Number Priority Date Filing Date Title
US609207P 2007-12-18 2007-12-18

Publications (1)

Publication Number Publication Date
NL1036273A1 true NL1036273A1 (nl) 2009-06-19

Family

ID=40844295

Family Applications (1)

Application Number Title Priority Date Filing Date
NL1036273A NL1036273A1 (nl) 2007-12-18 2008-12-03 Lithographic apparatus and method of cleaning a surface of an immersion lithographic apparatus.

Country Status (3)

Country Link
US (1) US9289802B2 (nl)
JP (1) JP5145206B2 (nl)
NL (1) NL1036273A1 (nl)

Families Citing this family (21)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7880860B2 (en) 2004-12-20 2011-02-01 Asml Netherlands B.V. Lithographic apparatus and device manufacturing method
US8654305B2 (en) * 2007-02-15 2014-02-18 Asml Holding N.V. Systems and methods for insitu lens cleaning in immersion lithography
US8817226B2 (en) 2007-02-15 2014-08-26 Asml Holding N.V. Systems and methods for insitu lens cleaning using ozone in immersion lithography
US8011377B2 (en) 2007-05-04 2011-09-06 Asml Netherlands B.V. Cleaning device and a lithographic apparatus cleaning method
US7866330B2 (en) 2007-05-04 2011-01-11 Asml Netherlands B.V. Cleaning device, a lithographic apparatus and a lithographic apparatus cleaning method
US7900641B2 (en) * 2007-05-04 2011-03-08 Asml Netherlands B.V. Cleaning device and a lithographic apparatus cleaning method
US7916269B2 (en) 2007-07-24 2011-03-29 Asml Netherlands B.V. Lithographic apparatus and contamination removal or prevention method
US9019466B2 (en) * 2007-07-24 2015-04-28 Asml Netherlands B.V. Lithographic apparatus, reflective member and a method of irradiating the underside of a liquid supply system
NL1036306A1 (nl) 2007-12-20 2009-06-23 Asml Netherlands Bv Lithographic apparatus and in-line cleaning apparatus.
EP2131241B1 (en) * 2008-05-08 2019-07-31 ASML Netherlands B.V. Fluid handling structure, lithographic apparatus and device manufacturing method
NL2003333A (en) * 2008-10-23 2010-04-26 Asml Netherlands Bv Fluid handling structure, lithographic apparatus and device manufacturing method.
NL2005610A (en) 2009-12-02 2011-06-06 Asml Netherlands Bv Lithographic apparatus and surface cleaning method.
NL2005655A (en) 2009-12-09 2011-06-14 Asml Netherlands Bv A lithographic apparatus and a device manufacturing method.
EP2381310B1 (en) * 2010-04-22 2015-05-06 ASML Netherlands BV Fluid handling structure and lithographic apparatus
NL2007453A (en) * 2010-10-18 2012-04-19 Asml Netherlands Bv A fluid handling structure, a lithographic apparatus and a device manufacturing method.
NL2008980A (en) 2011-07-11 2013-01-14 Asml Netherlands Bv A fluid handling structure, a lithographic apparatus and a device manufacturing method.
NL2008979A (en) 2011-07-11 2013-01-14 Asml Netherlands Bv A fluid handling structure, a lithographic apparatus and a device manufacturing method.
NL2009899A (en) 2011-12-20 2013-06-24 Asml Netherlands Bv A pump system, a carbon dioxide supply system, an extraction system, a lithographic apparatus and a device manufacturing method.
EP3447581A1 (en) * 2017-08-23 2019-02-27 ASML Netherlands B.V. A clear-out tool, a lithographic apparatus and a device manufacturing method
CN110560424A (zh) * 2019-09-18 2019-12-13 宁波南大光电材料有限公司 一种用于光刻设备的非接触式超声清洗装置
CN113138540B (zh) * 2020-01-17 2024-02-09 浙江启尔机电技术有限公司 一种具有气液分离回收功能的浸液供给回收装置

Family Cites Families (84)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JPS568481A (en) * 1979-06-29 1981-01-28 Jiro Okada Production of aerosol spray
US4509852A (en) 1980-10-06 1985-04-09 Werner Tabarelli Apparatus for the photolithographic manufacture of integrated circuit elements
US5931721A (en) * 1994-11-07 1999-08-03 Sumitomo Heavy Industries, Ltd. Aerosol surface processing
US5853962A (en) * 1996-10-04 1998-12-29 Eco-Snow Systems, Inc. Photoresist and redeposition removal using carbon dioxide jet spray
AU1175799A (en) * 1997-11-21 1999-06-15 Nikon Corporation Projection aligner and projection exposure method
JPH11162831A (ja) * 1997-11-21 1999-06-18 Nikon Corp 投影露光装置及び投影露光方法
AU2747999A (en) 1998-03-26 1999-10-18 Nikon Corporation Projection exposure method and system
JP2000323396A (ja) 1999-05-13 2000-11-24 Canon Inc 露光方法、露光装置、およびデイバイス製造方法
JP2003115451A (ja) * 2001-07-30 2003-04-18 Canon Inc 露光装置及びそれを用いたデバイスの製造方法
US20040132731A1 (en) 2002-06-26 2004-07-08 Fox David Nathan Abraham Novel combination
CN100470367C (zh) * 2002-11-12 2009-03-18 Asml荷兰有限公司 光刻装置和器件制造方法
EP1420300B1 (en) 2002-11-12 2015-07-29 ASML Netherlands B.V. Lithographic apparatus and device manufacturing method
SG121822A1 (en) 2002-11-12 2006-05-26 Asml Netherlands Bv Lithographic apparatus and device manufacturing method
JP4423559B2 (ja) 2002-12-03 2010-03-03 株式会社ニコン 汚染物質除去方法
CN101872135B (zh) * 2002-12-10 2013-07-31 株式会社尼康 曝光设备和器件制造法
JP4352874B2 (ja) 2002-12-10 2009-10-28 株式会社ニコン 露光装置及びデバイス製造方法
SG10201803122UA (en) 2003-04-11 2018-06-28 Nikon Corp Immersion lithography apparatus and device manufacturing method
TWI612556B (zh) 2003-05-23 2018-01-21 尼康股份有限公司 曝光裝置、曝光方法及元件製造方法
EP1486827B1 (en) 2003-06-11 2011-11-02 ASML Netherlands B.V. Lithographic apparatus and device manufacturing method
JP2005072404A (ja) 2003-08-27 2005-03-17 Sony Corp 露光装置および半導体装置の製造方法
JP4305095B2 (ja) 2003-08-29 2009-07-29 株式会社ニコン 光学部品の洗浄機構を搭載した液浸投影露光装置及び液浸光学部品洗浄方法
KR101248325B1 (ko) 2003-09-26 2013-03-27 가부시키가이샤 니콘 투영노광장치 및 투영노광장치의 세정방법, 메인터넌스방법 그리고 디바이스의 제조방법
EP1672682A4 (en) 2003-10-08 2008-10-15 Zao Nikon Co Ltd SUBSTRATE TRANSPORT DEVICE AND METHOD, EXPOSURE DEVICE AND METHOD AND COMPONENT MANUFACTURING METHOD
US7528929B2 (en) 2003-11-14 2009-05-05 Asml Netherlands B.V. Lithographic apparatus and device manufacturing method
US8067147B2 (en) 2003-12-23 2011-11-29 Koninklijke Philips Electronics N.V. Removable pellicle for immersion lithography
US7050146B2 (en) 2004-02-09 2006-05-23 Asml Netherlands B.V. Lithographic apparatus and device manufacturing method
JP4548341B2 (ja) 2004-02-10 2010-09-22 株式会社ニコン 露光装置及びデバイス製造方法、メンテナンス方法及び露光方法
US7091502B2 (en) 2004-05-12 2006-08-15 Taiwan Semiconductor Manufacturing, Co., Ltd. Apparatus and method for immersion lithography
KR20170016532A (ko) 2004-06-09 2017-02-13 가부시키가이샤 니콘 노광 장치 및 디바이스 제조 방법
US8698998B2 (en) 2004-06-21 2014-04-15 Nikon Corporation Exposure apparatus, method for cleaning member thereof, maintenance method for exposure apparatus, maintenance device, and method for producing device
DE102004033208B4 (de) 2004-07-09 2010-04-01 Vistec Semiconductor Systems Gmbh Vorrichtung zur Inspektion eines mikroskopischen Bauteils mit einem Immersionsobjektiv
US7307263B2 (en) 2004-07-14 2007-12-11 Asml Netherlands B.V. Lithographic apparatus, radiation system, contaminant trap, device manufacturing method, and method for trapping contaminants in a contaminant trap
US7224427B2 (en) 2004-08-03 2007-05-29 Taiwan Semiconductor Manufacturing Company, Ltd. Megasonic immersion lithography exposure apparatus and method
US7701550B2 (en) 2004-08-19 2010-04-20 Asml Netherlands B.V. Lithographic apparatus and device manufacturing method
JP4772306B2 (ja) * 2004-09-06 2011-09-14 株式会社東芝 液浸光学装置及び洗浄方法
US7385670B2 (en) * 2004-10-05 2008-06-10 Asml Netherlands B.V. Lithographic apparatus, cleaning system and cleaning method for in situ removing contamination from a component in a lithographic apparatus
WO2006041086A1 (ja) 2004-10-13 2006-04-20 Nikon Corporation 露光装置、露光方法及びデバイス製造方法
JP2006120674A (ja) 2004-10-19 2006-05-11 Canon Inc 露光装置及び方法、デバイス製造方法
JP2006134999A (ja) 2004-11-04 2006-05-25 Sony Corp 液浸型露光装置、及び、液浸型露光装置における保持台の洗浄方法
US7414699B2 (en) * 2004-11-12 2008-08-19 Asml Netherlands B.V. Lithographic apparatus and device manufacturing method
WO2006055345A1 (en) * 2004-11-12 2006-05-26 Fsi International, Inc. Nozzle design for generating fluid streams useful in the manufacture of microelectronic devices
US7362412B2 (en) 2004-11-18 2008-04-22 International Business Machines Corporation Method and apparatus for cleaning a semiconductor substrate in an immersion lithography system
EP1821337B1 (en) 2004-12-06 2016-05-11 Nikon Corporation Maintenance method
US7880860B2 (en) 2004-12-20 2011-02-01 Asml Netherlands B.V. Lithographic apparatus and device manufacturing method
EP1681597B1 (en) 2005-01-14 2010-03-10 ASML Netherlands B.V. Lithographic apparatus and device manufacturing method
JP2006310706A (ja) 2005-05-02 2006-11-09 Nikon Corp 光学部品の洗浄方法、液浸投影露光装置および露光方法
US20060250588A1 (en) 2005-05-03 2006-11-09 Stefan Brandl Immersion exposure tool cleaning system and method
US7315033B1 (en) 2005-05-04 2008-01-01 Advanced Micro Devices, Inc. Method and apparatus for reducing biological contamination in an immersion lithography system
WO2006122578A1 (en) 2005-05-17 2006-11-23 Freescale Semiconductor, Inc. Contaminant removal apparatus and method therefor
US20070085989A1 (en) 2005-06-21 2007-04-19 Nikon Corporation Exposure apparatus and exposure method, maintenance method, and device manufacturing method
US20070002296A1 (en) 2005-06-30 2007-01-04 Taiwan Semiconductor Manufacturing Company, Ltd. Immersion lithography defect reduction
US7262422B2 (en) 2005-07-01 2007-08-28 Spansion Llc Use of supercritical fluid to dry wafer and clean lens in immersion lithography
DE102005031792A1 (de) 2005-07-07 2007-01-11 Carl Zeiss Smt Ag Verfahren zur Entfernung von Kontamination von optischen Elementen, insbesondere von Oberflächen optischer Elemente sowie ein optisches System oder Teilsystem hierfür
JP2007029973A (ja) 2005-07-25 2007-02-08 Sony Corp レーザ加工装置とその加工方法及びデブリ回収装置とその回収方法
US20070068558A1 (en) * 2005-09-06 2007-03-29 Applied Materials, Inc. Apparatus and methods for mask cleaning
JP2007088328A (ja) 2005-09-26 2007-04-05 Toshiba Corp 液浸型露光装置の洗浄方法
JP2007103658A (ja) 2005-10-04 2007-04-19 Canon Inc 露光方法および装置ならびにデバイス製造方法
US7986395B2 (en) * 2005-10-24 2011-07-26 Taiwan Semiconductor Manufacturing Company, Ltd. Immersion lithography apparatus and methods
CN1963673A (zh) 2005-11-11 2007-05-16 台湾积体电路制造股份有限公司 浸润式微影曝光设备及方法
JP2007142217A (ja) 2005-11-18 2007-06-07 Taiwan Semiconductor Manufacturing Co Ltd イマージョン式リソグラフィ露光装置およびその方法
JP2007150102A (ja) 2005-11-29 2007-06-14 Fujitsu Ltd 露光装置及び光学素子の洗浄方法
US8125610B2 (en) 2005-12-02 2012-02-28 ASML Metherlands B.V. Method for preventing or reducing contamination of an immersion type projection apparatus and an immersion type lithographic apparatus
US7462850B2 (en) 2005-12-08 2008-12-09 Asml Netherlands B.V. Radical cleaning arrangement for a lithographic apparatus
US7405417B2 (en) 2005-12-20 2008-07-29 Asml Netherlands B.V. Lithographic apparatus having a monitoring device for detecting contamination
JP2007173732A (ja) 2005-12-26 2007-07-05 Sokudo:Kk 基板処理装置
US7522263B2 (en) 2005-12-27 2009-04-21 Asml Netherlands B.V. Lithographic apparatus and method
US20070146658A1 (en) 2005-12-27 2007-06-28 Asml Netherlands B.V. Lithographic apparatus and method
JP4704221B2 (ja) 2006-01-26 2011-06-15 株式会社Sokudo 基板処理装置および基板処理方法
JP2007227543A (ja) 2006-02-22 2007-09-06 Toshiba Corp 液浸光学装置、洗浄方法及び液浸露光方法
JP2007227580A (ja) 2006-02-23 2007-09-06 Sony Corp 液浸型露光装置および液浸型露光方法
JP2007266074A (ja) 2006-03-27 2007-10-11 Toshiba Corp 半導体装置の製造方法及び液浸リソグラフィーシステム
JP2007294817A (ja) 2006-04-27 2007-11-08 Sokudo:Kk 基板処理方法、基板処理システムおよび基板処理装置
US7628865B2 (en) 2006-04-28 2009-12-08 Asml Netherlands B.V. Methods to clean a surface, a device manufacturing method, a cleaning assembly, cleaning apparatus, and lithographic apparatus
SG175671A1 (en) 2006-05-18 2011-11-28 Nikon Corp Exposure method and apparatus, maintenance method and device manufacturing method
US7969548B2 (en) 2006-05-22 2011-06-28 Asml Netherlands B.V. Lithographic apparatus and lithographic apparatus cleaning method
WO2007136089A1 (ja) 2006-05-23 2007-11-29 Nikon Corporation メンテナンス方法、露光方法及び装置、並びにデバイス製造方法
JP2007317987A (ja) 2006-05-29 2007-12-06 Sokudo:Kk 基板処理装置および基板処理方法
WO2008001871A1 (en) 2006-06-30 2008-01-03 Nikon Corporation Maintenance method, exposure method and apparatus and device manufacturing method
US8947629B2 (en) 2007-05-04 2015-02-03 Asml Netherlands B.V. Cleaning device, a lithographic apparatus and a lithographic apparatus cleaning method
US7900641B2 (en) 2007-05-04 2011-03-08 Asml Netherlands B.V. Cleaning device and a lithographic apparatus cleaning method
US9019466B2 (en) 2007-07-24 2015-04-28 Asml Netherlands B.V. Lithographic apparatus, reflective member and a method of irradiating the underside of a liquid supply system
US7916269B2 (en) 2007-07-24 2011-03-29 Asml Netherlands B.V. Lithographic apparatus and contamination removal or prevention method
NL1035942A1 (nl) * 2007-09-27 2009-03-30 Asml Netherlands Bv Lithographic Apparatus and Method of Cleaning a Lithographic Apparatus.
JP5017232B2 (ja) * 2007-10-31 2012-09-05 エーエスエムエル ネザーランズ ビー.ブイ. クリーニング装置および液浸リソグラフィ装置

Also Published As

Publication number Publication date
JP5145206B2 (ja) 2013-02-13
US9289802B2 (en) 2016-03-22
US20090174871A1 (en) 2009-07-09
JP2009188383A (ja) 2009-08-20

Similar Documents

Publication Publication Date Title
NL1036273A1 (nl) Lithographic apparatus and method of cleaning a surface of an immersion lithographic apparatus.
TWI367401B (en) Lithographic apparatus and lithographic apparatus cleaning method
NL1036306A1 (nl) Lithographic apparatus and in-line cleaning apparatus.
BRPI0922615A2 (pt) aparelho e método para limpeza de mantas flexíveis.
BRPI0819816A2 (pt) método e aparelho de revestimento automatizado
DE602007010626D1 (de) Vorrichtung zur behandlung einer oberfläche
BRPI0717659A2 (pt) Método de alocação de sequência e aparelho de alocação de sequência
DE602006004916D1 (de) Verfahren zur Erfassung des Sturzes einer Person
BRPI0912934A2 (pt) aparelho e método
BRPI0910713A2 (pt) método e aparelhos
BRPI0907634A2 (pt) Método e aparelho para remoção de uma película de uma superfície
DE602007012633D1 (de) Lithographische Vorrichtung und Verfahren
NL1037117A1 (nl) Method and device for examining a surface of an object.
DE602007004783D1 (de) Verfahren zur Reinigung von Photomasken
NL2002016A1 (nl) Exposure apparatus and method for photolithography process.
NL1036290A1 (nl) Lithographic apparatus.
FI20060955A0 (fi) Sakeutuslaite ja -menetelmä
NL2003258A1 (nl) Lithographic apparatus and device manufacturing method.
BRPI0719712A2 (pt) Método e dispositivo para revestimento de substratos
DE602007006598D1 (de) Doppeloberflächenpoliervorrichtung
DE602006002419D1 (de) Eintauchverfahren
NL1036313A1 (nl) Device manufacturing method and lithographic apparatus.
NL2003204A1 (nl) Lithographic apparatus and method.
FI20080264A0 (fi) Pinnoitusmenetelmä ja -laite
BRPI0618203A2 (pt) aparelho de revestimento

Legal Events

Date Code Title Description
AD1A A request for search or an international type search has been filed
EDI The registered patent application has been withdrawn