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MX2009006226A - Metodos y sistema para medir un objeto. - Google Patents

Metodos y sistema para medir un objeto.

Info

Publication number
MX2009006226A
MX2009006226A MX2009006226A MX2009006226A MX2009006226A MX 2009006226 A MX2009006226 A MX 2009006226A MX 2009006226 A MX2009006226 A MX 2009006226A MX 2009006226 A MX2009006226 A MX 2009006226A MX 2009006226 A MX2009006226 A MX 2009006226A
Authority
MX
Mexico
Prior art keywords
measuring
rotary scan
range sensor
includes positioning
geometric parameters
Prior art date
Application number
MX2009006226A
Other languages
English (en)
Inventor
Steven Robert Hayashi
Zhongguo Li
Kevin George Harding
Jianming Zheng
Howard Paul Weaver
Xiaoming Du
Tian Chen
Original Assignee
Gen Electric
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Gen Electric filed Critical Gen Electric
Publication of MX2009006226A publication Critical patent/MX2009006226A/es

Links

Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
    • G01B11/00—Measuring arrangements characterised by the use of optical techniques
    • G01B11/24—Measuring arrangements characterised by the use of optical techniques for measuring contours or curvatures

Landscapes

  • Physics & Mathematics (AREA)
  • General Physics & Mathematics (AREA)
  • Length Measuring Devices By Optical Means (AREA)
  • Length Measuring Devices With Unspecified Measuring Means (AREA)

Abstract

Un método para medir un objeto incluye posicionar el objeto en una plataforma movible, realizar un escaneo giratorio del objeto con un sensor del rango y determinar parámetros geométricos del objeto con base en el escaneo giratorio.
MX2009006226A 2006-12-20 2007-11-30 Metodos y sistema para medir un objeto. MX2009006226A (es)

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US11/642,076 US7768655B2 (en) 2006-12-20 2006-12-20 Methods and system for measuring an object
PCT/US2007/085994 WO2008076608A1 (en) 2006-12-20 2007-11-30 Method and system for measuring an object

Publications (1)

Publication Number Publication Date
MX2009006226A true MX2009006226A (es) 2009-06-22

Family

ID=39154015

Family Applications (1)

Application Number Title Priority Date Filing Date
MX2009006226A MX2009006226A (es) 2006-12-20 2007-11-30 Metodos y sistema para medir un objeto.

Country Status (8)

Country Link
US (1) US7768655B2 (es)
EP (1) EP2095066A1 (es)
JP (1) JP2010513927A (es)
CN (1) CN101611291B (es)
AU (1) AU2007334217A1 (es)
CA (1) CA2672475A1 (es)
MX (1) MX2009006226A (es)
WO (1) WO2008076608A1 (es)

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DE112009000516T5 (de) * 2008-03-12 2011-02-10 Optimet Optical Metrology Ltd. Intraorales Abbildungssystem und Verfahren, das auf der konoskopischen Holographie beruht
US7924439B2 (en) * 2008-09-29 2011-04-12 General Electric Company Method and system for parameter extraction of a cutting tool
US9478479B2 (en) 2010-10-26 2016-10-25 General Electric Company Thermal management system and method
US10274263B2 (en) 2009-04-09 2019-04-30 General Electric Company Method and apparatus for improved cooling of a heat sink using a synthetic jet
US9615482B2 (en) 2009-12-11 2017-04-04 General Electric Company Shaped heat sinks to optimize flow
US8112172B2 (en) * 2009-04-29 2012-02-07 General Electric Company Method and system for gash parameter extraction of a cutting tool
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DE102015105999B4 (de) * 2015-04-20 2016-11-10 Walter Maschinenbau Gmbh Verfahren und Vorrichtung zur materialabtragenden Bearbeitung eines Werkzeuges
JP6691837B2 (ja) * 2016-06-27 2020-05-13 株式会社キーエンス 測定装置
JP7111710B2 (ja) 2016-08-08 2022-08-02 ディープ・ブレイン・スティムレーション・テクノロジーズ・ピーティーワイ・リミテッド 神経活動をモニタするためのシステム及び方法
DE102017106741B4 (de) * 2017-03-29 2019-11-14 Jenoptik Industrial Metrology Germany Gmbh Oberflächenmessgerät
CN111200967B (zh) 2017-05-22 2023-06-06 深部脑刺激技术有限公司 用于监测神经活动的系统和方法
DE102018103420A1 (de) 2018-02-15 2019-08-22 Jenoptik Industrial Metrology Germany Gmbh Messgerät zur Oberflächen- oder Konturmessung
CN109444937B (zh) * 2018-08-08 2021-04-02 北京木业邦科技有限公司 树木建模及抚育方法、装置、电子设备及存储介质
DE102020108182A1 (de) 2019-05-07 2020-11-12 Jenoptik Industrial Metrology Germany Gmbh Oberflächenmessgerät
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Also Published As

Publication number Publication date
CA2672475A1 (en) 2008-06-26
CN101611291A (zh) 2009-12-23
AU2007334217A1 (en) 2008-06-26
JP2010513927A (ja) 2010-04-30
CN101611291B (zh) 2012-04-18
WO2008076608A1 (en) 2008-06-26
US20080148590A1 (en) 2008-06-26
US7768655B2 (en) 2010-08-03
EP2095066A1 (en) 2009-09-02

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