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Bai et al., 2004 - Google Patents

High-level crosstalk defect simulation methodology for system-on-chip interconnects

Bai et al., 2004

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Document ID
17943517847510049590
Author
Bai X
Dey S
Publication year
Publication venue
IEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems

External Links

Snippet

For system-on-chips (SoC) using nanometer technologies, buses and long interconnects are susceptible to crosstalk defects that may lead to functional and timing failures. Testing for crosstalk defects is becoming important to ensure error-free operation of an SoC. To …
Continue reading at scholar.archive.org (PDF) (other versions)

Classifications

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    • G06F17/50—Computer-aided design
    • G06F17/5009—Computer-aided design using simulation
    • G06F17/5022—Logic simulation, e.g. for logic circuit operation
    • G06F17/5031—Timing analysis
    • G—PHYSICS
    • G06—COMPUTING; CALCULATING; COUNTING
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    • G06F17/5036—Computer-aided design using simulation for analog modelling, e.g. for circuits, spice programme, direct methods, relaxation methods
    • G—PHYSICS
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    • G06F17/5068—Physical circuit design, e.g. layout for integrated circuits or printed circuit boards
    • G06F17/5081—Layout analysis, e.g. layout verification, design rule check
    • G—PHYSICS
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    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
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    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/3183—Generation of test inputs, e.g. test vectors, patterns or sequence
    • G01R31/318342—Generation of test inputs, e.g. test vectors, patterns or sequence by preliminary fault modelling, e.g. analysis, simulation
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    • G06F2217/70—Fault tolerant, i.e. transient fault suppression
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    • G06F11/00—Error detection; Error correction; Monitoring

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