ZA811935B - Process and device for the contact free measurement of a dimension - Google Patents

Process and device for the contact free measurement of a dimension

Info

Publication number: ZA811935B
Authority: ZA; South Africa
Prior art keywords: dimension; free measurement; contact free; measurement; contact
Prior art date: 1980-03-25

Application number

ZA00811935A

Inventor

Urs Peter Studer

Original Assignee

Zumbach Electronic Ag

Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)

1980-03-25

Filing date

1981-03-23

Publication date

1982-04-28

1981-03-23 Application filed by Zumbach Electronic Ag filed Critical Zumbach Electronic Ag

1982-04-28 Publication of ZA811935B publication Critical patent/ZA811935B/en

Classifications

- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/08—Measuring arrangements characterised by the use of optical techniques for measuring diameters
- G01B11/10—Measuring arrangements characterised by the use of optical techniques for measuring diameters of objects while moving
- G01B11/105—Measuring arrangements characterised by the use of optical techniques for measuring diameters of objects while moving using photoelectric detection means
- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
- G01B11/06—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
- G01B11/0691—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material of objects while moving

Landscapes

Physics & Mathematics (AREA)
General Physics & Mathematics (AREA)
Length Measuring Devices By Optical Means (AREA)
Length Measuring Devices With Unspecified Measuring Means (AREA)

ZA00811935A 1980-03-25 1981-03-23 Process and device for the contact free measurement of a dimension ZA811935B (en)

Applications Claiming Priority (1)

Application Number	Priority Date	Filing Date	Title
CH231480A CH645462A5 (en)	1980-03-25	1980-03-25	METHOD AND DEVICE FOR THE CONTACTLESS MEASUREMENT OF A DIMENSION OF AT LEAST ONE OBJECT.

Publications (1)

Publication Number	Publication Date
ZA811935B true ZA811935B (en)	1982-04-28

Family

ID=4230897

Family Applications (1)

Application Number	Title	Priority Date	Filing Date
ZA00811935A ZA811935B (en)	1980-03-25	1981-03-23	Process and device for the contact free measurement of a dimension

Country Status (11)

Country	Link
JP (1)	JPS56150302A (en)
AU (1)	AU538202B2 (en)
BE (1)	BE888013A (en)
CA (1)	CA1168437A (en)
CH (1)	CH645462A5 (en)
DE (1)	DE3111356A1 (en)
ES (1)	ES500695A0 (en)
FR (1)	FR2479447B1 (en)
GB (1)	GB2072840B (en)
IT (1)	IT1135714B (en)
ZA (1)	ZA811935B (en)

Families Citing this family (19)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
JPS5937405A (en) *	1982-08-26	1984-02-29	Mitsutoyo Mfg Co Ltd	Photoelectric type measuring device
JPS6134410A (en) *	1984-07-26	1986-02-18	Mitsutoyo Mfg Co Ltd	Optical measuring apparatus
US4730116A (en) *	1985-08-06	1988-03-08	Mitsubishi Denki Kabushiki Kaisha	Sheet thickness measuring apparatus by optical scanning
JPS6249202A (en) *	1985-08-28	1987-03-03	Mitsutoyo Mfg Corp	Optical measuring apparatus
CH672184A5 (en) *	1985-12-17	1989-10-31	Manfred Meyer
CH674774A5 (en) *	1986-04-03	1990-07-13	Zumbach Electronic Ag
DE3713109A1 (en) *	1987-04-16	1988-11-03	Limess Licht Messtechnik Gmbh	Device for measuring workpieces
KR920004750B1 (en) *	1988-01-19	1992-06-15	미쓰비시전기 주식회사	Thickness measuring method
DE3815011A1 (en) *	1988-04-30	1989-11-16	Leybold Ag	DEVICE FOR NON-DESTRUCTION-FREE MEASUREMENT OF THE RESISTANT THIN LAYERS
DE3816322A1 (en) *	1988-05-13	1989-11-23	Udo Dr Ing Tutschke	Method and device for the contactless measurement of the external dimensions of bodies
GB8816346D0 (en) *	1988-07-08	1988-08-10	Kyriakis J	Apparatus for monitoring product in hostile environment
DE3824820A1 (en) *	1988-07-21	1990-01-25	Gebhard Birkle	DEVICE FOR CONTACTLESS OPTICAL DETERMINATION OF GEOMETRIC DIMENSIONS OF AN OBJECT
DE4024849A1 (en) *	1990-08-06	1992-02-13	Horn Hannes Dr Schulze	Object dimension digital measurement - uses pulsed laser beam passed across pulse detection path in repeated, pref. oscillatory, manner
DE9013559U1 (en) *	1990-09-27	1990-12-06	Mesacon Gesellschaft für Meßtechnik mbH, 4600 Dortmund	Optical device for measuring the speed or length of a moving surface
FR2678727A1 (en) *	1991-07-04	1993-01-08	Tabacs & Allumettes Ind	CALIBRATION METHOD AND DEVICE, IN PARTICULAR FOR CIGARETTES, USING THE DETERMINATION OF THE INTERCEPTION TIME OF A LASER BEAM.
DE4201385A1 (en) *	1992-01-21	1993-07-22	Peter Dipl Ing Renner	Optical measurement system with light curtain, photoelectric receiver - contains null point, linearity error correction circuit for digitised receiver signal
DE19516154A1 (en) *	1995-05-03	1996-11-14	Hell Ag Linotype	Optical position determining arrangement for rotating objects
RU2158414C1 (en) *	1999-03-01	2000-10-27	Московский государственный технологический университет "СТАНКИН"	Process measuring geometrical parameters of elements of surfaces
EP3047232B1 (en)	2013-09-16	2022-04-06	Steinfurth Mess-Systeme GmbH	Method and device for establishing a geometry of a container for packaging a flowable medium

Family Cites Families (6)

* Cited by examiner, † Cited by third party
Publication number	Priority date	Publication date	Assignee	Title
DE1191591B (en) *	1958-01-17	1965-04-22	Licentia Gmbh	Method for photoelectrically determining the relative position of at least one edge of an object
JPS5335569A (en) *	1976-09-14	1978-04-03	Asahi Glass Co Ltd	Method of measuring outer diameter of transparent substance
US4097849A (en) *	1976-09-27	1978-06-27	Systems Research Laboratories, Inc.	Electronic comparator for process control
US4082463A (en) *	1977-01-06	1978-04-04	Systems Research Laboratories, Inc.	Calibrated optical micrometer
JPS53119079A (en) *	1977-03-26	1978-10-18	Tatsu Akutsu	Measuring method of diameter of running filamentous articles
US4168126A (en) *	1977-07-05	1979-09-18	Altman Associates, Inc.	Electro-optical measuring system using precision light translator

1980
- 1980-03-25 CH CH231480A patent/CH645462A5/en not_active IP Right Cessation
1981
- 1981-03-18 CA CA000373326A patent/CA1168437A/en not_active Expired
- 1981-03-18 FR FR8105566A patent/FR2479447B1/en not_active Expired
- 1981-03-19 BE BE1/10179A patent/BE888013A/en not_active IP Right Cessation
- 1981-03-20 AU AU68585/81A patent/AU538202B2/en not_active Ceased
- 1981-03-23 DE DE19813111356 patent/DE3111356A1/en active Granted
- 1981-03-23 ZA ZA00811935A patent/ZA811935B/en unknown
- 1981-03-23 GB GB8108947A patent/GB2072840B/en not_active Expired
- 1981-03-24 IT IT20686/81A patent/IT1135714B/en active
- 1981-03-25 JP JP4258181A patent/JPS56150302A/en active Pending
- 1981-03-25 ES ES500695A patent/ES500695A0/en active Granted

Also Published As

Publication number	Publication date
ES8203150A1 (en)	1982-03-01
AU6858581A (en)	1981-10-01
IT8120686A0 (en)	1981-03-24
GB2072840A (en)	1981-10-07
JPS56150302A (en)	1981-11-20
CA1168437A (en)	1984-06-05
DE3111356C2 (en)	1988-05-11
BE888013A (en)	1981-07-16
ES500695A0 (en)	1982-03-01
FR2479447B1 (en)	1986-06-27
DE3111356A1 (en)	1982-03-25
FR2479447A1 (en)	1981-10-02
IT1135714B (en)	1986-08-27
CH645462A5 (en)	1984-09-28
AU538202B2 (en)	1984-08-02
GB2072840B (en)	1983-11-09

Publication	Publication Date	Title
DE3071910D1 (en)	1987-04-02	Dimension measuring apparatus
GB2089323B (en)	1983-08-03	Measuring device
JPS57107046A (en)	1982-07-03	Article inspecting device
ZA811935B (en)	1982-04-28	Process and device for the contact free measurement of a dimension
JPS56108906A (en)	1981-08-28	Dislocation measuring device
GB2088062B (en)	1985-03-20	Process and apparatus for measuring the ovalisation of a pipe
GB2016710B (en)	1983-02-23	Device and method for measuring surface properties
JPS5710444A (en)	1982-01-20	Measuring device
ZA812985B (en)	1982-04-28	Process and device for the measurement of a dimension of a object located in a liquid
JPS55103403A (en)	1980-08-07	Method and device for measuring distance
GB2060907B (en)	1983-03-30	Process for the measurement of the specific capacity of a cable and a device for carrying out the process
DE2965496D1 (en)	1983-07-07	Solid surface detecting and measuring device and method
GB2097127B (en)	1984-09-05	Contact point type measuring device
JPS5689677A (en)	1981-07-21	Contacting stopping device
JPS5571902A (en)	1980-05-30	Dimension measuring device
JPS5694285A (en)	1981-07-30	Method and device for dopplerrradar measurement
JPS54164193A (en)	1979-12-27	Method and device for measuring surface tension
JPS5717803A (en)	1982-01-29	Measuring device
JPS5746126A (en)	1982-03-16	Device for measuring mass and force
JPS56119849A (en)	1981-09-19	Surface inspecting device
JPS56604A (en)	1981-01-07	Method and device for measuring distance or thickness without contact
JPS5771039A (en)	1982-05-01	Device for sensing contact
DE2961258D1 (en)	1982-01-14	Method and device for detecting the presence of one or more mfc-frequencies within a pcm-signal
JPS56162107A (en)	1981-12-12	Interval measuring device
JPS54108695A (en)	1979-08-25	Method and device for measuring antigennantibody reaction