WO2024116813A1 - 弾性波装置及びフィルタ装置 - Google Patents
弾性波装置及びフィルタ装置 Download PDFInfo
- Publication number
- WO2024116813A1 WO2024116813A1 PCT/JP2023/040852 JP2023040852W WO2024116813A1 WO 2024116813 A1 WO2024116813 A1 WO 2024116813A1 JP 2023040852 W JP2023040852 W JP 2023040852W WO 2024116813 A1 WO2024116813 A1 WO 2024116813A1
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- electrode
- region
- electrode fingers
- elastic wave
- wave device
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Ceased
Links
Images
Classifications
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
- H03H9/00—Networks comprising electromechanical or electro-acoustic elements; Electromechanical resonators
- H03H9/02—Details
- H03H9/02535—Details of surface acoustic wave devices
- H03H9/02543—Characteristics of substrate, e.g. cutting angles
- H03H9/02574—Characteristics of substrate, e.g. cutting angles of combined substrates, multilayered substrates, piezoelectrical layers on not-piezoelectrical substrate
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
- H03H9/00—Networks comprising electromechanical or electro-acoustic elements; Electromechanical resonators
- H03H9/02—Details
- H03H9/02228—Guided bulk acoustic wave devices or Lamb wave devices having interdigital transducers situated in parallel planes on either side of a piezoelectric layer
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
- H03H9/00—Networks comprising electromechanical or electro-acoustic elements; Electromechanical resonators
- H03H9/02—Details
- H03H9/02535—Details of surface acoustic wave devices
- H03H9/02818—Means for compensation or elimination of undesirable effects
- H03H9/02858—Means for compensation or elimination of undesirable effects of wave front distortion
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
- H03H9/00—Networks comprising electromechanical or electro-acoustic elements; Electromechanical resonators
- H03H9/02—Details
- H03H9/125—Driving means, e.g. electrodes, coils
- H03H9/145—Driving means, e.g. electrodes, coils for networks using surface acoustic waves
- H03H9/14517—Means for weighting
- H03H9/14529—Distributed tap
- H03H9/14532—Series weighting; Transverse weighting
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03H—IMPEDANCE NETWORKS, e.g. RESONANT CIRCUITS; RESONATORS
- H03H9/00—Networks comprising electromechanical or electro-acoustic elements; Electromechanical resonators
- H03H9/02—Details
- H03H9/125—Driving means, e.g. electrodes, coils
- H03H9/145—Driving means, e.g. electrodes, coils for networks using surface acoustic waves
- H03H9/14544—Transducers of particular shape or position
- H03H9/14547—Fan shaped; Tilted; Shifted; Slanted; Tapered; Arched; Stepped finger transducers
Definitions
- the present invention relates to an elastic wave device and a filter device.
- an acoustic wave device is disclosed in the following Patent Document 1.
- an IDT (Interdigital Transducer) electrode is provided on a piezoelectric substrate.
- the shape of the multiple electrode fingers of the IDT electrode includes a curved shape. More specifically, each electrode finger extends along a curve from the center of the area where the IDT electrodes intersect to the common electrode.
- the electrode finger pitch in the center portion in the direction in which the multiple electrode fingers extend is narrower than the electrode finger pitch at the ends in the same direction. This provides the effect of suppressing the response of unwanted waves.
- the object of the present invention is to provide an elastic wave device and a filter device that can increase the Q value.
- the elastic wave device comprises a piezoelectric substrate including a piezoelectric layer, and an IDT electrode provided on the piezoelectric layer and having a pair of bus bars and a plurality of electrode fingers, the pair of bus bars being a first bus bar and a second bus bar facing each other, the plurality of electrode fingers being a plurality of first electrode fingers and a plurality of second electrode fingers, one end of each of the plurality of first electrode fingers being connected to the first bus bar, one end of each of the plurality of second electrode fingers being connected to the second bus bar, the plurality of first electrode fingers and the plurality of second electrode fingers being interdigitated with each other, a virtual line formed by connecting the tips of the plurality of second electrode fingers being a first envelope, and a virtual line formed by connecting the tips of the plurality of first electrode fingers being a second envelope, and in the IDT electrode,
- the region between the first envelope and the second envelope is an intersection region, and is provided on the piezoelectric layer.
- the piezoelectric layer further includes a plurality of electrode patterns provided at least one between the first bus bar and the intersection region and between the second bus bar and the intersection region, and among the plurality of electrode fingers, the tip of at least one of the first electrode fingers or the tip of at least one of the second electrode fingers faces the electrode pattern, and the shapes of the plurality of first electrode fingers and the plurality of second electrode fingers in a plan view each include a curved portion in the intersection region, and when the wavelength defined by the electrode finger pitch of the IDT electrode is ⁇ , the distance between the tip of the electrode finger facing the electrode pattern and the electrode pattern is 0.5 ⁇ or less.
- the filter device according to the present invention is an elastic wave device that includes a plurality of elastic wave resonators, at least one of which is configured according to the present invention.
- the elastic wave device and filter device of the present invention can increase the Q value.
- FIG. 1 is a schematic plan view of an elastic wave device according to a first preferred embodiment of the present invention.
- FIG. 2 is a schematic cross-sectional view taken along line II in FIG.
- FIG. 3 is a schematic plan view for explaining the configuration of an IDT electrode in the first embodiment of the present invention.
- FIG. 4 is a schematic plan view of a conventional elastic wave device.
- FIG. 5 is a schematic plan view of an elastic wave device according to a first reference example.
- FIG. 6 is a schematic plan view of an elastic wave device according to a second reference example.
- FIG. 7 is a diagram showing impedance frequency characteristics in the first embodiment of the present invention, the first reference example, and the second reference example.
- FIG. 1 is a schematic plan view of an elastic wave device according to a first preferred embodiment of the present invention.
- FIG. 2 is a schematic cross-sectional view taken along line II in FIG.
- FIG. 3 is a schematic plan view for explaining the configuration of an IDT electrode in the first embodiment of the present
- FIG. 8 is a diagram showing the relationship between frequency and Q value in the first embodiment, the first reference example, and the second reference example of the present invention.
- FIG. 9 is a diagram showing the reverse velocity plane of an elastic wave propagating through a first piezoelectric substrate and a second piezoelectric substrate.
- FIG. 10 is a diagram showing the reverse velocity planes of a longitudinal wave, a fast shear wave, and a slow shear wave in a first piezoelectric substrate.
- FIG. 11 is a diagram showing the relationship between the absolute value
- FIG. 12 is a schematic plan view for explaining the configuration of an IDT electrode when the fixed points are the centers of gravity of two foci of an ellipse.
- FIG. 13 is a schematic plan view of an elastic wave device according to a second preferred embodiment of the present invention.
- FIG. 14 is a diagram showing impedance frequency characteristics in the second embodiment and the third reference example of the present invention.
- FIG. 15 is a diagram showing the relationship between frequency and Q value in the second embodiment and the third reference example of the present invention.
- FIG. 16 is a schematic plan view of an elastic wave device according to a first modified example of the second embodiment of the present invention.
- FIG. 17 is a schematic plan view of an elastic wave device according to a second modified example of the second embodiment of the present invention.
- FIG. 18 is a schematic plan view of an elastic wave device according to a third modified example of the second embodiment of the present invention.
- FIG. 19 is a schematic plan view of an elastic wave device according to a fourth modified example of the second embodiment of the present invention.
- FIG. 20 is a schematic plan view showing the vicinity of a first edge region and the vicinity of a second edge region of an IDT electrode in a fifth modified example of the second embodiment of the present invention.
- FIG. 21 is a schematic plan view showing the vicinity of a first edge region and the vicinity of a second edge region of an IDT electrode in a sixth modified example of the second embodiment of the present invention.
- FIG. 22 is a schematic plan view showing the vicinity of a first edge region and the vicinity of a second edge region of an IDT electrode in a seventh modified example of the second embodiment of the present invention.
- FIG. 23 is a schematic plan view showing the vicinity of a first electrode pattern and the vicinity of a second electrode pattern of an IDT electrode in the third embodiment of the present invention.
- FIG. 24 is a schematic plan view showing the vicinity of a first electrode pattern and the vicinity of a second electrode pattern of an IDT electrode in a first modified example of the third embodiment of the present invention.
- FIG. 25 is a schematic plan view showing the vicinity of a first electrode pattern and the vicinity of a second electrode pattern of an IDT electrode in a second modified example of the third embodiment of the present invention.
- FIG. 26 is a schematic plan view showing the vicinity of a first electrode pattern and the vicinity of a second electrode pattern of an IDT electrode in a third modified example of the third embodiment of the present invention.
- FIG. 27 is a schematic plan view showing the vicinity of a first electrode pattern and the vicinity of a second electrode pattern of an IDT electrode in a fourth modified example of the third embodiment of the present invention.
- FIG. 28 is a schematic plan view for explaining the configuration of an IDT electrode according to the fourth embodiment of the present invention.
- FIG. 29 is a diagram showing the relationship between the absolute value
- FIG. 30 is a schematic plan view of an elastic wave device according to a third modified example of the fourth embodiment of the present invention.
- FIG. 31 is a schematic plan view for explaining the configuration of an IDT electrode according to the fifth embodiment of the present invention.
- FIG. 32 is a schematic plan view of an elastic wave device according to a modified example of the fifth embodiment of the present invention.
- FIG. 33 is a schematic plan view of an elastic wave device according to a sixth preferred embodiment of the present invention.
- FIG. 34 is a schematic plan view for explaining the configuration of an IDT electrode according to the sixth embodiment of the present invention.
- FIG. 35 is a schematic plan view of an elastic wave device according to a modified example of the sixth embodiment of the present invention.
- FIG. 36 is a schematic plan view of an elastic wave device according to a seventh preferred embodiment of the present invention.
- FIG. 37 is a diagram showing the relationship between the absolute value
- FIG. 38 is a diagram showing the relationship between the absolute value of the excitation angle
- FIG. 39 is a schematic cross-sectional front view of an elastic wave device according to a tenth preferred embodiment of the present invention.
- FIG. 39 is a schematic cross-sectional front view of an elastic wave device according to a tenth preferred embodiment of the present invention.
- FIG. 40 is a diagram showing the relationship between the absolute value
- FIG. 41 is a diagram showing the relationship between the absolute value
- FIG. 42 is a schematic cross-sectional front view of an elastic wave device according to an eleventh preferred embodiment of the present invention.
- FIG. 43 is a diagram showing impedance frequency characteristics in the eleventh embodiment of the present invention and the second reference example.
- FIG. 44 is a diagram showing the relationship between frequency and return loss in the eleventh embodiment and the second reference example of the present invention.
- FIG. 45 is a diagram showing impedance frequency characteristics in the first modified example and the second reference example of the eleventh embodiment of the present invention.
- FIG. 46 is a diagram showing the relationship between frequency and return loss in the first modified example and the second reference example of the eleventh embodiment of the present invention.
- FIG. 47 is a schematic cross-sectional front view of an elastic wave device according to a second modified example of the eleventh embodiment of the present invention.
- FIG. 48 is a schematic cross-sectional front view of an elastic wave device according to a third modified example of the eleventh embodiment of the present invention.
- FIG. 49 is a schematic cross-sectional front view of an elastic wave device according to a fourth modified example of the eleventh embodiment of the present invention.
- FIG. 50 is a schematic cross-sectional front view of an elastic wave device according to a twelfth preferred embodiment of the present invention.
- FIG. 51 is a schematic cross-sectional front view of an elastic wave device according to a first modified example of the twelfth embodiment of the present invention.
- FIG. 52 is a schematic cross-sectional front view of an elastic wave device according to a second modified example of the twelfth embodiment of the present invention.
- FIG. 53 is a schematic cross-sectional front view of an elastic wave device according to a third modified example of the twelfth embodiment of the present invention.
- FIG. 54 is a circuit diagram of a filter device according to a thirteenth embodiment of the present invention.
- FIG. 1 is a schematic plan view of an elastic wave device according to a first embodiment of the present invention.
- FIG. 2 is a schematic cross-sectional view taken along line II in FIG. 1.
- the elastic wave device 1 has a piezoelectric substrate 2.
- the piezoelectric substrate 2 is a substrate having piezoelectricity.
- the piezoelectric substrate 2 has a support substrate 4, an intermediate layer 5, and a piezoelectric layer 6.
- the intermediate layer 5 is provided on the support substrate 4.
- the piezoelectric layer 6 is provided on the intermediate layer 5.
- the intermediate layer 5 has a frame-like shape. That is, the intermediate layer 5 has a through hole.
- the support substrate 4 blocks one end of the through hole in the intermediate layer 5.
- the piezoelectric layer 6 blocks the other end of the through hole in the intermediate layer 5. This forms a hollow portion 2c in the piezoelectric substrate 2.
- a part of the piezoelectric layer 6 and a part of the support substrate 4 face each other with the hollow portion 2c in between.
- the support substrate 4 is the support member in the present invention.
- the support member may be a laminate including the support substrate 4.
- the piezoelectric layer 6 may be indirectly provided on the support substrate 4 via another layer, as in this embodiment.
- the piezoelectric substrate 2 may be a substrate consisting of only the piezoelectric layer 6.
- the piezoelectric layer 6 has a first principal surface 6a and a second principal surface 6b.
- the first principal surface 6a and the second principal surface 6b face each other.
- the second principal surface 6b is located on the support substrate 4 side.
- An IDT electrode 8 is provided on the first principal surface 6a of the piezoelectric layer 6. At least a portion of the IDT electrode 8 overlaps with the hollow portion 2c in a plan view.
- a plan view refers to a view from a direction corresponding to the top in FIG. 2. In FIG. 2, for example, of the support substrate 4 side and the piezoelectric layer 6 side, the piezoelectric layer 6 side is the top.
- the IDT electrode 8 has a pair of bus bars and a plurality of electrode fingers.
- the pair of bus bars is specifically a first bus bar 14 and a second bus bar 15.
- the first bus bar 14 and the second bus bar 15 face each other.
- the plurality of electrode fingers is specifically a plurality of first electrode fingers 16 and a plurality of second electrode fingers 17.
- One end of each of the plurality of first electrode fingers 16 is connected to the first bus bar 14.
- One end of each of the plurality of second electrode fingers 17 is connected to the second bus bar 15.
- Each of the plurality of first electrode fingers 16 and the plurality of second electrode fingers 17 includes a base end and a tip end. The base end of the first electrode finger 16 is the portion connected to the first bus bar 14.
- the base end of the second electrode finger 17 is the portion connected to the second bus bar 15.
- the plurality of first electrode fingers 16 and the plurality of second electrode fingers 17 are interdigitated with each other.
- the first electrode finger 16 and the second electrode finger 17 may be simply referred to as electrode fingers.
- the first bus bar 14 and the second bus bar 15 may be simply referred to as bus bars.
- the electrode finger pitch is constant in the IDT electrode 8 of the acoustic wave device 1.
- the electrode finger pitch is the center-to-center distance between adjacent first electrode fingers 16 and second electrode fingers 17.
- the IDT electrode 8 has a plurality of first electrode patterns 18 and a plurality of second electrode patterns 19. More specifically, each of the plurality of first electrode patterns 18 is located between the first bus bar 14 and the second electrode finger 17. Meanwhile, each of the plurality of second electrode patterns 19 is located between the second bus bar 15 and the first electrode finger 16.
- the first electrode pattern 18 and the second electrode pattern 19 may be simply referred to as electrode patterns.
- Each of the multiple first electrode patterns 18 is connected to both adjacent first electrode fingers 16.
- the multiple first electrode patterns 18 have a rectangular shape extending parallel to the first bus bar 14 in a plan view.
- the first electrode patterns 18 are provided between all of the first electrode fingers 16. Therefore, the configuration of the IDT electrode 8 corresponds to a configuration in which all of the first electrode fingers 16 are connected by the first bus bar 14 and bar-shaped electrodes other than the first bus bar 14.
- multiple openings are formed by the first bus bar 14, the multiple first electrode fingers 16, and the multiple first electrode patterns 18.
- the multiple first electrode patterns 18 do not have to be connected to the first electrode fingers 16.
- Each of the multiple second electrode patterns 19 is connected to both adjacent second electrode fingers 17.
- the multiple second electrode patterns 19 have a rectangular shape extending parallel to the second bus bar 15.
- the second electrode patterns 19 are provided between all of the second electrode fingers 17.
- the second bus bar 15, the multiple second electrode fingers 17, and the multiple second electrode patterns 19 form multiple openings.
- the multiple second electrode patterns 19 do not have to be connected to the second electrode fingers 17.
- each first electrode pattern 18 faces the first bus bar 14 across a gap.
- each second electrode pattern 19 faces the second bus bar 15 across a gap.
- all of the first electrode patterns 18 face the tips of the second electrode fingers 17 across a gap. All of the second electrode patterns 19 face the tips of the first electrode fingers 16 across a gap. It is sufficient that the tip of at least one first electrode finger 16 or the tip of at least one second electrode finger 17 of the multiple electrode fingers faces the electrode pattern of the present invention.
- the first electrode pattern 18 is provided between at least one adjacent set of first electrode fingers 16. It is sufficient that at least one first electrode pattern 18 faces at least one second electrode finger 17. Alternatively, for example, it is sufficient that the second electrode pattern 19 is provided between at least one adjacent set of second electrode fingers 17. It is sufficient that at least one second electrode pattern 19 faces at least one first electrode finger 16.
- the imaginary line formed by connecting the tips of the second electrode fingers 17 is the first envelope E1
- the imaginary line formed by connecting the tips of the first electrode fingers 16 is the second envelope E2.
- the area between the first envelope E1 and the second envelope E2 is the intersection area D. More specifically, the area surrounded by the electrode finger at one end of the multiple electrode fingers in the direction in which the multiple electrode fingers are arranged, the electrode finger at the other end, the first envelope E1, and the second envelope E2 is the intersection area D. Therefore, the first envelope E1 corresponds to the edge portion of the intersection area D on the first bus bar 14 side.
- the second envelope E2 corresponds to the edge portion of the intersection area D on the second bus bar 15 side.
- the electrode pattern may be provided at least either between the first bus bar 14 and the intersection region D, or between the second bus bar 15 and the intersection region D.
- the shape of the multiple first electrode fingers 16 and the multiple second electrode fingers 17 in a planar view includes a shape in which two arcs are connected. More specifically, it includes a shape in which the arcs of two circles whose centers are at different positions and have the same radius are connected. The centers of the two circles face each other with the IDT electrode 8 in between.
- the shape of the multiple electrode fingers is not limited to the above. It is sufficient that the shape of the multiple electrode fingers in a planar view includes a curved shape in the intersection region D.
- the features of this embodiment are as follows: 1) The shapes of the first electrode fingers 16 and the second electrode fingers 17 in a planar view each include a curved portion in the intersection region D. 2) The distance between the tip of an electrode finger that faces the electrode pattern and the electrode pattern is 0.5 ⁇ or less. This makes it possible to increase the Q value. The following describes the above effects in detail, along with the detailed configuration of the IDT electrode 8.
- the shapes of the multiple first electrode fingers 16 and the multiple second electrode fingers 17 in a planar view each have an inflection point.
- an inflection point is a point where different curves are connected to each other, or a point where a curve and a straight line are connected.
- the directions of the curved shapes are different with the inflection point as a boundary.
- the different directions of the curved shapes mean, for example, that the curved directions are different in the curved shapes. More specifically, for example, the direction of the curved shape is different when the curve is bent so as to be convex to the left in FIG. 1 and the curve is bent so as to be convex to the right.
- the two curved shapes are inverted to each other with the inflection point as a boundary.
- FIG. 3 is a schematic plan view for explaining the configuration of the IDT electrode in the first embodiment.
- each curved region which will be described later, is indicated by hatching.
- each of the multiple electrode fingers in plan view is a shape in which two arcs are connected.
- one of the arcs in each of the multiple electrode finger shapes is a respective arc in the multiple concentric circles. Therefore, the centers of the circles containing the arcs in each of the multiple electrode finger shapes are coincident.
- the centers of these circles are defined as fixed point C1.
- the other arc in each of the multiple electrode finger shapes is also a respective arc in the multiple concentric circles.
- the centers of these circles are defined as fixed point C2.
- two fixed points C1 and C2 are defined. Fixed point C1 and C2 face each other across the IDT electrode 8.
- the direction of the curved shape can be defined depending on whether the shape of the electrode finger in a planar view is an arc centered on fixed point C1 or fixed point C2.
- the shape of the IDT electrode 8 may be a shape that defines three or more fixed points.
- the shape of the multiple electrode fingers in a planar view may include an elliptical arc.
- the fixed point is the midpoint of the two foci of the ellipse in which the elliptical arc is included.
- the fixed point is the center of gravity of the two foci of the ellipse.
- the different curved portions of the shape of the multiple electrode fingers in a planar view may be a combination of a circular arc and an elliptical arc.
- the ellipse coefficient of the shape of the multiple electrode fingers in a planar view is ⁇ 2/ ⁇ 1.
- two ellipse coefficients ⁇ 2/ ⁇ 1 can be defined.
- the ellipse coefficient of the circle or ellipse based on the fixed point C1 in the shape of the multiple electrode fingers is ⁇ 12/ ⁇ 11
- the ellipse coefficient of the circle or ellipse based on the fixed point C2 is ⁇ 22/ ⁇ 21.
- both the ellipse coefficients ⁇ 12/ ⁇ 11 and ⁇ 22/ ⁇ 21 are 1.
- the ellipse coefficients ⁇ 12/ ⁇ 11 and ⁇ 22/ ⁇ 21 are other than 1.
- ⁇ 1 i.e., ⁇ 11 and ⁇ 21
- ⁇ 2 i.e., ⁇ 12 and ⁇ 22
- ⁇ 12 and ⁇ 22 correspond to the dimensions along the axis direction not passing through the intersection region D among the major and minor axes of the ellipse.
- the intersection region D includes a plurality of curved regions.
- the plurality of curved regions are a first curved region W1 and a second curved region W2.
- the first curved region W1 includes a first envelope E1.
- the second curved region W2 includes a second envelope E2.
- the shape of the first electrode fingers 16 and the second electrode fingers 17 in a planar view is a single arc or an elliptical arc.
- the boundary between the different curved regions corresponds to a line connecting the inflection points of each electrode finger.
- the boundary line O between the first curved region W1 and the second curved region W2 shown in FIG. 3 is a straight line.
- the extension line of the boundary line O passes through the fixed points C1 and C2.
- the shape of the IDT electrode 8 in this embodiment is an example, and the extension line of the boundary line O does not have to pass through the fixed points C1 and C2.
- the first curved region W1 in the crossing region D has portions located on countless straight lines passing through the fixed point C1.
- a straight line M1 is shown as an example of the countless straight lines passing through the fixed point C1 and the first curved region W1.
- an elastic wave is excited in a portion located on the straight line M1 in the first curved region W1.
- An elastic wave is also excited in each of the portions located on the countless straight lines (not shown) that pass through the fixed point C1 and the first curved region W1.
- the elastic wave device 1 has an excitation section located on the straight line M1 and excitation sections located on countless other straight lines (not shown).
- the second curved region W2 in the intersection region D similarly has an infinite number of excitation parts.
- the excitation parts in the second curved region W2 are located on a straight line passing through the fixed point C2.
- a straight line M2 is shown as an example of the infinite number of straight lines passing through the fixed point C2 and the second curved region W2.
- An extension of the first envelope E1 passes through the fixed point C1.
- a straight line including the first envelope E1 and an extension of the first envelope E1 is defined as a reference line N1 in the first curved region W1.
- the angle between the reference line N1 and a straight line passing through the fixed point C1 and the excitation unit in the first curved region W1 is defined as an angle ⁇ C1 in the first curved region W1.
- FIG. 3 shows an angle ⁇ C1 of the excitation unit located on the straight line M1 as an example. Note that the angle ⁇ C1 is 0° in the first envelope E1.
- an extension of the second envelope E2 passes through the fixed point C2.
- a straight line including the second envelope E2 and the extension of the second envelope E2 is defined as a reference line N2 in the second curved region W2.
- An angle between a straight line passing through the fixed point C2 and the excitation unit in the second curved region W2 and the reference line N2 is defined as an angle ⁇ C2 in the second curved region W2.
- an angle ⁇ C2 of the excitation unit located on the straight line M2 is shown as an example. Note that the angle ⁇ C2 is 0° in the second envelope E2.
- the positive direction of angle ⁇ C1 is the counterclockwise direction in plan view. More specifically, the positive direction is the direction from the second bus bar 15 side to the first bus bar 14 side.
- the positive direction of angle ⁇ C2 is also the counterclockwise direction in plan view.
- the direction in which an elastic wave is excited is one of the following three directions.
- the first direction is perpendicular to the direction in which the electrode fingers extend.
- the second direction is the direction that connects the shortest distance between adjacent electrode fingers.
- the third direction is parallel to the electric field vector generated between the electrode fingers.
- each electrode finger includes a pair of edge portions that connect the base end and the tip end in a plan view. Both edge portions have a curved shape.
- the direction in which the electrode fingers extend is as follows. First, when a virtual line parallel to the reference line in the present invention is drawn to connect both edge portions in any part of the electrode finger, the center of gravity of the part located on the virtual line is set as the representative point of the virtual line. An infinite number of virtual lines can be drawn on the electrode finger, and there are an infinite number of representative points. The direction in which the tangent to the curve connecting these representative points extends is set as the direction in which the electrode finger extends. The direction in which the electrode finger extends differs for each position on the electrode finger. In the case of having a different reference line for each curved region as in this embodiment, the reference line of the curved region on which the virtual line is drawn may be set as the direction in which the virtual line extends.
- the excitation direction of the elastic wave is the same in all three directions described above.
- the shape of the electrode fingers in a planar view is an arc centered on each fixed point.
- the direction in which the elastic wave is excited is the first direction described above.
- the direction in which the elastic wave is excited is represented by the direction perpendicular to the extension direction of the electrode fingers.
- the angle between the reference line N1 and a straight line passing through the fixed point C1 and the excitation portion of the first curved region W1, and the excitation direction of the elastic wave at the intersection of the electrode fingers is defined as the excitation angle ⁇ C1 _prop .
- the angle between the fixed point C2 and the excitation portion of the second curved region W2, and the excitation direction of the elastic wave at the intersection of the electrode fingers is defined as the excitation angle ⁇ C2 _prop .
- the positive and negative directions of the excitation angles ⁇ C1 _prop and ⁇ C2 _prop are the same as the positive and negative directions of the angles ⁇ C1 and ⁇ C2 , respectively.
- the angle ⁇ C1 in the excitation part of the first curved region W1 and the excitation angle ⁇ C1_prop are approximately equal.
- the configuration of the present invention may be described in detail by taking up either the angle ⁇ C1 or the excitation angle ⁇ C1_prop .
- the relationship between the angle ⁇ C2 in the excitation part of the second curved region W2 and the excitation angle ⁇ C2_prop is similar.
- the angle between the straight line passing through the edge portion on the first busbar 14 side and the fixed point C1 and the straight line passing through the edge portion on the second busbar 15 side and the fixed point C2 is defined as the intersection angle.
- the intersection angle in the first curved region W1 is defined as ⁇ C1 _AP
- the intersection angle in the second curved region W2 is defined as ⁇ C2 _AP .
- the straight line passing through the edge portion on the first busbar 14 side and the fixed point C1 in the first curved region W1 is the reference line N1, which is a straight line passing through the first envelope E1 and the fixed point C1.
- the extension line of the boundary line O of the first curved region W1 and the second curved region W2 passes through the fixed point C1 and the fixed point C2. Therefore, the straight line passing through the edge portion on the second busbar 15 side and the fixed point C1 in the first curved region W1 is a straight line including the boundary line O. Therefore, the intersection angle ⁇ C1_AP in the first curved region W1 is the angle between the reference line N1 and a straight line including the boundary line O. In this case, 0 ⁇ C1_prop ⁇ C1_AP .
- the intersection angle ⁇ C2_AP in the second curved region W2 is the angle between the reference line N2 and a straight line including the boundary line O. In this case, 0 ⁇ C2_prop ⁇ C2_AP .
- the intersection angle ⁇ C1_AP of the first curved region W1 and the intersection angle ⁇ C2_AP of the second curved region W2 are the same. However, the intersection angle ⁇ C1_AP of the first curved region W1 and the intersection angle ⁇ C2_AP of the second curved region W2 may be different from each other.
- the electrode finger pitch is constant in the IDT electrode 8 of the elastic wave device 1. Therefore, the wavelength ⁇ in the IDT electrode 8 is constant regardless of the excitation angle ⁇ C1 —prop and the excitation angle ⁇ C2 —prop .
- a piezoelectric single crystal is used as the material for the piezoelectric layer 6 of the elastic wave device 1.
- the propagation axis is the axis along which the elastic wave propagates.
- the direction in which the propagation axis extends is the X-propagation direction.
- the straight lines that extend parallel to the propagation axis are the reference lines N1 and N2.
- the reference lines N1 and N2 do not necessarily have to extend parallel to the propagation axis.
- the direction in which the propagation axis extends is not limited to the X propagation direction, but may be perpendicular to either the 90°X propagation direction or the direction in which the electrode fingers of the IDT electrode 8 extend.
- a pair of reflectors 9A and 9B are provided on the piezoelectric layer 6.
- the reflectors 9A and 9B face each other across the IDT electrode 8 in the direction in which the multiple electrode fingers of the IDT electrode 8 are arranged.
- the reflector 9A has multiple reflector electrode fingers 9a.
- the reflector 9B has multiple reflector electrode fingers 9b.
- the shape of the multiple reflector electrode fingers 9a of the reflector 9A and the shape of the multiple reflector electrode fingers 9b of the reflector 9B each include a curved shape.
- the shape of the multiple reflector electrode fingers 9a of the reflector 9A and the shape of the multiple reflector electrode fingers 9b of the reflector 9B in a planar view are each a shape in which two arcs are connected.
- one of the arcs in the shape of the multiple reflector electrode fingers 9a is a respective arc in multiple concentric circles centered on the fixed point C1.
- the other arc in the shape of the multiple reflector electrode fingers 9a is a respective arc in multiple concentric circles centered on the fixed point C2.
- the shapes of the multiple reflector electrode fingers 9b are each a shape in which two arcs are connected.
- one of the arcs in the shape of the multiple reflector electrode fingers 9a is a respective arc in multiple concentric circles centered on the fixed point C1.
- the other arc in the shape of the multiple reflector electrode fingers 9a is a respective arc in multiple concentric circles centered on the fixed point C2.
- the shapes of the multiple reflector electrode fingers 9b are each a shape in which
- each reflector electrode finger corresponds to the shape of the electrode fingers of the IDT electrode 8 in the excitation section. Note that the shape of each reflector electrode finger in a planar view may be a curved or straight shape that does not correspond to the shape of the electrode fingers of the IDT electrode 8 in the excitation section.
- the elastic wave device 202 of the first reference example shown in FIG. 5 differs from the elastic wave device 1 of the first embodiment in that it does not have the electrode pattern of the present invention and has a plurality of first offset electrodes 22 and a plurality of second offset electrodes 23.
- each of the multiple first offset electrodes 22 is connected to the first bus bar 14.
- the first electrode fingers 16 and the first offset electrodes 22 are arranged alternately.
- One end of each of the multiple second offset electrodes 23 is connected to the second bus bar 15.
- the second electrode fingers 17 and the second offset electrodes 23 are arranged alternately.
- the first offset electrodes 22 and the second offset electrodes 23 each include a base end and a tip end.
- the base ends of the first electrode finger 16 and the first offset electrode 22 are connected to the first bus bar 14.
- the base ends of the second electrode finger 17 and the second offset electrode 23 are connected to the second bus bar 15.
- the tip end of the first electrode finger 16 and the tip end of the second offset electrode 23 face each other across a gap.
- the tip end of the second electrode finger 17 and the tip end of the first offset electrode 22 face each other across a gap.
- the first offset electrode 22 and the second offset electrode 23 may be simply referred to as offset electrodes.
- the elastic wave device 301 of the second reference example shown in FIG. 6 differs from the elastic wave device 1 of the first embodiment in that it does not have an electrode pattern according to the present invention.
- the design parameters of the elastic wave device 1 of the first embodiment for comparison are as follows.
- the distance between the tip of the electrode finger facing the electrode pattern and the electrode pattern is defined as the I-P gap.
- the distance between the electrode pattern and the bus bar is defined as the B-P gap.
- the dimension of the electrode pattern along the direction perpendicular to the direction in which the electrode pattern extends is defined as the width of the electrode pattern.
- Support substrate 4 Material: Si, surface orientation: (111), Euler angles ( ⁇ , ⁇ , ⁇ ) ⁇ : 73°
- Intermediate layer 5 Material: SiO 2 , thickness: 0.15 ⁇
- Piezoelectric layer 6 Material: rotated Y-cut 55° X-propagation LiTaO 3 , thickness: 0.2 ⁇ IDT electrode 8; material: Al, thickness: 0.05 ⁇ , Ellipticity coefficient ⁇ 12/ ⁇ 11 in the shape of the electrode finger; 1 Ellipticity coefficient ⁇ 22/ ⁇ 21 in the shape of the electrode finger; 1 Wavelength ⁇ : 2 ⁇ m Number of pairs of electrode fingers of the IDT electrode 8: 100 Duty ratio: 0.5 in the excitation section where the angle ⁇ C1 and the angle ⁇ C2 are 0° Intersection angle ⁇ C1_AP ; 10° Intersection angle ⁇ C2_AP ; 10° I-P gap: 0.135 ⁇ Width of the first electrode pattern 18 and the second electrode pattern 19: 0.2 ⁇ B-P gap: 3.2 ⁇
- the design parameters of the elastic wave devices of the first and second reference examples are the same as those of the elastic wave device 1, except for the parameters related to the electrode pattern.
- the length of the offset electrode is defined as the dimension along the direction connecting the base end and the tip end of the offset electrode, the length of each offset electrode is 3.5 ⁇ .
- the distance between the electrode finger and the bus bar is 3.5 ⁇ .
- the impedance frequency characteristics and the relationship between frequency and Q value were determined for each of the elastic wave devices of the first embodiment, the first reference example, and the second reference example.
- FIG. 7 is a diagram showing impedance frequency characteristics in the first embodiment, the first reference example, and the second reference example.
- FIG. 8 is a diagram showing the relationship between frequency and Q value in the first embodiment, the first reference example, and the second reference example. Note that fr shown in FIG. 7 and FIG. 8 is the resonant frequency, and fa is the anti-resonant frequency.
- the impedance frequency characteristics are almost the same in the first and second reference examples.
- the impedance ratio is larger in the first embodiment than in the first and second reference examples.
- the Q value of the first embodiment is higher than that of the first and second reference examples. Specifically, the Q value of the first embodiment is particularly high near the anti-resonance frequency. As a result, the impedance at the anti-resonance frequency is high in the first embodiment. As a result, the impedance ratio in the first embodiment can be increased.
- the leakage of elastic wave energy occurs, for example, when a mode is converted.
- a mode For example, when SH waves are used as the main mode of elastic waves, the energy of the elastic waves leaks due to conversion from SH waves to Rayleigh waves or from SH waves to bulk waves. Such leakage occurs from the crossing region side toward the busbar side.
- the offset electrode is used to suppress the leakage of elastic wave energy.
- the leakage cannot be sufficiently suppressed.
- an offset electrode is not provided, and therefore the leakage of elastic wave energy cannot be suppressed as effectively as in the first reference example. Therefore, in the first and second reference examples, the Q value cannot be sufficiently increased.
- a first electrode pattern 18 is provided between the first bus bar 14 and the second electrode finger 17.
- a second electrode pattern 19 is provided between the second bus bar 15 and the first electrode finger 16.
- the I-P gap which is the distance between the tip of the electrode finger facing the electrode pattern and the electrode pattern, is set to 0.5 ⁇ or less. This makes it possible to suppress the leakage of elastic wave energy that accompanies mode conversion.
- the first electrode patterns 18 face the first busbar 14 across a gap.
- the first electrode fingers 16 and the second electrode fingers 17 are alternately arranged, while in the region closer to the first busbar 14 than the first electrode patterns 18, only the first electrode fingers 16 are provided among the first electrode fingers 16 and the second electrode fingers 17.
- a high acoustic velocity region is formed in the region between the first electrode patterns 18 and the first busbar 14.
- the high acoustic velocity region is a region where the acoustic velocity is higher than that in the central region.
- the central region is a region located in the center of the intersection region D. Details of the central region will be described later.
- a high acoustic velocity region is also formed in the region between the second electrode patterns 19 and the second busbar 15.
- the energy of the elastic waves can be effectively confined to the crossing region D side. Therefore, in the first embodiment, the Q value can be effectively increased.
- the I-P gap exceeds 0.5 ⁇ , energy starts to leak outside the intersection region. If the I-P gap exceeds 1 ⁇ , the effect of suppressing the leakage of elastic wave energy cannot be obtained. On the other hand, it is known that the smaller the I-P gap value, the higher the Q value and the larger the impedance ratio. And if the I-P gap is 0.5 ⁇ or less, the Q value and impedance ratio remain almost unchanged. Therefore, by having an I-P gap of 0.5 ⁇ or less, as in the present invention, the Q value can be effectively increased and the impedance ratio can be increased.
- the angle ⁇ C1 and the excitation angle ⁇ C1_prop are 0° in the excitation section through which the reference line N1 passes.
- the angle ⁇ C2 and the excitation angle ⁇ C2_prop are 0° in the excitation section through which the reference line N2 passes. Since the excitation angles ⁇ C1_prop or the excitation angles ⁇ C2_prop are different between the excitation sections of each curved region, the propagation characteristics of the elastic waves are different from each other. In contrast, in this embodiment, the duty ratios are made different between the multiple excitation sections so that the resonance frequencies or anti-resonance frequencies of all the excitation sections are approximately the same.
- the duty ratios are the same between the excitation sections having the same absolute value of the excitation angle
- one frequency and the other frequency being approximately the same means that the absolute value of the difference between the two frequencies is 10% or less with respect to the reference frequency.
- the reference frequency is the frequency when the excitation angle is 0°.
- the absolute value of the difference between the highest resonance frequency and the lowest resonance frequency of the main mode is preferably 2% or less with respect to the reference frequency, and more preferably 1% or less.
- the absolute value of the difference between the highest anti-resonance frequency and the lowest anti-resonance frequency of the main mode is preferably 2% or less with respect to the reference frequency, and more preferably 1% or less. This makes it possible to more reliably improve the resonance characteristics.
- the propagation characteristics of the elastic waves are different in each excitation section, which makes use of this to obtain effects such as suppressing unwanted waves. The details of this are explained below.
- the phase velocity of the elastic wave has a dependency on the excitation angle in each curved region, and shows a unique characteristic according to the configuration of the substrate.
- the inverse of the phase velocity corresponds to the reverse velocity plane. Therefore, the relationship between the excitation angle ⁇ C1_prop and the excitation angle ⁇ C2_prop and the phase velocity is approximately equal to the reverse velocity plane of the piezoelectric substrate.
- an example of the reverse velocity plane of the piezoelectric substrate having a different layer configuration is shown.
- One piezoelectric substrate is a substrate made of only LiTaO 3 (LT) with a rotated Y cut and 42° X propagation. This substrate is the first piezoelectric substrate.
- the other piezoelectric substrate is a laminated substrate of a piezoelectric layer/support substrate.
- This substrate is the second piezoelectric substrate. More specifically, the second piezoelectric substrate is a substrate in which a silicon substrate with a surface orientation of (100), a silicon oxide film, and a lithium tantalate layer are laminated in this order. Even if the surface orientation of the silicon substrate is (110) or (111) or another surface orientation, the shape of the unevenness of the reverse velocity surface does not change.
- Figure 9 shows the reverse velocity plane of elastic waves propagating through the first piezoelectric substrate and the second piezoelectric substrate.
- the x-axis shown in FIG. 9 corresponds to the result when it is parallel to the propagation axis. That is, it corresponds to the result when the excitation angle ⁇ C1 _prop and the excitation angle ⁇ C2 _prop are 0°.
- the reverse velocity planes in the first piezoelectric substrate and the second piezoelectric substrate are both symmetrical with respect to the x-axis.
- the reverse velocity plane in the first piezoelectric substrate has a concave shape.
- the reverse velocity plane in the second piezoelectric substrate has a convex shape.
- Figure 10 shows the inverse velocity planes of longitudinal waves, fast shear waves, and slow shear waves in a first piezoelectric substrate.
- the reverse velocity planes of the three elastic wave modes, the longitudinal wave, the fast transverse wave, and the slow transverse wave are different from each other.
- the portions passing through the arrows L1 and L2 in FIG. 10 correspond to examples of results when the excitation angles ⁇ C1 _prop and ⁇ C2 _prop are other than 0°.
- the intervals of the reverse velocity planes of the slow transverse wave and the fast transverse wave in the portion passing through the arrow L1 are different from the intervals of the reverse velocity planes of the slow transverse wave and the fast transverse wave in the portion passing through the arrow L2.
- the intervals of the reverse velocity planes of the fast transverse wave and the longitudinal wave in the portion passing through the arrow L1 are different from the intervals of the reverse velocity planes of the fast transverse wave and the longitudinal wave in the portion passing through the arrow L2. That is, in each curved region, the intervals of the reverse velocity planes of different modes are different between excitation parts having different excitation angles. This is also true for the relationship between the main mode and the unnecessary waves used in the elastic wave device.
- the resonant frequencies or anti-resonant frequencies of the main modes are substantially the same in all excitation parts. Therefore, the frequencies of unwanted waves differ from each other in different excitation parts. This disperses unwanted waves outside the passband. Therefore, unwanted waves outside the passband can be suppressed.
- outside the passband in an elastic wave device refers to the lower frequency side than the resonant frequency and the higher frequency side than the anti-resonant frequency.
- the resonant frequencies or anti-resonant frequencies of each excitation section are approximately the same, so that the main mode is preferably excited. This makes it possible to more reliably suppress deterioration of the resonance characteristics.
- the crossing region D has a first curved region W1 and a second curved region W2.
- each electrode finger has a portion located in the first curved region W1 and a portion located in the second curved region W2. Therefore, the crossing angle at the portion where each electrode finger is located corresponds to the sum of the crossing angle ⁇ C1_AP in the first curved region W1 and the crossing angle ⁇ C2_AP in the second curved region W2. Therefore, the range of excitation angles is wide at any position in the crossing region D. This makes it possible to effectively disperse unwanted waves and transverse modes outside the passband.
- the phase velocity corresponds to the reciprocal of the reverse velocity plane. Therefore, the relationship between the excitation angle ⁇ C1_prop and the excitation angle ⁇ C2_prop and the phase velocity is approximately equal to the reverse velocity plane in the XY plane of the piezoelectric substrate as shown in FIG. 10. In other words, it can be said that the function expressing the curved shape of the electrode fingers is determined by the shape of the reverse velocity plane in the XY plane of the piezoelectric substrate.
- the phase velocity of the elastic wave has dependency on the excitation angle ⁇ C1_prop and the excitation angle ⁇ C2_prop .
- the duty ratio is changed in each curve region according to the excitation angle ⁇ C1_prop or the excitation angle ⁇ C2_prop , so that the resonance frequencies or anti-resonance frequencies of all the excitation units are made to substantially coincide with each other.
- the relationship between the excitation angle ⁇ C1_prop and the duty ratio in the first embodiment is shown in FIG. 11. Note that examples in which the maximum value of the duty ratio is different from that in the first embodiment are also shown as a first modified example and a second modified example of the first embodiment.
- FIG. 11 is a diagram showing the relationship between the absolute value
- the duty ratio when the excitation angle ⁇ C1 _prop is 0°, the duty ratio is maximum. Note that in the first embodiment, when the excitation angle ⁇ C1 _prop is 0°, the duty ratio is 0.5. The larger the absolute value of the excitation angle
- the duty ratio is smaller as the absolute value
- the duty ratio is 0.64.
- the excitation angle ⁇ C1 _prop is 0°, the duty ratio is 0.425.
- the resonance frequencies or anti-resonance frequencies are approximately the same in all excitation parts in the first curved region.
- of the excitation angle in the second curved region and the duty ratio is the same as the relationship shown in FIG. 11. Therefore, the resonance frequencies or anti-resonance frequencies are approximately the same in all excitation parts in the second curved region.
- the first and second modified examples are configured in the same way as the first embodiment except for the duty ratio. Therefore, the Q value can be increased.
- the relationship between the duty ratio and the frequency of each mode varies depending on the reverse velocity plane of the piezoelectric substrate. Therefore, depending on the configuration of the piezoelectric substrate and the configuration on the piezoelectric substrate, when the absolute values of the excitation angles
- An example of this is an elastic wave device in which an IDT electrode provided on a substrate made of only rotated Y-cut -4°X-proper LiNbO 3 is embedded in a thick SiO 2 film.
- the duty ratio is not necessarily maximum or minimum.
- the duty ratio is not necessarily maximum or minimum.
- the duty ratio is changed in each curved region according to the angle ⁇ C1 or the excitation angle ⁇ C1 _prop , or the angle ⁇ C2 or the excitation angle ⁇ C2 _prop , so that the resonance frequencies or anti-resonance frequencies of all the excitation parts are made to substantially coincide with each other.
- the setting of parameters such as the duty ratio is not particularly limited. However, it is preferable that at least one of the duty ratio, the electrode finger pitch, and the thicknesses of the first electrode fingers 16 and the second electrode fingers 17 is changed in accordance with the angle ⁇ C1 or the excitation angle ⁇ C1 _prop , or the angle ⁇ C2 or the excitation angle ⁇ C2 _prop .
- At least one of these parameters is changed in accordance with the angle or the excitation angle so that the resonance frequencies or anti-resonance frequencies of all the excitation parts in each curved region are made to substantially coincide with each other. This makes it possible to more reliably improve the resonance characteristics.
- the parameter may be changed in each curved region according to the angle or the excitation angle.
- a dielectric film is provided on the piezoelectric substrate 2 so as to cover the IDT electrode 8, the thickness of the dielectric film may be changed in each curved region according to the angle or the excitation angle.
- a plurality of parameters of the IDT electrode 8 or parameters other than the IDT electrode 8 may be changed in each curved region according to the angle or the excitation angle. Even in these cases, the resonant frequencies or anti-resonant frequencies can be made to approximately match in all excitation sections.
- Parameters such as the reflector electrode finger pitch or duty ratio of each reflector may be different from the parameters of the electrode fingers of the IDT electrode 8 in the excitation section.
- the reflector electrode finger pitch is the center-to-center distance between adjacent reflector electrode fingers.
- Each reflector electrode finger may be configured in a pattern different from the shape of the electrode fingers of the IDT electrode 8 in the excitation section.
- the shape of the multiple electrode fingers in a planar view includes a shape in which two circular arcs are connected.
- this is not limited to this.
- the shape of the multiple electrode fingers in a planar view includes a shape in which two elliptical arcs are connected.
- the intersection region D of the IDT electrode 8A also includes a first curved region W1 and a second curved region W2.
- the shapes of the multiple electrode fingers in a planar view are shapes that correspond to the respective elliptical arcs of multiple ellipses with the same center of gravity.
- the midpoint of the focal points A1 and B1 is the fixed point C1.
- the fixed point C1 is the center of gravity of the focal points A1 and B1.
- the center of gravity of the focal points A1 and B1 is the center of gravity of an ellipse having the focal points A1 and B1.
- the second curved region W2 is the same.
- the midpoint of the focal points A2 and B2 is the fixed point C2.
- the fixed point C2 is the center of gravity of the focal points A2 and B2.
- ⁇ 12/ ⁇ 11 and ⁇ 22/ ⁇ 21 which are the elliptical coefficients ⁇ 1/ ⁇ 2 of the shape of the multiple electrode fingers in a planar view, are other than 1.
- a plurality of first electrode patterns 18 and a plurality of second electrode patterns 19 are provided. This makes it possible to increase the Q value.
- the shape of the IDT electrode in the first embodiment and each of its modified examples is an example in the present invention.
- the shape of the IDT electrode may be a shape in which three or more fixed points are defined.
- Each electrode finger may have multiple inflection points.
- the shape of each electrode finger in a planar view may include a linear shape as well as a curved shape.
- the reference line does not necessarily have to pass through the fixed point.
- the reference line can be defined individually in a localized area of the curve of the shape of each electrode finger in a planar view. In this case, the reference line has an origin other than the fixed point.
- the directions in which the multiple reference lines extend are parallel.
- each electrode finger changes continuously.
- the width of each electrode finger may also change discontinuously.
- each electrode finger may have a configuration corresponding to a configuration in which multiple parts are connected, and at a connection portion where different parts are connected, the widths of the connected parts may differ from each other.
- design parameters of the comparative elastic wave device 1 shown in Figures 7 and 8 show examples of materials for each layer of the piezoelectric substrate 2 and the IDT electrode 8 in the elastic wave device 1.
- the materials are not limited to those mentioned above.
- the combination of materials for each layer of the piezoelectric substrate 2 and the IDT electrode 8 may be any combination of appropriate materials that excites an elastic wave.
- the material of the piezoelectric layer 6 shown in FIG. 2 may be, for example, lithium tantalate, lithium niobate, zinc oxide, aluminum nitride, quartz, or PZT (lead zirconate titanate). It is preferable to use lithium tantalate or lithium niobate as the material of the piezoelectric layer 6.
- the material of the IDT electrode 8 may be, for example, one or more metals selected from the group consisting of Ti, Mo, Ru, W, Al, Pt, Ir, Cu, Cr, and Sc.
- the same material as the IDT electrode 8 may be used for each reflector.
- the IDT electrode 8 and each reflector may be made of a single layer metal film or a laminated metal film.
- the material of the intermediate layer 5 in the first embodiment may be, for example, a dielectric material such as silicon oxide, silicon nitride, silicon oxynitride, or tantalum oxide.
- the material of the support substrate 4 may be, for example, a piezoelectric material such as aluminum nitride, lithium tantalate, lithium niobate, or quartz; a ceramic material such as alumina, sapphire, magnesia, silicon nitride, silicon carbide, zirconia, cordierite, mullite, steatite, or forsterite; a dielectric material such as diamond or glass; a semiconductor material such as silicon, gallium nitride, or gallium arsenide; or a resin; or a material containing the above materials as a main component. It is preferable to use high-resistivity silicon for the support substrate 4. It is desirable for the volume resistivity of the material of the support substrate 4 to be 1000 ⁇ cm or more.
- main component refers to a component that accounts for more than 50% by weight.
- the main component material may be in any of the following states: single crystal, polycrystalline, or amorphous, or a mixture of these.
- the configuration may be such that the piston mode can be used.
- An example of a configuration in which the piston mode can be used is shown below in the second embodiment.
- the excitation section is any part on a straight line passing through a fixed point in an area located in the central area of each curved region, which will be described later.
- FIG. 13 is a schematic plan view of an elastic wave device according to a second embodiment.
- This embodiment differs from the first embodiment in that a mass-adding film is provided on each electrode finger and each reflector electrode finger.
- the elastic wave device of this embodiment has the same configuration as the elastic wave device 1 of the first embodiment.
- the intersection region D of the IDT electrode 8 has a central region F and a pair of edge regions.
- the pair of edge regions are a first edge region H1 and a second edge region H2.
- the first edge region H1 includes the first envelope E1 as an edge portion.
- the second edge region H2 includes the second envelope E2 as an edge portion.
- the first edge region H1 and the second edge region H2 face each other with the central region F in between. Note that the region of the IDT electrode 8 is defined here, and the configuration of the IDT electrode 8 in this embodiment is the same as the configuration of the IDT electrode 8 in the first embodiment.
- each electrode finger in each edge region when viewed in a plan view may be curved or linear.
- a plurality of mass-adding films 29 are provided in the first edge region H1. Specifically, the mass-adding films 29 are provided on each of the first electrode fingers 16 and each of the second electrode fingers 17. This forms a low acoustic velocity region in the first edge region H1.
- the low acoustic velocity region is a region in which the acoustic velocity is lower than that in the central region F.
- each mass-adding film 29 is provided only on one electrode finger.
- the mass-adding film 29 can be made of an appropriate metal or dielectric material.
- a mass-adding film 29 is also provided on each reflector electrode finger 9a of the reflector 9A.
- a mass-adding film 29 is also provided on each reflector electrode finger 9b of the reflector 9B.
- the mass-adding film 29 does not have to be provided on the reflector electrode finger 9a of the reflector 9A and the reflector electrode finger 9b of the reflector 9B.
- the central region F and a pair of low sound velocity regions are arranged in this order from the inside to the outside in the direction in which the first bus bar 14 and the second bus bar 15 face each other. This establishes a piston mode. This effectively confines the energy of the main mode to the center of the intersection region D, improving the characteristics of the main mode and suppressing the transverse mode.
- each electrode finger of the IDT electrode 8 in a planar view includes a curved shape, similar to the first embodiment. Therefore, it is possible to disperse unwanted waves outside the passband.
- the IDT electrode 8 is provided with a plurality of first electrode patterns 18 and a plurality of second electrode patterns 19. This makes it possible to suppress the leakage of energy of the elastic waves, and to increase the Q value. Below, the effect of increasing the Q value in this embodiment is shown by comparing this embodiment with the third reference example.
- the third reference example differs from the second embodiment in that the configuration of the IDT electrodes is the same as that of the IDT electrodes in the elastic wave device 301 of the second reference example shown in FIG. 6.
- a mass-adding film is provided on each electrode finger in each edge region, as in the second embodiment.
- the design parameters of the elastic wave device of the second embodiment in the comparison are the same as those of the elastic wave device 1 of the first embodiment in the comparison in FIGS. 7 and 8, except for the mass-adding film.
- the design parameters of the elastic wave device of the third reference example in the comparison are the same as those of the elastic wave device 301 of the second reference example in the comparison in FIGS. 7 and 8, except for the mass-adding film.
- the impedance-frequency characteristics and the relationship between frequency and Q value were obtained for each of the elastic wave devices of the second embodiment and the third reference example.
- FIG. 14 is a diagram showing impedance frequency characteristics in the second embodiment and the third reference example.
- FIG. 15 is a diagram showing the relationship between frequency and Q value in the second embodiment and the third reference example.
- the impedance ratio is larger in the second embodiment than in the third reference example. Furthermore, it can be seen that the transverse mode between the resonant frequency and the anti-resonant frequency can be suppressed in the second embodiment.
- the Q value is higher in the second embodiment than in the third reference example.
- the Q value is high especially near the anti-resonance frequency.
- the impedance at the anti-resonance frequency is high in the second embodiment.
- the impedance ratio in the second embodiment can be increased.
- a low sonic velocity region is formed in at least one of the first edge region H1 and the second edge region H2.
- a low sonic velocity region is formed in both the first edge region H1 and the second edge region H2. This makes it possible to more reliably establish the piston mode.
- the mass-adding film 29 may be laminated with at least one of the multiple electrode fingers in at least one of the first edge region H1 and the second edge region H2. However, it is preferable that the multiple electrode fingers are laminated with the mass-adding film 29 in at least one of the first edge region H1 and the second edge region H2, and it is more preferable that all of the electrode fingers are laminated with the mass-adding film 29. It is more preferable that the multiple electrode fingers are laminated with the mass-adding film 29 in both the first edge region H1 and the second edge region H2. This makes it possible to more reliably establish the piston mode. It is even more preferable that all of the electrode fingers are laminated with the mass-adding film 29 in both edge regions. In this case, the low sound velocity region is formed in the entirety of both edge regions. This makes it possible to more reliably establish the piston mode.
- the electrode fingers and mass adding film 29 are stacked in the order of the piezoelectric substrate 2, the electrode fingers, and the mass adding film 29.
- they may also be stacked in the order of the piezoelectric substrate 2, the mass adding film 29, and the electrode fingers.
- the mass adding film 29 may be provided between the piezoelectric substrate 2 and the electrode fingers. It is sufficient that the mass adding film 29 overlaps with the electrode fingers when viewed in a plan view.
- the first to fourth modified examples of the second embodiment are shown.
- the first to fourth modified examples can also improve the characteristics of the main mode, suppress transverse modes and unwanted waves outside the passband, and increase the Q value.
- the IDT electrode 8 is configured in the same manner as in the second embodiment.
- One mass-adding film 29A is provided in each of the first edge region H1 and the second edge region H2. This forms a low acoustic velocity region in the first edge region H1 and the second edge region H2.
- each mass addition film 29A has a band-like shape.
- One of the pair of mass addition films 29A is provided over a plurality of electrode fingers in the first edge region H1.
- the other mass addition film 29A is provided over a plurality of electrode fingers in the second edge region H2.
- Each mass addition film 29A is also provided in the portion between the electrode fingers on the piezoelectric layer 6.
- An appropriate dielectric material can be used as the material for the mass addition film 29A.
- the mass-adding film 29A may be laminated with at least one of the multiple electrode fingers in at least one of the first edge region H1 and the second edge region H2. In this case, the mass-adding film 29A may be provided over the portion where the electrode fingers are provided and the portion between the electrode fingers. However, it is preferable that the multiple electrode fingers are laminated with the mass-adding film 29A in at least one of the first edge region H1 and the second edge region H2, and it is more preferable that all the electrode fingers are laminated with the mass-adding film 29A.
- the multiple electrode fingers are laminated with the mass-adding film 29A in both the first edge region H1 and the second edge region H2, and it is even more preferable that all the electrode fingers are laminated with the mass-adding film 29A. This makes it possible to more reliably establish the piston mode.
- each electrode finger of the IDT electrode 28 has a wide portion in the first edge region H1 and the second edge region H2.
- the width of the electrode finger in the wide portion is wider than the width of the electrode finger in the central region F.
- the second electrode finger 27 has a wide portion 27a in the first edge region H1.
- the first electrode finger 26 has a wide portion 26b in the second edge region H2.
- the sound speed in the first edge region H1 and the second edge region H2 is lower than the sound speed in the central region F.
- a low sound speed region is formed in the first edge region H1 and the second edge region H2.
- At least one electrode finger has a wide portion in at least one of the first edge region H1 and the second edge region H2.
- multiple electrode fingers have wide portions in at least one of the first edge region H1 and the second edge region H2, and it is more preferable that all electrode fingers have wide portions. It is more preferable that multiple electrode fingers have wide portions in both the first edge region H1 and the second edge region H2, and it is even more preferable that all electrode fingers have wide portions. This makes it possible to more reliably establish the piston mode.
- each electrode finger is wide over the entire edge region.
- the shape of each wide portion in a plan view is rectangular.
- each electrode finger may be wide in at least a portion of each edge region.
- the shape of each wide portion in a plan view is not limited to a rectangular shape.
- the IDT electrode 28 is configured in the same manner as in the second modified example.
- one mass-adding film 29A is provided in each of the first edge region H1 and the second edge region H2.
- the electrode fingers and mass-adding film 29A are stacked in the order of the piezoelectric substrate 2, the electrode fingers, and the mass-adding film 29A.
- they may also be stacked in the order of the piezoelectric substrate 2, the mass-adding film 29A, and the electrode fingers.
- the mass-adding film 29A may be provided between the piezoelectric substrate 2 and the electrode fingers.
- a high acoustic velocity film 25 is provided in the central region F of the IDT electrode 8 similar to that of the second embodiment. This makes the acoustic velocity in the central region F high. Therefore, the acoustic velocity in the first edge region H1 and the second edge region H2 is lower than the acoustic velocity in the central region F. In other words, low acoustic velocity regions are formed in both the first edge region H1 and the second edge region H2.
- the high acoustic velocity film 25 may be provided in the central region F in the configurations of the first to third modified examples as well.
- the material of the high acoustic velocity film 25 laminated with the IDT electrode 8 is preferably an insulating material such as silicon nitride, silicon carbide, aluminum nitride, aluminum oxide, or diamond thin film.
- the electrode fingers and high acoustic velocity film 25 are stacked in the order of the piezoelectric substrate 2, the electrode fingers, and the high acoustic velocity film 25.
- they may also be stacked in the order of the piezoelectric substrate 2, the high acoustic velocity film 25, and the electrode fingers.
- the high acoustic velocity film 25 may be provided between the piezoelectric substrate 2 and the electrode fingers.
- the first electrode pattern 18 is provided between all of the first electrode fingers 16.
- the second electrode pattern 19 is provided between all of the second electrode fingers 17. Note that in the present invention, the first electrode pattern 18 does not necessarily have to be provided in the portions between all of the first electrode fingers 16. The second electrode pattern 19 does not necessarily have to be provided in the portions between all of the second electrode fingers 17.
- the fifth to seventh modified examples of the second embodiment are shown.
- the main mode characteristics can be improved, the transverse mode and unwanted waves outside the passband can be suppressed, and the Q value can be increased.
- the first electrode pattern 18 is provided between all of the first electrode fingers 16, and the second electrode pattern 19 is provided between all of the second electrode fingers 17.
- a low acoustic velocity region is formed in both the first edge region H1 and the second edge region H2.
- the first electrode pattern 18 is provided between all of the first electrode fingers 16.
- the second electrode pattern 19 is not provided.
- the low acoustic velocity region is formed only in at least a part of the second edge region H2. More specifically, in this modified example, the low acoustic velocity region is formed in the entire second edge region H2.
- some of all the second electrode fingers 17 face the first electrode pattern 18.
- a low acoustic velocity region is formed in a part of the first edge region H1.
- At least one second electrode finger 17 is located in a part of the first edge region H1 where no low acoustic velocity region is formed.
- the tip of the at least one second electrode finger 17 faces the first electrode pattern 18.
- the first electrode pattern 18 is provided in the portion between every other first electrode finger 16 that is aligned in the direction in which the first bus bar 14 extends. Therefore, every other second electrode finger 17 faces the first electrode pattern 18. Then, in the first edge region H1, a mass-adding film 29 is laminated on every other second electrode finger 17. The second electrode finger 17 on which the mass-adding film 29 is laminated does not face the first electrode pattern 18.
- the arrangement in which the first electrode pattern 18 is provided and the arrangement in which the mass-adding film 29 is provided in the first edge region H1 are not limited to the above.
- second electrode patterns 19 are provided between all of the second electrode fingers 17, and a low acoustic velocity region is formed in the entire second edge region H2.
- the first electrode pattern 18 is not provided.
- a low acoustic velocity region is formed in a part of the first edge region H1.
- At least one second electrode finger 17 is located in the part of the first edge region H1 where the low acoustic velocity region is not formed.
- a first offset electrode 22 is provided so as to face the at least one second electrode finger 17.
- the first offset electrode 22 is configured in the same manner as the first offset electrode 22 in the first reference example shown in FIG. 5. That is, one end of the first offset electrode 22, that is, the base end, is connected to the first bus bar 14. The tip end of the first offset electrode 22 faces the tip end of the second electrode finger 17 across a gap.
- a mass-adding film 29 is laminated on every other second electrode finger 17 in the first edge region H1.
- the second electrode fingers 17 on which the mass-adding film 29 is laminated do not face the first offset electrode 22.
- the second electrode fingers 17 on which the mass-adding film 29 is not laminated face the first offset electrode 22.
- second electrode patterns 19 are provided between all of the second electrode fingers 17, and a low acoustic velocity region is formed in the entire second edge region H2.
- each electrode pattern has a rectangular shape extending parallel to the bus bar and is connected to both adjacent electrode fingers.
- the shape of the electrode pattern in the present invention is not limited to the above.
- the third embodiment shows an example of another electrode pattern shape.
- FIG. 23 is a schematic plan view showing the vicinity of the first electrode pattern and the vicinity of the second electrode pattern of the IDT electrode in the third embodiment.
- This embodiment differs from the second embodiment in the configuration of the connections with the electrode fingers in the first electrode pattern 38 and the second electrode pattern 39.
- the elastic wave device of this embodiment has the same configuration as the elastic wave device of the second embodiment.
- the first electrode pattern 38 has a rectangular shape extending parallel to the first bus bar 14 in a plan view, and is connected to only one of the adjacent first electrode fingers 16.
- the second electrode pattern 39 has a rectangular shape extending parallel to the second bus bar 15 in a plan view, and is connected to only one of the adjacent second electrode fingers 17.
- the main mode characteristics can be improved, transverse modes and unnecessary waves outside the passband can be suppressed, and the Q value can be increased.
- the multiple first electrode patterns may include, for example, the first electrode pattern of the first embodiment and the first electrode pattern of the present embodiment. The same applies to the second electrode pattern.
- first to fourth modified examples of the third embodiment are shown, which differ from the third embodiment only in the configurations of the first and second electrode patterns.
- the first to fourth modified examples can also improve the characteristics of the main mode, suppress transverse modes and unwanted waves outside the passband, and increase the Q value.
- the first electrode pattern 38A has a rectangular shape extending parallel to the first bus bar 14 in a plan view, and is not connected to any of the adjacent first electrode fingers 16.
- the second electrode pattern 39A has a rectangular shape extending parallel to the second bus bar 15, and is not connected to any of the adjacent second electrode fingers 17.
- the first electrode pattern 38B has a shape including a side that does not extend parallel to the first bus bar 14 in a plan view, and is connected to both of the adjacent first electrode fingers 16. Specifically, the side of the first electrode pattern 38B facing the first bus bar 14 does not extend parallel to the first bus bar 14. On the other hand, the side facing the second electrode finger 17 extends parallel to the first bus bar 14.
- the shape of the first electrode pattern 38B in a plan view is a pentagon.
- the shape of the second electrode pattern 39B in a plan view is also a pentagon. In this way, the shapes of the first electrode pattern and the second electrode pattern in the present invention in a plan view may be polygons other than a rectangle.
- the first electrode pattern 38C has a shape including a side that does not extend parallel to the first bus bar 14 in a plan view, and is connected to only one of the adjacent first electrode fingers 16.
- the side of the first electrode pattern 38C facing the first bus bar 14 does not extend parallel to the first bus bar 14.
- the side facing the second electrode finger 17 extends parallel to the first bus bar 14.
- the second electrode pattern 39C has a shape including a side that does not extend parallel to the second bus bar 15 in a plan view, and is connected to only one of the adjacent second electrode fingers 17.
- the first electrode pattern 38D has a shape including a side that does not extend parallel to the first bus bar 14 in a plan view, and is not connected to any of the adjacent first electrode fingers 16.
- the side of the first electrode pattern 38D facing the first bus bar 14 does not extend parallel to the first bus bar 14.
- the side facing the second electrode finger 17 extends parallel to the first bus bar 14.
- the shape of the first electrode pattern 38D in a plan view is a pentagon.
- the shape of the second electrode pattern 39D in a plan view is also a pentagon, and is not connected to any of the adjacent second electrode fingers 17.
- At least one of the multiple first electrode patterns may have the configuration of any of the modified examples.
- the multiple first electrode patterns may include first electrode patterns of different forms according to the present invention. The same applies to the multiple second electrode patterns.
- FIG. 28 is a schematic plan view illustrating the configuration of the IDT electrode in the fourth embodiment.
- This embodiment differs from the first embodiment in that the reference line N1 does not include the first envelope E1 and an extension of the first envelope E1.
- the reference line N1 is a straight line that extends parallel to the propagation axis of the piezoelectric layer and passes through the fixed point C1.
- This embodiment also differs from the first embodiment in that the reference line N2 does not include the second envelope E2 and an extension of the second envelope E2.
- the reference line N2 is a straight line that extends parallel to the propagation axis of the piezoelectric layer and passes through the fixed point C2.
- This embodiment also differs from the first embodiment in that the first envelope E1 and the second envelope E2 are inclined with respect to the propagation axis.
- the elastic wave device of this embodiment has a similar configuration to the elastic wave device 1 of the first embodiment.
- a straight line including the first envelope E1 and an extension of the first envelope E1 is defined as a straight line IG1.
- a fixed point C1 is located on the straight line IG1.
- the angle between the straight line IG1 and the reference line N1 is defined as an envelope inclination angle ⁇ IG1 .
- a straight line including the second envelope E2 and an extension of the second envelope E2 is defined as a straight line IG2.
- a fixed point C2 is located on the straight line IG2.
- the angle between the straight line IG2 and the reference line N2 is defined as an envelope inclination angle ⁇ IG2 .
- the absolute values of the envelope inclination angle ⁇ IG1 and the envelope inclination angle ⁇ IG2 are 90° or less.
- the positive direction of both the envelope inclination angle ⁇ IG1 and the envelope inclination angle ⁇ IG2 is defined as a counterclockwise direction when viewed in a plan view.
- the envelope inclination angle ⁇ IG1 is the angle at which the first envelope E1 is inclined with respect to the propagation axis.
- the envelope inclination angle ⁇ IG2 is the angle at which the second envelope E2 is inclined with respect to the propagation axis.
- each envelope inclination angle is not limited to the above.
- the IDT electrode of this embodiment has a plurality of first electrode patterns 18 and a plurality of second electrode patterns 19, similar to the first embodiment. This makes it possible to suppress the leakage of elastic wave energy and increase the Q value.
- the angle ⁇ C1 , the excitation angle ⁇ C1_prop , and the cross angle ⁇ C1_AP are defined with reference to the reference line N1.
- the angle ⁇ C2 , the excitation angle ⁇ C2_prop , and the cross angle ⁇ C2_AP are defined with reference to the reference line N2.
- the duty ratio of the IDT electrode is changed in each curved region according to the excitation angle ⁇ C1_prop or the excitation angle ⁇ C2_prop , so that the resonance frequencies or anti-resonance frequencies of all the excitation parts are made to substantially coincide with each other.
- the relationship between the excitation angle ⁇ C1_prop and the duty ratio in the fourth embodiment is shown in FIG. 29. Note that examples in which the maximum value of the duty ratio is different from that in the fourth embodiment are also shown as a first modified example and a second modified example of the fourth embodiment.
- FIG. 29 is a diagram showing the relationship between the absolute value of the excitation angle
- the two-dot chain line in Fig. 29 indicates the position on the straight line IG1.
- the duty ratio when the excitation angle ⁇ C1 _prop is 0°, the duty ratio is maximum. Note that in the fourth embodiment, when the excitation angle ⁇ C1 _prop is 0°, the duty ratio is 0.5. The larger the absolute value of the excitation angle
- the duty ratio is smaller as the absolute value
- the duty ratio is 0.64.
- the excitation angle ⁇ C1 _prop is 0°, the duty ratio is 0.425.
- the resonance frequencies or anti-resonance frequencies are approximately the same in all excitation parts in the first curved region.
- of the excitation angle in the second curved region and the duty ratio is the same as the relationship shown in FIG. 29. Therefore, the resonance frequencies or anti-resonance frequencies are approximately the same in all excitation parts in the second curved region.
- the first and second modified examples are configured in the same way as the fourth embodiment except for the duty ratio. Therefore, the Q value can be increased.
- a low acoustic velocity region may be configured in the same way as in the second embodiment.
- a mass-adding film 29 is laminated on each electrode finger of the IDT electrode, in the same way as in the second embodiment. That is, in each edge region, a mass-adding film 29 is laminated on each electrode finger. This allows the piston mode to be established.
- a plurality of first electrode patterns 18 and second electrode patterns 19 are also provided. This allows the characteristics of the main mode to be improved, transverse modes and unnecessary waves outside the passband to be suppressed, and the Q value to be increased.
- FIG. 31 is a schematic plan view illustrating the configuration of an IDT electrode in the fifth embodiment.
- ⁇ IG1 ⁇ ⁇ IG2 .
- the signs of the envelope inclination angles ⁇ IG1 and ⁇ IG2 are opposite to each other. That is, the first envelope E1 and the second envelope E2 extend at angles opposite to each other with respect to the propagation axis.
- the IDT electrode 48 has a plurality of first electrode patterns 18 and a plurality of second electrode patterns 19, as in the fourth embodiment. This makes it possible to suppress the leakage of elastic wave energy and increase the Q value.
- the signs of the envelope inclination angle ⁇ IG1 and the envelope inclination angle ⁇ IG2 are opposite to each other and have the same absolute value. Therefore, the first envelope E1 and the second envelope E2 are linearly symmetric with respect to the symmetry axis extending in a direction parallel to the propagation axis. However, the signs of the envelope inclination angle ⁇ IG1 and the envelope inclination angle ⁇ IG2 may be opposite to each other and have different absolute values. The signs of the envelope inclination angle ⁇ IG1 and the envelope inclination angle ⁇ IG2 may be the same and have different absolute values. Alternatively, for example, the first envelope E1 may be inclined with respect to the propagation axis, and the second envelope E2 may not be inclined with respect to the propagation axis.
- a low sound velocity region may be configured in the same manner as in the second embodiment.
- a mass-adding film 29 is laminated on each electrode finger of the IDT electrode 48 in the same manner as in the second embodiment. That is, in each edge region, a mass-adding film 29 is laminated on each electrode finger. This allows the piston mode to be established.
- the IDT electrode 48 is configured in the same manner as in the fifth embodiment, and a plurality of first electrode patterns 18 and second electrode patterns 19 are provided. This allows the characteristics of the main mode to be improved, the transverse mode and unnecessary waves outside the passband to be suppressed, and the Q value to be increased.
- FIG. 33 is a schematic plan view of an elastic wave device according to a sixth embodiment.
- FIG. 34 is a schematic plan view for explaining the configuration of an IDT electrode in the sixth embodiment.
- this embodiment differs from the fifth embodiment in that the intersection region D includes a first linear region T1 and a second linear region T2. As shown in FIG. 34, this embodiment also differs from the fifth embodiment in that the straight line IG1 does not pass through the fixed point C1, and the straight line IG2 does not pass through the fixed point C2.
- the elastic wave device of this embodiment has the same configuration as the elastic wave device of the fifth embodiment.
- the first straight line region T1 includes the first envelope curve E1.
- the second straight line region T2 includes the second envelope curve E2.
- the first electrode fingers 56 and the second electrode fingers 57 have a linear shape in a plan view.
- a straight line that extends parallel to the straight line IG1 and passes through the fixed point C1 is defined as a straight line J1.
- the straight line J1 includes an edge portion of the first curved region W1 on the first bus bar 14 side and an extension of the edge portion.
- the angle between the straight line J1 and the reference line N1 is defined as an edge inclination angle ⁇ J1 .
- a straight line that extends parallel to the straight line IG2 and passes through the fixed point C2 is defined as a straight line J2.
- the straight line J2 includes an edge portion of the second curved region W2 on the second bus bar 15 side and an extension of the edge portion.
- the angle between the straight line J2 and the reference line N2 is defined as an edge inclination angle ⁇ J2 .
- the absolute values of the edge inclination angle ⁇ J1 and the edge inclination angle ⁇ J2 are 90° or less.
- the positive direction of both the edge inclination angle ⁇ J1 and the edge inclination angle ⁇ J2 is defined as the counterclockwise direction in a plan view.
- the signs of the edge inclination angles ⁇ J1 and ⁇ J2 are opposite to each other and the absolute values are the same. Therefore, the edge of the first curved region W1 on the first bus bar 14 side and the edge of the second curved region W2 on the second bus bar 15 side are linearly symmetrical with respect to the axis of symmetry extending in a direction parallel to the propagation axis.
- the signs of the edge inclination angles ⁇ J1 and ⁇ J2 may be opposite to each other and the absolute values may be different.
- the signs of the edge inclination angles ⁇ J1 and ⁇ J2 may be the same and the absolute values may be different.
- the edge inclination angles ⁇ J1 and ⁇ J2 may be the same.
- the edge of the first curved region W1 may be inclined with respect to the propagation axis, and the edge of the second curved region W2 may not be inclined with respect to the propagation axis.
- the IDT electrode 58 has a plurality of first electrode patterns 18 and a plurality of second electrode patterns 19, as in the fifth embodiment. This makes it possible to suppress the leakage of elastic wave energy and increase the Q value.
- a low sound velocity region may be configured in the same manner as in the second embodiment.
- a mass-adding film 29 is laminated on each electrode finger of the IDT electrode 58 in the same manner as in the second embodiment. That is, in each edge region, a mass-adding film 29 is laminated on each electrode finger. This allows the piston mode to be established.
- the IDT electrode 58 is configured in the same manner as in the sixth embodiment, and a plurality of first electrode patterns 18 and second electrode patterns 19 are provided. This allows the characteristics of the main mode to be improved, the transverse mode and unnecessary waves outside the passband to be suppressed, and the Q value to be increased.
- FIG. 36 is a schematic plan view of an elastic wave device according to a seventh embodiment.
- This embodiment differs from the first embodiment in the shape of the IDT electrode 68. Accordingly, the shapes of the reflectors also differ from those of the first embodiment.
- the elastic wave device of this embodiment has a similar configuration to the elastic wave device 1 of the first embodiment.
- the portion of the first busbar 64 on the side of the intersection region D has multiple bends 64a.
- the portion of the second busbar 65 on the side of the intersection region D has multiple bends 65a.
- at least one of the first busbar 64 and the second busbar 65 may have at least one bend.
- the first envelope E1 has multiple bends V1.
- the first envelope E1 has a wavy shape in which the multiple bends V1 are connected by straight lines. This makes the distance between the first bus bar 64 and the intersection region D constant.
- the second envelope E2 has multiple bends V2.
- the second envelope E2 has a wavy shape in which the multiple bends V2 are connected by straight lines. This makes the distance between the second bus bar 65 and the intersection region D constant.
- At least one of the first envelope E1 and the second envelope E2 may have a wavy shape in which multiple bends are connected by curves.
- at least one of the first envelope E1 and the second envelope E2 may have a wavy shape.
- each first electrode pattern 18 extends parallel to the direction in which the portion of the first busbar 64 on the crossing region D side extends.
- the multiple first electrode patterns 18 are lined up along a wavy shape.
- each second electrode pattern 19 extends parallel to the direction in which the portion of the second busbar 65 on the crossing region D side extends.
- the multiple second electrode patterns 19 are lined up along a wavy shape.
- the shape of the multiple electrode fingers of the IDT electrode 68 in a planar view is an arc shape on concentric circles with a common center at a fixed point.
- the distance between the tip of the electrode finger facing the electrode pattern and the electrode pattern is 0.5 ⁇ or less. This makes it possible to increase the Q value.
- the duty ratio is adjusted to make the resonant frequencies or anti-resonant frequencies in all excitation sections approximately equal.
- the electrode finger pitch may be adjusted to make the resonant frequencies or anti-resonant frequencies in all excitation sections approximately equal. An example of this is shown in the eighth embodiment.
- the eighth embodiment differs from the first embodiment in that the duty ratio of the IDT electrodes is constant and the electrode finger pitch is not constant.
- the elastic wave device of this embodiment has the same configuration as the elastic wave device 1 of the first embodiment.
- the electrode finger pitch in the excitation portion where ⁇ C1 — prop is 0° is p0
- the electrode finger pitch in an arbitrary portion is p1
- the rate of change in the electrode finger pitch ⁇ pitch [%] is ⁇ (p1 ⁇ p0)/p0 ⁇ 100 [%].
- FIG. 37 is a diagram showing the relationship between the absolute value
- the resonance frequencies or the anti-resonance frequencies are approximately the same.
- the resonance frequencies or anti-resonance frequencies may be approximately equal in all excitation parts.
- An example of this is an acoustic wave device in which an IDT electrode provided on a substrate made of only rotated Y-cut -4°X-prop LiNbO 3 is embedded in a thick SiO 2 film.
- the value of the electrode finger pitch is not necessarily maximum or minimum.
- the duty ratio or electrode finger pitch is adjusted to make the resonant frequencies or anti-resonant frequencies in all excitation sections approximately equal.
- the thickness of multiple electrode fingers may be adjusted to make the resonant frequencies or anti-resonant frequencies in all excitation sections approximately equal. An example of this is shown in the ninth embodiment.
- the ninth embodiment differs from the first embodiment in that the duty ratio of the IDT electrode is constant and the thickness of the multiple electrode fingers is not constant.
- the elastic wave device of this embodiment has the same configuration as the elastic wave device 1 of the first embodiment.
- FIG. 38 is a diagram showing the relationship between the absolute value of the excitation angle
- the thinner the thickness of the first electrode finger and the second electrode finger.
- in the second curved region and the thickness of the first electrode finger and the second electrode finger is also the same as the relationship shown in Fig. 38.
- the resonance frequencies or the anti-resonance frequencies are approximately the same.
- the relationship between the thickness of the first electrode finger and the second electrode finger and the frequency of each mode varies depending on the reverse velocity plane of the piezoelectric substrate. Therefore, depending on the configuration of the piezoelectric substrate and the configuration on the piezoelectric substrate, the larger the absolute values of the excitation angles
- An example of this is an acoustic wave device in which an IDT electrode provided on a substrate made of only rotated Y-cut -4°X-prop LiNbO 3 is embedded in a thick SiO 2 film.
- the thickness value of the first electrode finger and the second electrode finger is not necessarily maximum or minimum.
- the resonant frequencies or anti-resonant frequencies in all excitation sections are made to substantially coincide with each other by the configuration of the IDT electrodes.
- the resonant frequencies or anti-resonant frequencies in all excitation sections may also be made to substantially coincide with each other by adjusting the thickness of the dielectric film covering the IDT electrodes. An example of this is shown in the tenth embodiment and its modified example.
- FIG. 39 is a schematic cross-sectional front view of an elastic wave device according to a tenth embodiment.
- FIG. 39 shows a cross section corresponding to the portion shown in FIG. 2. The same is true for the other schematic cross-sectional front views.
- This embodiment differs from the first embodiment in that the duty ratio of the IDT electrode 78 is constant. This embodiment also differs from the first embodiment in that a dielectric film 75 is provided on the piezoelectric layer 6 so as to cover the IDT electrode 78.
- the elastic wave device of this embodiment has the same configuration as the elastic wave device 1 of the first embodiment.
- the sound velocity of the transverse wave propagating through the dielectric film 75 of this embodiment is lower than the sound velocity of the main mode propagating through the dielectric film 75.
- the thickness of the dielectric film 75 varies depending on the excitation angle ⁇ C1 _prop of the excitation part of the first curved region covered by the dielectric film 75.
- the thickness of the dielectric film 75 varies depending on the excitation angle ⁇ C2 _prop of the excitation part of the second curved region covered by the dielectric film 75.
- FIG. 40 is a diagram showing the relationship between the absolute value
- of the excitation angle of the excitation part in the first curved region covered by the dielectric film 75 the thinner the thickness of the dielectric film 75.
- of the excitation angle in the second curved region and the thickness of the dielectric film 75 is also the same as the relationship shown in Fig. 40.
- the resonance frequencies or the anti-resonance frequencies are approximately the same.
- the leakage of the energy of the elastic wave can be suppressed and the Q value can be increased.
- the sound velocity of the transverse waves propagating through the dielectric film 75 is lower than the sound velocity of the main mode propagating through the dielectric film 75.
- the relationship of the sound velocities of the waves propagating through the dielectric film is not limited to the above.
- a modified example of the tenth embodiment, which differs from the tenth embodiment only in the sound velocity of the transverse waves propagating through the dielectric film and the manner in which the thickness changes, is shown below.
- the sound velocity of the transverse wave propagating through the dielectric film is higher than the sound velocity of the main mode propagating through the dielectric film.
- of the excitation angle in the excitation part of the first curved region covered by the dielectric film and the thickness of the dielectric film is as shown in FIG. 41. More specifically, the greater the absolute value
- of the excitation angle in the second curved region and the thickness of the dielectric film is also the same as the relationship shown in FIG. 41.
- the resonance frequencies or the anti-resonance frequencies are approximately the same.
- the leakage of the energy of the elastic wave can be suppressed, and the Q value can be increased.
- the thickness of the portion of the dielectric film covering the excitation portion through which the reference line passes in this invention may not necessarily be the maximum or minimum.
- the laminated structure of the piezoelectric substrate is not limited to the configuration shown in FIG. 2.
- the eleventh embodiment shows an example in which an elastic wave device has a piezoelectric substrate different from that of the first embodiment.
- FIG. 42 is a schematic cross-sectional front view of an elastic wave device according to an eleventh embodiment.
- This embodiment differs from the first embodiment in the layered structure of the piezoelectric substrate 82.
- the elastic wave device of this embodiment has the same configuration as the elastic wave device of the first embodiment.
- the piezoelectric substrate 82 has a support substrate 4, a high acoustic velocity film 85A, a low acoustic velocity film 85B, and a piezoelectric layer 6.
- the high acoustic velocity film 85A is provided on the support substrate 4.
- the low acoustic velocity film 85B is provided on the high acoustic velocity film 85A.
- the piezoelectric layer 6 is provided on the low acoustic velocity film 85B.
- the high acoustic velocity film 85A is a film with a relatively high acoustic velocity. More specifically, the acoustic velocity of the bulk wave propagating through the high acoustic velocity film 85A is higher than the acoustic velocity of the elastic wave propagating through the piezoelectric layer 6.
- the material of the high acoustic velocity film 85A may be, for example, a piezoelectric material such as aluminum nitride, lithium tantalate, lithium niobate, or quartz; a ceramic material such as alumina, sapphire, magnesia, silicon nitride, silicon carbide, zirconia, cordierite, mullite, steatite, forsterite, spinel, or sialon; a dielectric material such as aluminum oxide, silicon oxynitride, DLC (diamond-like carbon), or diamond; or a semiconductor material such as silicon; or a material mainly composed of the above-mentioned material.
- a piezoelectric material such as aluminum nitride, lithium tantalate, lithium niobate, or quartz
- a ceramic material such as alumina, sapphire, magnesia, silicon nitride, silicon carbide, zirconia, cordierite, mullite, steatite
- the spinel includes an aluminum compound containing one or more elements selected from Mg, Fe, Zn, Mn, and the like, and oxygen.
- Examples of the spinel include MgAl2O4 , FeAl2O4 , ZnAl2O4 , and MnAl2O4 .
- the low acoustic velocity film 85B is a film with a relatively low acoustic velocity. More specifically, the acoustic velocity of the bulk waves propagating through the low acoustic velocity film 85B is lower than the acoustic velocity of the bulk waves propagating through the piezoelectric layer 6.
- the low acoustic velocity film 85B can be made of a material such as glass, silicon oxide, silicon oxynitride, lithium oxide, tantalum oxide, or a dielectric material such as a compound of silicon oxide with fluorine, carbon, or boron added, or a material containing the above materials as a main component.
- a high acoustic velocity film 85A, a low acoustic velocity film 85B, and a piezoelectric layer 6 are laminated in this order on a piezoelectric substrate 82.
- the stopband is a region where the wavelength of the elastic wave is constant as a result of the elastic wave being confined in a metal grating with a periodic structure.
- the upper end of the stopband is the end of the stopband on the high-frequency side.
- the stopband is a band from the resonant frequency to the frequency at the upper end of the stopband.
- the Q value can be effectively increased. Furthermore, it is also possible to suppress transverse modes.
- Support substrate 4 Material: Si, surface orientation: (111), Euler angles ( ⁇ , ⁇ , ⁇ ) ⁇ : 73° High sound velocity film 85A; material: SiN, thickness: 0.15 ⁇ Low sound velocity film 85B: material: SiO 2 , thickness: 0.15 ⁇
- Piezoelectric layer 6 Material: rotated Y-cut 55° X-propagation LiTaO 3 , thickness: 0.2 ⁇ IDT electrode 8; material: Al, thickness: 0.05 ⁇ , Ellipticity coefficient ⁇ 12/ ⁇ 11 in the shape of the electrode finger; 1 Ellipticity coefficient ⁇ 22/ ⁇ 21 in the shape of the electrode finger; 1 Wavelength ⁇ : 2 ⁇ m Number of pairs of electrode fingers of the IDT electrode 8: 80 Duty ratio: 0.5 in the excitation section where the angle ⁇ C1 and the angle ⁇ C2 are 0° Intersection angle ⁇ C1_AP ; 10° Intersection angle ⁇ C2_AP ; 10° I-P gap: 0.135 ⁇ Width of the first electrode pattern 18
- the design parameters of the elastic wave device of the second reference example are the same as those of the elastic wave device of the eleventh embodiment, except for the parameters related to the electrode pattern.
- the distance between the electrode fingers and the bus bar is 2 ⁇ .
- the impedance frequency characteristics and the relationship between frequency and Q value were determined for each of the elastic wave devices of the 11th embodiment and the second reference example.
- FIG. 43 is a diagram showing impedance frequency characteristics in the eleventh embodiment and the second reference example.
- FIG. 44 is a diagram showing the relationship between frequency and return loss in the eleventh embodiment and the second reference example. Note that fr shown in FIG. 43 and FIG. 44 is the resonance frequency, fa is the anti-resonance frequency, and fs is the frequency at the upper end of the stop band. The same applies to FIG. 45 and FIG. 46 described later.
- the impedance ratio is greater in the 11th embodiment than in the second reference example. This is because the Q value can be increased in the 11th embodiment.
- each electrode finger has a wide portion. This forms a low acoustic velocity region in each edge region.
- the design parameters of the elastic wave device of the first modified example in this comparison are similar to the design parameters of the elastic wave device of the eleventh embodiment in this comparison in Figures 43 and 44, except for the edge regions. Specifically, in the first modified example, the dimension of each edge region along the direction in which the electrode fingers extend is 0.75 ⁇ . The duty ratio in each edge region is 0.67.
- the design parameters of the elastic wave device of the second reference example are similar to the design parameters in the comparison in Figures 43 and 44.
- FIG. 45 is a diagram showing impedance frequency characteristics in the first modified example and the second reference example of the 11th embodiment.
- FIG. 46 is a diagram showing the relationship between frequency and return loss in the first modified example and the second reference example of the 11th embodiment.
- the impedance ratio is larger in the first modified example than in the second reference example. This is because the Q value can be increased in the first modified example, as in the eleventh embodiment.
- the first modified example is able to suppress the transverse mode more effectively than the second reference example. This is because the piston mode is established in the first modified example. In addition, it can be seen that this modified example is able to reduce loss in the stopband more than the second reference example.
- the effects of the eleventh embodiment and the first modified example can be obtained in the same way even when a dielectric film is provided on a piezoelectric substrate.
- a piezoelectric substrate 82A has a support substrate 4, an acoustic reflection film 87, a low acoustic velocity film 85B, and a piezoelectric layer 6.
- the acoustic reflection film 87 is provided on the support substrate 4.
- the low acoustic velocity film 85B is provided on the acoustic reflection film 87.
- the piezoelectric layer 6 is provided on the low acoustic velocity film 85B.
- the acoustic reflection film 87 is a laminate of multiple acoustic impedance layers. Specifically, the acoustic reflection film 87 has multiple low acoustic impedance layers and multiple high acoustic impedance layers.
- the high acoustic impedance layers are layers with relatively high acoustic impedance. More specifically, the multiple high acoustic impedance layers of the acoustic reflection film 87 are high acoustic impedance layer 87a, high acoustic impedance layer 87c, and high acoustic impedance layer 87e.
- the low acoustic impedance layers are layers with relatively low acoustic impedance.
- the multiple low acoustic impedance layers of the acoustic reflection film 87 are low acoustic impedance layer 87b and low acoustic impedance layer 87d.
- the low acoustic impedance layers and high acoustic impedance layers are alternately laminated.
- the high acoustic impedance layer 87a is the layer located closest to the piezoelectric layer 6 in the acoustic reflection film 87.
- the acoustic reflection film 87 has two low acoustic impedance layers and three high acoustic impedance layers. However, it is sufficient that the acoustic reflection film 87 has at least one low acoustic impedance layer and one high acoustic impedance layer.
- the material for the low acoustic impedance layer may be, for example, silicon oxide or aluminum.
- the material for the high acoustic impedance layer may be, for example, a metal such as platinum or tungsten, or a dielectric such as aluminum nitride or silicon nitride.
- the material for the low acoustic velocity film 85B may be the same as the material for the low acoustic impedance layer.
- the piezoelectric substrate 82B has a support substrate 84 and a piezoelectric layer 6.
- the piezoelectric layer 6 is provided directly on the support substrate 84. More specifically, the support substrate 84 has a recess.
- the piezoelectric layer 6 is provided on the support substrate 84 so as to cover the recess. This forms a hollow portion 82c in the piezoelectric substrate 82B.
- a portion of the piezoelectric layer 6 and a portion of the support substrate 84 face each other with the hollow portion 82c in between.
- the hollow portion 82c overlaps at least a portion of the IDT electrode 8 in a plan view.
- the IDT electrode 8 shown in FIG. 42 may be embedded in a protective film.
- a protective film 89 is provided on the piezoelectric layer 6 so as to cover the IDT electrode 8.
- the thickness of the protective film 89 is greater than the thickness of the IDT electrode 8.
- the IDT electrode 8 is embedded in the protective film 89. This makes it difficult for the IDT electrode 8 to be damaged.
- the protective film 89 has a first layer 89a and a second layer 89b.
- the IDT electrode 8 is embedded in the first layer 89a.
- the second layer 89b is provided on the first layer 89a.
- silicon oxide is used as the material for the first layer 89a.
- TCF temperature coefficient of frequency
- Silicon nitride is used for the second layer 89b. This allows the moisture resistance to be improved.
- the Q value can be increased, as in the eleventh embodiment.
- the materials of the first layer 89a and the second layer 89b are not limited to those mentioned above.
- the protective film 89 may be a single layer or a laminate of three or more layers.
- FIG. 50 is a schematic cross-sectional front view of an elastic wave device according to a twelfth embodiment.
- This embodiment differs from the first embodiment in that an IDT electrode 8 is provided on both the first principal surface 6a and the second principal surface 6b of the piezoelectric layer 6.
- the IDT electrode 8 provided on the second principal surface 6b is located within the hollow portion 2c.
- the elastic wave device 91 of this embodiment has the same configuration as the elastic wave device 1 of the first embodiment.
- a plurality of first electrode patterns and a plurality of second electrode patterns are provided. This makes it possible to suppress the leakage of elastic wave energy and increase the Q value.
- the IDT electrodes 8 provided on the first principal surface 6a and the second principal surface 6b of the piezoelectric layer 6 may have different design parameters, for example.
- first to third modified examples of the twelfth embodiment are shown, which differ from the twelfth embodiment only in at least one of the configuration of the electrodes provided on the second main surface of the piezoelectric layer and the laminated structure of the piezoelectric substrate.
- the Q value can be increased.
- the piezoelectric substrate 82 is configured in the same manner as in the eleventh embodiment. Specifically, the piezoelectric substrate 82 has a support substrate 4, a high acoustic velocity film 85A, a low acoustic velocity film 85B, and a piezoelectric layer 6. The IDT electrode 8 provided on the second main surface 6b of the piezoelectric layer 6 is embedded in the low acoustic velocity film 85B.
- a plate-shaped electrode 98 is provided on the second main surface 6b of the piezoelectric layer 6.
- the electrode 98 is located within the hollow portion 2c.
- the IDT electrode 8 and the electrode 98 face each other with the piezoelectric layer 6 in between.
- the piezoelectric substrate 82 is configured in the same manner as in the first modified example, and an electrode 98 similar to that in the second modified example is provided on the second main surface 6b of the piezoelectric layer 6.
- the electrode 98 is embedded in the low acoustic velocity film 85B.
- the elastic wave device according to the present invention can be used, for example, in a filter device. An example of this is shown below.
- FIG. 54 is a circuit diagram of a filter device according to the thirteenth embodiment.
- the filter device 100 of this embodiment is a ladder-type filter.
- the filter device 100 has a first signal terminal 102, a second signal terminal 103, a plurality of series arm resonators, and a plurality of parallel arm resonators.
- all of the series arm resonators and all of the parallel arm resonators are elastic wave resonators.
- all of the series arm resonators and all of the parallel arm resonators are elastic wave devices according to the present invention.
- it is sufficient that at least one of the plurality of elastic wave resonators of the filter device 100 is an elastic wave device according to the present invention.
- the first signal terminal 102 is an antenna terminal.
- the antenna terminal is connected to an antenna.
- the first signal terminal 102 does not necessarily have to be an antenna terminal.
- the first signal terminal 102 and the second signal terminal 103 may be configured as, for example, an electrode pad or as wiring.
- the multiple series arm resonators in this embodiment are specifically series arm resonators S1, S2, and S3.
- the multiple series arm resonators are connected in series between the first signal terminal 102 and the second signal terminal 103.
- the multiple parallel arm resonators are specifically parallel arm resonators P1 and P2.
- the parallel arm resonator P1 is connected between the connection point between the series arm resonator S1 and the series arm resonator S2 and the ground potential.
- the parallel arm resonator P2 is connected between the connection point between the series arm resonator S2 and the series arm resonator S3 and the ground potential.
- the circuit configuration of the filter device 100 is not limited to the above.
- the filter device 100 may include, for example, a longitudinally coupled resonator type acoustic wave filter.
- the elastic wave resonator in the filter device 100 is an elastic wave device according to the present invention. Therefore, in the elastic wave resonator of the filter device 100, it is possible to suppress the leakage of elastic wave energy and increase the Q value. Therefore, it is possible to improve the filter characteristics of the filter device 100.
- a piezoelectric substrate including a piezoelectric layer, and an IDT electrode provided on the piezoelectric layer and having a pair of bus bars and a plurality of electrode fingers, the pair of bus bars being a first bus bar and a second bus bar facing each other, the plurality of electrode fingers being a plurality of first electrode fingers and a plurality of second electrode fingers, one end of each of the plurality of first electrode fingers being connected to the first bus bar, one end of each of the plurality of second electrode fingers being connected to the second bus bar, the plurality of first electrode fingers and the plurality of second electrode fingers being interdigitated with each other, a virtual line formed by connecting the tips of the plurality of second electrode fingers being a first envelope, a virtual line formed by connecting the tips of the plurality of first electrode fingers being a second envelope, and the first envelope in the IDT electrode and the second envelope is an intersection region, the region is provided on the piezoelectric layer, and the region further includes a plurality of electrode patterns provided at least one between the first bus bar
- ⁇ 2> The elastic wave device described in ⁇ 1>, in which the intersection region has a first edge region including the first envelope, a second edge region including the second envelope, and a central region sandwiched between the first edge region and the second edge region, and a low sound speed region is formed in at least a portion of at least one of the first edge region and the second edge region, in which the sound speed is lower than the sound speed in the central region.
- the elastic wave device according to ⁇ 2> or ⁇ 3>, further comprising a mass-adding film that is provided in at least one of the first edge region and the second edge region so as to overlap at least one of the first electrode fingers and the second electrode fingers when viewed in a plane, and the low acoustic velocity region is formed by providing the mass-adding film.
- An elastic wave device according to any one of ⁇ 2> to ⁇ 4>, further comprising a high acoustic velocity film provided in the central region, the high acoustic velocity film making the acoustic velocity in the central region higher than the acoustic velocity in the first edge region and the second edge region, and the low acoustic velocity region being formed in both the first edge region and the second edge region.
- ⁇ 6> An elastic wave device according to any one of ⁇ 2> to ⁇ 5>, in which the low acoustic velocity region is formed throughout both the first edge region and the second edge region.
- ⁇ 7> An elastic wave device according to any one of ⁇ 2> to ⁇ 4>, in which the low acoustic velocity region is formed in at least a portion of only one of the first edge region and the second edge region.
- An elastic wave device according to any one of ⁇ 2> to ⁇ 4>, in which some of all the second electrode fingers face the electrode pattern, the low acoustic velocity region is formed in a part of the first edge region, at least one of the second electrode fingers is located in a part of the first edge region where the low acoustic velocity region is not formed, and a tip of the at least one second electrode finger faces the electrode pattern.
- An elastic wave device comprising at least one offset electrode having one end connected to the first bus bar, the low acoustic velocity region being formed in a portion of the first edge region, at least one of the second electrode fingers being positioned in a portion of the first edge region where the low acoustic velocity region is not formed, and the at least one second electrode finger and the at least one offset electrode being opposed to each other.
- An elastic wave device according to any one of ⁇ 1> to ⁇ 7>, in which the plurality of electrode patterns are provided both between the first bus bar and the intersection region and between the second bus bar and the intersection region, and the tips of all the first electrode fingers and the tips of all the second electrode fingers face the electrode patterns.
- ⁇ 12> An elastic wave device according to any one of ⁇ 1> to ⁇ 7>, in which the plurality of electrode patterns are provided only between the first bus bar and the intersection region and only between the second bus bar and the intersection region.
- An elastic wave device according to any one of ⁇ 1> to ⁇ 12>, in which at least one of the plurality of electrode patterns has a rectangular shape in a plan view that extends parallel to the bus bar of the pair of bus bars that faces the electrode pattern, and is connected to both of the adjacent electrode fingers connected to the bus bar.
- An elastic wave device according to any one of ⁇ 1> to ⁇ 12>, in which at least one of the plurality of electrode patterns has a rectangular shape extending parallel to the bus bar of the pair of bus bars that faces the electrode pattern in a plan view, and is connected to only one of the adjacent electrode fingers connected to the bus bar.
- An elastic wave device according to any one of ⁇ 1> to ⁇ 12>, in which at least one of the plurality of electrode patterns has a rectangular shape extending parallel to the bus bar of the pair of bus bars that faces the electrode pattern in a plan view, and is not connected to any of the adjacent electrode fingers connected to the bus bar.
- An elastic wave device according to any one of ⁇ 1> to ⁇ 12>, in which at least one of the plurality of electrode patterns has a shape including a side that does not extend parallel to the bus bar of the pair of bus bars that faces the electrode pattern in a plan view, and is connected to both of the adjacent electrode fingers connected to the bus bar.
- An elastic wave device according to any one of ⁇ 1> to ⁇ 12>, in which at least one of the plurality of electrode patterns has a shape including a side that does not extend parallel to the bus bar of the pair of bus bars that faces the electrode pattern in a plan view, and is connected to only one of the adjacent electrode fingers connected to the bus bar.
- An elastic wave device according to any one of ⁇ 1> to ⁇ 12>, in which at least one of the plurality of electrode patterns has a shape including a side that does not extend parallel to the bus bar of the pair of bus bars that faces the electrode pattern in a plan view, and is not connected to any of the adjacent electrode fingers connected to the bus bar.
- An elastic wave device according to any one of ⁇ 1> to ⁇ 18>, in which a piezoelectric single crystal is used as the material of the piezoelectric layer, the piezoelectric layer has a propagation axis, and the first envelope extends at an angle with respect to the propagation axis.
- An elastic wave device according to any one of ⁇ 1> to ⁇ 19>, in which at least one of the first envelope and the second envelope has at least one bend where the extension direction changes.
- An elastic wave device according to any one of ⁇ 1> to ⁇ 21>, in which the shapes of the first electrode fingers and the second electrode fingers in a plan view each include at least two curved portions in which the first electrode fingers and the second electrode fingers bend in different directions in the intersection region, and have at least one inflection point.
- ⁇ 23> The elastic wave device according to ⁇ 22>, wherein the at least two curved portions in the shape of the first electrode fingers and the second electrode fingers in a planar view each include a circular arc or an elliptical arc shape, and the intersection region includes at least two curved regions in which the shape of the first electrode fingers and the second electrode fingers in a planar view each include a single circular arc or an elliptical arc shape.
- one of the plurality of curved regions includes the first envelope, and in each of the curved regions, the center of a circle including the circular arc in the shape of the first electrode finger and the second electrode finger, or the center of gravity of two foci of an ellipse including the elliptical arc, is taken as a fixed point, and a portion on an arbitrary straight line passing through the fixed point in each of the curved regions is taken as an excitation portion, an extension line of the first envelope passes through the fixed point in the curved region, and a straight line including the first envelope and the extension line of the first envelope is taken as a reference line, and the fixed point and
- the elastic wave device in which, when an angle between a straight line passing through the fixed point and the excitation part and the reference line is defined, and an excitation angle between a straight line passing through the fixed point and the excitation part in the curved region and an excitation direction of an elastic wave at an intersection of the electrode fingers and the reference line is defined, at least one
- the piezoelectric layer further includes a dielectric film provided to cover the IDT electrode, and one of the plurality of curved regions includes the first envelope, and in each of the curved regions, the center of a circle including the circular arc in the shape of the first electrode finger and the second electrode finger, or the center of gravity of two foci of an ellipse including the elliptical arc is set as a fixed point, and in each of the curved regions, when a portion on any straight line passing through the fixed point is set as an excitation portion, an extension line of the first envelope passes through the fixed point in the curved region, and the first envelope and the first envelope are aligned in a direction perpendicular to each other.
- the elastic wave device described in ⁇ 23> in which a straight line including an extension of a tangential line is used as a reference line, an angle formed by a straight line passing through the fixed point and the excitation part in the curved region including the first envelope and the reference line is defined, and an excitation angle is defined as an angle formed by the straight line passing through the fixed point and the excitation part in the curved region and the excitation direction of the elastic wave at the intersection of the electrode fingers and the reference line, the thickness of the dielectric film changes according to each of the angles or the excitation angles so that the resonance frequencies or anti-resonance frequencies in all the excitation parts in the curved region are approximately equal.
- a piezoelectric single crystal is used as the material of the piezoelectric layer, the piezoelectric layer has a propagation axis, and in each of the curved regions, the center of a circle including the circular arc in the shape of the first electrode finger and the second electrode finger, or the center of gravity of two foci of an ellipse including the elliptical arc is a fixed point, and in each of the curved regions, a portion on any straight line passing through the fixed point is an excitation part, a straight line extending parallel to the propagation axis and passing through the fixed point is a reference line, and a straight line passing through the fixed point and the excitation part in the curved region including the first envelope,
- the elastic wave device described in ⁇ 23> in which at least one of the duty ratio, the electrode finger pitch, and the thicknesses of the first electrode fingers and the second electrode fingers varies according to the angle or the excitation angle, so that when the angle formed by the reference line and the straight line passing through the fixed point and
- a dielectric film is further provided on the piezoelectric layer so as to cover the IDT electrode, and a piezoelectric single crystal is used as the material of the piezoelectric layer, the piezoelectric layer has a propagation axis, and in each of the curved regions, the center of a circle including the circular arc in the shape of the first electrode finger and the second electrode finger, or the center of gravity of two foci of an ellipse including the elliptical arc, is a fixed point, and in each of the curved regions, a portion on any straight line passing through the fixed point is an excitation part, and a straight line extending parallel to the propagation axis and passing through the fixed point is a reference line
- the elastic wave device described in ⁇ 23> in which the angle formed by the reference line and a straight line passing through the fixed point and the excitation part in the curved region including the first envelope is defined, and the excitation angle formed by the straight line passing through the fixed point and the excitation part in the curved region
- An elastic wave device according to any one of ⁇ 1> to ⁇ 27>, wherein in the intersection region, the shapes of the first electrode fingers and the second electrode fingers in a planar view include straight line shapes.
- the elastic wave device according to any one of ⁇ 1> to ⁇ 28>, further comprising a pair of reflectors arranged on the piezoelectric layer so as to face each other with the IDT electrode therebetween, each of the reflectors having a plurality of reflector electrode fingers, and the shape of the plurality of reflector electrode fingers in a plan view includes a curved shape.
- ⁇ 30> An elastic wave device according to any one of ⁇ 1> to ⁇ 29>, in which the piezoelectric substrate has a support substrate and the piezoelectric layer is provided on the support substrate.
- ⁇ 31> The elastic wave device described in ⁇ 30>, wherein the piezoelectric substrate has an intermediate layer provided between the support substrate and the piezoelectric layer.
- ⁇ 32> An elastic wave device according to ⁇ 30> or ⁇ 31>, in which a hollow portion is formed in the piezoelectric substrate, and a part of the support substrate and a part of the piezoelectric layer face each other with the hollow portion therebetween.
- a filter device comprising a plurality of elastic wave resonators, at least one of which is an elastic wave device according to any one of ⁇ 1> to ⁇ 33>.
- REFERENCE SIGNS LIST 1 ... acoustic wave device 2... piezoelectric substrate 2c... hollow portion 4... supporting substrate 5... intermediate layer 6... piezoelectric layer 6a, 6b... first and second main surfaces 8, 8A... IDT electrodes 9A, 9B... reflectors 9a, 9b... reflector electrode fingers 14, 15... first and second bus bars 16, 17... first and second electrode fingers 18, 19... first and second electrode patterns 22, 23... first and second offset electrodes 25... high acoustic velocity films 26...
Landscapes
- Physics & Mathematics (AREA)
- Acoustics & Sound (AREA)
- Surface Acoustic Wave Elements And Circuit Networks Thereof (AREA)
- Chemical & Material Sciences (AREA)
- Crystallography & Structural Chemistry (AREA)
Abstract
Description
中間層5;材料…SiO2、厚み…0.15λ
圧電体層6;材料…回転Yカット55°X伝搬のLiTaO3、厚み…0.2λ
IDT電極8;材料…Al、厚み…0.05λ、
電極指の形状における楕円係数α12/α11;1
電極指の形状における楕円係数α22/α21;1
波長λ;2μm
IDT電極8の電極指の対数;100対
デューティ比;角度θC1及び角度θC2が0°である励振部において0.5
交叉角度θC1_AP;10°
交叉角度θC2_AP;10°
I-Pギャップ;0.135λ
第1の電極パターン18及び第2の電極パターン19の幅;0.2λ
B-Pギャップ;3.2λ
反射器9A及び反射器9B;反射器電極指の対数…20対
高音速膜85A;材料…SiN、厚み…0.15λ
低音速膜85B;材料…SiO2、厚み…0.15λ
圧電体層6;材料…回転Yカット55°X伝搬のLiTaO3、厚み…0.2λ
IDT電極8;材料…Al、厚み…0.05λ、
電極指の形状における楕円係数α12/α11;1
電極指の形状における楕円係数α22/α21;1
波長λ;2μm
IDT電極8の電極指の対数;80対
デューティ比;角度θC1及び角度θC2が0°である励振部において0.5
交叉角度θC1_AP;10°
交叉角度θC2_AP;10°
I-Pギャップ;0.135λ
第1の電極パターン18及び第2の電極パターン19の幅;0.2λ
B-Pギャップ;2λ
反射器9A及び反射器9B;反射器電極指の対数…20対
2…圧電性基板
2c…中空部
4…支持基板
5…中間層
6…圧電体層
6a,6b…第1,第2の主面
8,8A…IDT電極
9A,9B…反射器
9a,9b…反射器電極指
14,15…第1,第2のバスバー
16,17…第1,第2の電極指
18,19…第1、第2の電極パターン
22,23…第1,第2のオフセット電極
25…高音速膜
26…第1の電極指
26b…幅広部
27…第2の電極指
27a…幅広部
28…IDT電極
29,29A…質量付加膜
38,38A~38D…第1の電極パターン
39,39A~39D…第2の電極パターン
48…IDT電極
56,57…第1,第2の電極指
58…IDT電極
64,65…第1,第2のバスバー
64a,65a…折れ曲がり部
68…IDT電極
75…誘電体膜
78…IDT電極
82,82A,82B…圧電性基板
82c…中空部
84…支持基板
85A…高音速膜
85B…低音速膜
87…音響反射膜
87a…高音響インピーダンス層
87b…低音響インピーダンス層
87c…高音響インピーダンス層
87d…低音響インピーダンス層
87e…高音響インピーダンス層
89…保護膜
89a,89b…第1,第2の層
91…弾性波装置
98…電極
100…フィルタ装置
102,103…第1,第2の信号端子
201,202,301…弾性波装置
D…交叉領域
E1,E2…第1,第2の包絡線
F…中央領域
H1,H2…第1,第2のエッジ領域
N1,N2…基準線
P1,P2…並列腕共振子
S1~S3…直列腕共振子
T1,T2…第1,第2の直線領域
V1,V2…複数の折れ曲がり部
W1,W2…第1,第2の曲線領域
Claims (34)
- 圧電体層を含む圧電性基板と、
前記圧電体層上に設けられており、1対のバスバー及び複数の電極指を有するIDT電極と、
を備え、
前記1対のバスバーが、互いに対向している第1のバスバー及び第2のバスバーであり、前記複数の電極指が、複数の第1の電極指及び複数の第2の電極指であり、前記複数の第1の電極指の一端がそれぞれ、前記第1のバスバーに接続されており、前記複数の第2の電極指の一端がそれぞれ、前記第2のバスバーに接続されており、前記複数の第1の電極指及び前記複数の第2の電極指が互いに間挿し合っており、
前記複数の第2の電極指の先端部を結ぶことにより形成される仮想線を第1の包絡線、前記複数の第1の電極指の先端部を結ぶことにより形成される仮想線を第2の包絡線とし、前記IDT電極における、前記第1の包絡線及び前記第2の包絡線の間の領域が交叉領域であり、
前記圧電体層上に設けられており、前記第1のバスバーと前記交叉領域との間、及び前記第2のバスバーと前記交叉領域との間のうち、少なくとも一方に設けられている、複数の電極パターンをさらに備え、
前記複数の電極指のうち、少なくとも1本の前記第1の電極指の先端部または少なくとも1本の前記第2の電極指の先端部が、前記電極パターンと対向しており、
平面視における前記複数の第1の電極指及び前記複数の第2の電極指の形状がそれぞれ、前記交叉領域において、曲線状の部分を含み、前記IDT電極の電極指ピッチにより規定される波長をλとしたときに、前記複数の電極指のうち、前記電極パターンと対向している電極指の先端部と、該電極パターンとの間の距離が、0.5λ以下である、弾性波装置。 - 前記交叉領域が、前記第1の包絡線を含む第1のエッジ領域と、前記第2の包絡線を含む第2のエッジ領域と、前記第1のエッジ領域及び前記第2のエッジ領域により挟まれた中央領域と、を有し、前記第1のエッジ領域及び前記第2のエッジ領域のうち少なくとも一方の少なくとも一部において、前記中央領域における音速よりも音速が低い、低音速領域が構成されている、請求項1に記載の弾性波装置。
- 前記第1のエッジ領域及び前記第2のエッジ領域のうち少なくとも一方において、少なくとも1本の前記電極指が、前記中央領域における幅よりも幅が広い幅広部を有することにより、前記低音速領域が構成されている、請求項2に記載の弾性波装置。
- 前記第1のエッジ領域及び前記第2のエッジ領域のうち少なくとも一方において、平面視したときに、前記複数の第1の電極指及び前記複数の第2の電極指のうち少なくとも1本と重なるように設けられている、質量付加膜をさらに備え、
前記質量付加膜が設けられていることにより、前記低音速領域が構成されている、請求項2または3に記載の弾性波装置。 - 前記中央領域に設けられている高音速膜をさらに備え、
前記高音速膜が設けられていることによって、前記中央領域における音速が、前記第1のエッジ領域及び前記第2のエッジ領域における音速よりも高くなっており、前記第1のエッジ領域及び前記第2のエッジ領域の双方において、前記低音速領域が構成されている、請求項2~4のいずれか1項に記載の弾性波装置。 - 前記低音速領域が、前記第1のエッジ領域及び前記第2のエッジ領域の双方の全体において構成されている、請求項2~5のいずれか1項に記載の弾性波装置。
- 前記低音速領域が、前記第1のエッジ領域及び前記第2のエッジ領域のうち一方のみの少なくとも一部において構成されている、請求項2~4のいずれか1項に記載の弾性波装置。
- 前記複数の電極パターンが、前記第1のバスバーと、前記複数の第2の電極指との間のみに設けられており、
前記低音速領域が、前記第2のエッジ領域のみの少なくとも一部において構成されている、請求項7に記載の弾性波装置。 - 全ての前記第2の電極指のうち一部の前記第2の電極指が、前記電極パターンと対向しており、
前記低音速領域が、前記第1のエッジ領域の一部において構成されており、
前記第1のエッジ領域における前記低音速領域が構成されていない部分に、少なくとも1本の前記第2の電極指が位置しており、該少なくとも1本の第2の電極指の先端部が、前記電極パターンと対向している、請求項2~4のいずれか1項に記載の弾性波装置。 - 前記第1のバスバーに一端が接続されている少なくとも1本のオフセット電極を有し、
前記低音速領域が、前記第1のエッジ領域の一部において構成されており、
前記第1のエッジ領域における前記低音速領域が構成されていない部分に、少なくとも1本の前記第2の電極指が位置しており、該少なくとも1本の第2の電極指と、前記少なくとも1本のオフセット電極が対向している、請求項2~4のいずれか1項に記載の弾性波装置。 - 前記複数の電極パターンが、前記第1のバスバーと前記交叉領域との間、及び前記第2のバスバーと前記交叉領域との間の双方に設けられており、全ての前記第1の電極指の先端部及び全ての前記第2の電極指の先端部が、前記電極パターンと対向している、請求項1~7のいずれか1項に記載の弾性波装置。
- 前記複数の電極パターンが、前記第1のバスバーと前記交叉領域との間、及び前記第2のバスバーと前記交叉領域との間のうち一方にのみ設けられている、請求項1~7のいずれか1項に記載の弾性波装置。
- 前記複数の電極パターンのうち少なくとも1つが、平面視において、前記1対のバスバーのうち該電極パターンと対向しているバスバーと平行に延びる矩形の形状を有し、かつ該バスバーに接続された隣り合う前記電極指の双方に接続されている、請求項1~12のいずれか1項に記載の弾性波装置。
- 前記複数の電極パターンのうち少なくとも1つが、平面視において、前記1対のバスバーのうち該電極パターンと対向しているバスバーと平行に延びる矩形の形状を有し、かつ該バスバーに接続された隣り合う前記電極指のうち一方のみに接続されている、請求項1~12のいずれか1項に記載の弾性波装置。
- 前記複数の電極パターンのうち少なくとも1つが、平面視において、前記1対のバスバーのうち該電極パターンと対向しているバスバーと平行に延びる矩形の形状を有し、かつ該バスバーに接続された隣り合う前記電極指のいずれにも接続されていない、請求項1~12のいずれか1項に記載の弾性波装置。
- 前記複数の電極パターンのうち少なくとも1つが、平面視において、前記1対のバスバーのうち該電極パターンと対向しているバスバーと平行に延びていない辺を含む形状を有し、かつ該バスバーに接続された隣り合う前記電極指の双方に接続されている、請求項1~12のいずれか1項に記載の弾性波装置。
- 前記複数の電極パターンのうち少なくとも1つが、平面視において、前記1対のバスバーのうち該電極パターンと対向しているバスバーと平行に延びていない辺を含む形状を有し、かつ該バスバーに接続された隣り合う前記電極指のうち一方のみに接続されている、請求項1~12のいずれか1項に記載の弾性波装置。
- 前記複数の電極パターンのうち少なくとも1つが、平面視において、前記1対のバスバーのうち該電極パターンと対向しているバスバーと平行に延びていない辺を含む形状を有し、かつ該バスバーに接続された隣り合う前記電極指のいずれにも接続されていない、請求項1~12のいずれか1項に記載の弾性波装置。
- 前記圧電体層の材料として、圧電単結晶が用いられており、
前記圧電体層が伝搬軸を有し、
前記第1の包絡線が前記伝搬軸に対して傾斜して延びている、請求項1~18のいずれか1項に記載の弾性波装置。 - 前記第2の包絡線が前記伝搬軸に対して傾斜して延びており、
前記第1の包絡線及び前記第2の包絡線が、前記伝搬軸に対して傾斜している角度の絶対値が90°以下であり、前記第1の包絡線及び前記第2の包絡線が、前記伝搬軸に対して、互いに反対側に傾斜して延びている、請求項19に記載の弾性波装置。 - 前記第1の包絡線及び前記第2の包絡線のうち少なくとも一方が、延びる方向が変化している、少なくとも1つの折れ曲がり部を有する、請求項1~19のいずれか1項に記載の弾性波装置。
- 平面視における前記複数の第1の電極指及び前記複数の第2の電極指の形状がそれぞれ、前記交叉領域において、前記第1の電極指及び前記第2の電極指の曲がる方向が異なる少なくとも2つの曲線状の部分を含み、かつ少なくとも1つの変曲点を有する、請求項1~21のいずれか1項に記載の弾性波装置。
- 平面視における前記複数の第1の電極指及び前記複数の第2の電極指の形状における、前記少なくとも2つの曲線状の部分がそれぞれ、円弧または楕円弧の形状を含み、前記交叉領域が、平面視における前記複数の第1の電極指及び前記複数の第2の電極指の形状がそれぞれ、単一の円弧または楕円弧の形状である、少なくとも2つの曲線領域を含む、請求項22に記載の弾性波装置。
- 複数の前記曲線領域のうち1つの曲線領域が前記第1の包絡線を含み、
それぞれの前記曲線領域において、前記第1の電極指及び前記第2の電極指の形状における前記円弧を含む円の中心、または前記楕円弧を含む楕円の2つの焦点の重心を定点とし、それぞれの前記曲線領域における、前記定点を通る任意の直線上の部分を励振部としたときに、前記第1の包絡線の延長線が、該曲線領域における前記定点を通り、
前記第1の包絡線及び前記第1の包絡線の延長線を含む直線を基準線とし、前記第1の包絡線を含む前記曲線領域における前記定点及び前記励振部を通る直線と、前記基準線とがなす角の角度を定義し、該曲線領域における前記定点及び前記励振部を通る直線並びに前記電極指の交点における弾性波の励振方向と、前記基準線とがなす角の励振角度を定義した場合、該曲線領域の全ての前記励振部における共振周波数同士、または反共振周波数同士が略一致するように、デューティ比、電極指ピッチ、並びに前記複数の第1の電極指及び前記複数の第2の電極指の厚みのうち少なくともいずれかが、それぞれの前記角度または前記励振角度に応じて変化している、請求項23に記載の弾性波装置。 - 前記圧電体層上に、前記IDT電極を覆うように設けられている誘電体膜をさらに備え、
複数の前記曲線領域のうち1つの曲線領域が前記第1の包絡線を含み、
それぞれの前記曲線領域において、前記第1の電極指及び前記第2の電極指の形状における前記円弧を含む円の中心、または前記楕円弧を含む楕円の2つの焦点の重心を定点とし、それぞれの前記曲線領域における、前記定点を通る任意の直線上の部分を励振部としたときに、前記第1の包絡線の延長線が、該曲線領域における前記定点を通り、
前記第1の包絡線及び前記第1の包絡線の延長線を含む直線を基準線とし、前記第1の包絡線を含む前記曲線領域における前記定点及び前記励振部を通る直線と、前記基準線とがなす角の角度を定義し、該曲線領域における前記定点及び前記励振部を通る直線並びに前記電極指の交点における弾性波の励振方向と、前記基準線とがなす角の励振角度を定義した場合、該曲線領域の全ての前記励振部における共振周波数同士、または反共振周波数同士が略一致するように、前記誘電体膜の厚みが、それぞれの前記角度または前記励振角度に応じて変化している、請求項23に記載の弾性波装置。 - 前記圧電体層の材料として、圧電単結晶が用いられており、
前記圧電体層が伝搬軸を有し、
それぞれの前記曲線領域において、前記第1の電極指及び前記第2の電極指の形状における前記円弧を含む円の中心、または前記楕円弧を含む楕円の2つの焦点の重心を定点とし、それぞれの前記曲線領域における、前記定点を通る任意の直線上の部分を励振部とし、前記伝搬軸と平行に延び、かつ前記定点を通る直線を基準線とし、前記第1の包絡線を含む前記曲線領域における前記定点及び前記励振部を通る直線と、前記基準線とがなす角の角度を定義し、該曲線領域における前記定点及び前記励振部を通る直線並びに前記電極指の交点における弾性波の励振方向と、前記基準線とがなす角の励振角度を定義した場合、該曲線領域の全ての前記励振部における共振周波数同士、または反共振周波数同士が略一致するように、デューティ比、電極指ピッチ、並びに前記複数の第1の電極指及び前記複数の第2の電極指の厚みのうち少なくともいずれかが、それぞれの前記角度または前記励振角度に応じて変化している、請求項23に記載の弾性波装置。 - 前記圧電体層上に、前記IDT電極を覆うように設けられている誘電体膜をさらに備え、
前記圧電体層の材料として、圧電単結晶が用いられており、
前記圧電体層が伝搬軸を有し、
それぞれの前記曲線領域において、前記第1の電極指及び前記第2の電極指の形状における前記円弧を含む円の中心、または前記楕円弧を含む楕円の2つの焦点の重心を定点とし、それぞれの前記曲線領域における、前記定点を通る任意の直線上の部分を励振部とし、前記伝搬軸と平行に延び、かつ前記定点を通る直線を基準線とし、前記第1の包絡線を含む前記曲線領域における前記定点及び前記励振部を通る直線と、前記基準線とがなす角の角度を定義し、該曲線領域における前記定点及び前記励振部を通る直線並びに前記電極指の交点における弾性波の励振方向と、前記基準線とがなす角の励振角度を定義した場合、該曲線領域の全ての前記励振部における共振周波数同士、または反共振周波数同士が略一致するように、前記誘電体膜の厚みが、それぞれの前記角度または前記励振角度に応じて変化している、請求項23に記載の弾性波装置。 - 前記交叉領域において、平面視における前記第1の電極指及び前記第2の電極指の形状が、直線の形状を含む、請求項1~27のいずれか1項に記載の弾性波装置。
- 前記圧電体層上に、前記IDT電極を挟み互いに対向するように設けられており、複数の反射器電極指をそれぞれ有する、1対の反射器をさらに備え、
平面視における前記複数の反射器電極指の形状が、曲線状の形状を含む、請求項1~28のいずれか1項に記載の弾性波装置。 - 前記圧電性基板が支持基板を有し、
前記支持基板上に前記圧電体層が設けられている、請求項1~29のいずれか1項に記載の弾性波装置。 - 前記圧電性基板が、前記支持基板及び前記圧電体層の間に設けられている中間層を有する、請求項30に記載の弾性波装置。
- 前記圧電性基板において中空部が構成されており、前記支持基板の一部と、前記圧電体層の一部とが、前記中空部を挟み互いに対向している、請求項30または31に記載の弾性波装置。
- 前記圧電性基板が前記圧電体層のみからなる、請求項1~29のいずれか1項に記載の弾性波装置。
- 複数の弾性波共振子を備え、
少なくとも1つの前記弾性波共振子が、請求項1~33のいずれか1項に記載の弾性波装置である、フィルタ装置。
Priority Applications (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| CN202380081471.7A CN120266395A (zh) | 2022-11-28 | 2023-11-14 | 弹性波装置以及滤波器装置 |
| US19/207,606 US20250274098A1 (en) | 2022-11-28 | 2025-05-14 | Acoustic wave device and filter device |
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2022189463 | 2022-11-28 | ||
| JP2022-189463 | 2022-11-28 |
Related Child Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| US19/207,606 Continuation US20250274098A1 (en) | 2022-11-28 | 2025-05-14 | Acoustic wave device and filter device |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| WO2024116813A1 true WO2024116813A1 (ja) | 2024-06-06 |
Family
ID=91323612
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| PCT/JP2023/040852 Ceased WO2024116813A1 (ja) | 2022-11-28 | 2023-11-14 | 弾性波装置及びフィルタ装置 |
Country Status (3)
| Country | Link |
|---|---|
| US (1) | US20250274098A1 (ja) |
| CN (1) | CN120266395A (ja) |
| WO (1) | WO2024116813A1 (ja) |
Families Citing this family (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JP2025015130A (ja) * | 2023-07-20 | 2025-01-30 | 株式会社村田製作所 | フィルタ装置及びマルチプレクサ |
Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0750548A (ja) * | 1993-05-31 | 1995-02-21 | Canon Inc | 弾性表面波素子 |
| JPH09181554A (ja) * | 1995-12-26 | 1997-07-11 | Maruyasu Kogyo Kk | 弾性表面波装置 |
| WO2011108229A1 (ja) * | 2010-03-04 | 2011-09-09 | パナソニック株式会社 | 弾性波装置 |
| JP2022026850A (ja) * | 2020-07-31 | 2022-02-10 | 太陽誘電株式会社 | フィルタ及びマルチプレクサ |
| WO2022158370A1 (ja) * | 2021-01-22 | 2022-07-28 | 株式会社村田製作所 | 弾性波装置 |
| WO2022239630A1 (ja) * | 2021-05-13 | 2022-11-17 | 株式会社村田製作所 | 圧電バルク波装置 |
-
2023
- 2023-11-14 CN CN202380081471.7A patent/CN120266395A/zh active Pending
- 2023-11-14 WO PCT/JP2023/040852 patent/WO2024116813A1/ja not_active Ceased
-
2025
- 2025-05-14 US US19/207,606 patent/US20250274098A1/en active Pending
Patent Citations (6)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0750548A (ja) * | 1993-05-31 | 1995-02-21 | Canon Inc | 弾性表面波素子 |
| JPH09181554A (ja) * | 1995-12-26 | 1997-07-11 | Maruyasu Kogyo Kk | 弾性表面波装置 |
| WO2011108229A1 (ja) * | 2010-03-04 | 2011-09-09 | パナソニック株式会社 | 弾性波装置 |
| JP2022026850A (ja) * | 2020-07-31 | 2022-02-10 | 太陽誘電株式会社 | フィルタ及びマルチプレクサ |
| WO2022158370A1 (ja) * | 2021-01-22 | 2022-07-28 | 株式会社村田製作所 | 弾性波装置 |
| WO2022239630A1 (ja) * | 2021-05-13 | 2022-11-17 | 株式会社村田製作所 | 圧電バルク波装置 |
Also Published As
| Publication number | Publication date |
|---|---|
| CN120266395A (zh) | 2025-07-04 |
| US20250274098A1 (en) | 2025-08-28 |
Similar Documents
| Publication | Publication Date | Title |
|---|---|---|
| US20240154595A1 (en) | Acoustic wave device | |
| US20250167756A1 (en) | Acoustic wave device and filter device | |
| US20250183870A1 (en) | Acoustic wave device | |
| US20250183868A1 (en) | Acoustic wave device | |
| US20250158593A1 (en) | Acoustic wave device and filter device | |
| US20250030400A1 (en) | Acoustic wave device | |
| WO2024029360A1 (ja) | 弾性波装置及びフィルタ装置 | |
| US20250274098A1 (en) | Acoustic wave device and filter device | |
| US20250317118A1 (en) | Acoustic wave device and filter device | |
| US20250274096A1 (en) | Acoustic wave device and filter device | |
| US20250023548A1 (en) | Acoustic wave device | |
| US20240380379A1 (en) | Acoustic wave device | |
| CN118399918A (zh) | 弹性波装置 | |
| WO2023136291A1 (ja) | 弾性波装置 | |
| WO2023136293A1 (ja) | 弾性波装置 | |
| US20240297634A1 (en) | Acoustic wave device | |
| US20250080078A1 (en) | Acoustic wave device | |
| WO2024262276A1 (ja) | 弾性波装置及びフィルタ装置 | |
| JP7700959B2 (ja) | 弾性波装置 | |
| US20250070744A1 (en) | Acoustic wave device | |
| US20240030886A1 (en) | Acoustic wave device | |
| US20250175139A1 (en) | Acoustic wave device | |
| WO2024157586A1 (ja) | 弾性波装置 | |
| WO2023204272A1 (ja) | 弾性波装置 | |
| CN121312071A (zh) | 弹性波装置以及弹性波滤波器装置 |
Legal Events
| Date | Code | Title | Description |
|---|---|---|---|
| 121 | Ep: the epo has been informed by wipo that ep was designated in this application |
Ref document number: 23897464 Country of ref document: EP Kind code of ref document: A1 |
|
| WWE | Wipo information: entry into national phase |
Ref document number: 202380081471.7 Country of ref document: CN |
|
| NENP | Non-entry into the national phase |
Ref country code: DE |
|
| WWP | Wipo information: published in national office |
Ref document number: 202380081471.7 Country of ref document: CN |
|
| 122 | Ep: pct application non-entry in european phase |
Ref document number: 23897464 Country of ref document: EP Kind code of ref document: A1 |