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WO2022270037A1 - Photometry device and analysis device - Google Patents

Photometry device and analysis device Download PDF

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Publication number
WO2022270037A1
WO2022270037A1 PCT/JP2022/010527 JP2022010527W WO2022270037A1 WO 2022270037 A1 WO2022270037 A1 WO 2022270037A1 JP 2022010527 W JP2022010527 W JP 2022010527W WO 2022270037 A1 WO2022270037 A1 WO 2022270037A1
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WIPO (PCT)
Prior art keywords
light
cuvette
photometric
base member
optical axis
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Ceased
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PCT/JP2022/010527
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French (fr)
Japanese (ja)
Inventor
堅志 米山
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Furuno Electric Co Ltd
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Furuno Electric Co Ltd
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Priority to JP2023529545A priority Critical patent/JPWO2022270037A1/ja
Priority to CN202280037554.1A priority patent/CN117396748A/en
Publication of WO2022270037A1 publication Critical patent/WO2022270037A1/en
Anticipated expiration legal-status Critical
Ceased legal-status Critical Current

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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01NINVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
    • G01N21/00Investigating or analysing materials by the use of optical means, i.e. using sub-millimetre waves, infrared, visible or ultraviolet light
    • G01N21/17Systems in which incident light is modified in accordance with the properties of the material investigated
    • G01N21/47Scattering, i.e. diffuse reflection
    • G01N21/49Scattering, i.e. diffuse reflection within a body or fluid

Definitions

  • the present invention mainly relates to an analyzer that analyzes a reaction liquid between a specimen and a reagent.
  • an analyzer that analyzes the components of a specimen by reacting the specimen with a reagent.
  • a plurality of cuvettes containing specimens and reagents are arranged in a circle on a cuvette table, the cuvette table is rotated, and a photometric position between a light source and a spectroscopic detector placed across the cuvette is detected. to pass through the cuvette.
  • the component of the specimen is analyzed by measuring the absorbance from the amount of light transmitted through the cuvette.
  • Patent Document 1 describes a reaction disk (cuvette table) that holds reaction containers (cuvettes) on the circumference and repeats rotation and stop, and a reaction container that is placed at a photometric position and contains a mixture of a sample and a reagent.
  • a detector that detects scattered light or transmitted light from the mixed liquid
  • the detector is in the moving direction of the reaction vessel due to the rotation of the reaction disk
  • One or more sets are arranged symmetrically at equal angles or equal intervals around the optical axis of the light emitted from the light source in a plane perpendicular to the light source, and the averaged value and/or sum of the light intensity data from each detector is used to calculate the concentration of the substance to be measured in the mixed liquid. That is, in Patent Document 1, scattered light is received by light receiving elements linearly arranged in the vertical direction.
  • the intensity of scattered light from particles is much smaller than that of transmitted light.
  • fluctuations Brown motion
  • this fluctuation causes the distribution of the amount of scattered light to vary greatly depending on the radiation direction.
  • Patent Document 1 since the light-receiving elements that receive the scattered light are linearly arranged, there is a problem that the intensity of the scattered light cannot be accurately measured by photometry in a short time (for example, 100 us).
  • the present invention has been made to solve the above problems, and an object of the present invention is to provide a photometric device capable of accurately measuring the intensity of scattered light in a short period of time.
  • a photometric device includes a light source for irradiating an irradiated area of a cuvette placed at a photometric position, a base member facing the light source, and light emitted from the cuvette at the photometric position on the base member.
  • a plurality of first light-receiving elements arranged in a planar region defined by a first radiation direction and a second radiation direction centering on the optical axis of the transmitted light, and receiving scattered light scattered from the cuvette.
  • FIG. 4 is a schematic diagram showing the positional relationship between the cuvette and the base member; 4 is a graph showing the relationship between scattered light intensity (scattered light amount) and particle size.
  • A) is a perspective view of a filter portion in a first mode
  • B) is a perspective view of a filter portion in a second mode.
  • FIG. 1 is a plan view showing a schematic configuration of an analysis device 1 according to one embodiment of the present invention.
  • An analyzer 1 is an apparatus for analyzing a sample (for example, blood, urine, etc.) and a reaction liquid of a reagent, and includes a cuvette table 3 on which rows of cuvettes 2 are arranged in a circle, a driving unit 4, and a photometric device 5. , an optical sensor 6 and an analysis unit 7 .
  • the cuvette table 3 is formed in an annular shape in plan view, and a plurality of cuvettes 2 are arranged along the annular direction (arc-shaped arrow line in FIG. 1).
  • the cuvette 2 is a container for containing a specimen and a reagent, and has a cubic or rectangular parallelepiped shape with an open top.
  • a sample storage (not shown) that stores sample containers
  • a reagent store (not shown) that stores reagent containers, and the like.
  • a pipette (not shown) is used to supply the sample and reagent from the sample container and the reagent container to the cuvette 2 .
  • the drive unit 4 is a member that rotates the row of cuvettes 2 in an annular direction.
  • the driving section 4 comprises a driving gear 41 and a driven gear 42 connected to the cuvette table 3 .
  • the driving gear 41 is attached to a stepping motor (not shown), and by driving the stepping motor to rotate the driving gear 41 , the cuvette table 3 can be rotated via the driven gear 42 .
  • the mechanism for rotating the cuvette table 3 is not limited to this.
  • a pulley may be attached to the center shaft of the cuvette table 3 and driven by a timing belt.
  • the photometry device 5 is a member that irradiates light onto each cuvette 2 passing through the photometry position P while the row of cuvettes 2 rotates, and measures the emitted light from the irradiated region of the cuvette 2 at the photometry position P.
  • FIG. 1 shows a light source 51 , a base member 52 and a first light receiving element 53 as members constituting the photometric device 5 . A more detailed configuration of the photometric device 5 will be described later.
  • the cuvette table 3 is provided with slits 31 arranged corresponding to each cuvette 2 .
  • the number of slits 31 is the same as the number of cuvettes 2 , and the slits 31 are arranged in an annular direction on the outer peripheral edge of the cuvette table 3 .
  • the optical sensor 6 is a member that detects the slit 31 .
  • the optical sensor 6 has a U-shape and includes a light source 61 and a light receiving element 62 facing each other with the outer peripheral edge of the cuvette table 3 interposed therebetween.
  • the emitted light from the light source 61 reaches the light receiving element 62 only while the slit 31 is passing between the light source 61 and the light receiving element 62, and the voltage signal photoelectrically converted by the light receiving element 62 is output to the analysis unit 7. be done.
  • FIG. 3 is a perspective view showing the detailed configuration of the photometric device 5.
  • the photometric device 5 mainly includes a light source 51 , a base member 52 , a plurality of first light receiving elements 53 , a mirror 54 , a spectral mirror 55 , a plurality of second light receiving elements 56 and a filter section 57 . ing.
  • the light source 51 irradiates the irradiated area of each cuvette 2 placed at the photometric position P with light.
  • the light incident on the irradiated region of the cuvette 2 passes through the interior of the cuvette 2 and exits from the irradiated region of the cuvette 2 (more precisely, the back surface of the irradiated region).
  • a halogen lamp that emits light of multiple wavelengths (for example, 380 nm to 800 nm) in a predetermined wavelength band can be used.
  • the base member 52 is an annular flat plate facing the light source 51 .
  • the base member 52 has a circular opening 52a in its center, and transmitted light emitted from the cuvette 2 passes through the opening 52a.
  • the first light receiving element 53 is arranged on the side facing the photometry position P with respect to the base member 52 .
  • the first light receiving element 53 is arranged on the base member 52 in a first radiation direction D1 and a second radiation direction D2 centered on the optical axis La of the transmitted light emitted from the cuvette 2 at the photometry position P. and receive scattered light scattered from the cuvette 2 at the photometric position P, respectively.
  • the planar region where the first light receiving element 53 is arranged is an annular region surrounding the optical axis La on the base member 52, and is based on the scattering range due to fluctuation of particles in the reaction liquid of the cuvette 2.
  • the first light receiving elements 53 are planarly arranged in an annular region.
  • the first radiation direction D1 is the direction from the photometry position P to the inner edge of the base member 52 (the edge of the opening 52a), and the second radiation direction D2 is the direction from the photometry position P to the outer edge of the base member 52. be.
  • the photometry position P is indicated by a dot in FIG. 4, it is not particularly limited as long as it is within the reaction liquid inside the cuvette 2 on the optical axis La.
  • the first radiation direction D1 may be a direction from the photometry position P toward the outside of the inner edge of the base member 52
  • the second radiation direction D2 may be a direction from the photometry position P toward the inside of the outer edge of the base member 52. may be
  • the scattered light intensity I( ⁇ ) is inversely proportional to the scattering angle ⁇ .
  • the scattering angle ⁇ is the angle between the direction of emission of the scattered light and the optical axis La.
  • FIG. 5 is a graph showing the relationship between scattered light intensity (scattered light amount) and particle size. It can be seen that the scattered light intensity increases mainly when the scattering angle is 20° to 30°. Therefore, in this embodiment, as shown in FIG. 4, the angle ⁇ 1 formed between the first radiation direction D1 and the optical axis La is set to 20°, and the angle ⁇ 2 formed between the second radiation direction D2 and the optical axis La is set to 30°. ° is set.
  • the angle between the straight line connecting the first light receiving element 53 and the photometry position P and the optical axis La is 20° to 30°, and most of the scattered light emitted from the cuvette 2 is incident on
  • Each first light-receiving element 53 photoelectrically converts the scattered light and outputs a voltage signal having an intensity corresponding to the amount of light to the analysis unit 7 .
  • the analysis unit 7 calculates the total value of the voltage signals from the respective first light receiving elements 53 as the intensity of the scattered light.
  • the distribution of the amount of scattered light varies greatly depending on the radiation direction due to Brownian motion of particles. That is, scattered light is not emitted uniformly in a radial pattern.
  • the plurality of first light receiving elements 53 are arranged in a plane, even if the amount of scattered light varies locally, the entire area where the first light receiving elements 53 are arranged is almost constant. Therefore, the scattered light intensity can be accurately measured in a short time by correcting variations in the amount of scattered light.
  • the values of the angles ⁇ 1 and ⁇ 2 are not limited to the above values, and can be changed as appropriate according to the particle size of the particles.
  • the base member 52 is movable along the optical axis La by a drive mechanism (not shown), and by moving the base member 52, the angles ⁇ 1 and ⁇ 2 can be adjusted.
  • the transmitted light that has passed through the opening 52a is incident on the spectroscopic mirror 55 via the mirror 54, and the spectroscopic mirror 55 disperses the incident light by wavelength band and reflects it to the second light receiving element 56.
  • Each of the second light receiving elements 56 photoelectrically converts the transmitted light in different wavelength bands, and outputs a voltage signal having an intensity corresponding to the amount of light to the analysis section 7 .
  • the second light receiving element 56 may be provided near the center of the base member 52 without providing the opening 52a in the base member 52 .
  • disposing the second light receiving element 56 on the opposite side of the base member 52 to the photometric position P as in the present embodiment facilitates the installation of an optical system that disperses the transmitted light.
  • the filter section 57 is connected to a rotating shaft 58a rotated by a motor 58.
  • the filter section 57 includes a cylindrical section 573 and single-wavelength filters 574 provided inside both ends of the cylindrical section 573 .
  • Two circular passage holes 57a are formed in opposing side surfaces of the cylindrical portion 573 in the middle portion in the longitudinal direction.
  • the central axis of the cylindrical portion 573, the line connecting the centers of the two through holes 57a, and the longitudinal direction of the rotating shaft 58a are orthogonal to each other.
  • the filter part 57 is oriented so that the central axis of the cylindrical part 573 coincides with the emission direction of the light L1 from the light source 51 .
  • the multi-wavelength light L1 passes through the single-wavelength filter 574, and the single-wavelength filter 574 passes the single-wavelength (for example, 700 nm) light L2.
  • the light L2 is scattered at the photometry position P, emitted from each cuvette 2, and received by the first light receiving element 53.
  • the filter part 57 is oriented so that the line connecting the centers of the two passage holes 57a coincides with the emission direction of the light L1.
  • the multi-wavelength light L1 in the predetermined wavelength band passes through the passage hole 57a as it is.
  • the light L1 passes through the photometric position P, is emitted from each cuvette 2, and is received by the second light receiving element 56.
  • both the transmitted light and the scattered light of the reaction liquid can be photometrically measured.
  • the first light receiving element 53 is arranged in a ring-shaped region on the base member 52 in a planar manner, but the arrangement is not limited to a circular ring as long as it is arranged in a planar manner.
  • the first light receiving elements 53 can be arranged in a rectangular frame shape or an arc shape.
  • the planar region in which the first light receiving element 53 is arranged may be a discontinuous surface.
  • the photometric device 5 can measure both the transmitted light and the scattered light of the reaction liquid, it may be possible to measure only the scattered light.
  • the light source 51 a light source that emits light of a single wavelength, such as a semiconductor laser, can be used, and the filter section 57 need not be provided.
  • the photometric device 5 has the base member 52 disposed on the opposite side of the photometric position P from the light source 51 (that is, disposed between the photometric position P and the mirror 54). ), and the plurality of first light receiving elements 53 are arranged on the side facing the photometric position P with respect to the base member 52 , but the present invention is not limited to this.
  • the base member 52 may be arranged between the photometry position P and the light source 51 (or the filter section 57), and the plurality of first light receiving elements 53 may be arranged on the side facing the photometry position P with respect to the base member 52. .

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  • Physics & Mathematics (AREA)
  • Health & Medical Sciences (AREA)
  • Life Sciences & Earth Sciences (AREA)
  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Biochemistry (AREA)
  • General Health & Medical Sciences (AREA)
  • General Physics & Mathematics (AREA)
  • Immunology (AREA)
  • Pathology (AREA)
  • Investigating Or Analysing Materials By Optical Means (AREA)

Abstract

[Problem] To provide a photometry device that can measure accurate scattered light intensity in a short time. [Solution] This photometry device 5 comprises: a light source 51 that radiates light onto an irradiation area of a cuvette 2 disposed in a photometric position P; a base member 52 opposite the light source 51; and a plurality of first light-receiving elements 53 that are disposed, on the base member 52, within a planar region demarcated by a first radiation direction and a second radiation direction centering around the optical axis of transmitted light output from the cuvette 2 in the photometric position P, and respectively receive scattered light scattered by the cuvette 2 in the photometric position P.

Description

測光装置および分析装置Photometric and analytical equipment

 本発明は、主として、検体と試薬との反応液を分析する分析装置に関する。 The present invention mainly relates to an analyzer that analyzes a reaction liquid between a specimen and a reagent.

 従来、検体と試薬とを反応させることによって、当該検体の成分を分析する分析装置が知られている。この種の分析装置では、検体および試薬を収容した複数のキュベットをキュベットテーブルに環状に配置してキュベットテーブルを回転させ、キュベットを挟んで配置された光源と分光検出器との間にある測光位置にキュベットを通過させる。このときにキュベットを透過する光量から吸光度を測定することにより、検体の成分を分析する。 Conventionally, there is known an analyzer that analyzes the components of a specimen by reacting the specimen with a reagent. In this type of analyzer, a plurality of cuvettes containing specimens and reagents are arranged in a circle on a cuvette table, the cuvette table is rotated, and a photometric position between a light source and a spectroscopic detector placed across the cuvette is detected. to pass through the cuvette. At this time, the component of the specimen is analyzed by measuring the absorbance from the amount of light transmitted through the cuvette.

 分析装置に使用する試薬によっては、吸光度だけでは高感度に測定できない項目がある。そのため、試薬に光を当てると光が散乱する特性を利用した技術が存在する(例えば、特許文献1)。特許文献1には、反応容器(キュベット)を円周上に保持し回転と停止を繰り返す反応ディスク(キュベットテーブル)と、測光位置に配置されるとともに試料と試薬との混合液を収容する反応容器に光を照射する光源と、混合液からの散乱光または透過光を検出する検知器(受光素子)とを備えた自動分析装置であって、検知器は反応ディスクの回転による反応容器の移動方向に対して垂直な面内に、光源からの照射光の光軸を中心として等角度または等間隔に対称に1組以上配置され、各検知器からの光量データを平均化した値および/または和を、混合液内の測定対象物質濃度の算出に用いることを特徴とする自動分析装置が開示されている。すなわち、特許文献1では、上下方向に線状に配置された受光素子によって散乱光を受光している。  Depending on the reagents used in the analyzer, there are items that cannot be measured with high sensitivity using only absorbance. Therefore, there is a technique that utilizes the characteristic that light scatters when light is applied to a reagent (for example, Patent Document 1). Patent Document 1 describes a reaction disk (cuvette table) that holds reaction containers (cuvettes) on the circumference and repeats rotation and stop, and a reaction container that is placed at a photometric position and contains a mixture of a sample and a reagent. and a detector (light-receiving element) that detects scattered light or transmitted light from the mixed liquid, the detector is in the moving direction of the reaction vessel due to the rotation of the reaction disk One or more sets are arranged symmetrically at equal angles or equal intervals around the optical axis of the light emitted from the light source in a plane perpendicular to the light source, and the averaged value and/or sum of the light intensity data from each detector is used to calculate the concentration of the substance to be measured in the mixed liquid. That is, in Patent Document 1, scattered light is received by light receiving elements linearly arranged in the vertical direction.

特許第5481402号Patent No. 5481402

 粒子の散乱光の強度は透過光に比べ非常に小さい。また、粒子には水分子の熱運動による揺らぎ(ブラウン運動)が発生しており、この揺らぎにより散乱光量の分布は放射方向によって大きなバラツキがある。特許文献1では、散乱光を受光する受光素子が線状に配置されているため、短時間による測光(例えば100us)では正確な散乱光の強度を測定することができないという問題がある。 The intensity of scattered light from particles is much smaller than that of transmitted light. In addition, fluctuations (Brownian motion) occur in the particles due to the thermal motion of water molecules, and this fluctuation causes the distribution of the amount of scattered light to vary greatly depending on the radiation direction. In Patent Document 1, since the light-receiving elements that receive the scattered light are linearly arranged, there is a problem that the intensity of the scattered light cannot be accurately measured by photometry in a short time (for example, 100 us).

 本発明は、上記問題を解決するためになされたものであって、短時間に正確な散乱光の強度を測定することができる測光装置を提供することを課題とする。 The present invention has been made to solve the above problems, and an object of the present invention is to provide a photometric device capable of accurately measuring the intensity of scattered light in a short period of time.

 本発明に係る測光装置は、測光位置に配置されたキュベットの被照射領域に光を照射する光源と、前記光源と対向するベース部材と、前記ベース部材上において、前記測光位置の前記キュベットから出射される透過光の光軸を中心とした第1放射方向と第2放射方向とで区画される面状領域に配置され、前記キュベットから散乱される散乱光をそれぞれ受光する複数の第1受光素子と、を備えたことを特徴とする。 A photometric device according to the present invention includes a light source for irradiating an irradiated area of a cuvette placed at a photometric position, a base member facing the light source, and light emitted from the cuvette at the photometric position on the base member. A plurality of first light-receiving elements arranged in a planar region defined by a first radiation direction and a second radiation direction centering on the optical axis of the transmitted light, and receiving scattered light scattered from the cuvette. and

 本発明によれば、短時間に正確な散乱光の強度を測定することができる測光装置を提供することができる。 According to the present invention, it is possible to provide a photometric device that can accurately measure the intensity of scattered light in a short period of time.

本発明の一実施形態に係る分析装置の構成を示す平面図である。It is a top view showing composition of an analysis device concerning one embodiment of the present invention. 光センサの構成を示す側面図である。It is a side view which shows the structure of an optical sensor. 測光装置の詳細な構成を示す斜視図である。3 is a perspective view showing the detailed configuration of the photometric device; FIG. キュベットとベース部材との位置関係を示す概略図である。FIG. 4 is a schematic diagram showing the positional relationship between the cuvette and the base member; 散乱光強度(散乱光量)と粒子の粒径との関係を示すグラフである。4 is a graph showing the relationship between scattered light intensity (scattered light amount) and particle size. (A)は第1態様におけるフィルタ部の斜視図であり、(B)は第2態様におけるフィルタ部の斜視図である。(A) is a perspective view of a filter portion in a first mode, and (B) is a perspective view of a filter portion in a second mode.

 以下、本発明の実施形態について添付図面を参照して説明する。なお、本発明は、下記の実施形態に限定されるものではない。 Hereinafter, embodiments of the present invention will be described with reference to the accompanying drawings. In addition, this invention is not limited to the following embodiment.

 (分析装置の全体構成)
 図1は、本発明の一実施形態に係る分析装置1の概略構成を示す平面図である。分析装置1は、検体(例えば、血液、尿等)および試薬の反応液を分析する装置であり、キュベット2の列を環状に配置させたキュベットテーブル3と、駆動部4と、測光装置5と、光センサ6と、分析部7と、を主に備えている。
(Overall configuration of analyzer)
FIG. 1 is a plan view showing a schematic configuration of an analysis device 1 according to one embodiment of the present invention. An analyzer 1 is an apparatus for analyzing a sample (for example, blood, urine, etc.) and a reaction liquid of a reagent, and includes a cuvette table 3 on which rows of cuvettes 2 are arranged in a circle, a driving unit 4, and a photometric device 5. , an optical sensor 6 and an analysis unit 7 .

 キュベットテーブル3は、平面視環状に形成されており、環状方向(図1の円弧状の矢印線)に沿って複数のキュベット2が配置されている。キュベット2は、検体および試薬を収容する容器であり、上面が開口した立方体または直方体の形状を呈している。キュベットテーブル3の内側または周囲には、検体容器を収容する検体庫(図示省略)や、試薬容器を収容する試薬庫(図示省略)などが設けられている。キュベット2をキュベットテーブル3に配置した後、ピペット(図示省略)を用いて、検体容器および試薬容器からキュベット2に検体および試薬が供給される。 The cuvette table 3 is formed in an annular shape in plan view, and a plurality of cuvettes 2 are arranged along the annular direction (arc-shaped arrow line in FIG. 1). The cuvette 2 is a container for containing a specimen and a reagent, and has a cubic or rectangular parallelepiped shape with an open top. Inside or around the cuvette table 3, there are provided a sample storage (not shown) that stores sample containers, a reagent store (not shown) that stores reagent containers, and the like. After placing the cuvette 2 on the cuvette table 3, a pipette (not shown) is used to supply the sample and reagent from the sample container and the reagent container to the cuvette 2 .

 駆動部4は、キュベット2の列を環状方向に回転させる部材である。本実施形態では、駆動部4は、駆動ギヤ41と、キュベットテーブル3に接続された従動ギヤ42と、を備えている。駆動ギヤ41はステッピングモータ(図示省略)に取り付けられており、ステッピングモータを駆動させて駆動ギヤ41を回転させることにより、従動ギヤ42を介してキュベットテーブル3を回転させることができる。なお、キュベットテーブル3を回転させる機構はこれに限定されず、例えば、キュベットテーブル3の中心軸にプーリを付けてタイミングベルトでプーリを駆動させてもよい。 The drive unit 4 is a member that rotates the row of cuvettes 2 in an annular direction. In this embodiment, the driving section 4 comprises a driving gear 41 and a driven gear 42 connected to the cuvette table 3 . The driving gear 41 is attached to a stepping motor (not shown), and by driving the stepping motor to rotate the driving gear 41 , the cuvette table 3 can be rotated via the driven gear 42 . The mechanism for rotating the cuvette table 3 is not limited to this. For example, a pulley may be attached to the center shaft of the cuvette table 3 and driven by a timing belt.

 測光装置5は、キュベット2の列の回転の間に測光位置Pを通過する各キュベット2に光を照射して、測光位置Pのキュベット2の被照射領域からの出射光を測光する部材である。図1では、測光装置5を構成する部材として、光源51、ベース部材52および第1受光素子53が示されている。測光装置5のさらに詳細な構成については、後述する。 The photometry device 5 is a member that irradiates light onto each cuvette 2 passing through the photometry position P while the row of cuvettes 2 rotates, and measures the emitted light from the irradiated region of the cuvette 2 at the photometry position P. . FIG. 1 shows a light source 51 , a base member 52 and a first light receiving element 53 as members constituting the photometric device 5 . A more detailed configuration of the photometric device 5 will be described later.

 キュベットテーブル3には、各キュベット2に対応して配置されたスリット31が設けられている。スリット31の個数はキュベット2と同数であり、各スリット31は、キュベットテーブル3の外周縁部に環状方向に配列されている。 The cuvette table 3 is provided with slits 31 arranged corresponding to each cuvette 2 . The number of slits 31 is the same as the number of cuvettes 2 , and the slits 31 are arranged in an annular direction on the outer peripheral edge of the cuvette table 3 .

 光センサ6は、スリット31を検知する部材である。図2に示すように、光センサ6はコ字形状を呈しており、キュベットテーブル3の外周縁を挟んで対向する光源61と受光素子62とを備えている。光源61と受光素子62との間をスリット31が通過している間のみ、光源61からの出射光が受光素子62に到達し、受光素子62によって光電変換された電圧信号が分析部7に出力される。 The optical sensor 6 is a member that detects the slit 31 . As shown in FIG. 2, the optical sensor 6 has a U-shape and includes a light source 61 and a light receiving element 62 facing each other with the outer peripheral edge of the cuvette table 3 interposed therebetween. The emitted light from the light source 61 reaches the light receiving element 62 only while the slit 31 is passing between the light source 61 and the light receiving element 62, and the voltage signal photoelectrically converted by the light receiving element 62 is output to the analysis unit 7. be done.

 各キュベット2がどのスリット31と対応しているかは、公知の方法で把握することができる。本実施形態では、初期化動作において、キュベットテーブル3と一緒に回転する原点検出用のドグ(図示省略)を固定側に設置された原点センサ(図示省略)によって検知することで、原点出しが実行される。その後、キュベットテーブル3を再び回転させたときに、光センサ6を通過するスリット31をカウントすることで、どのキュベット2が測光位置Pあるいは測光装置5付近を通過しているのかを監視することができる。 Which slit 31 each cuvette 2 corresponds to can be grasped by a known method. In this embodiment, in the initialization operation, the origin detection dog (not shown) that rotates together with the cuvette table 3 is detected by the origin sensor (not shown) installed on the fixed side, thereby executing the origin search. be done. After that, when the cuvette table 3 is rotated again, it is possible to monitor which cuvette 2 is passing through the photometric position P or the vicinity of the photometric device 5 by counting the number of slits 31 passing through the optical sensor 6 . can.

 (測光装置の構成)
 図3は、測光装置5の詳細な構成を示す斜視図である。測光装置5は、光源51と、ベース部材52と、複数の第1受光素子53と、ミラー54と、分光ミラー55と、複数の第2受光素子56と、フィルタ部57と、を主に備えている。
(Configuration of photometric device)
FIG. 3 is a perspective view showing the detailed configuration of the photometric device 5. As shown in FIG. The photometric device 5 mainly includes a light source 51 , a base member 52 , a plurality of first light receiving elements 53 , a mirror 54 , a spectral mirror 55 , a plurality of second light receiving elements 56 and a filter section 57 . ing.

 光源51は、測光位置Pに配置された各キュベット2の被照射領域に光を照射する。キュベット2の被照射領域に入射した光は、キュベット2の内部を通過して、キュベット2の被照射領域(正確には、被照射領域の裏面)から出射する。光源51としては、例えば、所定波長帯域の多波長(例えば、380nm~800nm)の光を照射するハロゲンランプを用いることができる。 The light source 51 irradiates the irradiated area of each cuvette 2 placed at the photometric position P with light. The light incident on the irradiated region of the cuvette 2 passes through the interior of the cuvette 2 and exits from the irradiated region of the cuvette 2 (more precisely, the back surface of the irradiated region). As the light source 51, for example, a halogen lamp that emits light of multiple wavelengths (for example, 380 nm to 800 nm) in a predetermined wavelength band can be used.

 ベース部材52は、光源51と対向する円環状の平板である。ベース部材52は、中心部に円形の開口部52aを備え、キュベット2から出射される透過光は開口部52aを通過する。 The base member 52 is an annular flat plate facing the light source 51 . The base member 52 has a circular opening 52a in its center, and transmitted light emitted from the cuvette 2 passes through the opening 52a.

 図4に示すように、第1受光素子53は、ベース部材52に対して測光位置Pを向く側に配置されている。具体的には、第1受光素子53は、ベース部材52上において、測光位置Pのキュベット2から出射される透過光の光軸Laを中心とした第1放射方向D1と第2放射方向D2とで区画される面状領域に配置され、測光位置Pのキュベット2から散乱される散乱光をそれぞれ受光する。第1受光素子53が配置される面状領域は、ベース部材52上の光軸Laを取り囲む円環状の領域であり、キュベット2の反応液中の粒子の揺らぎによる散乱範囲に基づいた領域である。本実施形態において、第1受光素子53は、円環状の領域に面状に配置されている。 As shown in FIG. 4, the first light receiving element 53 is arranged on the side facing the photometry position P with respect to the base member 52 . Specifically, the first light receiving element 53 is arranged on the base member 52 in a first radiation direction D1 and a second radiation direction D2 centered on the optical axis La of the transmitted light emitted from the cuvette 2 at the photometry position P. and receive scattered light scattered from the cuvette 2 at the photometric position P, respectively. The planar region where the first light receiving element 53 is arranged is an annular region surrounding the optical axis La on the base member 52, and is based on the scattering range due to fluctuation of particles in the reaction liquid of the cuvette 2. . In the present embodiment, the first light receiving elements 53 are planarly arranged in an annular region.

 第1放射方向D1は、測光位置Pからベース部材52の内縁(開口部52aの縁部)に向かう方向であり、第2放射方向D2は、測光位置Pからベース部材52の外縁に向かう方向である。なお、図4では、測光位置Pは点で示されているが、光軸Laのキュベット2内の反応液内の部分であれば特に限定されない。また、第1放射方向D1は、測光位置Pからベース部材52の内縁より外側に向かう方向であってもよく、第2放射方向D2は、測光位置Pからベース部材52の外縁より内側に向かう方向であってもよい。 The first radiation direction D1 is the direction from the photometry position P to the inner edge of the base member 52 (the edge of the opening 52a), and the second radiation direction D2 is the direction from the photometry position P to the outer edge of the base member 52. be. Although the photometry position P is indicated by a dot in FIG. 4, it is not particularly limited as long as it is within the reaction liquid inside the cuvette 2 on the optical axis La. The first radiation direction D1 may be a direction from the photometry position P toward the outside of the inner edge of the base member 52, and the second radiation direction D2 may be a direction from the photometry position P toward the inside of the outer edge of the base member 52. may be

 キュベット2の内部を通過する光の一部は反応液の粒子によって散乱し、散乱光となってキュベット2から出射する。この散乱はレーリー散乱と呼ばれ、散乱光の強度は下記式によって求められる。
I(θ)=(Iπ/8Rλ)*(m-1/m+1)*(1+cosθ)
I(θ):散乱光強度
θ:散乱角度
:入射光強度
d:粒径
R:散乱粒子からの距離
m:溶媒の屈折率
λ:波長
θ:入射光に対する散乱角度
Part of the light passing through the inside of the cuvette 2 is scattered by the particles of the reaction liquid and emitted from the cuvette 2 as scattered light. This scattering is called Rayleigh scattering, and the intensity of the scattered light is obtained by the following formula.
I(θ)=(I 0 π 4 d 6 /8R 2 λ 4 )*(m 2 −1/m 2 +1)*(1+cos 2 θ)
I(θ): Scattered light intensity θ: Scattering angle I 0 : Incident light intensity d: Particle size R: Distance from scattering particle m: Refractive index of solvent λ: Wavelength θ: Scattering angle for incident light

 このように、散乱光強度I(θ)は散乱角度θに反比例する。なお、散乱角度θは、散乱光の出射方向と光軸Laとの角度である。 Thus, the scattered light intensity I(θ) is inversely proportional to the scattering angle θ. The scattering angle θ is the angle between the direction of emission of the scattered light and the optical axis La.

 図5は、散乱光強度(散乱光量)と粒子の粒径との関係を示すグラフである。散乱光強度は、散乱角度が主に20°~30°で大きくなることが分かる。そのため本実施形態では、図4に示すように、第1放射方向D1と光軸Laとのなす角度θ1は20°に設定され、第2放射方向D2と光軸Laとのなす角度θ2は30°に設定されている。すなわち、第1受光素子53と測光位置Pとを結ぶ直線と光軸Laとのなす角度は20°~30°であり、キュベット2から出射された散乱光の大部分は、第1受光素子53に入射する。各第1受光素子53は、散乱光を光電変換し、光量に応じた強さの電圧信号を分析部7に出力する。分析部7は、各第1受光素子53からの電圧信号の合計値を散乱光の強度として算出する。 FIG. 5 is a graph showing the relationship between scattered light intensity (scattered light amount) and particle size. It can be seen that the scattered light intensity increases mainly when the scattering angle is 20° to 30°. Therefore, in this embodiment, as shown in FIG. 4, the angle θ1 formed between the first radiation direction D1 and the optical axis La is set to 20°, and the angle θ2 formed between the second radiation direction D2 and the optical axis La is set to 30°. ° is set. That is, the angle between the straight line connecting the first light receiving element 53 and the photometry position P and the optical axis La is 20° to 30°, and most of the scattered light emitted from the cuvette 2 is incident on Each first light-receiving element 53 photoelectrically converts the scattered light and outputs a voltage signal having an intensity corresponding to the amount of light to the analysis unit 7 . The analysis unit 7 calculates the total value of the voltage signals from the respective first light receiving elements 53 as the intensity of the scattered light.

 [発明が解決しようとする課題]に記載のように、粒子のブラウン運動により散乱光量の分布は放射方向によって大きなバラツキがある。すなわち、散乱光は放射状に一様に出射するわけではない。これに対し、本実施形態では、複数の第1受光素子53が面状に配置されているため、局所的に散乱光量にバラツキがあっても、第1受光素子53が配置されている領域全体の散乱光量はほぼ一定となる。よって、散乱光量にバラツキを補正して、短時間に正確な散乱光の強度を測定することができる。 As described in [Problems to be Solved by the Invention], the distribution of the amount of scattered light varies greatly depending on the radiation direction due to Brownian motion of particles. That is, scattered light is not emitted uniformly in a radial pattern. On the other hand, in this embodiment, since the plurality of first light receiving elements 53 are arranged in a plane, even if the amount of scattered light varies locally, the entire area where the first light receiving elements 53 are arranged is almost constant. Therefore, the scattered light intensity can be accurately measured in a short time by correcting variations in the amount of scattered light.

 なお、角度θ1および角度θ2の値は上記に限定されず、粒子の粒径に応じて適宜変更することができる。本実施形態では、ベース部材52は、図示しない駆動機構により光軸Laに沿って移動可能となっており、ベース部材52を移動させることにより、角度θ1および角度θ2を調節することができる。 It should be noted that the values of the angles θ1 and θ2 are not limited to the above values, and can be changed as appropriate according to the particle size of the particles. In this embodiment, the base member 52 is movable along the optical axis La by a drive mechanism (not shown), and by moving the base member 52, the angles θ1 and θ2 can be adjusted.

 開口部52aを通過した透過光は、ミラー54を介して分光ミラー55に入射し、分光ミラー55は、入射光を波長帯域ごとに分光して第2受光素子56に反射する。各第2受光素子56は、異なる波長帯域の透過光をそれぞれ光電変換し、光量に応じた強さの電圧信号を分析部7に出力する。 The transmitted light that has passed through the opening 52a is incident on the spectroscopic mirror 55 via the mirror 54, and the spectroscopic mirror 55 disperses the incident light by wavelength band and reflects it to the second light receiving element 56. Each of the second light receiving elements 56 photoelectrically converts the transmitted light in different wavelength bands, and outputs a voltage signal having an intensity corresponding to the amount of light to the analysis section 7 .

 なお、ベース部材52に開口部52aを設けず、第2受光素子56をベース部材52の中心付近に設けてもよい。しかし、本実施形態のように、第2受光素子56をベース部材52に対して測光位置Pと反対側に配置するほうが、透過光を分光させる光学系の設置が容易になる。 Note that the second light receiving element 56 may be provided near the center of the base member 52 without providing the opening 52a in the base member 52 . However, disposing the second light receiving element 56 on the opposite side of the base member 52 to the photometric position P as in the present embodiment facilitates the installation of an optical system that disperses the transmitted light.

 図3に示すように、フィルタ部57は、モータ58によって回転する回転軸58aに接続されている。図6(A)および(B)に示すように、フィルタ部57は、円筒部573と、円筒部573の両端内部に設けられた単波長フィルタ574とを備えている。円筒部573の長さ方向中間部の対向する側面には、2つの円形の通過穴57aが形成されている。円筒部573の中心軸、2つの通過穴57aの中心を結ぶ線、および、回転軸58aの長手方向は、互いに直交している。 As shown in FIG. 3, the filter section 57 is connected to a rotating shaft 58a rotated by a motor 58. As shown in FIGS. 6A and 6B, the filter section 57 includes a cylindrical section 573 and single-wavelength filters 574 provided inside both ends of the cylindrical section 573 . Two circular passage holes 57a are formed in opposing side surfaces of the cylindrical portion 573 in the middle portion in the longitudinal direction. The central axis of the cylindrical portion 573, the line connecting the centers of the two through holes 57a, and the longitudinal direction of the rotating shaft 58a are orthogonal to each other.

 第1態様では、図6(A)に示すように、フィルタ部57は、円筒部573の中心軸が光源51からの光L1の出射方向と一致するように指向する。このとき、多波長の光L1は単波長フィルタ574を通過し、単波長フィルタ574は、単波長(例えば、700nm)の光L2を通過させる。光L2は、測光位置Pで散乱して各キュベット2から出射され、第1受光素子53によって受光される。 In the first mode, as shown in FIG. 6(A), the filter part 57 is oriented so that the central axis of the cylindrical part 573 coincides with the emission direction of the light L1 from the light source 51 . At this time, the multi-wavelength light L1 passes through the single-wavelength filter 574, and the single-wavelength filter 574 passes the single-wavelength (for example, 700 nm) light L2. The light L2 is scattered at the photometry position P, emitted from each cuvette 2, and received by the first light receiving element 53. FIG.

 第2態様では、図6(B)に示すように、フィルタ部57は、2つの通過穴57aの中心を結ぶ線が光L1の出射方向と一致するように指向する。このとき、所定波長帯域の多波長の光L1は通過穴57aをそのまま通過する。光L1は、測光位置Pを透過して各キュベット2から出射され、第2受光素子56によって受光される。 In the second mode, as shown in FIG. 6(B), the filter part 57 is oriented so that the line connecting the centers of the two passage holes 57a coincides with the emission direction of the light L1. At this time, the multi-wavelength light L1 in the predetermined wavelength band passes through the passage hole 57a as it is. The light L1 passes through the photometric position P, is emitted from each cuvette 2, and is received by the second light receiving element 56. FIG.

 このように、第1態様と第2態様とを切り替えることにより、反応液の透過光および散乱光の両方を測光することができる。 Thus, by switching between the first mode and the second mode, both the transmitted light and the scattered light of the reaction liquid can be photometrically measured.

 (付記事項)
 本発明は上記実施形態に限定されるものではなく、請求項に示した範囲で種々の変更が可能であり、実施形態に開示された技術的手段を適宜組み合わせて得られる形態も本発明の技術的範囲に含まれる。
(Additional notes)
The present invention is not limited to the above embodiments, and can be modified in various ways within the scope of the claims. Forms obtained by appropriately combining technical means disclosed in the embodiments are also techniques of the present invention. included in the scope.

 例えば、上記実施形態では、第1受光素子53は、ベース部材52上の円環状の領域に面状に配置されていたが、面状の配置であれば円環状に限定されない。例えば、第1受光素子53を矩形枠状や円弧状に配置することもできる。また、第1受光素子53が配置される面状領域は、不連続面であってもよい。 For example, in the above-described embodiment, the first light receiving element 53 is arranged in a ring-shaped region on the base member 52 in a planar manner, but the arrangement is not limited to a circular ring as long as it is arranged in a planar manner. For example, the first light receiving elements 53 can be arranged in a rectangular frame shape or an arc shape. Further, the planar region in which the first light receiving element 53 is arranged may be a discontinuous surface.

 また、上記実施形態に係る測光装置5は、反応液の透過光および散乱光の両方を測光可能であったが、散乱光のみを測光可能であってもよい。この場合は、光源51としては、半導体レーザなどの単波長の光を照射する光源を用いることができ、フィルタ部57を設ける必要はない。 Further, although the photometric device 5 according to the above-described embodiment can measure both the transmitted light and the scattered light of the reaction liquid, it may be possible to measure only the scattered light. In this case, as the light source 51, a light source that emits light of a single wavelength, such as a semiconductor laser, can be used, and the filter section 57 need not be provided.

 また、上記実施形態に係る測光装置5は、図3において、ベース部材52が測光位置Pの光源51とは反対側に配置されて(すなわち、測光位置Pとミラー54との間に配置されて)、複数の第1受光素子53がベース部材52に対して測光位置Pを向く側に配置されていたが、これに限定されない。ベース部材52が測光位置Pと光源51(あるいはフィルタ部57)との間に配置され、複数の第1受光素子53がベース部材52に対して測光位置Pを向く側に配置されていてもよい。 3, the photometric device 5 according to the above-described embodiment has the base member 52 disposed on the opposite side of the photometric position P from the light source 51 (that is, disposed between the photometric position P and the mirror 54). ), and the plurality of first light receiving elements 53 are arranged on the side facing the photometric position P with respect to the base member 52 , but the present invention is not limited to this. The base member 52 may be arranged between the photometry position P and the light source 51 (or the filter section 57), and the plurality of first light receiving elements 53 may be arranged on the side facing the photometry position P with respect to the base member 52. .

1  分析装置
2  キュベット
3  キュベットテーブル
31 スリット
4  駆動部
41 駆動ギヤ
42 従動ギヤ
5  測光装置
51 光源
52 ベース部材
52a 開口部
53 第1受光素子
54 ミラー
55 分光ミラー
56 第2受光素子
57 フィルタ部
573 円筒部
574 単波長フィルタ
57a 通過穴
58 モータ
58a 回転軸
6  光センサ
61 光源
62 受光素子
7  分析部
D1 第1放射方向
D2 第2放射方向
La 光軸
P  測光位置
1 Analysis device 2 Cuvette 3 Cuvette table 31 Slit 4 Drive unit 41 Drive gear 42 Driven gear 5 Photometry device 51 Light source 52 Base member 52a Opening 53 First light receiving element 54 Mirror 55 Spectral mirror 56 Second light receiving element 57 Filter section 573 Cylindrical Part 574 Single-wavelength filter 57a Passing hole 58 Motor 58a Rotating shaft 6 Optical sensor 61 Light source 62 Light receiving element 7 Analysis part D1 First radiation direction D2 Second radiation direction La Optical axis P Photometry position

Claims (12)

 測光位置に配置されたキュベットの被照射領域に光を照射する光源と、
 前記光源と対向するベース部材と、
 前記ベース部材上において、前記測光位置の前記キュベットから出射される透過光の光軸を中心とした第1放射方向と第2放射方向とで区画される面状領域に配置され、前記キュベットから散乱される散乱光をそれぞれ受光する複数の第1受光素子と、
 を備えた測光装置。
a light source that irradiates light onto the irradiated area of the cuvette placed at the photometric position;
a base member facing the light source;
Disposed on the base member in a planar region defined by a first radiation direction and a second radiation direction around the optical axis of the transmitted light emitted from the cuvette at the photometry position, and scattered from the cuvette a plurality of first light-receiving elements that respectively receive scattered light;
A photometric device with
 前記面状領域は、前記ベース部材上の前記光軸を取り囲む円環状の領域である、請求項1に記載の測光装置。 The photometric device according to claim 1, wherein the planar area is an annular area surrounding the optical axis on the base member.  前記面状領域は、前記キュベットの反応液中の粒子の揺らぎによる散乱範囲に基づいた領域である、請求項1または請求項2に記載の測定装置。 The measurement device according to claim 1 or claim 2, wherein the planar region is a region based on a scattering range due to fluctuations of particles in the reaction liquid of the cuvette.  前記透過光を受光する第2受光素子をさらに備える、請求項1乃至請求項3のいずれかに記載の測光装置。 The photometric device according to any one of claims 1 to 3, further comprising a second light receiving element that receives the transmitted light.  前記ベース部材は、前記透過光が通過する開口部を備え、
 前記第2受光素子は、前記ベース部材に対して前記測光位置と反対側に配置されている、請求項4に記載の測光装置。
The base member has an opening through which the transmitted light passes,
5. The photometric device according to claim 4, wherein said second light receiving element is arranged on the opposite side of said photometric position with respect to said base member.
 前記ベース部材は、前記測光位置と前記光源との間に配置され、
 前記複数の第1受光素子は、前記ベース部材に対して前記測光位置を向く側に配置されている、請求項5に記載の測光装置。
The base member is arranged between the photometric position and the light source,
6. The photometric device according to claim 5, wherein said plurality of first light receiving elements are arranged on a side facing said photometric position with respect to said base member.
 前記第1放射方向と前記光軸とのなす角度は、前記第2放射方向と前記光軸とのなす角度よりも小さく、
 前記第1放射方向と前記光軸とのなす角度が20°以上であり、
 前記第2放射方向と前記光軸とのなす角度が30°以下である、請求項1乃至請求項6のいずれかに記載の測光装置。
an angle between the first radiation direction and the optical axis is smaller than an angle between the second radiation direction and the optical axis;
an angle formed by the first radiation direction and the optical axis is 20° or more;
7. The photometric device according to claim 1, wherein an angle formed by said second radiation direction and said optical axis is 30[deg.] or less.
 前記光源は単波長の光を照射し、
 前記複数の第1受光素子は、前記測光位置で散乱して前記キュベットから出射される前記単波長の光を受光する、請求項1乃至請求項7のいずれかに記載の測光装置。
The light source emits light of a single wavelength,
8. The photometric device according to claim 1, wherein the plurality of first light receiving elements receive the light of the single wavelength scattered at the photometric position and emitted from the cuvette.
 前記光源は多波長の光を照射し、
 前記第2受光素子は、前記測光位置を透過して前記キュベットから出射される前記多波長の光を受光する、請求項5または請求項6のいずれかに記載の測光装置。
The light source emits light of multiple wavelengths,
7. The photometric device according to claim 5, wherein said second light receiving element receives said multi-wavelength light transmitted through said photometric position and emitted from said cuvette.
 前記光源は多波長の光を照射し、
 前記多波長の光を単波長フィルタに通過させる第1態様と、前記多波長の光をそのまま通過させる第2態様とを有するフィルタ部が、前記光源と前記測光位置との間に配置された、請求項1乃至請求項9のいずれかに記載の測光装置。
The light source emits light of multiple wavelengths,
A filter unit having a first mode for passing the multi-wavelength light through a single-wavelength filter and a second mode for passing the multi-wavelength light as it is, is arranged between the light source and the photometry position, 10. The photometric device according to any one of claims 1 to 9.
 前記ベース部材を移動させる光軸に沿って移動させる駆動機構をさらに備えた、請求項1乃至請求項10のいずれかに記載の測光装置。 The photometric device according to any one of claims 1 to 10, further comprising a driving mechanism for moving the base member along the optical axis.  請求項1乃至請求項11のいずれかに記載の測光装置と、
 前記キュベットの列を環状に配置させたキュベットテーブルと、
 前記キュベットの列を環状方向に回転させて、各キュベットを前記測光位置に通過させる駆動部と、
 前記測光装置の測光データに基づいて、前記キュベットの収容物を分析する分析部と、
 を備えた分析装置。
a photometric device according to any one of claims 1 to 11;
a cuvette table on which the rows of cuvettes are arranged in a circle;
a driving unit that rotates the rows of cuvettes in a circular direction to pass each cuvette to the photometric position;
an analysis unit that analyzes the contents of the cuvette based on the photometric data of the photometric device;
analyzer with
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JP2012149903A (en) * 2011-01-17 2012-08-09 Hitachi High-Technologies Corp Automatic analyzer
JP2013036807A (en) * 2011-08-05 2013-02-21 Dkk Toa Corp Turbidimeter
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* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2006329629A (en) * 2005-05-23 2006-12-07 Yokogawa Electric Corp Turbidimeter
JP2008058155A (en) * 2006-08-31 2008-03-13 Hitachi High-Tech Science Systems Corp Medical photometer
JP2009014602A (en) * 2007-07-06 2009-01-22 Toshiba Corp Automatic analyzer
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