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WO2022038725A1 - Waveguide mode measurement device, waveguide mode measurement method, waveguide system, and waveguide device - Google Patents

Waveguide mode measurement device, waveguide mode measurement method, waveguide system, and waveguide device Download PDF

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Publication number
WO2022038725A1
WO2022038725A1 PCT/JP2020/031360 JP2020031360W WO2022038725A1 WO 2022038725 A1 WO2022038725 A1 WO 2022038725A1 JP 2020031360 W JP2020031360 W JP 2020031360W WO 2022038725 A1 WO2022038725 A1 WO 2022038725A1
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WIPO (PCT)
Prior art keywords
average value
probe
mode
amplitude
waveguide
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PCT/JP2020/031360
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French (fr)
Japanese (ja)
Inventor
伸一 山本
宏昌 中嶋
秀憲 湯川
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Mitsubishi Electric Corp
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Mitsubishi Electric Corp
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Priority to JP2022543204A priority Critical patent/JP7186932B2/en
Priority to PCT/JP2020/031360 priority patent/WO2022038725A1/en
Publication of WO2022038725A1 publication Critical patent/WO2022038725A1/en
Anticipated expiration legal-status Critical
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    • GPHYSICS
    • G01MEASURING; TESTING
    • G01RMEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R29/00Arrangements for measuring or indicating electric quantities not covered by groups G01R19/00 - G01R27/00
    • G01R29/08Measuring electromagnetic field characteristics

Definitions

  • the present disclosure relates to a waveguide mode measuring device, a waveguide mode measuring method, a waveguide system, and a waveguide device.
  • a horn antenna is used to radiate the electromagnetic wave in the waveguide mode into space, and the electromagnetic wave in space is emitted.
  • a method of measuring the amplitude of each electromagnetic wave by analyzing the radiation pattern hereinafter referred to as "conventional waveguide mode measuring method").
  • the electromagnetic wave radiated in the space may have an adverse effect such as electromagnetic interference on the peripheral equipment of the circular waveguide. be.
  • an adverse effect such as electromagnetic interference on the peripheral equipment of the circular waveguide. be.
  • the conventional waveguide mode measuring method has a problem that if the radiation of the electromagnetic wave to the space is stopped, the amplitude of the electromagnetic wave cannot be measured. Even if the power distributor disclosed in Patent Document 1 is applied to a conventional waveguide mode measuring device, the adverse effect on peripheral devices cannot be suppressed, so that the above problem cannot be solved.
  • the present disclosure has been made to solve the above-mentioned problems, and is a waveguide mode measuring device and a guide that can measure the amplitude of an electromagnetic wave without radiating an electromagnetic wave in a circular waveguide into space.
  • the purpose is to obtain a waveguide mode measurement method.
  • the waveguide mode measuring device measures the amplitude of the TM01 mode electromagnetic wave propagating in a circular waveguide having a tube wall or the TE11 mode electromagnetic wave propagating in a circular waveguide mode. It is a measuring device, and the measured value of the voltage appearing in each probe is acquired from the measuring instrument connected to the end of the plurality of probes inserted in each of the plurality of holes penetrating the tube wall.
  • the amplitude of the electromagnetic wave in the TM01 mode is calculated from the measured value acquisition unit, the average value calculation unit that calculates the average value of multiple measured values acquired by the measurement value acquisition unit, and the average value calculated by the average value calculation unit.
  • the average value calculated by the average value calculation unit is subtracted from each measured value acquired by the first amplitude calculation processing unit or the measurement value acquisition unit, and the weighting of a plurality of measured values after the average value is subtracted.
  • the second amplitude calculation processing unit includes an amplitude calculation unit including one or more amplitude calculation processing units.
  • the amplitude of the electromagnetic wave can be measured without radiating the electromagnetic wave in the circular waveguide into the space.
  • FIG. 1 It is a block diagram which shows the waveguide system which concerns on Embodiment 1.
  • FIG. It is a perspective view which shows the waveguide device 1 which concerns on Embodiment 1.
  • FIG. It is a side view which shows the waveguide device 1 which concerns on Embodiment 1.
  • FIG. It is sectional drawing which shows the waveguide device 1 which concerns on Embodiment 1.
  • FIG. It is an enlarged view which shows the main part of the waveguide apparatus 1 which concerns on Embodiment 1.
  • FIG. It is a block diagram which shows the waveguide mode measuring apparatus 5 which concerns on Embodiment 1.
  • FIG. It is a hardware block diagram which shows the hardware of the waveguide mode measuring apparatus 5 which concerns on Embodiment 1.
  • FIG. 3 is a hardware configuration diagram of a computer when the waveguide mode measuring device 5 is realized by software, firmware, or the like.
  • 9A is an explanatory diagram showing each of the electric field and the magnetic field of the electromagnetic wave in the TE11A mode
  • FIG. 9B is an explanatory diagram showing each of the electric field and the magnetic field of the electromagnetic wave in the TE11B mode
  • FIG. 9C is the electric field and the magnetic field of the electromagnetic wave in the TM01 mode.
  • It is a flowchart which shows the waveguide mode measuring method which is the processing procedure of the waveguide mode measuring apparatus 5.
  • It is a block diagram which shows the waveguide system which concerns on Embodiment 2.
  • It is a side view which shows the waveguide device 1 which concerns on Embodiment 2.
  • FIG. is sectional drawing which shows the waveguide device 1 which concerns on Embodiment 2.
  • FIG. 1 is a configuration diagram showing a waveguide system according to the first embodiment.
  • the waveguide system shown in FIG. 1 includes a waveguide device 1, a measuring device 4, and a waveguide mode measuring device 5.
  • the waveguide device 1 includes a circular waveguide 2 and an n-th power probe 3 of 2.
  • n is an integer of 2 or more.
  • the term “probe 3” may be used.
  • the circular waveguide 2 has a TM01 mode and a TE11 mode as the waveguide modes, respectively.
  • the circular waveguide 2 shown in FIG. 1 may have a TM01 mode and a TE11 mode, respectively, and may further have a waveguide mode different from each of the TM01 mode and the TE11 mode.
  • FIG. 2 is a perspective view showing the waveguide device 1 according to the first embodiment
  • FIG. 3 is a side view showing the waveguide device 1 according to the first embodiment
  • FIG. 4 is a side view showing the embodiment.
  • It is sectional drawing which shows the waveguide device 1 which concerns on Embodiment 1.
  • FIG. FIG. 5 is an enlarged view showing a main part of the waveguide device 1 according to the first embodiment.
  • the circular waveguide 2 has a tube wall 2a, and the tube wall 2a is provided with a plurality of holes 2b as through holes.
  • the number of holes 2b is 2 to the nth root, and 2 to the nth root holes 2b are arranged at intervals of 45 degrees in the circumferential direction of the pipe wall 2a.
  • 2 n-th power probes 3 are arranged at intervals of 45 degrees in the circumferential direction of the tube wall 2a.
  • Probe 3-1 is the first probe
  • probe 3-2 is the second probe
  • probe 3-3 is the third probe
  • probe 3-4 is the fourth probe.
  • Probe 3-5 is the fifth probe
  • probe 3-6 is the sixth probe
  • probe 3-7 is the seventh probe
  • probe 3-8 is the eighth probe.
  • the probe 3-m When the probe 3-m is realized by a coaxial line, the probe 3-m has an inner conductor 3a of the coaxial line.
  • One end of the probe 3-m is inserted into a hole 2b penetrating the tube wall 2a of the circular waveguide 2.
  • the other end of the probe 3-m is connected to the measuring instrument 4.
  • the inner conductor 3a of the coaxial line is inserted into the hole 2b as shown in FIG. In FIG. 5, the inner conductor 3a of the coaxial line is inserted into the hole 2b, and the tip of the inner conductor 3a remains at the position of the hole 2b.
  • the tip of the inner conductor 3a may be inserted into the circular waveguide 2 through the hole 2b.
  • the probes 3 having the same shape are used as the eight probes 3-1 to 3-8.
  • probes 3 having different shapes may be used as probes 3-1 to 3-8.
  • the probe 3-m is realized by a coaxial line.
  • the probe 3-m may be realized by, for example, a rectangular waveguide.
  • the measuring instrument 4 is realized by, for example, an oscilloscope.
  • the other ends of the probes 3-1 to 3-8 are connected to the measuring instrument 4.
  • the measuring instrument 4 measures the voltage appearing in each probe 3-m.
  • the waveguide mode measuring device 5 includes a measured value acquisition unit 11, an average value calculation unit 12, and an amplitude calculation unit 13.
  • the waveguide mode measuring device 5 calculates each of the amplitude of the electromagnetic wave in the TM01 mode and the amplitude of the electromagnetic wave in the TE11 mode.
  • FIG. 6 is a block diagram showing the waveguide mode measuring device 5 according to the first embodiment.
  • FIG. 7 is a hardware configuration diagram showing the hardware of the waveguide mode measuring device 5 according to the first embodiment.
  • the measured value acquisition unit 11 is realized by, for example, the measured value acquisition circuit 21 shown in FIG. 7.
  • the measured value acquisition unit 11 outputs the measurement information to each of the average value calculation unit 12 and the amplitude calculation unit 13.
  • the average value calculation unit 12 is realized by, for example, the average value calculation circuit 22 shown in FIG. 7.
  • the average value calculation unit 12 calculates the average value Pave of the measured values P1 to P8 acquired by the measured value acquisition unit 11.
  • the mean value calculation unit 12 outputs the mean value Pave to the amplitude calculation processing unit 13.
  • the amplitude calculation unit 13 includes a first amplitude calculation processing unit 14 and a second amplitude calculation processing unit 15.
  • the amplitude calculation unit 13 calculates the electromagnetic wave amplitude Amp 1 in the TM01 mode and the electromagnetic wave amplitudes Amp 2A and Amp 2B in the TE11 mode.
  • the amplitude calculation unit 13 includes a first amplitude calculation processing unit 14 and a second amplitude calculation processing unit 15.
  • the amplitude calculation unit 13 may include either the first amplitude calculation processing unit 14 or the second amplitude calculation processing unit 15. .
  • the first amplitude calculation processing unit 14 is realized by, for example, the first amplitude calculation circuit 23 shown in FIG. 7.
  • the first amplitude calculation processing unit 14 calculates the amplitude Amp 1 of the electromagnetic wave in the TM01 mode from the average value Ave calculated by the average value calculation unit 12.
  • the second amplitude calculation processing unit 15 is realized by, for example, the second amplitude calculation circuit 24 shown in FIG. 7.
  • the second amplitude calculation processing unit 15 subtracts the average value Pave calculated by the average value calculation unit 12 from each measured value Pm acquired by the measurement value acquisition unit 11, so that the average value is subtracted. Calculate the measured value Pm'.
  • the second amplitude calculation processing unit 15 calculates the weighted average value of the plurality of measured values Pm'after the average value is subtracted, and calculates the amplitudes Amp 2A and Amp 2B of the electromagnetic wave in the TE11 mode from the weighted average value.
  • each of the measured value acquisition unit 11, the average value calculation unit 12, the first amplitude calculation processing unit 14, and the second amplitude calculation processing unit 15, which are the components of the waveguide mode measuring device 5, is shown in FIG. It is assumed that it is realized by dedicated hardware as shown in 7. That is, it is assumed that the waveguide mode measuring device 5 is realized by the measured value acquisition circuit 21, the mean value calculation circuit 22, the first amplitude calculation circuit 23, and the second amplitude calculation circuit 24.
  • Each of the measured value acquisition circuit 21, the average value calculation circuit 22, the first amplitude calculation circuit 23 and the second amplitude calculation circuit 24 is, for example, a single circuit, a composite circuit, a programmed processor, or a parallel programmed processor. , ASIC (Application Specific Integrated Circuit), FPGA (Field-Programmable Gate Array), or a combination thereof.
  • the components of the waveguide mode measuring device 5 are not limited to those realized by dedicated hardware, and the waveguide mode measuring device 5 is realized by software, firmware, or a combination of software and firmware. It may be what is done.
  • the software or firmware is stored as a program in the memory of the computer.
  • a computer means hardware that executes a program, and corresponds to, for example, a CPU (Central Processing Unit), a central processing unit, a processing unit, a computing device, a microprocessor, a microcomputer, a processor, or a DSP (Digital Signal Processor). do.
  • FIG. 8 is a hardware configuration diagram of a computer when the waveguide mode measuring device 5 is realized by software, firmware, or the like.
  • the waveguide mode measuring device 5 is realized by software, firmware, or the like
  • the measured value acquisition unit 11 the average value calculation unit 12, the first amplitude calculation processing unit 14, and the second amplitude calculation processing unit 15, respectively.
  • a program for causing the computer to execute the processing procedure of is stored in the memory 31.
  • the processor 32 of the computer executes the program stored in the memory 31.
  • FIG. 7 shows an example in which each of the components of the waveguide mode measuring device 5 is realized by dedicated hardware
  • FIG. 8 shows an example in which the waveguide mode measuring device 5 is realized by software, firmware, or the like.
  • An example is shown. However, this is only an example, and some components in the waveguide mode measuring device 5 may be realized by dedicated hardware, and the remaining components may be realized by software, firmware, or the like. ..
  • the circular waveguide 2 has at least TM01 mode and TE11 mode as waveguide modes.
  • the electromagnetic wave in the TE11 mode includes a first polarization and a second polarization orthogonal to the first polarization.
  • the first polarization is, for example, vertical vertical polarization as shown in FIG. 9A
  • the second polarization is, for example, horizontal horizontal polarization as shown in FIG. 9B.
  • the vertical polarization in the vertical direction as shown in FIG. 9A is referred to as an electromagnetic wave in the TE11A mode.
  • the horizontal horizontal polarization as shown in FIG. 9B is referred to as an electromagnetic wave in the TE11B mode.
  • FIG. 9A is an explanatory diagram showing each of the electric field and the magnetic field of the electromagnetic wave in the TE11A mode
  • FIG. 9B is an explanatory diagram showing each of the electric field and the magnetic field of the electromagnetic wave in the TE11B mode
  • FIG. 9C is an explanatory diagram showing each of the electric field and the magnetic field of the electromagnetic wave in the TM01 mode.
  • each of the vertical polarization in the vertical direction and the horizontal polarization in the horizontal direction is defined as follows. In FIG.
  • Eight probes 3-1 to 3-8 are arranged at intervals of 45 degrees in the circumferential direction on the tube wall 2a of the circular waveguide 2.
  • the amount of binding is represented by the amplitude of the electromagnetic wave coupled to the probe 3-m and the phase of the electromagnetic wave coupled to the probe 3-m.
  • the amplitude of the electromagnetic wave coupled to each of probe 3-1 and probe 3-5 is that of the electromagnetic wave coupled to each of the other probes 3-2 to 3-4, 3-6 to 3-8. It is larger than the amplitude and has the maximum amplitude.
  • the phase of the electromagnetic wave coupled to the probe 3-1 and the phase of the electromagnetic wave coupled to the probe 3-5 are opposite in phase.
  • the amplitude of the electromagnetic wave coupled to each of the probe 3-2 and the probe 3-6 is -3 [dB] rather than the maximum amplitude.
  • the phase of the electromagnetic wave coupled to the probe 3-2 and the phase of the electromagnetic wave coupled to the probe 3-6 are opposite in phase.
  • the amplitude of the electromagnetic wave coupled to each of the probe 3-4 and the probe 3-8 is -3 [dB] rather than the maximum amplitude.
  • the phase of the electromagnetic wave coupled to the probe 3-4 and the phase of the electromagnetic wave coupled to the probe 3-8 are opposite in phase. Almost no electromagnetic wave is bound to each of the probe 3-3 and the probe 3-7.
  • the amplitude of the electromagnetic wave bound to each of probe 3-3 and probe 3-7 is bound to each of the other probes 3-1, 3-2, 3-4 to 3-6, 3-8. It is larger than the amplitude of the electromagnetic wave to be generated and has the maximum amplitude.
  • the phase of the electromagnetic wave coupled to the probe 3-3 and the phase of the electromagnetic wave coupled to the probe 3-7 are opposite in phase.
  • the amplitude of the electromagnetic wave coupled to each of the probe 3-2 and the probe 3-6 is -3 [dB] rather than the maximum amplitude.
  • the phase of the electromagnetic wave coupled to the probe 3-2 and the phase of the electromagnetic wave coupled to the probe 3-6 are opposite in phase.
  • the amplitude of the electromagnetic wave coupled to each of the probe 3-4 and the probe 3-8 is -3 [dB] rather than the maximum amplitude.
  • the phase of the electromagnetic wave coupled to the probe 3-4 and the phase of the electromagnetic wave coupled to the probe 3-8 are opposite in phase. Almost no electromagnetic wave is bound to each of the probe 3-1 and the probe 3-5.
  • the amount of electromagnetic waves bound to each probe 3-m is the relative amount of binding as described above.
  • the amount of electromagnetic waves bound to each probe 3-m is used in the TM01 mode for all the probes 3.
  • the binding amount B TM01 , the binding amount B TE11A for all probes 3 in TE11A mode, and the binding amount B TE11B for all probes 3 in TE11B mode are calculated. Since each calculation process for the binding amount B TM01 , the binding amount B TE11A , and the binding amount B TE11B is a known technique, detailed description thereof will be omitted.
  • the amount of electromagnetic waves coupled to each probe 3-m differs depending on the shape of each probe 3-m. If the shapes of the probes 3-1 to 3-8 are different from each other, for example, a computer (not shown) may perform electromagnetic field analysis or the like to bond the amount B in the TM01 mode and the binding in the TE11A mode. The amount B TE11A and the binding amount B TE11B in the TE11B mode are calculated respectively.
  • the coupling amount B TM01 is stored in the internal memory of the first amplitude calculation processing unit 14, and each of the coupling amount B TE11A and the coupling amount B TE11B is stored in the internal memory of the second amplitude calculation processing unit 15.
  • FIG. 10 is a flowchart showing a waveguide mode measuring method, which is a processing procedure of the waveguide mode measuring device 5.
  • the measured value acquisition unit 11 of the waveguide mode measuring device 5 acquires measurement information indicating the measured value Pm of the voltage appearing in each probe 3-m from the measuring device 4 (step ST1 in FIG. 10).
  • the measured value acquisition unit 11 outputs the measurement information to each of the average value calculation unit 12 and the second amplitude calculation processing unit 15.
  • the average value calculation unit 12 acquires measurement information from the measurement value acquisition unit 11. As shown in the following equation (1), the mean value calculation unit 12 calculates the mean value Pave of the measured values P1 to P8 indicated by the measurement information (step ST2 in FIG. 10). The mean value calculation unit 12 outputs the mean value Pave to each of the first amplitude calculation processing unit 14 and the second amplitude calculation processing unit 15.
  • the first amplitude calculation processing unit 14 acquires the average value Pave from the average value calculation unit 12. As shown in the following equation (2), the first amplitude calculation processing unit 14 adds the coupling amount B TM01 in the TM01 mode stored in the internal memory to the average value Pave , thereby in the TM01 mode.
  • the first amplitude calculation processing unit 14 outputs the amplitude Amp 1 of the electromagnetic wave in the TM01 mode to, for example, an external device (not shown) that uses the electromagnetic wave in the TM01 mode.
  • the second amplitude calculation processing unit 15 has a measured value P1', a measured value P2', a measured value P4', a measured value P5', a measured value P6', and a measured value P8'.
  • the second amplitude calculation processing unit 15 has a measured value P2', a measured value P3', a measured value P4', a measured value P6', a measured value P7', and a measured value P8'. Is calculated as the second weighted average value WP ave2 (step ST6 in FIG. 10).
  • the second amplitude calculation processing unit 15 adds the coupling amount B TE11A in the TE11A mode stored in the internal memory to the first weighted average value WP ave1 .
  • the second amplitude calculation processing unit 15 adds the coupling amount B TE11B in the TE11B mode stored in the internal memory to the second weighted average value WP ave2 .
  • the amplitude Amp 2B of the electromagnetic wave in the TE11B mode is calculated (step ST8 in FIG. 10).
  • Amp 2B WP ave2 + B TE11B (7)
  • the second amplitude calculation processing unit 15 is an external device that uses each of the electromagnetic wave amplitude Amp 2A in the TE11A mode and the electromagnetic wave amplitude Amp 2B in the TE11B mode, for example, the electromagnetic wave in the TE11A mode and the electromagnetic wave in the TE11B mode. Output to) (not shown).
  • the waveguide mode measurement for measuring the amplitude of the TM01 mode electromagnetic wave propagating in the circular waveguide 2 having the tube wall 2a or the TE11 mode electromagnetic wave propagating in the circular waveguide 2.
  • the voltage appearing in each probe 3 from the measuring instrument 4 connected to the end of the plurality of probes 3 inserted in each of the plurality of holes 2b penetrating the tube wall 2a.
  • the average value calculation unit 12 that calculates the average value of the plurality of measured values acquired by the measured value acquisition unit 11, and the average value calculated by the average value calculation unit 12.
  • the average value calculated by the average value calculation unit 12 is subtracted from each measurement value acquired by the first amplitude calculation processing unit 14 for calculating the amplitude of the electromagnetic wave in the TM01 mode or the measurement value acquisition unit 11.
  • One or more amplitude calculation processes in the second amplitude calculation processing unit 15 that calculates the weighted average value of a plurality of measured values after subtracting the average value and calculates the amplitude of the electromagnetic wave in the TE11 mode from the weighted average value. It is provided with an amplitude calculation unit 13 including a unit. Therefore, the waveguide mode measuring device 5 can measure the amplitude of the electromagnetic wave without radiating the electromagnetic wave in the circular waveguide 2 into the space.
  • the circular waveguide 2 shown in FIG. 1 has a TM01 mode and a TE11 mode as waveguide modes, respectively.
  • the circular waveguide 2 shown in FIG. 1 may have, for example, a TE21 mode in addition to the TM01 mode and the TE11 mode as the waveguide mode.
  • the phases of the electromagnetic waves coupled to each of the two probes 3 arranged at opposite positions are in phase.
  • the phase of the electromagnetic wave coupled to the certain probe 3 is in phase with the phase of the electromagnetic wave coupled to the probe 3 arranged at a position 90 degrees away from the certain probe 3.
  • the average value Pave of the measured values P1 to P8 becomes 0, so that the circular waveguide 2 has the TE21 mode is the amplitude of the electromagnetic wave in the TM01 mode calculated from the average value Pave. Does not affect Amp 1 .
  • the phases of the electromagnetic waves coupled to each of the two probes 3 arranged at opposite positions are in phase, so that the circular waveguide 2 has the TE21 mode. , Does not affect the calculation of electromagnetic wave amplitudes Amp 2A and Amp 2b in TE11 mode.
  • the waveguide device 1 shown in FIG. 1 eight probes 3-1 to 3-8 are arranged in a row at intervals of 45 degrees in the circumferential direction of the tube wall 2a.
  • the value of the coefficient k included in each of the equations (4) and (5) may be changed according to the interval between the respective probes, and the eight probes 3-1 to 3-8 may be used.
  • the four coefficients k included in each of the equations (4) and (5) are set as k1, k2, k3, and k4, and different values are set according to the distance between the respective probes.
  • the probes 3-1 to 3-8 do not need to be arranged in a line in the circumferential direction of the tube wall 2a.
  • FIG. 11 is a configuration diagram showing a waveguide system according to the second embodiment.
  • FIG. 12 is a side view showing the waveguide device 1 according to the second embodiment
  • FIG. 13 is a cross-sectional view showing the waveguide device 1 according to the second embodiment.
  • Probe 3-1 is the first probe
  • probe 3-2 is the second probe
  • probe 3-3 is the third probe
  • probe 3-4 is the fourth probe.
  • the configuration of the waveguide mode measuring device 5 according to the second embodiment is the same as the configuration of the waveguide mode measuring device 5 according to the first embodiment, and the waveguide mode measuring device 5 according to the second embodiment.
  • FIG. 6 is a configuration diagram showing the above.
  • the amplitude calculation unit 13 includes a first amplitude calculation processing unit 14 and a second amplitude calculation processing unit 15. However, even if the amplitude calculation unit 13 calculates the amplitude of the electromagnetic wave in any one of the amplitude Amp 1 of the electromagnetic wave in the TM01 mode and the amplitude Amp 2A and Amp 2B of the electromagnetic wave in the TE11 mode. good.
  • the amplitude calculation unit 13 may include either the first amplitude calculation processing unit 14 or the second amplitude calculation processing unit 15. ..
  • the measured value acquisition unit 11 of the waveguide mode measuring device 5 acquires measurement information indicating the measured value Pm of the voltage appearing in each probe 3-m from the measuring device 4.
  • the measured value acquisition unit 11 outputs the measurement information to each of the average value calculation unit 12 and the second amplitude calculation processing unit 15.
  • the average value calculation unit 12 acquires measurement information from the measurement value acquisition unit 11. As shown in the following equation (8), the average value calculation unit 12 calculates the average value Pave of the measured values P1 to P4 indicated by the measurement information. The mean value calculation unit 12 outputs the mean value Pave to each of the first amplitude calculation processing unit 14 and the second amplitude calculation processing unit 15.
  • the second amplitude calculation processing unit 15 calculates the weighted average value of the measured value P1', the measured value P2', and the measured value P4'as the first weighted average value WP ave1. do.
  • the second amplitude calculation processing unit 15 calculates the weighted average value of the measured value P2', the measured value P3', and the measured value P4'as the second weighted average value WP ave2. do.
  • the second amplitude calculation processing unit 15 adds the coupling amount B TE11A in the TE11A mode stored in the internal memory to the first weighted average value WP ave1 .
  • the amplitude Amp 2A of the electromagnetic wave in the TE11 mode is calculated.
  • Amp 2A WP ave1 + B TE11A (13)
  • the second amplitude calculation processing unit 15 adds the coupling amount B TE11B in the TE11B mode stored in the internal memory to the second weighted average value WP ave2 .
  • the amplitude Amp 2B of the electromagnetic wave in the TE11B mode is calculated.
  • Amp 2B WP ave2 + B TE11B (14)
  • the second amplitude calculation processing unit 15 is an external device that uses each of the electromagnetic wave amplitude Amp 2A in the TE11A mode and the electromagnetic wave amplitude Amp 2B in the TE11B mode, for example, the electromagnetic wave in the TE11A mode and the electromagnetic wave in the TE11B mode. Output to) (not shown).
  • the number of the plurality of probes 3 inserted into the holes 2b of the tube wall 2a is 2 to the nth power.
  • the value of the coefficient k included in each of the equations (4) and (5) or the value of the coefficient k included in each of the equations (11) and (12) is changed and weighted.
  • the number of the plurality of probes 3 inserted into the holes 2b of the tube wall 2a does not have to be 2 to the nth power.
  • the four coefficients k included in each of the equations (4) and (5) are set to different k according to the number of probes 3 and the position of each probe 3, and the number of probes 3 is set. And, depending on the position of each probe 3, it is necessary to set different values to k.
  • any combination of the embodiments can be freely combined, any component of the embodiment can be modified, or any component can be omitted in each embodiment.
  • the present disclosure is suitable for a waveguide mode measuring device and a waveguide mode measuring method.
  • the present disclosure is suitable for waveguide systems including waveguide devices and waveguide mode measuring devices.
  • the present disclosure is suitable for waveguide devices.
  • Waveguide device 1 Waveguide device, 2 Circular waveguide, 2a Waveguide wall, 2b hole, 3,3-1 to 3-8 probe, 3a Inner conductor, 4 Measuring instrument, 5 Waveguide mode measuring device, 11 Measurement value acquisition Unit, 12 average value calculation unit, 13 amplitude calculation unit, 14 first amplitude calculation processing unit, 15 second amplitude calculation processing unit, 21 measurement value acquisition circuit, 22 average value calculation circuit, 23 first amplitude calculation processing unit. , 24 Second amplitude calculation circuit, 31 Memory, 32 Processor.

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Abstract

The present invention provides a waveguide mode measurement device (5) that measures the amplitude of a TM01-mode electromagnetic wave propagating through a circular waveguide (2) having a tube wall (2a) or of a TE11-mode electromagnetic wave propagating through the circular waveguide (2). The waveguide mode measurement device (5) comprises: a measured value acquisition unit (11) that acquires, from a measuring instrument (4) connected to the ends of a plurality of probes (3) inserted into a plurality of holes (2b) penetrating the tube wall (2a), a measured value of the voltage appearing at each of the plurality of probes (3); an average value calculation unit (12) that calculates the average value of the plurality of measured values acquired by the measured value acquisition unit (11); and an amplitude calculation unit (13) that is provided with at least one among a first amplitude calculation processing unit (14) and a second amplitude calculation processing unit (15), where the first amplitude calculation processing unit (14) calculates the amplitude of an electromagnetic wave in the TM01 mode from the average value calculated by the average value calculation unit (12), and the second amplitude calculation processing unit (15) subtracts the average value calculated by the average value calculation unit (12) from the individual measured values acquired by the measured value acquisition unit (11), calculates a weighted average value of the plurality of measured values after subtracting the average value, and calculates the amplitude of an electromagnetic wave in the TE11 mode from the weighted average value. Therefore, the waveguide mode measurement device (5) makes it possible to measure the amplitude of an electromagnetic wave inside the circular waveguide (2) without having to emit the electromagnetic wave into a space.

Description

導波管モード測定装置、導波管モード測定方法、導波管システム及び導波管装置Waveguide mode measuring device, waveguide mode measuring method, waveguide system and waveguide device

 本開示は、導波管モード測定装置と、導波管モード測定方法と、導波管システムと、導波管装置とに関するものである。 The present disclosure relates to a waveguide mode measuring device, a waveguide mode measuring method, a waveguide system, and a waveguide device.

 円形導波管が有している複数の導波管モードにおけるそれぞれの電磁波の振幅を測定する方法として、ホーンアンテナを用いて、導波管モード内の電磁波を空間に放射させ、空間における電磁波の放射パターンを解析することによって、それぞれの電磁波の振幅を測定する方法(以下「従来の導波管モード測定方法」という)がある。 As a method of measuring the amplitude of each electromagnetic wave in a plurality of waveguide modes possessed by a circular waveguide, a horn antenna is used to radiate the electromagnetic wave in the waveguide mode into space, and the electromagnetic wave in space is emitted. There is a method of measuring the amplitude of each electromagnetic wave by analyzing the radiation pattern (hereinafter referred to as "conventional waveguide mode measuring method").

 ところで、円形導波管の周囲に複数の同軸ケーブルを接続することによって、それぞれの同軸ケーブルから、当該円形導波管が有しているTM01モードの電磁波の取り出しを可能にしている電力分配器がある(例えば、特許文献1を参照)。 By the way, by connecting a plurality of coaxial cables around the circular waveguide, a power distributor that enables the extraction of the electromagnetic wave of the TM01 mode possessed by the circular waveguide from each coaxial cable. (See, for example, Patent Document 1).

特開2016-040900号公報Japanese Unexamined Patent Publication No. 2016-040900

 従来の導波管モード測定方法では、円形導波管内の電磁波の電力によっては、空間に放射された電磁波が、円形導波管の周辺機器に対して電磁障害等の悪影響を及ぼしてしまうことがある。周辺機器に対する悪影響を抑えるには、空間への電磁波の放射を止めなければならないことがある。従来の導波管モード測定方法では、空間への電磁波の放射を止めてしまうと、電磁波の振幅を測定することができなくなるという課題があった。
 なお、特許文献1に開示されている電力分配器を従来の導波管モード測定装置に適用しても、周辺機器に対する悪影響を抑えることができないため、上記課題を解決できない。
In the conventional waveguide mode measurement method, depending on the power of the electromagnetic wave in the circular waveguide, the electromagnetic wave radiated in the space may have an adverse effect such as electromagnetic interference on the peripheral equipment of the circular waveguide. be. In order to reduce the adverse effects on peripheral devices, it may be necessary to stop the radiation of electromagnetic waves into the space. The conventional waveguide mode measuring method has a problem that if the radiation of the electromagnetic wave to the space is stopped, the amplitude of the electromagnetic wave cannot be measured.
Even if the power distributor disclosed in Patent Document 1 is applied to a conventional waveguide mode measuring device, the adverse effect on peripheral devices cannot be suppressed, so that the above problem cannot be solved.

 本開示は、上記のような課題を解決するためになされたもので、円形導波管内の電磁波を空間に放射させることなく、電磁波の振幅を測定することができる導波管モード測定装置及び導波管モード測定方法を得ることを目的とする。 The present disclosure has been made to solve the above-mentioned problems, and is a waveguide mode measuring device and a guide that can measure the amplitude of an electromagnetic wave without radiating an electromagnetic wave in a circular waveguide into space. The purpose is to obtain a waveguide mode measurement method.

 本開示に係る導波管モード測定装置は、管壁を有する円形導波管を伝搬するTM01モードの電磁波、又は、円形導波管を伝搬するTE11モードの電磁波の振幅を測定する導波管モード測定装置であって、管壁を貫通している複数の孔のそれぞれに挿入された複数のプローブの端部に接続された測定器から、それぞれのプローブに現れている電圧の測定値を取得する測定値取得部と、測定値取得部により取得された複数の測定値の平均値を算出する平均値算出部と、平均値算出部により算出された平均値から、TM01モードにおける電磁波の振幅を算出する第1の振幅算出処理部、又は、測定値取得部により取得されたそれぞれの測定値から、平均値算出部により算出された平均値を減算し、平均値減算後の複数の測定値の重み付け平均値を算出し、重み付け平均値から、TE11モードにおける電磁波の振幅を算出する第2の振幅算出処理部のうち、1つ以上の振幅算出処理部を備える振幅算出部とを備えるものである。 The waveguide mode measuring device according to the present disclosure measures the amplitude of the TM01 mode electromagnetic wave propagating in a circular waveguide having a tube wall or the TE11 mode electromagnetic wave propagating in a circular waveguide mode. It is a measuring device, and the measured value of the voltage appearing in each probe is acquired from the measuring instrument connected to the end of the plurality of probes inserted in each of the plurality of holes penetrating the tube wall. The amplitude of the electromagnetic wave in the TM01 mode is calculated from the measured value acquisition unit, the average value calculation unit that calculates the average value of multiple measured values acquired by the measurement value acquisition unit, and the average value calculated by the average value calculation unit. The average value calculated by the average value calculation unit is subtracted from each measured value acquired by the first amplitude calculation processing unit or the measurement value acquisition unit, and the weighting of a plurality of measured values after the average value is subtracted. Among the second amplitude calculation processing units that calculate the average value and calculate the amplitude of the electromagnetic wave in the TE11 mode from the weighted average value, the second amplitude calculation processing unit includes an amplitude calculation unit including one or more amplitude calculation processing units.

 本開示によれば、円形導波管内の電磁波を空間に放射させることなく、電磁波の振幅を測定することができる。 According to the present disclosure, the amplitude of the electromagnetic wave can be measured without radiating the electromagnetic wave in the circular waveguide into the space.

実施の形態1に係る導波管システムを示す構成図である。It is a block diagram which shows the waveguide system which concerns on Embodiment 1. FIG. 実施の形態1に係る導波管装置1を示す斜視図である。It is a perspective view which shows the waveguide device 1 which concerns on Embodiment 1. FIG. 実施の形態1に係る導波管装置1を示す側面図である。It is a side view which shows the waveguide device 1 which concerns on Embodiment 1. FIG. 実施の形態1に係る導波管装置1を示す断面図である。It is sectional drawing which shows the waveguide device 1 which concerns on Embodiment 1. FIG. 実施の形態1に係る導波管装置1の要部を示す拡大図である。It is an enlarged view which shows the main part of the waveguide apparatus 1 which concerns on Embodiment 1. FIG. 実施の形態1に係る導波管モード測定装置5を示す構成図である。It is a block diagram which shows the waveguide mode measuring apparatus 5 which concerns on Embodiment 1. FIG. 実施の形態1に係る導波管モード測定装置5のハードウェアを示すハードウェア構成図である。It is a hardware block diagram which shows the hardware of the waveguide mode measuring apparatus 5 which concerns on Embodiment 1. FIG. 導波管モード測定装置5が、ソフトウェア又はファームウェア等によって実現される場合のコンピュータのハードウェア構成図である。FIG. 3 is a hardware configuration diagram of a computer when the waveguide mode measuring device 5 is realized by software, firmware, or the like. 図9Aは、TE11Aモードにおける電磁波の電界及び磁界のそれぞれを示す説明図、図9Bは、TE11Bモードにおける電磁波の電界及び磁界のそれぞれを示す説明図、図9Cは、TM01モードにおける電磁波の電界及び磁界のそれぞれを示す説明図である。9A is an explanatory diagram showing each of the electric field and the magnetic field of the electromagnetic wave in the TE11A mode, FIG. 9B is an explanatory diagram showing each of the electric field and the magnetic field of the electromagnetic wave in the TE11B mode, and FIG. 9C is the electric field and the magnetic field of the electromagnetic wave in the TM01 mode. It is explanatory drawing which shows each of. 導波管モード測定装置5の処理手順である導波管モード測定方法を示すフローチャートである。It is a flowchart which shows the waveguide mode measuring method which is the processing procedure of the waveguide mode measuring apparatus 5. 実施の形態2に係る導波管システムを示す構成図である。It is a block diagram which shows the waveguide system which concerns on Embodiment 2. 実施の形態2に係る導波管装置1を示す側面図である。It is a side view which shows the waveguide device 1 which concerns on Embodiment 2. FIG. 実施の形態2に係る導波管装置1を示す断面図である。It is sectional drawing which shows the waveguide device 1 which concerns on Embodiment 2. FIG.

 以下、本開示をより詳細に説明するために、本開示を実施するための形態について、添付の図面に従って説明する。 Hereinafter, in order to explain the present disclosure in more detail, a mode for carrying out the present disclosure will be described in accordance with the attached drawings.

実施の形態1.
 図1は、実施の形態1に係る導波管システムを示す構成図である。
 図1に示す導波管システムは、導波管装置1、測定器4及び導波管モード測定装置5を備えている。
 導波管装置1は、円形導波管2及び2のn乗本のプローブ3を備えている。nは、2以上の整数である。
 図1に示す導波管システムでは、n=3であり、導波管装置1が、2の3乗本(=8本)のプローブ3-1~3-8を備えている。以下、プローブ3-1~3-8を区別しない場合、プローブ3のように表記することがある。
 円形導波管2は、導波管モードとして、TM01モード及びTE11モードのそれぞれを有している。
 図1に示す円形導波管2は、TM01モード及びTE11モードのそれぞれを有していればよく、TM01モード及びTE11モードのそれぞれと異なる導波管モードを更に有していてよい。
Embodiment 1.
FIG. 1 is a configuration diagram showing a waveguide system according to the first embodiment.
The waveguide system shown in FIG. 1 includes a waveguide device 1, a measuring device 4, and a waveguide mode measuring device 5.
The waveguide device 1 includes a circular waveguide 2 and an n-th power probe 3 of 2. n is an integer of 2 or more.
In the waveguide system shown in FIG. 1, n = 3, and the waveguide device 1 includes 2 cubes (= 8) probes 3-1 to 3-8. Hereinafter, when the probes 3-1 to 3-8 are not distinguished, the term “probe 3” may be used.
The circular waveguide 2 has a TM01 mode and a TE11 mode as the waveguide modes, respectively.
The circular waveguide 2 shown in FIG. 1 may have a TM01 mode and a TE11 mode, respectively, and may further have a waveguide mode different from each of the TM01 mode and the TE11 mode.

 図2は、実施の形態1に係る導波管装置1を示す斜視図であり、図3は、実施の形態1に係る導波管装置1を示す側面図であり、図4は、実施の形態1に係る導波管装置1を示す断面図である。
 図5は、実施の形態1に係る導波管装置1の要部を示す拡大図である。
 円形導波管2は、管壁2aを有しており、管壁2aには、貫通孔として、複数の孔2bが施されている。
 孔2bの数は、2のn乗個であり、2のn乗個の孔2bが、管壁2aの円周方向に45度の間隔で並んでいる。図1に示す導波管システムでは、n=3であり、孔2bの数が、2の3乗個(=8個)である。
 複数のプローブ3として、2のn乗本のプローブ3が、管壁2aの円周方向に45度の間隔で並んでいる。
 図1に示す導波管システムでは、n=3であり、8本のプローブ3-1~3-8が、管壁2aの円周方向に45度の間隔で並んでいる。
 プローブ3-1は第1のプローブであり、プローブ3-2は第2のプローブであり、プローブ3-3は第3のプローブであり、プローブ3-4は第4のプローブである。
 プローブ3-5は第5のプローブであり、プローブ3-6は第6のプローブであり、プローブ3-7は第7のプローブであり、プローブ3-8は第8のプローブである。
FIG. 2 is a perspective view showing the waveguide device 1 according to the first embodiment, FIG. 3 is a side view showing the waveguide device 1 according to the first embodiment, and FIG. 4 is a side view showing the embodiment. It is sectional drawing which shows the waveguide device 1 which concerns on Embodiment 1. FIG.
FIG. 5 is an enlarged view showing a main part of the waveguide device 1 according to the first embodiment.
The circular waveguide 2 has a tube wall 2a, and the tube wall 2a is provided with a plurality of holes 2b as through holes.
The number of holes 2b is 2 to the nth root, and 2 to the nth root holes 2b are arranged at intervals of 45 degrees in the circumferential direction of the pipe wall 2a. In the waveguide system shown in FIG. 1, n = 3, and the number of holes 2b is 2 to the 3rd power (= 8).
As a plurality of probes 3, 2 n-th power probes 3 are arranged at intervals of 45 degrees in the circumferential direction of the tube wall 2a.
In the waveguide system shown in FIG. 1, n = 3, and eight probes 3-1 to 3-8 are arranged at intervals of 45 degrees in the circumferential direction of the tube wall 2a.
Probe 3-1 is the first probe, probe 3-2 is the second probe, probe 3-3 is the third probe, and probe 3-4 is the fourth probe.
Probe 3-5 is the fifth probe, probe 3-6 is the sixth probe, probe 3-7 is the seventh probe, and probe 3-8 is the eighth probe.

 プローブ3-m(m=1,2,・・・,8)は、例えば、同軸線路によって実現される。
 プローブ3-mが、同軸線路によって実現される場合、プローブ3-mは、同軸線路の内導体3aを有する。
 プローブ3-mの一端は、円形導波管2の管壁2aを貫通している孔2bに挿入されている。
 プローブ3-mの他端である端部は、測定器4と接続されている。
 プローブ3-mが同軸線路によって実現される場合、図5に示すように、同軸線路の内導体3aが、孔2bに挿入される。
 図5では、同軸線路の内導体3aが、孔2bに挿入され、内導体3aの先端は、孔2bの位置に留まっている。しかし、これは一例に過ぎず、内導体3aの先端は、孔2bを貫通して、円形導波管2の管内に挿入されていてもよい。
 図1に示す導波管システムでは、8本のプローブ3-1~3-8として、同一形状のプローブ3が用いられるものを想定している。しかし、これは一例に過ぎず、プローブ3-1~3-8として、互いに異なる形状のプローブ3が用いられるものであってもよい。
 図1に示す導波管システムでは、プローブ3-mが、同軸線路によって実現されている。しかし、これは一例に過ぎず、プローブ3-mが、例えば、方形導波管によって実現されていてもよい。
The probe 3-m (m = 1, 2, ..., 8) is realized by, for example, a coaxial line.
When the probe 3-m is realized by a coaxial line, the probe 3-m has an inner conductor 3a of the coaxial line.
One end of the probe 3-m is inserted into a hole 2b penetrating the tube wall 2a of the circular waveguide 2.
The other end of the probe 3-m is connected to the measuring instrument 4.
When the probe 3-m is realized by a coaxial line, the inner conductor 3a of the coaxial line is inserted into the hole 2b as shown in FIG.
In FIG. 5, the inner conductor 3a of the coaxial line is inserted into the hole 2b, and the tip of the inner conductor 3a remains at the position of the hole 2b. However, this is only an example, and the tip of the inner conductor 3a may be inserted into the circular waveguide 2 through the hole 2b.
In the waveguide system shown in FIG. 1, it is assumed that probes 3 having the same shape are used as the eight probes 3-1 to 3-8. However, this is only an example, and probes 3 having different shapes may be used as probes 3-1 to 3-8.
In the waveguide system shown in FIG. 1, the probe 3-m is realized by a coaxial line. However, this is only an example, and the probe 3-m may be realized by, for example, a rectangular waveguide.

 測定器4は、例えば、オシロスコープによって実現される。
 測定器4には、プローブ3-1~3-8におけるそれぞれの他端が接続されている。
 測定器4は、それぞれのプローブ3-mに現れている電圧を測定する。
 測定器4は、それぞれの電圧の測定値Pm(m=1,2,・・・,8)を示す測定情報を導波管モード測定装置5に出力する。
The measuring instrument 4 is realized by, for example, an oscilloscope.
The other ends of the probes 3-1 to 3-8 are connected to the measuring instrument 4.
The measuring instrument 4 measures the voltage appearing in each probe 3-m.
The measuring device 4 outputs measurement information indicating the measured value Pm (m = 1, 2, ..., 8) of each voltage to the waveguide mode measuring device 5.

 導波管モード測定装置5は、図6に示すように、測定値取得部11、平均値算出部12及び振幅算出部13を備えている。
 導波管モード測定装置5は、TM01モードにおける電磁波の振幅及びTE11モードにおける電磁波の振幅のそれぞれを算出する。
As shown in FIG. 6, the waveguide mode measuring device 5 includes a measured value acquisition unit 11, an average value calculation unit 12, and an amplitude calculation unit 13.
The waveguide mode measuring device 5 calculates each of the amplitude of the electromagnetic wave in the TM01 mode and the amplitude of the electromagnetic wave in the TE11 mode.

 図6は、実施の形態1に係る導波管モード測定装置5を示す構成図である。
 図7は、実施の形態1に係る導波管モード測定装置5のハードウェアを示すハードウェア構成図である。
 測定値取得部11は、例えば、図7に示す測定値取得回路21によって実現される。
 測定値取得部11は、測定器4から、それぞれのプローブ3-m(m=1,2,・・・,8)に現れている電圧の測定値Pmを示す測定情報を取得する。
 測定値取得部11は、測定情報を平均値算出部12及び振幅算出部13のそれぞれに出力する。
FIG. 6 is a block diagram showing the waveguide mode measuring device 5 according to the first embodiment.
FIG. 7 is a hardware configuration diagram showing the hardware of the waveguide mode measuring device 5 according to the first embodiment.
The measured value acquisition unit 11 is realized by, for example, the measured value acquisition circuit 21 shown in FIG. 7.
The measured value acquisition unit 11 acquires measurement information indicating the measured value Pm of the voltage appearing in each probe 3-m (m = 1, 2, ..., 8) from the measuring instrument 4.
The measured value acquisition unit 11 outputs the measurement information to each of the average value calculation unit 12 and the amplitude calculation unit 13.

 平均値算出部12は、例えば、図7に示す平均値算出回路22によって実現される。
 平均値算出部12は、測定値取得部11により取得された測定値P1~P8の平均値Paveを算出する。
 平均値算出部12は、平均値Paveを振幅算出処理部13に出力する。
The average value calculation unit 12 is realized by, for example, the average value calculation circuit 22 shown in FIG. 7.
The average value calculation unit 12 calculates the average value Pave of the measured values P1 to P8 acquired by the measured value acquisition unit 11.
The mean value calculation unit 12 outputs the mean value Pave to the amplitude calculation processing unit 13.

 振幅算出部13は、第1の振幅算出処理部14及び第2の振幅算出処理部15を備えている。
 振幅算出部13は、TM01モードにおける電磁波の振幅Ampと、TE11モードにおける電磁波の振幅Amp2A,Amp2Bとを算出する。
 図1に示す導波管システムでは、振幅算出部13が、第1の振幅算出処理部14及び第2の振幅算出処理部15を備えている。しかし、振幅算出部13は、TM01モードにおける電磁波の振幅Ampと、TE11モードにおける電磁波の振幅Amp2A,Amp2Bとのうち、いずれか1つのモードにおける電磁波の振幅を算出するものであってもよい。いずれか1つのモードにおける電磁波の振幅を算出する場合、振幅算出部13は、第1の振幅算出処理部14、又は、第2の振幅算出処理部15のいずれか1つを備えていればよい。
The amplitude calculation unit 13 includes a first amplitude calculation processing unit 14 and a second amplitude calculation processing unit 15.
The amplitude calculation unit 13 calculates the electromagnetic wave amplitude Amp 1 in the TM01 mode and the electromagnetic wave amplitudes Amp 2A and Amp 2B in the TE11 mode.
In the waveguide system shown in FIG. 1, the amplitude calculation unit 13 includes a first amplitude calculation processing unit 14 and a second amplitude calculation processing unit 15. However, even if the amplitude calculation unit 13 calculates the amplitude of the electromagnetic wave in any one of the amplitude Amp 1 of the electromagnetic wave in the TM01 mode and the amplitude Amp 2A and Amp 2B of the electromagnetic wave in the TE11 mode. good. When calculating the amplitude of the electromagnetic wave in any one mode, the amplitude calculation unit 13 may include either the first amplitude calculation processing unit 14 or the second amplitude calculation processing unit 15. ..

 第1の振幅算出処理部14は、例えば、図7に示す第1の振幅算出回路23によって実現される。
 第1の振幅算出処理部14は、平均値算出部12により算出された平均値Paveから、TM01モードにおける電磁波の振幅Ampを算出する。
 第2の振幅算出処理部15は、例えば、図7に示す第2の振幅算出回路24によって実現される。
 第2の振幅算出処理部15は、測定値取得部11により取得されたそれぞれの測定値Pmから、平均値算出部12により算出された平均値Paveを減算することによって、平均値減算後の測定値Pm’を算出する。
 第2の振幅算出処理部15は、平均値減算後の複数の測定値Pm’の重み付け平均値を算出し、重み付け平均値から、TE11モードにおける電磁波の振幅Amp2A,Amp2Bを算出する。
The first amplitude calculation processing unit 14 is realized by, for example, the first amplitude calculation circuit 23 shown in FIG. 7.
The first amplitude calculation processing unit 14 calculates the amplitude Amp 1 of the electromagnetic wave in the TM01 mode from the average value Ave calculated by the average value calculation unit 12.
The second amplitude calculation processing unit 15 is realized by, for example, the second amplitude calculation circuit 24 shown in FIG. 7.
The second amplitude calculation processing unit 15 subtracts the average value Pave calculated by the average value calculation unit 12 from each measured value Pm acquired by the measurement value acquisition unit 11, so that the average value is subtracted. Calculate the measured value Pm'.
The second amplitude calculation processing unit 15 calculates the weighted average value of the plurality of measured values Pm'after the average value is subtracted, and calculates the amplitudes Amp 2A and Amp 2B of the electromagnetic wave in the TE11 mode from the weighted average value.

 図6では、導波管モード測定装置5の構成要素である測定値取得部11、平均値算出部12、第1の振幅算出処理部14及び第2の振幅算出処理部15のそれぞれが、図7に示すような専用のハードウェアによって実現されるものを想定している。即ち、導波管モード測定装置5が、測定値取得回路21、平均値算出回路22、第1の振幅算出回路23及び第2の振幅算出回路24によって実現されるものを想定している。
 測定値取得回路21、平均値算出回路22、第1の振幅算出回路23及び第2の振幅算出回路24のそれぞれは、例えば、単一回路、複合回路、プログラム化したプロセッサ、並列プログラム化したプロセッサ、ASIC(Application Specific Integrated Circuit)、FPGA(Field-Programmable Gate Array)、又は、これらを組み合わせたものが該当する。
In FIG. 6, each of the measured value acquisition unit 11, the average value calculation unit 12, the first amplitude calculation processing unit 14, and the second amplitude calculation processing unit 15, which are the components of the waveguide mode measuring device 5, is shown in FIG. It is assumed that it is realized by dedicated hardware as shown in 7. That is, it is assumed that the waveguide mode measuring device 5 is realized by the measured value acquisition circuit 21, the mean value calculation circuit 22, the first amplitude calculation circuit 23, and the second amplitude calculation circuit 24.
Each of the measured value acquisition circuit 21, the average value calculation circuit 22, the first amplitude calculation circuit 23 and the second amplitude calculation circuit 24 is, for example, a single circuit, a composite circuit, a programmed processor, or a parallel programmed processor. , ASIC (Application Specific Integrated Circuit), FPGA (Field-Programmable Gate Array), or a combination thereof.

 導波管モード測定装置5の構成要素は、専用のハードウェアによって実現されるものに限るものではなく、導波管モード測定装置5が、ソフトウェア、ファームウェア、又は、ソフトウェアとファームウェアとの組み合わせによって実現されるものであってもよい。
 ソフトウェア又はファームウェアは、プログラムとして、コンピュータのメモリに格納される。コンピュータは、プログラムを実行するハードウェアを意味し、例えば、CPU(Central Processing Unit)、中央処理装置、処理装置、演算装置、マイクロプロセッサ、マイクロコンピュータ、プロセッサ、あるいは、DSP(Digital Signal Processor)が該当する。
The components of the waveguide mode measuring device 5 are not limited to those realized by dedicated hardware, and the waveguide mode measuring device 5 is realized by software, firmware, or a combination of software and firmware. It may be what is done.
The software or firmware is stored as a program in the memory of the computer. A computer means hardware that executes a program, and corresponds to, for example, a CPU (Central Processing Unit), a central processing unit, a processing unit, a computing device, a microprocessor, a microcomputer, a processor, or a DSP (Digital Signal Processor). do.

 図8は、導波管モード測定装置5が、ソフトウェア又はファームウェア等によって実現される場合のコンピュータのハードウェア構成図である。
 導波管モード測定装置5が、ソフトウェア又はファームウェア等によって実現される場合、測定値取得部11、平均値算出部12、第1の振幅算出処理部14及び第2の振幅算出処理部15におけるそれぞれの処理手順をコンピュータに実行させるためのプログラムがメモリ31に格納される。そして、コンピュータのプロセッサ32がメモリ31に格納されているプログラムを実行する。
FIG. 8 is a hardware configuration diagram of a computer when the waveguide mode measuring device 5 is realized by software, firmware, or the like.
When the waveguide mode measuring device 5 is realized by software, firmware, or the like, the measured value acquisition unit 11, the average value calculation unit 12, the first amplitude calculation processing unit 14, and the second amplitude calculation processing unit 15, respectively. A program for causing the computer to execute the processing procedure of is stored in the memory 31. Then, the processor 32 of the computer executes the program stored in the memory 31.

 また、図7では、導波管モード測定装置5の構成要素のそれぞれが専用のハードウェアによって実現される例を示し、図8では、導波管モード測定装置5がソフトウェア又はファームウェア等によって実現される例を示している。しかし、これは一例に過ぎず、導波管モード測定装置5における一部の構成要素が専用のハードウェアによって実現され、残りの構成要素がソフトウェア又はファームウェア等によって実現されるものであってもよい。 Further, FIG. 7 shows an example in which each of the components of the waveguide mode measuring device 5 is realized by dedicated hardware, and FIG. 8 shows an example in which the waveguide mode measuring device 5 is realized by software, firmware, or the like. An example is shown. However, this is only an example, and some components in the waveguide mode measuring device 5 may be realized by dedicated hardware, and the remaining components may be realized by software, firmware, or the like. ..

 円形導波管2は、導波管モードとして、少なくとも、TM01モード及びTE11モードのそれぞれを有している。
 TE11モードにおける電磁波は、第1の偏波と、第1の偏波と直交している第2の偏波とを含んでいる。第1の偏波は、例えば、図9Aに示すような縦方向の垂直偏波であり、第2の偏波は、例えば、図9Bに示すような横方向の水平偏波である。
 以下、図9Aに示すような縦方向の垂直偏波をTE11Aモードにおける電磁波と称する。また、図9Bに示すような横方向の水平偏波をTE11Bモードにおける電磁波と称する。
 TE11モードにおける電磁波のうち、任意の傾斜角を有する偏波であっても、TE11Aモード、又は、TE11Bモードのいずれかに含めることができる。
 図9Aは、TE11Aモードにおける電磁波の電界及び磁界のそれぞれを示す説明図、図9Bは、TE11Bモードにおける電磁波の電界及び磁界のそれぞれを示す説明図である。
 図9Cは、TM01モードにおける電磁波の電界及び磁界のそれぞれを示す説明図である。
 図1に示す導波管システムでは、縦方向の垂直偏波及び横方向の水平偏波のそれぞれを以下のように定義する。
 縦方向の垂直偏波は、図3において、円形導波管2の中心からプローブ3-1への方向であるφ=0[deg]方向の偏波とする。
 横方向の水平偏波は、図3において、円形導波管2の中心からプローブ3-3への方向であるφ=90[deg]方向の偏波とする。
The circular waveguide 2 has at least TM01 mode and TE11 mode as waveguide modes.
The electromagnetic wave in the TE11 mode includes a first polarization and a second polarization orthogonal to the first polarization. The first polarization is, for example, vertical vertical polarization as shown in FIG. 9A, and the second polarization is, for example, horizontal horizontal polarization as shown in FIG. 9B.
Hereinafter, the vertical polarization in the vertical direction as shown in FIG. 9A is referred to as an electromagnetic wave in the TE11A mode. Further, the horizontal horizontal polarization as shown in FIG. 9B is referred to as an electromagnetic wave in the TE11B mode.
Among the electromagnetic waves in the TE11 mode, even if the polarization has an arbitrary tilt angle, it can be included in either the TE11A mode or the TE11B mode.
FIG. 9A is an explanatory diagram showing each of the electric field and the magnetic field of the electromagnetic wave in the TE11A mode, and FIG. 9B is an explanatory diagram showing each of the electric field and the magnetic field of the electromagnetic wave in the TE11B mode.
FIG. 9C is an explanatory diagram showing each of the electric field and the magnetic field of the electromagnetic wave in the TM01 mode.
In the waveguide system shown in FIG. 1, each of the vertical polarization in the vertical direction and the horizontal polarization in the horizontal direction is defined as follows.
In FIG. 3, the vertical polarization in the vertical direction is defined as the polarization in the φ = 0 [deg] direction, which is the direction from the center of the circular waveguide 2 to the probe 3-1.
The horizontal polarization in the lateral direction is defined as the polarization in the φ = 90 [deg] direction, which is the direction from the center of the circular waveguide 2 to the probe 3-3 in FIG.

 円形導波管2の管壁2aには、8本のプローブ3-1~3-8が、円周方向に45度の間隔で並んでいる。
 プローブ3-1は、φ=0[deg]方向に配置されており、プローブ3-1に現れる電圧の測定値は、P1である。
 プローブ3-2は、φ=45[deg]方向に配置されており、プローブ3-2に現れる電圧の測定値は、P2である。
 プローブ3-3は、φ=90[deg]方向に配置されており、プローブ3-3に現れる電圧の測定値は、P3である。
 プローブ3-4は、φ=135[deg]方向に配置されており、プローブ3-4に現れる電圧の測定値は、P4である。
 プローブ3-5は、φ=180[deg]方向に配置されており、プローブ3-5に現れる電圧の測定値は、P5である。
 プローブ3-6は、φ=225[deg]方向に配置されており、プローブ3-6に現れる電圧の測定値は、P6である。
 プローブ3-7は、φ=270[deg]方向に配置されており、プローブ3-7に現れる電圧の測定値は、P7である。
 プローブ3-8は、φ=315[deg]方向に配置されており、プローブ3-8に現れる電圧の測定値は、P8である。
Eight probes 3-1 to 3-8 are arranged at intervals of 45 degrees in the circumferential direction on the tube wall 2a of the circular waveguide 2.
The probe 3-1 is arranged in the φ = 0 [deg] direction, and the measured value of the voltage appearing on the probe 3-1 is P1.
The probe 3-2 is arranged in the φ = 45 [deg] direction, and the measured value of the voltage appearing on the probe 3-2 is P2.
The probe 3-3 is arranged in the φ = 90 [deg] direction, and the measured value of the voltage appearing on the probe 3-3 is P3.
The probe 3-4 is arranged in the φ = 135 [deg] direction, and the measured value of the voltage appearing on the probe 3-4 is P4.
The probe 3-5 is arranged in the φ = 180 [deg] direction, and the measured value of the voltage appearing on the probe 3-5 is P5.
The probe 3-6 is arranged in the φ = 225 [deg] direction, and the measured value of the voltage appearing on the probe 3-6 is P6.
The probe 3-7 is arranged in the φ = 270 [deg] direction, and the measured value of the voltage appearing on the probe 3-7 is P7.
The probe 3-8 is arranged in the φ = 315 [deg] direction, and the measured value of the voltage appearing on the probe 3-8 is P8.

 それぞれのプローブ3-m(m=1,2,・・・,8)への電磁波の相対的な結合量は、以下の通りである。結合量は、プローブ3-mに結合される電磁波の振幅と、プローブ3-mに結合される電磁波の位相とによって表される。
 TM01モードでは、それぞれのプローブ3-m(m=1,2,・・・,8)に結合される電磁波の振幅は、同一振幅となり、それぞれのプローブ3-mに結合される電磁波の位相は、同一位相となる。
The relative amount of electromagnetic waves coupled to each probe 3-m (m = 1, 2, ..., 8) is as follows. The amount of binding is represented by the amplitude of the electromagnetic wave coupled to the probe 3-m and the phase of the electromagnetic wave coupled to the probe 3-m.
In TM01 mode, the amplitude of the electromagnetic wave coupled to each probe 3-m (m = 1, 2, ..., 8) is the same, and the phase of the electromagnetic wave coupled to each probe 3-m is , In phase.

 TE11Aモードでは、プローブ3-1及びプローブ3-5のそれぞれに結合される電磁波の振幅は、他のプローブ3-2~3-4,3-6~3-8のそれぞれに結合される電磁波の振幅よりも大きく、最大振幅となる。プローブ3-1に結合される電磁波の位相と、プローブ3-5に結合される電磁波の位相とは、逆相となる。プローブ3-2及びプローブ3-6のそれぞれに結合される電磁波の振幅は、最大振幅よりも-3[dB]である。プローブ3-2に結合される電磁波の位相と、プローブ3-6に結合される電磁波の位相とは、逆相となる。プローブ3-4及びプローブ3-8のそれぞれに結合される電磁波の振幅は、最大振幅よりも-3[dB]である。プローブ3-4に結合される電磁波の位相と、プローブ3-8に結合される電磁波の位相とは、逆相となる。プローブ3-3及びプローブ3-7のそれぞれには、電磁波がほとんど結合されない。 In TE11A mode, the amplitude of the electromagnetic wave coupled to each of probe 3-1 and probe 3-5 is that of the electromagnetic wave coupled to each of the other probes 3-2 to 3-4, 3-6 to 3-8. It is larger than the amplitude and has the maximum amplitude. The phase of the electromagnetic wave coupled to the probe 3-1 and the phase of the electromagnetic wave coupled to the probe 3-5 are opposite in phase. The amplitude of the electromagnetic wave coupled to each of the probe 3-2 and the probe 3-6 is -3 [dB] rather than the maximum amplitude. The phase of the electromagnetic wave coupled to the probe 3-2 and the phase of the electromagnetic wave coupled to the probe 3-6 are opposite in phase. The amplitude of the electromagnetic wave coupled to each of the probe 3-4 and the probe 3-8 is -3 [dB] rather than the maximum amplitude. The phase of the electromagnetic wave coupled to the probe 3-4 and the phase of the electromagnetic wave coupled to the probe 3-8 are opposite in phase. Almost no electromagnetic wave is bound to each of the probe 3-3 and the probe 3-7.

 TE11Bモードでは、プローブ3-3及びプローブ3-7のそれぞれに結合される電磁波の振幅は、他のプローブ3-1,3-2,3-4~3-6,3-8のそれぞれに結合される電磁波の振幅よりも大きく、最大振幅となる。プローブ3-3に結合される電磁波の位相と、プローブ3-7に結合される電磁波の位相とは、逆相となる。プローブ3-2及びプローブ3-6のそれぞれに結合される電磁波の振幅は、最大振幅よりも-3[dB]である。プローブ3-2に結合される電磁波の位相と、プローブ3-6に結合される電磁波の位相とは、逆相となる。プローブ3-4及びプローブ3-8のそれぞれに結合される電磁波の振幅は、最大振幅よりも-3[dB]である。プローブ3-4に結合される電磁波の位相と、プローブ3-8に結合される電磁波の位相とは、逆相となる。プローブ3-1及びプローブ3-5のそれぞれには、電磁波がほとんど結合されない。 In TE11B mode, the amplitude of the electromagnetic wave bound to each of probe 3-3 and probe 3-7 is bound to each of the other probes 3-1, 3-2, 3-4 to 3-6, 3-8. It is larger than the amplitude of the electromagnetic wave to be generated and has the maximum amplitude. The phase of the electromagnetic wave coupled to the probe 3-3 and the phase of the electromagnetic wave coupled to the probe 3-7 are opposite in phase. The amplitude of the electromagnetic wave coupled to each of the probe 3-2 and the probe 3-6 is -3 [dB] rather than the maximum amplitude. The phase of the electromagnetic wave coupled to the probe 3-2 and the phase of the electromagnetic wave coupled to the probe 3-6 are opposite in phase. The amplitude of the electromagnetic wave coupled to each of the probe 3-4 and the probe 3-8 is -3 [dB] rather than the maximum amplitude. The phase of the electromagnetic wave coupled to the probe 3-4 and the phase of the electromagnetic wave coupled to the probe 3-8 are opposite in phase. Almost no electromagnetic wave is bound to each of the probe 3-1 and the probe 3-5.

 プローブ3-1~3-8の形状が同一形状であれば、それぞれのプローブ3-mへの電磁波の結合量は、上述したような相対的な結合量となる。
 例えば、図示せぬコンピュータは、プローブ3-1~3-8の形状が同一形状であれば、それぞれのプローブ3-mへの相対的な電磁波の結合量から、全てのプローブ3に対するTM01モードでの結合量BTM01、全てのプローブ3に対するTE11Aモードでの結合量BTE11A及び全てのプローブ3に対するTE11Bモードでの結合量BTE11Bのそれぞれを計算する。結合量BTM01、結合量BTE11A及び結合量BTE11Bにおけるそれぞれの計算処理は、公知の技術であるため、詳細な説明を省略する。
 それぞれのプローブ3-mの形状によっては、それぞれのプローブ3-mへの電磁波の結合量が異なる。プローブ3-1~3-8の形状が互いに異なる形状であれば、例えば、図示せぬコンピュータは、電磁界解析等を実施することによって、TM01モードでの結合量BTM01、TE11Aモードでの結合量BTE11A及びTE11Bモードでの結合量BTE11Bのそれぞれを計算する。
 結合量BTM01は、第1の振幅算出処理部14の内部メモリに格納され、結合量BTE11A及び結合量BTE11Bのそれぞれは、第2の振幅算出処理部15の内部メモリに格納される。
If the shapes of the probes 3-1 to 3-8 are the same, the amount of electromagnetic waves bound to each probe 3-m is the relative amount of binding as described above.
For example, in a computer (not shown), if the shapes of the probes 3-1 to 3-8 are the same, the amount of electromagnetic waves bound to each probe 3-m is used in the TM01 mode for all the probes 3. The binding amount B TM01 , the binding amount B TE11A for all probes 3 in TE11A mode, and the binding amount B TE11B for all probes 3 in TE11B mode are calculated. Since each calculation process for the binding amount B TM01 , the binding amount B TE11A , and the binding amount B TE11B is a known technique, detailed description thereof will be omitted.
The amount of electromagnetic waves coupled to each probe 3-m differs depending on the shape of each probe 3-m. If the shapes of the probes 3-1 to 3-8 are different from each other, for example, a computer (not shown) may perform electromagnetic field analysis or the like to bond the amount B in the TM01 mode and the binding in the TE11A mode. The amount B TE11A and the binding amount B TE11B in the TE11B mode are calculated respectively.
The coupling amount B TM01 is stored in the internal memory of the first amplitude calculation processing unit 14, and each of the coupling amount B TE11A and the coupling amount B TE11B is stored in the internal memory of the second amplitude calculation processing unit 15.

 次に、図1に示す導波管システムの動作について説明する。
 図10は、導波管モード測定装置5の処理手順である導波管モード測定方法を示すフローチャートである。
 測定器4は、それぞれのプローブ3-m(m=1,2,・・・,8)に現れている電圧を時間波形として測定する。
 測定器4は、それぞれの電圧の測定値Pm(m=1,2,・・・,8)を示す測定情報を導波管モード測定装置5に出力する。
Next, the operation of the waveguide system shown in FIG. 1 will be described.
FIG. 10 is a flowchart showing a waveguide mode measuring method, which is a processing procedure of the waveguide mode measuring device 5.
The measuring instrument 4 measures the voltage appearing in each probe 3-m (m = 1, 2, ..., 8) as a time waveform.
The measuring device 4 outputs measurement information indicating the measured value Pm (m = 1, 2, ..., 8) of each voltage to the waveguide mode measuring device 5.

 導波管モード測定装置5の測定値取得部11は、測定器4から、それぞれのプローブ3-mに現れている電圧の測定値Pmを示す測定情報を取得する(図10のステップST1)。
 測定値取得部11は、測定情報を平均値算出部12及び第2の振幅算出処理部15のそれぞれに出力する。
The measured value acquisition unit 11 of the waveguide mode measuring device 5 acquires measurement information indicating the measured value Pm of the voltage appearing in each probe 3-m from the measuring device 4 (step ST1 in FIG. 10).
The measured value acquisition unit 11 outputs the measurement information to each of the average value calculation unit 12 and the second amplitude calculation processing unit 15.

 平均値算出部12は、測定値取得部11から、測定情報を取得する。
 平均値算出部12は、以下の式(1)に示すように、測定情報が示す測定値P1~P8の平均値Paveを算出する(図10のステップST2)。

Figure JPOXMLDOC01-appb-I000001
 平均値算出部12は、平均値Paveを第1の振幅算出処理部14及び第2の振幅算出処理部15のそれぞれに出力する。 The average value calculation unit 12 acquires measurement information from the measurement value acquisition unit 11.
As shown in the following equation (1), the mean value calculation unit 12 calculates the mean value Pave of the measured values P1 to P8 indicated by the measurement information (step ST2 in FIG. 10).

Figure JPOXMLDOC01-appb-I000001
The mean value calculation unit 12 outputs the mean value Pave to each of the first amplitude calculation processing unit 14 and the second amplitude calculation processing unit 15.

 第1の振幅算出処理部14は、平均値算出部12から、平均値Paveを取得する。
 第1の振幅算出処理部14は、以下の式(2)に示すように、内部メモリに格納されているTM01モードでの結合量BTM01を平均値Paveに加算することによって、TM01モードにおける電磁波の振幅Ampを算出する(図10のステップST3)。
Amp=Pave+BTM01      (2)
 第1の振幅算出処理部14は、TM01モードにおける電磁波の振幅Ampを、例えば、TM01モードにおける電磁波を用いる外部の装置(図示せぬ)に出力する。
The first amplitude calculation processing unit 14 acquires the average value Pave from the average value calculation unit 12.
As shown in the following equation (2), the first amplitude calculation processing unit 14 adds the coupling amount B TM01 in the TM01 mode stored in the internal memory to the average value Pave , thereby in the TM01 mode. The amplitude Amp 1 of the electromagnetic wave is calculated (step ST3 in FIG. 10).
Amp 1 = P ave + B TM01 (2)
The first amplitude calculation processing unit 14 outputs the amplitude Amp 1 of the electromagnetic wave in the TM01 mode to, for example, an external device (not shown) that uses the electromagnetic wave in the TM01 mode.

 第2の振幅算出処理部15は、測定値取得部11から、測定情報を取得し、平均値算出部12から、平均値Paveを取得する。
 第2の振幅算出処理部15は、以下の式(3)に示すように、測定情報が示すそれぞれの測定値Pm(m=1,2,・・・,8)から、平均値Paveを減算することによって、平均値減算後の測定値Pm’を算出する(図10のステップST4)。
Pm’=Pm-Pave     (3)
The second amplitude calculation processing unit 15 acquires measurement information from the measured value acquisition unit 11, and acquires the average value Pave from the average value calculation unit 12.
As shown in the following equation (3), the second amplitude calculation processing unit 15 obtains the average value Pave from each measured value Pm (m = 1, 2, ..., 8) indicated by the measurement information. By subtracting, the measured value Pm'after subtracting the average value is calculated (step ST4 in FIG. 10).
Pm'= Pm-P ave (3)

 第2の振幅算出処理部15は、以下の式(4)に示すように、測定値P1’、測定値P2’、測定値P4’、測定値P5’、測定値P6’及び測定値P8’の重み付け平均値を第1の重み付け平均値WPave1として算出する(図10のステップST5)。

Figure JPOXMLDOC01-appb-I000002
 kは、係数であり、k=√2であれば、kをデシベル換算すると、3[dB]に相当する。 As shown in the following equation (4), the second amplitude calculation processing unit 15 has a measured value P1', a measured value P2', a measured value P4', a measured value P5', a measured value P6', and a measured value P8'. Is calculated as the first weighted average value WP ave1 (step ST5 in FIG. 10).

Figure JPOXMLDOC01-appb-I000002
k is a coefficient, and if k = √2, it corresponds to 3 [dB] when k is converted into decibels.

 第2の振幅算出処理部15は、以下の式(5)に示すように、測定値P2’、測定値P3’、測定値P4’、測定値P6’、測定値P7’及び測定値P8’の重み付け平均値を第2の重み付け平均値WPave2として算出する(図10のステップST6)。

Figure JPOXMLDOC01-appb-I000003
As shown in the following equation (5), the second amplitude calculation processing unit 15 has a measured value P2', a measured value P3', a measured value P4', a measured value P6', a measured value P7', and a measured value P8'. Is calculated as the second weighted average value WP ave2 (step ST6 in FIG. 10).

Figure JPOXMLDOC01-appb-I000003

 第2の振幅算出処理部15は、以下の式(6)に示すように、内部メモリに格納されているTE11Aモードでの結合量BTE11Aを第1の重み付け平均値WPave1に加算することによって、TE11モードAにおける電磁波の振幅Amp2Aを算出する(図10のステップST7)。
Amp2A=WPave1+BTE11A     (6)
As shown in the following equation (6), the second amplitude calculation processing unit 15 adds the coupling amount B TE11A in the TE11A mode stored in the internal memory to the first weighted average value WP ave1 . , The amplitude Amp 2A of the electromagnetic wave in the TE11 mode A is calculated (step ST7 in FIG. 10).
Amp 2A = WP ave1 + B TE11A (6)

 第2の振幅算出処理部15は、以下の式(7)に示すように、内部メモリに格納されているTE11Bモードでの結合量BTE11Bを第2の重み付け平均値WPave2に加算することによって、TE11Bモードにおける電磁波の振幅Amp2Bを算出する(図10のステップST8)。
Amp2B=WPave2+BTE11B     (7)
 第2の振幅算出処理部15は、TE11Aモードにおける電磁波の振幅Amp2A及びTE11Bモードにおける電磁波の振幅Amp2Bのそれぞれを、例えば、TE11Aモードにおける電磁波及びTE11Bモードにおける電磁波のそれぞれを用いる外部の装置(図示せぬ)に出力する。
As shown in the following equation (7), the second amplitude calculation processing unit 15 adds the coupling amount B TE11B in the TE11B mode stored in the internal memory to the second weighted average value WP ave2 . , The amplitude Amp 2B of the electromagnetic wave in the TE11B mode is calculated (step ST8 in FIG. 10).
Amp 2B = WP ave2 + B TE11B (7)
The second amplitude calculation processing unit 15 is an external device that uses each of the electromagnetic wave amplitude Amp 2A in the TE11A mode and the electromagnetic wave amplitude Amp 2B in the TE11B mode, for example, the electromagnetic wave in the TE11A mode and the electromagnetic wave in the TE11B mode. Output to) (not shown).

 以上の実施の形態1では、管壁2aを有する円形導波管2を伝搬するTM01モードの電磁波、又は、円形導波管2を伝搬するTE11モードの電磁波の振幅を測定する導波管モード測定装置5であって、管壁2aを貫通している複数の孔2bのそれぞれに挿入された複数のプローブ3の端部に接続された測定器4から、それぞれのプローブ3に現れている電圧の測定値を取得する測定値取得部11と、測定値取得部11により取得された複数の測定値の平均値を算出する平均値算出部12と、平均値算出部12により算出された平均値から、TM01モードにおける電磁波の振幅を算出する第1の振幅算出処理部14、又は、測定値取得部11により取得されたそれぞれの測定値から、平均値算出部12により算出された平均値を減算し、平均値減算後の複数の測定値の重み付け平均値を算出し、重み付け平均値から、TE11モードにおける電磁波の振幅を算出する第2の振幅算出処理部15のうち、1つ以上の振幅算出処理部を備える振幅算出部13とを備えている。したがって、導波管モード測定装置5は、円形導波管2内の電磁波を空間に放射させることなく、電磁波の振幅を測定することができる。 In the above-described first embodiment, the waveguide mode measurement for measuring the amplitude of the TM01 mode electromagnetic wave propagating in the circular waveguide 2 having the tube wall 2a or the TE11 mode electromagnetic wave propagating in the circular waveguide 2. In the device 5, the voltage appearing in each probe 3 from the measuring instrument 4 connected to the end of the plurality of probes 3 inserted in each of the plurality of holes 2b penetrating the tube wall 2a. From the measured value acquisition unit 11 that acquires the measured value, the average value calculation unit 12 that calculates the average value of the plurality of measured values acquired by the measured value acquisition unit 11, and the average value calculated by the average value calculation unit 12. , The average value calculated by the average value calculation unit 12 is subtracted from each measurement value acquired by the first amplitude calculation processing unit 14 for calculating the amplitude of the electromagnetic wave in the TM01 mode or the measurement value acquisition unit 11. , One or more amplitude calculation processes in the second amplitude calculation processing unit 15 that calculates the weighted average value of a plurality of measured values after subtracting the average value and calculates the amplitude of the electromagnetic wave in the TE11 mode from the weighted average value. It is provided with an amplitude calculation unit 13 including a unit. Therefore, the waveguide mode measuring device 5 can measure the amplitude of the electromagnetic wave without radiating the electromagnetic wave in the circular waveguide 2 into the space.

 図1に示す円形導波管2は、導波管モードとして、TM01モード及びTE11モードのそれぞれを有している。図1に示す円形導波管2は、導波管モードとして、TM01モード及びTE11モード以外に、例えば、TE21モードを有していてもよい。
 図1に示す円形導波管2が、TE21モードを有している場合、TE21モードでは、対向している位置に配置されている2つのプローブ3のそれぞれに結合される電磁波の位相が同相となる。また、或るプローブ3に結合される電磁波の位相は、或るプローブ3から90度ずれている位置に配置されているプローブ3に結合される電磁波の位相と同相となる。TE21モードでは、測定値P1~P8の平均値Paveが0になるので、円形導波管2がTE21モードを有していることは、平均値Paveから算出されるTM01モードにおける電磁波の振幅Ampに影響しない。
 また、TE21モードでは、対向している位置に配置されている2つのプローブ3のそれぞれに結合される電磁波の位相が同相となるので、円形導波管2がTE21モードを有していることは、TE11モードにおける電磁波の振幅Amp2A,Amp2bの算出に影響しない。
The circular waveguide 2 shown in FIG. 1 has a TM01 mode and a TE11 mode as waveguide modes, respectively. The circular waveguide 2 shown in FIG. 1 may have, for example, a TE21 mode in addition to the TM01 mode and the TE11 mode as the waveguide mode.
When the circular waveguide 2 shown in FIG. 1 has the TE21 mode, in the TE21 mode, the phases of the electromagnetic waves coupled to each of the two probes 3 arranged at opposite positions are in phase. Become. Further, the phase of the electromagnetic wave coupled to the certain probe 3 is in phase with the phase of the electromagnetic wave coupled to the probe 3 arranged at a position 90 degrees away from the certain probe 3. In the TE21 mode, the average value Pave of the measured values P1 to P8 becomes 0, so that the circular waveguide 2 has the TE21 mode is the amplitude of the electromagnetic wave in the TM01 mode calculated from the average value Pave. Does not affect Amp 1 .
Further, in the TE21 mode, the phases of the electromagnetic waves coupled to each of the two probes 3 arranged at opposite positions are in phase, so that the circular waveguide 2 has the TE21 mode. , Does not affect the calculation of electromagnetic wave amplitudes Amp 2A and Amp 2b in TE11 mode.

 図1に示す導波管装置1では、8本のプローブ3-1~3-8が、管壁2aの円周方向に45度の間隔で一列に並んでいる。しかし、それぞれのプローブの間の間隔に応じて、式(4)及び式(5)のそれぞれに含まれている係数kの値を変えればよく、8本のプローブ3-1~3-8が、45度の間隔で等間隔に並んでいる必要はない。ただし、式(4)及び式(5)のそれぞれに含まれている4つの係数kは、k1,k2,k3,k4として、それぞれのプローブの間の間隔に応じて、別々の値を設定する必要がある。
 また、プローブ3-1~3-8は、管壁2aの円周方向に一列に並んでいる必要はない。
In the waveguide device 1 shown in FIG. 1, eight probes 3-1 to 3-8 are arranged in a row at intervals of 45 degrees in the circumferential direction of the tube wall 2a. However, the value of the coefficient k included in each of the equations (4) and (5) may be changed according to the interval between the respective probes, and the eight probes 3-1 to 3-8 may be used. , It is not necessary to line up at equal intervals of 45 degrees. However, the four coefficients k included in each of the equations (4) and (5) are set as k1, k2, k3, and k4, and different values are set according to the distance between the respective probes. There is a need.
Further, the probes 3-1 to 3-8 do not need to be arranged in a line in the circumferential direction of the tube wall 2a.

実施の形態2.
 実施の形態2では、n=2であり、4(=2)本のプローブ3が、円形導波管2の管壁2aの円周方向に45度の間隔で並んでいる導波管システムについて説明する。
Embodiment 2.
In the second embodiment, n = 2 , and 4 (= 22) probes 3 are arranged in the circumferential direction of the tube wall 2a of the circular waveguide 2 at an interval of 45 degrees. Will be explained.

 図11は、実施の形態2に係る導波管システムを示す構成図である。
 図12は、実施の形態2に係る導波管装置1を示す側面図であり、図13は、実施の形態2に係る導波管装置1を示す断面図である。
 図11~13において、図1~5と同一符号は同一又は相当部分を示すので説明を省略する。
 プローブ3-1は第1のプローブであり、プローブ3-2は第2のプローブであり、プローブ3-3は第3のプローブであり、プローブ3-4は第4のプローブである。
FIG. 11 is a configuration diagram showing a waveguide system according to the second embodiment.
FIG. 12 is a side view showing the waveguide device 1 according to the second embodiment, and FIG. 13 is a cross-sectional view showing the waveguide device 1 according to the second embodiment.
In FIGS. 11 to 13, the same reference numerals as those in FIGS. 1 to 5 indicate the same or corresponding portions, and thus the description thereof will be omitted.
Probe 3-1 is the first probe, probe 3-2 is the second probe, probe 3-3 is the third probe, and probe 3-4 is the fourth probe.

 プローブ3-1は、φ=0[deg]方向に配置されており、プローブ3-1に現れる電圧の測定値は、P1である。
 プローブ3-2は、φ=45[deg]方向に配置されており、プローブ3-2に現れる電圧の測定値は、P2である。
 プローブ3-3は、φ=90[deg]方向に配置されており、プローブ3-3に現れる電圧の測定値は、P3である。
 プローブ3-4は、φ=135[deg]方向に配置されており、プローブ3-4に現れる電圧の測定値は、P4である。
The probe 3-1 is arranged in the φ = 0 [deg] direction, and the measured value of the voltage appearing on the probe 3-1 is P1.
The probe 3-2 is arranged in the φ = 45 [deg] direction, and the measured value of the voltage appearing on the probe 3-2 is P2.
The probe 3-3 is arranged in the φ = 90 [deg] direction, and the measured value of the voltage appearing on the probe 3-3 is P3.
The probe 3-4 is arranged in the φ = 135 [deg] direction, and the measured value of the voltage appearing on the probe 3-4 is P4.

 実施の形態2に係る導波管モード測定装置5の構成は、実施の形態1に係る導波管モード測定装置5の構成と同様であり、実施の形態2に係る導波管モード測定装置5を示す構成図は、図6である。
 図11に示す導波管システムでは、振幅算出部13が、第1の振幅算出処理部14及び第2の振幅算出処理部15を備えている。しかし、振幅算出部13は、TM01モードにおける電磁波の振幅Ampと、TE11モードにおける電磁波の振幅Amp2A,Amp2Bとのうち、いずれか1つのモードにおける電磁波の振幅を算出するものであってもよい。いずれか1つのモードにおける電磁波の振幅を算出する場合、振幅算出部13は、第1の振幅算出処理部14、又は、第2の振幅算出処理部15のいずれか1つを備えていればよい。
The configuration of the waveguide mode measuring device 5 according to the second embodiment is the same as the configuration of the waveguide mode measuring device 5 according to the first embodiment, and the waveguide mode measuring device 5 according to the second embodiment. FIG. 6 is a configuration diagram showing the above.
In the waveguide system shown in FIG. 11, the amplitude calculation unit 13 includes a first amplitude calculation processing unit 14 and a second amplitude calculation processing unit 15. However, even if the amplitude calculation unit 13 calculates the amplitude of the electromagnetic wave in any one of the amplitude Amp 1 of the electromagnetic wave in the TM01 mode and the amplitude Amp 2A and Amp 2B of the electromagnetic wave in the TE11 mode. good. When calculating the amplitude of the electromagnetic wave in any one mode, the amplitude calculation unit 13 may include either the first amplitude calculation processing unit 14 or the second amplitude calculation processing unit 15. ..

 次に、図11に示す導波管システムの動作について説明する。
 測定器4は、それぞれのプローブ3-m(m=1,2,3,4)に現れている電圧を時間波形として測定する。
 測定器4は、それぞれの電圧の測定値Pm(m=1,2,3,4)を示す測定情報を導波管モード測定装置5に出力する。
Next, the operation of the waveguide system shown in FIG. 11 will be described.
The measuring instrument 4 measures the voltage appearing in each probe 3-m (m = 1, 2, 3, 4) as a time waveform.
The measuring device 4 outputs measurement information indicating the measured value Pm (m = 1, 2, 3, 4) of each voltage to the waveguide mode measuring device 5.

 導波管モード測定装置5の測定値取得部11は、測定器4から、それぞれのプローブ3-mに現れている電圧の測定値Pmを示す測定情報を取得する。
 測定値取得部11は、測定情報を平均値算出部12及び第2の振幅算出処理部15のそれぞれに出力する。
The measured value acquisition unit 11 of the waveguide mode measuring device 5 acquires measurement information indicating the measured value Pm of the voltage appearing in each probe 3-m from the measuring device 4.
The measured value acquisition unit 11 outputs the measurement information to each of the average value calculation unit 12 and the second amplitude calculation processing unit 15.

 平均値算出部12は、測定値取得部11から、測定情報を取得する。
 平均値算出部12は、以下の式(8)に示すように、測定情報が示す測定値P1~P4の平均値Paveを算出する。

Figure JPOXMLDOC01-appb-I000004
 平均値算出部12は、平均値Paveを第1の振幅算出処理部14及び第2の振幅算出処理部15のそれぞれに出力する。 The average value calculation unit 12 acquires measurement information from the measurement value acquisition unit 11.
As shown in the following equation (8), the average value calculation unit 12 calculates the average value Pave of the measured values P1 to P4 indicated by the measurement information.

Figure JPOXMLDOC01-appb-I000004
The mean value calculation unit 12 outputs the mean value Pave to each of the first amplitude calculation processing unit 14 and the second amplitude calculation processing unit 15.

 第1の振幅算出処理部14は、平均値算出部12から、平均値Paveを取得する。
 第1の振幅算出処理部14は、以下の式(9)に示すように、内部メモリに格納されているTM01モードでの結合量BTM01を平均値Paveに加算することによって、TM01モードにおける電磁波の振幅Ampを算出する。
Amp=Pave+BTM01     (9)
 第1の振幅算出処理部14は、TM01モードにおける電磁波の振幅Ampを、例えば、TM01モードにおける電磁波を用いる外部の装置(図示せぬ)に出力する。
The first amplitude calculation processing unit 14 acquires the average value Pave from the average value calculation unit 12.
As shown in the following equation (9), the first amplitude calculation processing unit 14 adds the coupling amount B TM01 in the TM01 mode stored in the internal memory to the average value Pave , thereby in the TM01 mode. Calculate the amplitude Amp 1 of the electromagnetic wave.
Amp 1 = P ave + B TM01 (9)
The first amplitude calculation processing unit 14 outputs the amplitude Amp 1 of the electromagnetic wave in the TM01 mode to, for example, an external device (not shown) that uses the electromagnetic wave in the TM01 mode.

 第2の振幅算出処理部15は、測定値取得部11から、測定情報を取得し、平均値算出部12から、平均値Paveを取得する。
 第2の振幅算出処理部15は、以下の式(10)に示すように、測定情報が示すそれぞれの測定値Pm(m=1,2,3,4)から、平均値Paveを減算することによって、平均値減算後の測定値Pm’を算出する。
Pm’=Pm-Pave     (10)
The second amplitude calculation processing unit 15 acquires measurement information from the measured value acquisition unit 11, and acquires the average value Pave from the average value calculation unit 12.
As shown in the following equation (10), the second amplitude calculation processing unit 15 subtracts the average value Pave from each measured value Pm (m = 1, 2, 3, 4) indicated by the measurement information. By doing so, the measured value Pm'after subtracting the average value is calculated.
Pm'= Pm-P ave (10)

 第2の振幅算出処理部15は、以下の式(11)に示すように、測定値P1’、測定値P2’及び測定値P4’の重み付け平均値を第1の重み付け平均値WPave1として算出する。

Figure JPOXMLDOC01-appb-I000005
As shown in the following equation (11), the second amplitude calculation processing unit 15 calculates the weighted average value of the measured value P1', the measured value P2', and the measured value P4'as the first weighted average value WP ave1. do.

Figure JPOXMLDOC01-appb-I000005

 第2の振幅算出処理部15は、以下の式(12)に示すように、測定値P2’、測定値P3’及び測定値P4’の重み付け平均値を第2の重み付け平均値WPave2として算出する。

Figure JPOXMLDOC01-appb-I000006
As shown in the following equation (12), the second amplitude calculation processing unit 15 calculates the weighted average value of the measured value P2', the measured value P3', and the measured value P4'as the second weighted average value WP ave2. do.

Figure JPOXMLDOC01-appb-I000006

 第2の振幅算出処理部15は、以下の式(13)に示すように、内部メモリに格納されているTE11Aモードでの結合量BTE11Aを第1の重み付け平均値WPave1に加算することによって、TE11モードにおける電磁波の振幅Amp2Aを算出する。
Amp2A=WPave1+BTE11A     (13)
As shown in the following equation (13), the second amplitude calculation processing unit 15 adds the coupling amount B TE11A in the TE11A mode stored in the internal memory to the first weighted average value WP ave1 . , The amplitude Amp 2A of the electromagnetic wave in the TE11 mode is calculated.
Amp 2A = WP ave1 + B TE11A (13)

 第2の振幅算出処理部15は、以下の式(14)に示すように、内部メモリに格納されているTE11Bモードでの結合量BTE11Bを第2の重み付け平均値WPave2に加算することによって、TE11Bモードにおける電磁波の振幅Amp2Bを算出する。
Amp2B=WPave2+BTE11B     (14)
 第2の振幅算出処理部15は、TE11Aモードにおける電磁波の振幅Amp2A及びTE11Bモードにおける電磁波の振幅Amp2Bのそれぞれを、例えば、TE11Aモードにおける電磁波及びTE11Bモードにおける電磁波のそれぞれを用いる外部の装置(図示せぬ)に出力する。
As shown in the following equation (14), the second amplitude calculation processing unit 15 adds the coupling amount B TE11B in the TE11B mode stored in the internal memory to the second weighted average value WP ave2 . , The amplitude Amp 2B of the electromagnetic wave in the TE11B mode is calculated.
Amp 2B = WP ave2 + B TE11B (14)
The second amplitude calculation processing unit 15 is an external device that uses each of the electromagnetic wave amplitude Amp 2A in the TE11A mode and the electromagnetic wave amplitude Amp 2B in the TE11B mode, for example, the electromagnetic wave in the TE11A mode and the electromagnetic wave in the TE11B mode. Output to) (not shown).

 以上の実施の形態2では、4(=2)本のプローブ3が、円形導波管2の管壁2aの円周方向に45度の間隔で並んでいる導波管モード測定装置5を構成した。4本のプローブ3が、円形導波管2の管壁2aの円周方向に45度の間隔で並んでいる場合でも、導波管モード測定装置5は、円形導波管2内の電磁波を空間に放射させることなく、電磁波の振幅を測定することができる。
 4本のプローブ3が、円形導波管2の管壁2aの円周方向に45度の間隔で並んでいる場合、8本のプローブ3が、円形導波管2の管壁2aの円周方向に45度の間隔で並んでいる場合よりも、導波管モード測定装置5の振幅算出部13における電磁波の振幅算出処理を軽減することができる。
In the above embodiment 2 , the waveguide mode measuring device 5 in which 4 (= 22) probes 3 are arranged at intervals of 45 degrees in the circumferential direction of the tube wall 2a of the circular waveguide 2. Configured. Even when the four probes 3 are arranged at intervals of 45 degrees in the circumferential direction of the tube wall 2a of the circular waveguide 2, the waveguide mode measuring device 5 transmits electromagnetic waves in the circular waveguide 2. The amplitude of an electromagnetic wave can be measured without radiating it into space.
When the four probes 3 are arranged at an interval of 45 degrees in the circumferential direction of the tube wall 2a of the circular waveguide 2, the eight probes 3 are the circumferences of the tube wall 2a of the circular waveguide 2. It is possible to reduce the amplitude calculation process of the electromagnetic wave in the amplitude calculation unit 13 of the waveguide mode measuring device 5 as compared with the case where they are arranged at intervals of 45 degrees in the direction.

 図1及び図11に示す導波管システムでは、管壁2aの孔2bに挿入される複数のプローブ3の数が、2のn乗本である。しかし、式(4)及び式(5)のそれぞれに含まれている係数kの値、又は、式(11)及び式(12)のそれぞれに含まれている係数kの値を変えて、重み付け平均の算出式を変えれば、管壁2aの孔2bに挿入される複数のプローブ3の数が、2のn乗本でなくてもよい。
 ただし、例えば、式(4)及び式(5)のそれぞれに含まれている4つの係数kは、プローブ3の本数及びそれぞれのプローブ3の位置に応じて、別々のkとし、プローブ3の本数及びそれぞれのプローブ3の位置に応じて、別々の値をkに設定する必要がある。
In the waveguide system shown in FIGS. 1 and 11, the number of the plurality of probes 3 inserted into the holes 2b of the tube wall 2a is 2 to the nth power. However, the value of the coefficient k included in each of the equations (4) and (5) or the value of the coefficient k included in each of the equations (11) and (12) is changed and weighted. By changing the calculation formula of the average, the number of the plurality of probes 3 inserted into the holes 2b of the tube wall 2a does not have to be 2 to the nth power.
However, for example, the four coefficients k included in each of the equations (4) and (5) are set to different k according to the number of probes 3 and the position of each probe 3, and the number of probes 3 is set. And, depending on the position of each probe 3, it is necessary to set different values to k.

 なお、本開示は、各実施の形態の自由な組み合わせ、あるいは各実施の形態の任意の構成要素の変形、もしくは各実施の形態において任意の構成要素の省略が可能である。 In the present disclosure, any combination of the embodiments can be freely combined, any component of the embodiment can be modified, or any component can be omitted in each embodiment.

 本開示は、導波管モード測定装置及び導波管モード測定方法に適している。
 本開示は、導波管装置及び導波管モード測定装置を含む導波管システムに適している。
 本開示は、導波管装置に適している。
The present disclosure is suitable for a waveguide mode measuring device and a waveguide mode measuring method.
The present disclosure is suitable for waveguide systems including waveguide devices and waveguide mode measuring devices.
The present disclosure is suitable for waveguide devices.

 1 導波管装置、2 円形導波管、2a 管壁、2b 孔、3,3-1~3-8 プローブ、3a 内導体、4 測定器、5 導波管モード測定装置、11 測定値取得部、12 平均値算出部、13 振幅算出部、14 第1の振幅算出処理部、15 第2の振幅算出処理部、21 測定値取得回路、22 平均値算出回路、23 第1の振幅算出回路、24 第2の振幅算出回路、31 メモリ、32 プロセッサ。 1 Waveguide device, 2 Circular waveguide, 2a Waveguide wall, 2b hole, 3,3-1 to 3-8 probe, 3a Inner conductor, 4 Measuring instrument, 5 Waveguide mode measuring device, 11 Measurement value acquisition Unit, 12 average value calculation unit, 13 amplitude calculation unit, 14 first amplitude calculation processing unit, 15 second amplitude calculation processing unit, 21 measurement value acquisition circuit, 22 average value calculation circuit, 23 first amplitude calculation processing unit. , 24 Second amplitude calculation circuit, 31 Memory, 32 Processor.

Claims (11)

 管壁を有する円形導波管を伝搬するTM01モードの電磁波、又は、前記円形導波管を伝搬するTE11モードの電磁波の振幅を測定する導波管モード測定装置であって、
 前記管壁を貫通している複数の孔のそれぞれに挿入された複数のプローブの端部に接続された測定器から、それぞれのプローブに現れている電圧の測定値を取得する測定値取得部と、
 前記測定値取得部により取得された複数の測定値の平均値を算出する平均値算出部と、
 前記平均値算出部により算出された平均値から、前記TM01モードにおける電磁波の振幅を算出する第1の振幅算出処理部、又は、前記測定値取得部により取得されたそれぞれの測定値から、前記平均値算出部により算出された平均値を減算し、平均値減算後の複数の測定値の重み付け平均値を算出し、前記重み付け平均値から、前記TE11モードにおける電磁波の振幅を算出する第2の振幅算出処理部のうち、1つ以上の振幅算出処理部を備える振幅算出部と
 を備えることを特徴とする導波管モード測定装置。
A waveguide mode measuring device for measuring the amplitude of an electromagnetic wave in TM01 mode propagating in a circular waveguide having a tube wall or an electromagnetic wave in TE11 mode propagating in the circular waveguide.
A measurement value acquisition unit that acquires a measured value of the voltage appearing in each probe from a measuring instrument connected to the end of a plurality of probes inserted in each of the plurality of holes penetrating the tube wall. ,
An average value calculation unit that calculates the average value of a plurality of measured values acquired by the measured value acquisition unit, and an average value calculation unit.
From the average value calculated by the mean value calculation unit, the first amplitude calculation processing unit that calculates the amplitude of the electromagnetic wave in the TM01 mode, or from each measurement value acquired by the measurement value acquisition unit, the average. A second amplitude in which the average value calculated by the value calculation unit is subtracted, the weighted average value of a plurality of measured values after the average value is subtracted is calculated, and the amplitude of the electromagnetic wave in the TE11 mode is calculated from the weighted average value. Among the calculation processing units, a waveguide mode measuring device including an amplitude calculation unit including one or more amplitude calculation processing units.
 前記複数のプローブとして、2のn(nは、2以上の整数)乗本のプローブが、前記管壁の円周方向に45度の間隔で並んでおり、
 前記測定値取得部は、前記測定器から、それぞれのプローブに現れている電圧の測定値を取得することを特徴とする請求項1記載の導波管モード測定装置。
As the plurality of probes, probes of 2 n (n is an integer of 2 or more) are arranged at intervals of 45 degrees in the circumferential direction of the tube wall.
The waveguide mode measuring device according to claim 1, wherein the measured value acquisition unit acquires a measured value of a voltage appearing in each probe from the measuring device.
 n=3であり、2の3乗本のプローブとして、第1のプローブ、第2のプローブ、第3のプローブ、第4のプローブ、第5のプローブ、第6のプローブ、第7のプローブ及び第8のプローブが、前記円周方向に45度の間隔で並んでおり、
 前記第1のプローブに現れている電圧の測定値がP1、前記第2のプローブに現れている電圧の測定値がP2、前記第3のプローブに現れている電圧の測定値がP3、前記第4のプローブに現れている電圧の測定値がP4、前記第5のプローブに現れている電圧の測定値がP5、前記第6のプローブに現れている電圧の測定値がP6、前記第7のプローブに現れている電圧の測定値がP7及び前記第8のプローブに現れている電圧の測定値がP8であるとき、
 前記平均値算出部は、
 前記P1と、前記P2と、前記P3と、前記P4と、前記P5と、前記P6と、前記P7と、前記P8との平均値を算出することを特徴とする請求項2記載の導波管モード測定装置。
n = 3, and as 2 cubed probes, the first probe, the second probe, the third probe, the fourth probe, the fifth probe, the sixth probe, the seventh probe and the like. The eighth probes are lined up at intervals of 45 degrees in the circumferential direction.
The measured value of the voltage appearing in the first probe is P1, the measured value of the voltage appearing in the second probe is P2, the measured value of the voltage appearing in the third probe is P3, and the first. The measured value of the voltage appearing in the probe 4 is P4, the measured value of the voltage appearing in the fifth probe is P5, the measured value of the voltage appearing in the sixth probe is P6, and the seventh probe. When the measured value of the voltage appearing on the probe is P7 and the measured value of the voltage appearing on the eighth probe is P8.
The average value calculation unit is
The waveguide according to claim 2, wherein the average value of the P1, the P2, the P3, the P4, the P5, the P6, the P7, and the P8 is calculated. Mode measuring device.
 前記第1の振幅算出処理部は、
 前記平均値算出部により算出された平均値から、前記TM01モードにおける電磁波の振幅を算出することを特徴とする請求項3記載の導波管モード測定装置。
The first amplitude calculation processing unit is
The waveguide mode measuring device according to claim 3, wherein the amplitude of the electromagnetic wave in the TM01 mode is calculated from the average value calculated by the average value calculation unit.
 前記第2の振幅算出処理部は、
 前記P1、前記P2、前記P3、前記P4、前記P5、前記P6、前記P7及び前記P8のそれぞれから、前記平均値算出部により算出された平均値を減算することによって、P1’、P2’、P3’、P4’、P5’、P6’、P7’及びP8’のそれぞれを算出し、
 前記P1’、前記P2’、前記P4’、前記P5’、前記P6’及び前記P8’の重み付け平均値を第1の重み付け平均値として算出し、
 前記P2’、前記P3’、前記P4’、前記P6’、前記P7’及び前記P8’の重み付け平均値を第2の重み付け平均値として算出し、
 前記第1の重み付け平均値から、前記TE11モードにおける第1の偏波の振幅を算出し、前記第2の重み付け平均値から、前記第1の偏波と直交している、前記TE11モードにおける第2の偏波の振幅を算出することを特徴とする請求項3記載の導波管モード測定装置。
The second amplitude calculation processing unit is
By subtracting the average value calculated by the mean value calculation unit from each of the P1, the P2, the P3, the P4, the P5, the P6, the P7, and the P8, P1', P2', Calculate each of P3', P4', P5', P6', P7'and P8',
The weighted average values of the P1', the P2', the P4', the P5', the P6', and the P8'are calculated as the first weighted average value.
The weighted average values of the P2', the P3', the P4', the P6', the P7'and the P8' are calculated as the second weighted average value.
From the first weighted average value, the amplitude of the first polarization in the TE11 mode is calculated, and from the second weighted average value, the first in the TE11 mode, which is orthogonal to the first polarization. The waveguide mode measuring device according to claim 3, wherein the amplitude of the polarization of 2 is calculated.
 n=2であり、2の2乗本のプローブとして、第1のプローブ、第2のプローブ、第3のプローブ及び第4のプローブが、前記管壁の円周方向に45度の間隔で並んでおり、
 前記第1のプローブに現れている電圧の測定値がP1、前記第2のプローブに現れている電圧の測定値がP2、前記第3のプローブに現れている電圧の測定値がP3及び前記第4のプローブに現れている電圧の測定値がP4であるとき、
 前記平均値算出部は、
 前記P1と、前記P2と、前記P3と、前記P4との平均値を算出することを特徴とする請求項2記載の導波管モード測定装置。
n = 2, and as squared 2 probes, the first probe, the second probe, the third probe, and the fourth probe are arranged at intervals of 45 degrees in the circumferential direction of the tube wall. And
The measured value of the voltage appearing in the first probe is P1, the measured value of the voltage appearing in the second probe is P2, the measured value of the voltage appearing in the third probe is P3 and the first. When the measured value of the voltage appearing on the probe of 4 is P4,
The average value calculation unit is
The waveguide mode measuring device according to claim 2, wherein the average value of the P1, the P2, the P3, and the P4 is calculated.
 前記第1の振幅算出部は、
 前記平均値算出部により算出された平均値から、前記TM01モードにおける電磁波の振幅を算出することを特徴とする請求項6記載の導波管モード測定装置。
The first amplitude calculation unit is
The waveguide mode measuring device according to claim 6, wherein the amplitude of the electromagnetic wave in the TM01 mode is calculated from the average value calculated by the average value calculation unit.
 前記第2の振幅算出部は、
 前記P1、前記P2、前記P3及び前記P4のそれぞれから、前記平均値算出部により算出された平均値を減算することによって、P1’、P2’、P3’及びP4’のそれぞれを算出し、
 前記P1’、前記P2’及び前記P4’の重み付け平均値を第1の重み付け平均値として算出し、
 前記P2’、前記P3’及び前記P4’の重み付け平均値を第2の重み付け平均値として算出し、
 前記第1の重み付け平均値から、前記TE11モードにおける第1の偏波の振幅を算出し、前記第2の重み付け平均値から、前記第1の偏波と直交している、前記TE11モードにおける第2の偏波の振幅を算出することを特徴とする請求項6記載の導波管モード測定装置。
The second amplitude calculation unit is
By subtracting the average value calculated by the average value calculation unit from each of the P1, the P2, the P3, and the P4, each of P1', P2', P3', and P4'is calculated.
The weighted average values of the P1', the P2', and the P4'are calculated as the first weighted average value.
The weighted average value of the P2', the P3', and the P4'is calculated as the second weighted average value.
From the first weighted average value, the amplitude of the first polarization in the TE11 mode is calculated, and from the second weighted average value, the first in the TE11 mode, which is orthogonal to the first polarization. The waveguide mode measuring device according to claim 6, wherein the amplitude of the polarization of 2 is calculated.
 管壁を有する円形導波管を伝搬するTM01モードの電磁波、又は、前記円形導波管を伝搬するTE11モードの電磁波の振幅を測定する導波管モード測定方法であって、
 測定値取得部が、前記管壁を貫通している複数の孔のそれぞれに挿入された複数のプローブの端部に接続された測定器から、それぞれのプローブに現れている電圧の測定値を取得し、
 平均値算出部が、前記測定値取得部により取得された複数の測定値の平均値を算出し、
 振幅算出部が、前記平均値算出部により算出された平均値から、前記TM01モードにおける電磁波の振幅を算出する振幅算出処理、
 又は、前記測定値取得部により取得されたそれぞれの測定値から、前記平均値算出部により算出された平均値を減算し、平均値減算後の複数の測定値の重み付け平均値を算出し、前記重み付け平均値から、前記TE11モードにおける電磁波の振幅を算出する振幅算出処理のうち、1つ以上の振幅算出処理を行う
 ことを特徴とする導波管モード測定方法。
A waveguide mode measuring method for measuring the amplitude of an electromagnetic wave in TM01 mode propagating in a circular waveguide having a tube wall or an electromagnetic wave in TE11 mode propagating in the circular waveguide.
The measured value acquisition unit acquires the measured value of the voltage appearing in each probe from the measuring instrument connected to the end of the plurality of probes inserted in each of the plurality of holes penetrating the tube wall. death,
The average value calculation unit calculates the average value of a plurality of measured values acquired by the measured value acquisition unit, and then calculates the average value.
Amplitude calculation processing, in which the amplitude calculation unit calculates the amplitude of the electromagnetic wave in the TM01 mode from the average value calculated by the average value calculation unit.
Alternatively, the average value calculated by the average value calculation unit is subtracted from each measurement value acquired by the measurement value acquisition unit, and a weighted average value of a plurality of measured values after the average value is subtracted is calculated. A waveguide mode measuring method comprising performing one or more amplitude calculation processes among the amplitude calculation processes for calculating the amplitude of an electromagnetic wave in the TE11 mode from a weighted average value.
 管壁を有し、導波管モードとして、TM01モード及びTE11モードのそれぞれを有し、前記管壁の貫通孔として、前記管壁を貫通している複数の孔が施されている円形導波管と、
 前記管壁を貫通しているそれぞれの孔に一端が挿入されている複数のプローブと、
 それぞれのプローブの他端が接続されている測定器と、
 請求項1から請求項8のうちのいずれか1項記載の導波管モード測定装置と
 を備えた導波管システム。
A circular waveguide having a tube wall, having TM01 mode and TE11 mode as a waveguide mode, and having a plurality of holes penetrating the tube wall as through holes of the tube wall. With a tube
Multiple probes with one end inserted into each hole penetrating the tube wall,
With the measuring instrument to which the other end of each probe is connected,
A waveguide system including the waveguide mode measuring device according to any one of claims 1 to 8.
 管壁を有し、導波管モードとして、TM01モード及びTE11モードのそれぞれを有し、前記管壁の貫通孔として、前記管壁を貫通している複数の孔が施されている円形導波管と、
 前記管壁を貫通しているそれぞれの孔に一端が挿入されている複数のプローブと
 を備えた導波管装置。
A circular waveguide having a tube wall, having TM01 mode and TE11 mode as a waveguide mode, and having a plurality of holes penetrating the tube wall as through holes of the tube wall. With a tube
A waveguide device with a plurality of probes having one end inserted into each hole penetrating the tube wall.
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