WO2022074720A1 - 基板作業装置 - Google Patents
基板作業装置 Download PDFInfo
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- WO2022074720A1 WO2022074720A1 PCT/JP2020/037777 JP2020037777W WO2022074720A1 WO 2022074720 A1 WO2022074720 A1 WO 2022074720A1 JP 2020037777 W JP2020037777 W JP 2020037777W WO 2022074720 A1 WO2022074720 A1 WO 2022074720A1
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- Prior art keywords
- image pickup
- unit
- pickup unit
- imaging
- field
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- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K13/00—Apparatus or processes specially adapted for manufacturing or adjusting assemblages of electric components
- H05K13/08—Monitoring manufacture of assemblages
- H05K13/081—Integration of optical monitoring devices in assembly lines; Processes using optical monitoring devices specially adapted for controlling devices or machines in assembly lines
- H05K13/0812—Integration of optical monitoring devices in assembly lines; Processes using optical monitoring devices specially adapted for controlling devices or machines in assembly lines the monitoring devices being integrated in the mounting machine, e.g. for monitoring components, leads, component placement
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01B—MEASURING LENGTH, THICKNESS OR SIMILAR LINEAR DIMENSIONS; MEASURING ANGLES; MEASURING AREAS; MEASURING IRREGULARITIES OF SURFACES OR CONTOURS
- G01B11/00—Measuring arrangements characterised by the use of optical techniques
- G01B11/02—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness
- G01B11/06—Measuring arrangements characterised by the use of optical techniques for measuring length, width or thickness for measuring thickness ; e.g. of sheet material
- G01B11/0608—Height gauges
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N23/00—Cameras or camera modules comprising electronic image sensors; Control thereof
- H04N23/57—Mechanical or electrical details of cameras or camera modules specially adapted for being embedded in other devices
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N23/00—Cameras or camera modules comprising electronic image sensors; Control thereof
- H04N23/70—Circuitry for compensating brightness variation in the scene
- H04N23/73—Circuitry for compensating brightness variation in the scene by influencing the exposure time
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- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N23/00—Cameras or camera modules comprising electronic image sensors; Control thereof
- H04N23/70—Circuitry for compensating brightness variation in the scene
- H04N23/74—Circuitry for compensating brightness variation in the scene by influencing the scene brightness using illuminating means
-
- H—ELECTRICITY
- H04—ELECTRIC COMMUNICATION TECHNIQUE
- H04N—PICTORIAL COMMUNICATION, e.g. TELEVISION
- H04N23/00—Cameras or camera modules comprising electronic image sensors; Control thereof
- H04N23/90—Arrangement of cameras or camera modules, e.g. multiple cameras in TV studios or sports stadiums
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- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05K—PRINTED CIRCUITS; CASINGS OR CONSTRUCTIONAL DETAILS OF ELECTRIC APPARATUS; MANUFACTURE OF ASSEMBLAGES OF ELECTRICAL COMPONENTS
- H05K13/00—Apparatus or processes specially adapted for manufacturing or adjusting assemblages of electric components
- H05K13/04—Mounting of components, e.g. of leadless components
- H05K13/0417—Feeding with belts or tapes
Definitions
- the present invention relates to a board working device, and more particularly to a board working device including a head unit.
- a board work device equipped with a head unit is known.
- Such a substrate working apparatus is disclosed in, for example, Japanese Patent Application Laid-Open No. 2019-75475.
- the above-mentioned JP-A-2019-75475 discloses a component mounting device (board working device) including a head unit.
- This component mounting device includes an image pickup unit provided in the head unit.
- the imaging unit includes two cameras arranged vertically.
- the image pickup unit is configured to capture the mounting position of the component mounted on the substrate from two directions (angles) by two cameras.
- Each of the two cameras is arranged so as to be offset up and down so that the mounting position of the component can be imaged from a plurality of oblique directions with respect to the vertical direction.
- the upper camera of the two cameras offset vertically has an optical axis in an oblique direction close to the vertical direction.
- the lower camera of the two vertically offset cameras has an oblique optical axis that is close to horizontal.
- the horizontal position and the vertical direction of the component at the component mounting position are based on the images of the component mounting positions captured from two oblique directions by two cameras.
- the height position is acquired.
- the upper camera has an optical axis in an oblique direction close to the vertical direction
- the lower camera has an optical axis in an oblique direction close to the horizontal direction. Since it has an optical axis, when imaging a substrate with upward warpage and downward warpage, the distance between the upward warped portion and the downward warped portion of the upper surface of the substrate in the optical axis direction of the second camera is , It is larger than the distance between the upwardly warped portion and the downwardly warped portion of the upper surface of the substrate in the optical axis direction of the first camera.
- the present invention has been made to solve the above-mentioned problems, and one object of the present invention is an oblique direction by each of a plurality of image pickup units arranged at a plurality of different height positions in the vertical direction. It is an object of the present invention to provide a substrate working apparatus capable of ensuring that the image captured from the image is in focus (focus) more reliably.
- the substrate work apparatus is provided on the head unit including a work head that performs work on the substrate, and the head unit in a state of being arranged at a plurality of different height positions in the vertical direction, and is an image pickup target.
- the plurality of image pickup units are provided with a plurality of image pickup units that capture the same image pickup position in which the images are arranged from different oblique directions, and the plurality of image pickup units have different depths of field depending on the tilt angle of each image pickup in the diagonal direction. It is set.
- the plurality of imaging units may be configured to capture the same imaging position where the imaging target is arranged by dividing the field of view by a common camera, and the plurality of imaging units are separate from each other.
- the camera may be configured to capture the same imaging position in which the imaging target is arranged.
- different depths of field are set in the plurality of image pickup units according to the respective inclination angles from the respective height positions toward the image pickup target. ..
- different depths of field are set according to the tilt angle in each of the plurality of image pickup units.
- the plurality of image pickup units are located on the lower side of the first image pickup unit having the first inclination angle in the oblique direction close to the vertical direction among the inclination angles and the first image pickup unit. It includes a second image pickup unit that is arranged and has a second tilt angle in an oblique direction that is closer to the horizontal direction than the first tilt angle, and the second image pickup unit is from the first depth of field of the first image pickup unit. Also has a deep second depth of field. With this configuration, by making the second depth of field deeper than the first depth of field, it is possible to sufficiently secure the second depth of field of the second image pickup unit. The image captured by the image pickup unit can be more reliably focused.
- the first imaging unit and the second imaging unit are arranged so as to image the same imaging position in which the imaging target is arranged vertically side by side on the same plane along the vertical direction.
- the second image pickup unit is arranged below the first image pickup unit in the vertical direction, and has a second depth of field deeper than the first depth of field.
- the first depth of field is preferably set to a constant depth of field by setting the aperture of the first image pickup unit to be constant.
- the second depth of field is set to a constant depth of field deeper than the first depth of field by setting the aperture of the second imaging unit to be constant.
- each of the first image pickup unit and the second image pickup unit is at least around the mounting position of the component to be imaged and around the suction position of the component. It is configured to image one of them, and each of the first depth of field and the second depth of field is due to the warp of the substrate in the cross section along the direction in which the first image pickup unit and the second image pickup unit are arranged.
- the estimated amount of deviation of the height position of the upper surface of the board or the estimated amount of deviation of the height position of the upper surface of the parts stored in the storage tape due to the difference in the type of storage tape that stores the parts, and the horizontal direction of the parts. It is set by the length of and the tilt angle.
- the difference in the type of storage tape is not only the difference in the type of tape such as paper tape and embossed tape, but also when the size of the storage part for storing parts is different even with the same paper tape, and with the same embossed tape. Even if there is, it is a broad concept including the case where the size of the storage part for storing parts is different.
- the control for imaging the image pickup target by each of the illumination unit that irradiates the image pickup target with light and the first image pickup unit and the second image pickup unit.
- the control unit further includes a control unit for performing the above, and the control unit determines the sensor gain for each of the first image pickup unit and the second image pickup unit, the exposure time of each of the first image pickup unit and the second image pickup unit, and the light amount of the illumination unit. By making any of them different, it is configured to control the brightness of the images captured by each of the first imaging unit and the second imaging unit to be substantially the same as each other.
- the control unit preferably performs the exposure by the second imaging unit in parallel with the exposure by the first imaging unit. It is configured in. With such a configuration, the time required for exposure when imaging the imaging position can be minimized, so that the working time for the substrate of the work head can be prevented from increasing.
- the first image pickup unit and the second image pickup unit further include a first camera and a second camera, respectively.
- the structure of the optical system such as the lenses of the first imaging unit and the second imaging unit can be simplified as compared with the case of imaging with a common camera. It is possible to suppress the complexity of the structure of the second imaging unit.
- the first image pickup unit and the second image pickup unit further include a common camera and an optical system that divides the field of view of the common camera. .. With this configuration, the number of required cameras can be reduced, and the size of the head unit can be suppressed.
- an image is taken based on the first image captured by the first image pickup unit and the second image captured by the second image pickup unit. It is configured to acquire the height position around the target. With this configuration, by acquiring the height position of the periphery of the image pickup target based on the first image and the second image in focus, the height position of the periphery of the image pickup target can be acquired more accurately. Therefore, the work on the substrate by the work head can be performed more accurately.
- the image captured from an oblique direction is more reliably focused by each of the plurality of image pickup units arranged at a plurality of different height positions in the vertical direction. can do.
- the configuration of the component mounting device 100 according to the first embodiment of the present invention will be described with reference to FIGS. 1 to 6.
- the component mounting device 100 is an example of the "board working device” in the claims.
- the component mounting device 100 is configured to convey the substrate S by a pair of conveyors 2 and mount the component B on the substrate S at the working position P1.
- the component B is an example of the "imaging target" in the claims.
- the component mounting device 100 includes a base 1, a pair of conveyors 2, a component supply unit 3, a head unit 4, a support unit 5, a pair of rail units 6, a component recognition imaging unit 7, and an imaging unit 8. And a control unit 9.
- the transport direction of the substrate S by the pair of conveyors 2 is the X1 direction
- the direction opposite to the X1 direction is the X2 direction
- the combined direction of the X1 direction and the X2 direction is the X direction.
- the direction orthogonal to the X direction is defined as the Y direction.
- One of the Y directions is the Y1 direction
- the other direction of the Y direction is the Y2 direction.
- the direction orthogonal to the X and Y directions is the Z direction (vertical direction)
- one of the Z directions is the Z1 direction (upward)
- the other direction of the Z direction is the Z2 direction (downward). ..
- the pair of conveyors 2 are installed on the base 1 and are configured to convey the substrate S in the X1 direction. Further, the pair of conveyors 2 are provided with a holding mechanism for holding the substrate S being conveyed in a state of being stopped at the working position P1. Further, the pair of conveyors 2 are configured so that the distance in the Y direction can be adjusted according to the dimensions of the substrate S.
- the parts supply unit 3 is arranged on the outside (Y1 direction side and Y2 direction side) of the pair of conveyors 2. Further, a plurality of tape feeders 31 are arranged in the component supply unit 3. The component supply unit 3 is configured to supply the component B to the mounting head 42 described later.
- the tape feeder 31 holds a reel (not shown) around which a tape holding a plurality of parts B is held at predetermined intervals.
- the tape feeder 31 is configured to rotate the reel by sending out the storage tape 32 holding the component B to supply the component B from the tip of the tape feeder 31.
- component B includes electronic components such as ICs, transistors, capacitors and resistors.
- the head unit 4 is arranged on the Z1 direction side of the pair of conveyors 2 and the component supply unit 3, and has a plurality of (five) mounting heads 42 to which nozzles 41 (see FIG. 2) are attached to the lower ends, and board recognition. Includes camera 43.
- the mounting head 42 is an example of a "working head” in the claims.
- the mounting head 42 is configured to work on the board S. Specifically, that is, the mounting head 42 is configured to attract the component B at the component supply unit 3. Further, the mounting head 42 is configured to mount the component B on the substrate S. As described above, the mounting head 42 is configured to suck the component B supplied by the component supply unit 3 and mount the suctioned component B on the substrate S arranged at the working position P1. Further, the mounting head 42 is configured to be movable up and down (movable in the Z direction), and is supplied from the tape feeder 31 by the negative pressure generated at the tip of the nozzle 41 by a negative pressure generator (not shown). It is configured to attract and hold the component B and mount the component B at the mounting position P3 on the substrate S.
- the mounting position P3 of the component B is an example of the "imaging position" in the claims.
- the board recognition camera 43 is configured to image the fiction mark of the board S in order to recognize the position and orientation of the board S. Then, by imaging and recognizing the position of the fiducial mark, it is possible to accurately acquire the mounting position P3 of the component B on the substrate S.
- the support portion 5 includes a motor 51.
- the support portion 5 is configured to move the head unit 4 in the X direction along the support portion 5 by driving the motor 51. Both ends of the support portion 5 are supported by a pair of rail portions 6.
- the pair of rail portions 6 are fixed on the base 1.
- the rail portion 6 on the X1 side includes the motor 61.
- the rail portion 6 is configured to move the support portion 5 in the Y direction along the pair of rail portions 6 by driving the motor 61. Since the head unit 4 can move in the X direction along the support portion 5 and the support portion 5 can move in the Y direction along the rail portion 6, the head unit 4 can move in the horizontal direction (XY direction). It is movable.
- the component recognition image pickup unit 7 is fixed on the upper surface of the base 1.
- the component recognition image pickup unit 7 is arranged on the outside (Y1 direction side and Y2 direction side) of the pair of conveyors 2.
- the component recognition imaging unit 7 displays the component B sucked on the nozzle 41 of the mounting head 42 from the lower side (Z2 direction side) in order to recognize the suction state (suction posture) of the component B prior to mounting the component B. It is configured to image.
- the control unit 9 it is possible for the control unit 9 to acquire the suction state of the component B sucked by the nozzle 41 of the mounting head 42.
- the image pickup unit 8 is provided in the head unit 4.
- the image pickup unit 8 is configured to move in the XY direction together with the head unit 4 by moving the head unit 4 in the horizontal direction (XY direction).
- the image pickup unit 8 is arranged so as to be offset in the horizontal direction (particularly in the Y direction) with respect to the mounting head 42 so as not to interfere with the movement of the mounting head 42 in the Z direction.
- the image pickup unit 8 is configured to be able to take an image at a position where the mounting head 42 is lowered without moving the head unit 4. Specifically, the image pickup unit 8 is configured to be able to take an image of the suction positions P2 (imaging positions) of the component supply unit 3 from a plurality of (two) directions. Further, the image pickup unit 8 is configured so that the mounting position P3 (imaging position) of the substrate S can be imaged from a plurality of (two) directions.
- the suction position P2 of the component B is an example of the “imaging position” in the claims.
- the image pickup unit 8 is configured to image the periphery of the suction position P2 of the component B from a plurality of (two) directions to capture the first image and the second image. Further, the image pickup unit 8 is configured to take a picture of the periphery of the mounting position P3 of the component B from a plurality of (two) directions and take a first image and a second image.
- the image pickup unit 8 includes an illumination unit 81, a first image pickup unit 82, and a second image pickup unit 83.
- a set of the first image pickup unit 82 and the second image pickup unit 83 are arranged corresponding to each of the plurality of mounting heads 42.
- the lighting unit 81 has a light source such as an LED (Light Emitting Diode).
- the illumination unit 81 is configured to irradiate the component B arranged at the suction position P2 or the mounting position P3 (imaging position) with light.
- the illumination unit 81 is configured to emit light when an image is taken by the first image pickup unit 82 and the second image pickup unit 83.
- the illumination unit 81 is provided around the first image pickup unit 82 and the second image pickup unit 83.
- the first image pickup unit 82 and the second image pickup unit 83 are examples of the "plurality of image pickup units" in the claims.
- the first image pickup unit 82 and the second image pickup unit 83 have a first camera 82a and a second camera 83a, respectively.
- the first camera 82a has a first image sensor 182a.
- the second camera 83a has a second image sensor 183a.
- the first image sensor 182a is configured to convert the light incident from the first lens unit 182b, which will be described later, into an electric signal.
- the second image pickup device 183a is configured to convert the light incident from the second lens unit 183b, which will be described later, into an electric signal.
- the first imaging unit 82 and the second imaging unit 83 have a first optical system 82b and a second optical system 83b, respectively.
- the first optical system 82b has a first lens unit 182b having a plurality of lenses and a first diaphragm unit 182c.
- the second optical system 83b has a second lens portion 183b having a plurality of lenses and a second diaphragm portion 183c.
- the first diaphragm portion 182c is a hole that limits the light directed to the first lens portion 182b.
- the second diaphragm portion 183c is a hole that limits the light directed to the second lens portion 183b.
- the first image pickup unit 82 and the second image pickup unit 83 are provided on the head unit 4 in a state of being arranged at a plurality of different height positions in the Z direction.
- Each of the first imaging unit 82 and the second imaging unit 83 images the same suction position P2 (imaging position) or mounting position P3 (imaging position) on which the component B is arranged from diagonal directions intersecting each other in different Z directions. It is configured to do.
- the first image pickup unit 82 and the second image pickup unit 83 are configured to take images from tilt angles ( ⁇ u and ⁇ t) in which the respective image pickup directions are different from each other with respect to the reference plane H0. ing.
- the first imaging unit 82 and the second imaging unit 83 are arranged vertically in the same plane along the Z direction, and the component B (imaging target) is arranged from an oblique direction at the same suction position P2 (imaging position) or mounting position. It is arranged so as to image P3 (imaging position).
- the first imaging unit 82 and the second imaging unit 83 are arranged adjacent to each other in a vertical plane (inside the YZ plane) including the suction position P2 of the component B with respect to the reference plane H0 or the mounting position P3 of the component B. ing. Further, the first imaging unit 82 and the second imaging unit 83 are arranged so as to be offset from each other in the Z direction.
- the reference plane H0 is the upper surface of the substrate S that extends along the horizontal direction and is not warped.
- the first image pickup unit 82 has a first inclination angle ⁇ u in an oblique direction close to the vertical direction among the inclination angles.
- the second image pickup unit 83 is arranged on the Z2 direction side of the first image pickup unit 82, and has a second inclination angle ⁇ t in an oblique direction closer to the horizontal direction than the first inclination angle ⁇ u.
- the tilt angle indicates the tilt of the optical axis of the first image pickup unit 82 and the optical axis of the second image pickup unit 83 extending toward the component B with respect to the reference plane H0.
- each of the first imaging unit 82 and the second imaging unit 83 covers both the periphery of the mounting position P3 (imaging position) of the component B as the imaging target and the periphery of the suction position P2 (imaging position) of the component B. It is configured to image. That is, the image pickup unit 8 can image the suction position P2 of the component B by the mounting head 42 and the mounting position P3 of the component B by the mounting head 42 from a plurality of directions (angles), respectively.
- the first image pickup unit 82 and the second image pickup unit 83 of the first embodiment differ depending on the first tilt angle ⁇ u and the first tilt angle ⁇ u in the oblique direction to be imaged, respectively.
- the depth of field is set. That is, in the first image pickup unit 82 and the second image pickup unit 83, the depth of field differs depending on the first inclination angle ⁇ u and the first inclination angle ⁇ u of each optical axis toward the component B from each height position. It is set.
- the first imaging unit 82 has a first depth of field D1.
- the second image pickup unit 83 has a second depth of field D2 deeper than the first depth of field D1 of the first image pickup unit 82.
- the second image pickup unit 83 is arranged below the first image pickup unit 82 in the vertical direction (Z2 direction).
- the first depth of field D1 is set by the F value of the first camera 82a. Specifically, the first depth of field D1 is set to a constant depth of field by setting the aperture of the first imaging unit 82 to be constant. That is, the first depth of field D1 is set by the first diaphragm portion 182c, which is a hole having a constant diameter.
- the second depth of field D2 is set by the F value of the second camera 83a. Specifically, the second depth of field D2 is set to a constant depth of field deeper than the first depth of field D1 by setting the aperture of the second imaging unit 83 to be constant. ..
- the second depth of field D2 is set by the second diaphragm portion 183c, which is a hole having a constant diameter.
- the diameter of the hole of the second drawing portion 183c is smaller than the diameter of the hole of the first drawing portion 182c.
- Each of the first depth of field D1 and the second depth of field D2 is the height of the upper surface of the substrate S due to the warp of the substrate S in the cross section along the direction in which the first image pickup unit 82 and the second image pickup unit 83 are arranged.
- the deviation amount H of the height position of the upper surface of the substrate S will be described.
- the deviation amount H is the difference between the upper height position H1 on the upper surface of the substrate S when the substrate S is warped upward and the lower height position H2 on the upper surface of the upper surface of the substrate S when the substrate S is warped downward.
- the deviation amount H may be the deviation amount at the height position of the upper surface of the component B stored in the storage tape 32.
- the deviation amount H is stored in the height position of the upper surface of the component B stored in one storage tape 32, which is a reference among the plurality of types, and in a storage tape 32 different from the storage tape 32. This is the difference from the height position of the upper surface of the component B.
- each of the first depth of field D1 and the second depth of field D2 has a deviation amount H of the height position of the upper surface of the substrate S and a height position of the upper surface of the component B stored in the storage tape 32. It is set according to the larger of the deviation amounts of. Further, each of the first depth of field D1 and the second depth of field D2 is set according to the largest of the horizontal (Y direction) lengths of the plurality of parts B.
- the first depth of field D1 is about 2. It is calculated as 866 [mm], and the second depth of field D2 is calculated as about 3.964 [mm]. In this case, the second depth of field D2 is about 1.4 times deeper than the first depth of field D1.
- the F value of the second camera 83a is higher than the F value of the first camera 82a so that the second depth of field D2 is about 1.4 times deeper than the first depth of field D1. Is also set small. In this way, the first camera 82a and the second camera 83a are designed.
- control unit 9 has a CPU (Central Processing Unit) and a storage unit.
- the storage unit is a storage device having a memory such as a ROM (Read Only Memory) and a RAM (Random Access Memory).
- the storage unit stores a component mounting program for mounting the component B on the substrate S.
- the control unit 9 of the component B is based on an image of the suction position P2 of the component B imaged from a plurality of (two) directions by the first imaging unit 82 and the second imaging unit 83. It is configured to acquire the position in the horizontal direction (XY direction) and the height position H3 in the vertical direction (Z direction) of the component B at the suction position P2. Further, the control unit 9 is horizontal to the mounting position P3 of the component B based on the images of the mounting position P3 of the component B imaged from a plurality of (two) directions by the first imaging unit 82 and the second imaging unit 83. It is configured to acquire the position in the direction (XY direction) and the height position H3 in the vertical direction (Z direction).
- control unit 9 is configured to acquire the height position H3 with respect to the reference plane H0 by stereo matching. That is, by matching the images of the suction position P2 or the mounting position P3 of the component B imaged substantially simultaneously by the first image pickup unit 82 and the second image pickup unit 83, the height position H3 and the horizontal position of the imaged position can be changed. To be acquired. That is, the control unit 9 acquires the height position H3 around the image pickup target based on the first image captured by the first image pickup unit 82 and the second image captured by the second image pickup unit 83. It is configured to provide control. For matching, a general matching method such as SSD (Sum of Squared Difference) or SAD (Sum of Absolute Difference) is used.
- the first inclination angle ⁇ u of each optical axis toward the component B from each height position is ⁇ u.
- different depths of field are set according to the first tilt angle ⁇ u.
- each of the image pickup units 83 (plural image pickup units), different depths of field are set according to the tilt angle, so that the focus is on the suction position P2 or the mounting position P3 in which the component B (imaging target) is arranged. Can be set individually. As a result, the focus of the image imaged from an oblique direction by each of the first image pickup unit 82 and the second image pickup unit 83 (plurality of image pickup units) arranged at a plurality of different height positions in the vertical direction is improved. You can make sure it fits.
- the first image pickup unit 82 having the first inclination angle ⁇ u in the oblique direction close to the Z direction (vertical direction) among the inclination angles, and the lower side of the first image pickup unit 82.
- a second image pickup unit 83 having a second inclination angle ⁇ t in an oblique direction closer to the horizontal direction than the first inclination angle ⁇ u is provided.
- a second depth of field D2 deeper than the first depth of field D1 of the first image pickup unit 82 is set in the second image pickup unit 83.
- the second depth of field D2 of the second image pickup unit 83 can be sufficiently secured, so that the second depth of field D2 can be sufficiently secured.
- the image captured by the image pickup unit 83 can be more reliably focused.
- the first image pickup unit 82 and the second image pickup unit 83 are arranged vertically on the same plane along the Z direction (vertical direction), and the component B (image pickup target) is arranged from an oblique direction. ) Are arranged so as to image the same suction position P2 (imaging position) or mounting position P3 (imaging position).
- the second image pickup unit 83 is arranged below the Z direction (vertical direction) of the first image pickup unit 82, and a second depth of field D2 deeper than the first depth of field D1 is set.
- the first image pickup unit 82 and the second image pickup unit 83 are compared with the case where the first image pickup unit 82 and the second image pickup unit 83 are arranged at positions deviated from the same plane along the Z direction (vertical direction).
- the horizontal installation space can be reduced.
- the image captured by the second image pickup unit 83 can be more reliably focused, and the size of the head unit 4 provided with the first image pickup unit 82 and the second image pickup unit 83 can be suppressed. can do.
- the first depth of field D1 is set to a constant depth of field by setting the aperture of the first imaging unit 82 to be constant.
- the second depth of field D2 is set to a constant depth of field deeper than the first depth of field D1 by setting the aperture of the second imaging unit 83 to be constant.
- each of the first imaging unit 82 and the second imaging unit 83 is placed around the mounting position P3 of the component B as the component B (imaging target) and the suction position P2 of the component B. It is configured to image at least one of the surroundings.
- the first depth of field D1 and the second depth of field D2 having appropriate values can be acquired, so that appropriate images are taken for each of the first image pickup unit 82 and the second image pickup unit 83. You can set the depth of field.
- the first camera 82a and the second camera 83a are provided in the first image pickup unit 82 and the second image pickup unit 83, respectively.
- the structure of the optical system such as the lenses of the first image pickup unit 82 and the second image pickup unit 83 can be simplified as compared with the case of taking an image with a common camera. 2 It is possible to suppress the complexity of the structure of the image pickup unit 83.
- control unit 9 is a component based on the first image captured by the first image pickup unit 82 and the second image captured by the second image pickup unit 83. It is configured to acquire the height position around B (image target). As a result, by acquiring the height position around the component B (imaging target) based on the first image and the second image in focus, the height position around the imaging target is acquired more accurately. Therefore, the work on the substrate S by the mounting head 42 can be performed accurately.
- the control unit 209 aligns the brightness of the image captured by the first imaging unit 82 with the brightness of the image captured by the second imaging unit 83. ..
- the description of the same configuration as that of the first embodiment will be omitted.
- the component mounting device 200 includes a base 1, a pair of conveyors 2, a component supply unit 3, a head unit 4, a support unit 5, and a pair of rail units 6. It includes a component recognition image pickup unit 7, an image pickup unit 8, and a control unit 209.
- the component mounting device 200 is an example of the "board working device" in the claims.
- the control unit 209 of the second embodiment has different exposure times of the first image pickup unit 82 and the second image pickup unit 83, so that the images captured by each of the first image pickup unit 82 and the second image pickup unit 83 are captured. It is configured to control the brightness of the images to be substantially the same as each other. Specifically, the control unit 209 sets the exposure time of the second image pickup unit 83 longer than the exposure time of the first image pickup unit 82 by the amount of light transmitted due to the deep depth of field. By doing so, it is configured to control the brightness of the images captured by each of the first imaging unit 82 and the second imaging unit 83 to be substantially the same as each other.
- the control unit 209 is configured to perform exposure by the second imaging unit 83 in parallel with the exposure by the first imaging unit 82. That is, as an example, when the exposure start timing of the first imaging unit 82 and the exposure start timing of the second imaging unit 83 coincide with each other for exposure, the exposure end timing of the first imaging unit 82 and the second exposure are performed. The exposure may be performed at the same timing as the end of exposure of the image pickup unit 83. Further, as an example, during the exposure of the second image pickup unit 83, the exposure of the first image pickup unit 82 may be started and the exposure of the first image pickup unit 82 may be ended.
- the exposure of the first imaging unit 82 may be started during the exposure of the second imaging unit 83, and the exposure of the first imaging unit 82 may be terminated after the exposure of the second imaging unit 83 is completed. ..
- the other configurations of the second embodiment are the same as those of the first embodiment.
- the first optical axis of each optical axis toward the component B from each height position is the first.
- Different depths of field are set according to the 1 tilt angle ⁇ u and the 1st tilt angle ⁇ u.
- the focus of the image imaged from an oblique direction by each of the first image pickup unit 82 and the second image pickup unit 83 (plurality of image pickup units) arranged at a plurality of different height positions in the vertical direction becomes more focused. You can make sure it fits.
- the component mounting device 200 is provided with the lighting unit 81 that irradiates the component B (the image pickup target) with light, and the first image pickup unit 82 and the second image pickup unit 83, respectively.
- a control unit 209 that controls to image the component B (imaging target) is provided. By causing the control unit 209 to have different exposure times of the first image pickup unit 82 and the second image pickup unit 83, the brightness of the images captured by each of the first image pickup unit 82 and the second image pickup unit 83 can be adjusted to each other. It is configured to control to make it almost the same.
- the second image pickup unit 83 focuses but also the brightness of the image captured by the second image pickup unit 83 is achieved. Can be ensured. As a result, the image captured by the second imaging unit 83 can be more reliably focused, and an image having the same brightness as the image captured by the first imaging unit 82 is captured by the second imaging unit 83. can do.
- control unit 209 is configured to perform the exposure by the second imaging unit 83 in parallel with the exposure by the first imaging unit 82.
- the time required for exposure when imaging the suction position P2 or the mounting position P3 (imaging position) can be minimized, so that the working time of the mounting head 42 with respect to the substrate S can be prevented from increasing. ..
- the other effects of the second embodiment are the same as those of the first embodiment.
- the first imaging unit 82 and the second imaging unit 83 are arranged vertically in the same plane along the vertical direction, and the imaging targets are arranged vertically at the same imaging position.
- the image is arranged so as to image
- the present invention is not limited to this. In the present invention, the first imaging unit and the second imaging unit do not have to be arranged in the same plane along the vertical direction.
- the control unit 9 (209) causes the first image pickup unit 82 and the second image pickup unit 83 by different exposure times for each of the first image pickup unit 82 and the second image pickup unit 83.
- the control unit abbreviates the brightness of the image captured by each of the first image pickup unit and the second image pickup unit by making the sensor gains for each of the first image pickup unit and the second image pickup unit different. It may be configured to perform the same control. In this case, in the control unit, the sensor gain of the second imaging unit is set larger than the sensor gain of the first imaging unit.
- control unit is configured to control the brightness of the images captured by each of the first image pickup unit and the second image pickup unit to be substantially the same by changing the amount of light of the illumination unit. good.
- the exposure timing of the first imaging unit and the exposure timing of the second imaging unit are set separately, and the amount of light at the time of exposure of the first imaging unit is more than that of the second imaging unit. The amount of light during exposure is set large.
- the first image pickup unit 82 and the second image pickup unit 83 have an example in which the first camera 82a and the second camera 83a are provided, respectively. Not limited to this.
- the first image pickup unit 82 and the second image pickup unit 83 have a common camera 382 and an optical system 383 that divides the field of view of the common camera. May be good. As a result, the required number of cameras can be suppressed, so that the size of the head unit 4 can be suppressed.
- the mounting head 42 is shown as an example of the "working head” in the claims, but the present invention is not limited to this.
- the work head may be a dispense head that applies an adhesive to the substrate.
- the component mounting device is shown as an example of the "board working device" in the claims, but the present invention is not limited to this.
- the substrate working device may be a coating device that applies an adhesive, cream solder, or the like to the substrate.
- control unit 209 is configured to perform the exposure by the second image pickup unit 83 in parallel with the exposure by the first image pickup unit 82, but the present invention shows this. Not limited to. In the present invention, the exposure by the first imaging unit and the exposure by the second imaging unit may be sequentially performed.
- Head unit 42 Mounting head (working head) 81 Illumination unit 82 First imaging unit (multiple imaging units) 82a 1st camera 83 2nd imaging unit (multiple imaging units) 83a 2nd camera 100, 200 Parts mounting equipment (board work equipment) 382 Common camera 383 Optical system B component (target for imaging) D1 1st depth of field D2 2nd depth of field H Displacement amount H3 Height position L Length P2 Adsorption position (imaging position) P3 mounting position (imaging position) S board ⁇ t 2nd tilt angle ⁇ u 1st tilt angle
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Abstract
Description
図1~図6を参照して、本発明の第1実施形態による部品実装装置100の構成について説明する。なお、部品実装装置100は、請求の範囲の「基板作業装置」の一例である。
図2および図3に示すように、撮像ユニット8は、ヘッドユニット4に設けられている。これにより、撮像ユニット8は、ヘッドユニット4が水平方向(XY方向)に移動することにより、ヘッドユニット4とともに、XY方向に移動するように構成されている。撮像ユニット8は、実装ヘッド42のZ方向の移動に干渉しないように、実装ヘッド42に対して水平方向(特にY方向)にオフセットされて配置されている。
図1に示すように、制御部9は、CPU(Central Processing Unit)と、記憶部とを有している。記憶部は、ROM(Read Only Memory)およびRAM(Random Access Memory)などのメモリを有する記憶装置である。記憶部には、基板Sに部品Bを実装するための部品実装プログラムが記憶されている。
第1実施形態では、以下のような効果を得ることができる。
図7および図8を参照して、第2実施形態による部品実装装置200の構成について説明する。第2実施形態では、第1実施形態とは異なり、制御部209により、第1撮像部82により撮像された画像の明るさと、第2撮像部83により撮像された画像の明るさとが、揃えられる。なお、第2実施形態では、第1実施形態と同じ構成については、説明を省略する。
第2実施形態では、上記第1実施形態と同様に、第1撮像部82および第2撮像部83(複数の撮像部)において、各々の高さ位置から部品Bに向かう各々の光軸の第1傾斜角θuおよび第1傾斜角θuに応じて異なる被写界深度を設定する。これにより、鉛直方向において複数の異なる高さ位置に配置された第1撮像部82および第2撮像部83(複数の撮像部)の各々により斜め方向から撮像される画像のピント(焦点)がより確実に合うようにすることができる。
なお、今回開示された第1および第2実施形態は、すべての点で例示であって制限的なものではないと考えられるべきである。本発明の範囲は、上記した第1および第2実施形態の説明ではなく請求の範囲によって示され、さらに請求の範囲と均等の意味および範囲内でのすべての変更(変形例)が含まれる。
42 実装ヘッド(作業ヘッド)
81 照明部
82 第1撮像部(複数の撮像部)
82a 第1カメラ
83 第2撮像部(複数の撮像部)
83a 第2カメラ
100、200 部品実装装置(基板作業装置)
382 共通のカメラ
383 光学系
B 部品(撮像対象)
D1 第1被写界深度
D2 第2被写界深度
H ずれ量
H3 高さ位置
L 長さ
P2 吸着位置(撮像位置)
P3 実装位置(撮像位置)
S 基板
θt 第2傾斜角
θu 第1傾斜角
Claims (10)
- 基板に対して作業を行う作業ヘッドを含むヘッドユニットと、
鉛直方向において複数の異なる高さ位置に配置された状態で前記ヘッドユニットに設けられ、撮像対象が配置された同一の撮像位置を各々が互いに異なる斜め方向から撮像する複数の撮像部とを備え、
前記複数の撮像部では、各々の撮像する斜め方向の傾斜角に応じて異なる被写界深度が設定されている、基板作業装置。 - 前記複数の撮像部は、
傾斜角のうち鉛直方向に近い斜め方向の第1傾斜角を有する第1撮像部と、
前記第1撮像部の下側に配置されており、前記第1傾斜角よりも水平方向に近い斜め方向の第2傾斜角を有する第2撮像部とを含み、
前記第2撮像部は、前記第1撮像部の第1被写界深度よりも深い第2被写界深度を有している、請求項1に記載の基板作業装置。 - 前記第1撮像部および前記第2撮像部は、鉛直方向に沿った同一平面において上下に並んで斜め方向から前記撮像対象が配置された同一の前記撮像位置を撮像するように配置されており、
前記第2撮像部は、前記第1撮像部の鉛直方向の下方に配置されているとともに、前記第1被写界深度よりも深い前記第2被写界深度を有している、請求項2に記載の基板作業装置。 - 前記第1被写界深度は、前記第1撮像部の絞りが一定に設定されることにより、一定の被写界深度に設定されており、
前記第2被写界深度は、前記第2撮像部の絞りが一定に設定されることにより、前記第1被写界深度よりも深い一定の被写界深度に設定されている、請求項2または3に記載の基板作業装置。 - 前記第1撮像部および前記第2撮像部の各々は、前記撮像対象としての部品の実装位置周辺および前記部品の吸着位置周辺の少なくとも一方を撮像するように構成されており、
前記第1被写界深度および前記第2被写界深度の各々は、前記第1撮像部および前記第2撮像部の並ぶ方向に沿った断面において、前記基板の反りによる前記基板の上面の高さ位置の想定されるずれ量または前記部品を収納する収納テープの種類の違いによる前記収納テープに収納された前記部品の上面の高さ位置の想定されるずれ量と、前記部品の水平方向の長さと、前記傾斜角とにより、設定されている、請求項2~4のいずれか1項に記載の基板作業装置。 - 前記撮像対象に光を照射する照明部と、
前記第1撮像部および前記第2撮像部の各々により、前記撮像対象を撮像する制御を行う制御部とをさらに備え、
前記制御部は、前記第1撮像部および前記第2撮像部の各々に対するセンサゲイン、前記第1撮像部および前記第2撮像部の各々の露光時間、および、前記照明部の光量のいずれかを異ならせることにより、前記第1撮像部および前記第2撮像部の各々により撮像された画像の明るさを互いに略同じにする制御を行うように構成されている、請求項2~5のいずれか1項に記載の基板作業装置。 - 前記制御部は、前記第1撮像部による露光と並行して、前記第2撮像部による露光も行うように構成されている、請求項6に記載の基板作業装置。
- 前記第1撮像部および前記第2撮像部は、それぞれ、第1カメラおよび第2カメラを含む、請求項2~7のいずれか1項に記載の基板作業装置。
- 前記第1撮像部および前記第2撮像部は、
共通のカメラと、
前記共通のカメラの視野を分割する光学系とに含む、請求項2~7のいずれか1項に記載の基板作業装置。 - 前記第1撮像部により撮像された第1画像と、前記第2撮像部により撮像された第2画像とに基づいて、前記撮像対象の周辺の高さ位置を取得するように構成されている、請求項2~9のいずれか1項に記載の基板作業装置。
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| DE112020007435.8T DE112020007435T5 (de) | 2020-10-05 | 2020-10-05 | Leiterplattenarbeitsvorrichtung |
| PCT/JP2020/037777 WO2022074720A1 (ja) | 2020-10-05 | 2020-10-05 | 基板作業装置 |
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| WO2013128705A1 (ja) * | 2012-03-02 | 2013-09-06 | Wit株式会社 | 外観検査装置及び外観検査方法 |
| WO2014167248A1 (fr) * | 2013-04-11 | 2014-10-16 | Vit | Systeme et procede d'inspection optique de circuits electroniques |
| WO2019064413A1 (ja) * | 2017-09-28 | 2019-04-04 | ヤマハ発動機株式会社 | 部品実装装置 |
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| JP3269080B2 (ja) * | 1989-01-17 | 2002-03-25 | 松下電器産業株式会社 | 部品認識装置、部品装着機、面発光装置及び部品認識方法 |
| JP2005207808A (ja) * | 2004-01-21 | 2005-08-04 | Nidec Copal Corp | 欠陥検査装置及び欠陥検査方法 |
| JP5427222B2 (ja) | 2011-10-27 | 2014-02-26 | Wit株式会社 | 外観検査装置 |
| JP2015002241A (ja) | 2013-06-14 | 2015-01-05 | 日置電機株式会社 | 基板撮像装置、及び基板撮像方法 |
| JP6871930B2 (ja) * | 2016-08-24 | 2021-05-19 | 株式会社Fuji | 実装装置 |
| JP7158809B2 (ja) * | 2017-09-29 | 2022-10-24 | ダイハツ工業株式会社 | 車両用制御装置 |
| JP6912993B2 (ja) | 2017-10-17 | 2021-08-04 | ヤマハ発動機株式会社 | 部品実装装置 |
| JP2019089180A (ja) * | 2017-11-16 | 2019-06-13 | セイコーエプソン株式会社 | ロボット及びロボットシステム |
| CN108989671A (zh) * | 2018-07-25 | 2018-12-11 | Oppo广东移动通信有限公司 | 图像处理方法、装置和电子设备 |
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| WO2014167248A1 (fr) * | 2013-04-11 | 2014-10-16 | Vit | Systeme et procede d'inspection optique de circuits electroniques |
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