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WO2020017007A1 - Display device and manufacturing method therefor - Google Patents

Display device and manufacturing method therefor Download PDF

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Publication number
WO2020017007A1
WO2020017007A1 PCT/JP2018/027174 JP2018027174W WO2020017007A1 WO 2020017007 A1 WO2020017007 A1 WO 2020017007A1 JP 2018027174 W JP2018027174 W JP 2018027174W WO 2020017007 A1 WO2020017007 A1 WO 2020017007A1
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WO
WIPO (PCT)
Prior art keywords
frame
layer
display device
film
flattening film
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
PCT/JP2018/027174
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French (fr)
Japanese (ja)
Inventor
貴翁 斉藤
昌彦 三輪
庸輔 神崎
屹 孫
雅貴 山中
誠二 金子
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Sharp Corp
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Sharp Corp
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Filing date
Publication date
Application filed by Sharp Corp filed Critical Sharp Corp
Priority to PCT/JP2018/027174 priority Critical patent/WO2020017007A1/en
Publication of WO2020017007A1 publication Critical patent/WO2020017007A1/en
Anticipated expiration legal-status Critical
Ceased legal-status Critical Current

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    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10KORGANIC ELECTRIC SOLID-STATE DEVICES
    • H10K59/00Integrated devices, or assemblies of multiple devices, comprising at least one organic light-emitting element covered by group H10K50/00
    • H10K59/80Constructional details
    • H10K59/805Electrodes
    • H10K59/8052Cathodes
    • H10K59/80521Cathodes characterised by their shape
    • GPHYSICS
    • G09EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09FDISPLAYING; ADVERTISING; SIGNS; LABELS OR NAME-PLATES; SEALS
    • G09F9/00Indicating arrangements for variable information in which the information is built-up on a support by selection or combination of individual elements
    • GPHYSICS
    • G09EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09FDISPLAYING; ADVERTISING; SIGNS; LABELS OR NAME-PLATES; SEALS
    • G09F9/00Indicating arrangements for variable information in which the information is built-up on a support by selection or combination of individual elements
    • G09F9/30Indicating arrangements for variable information in which the information is built-up on a support by selection or combination of individual elements in which the desired character or characters are formed by combining individual elements
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05BELECTRIC HEATING; ELECTRIC LIGHT SOURCES NOT OTHERWISE PROVIDED FOR; CIRCUIT ARRANGEMENTS FOR ELECTRIC LIGHT SOURCES, IN GENERAL
    • H05B33/00Electroluminescent light sources
    • H05B33/02Details
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05BELECTRIC HEATING; ELECTRIC LIGHT SOURCES NOT OTHERWISE PROVIDED FOR; CIRCUIT ARRANGEMENTS FOR ELECTRIC LIGHT SOURCES, IN GENERAL
    • H05B33/00Electroluminescent light sources
    • H05B33/02Details
    • H05B33/06Electrode terminals
    • HELECTRICITY
    • H05ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
    • H05BELECTRIC HEATING; ELECTRIC LIGHT SOURCES NOT OTHERWISE PROVIDED FOR; CIRCUIT ARRANGEMENTS FOR ELECTRIC LIGHT SOURCES, IN GENERAL
    • H05B33/00Electroluminescent light sources
    • H05B33/10Apparatus or processes specially adapted to the manufacture of electroluminescent light sources
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10KORGANIC ELECTRIC SOLID-STATE DEVICES
    • H10K59/00Integrated devices, or assemblies of multiple devices, comprising at least one organic light-emitting element covered by group H10K50/00
    • H10K59/10OLED displays
    • H10K59/12Active-matrix OLED [AMOLED] displays
    • H10K59/124Insulating layers formed between TFT elements and OLED elements
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10KORGANIC ELECTRIC SOLID-STATE DEVICES
    • H10K59/00Integrated devices, or assemblies of multiple devices, comprising at least one organic light-emitting element covered by group H10K50/00
    • H10K59/80Constructional details
    • H10K59/805Electrodes
    • H10K59/8051Anodes
    • H10K59/80518Reflective anodes, e.g. ITO combined with thick metallic layers
    • HELECTRICITY
    • H10SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
    • H10KORGANIC ELECTRIC SOLID-STATE DEVICES
    • H10K59/00Integrated devices, or assemblies of multiple devices, comprising at least one organic light-emitting element covered by group H10K50/00
    • H10K59/80Constructional details
    • H10K59/805Electrodes
    • H10K59/8052Cathodes
    • H10K59/80524Transparent cathodes, e.g. comprising thin metal layers

Definitions

  • the present invention relates to a display device and a method for manufacturing the same.
  • organic EL display devices using organic EL (electroluminescence) elements have attracted attention as display devices replacing liquid crystal display devices.
  • organic EL display device a flexible organic EL display device in which an organic EL element or the like is formed on a flexible resin substrate has been proposed.
  • a rectangular display region for displaying an image and a frame region around the display region are provided, and it is desired to reduce the frame region.
  • a method of reducing the frame area by bending the frame area on the terminal side has been proposed.
  • the flattening film is also etched.
  • gas eg, chlorine gas
  • the present invention has been made in view of the above-described problem, and has as its object to provide a display device capable of preventing generation of gas due to etching of a flattening film.
  • a display device includes a resin substrate, a TFT layer having a flattening film provided on the resin substrate, and a light emitting device which is provided through the TFT layer and forms a display region.
  • An element a frame region provided around the display region, a terminal portion provided at an end of the frame region, a bent portion provided between the display region and the terminal portion, and a resin provided in the frame region.
  • a display device comprising: at least one layer of an inorganic insulating film constituting said TFT layer laminated on a substrate, wherein said TFT layer has a metal layer, and at least one layer of said inorganic insulating film is formed at a bent portion.
  • An opening is formed in the opening, a frame flattening film is provided in the opening, and a plurality of frame wirings made of the same metal material as the metal layer are provided on the frame flattening film. Electrically connected to the wiring in the forehead Flattening film is provided in an island shape for each of a plurality of frame lines, characterized in that the frame lines cover the entire surface and the side surface of the frame planarization film.
  • the present invention it is possible to prevent the frame flattening film from being etched when forming the frame wiring by dry etching in the bent portion. Therefore, generation of gas (eg, chlorine gas) due to etching of the frame flattening film can be prevented.
  • gas eg, chlorine gas
  • FIG. 2 is a plan view of the organic EL display device according to the first embodiment.
  • FIG. 2 is a plan view of a display area of the organic EL display device according to the first embodiment.
  • FIG. 2 is an equivalent circuit diagram illustrating a TFT layer included in the organic EL display device according to the first embodiment.
  • FIG. 2 is a sectional view of a display area of the organic EL display device according to the first embodiment.
  • FIG. 2 is a cross-sectional view illustrating an organic EL layer included in the organic EL display device according to the first embodiment.
  • FIG. 2 is a plan view of a bent portion of the organic EL display device according to the first embodiment.
  • FIG. 7 is a cross-sectional view of a bent portion of the organic EL display device according to the first embodiment, and is a cross-sectional view taken along line AA of FIG.
  • FIG. 7 is a sectional view of a bent portion of the organic EL display device according to the first embodiment, and is a sectional view taken along line BB of FIG.
  • FIG. 1 is a plan view of the organic EL display device 50a of the present embodiment.
  • FIG. 2 is a plan view of a display area D of the organic EL display device 50a.
  • FIG. 3 is an equivalent circuit diagram showing the TFT layer 20a constituting the organic EL display device 50a.
  • FIG. 4 is a sectional view of a display area D of the organic EL display device 50a.
  • FIG. 5 is a sectional view showing the organic EL layer 23 constituting the organic EL display device 50a.
  • the organic EL display device 50a includes a display area D for displaying an image defined in a rectangular shape, and a frame area F defined around the display area D.
  • the organic EL elements 30 are provided, and a plurality of pixels are arranged in a matrix.
  • a terminal portion T is provided at the right end of the frame region F in the drawing as shown in FIG.
  • a bent part G that is bent at 180 ° (in a U-shape) with the vertical direction in the figure as a bending axis is provided.
  • the display area D is provided along one side (the right side in the figure).
  • the display area D of the organic EL display device 50a As shown in FIG. 2, a plurality of sub-pixels P are arranged in a matrix. Further, as shown in FIG. 2, the display area D of the organic EL display device 50a includes a sub-pixel P having a red light-emitting area Lr for displaying red and a green light-emitting area Lg for displaying green. A sub-pixel P and a sub-pixel P having a blue light emitting region Lb for performing blue display are provided adjacent to each other.
  • one pixel is constituted by three adjacent sub-pixels P having a red light emitting region Lr, a green light emitting region Lg, and a blue light emitting region Lb.
  • the organic EL display device 50a includes a resin substrate layer 10 and an organic EL element 30 forming a display region D provided on the resin substrate layer 10 with a TFT (thin film transistor) layer 20a interposed therebetween.
  • TFT thin film transistor
  • the resin substrate layer 10 is made of, for example, a polyimide resin and provided as a resin substrate.
  • the TFT layer 20a includes a base coat film 11 provided on the resin substrate layer 10, a plurality of first TFTs 9a, a plurality of second TFTs 9b, and a plurality of capacitors 9c provided on the base coat film 11. It has a flattening film 19a provided on each first TFT 9a, each second TFT 9b, and each capacitor 9c.
  • a plurality of gate lines 14 are provided as the first metal layer so as to extend in the horizontal direction in the figure in parallel with each other.
  • a plurality of source lines 18f are provided as a second metal layer so as to extend in parallel with each other in the vertical direction in the drawing.
  • a plurality of power supply lines 18g are provided as second metal layers so as to extend in parallel with each other in the vertical direction in the drawing, adjacent to each source line 18f. ing.
  • a first TFT 9a, a second TFT 9b, and a capacitor 9c are provided in each sub-pixel P.
  • the second metal layer has a three-layer structure of, for example, titanium / aluminum / titanium, and can reduce the resistance of the source wiring 18f and the like. Further, the second metal layer is an example of the metal layer in the claims.
  • the base coat film 11 is composed of, for example, a single-layer film or a laminated film of an inorganic insulating film such as silicon nitride, silicon oxide, or silicon oxynitride.
  • the first TFT 9a is connected to the corresponding gate line 14 and source line 18f in each sub-pixel P, as shown in FIG.
  • the first TFT 9a includes a semiconductor layer 12a provided in an island shape on the base coat film 11, a gate insulating film 13 provided to cover the semiconductor layer 12a, and a gate insulating film 13
  • a gate electrode 14a provided thereon so as to overlap a part of the semiconductor layer 12a; a first interlayer insulating film 15 and a second interlayer insulating film 17 provided in order to cover the gate electrode 14a;
  • a source electrode 18a and a drain electrode 18b are provided on the film 17 and are spaced apart from each other.
  • the gate insulating film 13, the first interlayer insulating film 15, and the second interlayer insulating film 17 are each formed of a single-layer film or a stacked film of an inorganic insulating film such as silicon nitride, silicon oxide, or silicon oxynitride. .
  • the second TFT 9b is connected to the corresponding first TFT 9a and the power supply line 18g in each sub-pixel P, as shown in FIG.
  • the second TFT 9b includes a semiconductor layer 12b provided in an island shape on the base coat film 11, a gate insulating film 13 provided to cover the semiconductor layer 12b, and a gate insulating film 13
  • a gate electrode 14b provided overlying a part of the semiconductor layer 12b thereon; a first interlayer insulating film 15 and a second interlayer insulating film 17 provided in order to cover the gate electrode 14b;
  • a source electrode 18c and a drain electrode 18d are provided on the film 17 and are spaced apart from each other.
  • first gate 9a and the second TFT 9b of the top gate type are illustrated, but the first TFT 9a and the second TFT 9b may be a bottom gate type TFT.
  • the capacitor 9c is connected to the corresponding first TFT 9a and power supply line 18g in each sub-pixel P, as shown in FIG.
  • the capacitor 9c includes a lower conductive layer 14c formed in the same layer with the same material as the gate electrode, and a first interlayer insulating film 15 provided so as to cover the lower conductive layer 14c. And an upper conductive layer 16 provided on the first interlayer insulating film 15 so as to overlap the lower conductive layer 14c.
  • the flattening film 19a is formed of an inexpensive organic resin material such as an acrylic resin or an epoxy resin. Note that the flattening film 19a may be formed of a polyimide resin.
  • the organic EL element 30 includes a plurality of first electrodes (reflection electrodes) 21 sequentially provided on the planarization film 19a and a plurality of second electrodes (faces) opposed to the first electrodes 21.
  • An electrode (transparent electrode) 24, a plurality of organic EL layers 23 provided between the first electrode 21 and the second electrode 24, and a plurality of edge covers 22 are provided.
  • the plurality of first electrodes 21 function as reflection electrodes that reflect light emitted from the organic EL layer (light-emitting layer), and as shown in FIG.
  • the reflective electrodes 19a are provided in a matrix on the reflective electrodes 19a.
  • the first electrode 21 is connected to the drain electrode 18d of each second TFT 9b via a contact hole formed in the flattening film 19a.
  • the first electrode 21 has a function of injecting holes (holes) into the organic EL layer 23.
  • the first electrode 21 is more preferably formed of a material having a large work function in order to improve the efficiency of hole injection into the organic EL layer 23.
  • the first electrode 21 for example, silver (Ag), aluminum (Al), vanadium (V), cobalt (Co), nickel (Ni), tungsten (W), gold (Au) , Calcium (Ca), titanium (Ti), yttrium (Y), sodium (Na), ruthenium (Ru), manganese (Mn), indium (In), magnesium (Mg), lithium (Li), ytterbium (Yb) And a metal material such as lithium fluoride (LiF).
  • the material forming the first electrode 21 is, for example, magnesium (Mg) / copper (Cu), magnesium (Mg) / silver (Ag), sodium (Na) / potassium (K), astatine (At) / oxidation Such as astatine (AtO 2 ), lithium (Li) / aluminum (Al), lithium (Li) / calcium (Ca) / aluminum (Al), or lithium fluoride (LiF) / calcium (Ca) / aluminum (Al) It may be an alloy. Further, the material forming the first electrode 21 is, for example, a conductive oxide such as tin oxide (SnO), zinc oxide (ZnO), indium tin oxide (ITO), and indium zinc oxide (IZO). There may be. Further, the first electrode 21 may be formed by stacking a plurality of layers made of the above materials. Note that examples of the material having a large work function include indium tin oxide (ITO) and indium zinc oxide (IZO).
  • the edge cover 22 is provided in a grid pattern on the TFT layer 20a so as to cover the periphery of each first electrode 21, as shown in FIG.
  • the edge cover 22 is provided between the light emitting areas Lr, Lg, Lb and functions as a partition for partitioning the light emitting areas Lr, Lg, Lb.
  • an organic resin material such as a polyimide resin and an SOG (spin-on glass) resin can be cited.
  • each of the organic EL layers 23 has a hole injection layer 1, a hole transport layer 2, a light emitting layer 3, an electron transport layer 4, and an electron injection layer provided on the first electrode 21 in order. It has a layer 5.
  • the hole injection layer 1 is also called an anode buffer layer, and has a function of making the energy levels of the first electrode 21 and the organic EL layer 23 close to each other and improving the efficiency of hole injection from the first electrode 21 to the organic EL layer 23.
  • a material constituting the hole injection layer for example, a triazole derivative, an oxadiazole derivative, an imidazole derivative, a polyarylalkane derivative, a pyrazoline derivative, a phenylenediamine derivative, an oxazole derivative, a styrylanthracene derivative, a fluorenone derivative, Hydrazone derivatives, stilbene derivatives and the like can be mentioned.
  • the hole transport layer 2 has a function of improving the efficiency of transporting holes from the first electrode 21 to the organic EL layer 23.
  • the material constituting the hole transport layer 2 include porphyrin derivatives, aromatic tertiary amine compounds, styrylamine derivatives, polyvinylcarbazole, poly-p-phenylenevinylene, polysilane, triazole derivatives, oxadiazole Derivatives, imidazole derivatives, polyarylalkane derivatives, pyrazoline derivatives, pyrazolone derivatives, phenylenediamine derivatives, arylamine derivatives, amine-substituted chalcone derivatives, oxazole derivatives, styrylanthracene derivatives, fluorenone derivatives, hydrazone derivatives, stilbene derivatives, hydrogenated amorphous silicon, Examples include hydrogenated amorphous silicon carbide, zinc sulfide, and zinc selenide.
  • the light emitting layer 3 when a voltage is applied by the first electrode 21 and the second electrode 24, holes and electrons are injected from the first electrode 21 and the second electrode 24, respectively, and the holes and electrons recombine. Area.
  • the light emitting layer 3 is formed of a material having high luminous efficiency. Examples of the material constituting the light emitting layer 3 include a metal oxinoid compound [8-hydroxyquinoline metal complex], a naphthalene derivative, an anthracene derivative, a diphenylethylene derivative, a vinylacetone derivative, a triphenylamine derivative, a butadiene derivative, and a coumarin derivative.
  • the electron transport layer 4 has a function of efficiently moving electrons to the light emitting layer 3.
  • a material constituting the electron transport layer 4 for example, as an organic compound, an oxadiazole derivative, a triazole derivative, a benzoquinone derivative, a naphthoquinone derivative, an anthraquinone derivative, a tetracyanoanthraquinodimethane derivative, a diphenoquinone derivative, or a fluorenone derivative , Silole derivatives, metal oxinoid compounds and the like.
  • the electron injection layer 5 has a function of making the energy levels of the second electrode 24 and the organic EL layer 23 close to each other and improving the efficiency of injecting electrons from the second electrode 24 into the organic EL layer 23.
  • the drive voltage of the organic EL element 30 can be reduced.
  • the electron injection layer 5 is also called a cathode buffer layer.
  • a material constituting the electron injection layer 5 for example, lithium fluoride (LiF), magnesium fluoride (MgF 2 ), calcium fluoride (CaF 2 ), strontium fluoride (SrF 2 ), barium fluoride Examples thereof include an inorganic alkali compound such as (BaF 2 ), aluminum oxide (Al 2 O 3 ), and strontium oxide (SrO).
  • the second electrode 24 is provided so as to cover each of the organic EL layers 23 and the edge cover 22, as shown in FIG.
  • the second electrode 24 has a function of injecting electrons into the organic EL layer 23.
  • the second electrode 24 is more preferably made of a material having a small work function in order to improve the efficiency of electron injection into the organic EL layer 23.
  • the second electrode 24 for example, silver (Ag), aluminum (Al), vanadium (V), cobalt (Co), nickel (Ni), tungsten (W), gold (Au) , Calcium (Ca), titanium (Ti), yttrium (Y), sodium (Na), ruthenium (Ru), manganese (Mn), indium (In), magnesium (Mg), lithium (Li), ytterbium (Yb) , Lithium fluoride (LiF) and the like.
  • the second electrode 24 is made of, for example, magnesium (Mg) / copper (Cu), magnesium (Mg) / silver (Ag), sodium (Na) / potassium (K), astatine (At) / astatin oxide (AtO 2). ), Lithium (Li) / aluminum (Al), lithium (Li) / calcium (Ca) / aluminum (Al), and lithium fluoride (LiF) / calcium (Ca) / aluminum (Al). You may.
  • the second electrode 24 may be formed of a conductive oxide such as tin oxide (SnO), zinc oxide (ZnO), indium tin oxide (ITO), and indium zinc oxide (IZO), for example. .
  • the second electrode 24 may be formed by stacking a plurality of layers made of the above materials.
  • the material having a small work function include magnesium (Mg), lithium (Li), lithium fluoride (LiF), magnesium (Mg) / copper (Cu), magnesium (Mg) / silver (Ag), and sodium (Mg).
  • (Na) / potassium (K) lithium (Li) / aluminum (Al), lithium (Li) / calcium (Ca) / aluminum (Al), lithium fluoride (LiF) / calcium (Ca) / aluminum (Al) And the like.
  • the organic EL display device 50a includes a sealing film 28 that covers the organic EL element 30.
  • the sealing film 28 is provided to cover the second electrode 24, a first inorganic film 25, an organic film 26 provided to cover the first inorganic film 25, and provided to cover the organic film 26. And a function of protecting the organic EL layer 23 from moisture and oxygen.
  • the first inorganic film 25 and the second inorganic film 27 are made of, for example, silicon nitride (SiNx (x) such as silicon oxide (SiO 2 ), aluminum oxide (Al 2 O 3 ), and trisilicon tetranitride (Si 3 N 4 ). Is a positive number)) and an inorganic material such as silicon carbonitride (SiCN).
  • the organic film 26 is made of, for example, an organic material such as acrylate, polyurea, parylene, polyimide, and polyamide.
  • the first TFT 9a is turned on by inputting a gate signal to the first TFT 9a via the gate line 14, and the gate electrode of the second TFT 9b is connected via the source line 18f.
  • a predetermined voltage corresponding to the source signal is written to 14b and the capacitor 9c, the magnitude of the current from the power supply line 18g is defined based on the gate voltage of the second TFT 9b, and the defined current is supplied to the organic EL layer 23.
  • the light-emitting layer 3 of the organic EL layer 23 emits light to display an image.
  • the gate voltage of the second TFT 9b is held by the capacitor 9c, so that the light emitting layer 3 emits light until the gate signal of the next frame is input. Will be maintained.
  • the organic EL display device 50a of the present embodiment is formed, for example, by forming a TFT layer 20a and an organic EL element 30 on the surface of a resin substrate layer 10 formed on a glass substrate by using a known method. It can be manufactured by peeling.
  • FIG. 6 is a plan view of a bent portion G of the organic EL display device 50a according to the present embodiment
  • FIG. 7 is a sectional view taken along line AA of FIG.
  • FIG. 8 is a sectional view taken along line BB of FIG.
  • the organic EL display device 50a includes a resin substrate layer 10, an inorganic laminated film 36 and a frame flattening film 37 provided on the surface of the resin substrate layer 10 in the bending region E.
  • a plurality of frame wirings are provided on the surface of the frame flattening film 37 to connect the gate conductive layers 43a and 43b, and a surface protection layer 39 provided so as to cover the frame wirings.
  • the gate conductive layer 43a is electrically connected to a signal wiring (a wiring in the display area D such as the gate wiring 14, the source wiring 18f, and the power supply line 18g) provided in the TFT layer 20a in the display area D. It is provided to extend to the side.
  • the gate conductive layer 43b is provided so as to extend to the terminal portion T.
  • the frame flattening film 37 is formed in the same layer and the same material as the flattening film 19a. As shown in FIG. 7, the frame flattening film 37 is provided so as to straddle the opening S.
  • the plurality of frame wirings 38 are electrically connected to signal wirings in the display area D, and are provided on the frame flattening film 37 so as to cross the opening S, as shown in FIGS.
  • the surface protection layer 39 is configured to cover the frame wiring 38. Therefore, the frame wiring 38 is protected by the surface protection layer 39.
  • the frame wiring 38 is formed of the same material as the source wiring 18f (width: 3 to 10 ⁇ m), which is the above-described metal layer, and the center-to-center distance (pitch) P shown in FIG. 6 is set to 10 to 20 ⁇ m. Have been.
  • the surface protection layer 39 is formed of the same material as the edge cover 22 described above, and has a configuration in which the surface protection layer 39 is formed in the same layer as the edge cover 22.
  • the opening S is open from one end to the other end of the frame region F along the bent portion G, and as shown in FIGS. 37 is provided in a band shape so as to cover the opening S and the end of the inorganic laminated film 36 on the opening S side, and is formed of, for example, an organic resin material such as a polyimide resin.
  • the surface protective layer 39 is provided in a band shape with the frame wiring 38 interposed therebetween so as to cover the edge of the band-shaped frame flattening film 37.
  • the inorganic laminated film 36 is at least one layer of an inorganic insulating film constituting the TFT layer 20a, and as shown in FIG. 7, the base coat film 11, the gate insulating film 13, and the base coat film 11 sequentially laminated on the resin substrate layer 10.
  • An interlayer insulating film 40 including a first interlayer insulating film 15 and a second interlayer insulating film 17 is provided.
  • the inorganic laminated film 36 is also provided in the frame region F.
  • gate conductive layers 43a and 43b are provided.
  • the base coat film 11, the gate insulating film 13, and the interlayer insulating film 40 of the inorganic laminated film 36 are not provided, and an opening S is formed in the inorganic laminated film 36.
  • the opening S is covered with a frame flattening film 37.
  • the frame can be bent at an angle of 180 ° at the maximum.
  • the frame flattening film 37 is provided in the form of an island for each of the plurality of frame wirings 38, and the frame wiring 38 is formed on the surface of the frame flattening film 37. It is configured to cover the entire side surface.
  • the frame flattening film 37 is etched. Can be prevented. As a result, generation of gas (eg, chlorine gas) due to etching of the frame flattening film 37 can be prevented, and contamination in the chamber can be prevented.
  • gas eg, chlorine gas
  • the surface protection layer 39 is filled in the opening S, and the surface protection layer 39 covers the plurality of frame wirings 38.
  • the TFT layer 20a (the base coat film 11, the first TFT 9a, the second TFT 9b, the capacitor 9c, the first TFT 9a, and the flattening film 19a) is formed on the surface of the resin substrate layer 10 made of a polyimide resin using a known method. I do.
  • the inorganic laminated film 36 (the base coat film 11, the gate insulating film 13, and the interlayer insulating film 40) is formed on the surface of the resin substrate layer 10; An opening S that exposes the upper surface of the resin substrate layer 10 through the inorganic insulating film 36 is formed in the insulating film 36 by dry etching.
  • a plurality of frame flattening films 37 are formed in the opening S in an island shape (strip shape).
  • a photosensitive acrylic resin is applied on the base substrate 10 by a spin coating method, and a predetermined exposure amount (for example, 150 mJ / cm 2) is used using an exposure mask having a predetermined exposure pattern. ), And development is performed using an alkali developing solution, thereby forming a flattening film 19a having a thickness of 1 to 1.5 ⁇ m, for example. After the development, post-baking is performed under predetermined conditions (for example, at 220 ° C. for 60 minutes).
  • the organic EL element 30 (the first electrode 21, the edge cover 22, the organic EL layer 23 (the hole injection layer 1, the hole transport layer 2, the light emitting layer) is formed on the surface of the TFT layer 20a using a known method. 3, an electron transport layer 4, an electron injection layer 5), and a second electrode 24) are formed.
  • a metal layer is formed on the resin substrate layer 10 so as to cover the entire surface and side surfaces of the frame flattening film 37, and then the metal layer is patterned by dry etching. As shown in FIG. 8, a frame wiring 38 that covers the entire surface and side surfaces of the frame flattening film 37 is formed.
  • the frame flattening film 37 can be prevented from being etched, and the gas (for example, generation of chlorine gas) can be prevented.
  • a surface protection layer 39 that fills the opening S and covers the plurality of frame wirings 38 is formed.
  • the frame wiring 38 is formed so as to cover the frame flattening film 37 across the opening S.
  • an inorganic insulating film such as a silicon nitride film is formed to a thickness of about several tens nm to several ⁇ m by a plasma CVD (Chemical Vapor Deposition) method so as to cover the organic EL element 18. 25 are formed.
  • a plasma CVD Chemical Vapor Deposition
  • an organic resin material such as acrylate is discharged to a thickness of about several ⁇ m to several tens ⁇ m by an ink jet method on the entire surface of the substrate on which the first inorganic film 25 is formed, thereby forming the organic film 26.
  • an inorganic insulating film such as a silicon nitride film is formed to a thickness of about several tens nm to several ⁇ m by a plasma CVD method to form a second inorganic film 27.
  • a sealing film 28 including the first inorganic film 25, the organic film 26, and the second inorganic film 27 is formed.
  • the organic EL display device 50a of the present embodiment can be manufactured.
  • FIG. 9 and 10 are cross-sectional views of a bent portion of the organic EL display device according to the present embodiment. Note that the overall configuration of the organic EL display device is the same as that of the above-described first embodiment, and a detailed description thereof will be omitted here. The same components as those in the first embodiment are denoted by the same reference numerals, and description thereof is omitted.
  • the frame flattening film 37 is provided on the base coat film 11 in the bent portion G. Accordingly, disconnection of the source line 38 at the bent portion G can be prevented.
  • the base coat film 11 can be formed on the surface of the resin substrate layer 10 by, for example, forming a silicon oxide film, a silicon nitride film, or the like to a thickness of about 50 nm to 1000 nm by a CVD method. in is formed to a thickness T 1 of the base coat film 11 is smaller than the thickness T 2 of the base coat film 11 in the display region D (other than bent portion G) of the bent portion G.
  • the resin material forming the frame flattening film 37 is irradiated by performing exposure processing (halftone exposure processing) using a halftone mask as a photomask.
  • the exposure amount to be controlled may be controlled to form the frame flattening film 37 having a gentle cross-sectional shape (such as a substantially circular shape or a substantially elliptical shape).
  • the cross-sectional shape of the frame wiring covering the entire surface and side surfaces of the frame flattening film 37 has a substantially arc shape.
  • an organic EL layer having a five-layer structure of a hole injection layer, a hole transport layer, a light emitting layer, an electron transport layer, and an electron injection layer is exemplified.
  • a three-layer structure of a hole injection layer and a hole transport layer, a light emitting layer, and an electron transport layer and an electron injection layer may be employed.
  • the organic EL display device in which the first electrode is used as an anode and the second electrode is used as a cathode is exemplified.
  • the present invention inverts the stacked structure of the organic EL layer and uses the first electrode as a cathode. It can be applied to an organic EL display device using the second electrode as an anode.
  • the organic EL display device in which the electrode of the TFT connected to the first electrode is used as the source electrode is exemplified.
  • the electrode of the TFT connected to the first electrode is referred to as the drain electrode. It can also be applied to an organic EL display device called.
  • the organic EL display device is exemplified as the display device.
  • the present invention provides a display device including a plurality of light emitting elements driven by current, for example, a light emitting element using a quantum dot-containing layer.
  • the present invention can be applied to a display device having a QLED (Quantum-dot-light-emitting-diode).
  • the present invention is useful for a display device such as an organic EL display device.

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Abstract

In the present invention, an opening part (S) is formed in an inorganic laminated film (36) at a bent section (G) of an organic EL display device (50a), a frame flattening film (37) is disposed in the opening part (S), and multiple frame wiring lines (38) are disposed on the frame flattening film (37). The frame flattening film (37) is disposed in an island-like fashion for each set of the frame wiring lines (38), and the frame wiring lines (38) are formed so as to entirely cover the front face and side faces of the frame flattening film (37).

Description

表示装置およびその製造方法Display device and method of manufacturing the same

 本発明は、表示装置およびその製造方法に関するものである。 The present invention relates to a display device and a method for manufacturing the same.

 近年、液晶表示装置に代わる表示装置として、有機EL(electroluminescence)素子を用いた自発光型の有機EL表示装置が注目されている。この有機EL表示装置では、可撓性を有する樹脂基板上に有機EL素子等を形成したフレキシブルな有機EL表示装置が提案されている。 In recent years, self-luminous organic EL display devices using organic EL (electroluminescence) elements have attracted attention as display devices replacing liquid crystal display devices. As this organic EL display device, a flexible organic EL display device in which an organic EL element or the like is formed on a flexible resin substrate has been proposed.

 ここで、有機EL表示装置では、画像表示を行う矩形状の表示領域と、その表示領域の周囲に額縁領域とが設けられ、額縁領域を縮小させることが要望されているため、フレキシブルな有機EL表示装置では、例えば、端子側の額縁領域を折り曲げることにより、額縁領域を縮小させる方法が提案されている。 Here, in the organic EL display device, a rectangular display region for displaying an image and a frame region around the display region are provided, and it is desired to reduce the frame region. For the display device, for example, a method of reducing the frame area by bending the frame area on the terminal side has been proposed.

 例えば、端子側の額縁領域に設けられた折り曲げ部において、樹脂基板層と、樹脂基板層の表面に設けられた無機膜及び平坦化膜と、平坦化膜の表面に設けられた額縁配線とを備えたフレキシブルな有機EL表示装置が開示されている(例えば、特許文献1参照)。 For example, in the bent portion provided in the frame region on the terminal side, the resin substrate layer, the inorganic film and the flattening film provided on the surface of the resin substrate layer, and the frame wiring provided on the surface of the flattening film A flexible organic EL display device provided with the same is disclosed (for example, see Patent Document 1).

特開2011-8969号公報JP 2011-8969 A

 ここで、一般に、フレキシブルな有機EL表示装置では、上記折り曲げ部において、平坦化膜の表面上に、ドライエッチングにより額縁配線を形成する際に、平坦化膜もエッチングされてしまうため、当該平坦化膜のエッチングに起因してガス(例えば、塩素ガス)が発生するという問題があった。 Here, in general, in the flexible organic EL display device, when the frame wiring is formed on the surface of the flattening film by dry etching in the bent portion, the flattening film is also etched. There is a problem that gas (eg, chlorine gas) is generated due to etching of the film.

 そこで、本発明は、上述の問題に鑑みてなされたものであり、平坦化膜のエッチングに起因するガスの発生を防止することができる表示装置を提供することを目的とする。 Therefore, the present invention has been made in view of the above-described problem, and has as its object to provide a display device capable of preventing generation of gas due to etching of a flattening film.

 上記目的を達成するために、本発明に係る表示装置は、樹脂基板と、樹脂基板上に設けられた平坦化膜を有するTFT層と、TFT層を介して設けられ、表示領域を構成する発光素子と、表示領域の周囲に設けられた額縁領域と、額縁領域の端部に設けられた端子部と、表示領域及び端子部の間に設けられた折り曲げ部と、額縁領域に設けられ、樹脂基板上に積層された上記TFT層を構成する少なくとも1層の無機絶縁膜とを備えた表示装置であって、TFT層は、金属層を有し、折り曲げ部において、少なくとも1層の無機絶縁膜に開口部が形成され、開口部に額縁平坦化膜が設けられ、額縁平坦化膜上に、金属層と同一の金属材料により形成された複数の額縁配線が設けられ、額縁配線は、表示領域内の配線に電気的に接続され、額縁平坦化膜が、複数の額縁配線毎に島状に設けられるとともに、額縁配線が額縁平坦化膜の表面と側面の全面を覆うことを特徴とする。 In order to achieve the above object, a display device according to the present invention includes a resin substrate, a TFT layer having a flattening film provided on the resin substrate, and a light emitting device which is provided through the TFT layer and forms a display region. An element, a frame region provided around the display region, a terminal portion provided at an end of the frame region, a bent portion provided between the display region and the terminal portion, and a resin provided in the frame region. What is claimed is: 1. A display device comprising: at least one layer of an inorganic insulating film constituting said TFT layer laminated on a substrate, wherein said TFT layer has a metal layer, and at least one layer of said inorganic insulating film is formed at a bent portion. An opening is formed in the opening, a frame flattening film is provided in the opening, and a plurality of frame wirings made of the same metal material as the metal layer are provided on the frame flattening film. Electrically connected to the wiring in the forehead Flattening film is provided in an island shape for each of a plurality of frame lines, characterized in that the frame lines cover the entire surface and the side surface of the frame planarization film.

 本発明によれば、折り曲げ部において、ドライエッチングにより額縁配線を形成する際に、額縁平坦化膜がエッチングされることを防止することができる。従って、額縁平坦化膜のエッチングに起因するガス(例えば、塩素ガス)の発生を防止することができる。 According to the present invention, it is possible to prevent the frame flattening film from being etched when forming the frame wiring by dry etching in the bent portion. Therefore, generation of gas (eg, chlorine gas) due to etching of the frame flattening film can be prevented.

第1の実施形態に係る有機EL表示装置の平面図である。FIG. 2 is a plan view of the organic EL display device according to the first embodiment. 第1の実施形態に係る有機EL表示装置の表示領域の平面図である。FIG. 2 is a plan view of a display area of the organic EL display device according to the first embodiment. 第1の実施形態に係る有機EL表示装置を構成するTFT層を示す等価回路図である。FIG. 2 is an equivalent circuit diagram illustrating a TFT layer included in the organic EL display device according to the first embodiment. 第1の実施形態に係る有機EL表示装置の表示領域の断面図である。FIG. 2 is a sectional view of a display area of the organic EL display device according to the first embodiment. 第1の実施形態に係る有機EL表示装置を構成する有機EL層を示す断面図である。FIG. 2 is a cross-sectional view illustrating an organic EL layer included in the organic EL display device according to the first embodiment. 第1の実施形態に係る有機EL表示装置の折り曲げ部の平面図である。FIG. 2 is a plan view of a bent portion of the organic EL display device according to the first embodiment. 第1の実施形態に係る有機EL表示装置の折り曲げ部の断面図であり、図6のA-A断面図である。FIG. 7 is a cross-sectional view of a bent portion of the organic EL display device according to the first embodiment, and is a cross-sectional view taken along line AA of FIG. 第1の実施形態に係る有機EL表示装置の折り曲げ部の断面図であり、図6のB-B断面図である。FIG. 7 is a sectional view of a bent portion of the organic EL display device according to the first embodiment, and is a sectional view taken along line BB of FIG. 第2の実施形態に係る有機EL表示装置の折り曲げ部の断面図であり、図7に対応する断面図である。It is sectional drawing of the bending part of the organic EL display device which concerns on 2nd Embodiment, Comprising: It is sectional drawing corresponding to FIG. 第2の実施形態に係る有機EL表示装置の折り曲げ部の断面図であり、図8に対応する断面図である。It is sectional drawing of the bending part of the organic EL display device which concerns on 2nd Embodiment, Comprising: It is sectional drawing corresponding to FIG. 変形例に係る有機EL表示装置の折り曲げ部の断面図である。It is sectional drawing of the bending part of the organic EL display device concerning a modification. 変形例に係る有機EL表示装置の折り曲げ部の断面図である。It is sectional drawing of the bending part of the organic EL display device concerning a modification.

 以下、本発明の実施形態を図面に基づいて詳細に説明する。なお、本発明は、以下の各実施形態に限定されるものではない。 Hereinafter, embodiments of the present invention will be described in detail with reference to the drawings. Note that the present invention is not limited to the following embodiments.

 《第1の実施形態》
 図1~図5は、本発明に係る表示装置の第1の実施形態を示している。なお、以下の各実施形態では、発光素子を備えた表示装置として、有機EL素子を備えた有機EL表示装置を例示する。ここで、図1は、本実施形態の有機EL表示装置50aの平面図である。また、図2は、有機EL表示装置50aの表示領域Dの平面図である。また、図3は、有機EL表示装置50aを構成するTFT層20aを示す等価回路図である。また、図4は、有機EL表示装置50aの表示領域Dの断面図である。図5は、有機EL表示装置50aを構成する有機EL層23を示す断面図である。
<< 1st Embodiment >>
1 to 5 show a first embodiment of a display device according to the present invention. In the following embodiments, an organic EL display device having an organic EL element will be exemplified as a display device having a light emitting element. Here, FIG. 1 is a plan view of the organic EL display device 50a of the present embodiment. FIG. 2 is a plan view of a display area D of the organic EL display device 50a. FIG. 3 is an equivalent circuit diagram showing the TFT layer 20a constituting the organic EL display device 50a. FIG. 4 is a sectional view of a display area D of the organic EL display device 50a. FIG. 5 is a sectional view showing the organic EL layer 23 constituting the organic EL display device 50a.

 有機EL表示装置50aは、図1に示すように、矩形状に規定された画像表示を行う表示領域Dと、表示領域Dの周囲に規定された額縁領域Fとを備えている。 As shown in FIG. 1, the organic EL display device 50a includes a display area D for displaying an image defined in a rectangular shape, and a frame area F defined around the display area D.

 ここで、有機EL表示装置50aの表示領域Dには、図4に示すように、画素領域Aにおいて、有機EL素子30が設けられているとともに、複数の画素がマトリクス状に配列されている。また、額縁領域Fの図中右端部には、図1に示すように、端子部Tが設けられている。また、額縁領域Fにおいて、表示領域D及び端子部Tの間には、図1に示すように、図中縦方向を折り曲げの軸として180°に(U字状に)折り曲げられる折り曲げ部Gが表示領域Dの一辺(図中右辺)に沿うように設けられている。 Here, in the display area D of the organic EL display device 50a, as shown in FIG. 4, in the pixel area A, the organic EL elements 30 are provided, and a plurality of pixels are arranged in a matrix. A terminal portion T is provided at the right end of the frame region F in the drawing as shown in FIG. In the frame area F, between the display area D and the terminal part T, as shown in FIG. 1, a bent part G that is bent at 180 ° (in a U-shape) with the vertical direction in the figure as a bending axis is provided. The display area D is provided along one side (the right side in the figure).

 ここで、有機EL表示装置50aの表示領域Dには、図2に示すように、複数のサブ画素Pがマトリクス状に配置されている。また、有機EL表示装置50aの表示領域Dでは、図2に示すように、赤色の表示を行うための赤色発光領域Lrを有するサブ画素P、緑色の表示を行うための緑色発光領域Lgを有するサブ画素P、及び青色の表示を行うための青色発光領域Lbを有するサブ画素Pが互いに隣り合うように設けられている。 Here, in the display area D of the organic EL display device 50a, as shown in FIG. 2, a plurality of sub-pixels P are arranged in a matrix. Further, as shown in FIG. 2, the display area D of the organic EL display device 50a includes a sub-pixel P having a red light-emitting area Lr for displaying red and a green light-emitting area Lg for displaying green. A sub-pixel P and a sub-pixel P having a blue light emitting region Lb for performing blue display are provided adjacent to each other.

 なお、有機EL表示装置50aの表示領域Dでは、赤色発光領域Lr、緑色発光領域Lg及び青色発光領域Lbを有する隣り合う3つのサブ画素Pにより、1つの画素が構成されている。 In the display region D of the organic EL display device 50a, one pixel is constituted by three adjacent sub-pixels P having a red light emitting region Lr, a green light emitting region Lg, and a blue light emitting region Lb.

 有機EL表示装置50aは、図4に示すように、樹脂基板層10と、樹脂基板層10上にTFT(thin film transistor)層20aを介して設けられた表示領域Dを構成する有機EL素子30とを備えている。 As shown in FIG. 4, the organic EL display device 50a includes a resin substrate layer 10 and an organic EL element 30 forming a display region D provided on the resin substrate layer 10 with a TFT (thin film transistor) layer 20a interposed therebetween. And

 樹脂基板層10は、例えば、ポリイミド樹脂等により構成され、樹脂基板として設けられている。 (4) The resin substrate layer 10 is made of, for example, a polyimide resin and provided as a resin substrate.

 TFT層20aは、図4に示すように、樹脂基板層10上に設けられたベースコート膜11と、ベースコート膜11上に設けられた複数の第1TFT9a、複数の第2TFT9b及び複数のキャパシタ9cと、各第1TFT9a、各第2TFT9b及び各キャパシタ9c上に設けられた平坦化膜19aとを備えている。 As shown in FIG. 4, the TFT layer 20a includes a base coat film 11 provided on the resin substrate layer 10, a plurality of first TFTs 9a, a plurality of second TFTs 9b, and a plurality of capacitors 9c provided on the base coat film 11. It has a flattening film 19a provided on each first TFT 9a, each second TFT 9b, and each capacitor 9c.

 ここで、TFT層20aでは、図2及び図3に示すように、図中横方向に互いに平行に延びるように複数のゲート線14が第1金属層として設けられている。また、TFT層20aでは、図2及び図3に示すように、図中縦方向に互いに平行に延びるように複数のソース線18fが第2金属層として設けられている。また、TFT層20aでは、図2及び図3に示すように、各ソース線18fと隣り合って、図中縦方向に互いに平行に延びるように複数の電源線18gが第2金属層として設けられている。また、TFT層20aでは、図3に示すように、各サブ画素Pにおいて、第1TFT9a、第2TFT9b及びキャパシタ9cがそれぞれ設けられている。 Here, in the TFT layer 20a, as shown in FIG. 2 and FIG. 3, a plurality of gate lines 14 are provided as the first metal layer so as to extend in the horizontal direction in the figure in parallel with each other. Further, in the TFT layer 20a, as shown in FIGS. 2 and 3, a plurality of source lines 18f are provided as a second metal layer so as to extend in parallel with each other in the vertical direction in the drawing. Further, in the TFT layer 20a, as shown in FIGS. 2 and 3, a plurality of power supply lines 18g are provided as second metal layers so as to extend in parallel with each other in the vertical direction in the drawing, adjacent to each source line 18f. ing. In the TFT layer 20a, as shown in FIG. 3, a first TFT 9a, a second TFT 9b, and a capacitor 9c are provided in each sub-pixel P.

 なお、上記第1金属層には、例えば、モリブデンが用いられている。また、上記第2金属層は、例えば、チタン/アルミニウム/チタンからなる3層構造を有しており、ソース配線18f等の低抵抗化を図ることができる。更に、第2金属層は、請求の範囲における金属層の一例である。 Note that, for example, molybdenum is used for the first metal layer. Further, the second metal layer has a three-layer structure of, for example, titanium / aluminum / titanium, and can reduce the resistance of the source wiring 18f and the like. Further, the second metal layer is an example of the metal layer in the claims.

 ベースコート膜11は、例えば、窒化シリコン、酸化シリコン、酸窒化シリコン等の無機絶縁膜の単層膜又は積層膜により構成されている。 The base coat film 11 is composed of, for example, a single-layer film or a laminated film of an inorganic insulating film such as silicon nitride, silicon oxide, or silicon oxynitride.

 第1TFT9aは、図3に示すように、各サブ画素Pにおいて、対応するゲート線14及びソース線18fに接続されている。ここで、第1TFT9aは、図4に示すように、ベースコート膜11上に島状に設けられた半導体層12aと、半導体層12aを覆うように設けられたゲート絶縁膜13と、ゲート絶縁膜13上に半導体層12aの一部と重なるように設けられたゲート電極14aと、ゲート電極14aを覆うように順に設けられた第1層間絶縁膜15及び第2層間絶縁膜17と、第2層間絶縁膜17上に設けられ、互いに離間するように配置されたソース電極18a及びドレイン電極18bとを備えている。 (3) The first TFT 9a is connected to the corresponding gate line 14 and source line 18f in each sub-pixel P, as shown in FIG. Here, as shown in FIG. 4, the first TFT 9a includes a semiconductor layer 12a provided in an island shape on the base coat film 11, a gate insulating film 13 provided to cover the semiconductor layer 12a, and a gate insulating film 13 A gate electrode 14a provided thereon so as to overlap a part of the semiconductor layer 12a; a first interlayer insulating film 15 and a second interlayer insulating film 17 provided in order to cover the gate electrode 14a; A source electrode 18a and a drain electrode 18b are provided on the film 17 and are spaced apart from each other.

 なお、ゲート絶縁膜13、第1層間絶縁膜15及び第2層間絶縁膜17は、例えば、窒化シリコン、酸化シリコン、酸窒化シリコン等の無機絶縁膜の単層膜又は積層膜により構成されている。 Note that the gate insulating film 13, the first interlayer insulating film 15, and the second interlayer insulating film 17 are each formed of a single-layer film or a stacked film of an inorganic insulating film such as silicon nitride, silicon oxide, or silicon oxynitride. .

 第2TFT9bは、図3に示すように、各サブ画素Pにおいて、対応する第1TFT9a及び電源線18gに接続されている。ここで、第2TFT9bは、図4に示すように、ベースコート膜11上に島状に設けられた半導体層12bと、半導体層12bを覆うように設けられたゲート絶縁膜13と、ゲート絶縁膜13上に半導体層12bの一部と重なるように設けられたゲート電極14bと、ゲート電極14bを覆うように順に設けられた第1層間絶縁膜15及び第2層間絶縁膜17と、第2層間絶縁膜17上に設けられ、互いに離間するように配置されたソース電極18c及びドレイン電極18dとを備えている。 (3) The second TFT 9b is connected to the corresponding first TFT 9a and the power supply line 18g in each sub-pixel P, as shown in FIG. Here, as shown in FIG. 4, the second TFT 9b includes a semiconductor layer 12b provided in an island shape on the base coat film 11, a gate insulating film 13 provided to cover the semiconductor layer 12b, and a gate insulating film 13 A gate electrode 14b provided overlying a part of the semiconductor layer 12b thereon; a first interlayer insulating film 15 and a second interlayer insulating film 17 provided in order to cover the gate electrode 14b; A source electrode 18c and a drain electrode 18d are provided on the film 17 and are spaced apart from each other.

 なお、本実施形態では、トップゲート型の第1TFT9a及び第2TFT9bを例示したが、第1TFT9a及び第2TFT9bは、ボトムゲート型のTFTであってもよい。 In the present embodiment, the first gate 9a and the second TFT 9b of the top gate type are illustrated, but the first TFT 9a and the second TFT 9b may be a bottom gate type TFT.

 キャパシタ9cは、図3に示すように、各サブ画素Pにおいて、対応する第1TFT9a及び電源線18gに接続されている。ここで、キャパシタ9cは、図4に示すように、ゲート電極と同一材料により同一層に形成された下部導電層14cと、下部導電層14cを覆うように設けられた第1層間絶縁膜15と、第1層間絶縁膜15上に下部導電層14cと重なるように設けられた上部導電層16とを備えている。 The capacitor 9c is connected to the corresponding first TFT 9a and power supply line 18g in each sub-pixel P, as shown in FIG. Here, as shown in FIG. 4, the capacitor 9c includes a lower conductive layer 14c formed in the same layer with the same material as the gate electrode, and a first interlayer insulating film 15 provided so as to cover the lower conductive layer 14c. And an upper conductive layer 16 provided on the first interlayer insulating film 15 so as to overlap the lower conductive layer 14c.

 また、本実施形態においては、平坦化膜19aが、アクリル樹脂、エポキシ樹脂等の安価な有機樹脂材料により形成されている。なお、平坦化膜19aをポリイミド樹脂により形成してもよい。 In the present embodiment, the flattening film 19a is formed of an inexpensive organic resin material such as an acrylic resin or an epoxy resin. Note that the flattening film 19a may be formed of a polyimide resin.

 有機EL素子30は、図4に示すように、平坦化膜19a上に順に設けられた複数の第1電極(反射電極)21と、第1電極21に対向して設けられた複数の第2電極(透明電極)24と、第1電極21と第2電極24との間に設けられた複数の有機EL層23と、複数のエッジカバー22とを備えている。 As shown in FIG. 4, the organic EL element 30 includes a plurality of first electrodes (reflection electrodes) 21 sequentially provided on the planarization film 19a and a plurality of second electrodes (faces) opposed to the first electrodes 21. An electrode (transparent electrode) 24, a plurality of organic EL layers 23 provided between the first electrode 21 and the second electrode 24, and a plurality of edge covers 22 are provided.

 複数の第1電極21は、有機EL層(発光層)から放出された光を反射させる反射電極として機能し、図4に示すように、複数のサブ画素Pに対応するように、平坦化膜19a上にマトリクス状に反射電極として設けられている。ここで、第1電極21は、図4に示すように、平坦化膜19aに形成されたコンタクトホールを介して、各第2TFT9bのドレイン電極18dに接続されている。また、第1電極21は、有機EL層23にホール(正孔)を注入する機能を有している。また、第1電極21は、有機EL層23への正孔注入効率を向上させるために、仕事関数の大きな材料で形成するのがより好ましい。ここで、第1電極21を構成する材料としては、例えば、銀(Ag)、アルミニウム(Al)、バナジウム(V)、コバルト(Co)、ニッケル(Ni)、タングステン(W)、金(Au)、カルシウム(Ca)、チタン(Ti)、イットリウム(Y)、ナトリウム(Na)、ルテニウム(Ru)、マンガン(Mn)、インジウム(In)、マグネシウム(Mg)、リチウム(Li)、イッテルビウム(Yb)、フッ化リチウム(LiF)等の金属材料が挙げられる。また、第1電極21を構成する材料は、例えば、マグネシウム(Mg)/銅(Cu)、マグネシウム(Mg)/銀(Ag)、ナトリウム(Na)/カリウム(K)、アスタチン(At)/酸化アスタチン(AtO)、リチウム(Li)/アルミニウム(Al)、リチウム(Li)/カルシウム(Ca)/アルミニウム(Al)、又はフッ化リチウム(LiF)/カルシウム(Ca)/アルミニウム(Al)等の合金であっても構わない。さらに、第1電極21を構成する材料は、例えば、酸化スズ(SnO)、酸化亜鉛(ZnO)、インジウムスズ酸化物(ITO)、インジウム亜鉛酸化物(IZO)のような導電性酸化物等であってもよい。また、第1電極21は、上記材料からなる層を複数積層して形成されていてもよい。なお、仕事関数の大きな材料としては、例えば、インジウムスズ酸化物(ITO)やインジウム亜鉛酸化物(IZO)等が挙げられる。 The plurality of first electrodes 21 function as reflection electrodes that reflect light emitted from the organic EL layer (light-emitting layer), and as shown in FIG. The reflective electrodes 19a are provided in a matrix on the reflective electrodes 19a. Here, as shown in FIG. 4, the first electrode 21 is connected to the drain electrode 18d of each second TFT 9b via a contact hole formed in the flattening film 19a. Further, the first electrode 21 has a function of injecting holes (holes) into the organic EL layer 23. Further, the first electrode 21 is more preferably formed of a material having a large work function in order to improve the efficiency of hole injection into the organic EL layer 23. Here, as a material forming the first electrode 21, for example, silver (Ag), aluminum (Al), vanadium (V), cobalt (Co), nickel (Ni), tungsten (W), gold (Au) , Calcium (Ca), titanium (Ti), yttrium (Y), sodium (Na), ruthenium (Ru), manganese (Mn), indium (In), magnesium (Mg), lithium (Li), ytterbium (Yb) And a metal material such as lithium fluoride (LiF). The material forming the first electrode 21 is, for example, magnesium (Mg) / copper (Cu), magnesium (Mg) / silver (Ag), sodium (Na) / potassium (K), astatine (At) / oxidation Such as astatine (AtO 2 ), lithium (Li) / aluminum (Al), lithium (Li) / calcium (Ca) / aluminum (Al), or lithium fluoride (LiF) / calcium (Ca) / aluminum (Al) It may be an alloy. Further, the material forming the first electrode 21 is, for example, a conductive oxide such as tin oxide (SnO), zinc oxide (ZnO), indium tin oxide (ITO), and indium zinc oxide (IZO). There may be. Further, the first electrode 21 may be formed by stacking a plurality of layers made of the above materials. Note that examples of the material having a large work function include indium tin oxide (ITO) and indium zinc oxide (IZO).

 エッジカバー22は、図4に示すように、TFT層20a上において、各第1電極21の周縁部を覆うように格子状に設けられている。このエッジカバー22は、各発光領域Lr,Lg,Lbの間に設けられるとともに、各発光領域Lr,Lg,Lbを区画するための隔壁として機能する。 (4) The edge cover 22 is provided in a grid pattern on the TFT layer 20a so as to cover the periphery of each first electrode 21, as shown in FIG. The edge cover 22 is provided between the light emitting areas Lr, Lg, Lb and functions as a partition for partitioning the light emitting areas Lr, Lg, Lb.

 ここで、エッジカバー22を構成する材料としては、例えば、ポリイミド樹脂、SOG(スピンオンガラス)樹脂等の有機樹脂材料が挙げられる。 Here, as a material for forming the edge cover 22, for example, an organic resin material such as a polyimide resin and an SOG (spin-on glass) resin can be cited.

 複数の有機EL層23は、図4に示すように、各第1電極21上に配置され、複数のサブ画素に対応するように、マトリクス状に設けられている。ここで、各有機EL層23は、図5に示すように、第1電極21上に順に設けられた正孔注入層1、正孔輸送層2、発光層3、電子輸送層4及び電子注入層5を備えている。 (4) The plurality of organic EL layers 23 are arranged on each first electrode 21 as shown in FIG. 4 and provided in a matrix so as to correspond to a plurality of sub-pixels. Here, as shown in FIG. 5, each of the organic EL layers 23 has a hole injection layer 1, a hole transport layer 2, a light emitting layer 3, an electron transport layer 4, and an electron injection layer provided on the first electrode 21 in order. It has a layer 5.

 正孔注入層1は、陽極バッファ層とも呼ばれ、第1電極21と有機EL層23とのエネルギーレベルを近づけ、第1電極21から有機EL層23への正孔注入効率を改善する機能を有している。ここで、正孔注入層1を構成する材料としては、例えば、トリアゾール誘導体、オキサジアゾール誘導体、イミダゾール誘導体、ポリアリールアルカン誘導体、ピラゾリン誘導体、フェニレンジアミン誘導体、オキサゾール誘導体、スチリルアントラセン誘導体、フルオレノン誘導体、ヒドラゾン誘導体、スチルベン誘導体等が挙げられる。 The hole injection layer 1 is also called an anode buffer layer, and has a function of making the energy levels of the first electrode 21 and the organic EL layer 23 close to each other and improving the efficiency of hole injection from the first electrode 21 to the organic EL layer 23. Have. Here, as a material constituting the hole injection layer 1, for example, a triazole derivative, an oxadiazole derivative, an imidazole derivative, a polyarylalkane derivative, a pyrazoline derivative, a phenylenediamine derivative, an oxazole derivative, a styrylanthracene derivative, a fluorenone derivative, Hydrazone derivatives, stilbene derivatives and the like can be mentioned.

 正孔輸送層2は、第1電極21から有機EL層23への正孔の輸送効率を向上させる機能を有している。ここで、正孔輸送層2を構成する材料としては、例えば、ポルフィリン誘導体、芳香族第三級アミン化合物、スチリルアミン誘導体、ポリビニルカルバゾール、ポリ-p-フェニレンビニレン、ポリシラン、トリアゾール誘導体、オキサジアゾール誘導体、イミダゾール誘導体、ポリアリールアルカン誘導体、ピラゾリン誘導体、ピラゾロン誘導体、フェニレンジアミン誘導体、アリールアミン誘導体、アミン置換カルコン誘導体、オキサゾール誘導体、スチリルアントラセン誘導体、フルオレノン誘導体、ヒドラゾン誘導体、スチルベン誘導体、水素化アモルファスシリコン、水素化アモルファス炭化シリコン、硫化亜鉛、セレン化亜鉛等が挙げられる。 The hole transport layer 2 has a function of improving the efficiency of transporting holes from the first electrode 21 to the organic EL layer 23. Here, examples of the material constituting the hole transport layer 2 include porphyrin derivatives, aromatic tertiary amine compounds, styrylamine derivatives, polyvinylcarbazole, poly-p-phenylenevinylene, polysilane, triazole derivatives, oxadiazole Derivatives, imidazole derivatives, polyarylalkane derivatives, pyrazoline derivatives, pyrazolone derivatives, phenylenediamine derivatives, arylamine derivatives, amine-substituted chalcone derivatives, oxazole derivatives, styrylanthracene derivatives, fluorenone derivatives, hydrazone derivatives, stilbene derivatives, hydrogenated amorphous silicon, Examples include hydrogenated amorphous silicon carbide, zinc sulfide, and zinc selenide.

 発光層3は、第1電極21及び第2電極24による電圧印加の際に、第1電極21及び第2電極24から正孔及び電子がそれぞれ注入されると共に、正孔及び電子が再結合する領域である。ここで、発光層3は、発光効率が高い材料により形成されている。そして、発光層3を構成する材料としては、例えば、金属オキシノイド化合物[8-ヒドロキシキノリン金属錯体]、ナフタレン誘導体、アントラセン誘導体、ジフェニルエチレン誘導体、ビニルアセトン誘導体、トリフェニルアミン誘導体、ブタジエン誘導体、クマリン誘導体、ベンズオキサゾール誘導体、オキサジアゾール誘導体、オキサゾール誘導体、ベンズイミダゾール誘導体、チアジアゾール誘導体、ベンズチアゾール誘導体、スチリル誘導体、スチリルアミン誘導体、ビススチリルベンゼン誘導体、トリススチリルベンゼン誘導体、ペリレン誘導体、ペリノン誘導体、アミノピレン誘導体、ピリジン誘導体、ローダミン誘導体、アクイジン誘導体、フェノキサゾン、キナクリドン誘導体、ルブレン、ポリ-p-フェニレンビニレン、ポリシラン等が挙げられる。 In the light emitting layer 3, when a voltage is applied by the first electrode 21 and the second electrode 24, holes and electrons are injected from the first electrode 21 and the second electrode 24, respectively, and the holes and electrons recombine. Area. Here, the light emitting layer 3 is formed of a material having high luminous efficiency. Examples of the material constituting the light emitting layer 3 include a metal oxinoid compound [8-hydroxyquinoline metal complex], a naphthalene derivative, an anthracene derivative, a diphenylethylene derivative, a vinylacetone derivative, a triphenylamine derivative, a butadiene derivative, and a coumarin derivative. , Benzoxazole derivative, oxadiazole derivative, oxazole derivative, benzimidazole derivative, thiadiazole derivative, benzothiazole derivative, styryl derivative, styrylamine derivative, bisstyrylbenzene derivative, tristyrylbenzene derivative, perylene derivative, perinone derivative, aminopyrene derivative, Pyridine derivatives, rhodamine derivatives, aquidin derivatives, phenoxazone, quinacridone derivatives, rubrene, poly-p-phenylene vinylene , Polysilane, and the like.

 電子輸送層4は、電子を発光層3まで効率良く移動させる機能を有している。ここで、電子輸送層4を構成する材料としては、例えば、有機化合物として、オキサジアゾール誘導体、トリアゾール誘導体、ベンゾキノン誘導体、ナフトキノン誘導体、アントラキノン誘導体、テトラシアノアントラキノジメタン誘導体、ジフェノキノン誘導体、フルオレノン誘導体、シロール誘導体、金属オキシノイド化合物等が挙げられる。 (4) The electron transport layer 4 has a function of efficiently moving electrons to the light emitting layer 3. Here, as a material constituting the electron transport layer 4, for example, as an organic compound, an oxadiazole derivative, a triazole derivative, a benzoquinone derivative, a naphthoquinone derivative, an anthraquinone derivative, a tetracyanoanthraquinodimethane derivative, a diphenoquinone derivative, or a fluorenone derivative , Silole derivatives, metal oxinoid compounds and the like.

 電子注入層5は、第2電極24と有機EL層23とのエネルギーレベルを近づけ、第2電極24から有機EL層23へ電子が注入される効率を向上させる機能を有し、この機能により、有機EL素子30の駆動電圧を下げることができる。なお、電子注入層5は、陰極バッファ層とも呼ばれる。ここで、電子注入層5を構成する材料としては、例えば、フッ化リチウム(LiF)、フッ化マグネシウム(MgF)、フッ化カルシウム(CaF)、フッ化ストロンチウム(SrF)、フッ化バリウム(BaF)のような無機アルカリ化合物、酸化アルミニウム(Al)、酸化ストロンチウム(SrO)等が挙げられる。 The electron injection layer 5 has a function of making the energy levels of the second electrode 24 and the organic EL layer 23 close to each other and improving the efficiency of injecting electrons from the second electrode 24 into the organic EL layer 23. The drive voltage of the organic EL element 30 can be reduced. Note that the electron injection layer 5 is also called a cathode buffer layer. Here, as a material constituting the electron injection layer 5, for example, lithium fluoride (LiF), magnesium fluoride (MgF 2 ), calcium fluoride (CaF 2 ), strontium fluoride (SrF 2 ), barium fluoride Examples thereof include an inorganic alkali compound such as (BaF 2 ), aluminum oxide (Al 2 O 3 ), and strontium oxide (SrO).

 第2電極24は、図4に示すように、各有機EL層23及びエッジカバー22を覆うように設けられている。また、第2電極24は、有機EL層23に電子を注入する機能を有している。また、第2電極24は、有機EL層23への電子注入効率を向上させるために、仕事関数の小さな材料で構成するのがより好ましい。ここで、第2電極24を構成する材料としては、例えば、銀(Ag)、アルミニウム(Al)、バナジウム(V)、コバルト(Co)、ニッケル(Ni)、タングステン(W)、金(Au)、カルシウム(Ca)、チタン(Ti)、イットリウム(Y)、ナトリウム(Na)、ルテニウム(Ru)、マンガン(Mn)、インジウム(In)、マグネシウム(Mg)、リチウム(Li)、イッテルビウム(Yb)、フッ化リチウム(LiF)等が挙げられる。また、第2電極24は、例えば、マグネシウム(Mg)/銅(Cu)、マグネシウム(Mg)/銀(Ag)、ナトリウム(Na)/カリウム(K)、アスタチン(At)/酸化アスタチン(AtO)、リチウム(Li)/アルミニウム(Al)、リチウム(Li)/カルシウム(Ca)/アルミニウム(Al)、フッ化リチウム(LiF)/カルシウム(Ca)/アルミニウム(Al)等の合金により形成されていてもよい。また、第2電極24は、例えば、酸化スズ(SnO)、酸化亜鉛(ZnO)、インジウムスズ酸化物(ITO)、インジウム亜鉛酸化物(IZO)等の導電性酸化物により形成されていてもよい。また、第2電極24は、上記材料からなる層を複数積層して形成されていてもよい。なお、仕事関数が小さい材料としては、例えば、マグネシウム(Mg)、リチウム(Li)、フッ化リチウム(LiF)、マグネシウム(Mg)/銅(Cu)、マグネシウム(Mg)/銀(Ag)、ナトリウム(Na)/カリウム(K)、リチウム(Li)/アルミニウム(Al)、リチウム(Li)/カルシウム(Ca)/アルミニウム(Al)、フッ化リチウム(LiF)/カルシウム(Ca)/アルミニウム(Al)等が挙げられる。 The second electrode 24 is provided so as to cover each of the organic EL layers 23 and the edge cover 22, as shown in FIG. The second electrode 24 has a function of injecting electrons into the organic EL layer 23. The second electrode 24 is more preferably made of a material having a small work function in order to improve the efficiency of electron injection into the organic EL layer 23. Here, as a material forming the second electrode 24, for example, silver (Ag), aluminum (Al), vanadium (V), cobalt (Co), nickel (Ni), tungsten (W), gold (Au) , Calcium (Ca), titanium (Ti), yttrium (Y), sodium (Na), ruthenium (Ru), manganese (Mn), indium (In), magnesium (Mg), lithium (Li), ytterbium (Yb) , Lithium fluoride (LiF) and the like. The second electrode 24 is made of, for example, magnesium (Mg) / copper (Cu), magnesium (Mg) / silver (Ag), sodium (Na) / potassium (K), astatine (At) / astatin oxide (AtO 2). ), Lithium (Li) / aluminum (Al), lithium (Li) / calcium (Ca) / aluminum (Al), and lithium fluoride (LiF) / calcium (Ca) / aluminum (Al). You may. The second electrode 24 may be formed of a conductive oxide such as tin oxide (SnO), zinc oxide (ZnO), indium tin oxide (ITO), and indium zinc oxide (IZO), for example. . Further, the second electrode 24 may be formed by stacking a plurality of layers made of the above materials. Examples of the material having a small work function include magnesium (Mg), lithium (Li), lithium fluoride (LiF), magnesium (Mg) / copper (Cu), magnesium (Mg) / silver (Ag), and sodium (Mg). (Na) / potassium (K), lithium (Li) / aluminum (Al), lithium (Li) / calcium (Ca) / aluminum (Al), lithium fluoride (LiF) / calcium (Ca) / aluminum (Al) And the like.

 また、図4に示すように、有機EL表示装置50aは、有機EL素子30を覆う封止膜28を備えている。この封止膜28は、第2電極24を覆うように設けられた第1無機膜25と、第1無機膜25を覆うように設けられた有機膜26と、有機膜26を覆うように設けられた第2無機膜27とを備え、有機EL層23を水分や酸素から保護する機能を有している。 (4) As shown in FIG. 4, the organic EL display device 50a includes a sealing film 28 that covers the organic EL element 30. The sealing film 28 is provided to cover the second electrode 24, a first inorganic film 25, an organic film 26 provided to cover the first inorganic film 25, and provided to cover the organic film 26. And a function of protecting the organic EL layer 23 from moisture and oxygen.

 第1無機膜25及び第2無機膜27は、例えば、酸化シリコン(SiO)や酸化アルミニウム(Al)、四窒化三ケイ素(Si)のような窒化シリコン(SiNx(xは正数))、炭窒化ケイ素(SiCN)等の無機材料により構成されている。また、有機膜26は、例えば、アクリレート、ポリ尿素、パリレン、ポリイミド、ポリアミド等の有機材料により構成されている。 The first inorganic film 25 and the second inorganic film 27 are made of, for example, silicon nitride (SiNx (x) such as silicon oxide (SiO 2 ), aluminum oxide (Al 2 O 3 ), and trisilicon tetranitride (Si 3 N 4 ). Is a positive number)) and an inorganic material such as silicon carbonitride (SiCN). The organic film 26 is made of, for example, an organic material such as acrylate, polyurea, parylene, polyimide, and polyamide.

 上述した有機EL表示装置50aは、各サブ画素Pにおいて、ゲート線14を介して第1TFT9aにゲート信号を入力することにより、第1TFT9aをオン状態にし、ソース線18fを介して第2TFT9bのゲート電極14b及びキャパシタ9cにソース信号に対応する所定の電圧を書き込み、第2TFT9bのゲート電圧に基づいて電源線18gからの電流の大きさが規定され、その規定された電流が有機EL層23に供給されることにより、有機EL層23の発光層3が発光して、画像表示を行うように構成されている。 In the above-described organic EL display device 50a, in each sub-pixel P, the first TFT 9a is turned on by inputting a gate signal to the first TFT 9a via the gate line 14, and the gate electrode of the second TFT 9b is connected via the source line 18f. A predetermined voltage corresponding to the source signal is written to 14b and the capacitor 9c, the magnitude of the current from the power supply line 18g is defined based on the gate voltage of the second TFT 9b, and the defined current is supplied to the organic EL layer 23. Thus, the light-emitting layer 3 of the organic EL layer 23 emits light to display an image.

 なお、有機EL表示装置50aでは、第1TFT9aがオフ状態になっても、第2TFT9bのゲート電圧がキャパシタ9cによって保持されるので、次のフレームのゲート信号が入力されるまで発光層3による発光が維持される。 In the organic EL display device 50a, even if the first TFT 9a is turned off, the gate voltage of the second TFT 9b is held by the capacitor 9c, so that the light emitting layer 3 emits light until the gate signal of the next frame is input. Will be maintained.

 本実施形態の有機EL表示装置50aは、例えば、ガラス基板上に形成した樹脂基板層10の表面に、周知の方法を用いて、TFT層20a及び有機EL素子30を形成した後に、ガラス基板を剥離させることにより、製造することができる。 The organic EL display device 50a of the present embodiment is formed, for example, by forming a TFT layer 20a and an organic EL element 30 on the surface of a resin substrate layer 10 formed on a glass substrate by using a known method. It can be manufactured by peeling.

 次に、本実施形態における折り曲げ部について説明する。図6は、本実施形態の有機EL表示装置50aの折り曲げ部Gの平面図であり、図7は、図6のA-A断面図である。また、図8は、図6のB-B断面図である。 Next, the bent portion in the present embodiment will be described. FIG. 6 is a plan view of a bent portion G of the organic EL display device 50a according to the present embodiment, and FIG. 7 is a sectional view taken along line AA of FIG. FIG. 8 is a sectional view taken along line BB of FIG.

 図6、図7に示すように、有機EL表示装置50aは、折り曲げ領域Eにおいて、樹脂基板層10と、樹脂基板層10の表面に設けられた無機積層膜36及び額縁平坦化膜37と、額縁平坦化膜37の表面に設けられ、ゲート導電層43a,43bを接続するための複数の額縁配線38と、額縁配線38を覆うように設けられた表面保護層39とを備えている。 As shown in FIGS. 6 and 7, the organic EL display device 50a includes a resin substrate layer 10, an inorganic laminated film 36 and a frame flattening film 37 provided on the surface of the resin substrate layer 10 in the bending region E. A plurality of frame wirings are provided on the surface of the frame flattening film 37 to connect the gate conductive layers 43a and 43b, and a surface protection layer 39 provided so as to cover the frame wirings.

 ゲート導電層43aは、表示領域DにおけるTFT層20aに設けられた信号配線(ゲート配線14、ソース配線18f、電源線18g等の表示領域D内の配線)に電気的に接続され、表示領域D側に延びるように設けられている。また、ゲート導電層43bは、端子部Tに延びるように設けられている。 The gate conductive layer 43a is electrically connected to a signal wiring (a wiring in the display area D such as the gate wiring 14, the source wiring 18f, and the power supply line 18g) provided in the TFT layer 20a in the display area D. It is provided to extend to the side. The gate conductive layer 43b is provided so as to extend to the terminal portion T.

 額縁平坦化膜37は、平坦化膜19aと同層で、かつ、同一材料により、形成されている。また、図7に示すように、額縁平坦化膜37は、開口部Sを跨ぐように設けられている。 The frame flattening film 37 is formed in the same layer and the same material as the flattening film 19a. As shown in FIG. 7, the frame flattening film 37 is provided so as to straddle the opening S.

 複数の額縁配線38は、表示領域D内の信号配線に電気的に接続されており、図6、図7に示すように、額縁平坦化膜37上に開口部Sを横切るように設けられ、表面保護層39が額縁配線38を覆うように構成されている。従って、表面保護層39により額縁配線38が保護される。 The plurality of frame wirings 38 are electrically connected to signal wirings in the display area D, and are provided on the frame flattening film 37 so as to cross the opening S, as shown in FIGS. The surface protection layer 39 is configured to cover the frame wiring 38. Therefore, the frame wiring 38 is protected by the surface protection layer 39.

 なお、額縁配線38は、上述の金属層であるソース配線18f(幅:3~10μm)と同一材料により形成されており、図6に示す中心間距離(ピッチ)Pが、10~20μmに設定されている。 The frame wiring 38 is formed of the same material as the source wiring 18f (width: 3 to 10 μm), which is the above-described metal layer, and the center-to-center distance (pitch) P shown in FIG. 6 is set to 10 to 20 μm. Have been.

 また、表面保護層39は、上述のエッジカバー22と同一材料により形成されており、表面保護層39をエッジカバー22と同層に形成する構成としている。 The surface protection layer 39 is formed of the same material as the edge cover 22 described above, and has a configuration in which the surface protection layer 39 is formed in the same layer as the edge cover 22.

 また、図1に示すように、開口部Sは、折り曲げ部Gに沿って額縁領域Fの一端部から他端部まで開口されており、図1、図7に示すように、額縁平坦化膜37は、開口部Sと、無機積層膜36の開口部S側の端部を覆うように帯状に設けられ、例えば、ポリイミド樹脂等の有機樹脂材料により形成されている。 Also, as shown in FIG. 1, the opening S is open from one end to the other end of the frame region F along the bent portion G, and as shown in FIGS. 37 is provided in a band shape so as to cover the opening S and the end of the inorganic laminated film 36 on the opening S side, and is formed of, for example, an organic resin material such as a polyimide resin.

 また、図1、図7に示すように、表面保護層39は、帯状の額縁平坦化膜37の端部を覆うように、額縁配線38を挟んで帯状に設けられている。 As shown in FIGS. 1 and 7, the surface protective layer 39 is provided in a band shape with the frame wiring 38 interposed therebetween so as to cover the edge of the band-shaped frame flattening film 37.

 無機積層膜36は、TFT層20aを構成する少なくとも1層の無機絶縁膜であり、図7に示すように、樹脂基板層10上に順に積層されたベースコート膜11と、ゲート絶縁膜13と、第1層間絶縁膜15及び第2層間絶縁膜17からなる層間絶縁膜40とを備えている。なお、この無機積層膜36は、額縁領域Fにも設けられている。 The inorganic laminated film 36 is at least one layer of an inorganic insulating film constituting the TFT layer 20a, and as shown in FIG. 7, the base coat film 11, the gate insulating film 13, and the base coat film 11 sequentially laminated on the resin substrate layer 10. An interlayer insulating film 40 including a first interlayer insulating film 15 and a second interlayer insulating film 17 is provided. The inorganic laminated film 36 is also provided in the frame region F.

 また、無機積層膜36を構成するゲート絶縁膜13と層間絶縁膜40との間には、ゲート導電層43a,43bが設けられている。 {Circle around (4)} Between the gate insulating film 13 and the interlayer insulating film 40 constituting the inorganic laminated film 36, gate conductive layers 43a and 43b are provided.

 また、図7に示すように、折り曲げ部Gにおいて、無機積層膜36のベースコート膜11、ゲート絶縁膜13及び層間絶縁膜40は設けられておらず、無機積層膜36に開口部Sが形成され、当該開口部Sを額縁平坦化膜37が覆う構成となっている。 As shown in FIG. 7, in the bent portion G, the base coat film 11, the gate insulating film 13, and the interlayer insulating film 40 of the inorganic laminated film 36 are not provided, and an opening S is formed in the inorganic laminated film 36. The opening S is covered with a frame flattening film 37.

 そして、額縁平坦化膜37、額縁配線38、及び表面保護層39が設けられた折り曲げ部Gにおいて、最大180°の角度に折り曲げ可能となるように構成されている。 {Circle around (4)} In the bent portion G provided with the frame flattening film 37, the frame wiring 38, and the surface protection layer 39, the frame can be bent at an angle of 180 ° at the maximum.

 また、図6、図8に示すように、折り曲げ部Gにおいて、額縁平坦化膜37が、複数の額縁配線38毎に島状に設けられるとともに、額縁配線38が額縁平坦化膜37の表面と側面の全面を覆う構成としている。 As shown in FIGS. 6 and 8, in the bent portion G, the frame flattening film 37 is provided in the form of an island for each of the plurality of frame wirings 38, and the frame wiring 38 is formed on the surface of the frame flattening film 37. It is configured to cover the entire side surface.

 従って、折り曲げ部Gにおいて、額縁配線38を形成する金属導電膜をエッチングして、額縁平坦化膜37の表面と側面の全面を覆う額縁配線38を形成する際に、額縁平坦化膜37がエッチングされることを防止することができる。その結果、額縁平坦化膜37のエッチングに起因するガス(例えば、塩素ガス)の発生を防止することができ、チャンバー内の汚染を防止することができる。 Therefore, when the metal conductive film forming the frame wiring 38 is etched at the bent portion G to form the frame wiring 38 covering the entire surface and side surfaces of the frame flattening film 37, the frame flattening film 37 is etched. Can be prevented. As a result, generation of gas (eg, chlorine gas) due to etching of the frame flattening film 37 can be prevented, and contamination in the chamber can be prevented.

 また、図6、図8に示すように、折り曲げ部Gにおいて、表面保護層39が開口部Sに充填され、当該表面保護層39が複数の額縁配線38を覆う構成となっている。 6 and 8, at the bent portion G, the surface protection layer 39 is filled in the opening S, and the surface protection layer 39 covers the plurality of frame wirings 38.

 次に、本実施形態の有機EL表示装置50aの製造方法について説明する。 Next, a method for manufacturing the organic EL display device 50a according to the present embodiment will be described.

 例えば、ポリイミド樹脂製の樹脂基板層10の表面に、周知の方法を用いて、TFT層20a(ベースコート膜11、第1TFT9a、第2TFT9b、キャパシタ9cと、各第1TFT9a、平坦化膜19a)を形成する。 For example, the TFT layer 20a (the base coat film 11, the first TFT 9a, the second TFT 9b, the capacitor 9c, the first TFT 9a, and the flattening film 19a) is formed on the surface of the resin substrate layer 10 made of a polyimide resin using a known method. I do.

 この際、折り曲げ部Gにおいては、まず、樹脂基板層10の表面に、無機積層膜36(ベースコート膜11、ゲート絶縁膜13及び層間絶縁膜40)が形成され、次に、折り曲げ部において、無機絶縁膜36に、無機絶縁膜36を貫通して樹脂基板層10の上面を露出させる開口部Sをドライエッチングにより形成する。 At this time, in the bent portion G, first, the inorganic laminated film 36 (the base coat film 11, the gate insulating film 13, and the interlayer insulating film 40) is formed on the surface of the resin substrate layer 10; An opening S that exposes the upper surface of the resin substrate layer 10 through the inorganic insulating film 36 is formed in the insulating film 36 by dry etching.

 次に、図6、図8に示すように、開口部Sにおいて、複数の額縁平坦化膜37を、島状(帯状)に形成する。 Next, as shown in FIGS. 6 and 8, a plurality of frame flattening films 37 are formed in the opening S in an island shape (strip shape).

 より具体的には、例えば、感光性アクリル樹脂を、ベース基板10上にスピンコート法により塗布し、所定の露光パターンを有する露光マスクを使用して、所定の露光量(例えば、150mJ/cm)により露光を行い、アルカリ現像液を用いて現像を行うことにより、例えば、厚みが1~1.5μmの平坦化膜19aを形成する。なお、現像後、ポストベークとして、所定の条件下(例えば、220℃の温度で60分間)において焼成を行う。 More specifically, for example, a photosensitive acrylic resin is applied on the base substrate 10 by a spin coating method, and a predetermined exposure amount (for example, 150 mJ / cm 2) is used using an exposure mask having a predetermined exposure pattern. ), And development is performed using an alkali developing solution, thereby forming a flattening film 19a having a thickness of 1 to 1.5 μm, for example. After the development, post-baking is performed under predetermined conditions (for example, at 220 ° C. for 60 minutes).

 次に、TFT層20aの表面に、周知の方法を用いて、有機EL素子30(第1電極21、エッジカバー22、有機EL層23(正孔注入層1、正孔輸送層2、発光層3、電子輸送層4、電子注入層5)、第2電極24)を形成する。 Next, the organic EL element 30 (the first electrode 21, the edge cover 22, the organic EL layer 23 (the hole injection layer 1, the hole transport layer 2, the light emitting layer) is formed on the surface of the TFT layer 20a using a known method. 3, an electron transport layer 4, an electron injection layer 5), and a second electrode 24) are formed.

 この際、折り曲げ部Gにおいては、額縁平坦化膜37の表面と側面の全面を覆うように、樹脂基板層10上に金属層を成膜した後に、その金属層をドライエッチングによりパターニングすることにより、図8に示すように、額縁平坦化膜37の表面と側面の全面を覆う額縁配線38を形成する。 At this time, in the bent portion G, a metal layer is formed on the resin substrate layer 10 so as to cover the entire surface and side surfaces of the frame flattening film 37, and then the metal layer is patterned by dry etching. As shown in FIG. 8, a frame wiring 38 that covers the entire surface and side surfaces of the frame flattening film 37 is formed.

 従って、折り曲げ部Gにおいて、額縁配線38を形成する金属層をエッチングする際に、額縁平坦化膜37がエッチングされることを防止することができ、額縁平坦化膜37のエッチングに起因するガス(例えば、塩素ガス)の発生を防止することができる。 Therefore, when the metal layer forming the frame wiring 38 is etched at the bent portion G, the frame flattening film 37 can be prevented from being etched, and the gas ( For example, generation of chlorine gas) can be prevented.

 また、図6、図8に示すように、折り曲げ部Gにおいて、開口部Sに充填されるとともに複数の額縁配線38を覆う表面保護層39が形成される。 6 and 8, in the bent portion G, a surface protection layer 39 that fills the opening S and covers the plurality of frame wirings 38 is formed.

 なお、図6、図7に示すように、島状の額縁平坦化膜37が延びる方向においては、開口部Sを横切って額縁平坦化膜37を覆うように、額縁配線38が形成される。 In addition, as shown in FIGS. 6 and 7, in the direction in which the island-shaped frame flattening film 37 extends, the frame wiring 38 is formed so as to cover the frame flattening film 37 across the opening S.

 次に、有機EL素子18を覆うように、例えば、窒化シリコン膜等の無機絶縁膜をプラズマCVD(Chemical Vapor Deposition)法により厚さ数10nm~数μm程度に成膜して、第1無機膜25形成する。 Next, an inorganic insulating film such as a silicon nitride film is formed to a thickness of about several tens nm to several μm by a plasma CVD (Chemical Vapor Deposition) method so as to cover the organic EL element 18. 25 are formed.

 次に、第1無機膜25が形成された基板の表面全体に、例えば、アクリレート等の有機樹脂材料をインクジェット法により厚さ数μm~数10μm程度に吐出して、有機膜26を形成する。 Next, an organic resin material such as acrylate is discharged to a thickness of about several μm to several tens μm by an ink jet method on the entire surface of the substrate on which the first inorganic film 25 is formed, thereby forming the organic film 26.

 さらに、有機膜26が形成された基板に対して、例えば、窒化シリコン膜等の無機絶縁膜をプラズマCVD法により厚さ数10nm~数μm程度に成膜して、第2無機膜27を形成することにより、第1無機膜25、有機膜26及び第2無機膜27からなる封止膜28を形成する。 Further, on the substrate on which the organic film 26 is formed, an inorganic insulating film such as a silicon nitride film is formed to a thickness of about several tens nm to several μm by a plasma CVD method to form a second inorganic film 27. Thus, a sealing film 28 including the first inorganic film 25, the organic film 26, and the second inorganic film 27 is formed.

 以上のようにして、本実施形態の有機EL表示装置50aを製造することができる。 有機 As described above, the organic EL display device 50a of the present embodiment can be manufactured.

 《第2の実施形態》
 次に、本発明の第2の実施形態について説明する。図9~図10は、本実施形態に係る有機EL表示装置の折り曲げ部の断面図である。なお、有機EL表示装置の全体構成は、上述の第1の実施形態の場合と同じであるため、ここでは詳しい説明を省略する。また、上記第1の実施形態と同様の構成部分については同一の符号を付してその説明を省略する。
<< 2nd Embodiment >>
Next, a second embodiment of the present invention will be described. 9 and 10 are cross-sectional views of a bent portion of the organic EL display device according to the present embodiment. Note that the overall configuration of the organic EL display device is the same as that of the above-described first embodiment, and a detailed description thereof will be omitted here. The same components as those in the first embodiment are denoted by the same reference numerals, and description thereof is omitted.

 図9~図10に示すように、本実施形態においては、折り曲げ部Gにおいて、額縁平坦化膜37が、ベースコート膜11上に設けられている。従って、折り曲げ部Gにおいて、ソース配線38の段切れを防止することができる。 As shown in FIGS. 9 and 10, in the present embodiment, the frame flattening film 37 is provided on the base coat film 11 in the bent portion G. Accordingly, disconnection of the source line 38 at the bent portion G can be prevented.

 また、図9~図10に示すように、折り曲げ部Gにおけるベースコート膜11の厚みをT、折り曲げ部G以外におけるベースコート膜11の厚みをTとした場合に、T<Tの関係が成立する。従って、折り曲げ部Gのベースコート膜11において、クラックの発生を抑制することができる。 Further, as shown in FIGS. 9 to 10, when the thickness of the base coat film 11 in the bent portion G and T 1, the thickness of the base coat film 11 in the non-bent portion G and T 2, T 1 <T 2 relationship Holds. Therefore, the occurrence of cracks in the base coat film 11 at the bent portion G can be suppressed.

 なお、ベースコート膜11は、樹脂基板層10の表面に、例えば、CVD法により、酸化シリコン膜や窒化シリコン膜等を厚さ50nm~1000nm程度に成膜して形成することができ、本実施形態においては、折り曲げ部Gにおけるベースコート膜11の厚みTが表示領域D(折り曲げ部G以外)におけるベースコート膜11の厚みTよりも小さくなるように形成する。 The base coat film 11 can be formed on the surface of the resin substrate layer 10 by, for example, forming a silicon oxide film, a silicon nitride film, or the like to a thickness of about 50 nm to 1000 nm by a CVD method. in is formed to a thickness T 1 of the base coat film 11 is smaller than the thickness T 2 of the base coat film 11 in the display region D (other than bent portion G) of the bent portion G.

 また、折り曲げ部Gにおいて、ベースコート膜11を残すことにより、額縁配線38をエッチングする際の、樹脂基板層10におけるドライダストの発生を防止でき、歩留まりが向上する。 {Circle around (4)} By leaving the base coat film 11 in the bent portion G, the generation of dry dust in the resin substrate layer 10 when the frame wiring 38 is etched can be prevented, and the yield is improved.

 《その他の実施形態》
 上述の額縁平坦化膜37を形成する際に、フォトマスクとして、ハーフトーンマスクを使用して露光処理(ハーフトーン露光処理)することにより、額縁平坦化膜37を形成する樹脂材料に対して照射される露光量を制御し、図11に示すように、なだらかな断面形状(略円形状や略楕円形状等)を有する額縁平坦化膜37を形成する構成としてもよい。
<< Other embodiments >>
When the frame flattening film 37 is formed, the resin material forming the frame flattening film 37 is irradiated by performing exposure processing (halftone exposure processing) using a halftone mask as a photomask. As shown in FIG. 11, the exposure amount to be controlled may be controlled to form the frame flattening film 37 having a gentle cross-sectional shape (such as a substantially circular shape or a substantially elliptical shape).

 この場合、図11~図12に示すように、額縁平坦化膜37の表面と側面の全面を覆う額縁配線の断面形状は、略円弧状を有することになる。 In this case, as shown in FIGS. 11 and 12, the cross-sectional shape of the frame wiring covering the entire surface and side surfaces of the frame flattening film 37 has a substantially arc shape.

 このような構成により、額縁平坦化膜37の露出がなくなるため、ドライエッチングにより額縁配線38を形成する際に、装置汚染を防止することができる。 (4) With such a configuration, the frame flattening film 37 is not exposed, so that when the frame wiring 38 is formed by dry etching, device contamination can be prevented.

 上記実施形態における有機EL表示装置50aでは、正孔注入層、正孔輸送層、発光層、電子輸送層及び電子注入層の5層積層構造の有機EL層を例示したが、有機EL層は、例えば、正孔注入層兼正孔輸送層、発光層、及び電子輸送層兼電子注入層の3層積層構造であってもよい。 In the organic EL display device 50a according to the above embodiment, an organic EL layer having a five-layer structure of a hole injection layer, a hole transport layer, a light emitting layer, an electron transport layer, and an electron injection layer is exemplified. For example, a three-layer structure of a hole injection layer and a hole transport layer, a light emitting layer, and an electron transport layer and an electron injection layer may be employed.

 また、上記各実施形態では、第1電極を陽極とし、第2電極を陰極とした有機EL表示装置を例示したが、本発明は、有機EL層の積層構造を反転させ、第1電極を陰極とし、第2電極を陽極とした有機EL表示装置にも適用することができる。 Further, in each of the above embodiments, the organic EL display device in which the first electrode is used as an anode and the second electrode is used as a cathode is exemplified. However, the present invention inverts the stacked structure of the organic EL layer and uses the first electrode as a cathode. It can be applied to an organic EL display device using the second electrode as an anode.

 また、上記各実施形態では、第1電極に接続されたTFTの電極をソース電極とした有機EL表示装置を例示したが、本発明は、第1電極に接続されたTFTの電極をドレイン電極と呼ぶ有機EL表示装置にも適用することができる。 Further, in each of the above embodiments, the organic EL display device in which the electrode of the TFT connected to the first electrode is used as the source electrode is exemplified. However, in the present invention, the electrode of the TFT connected to the first electrode is referred to as the drain electrode. It can also be applied to an organic EL display device called.

 また、上記各実施形態では、表示装置として有機EL表示装置を例示したが、本発明は、電流によって駆動される複数の発光素子を備えた表示装置、例えば、量子ドット含有層を用いた発光素子であるQLED(Quantum-dot light emitting diode)を備えた表示装置に適用することができる。 Further, in each of the above embodiments, the organic EL display device is exemplified as the display device. However, the present invention provides a display device including a plurality of light emitting elements driven by current, for example, a light emitting element using a quantum dot-containing layer. The present invention can be applied to a display device having a QLED (Quantum-dot-light-emitting-diode).

 以上説明したように、本発明は、有機EL表示装置等の表示装置について有用である。 As described above, the present invention is useful for a display device such as an organic EL display device.

 3  発光層
 10  樹脂基板層(樹脂基板)
 11  ベースコート膜
 13  ゲート絶縁膜
 14  ゲート線
 15  第1層間絶縁膜
 17  第2層間絶縁膜
 18a  ソース電極
 18c  ソース電極
 18f  ソース配線(金属層)
 18g  電源線
 19a  平坦化膜
 20a  TFT層
 21  第1電極(金属電極)
 23  有機EL層
 24  第2電極
 30  有機EL素子(発光素子)
 36  無機積層膜(無機絶縁膜)
 37  額縁平坦化膜
 38  額縁配線
 39  表面保護層
 40  層間絶縁膜
 43a、43b  ゲート導電層(第2導電層)
 50a  有機EL表示装置
 A  画素領域
 D  表示領域
 F  額縁領域
 G  折り曲げ部
3 light emitting layer 10 resin substrate layer (resin substrate)
Reference Signs List 11 base coat film 13 gate insulating film 14 gate line 15 first interlayer insulating film 17 second interlayer insulating film 18a source electrode 18c source electrode 18f source wiring (metal layer)
18g Power line 19a Flattening film 20a TFT layer 21 First electrode (metal electrode)
23 organic EL layer 24 second electrode 30 organic EL element (light emitting element)
36 Inorganic laminated film (inorganic insulating film)
37 frame flattening film 38 frame wiring 39 surface protection layer 40 interlayer insulating film 43a, 43b gate conductive layer (second conductive layer)
50a Organic EL display device A Pixel region D Display region F Frame region G Bent portion

Claims (13)

 樹脂基板と、
 前記樹脂基板上に設けられた平坦化膜を有するTFT層と、
 前記TFT層を介して設けられ、表示領域を構成する発光素子と、
 前記表示領域の周囲に設けられた額縁領域と、
 前記額縁領域の端部に設けられた端子部と、
 前記表示領域及び端子部の間に設けられた折り曲げ部と、
 前記額縁領域に設けられ、前記樹脂基板上に積層された上記TFT層を構成する少なくとも1層の無機絶縁膜と
 を備えた表示装置であって、
 前記TFT層は、金属層を有し、
 前記折り曲げ部において、前記少なくとも1層の無機絶縁膜に開口部が形成され、前記開口部に額縁平坦化膜が設けられ、該額縁平坦化膜上に、前記金属層と同一の金属材料により形成された複数の額縁配線が設けられ、
 前記額縁配線は、前記表示領域内の配線に電気的に接続され、
 前記額縁平坦化膜が、前記複数の額縁配線毎に島状に設けられるとともに、前記額縁配線が前記額縁平坦化膜の表面と側面の全面を覆うことを特徴とする表示装置。
A resin substrate,
A TFT layer having a flattening film provided on the resin substrate,
A light-emitting element provided via the TFT layer and constituting a display area;
A frame area provided around the display area;
A terminal portion provided at an end of the frame region,
A bent portion provided between the display region and the terminal portion,
A display device comprising: at least one inorganic insulating film that is provided in the frame region and that constitutes the TFT layer laminated on the resin substrate;
The TFT layer has a metal layer,
In the bent portion, an opening is formed in the at least one layer of the inorganic insulating film, a frame flattening film is provided in the opening, and the same metal material as the metal layer is formed on the frame flattening film. A plurality of frame wirings are provided,
The frame wiring is electrically connected to a wiring in the display area,
The display device, wherein the frame flattening film is provided in an island shape for each of the plurality of frame wirings, and the frame wiring covers the entire surface and side surfaces of the frame flattening film.
 前記折り曲げ部において、前記開口部に充填されるとともに前記複数の額縁配線を覆う表面保護層が設けられていることを特徴とする請求項1に記載の表示装置。 2. The display device according to claim 1, wherein a surface protection layer that fills the opening and covers the plurality of frame wirings is provided in the bent portion. 3.  前記発光素子は、該発光素子の発光領域が区画されるエッジカバーを備え、
 前記表面保護層は、前記エッジカバーと同層で、かつ、同一材料により形成されていることを特徴とする請求項2に記載の表示装置。
The light emitting device includes an edge cover that defines a light emitting region of the light emitting device,
The display device according to claim 2, wherein the surface protection layer is the same layer as the edge cover and is formed of the same material.
 前記金属層が、チタン/アルミニウム/チタンからなる3層構造であることを特徴とする請求項1~請求項3のいずれか1項に記載の表示装置。 The display device according to any one of claims 1 to 3, wherein the metal layer has a three-layer structure of titanium / aluminum / titanium.  前記樹脂基板上にベースコート膜が設けられ、
 前記折り曲げ部において、前記額縁平坦化膜は、前記ベースコート膜上に設けられていることを特徴とする請求項1~請求項4のいずれか1項に記載の表示装置。
A base coat film is provided on the resin substrate,
The display device according to claim 1, wherein the frame flattening film is provided on the base coat film in the bent portion.
 前記折り曲げ部における前記ベースコート膜の厚みをT、前記表示領域における前記ベースコート膜の厚みをTとした場合に、T<Tの関係が成立することを特徴とする請求項5に記載の表示装置。 The relationship of T 1 <T 2 is satisfied when the thickness of the base coat film in the bent portion is T 1 and the thickness of the base coat film in the display area is T 2. Display device.  前記ベースコート膜が、無機絶縁膜により形成されていることを特徴とする請求項5または請求項6に記載の表示装置。 7. The display device according to claim 5, wherein the base coat film is formed of an inorganic insulating film.  前記額縁配線の断面形状が略円弧状であることを特徴とする請求項1~請求項7のいずれか1項に記載の表示装置。 (8) The display device according to any one of (1) to (7), wherein the cross-sectional shape of the frame wiring is substantially arc-shaped.  前記額縁平坦化膜は前記開口部を跨ぐように設けられていることを特徴とする請求項1~請求項8のいずれか1項に記載の表示装置。 The display device according to any one of claims 1 to 8, wherein the frame flattening film is provided so as to straddle the opening.  前記額縁平坦化膜がポリイミド樹脂により形成されていることを特徴とする請求項1~請求項9のいずれか1項に記載の表示装置。 (10) The display device according to any one of (1) to (9), wherein the frame flattening film is formed of a polyimide resin.  前記額縁平坦化膜がアクリル樹脂又はエポキシ樹脂により形成されていることを特徴とする請求項1~請求項9のいずれか1項に記載の表示装置。 (10) The display device according to any one of (1) to (9), wherein the frame flattening film is formed of an acrylic resin or an epoxy resin.  前記発光素子は、有機EL素子であることを特徴とする請求項1~請求項11のいずれか1項に記載の表示装置。 The display device according to any one of claims 1 to 11, wherein the light emitting element is an organic EL element.  樹脂基板と、
 前記樹脂基板上に設けられた平坦化膜を有するTFT層と、
 前記TFT層を介して設けられ、表示領域を構成する発光素子と、
 前記表示領域の周囲に設けられた額縁領域と、
 前記額縁領域の端部に設けられた端子部と、
 前記表示領域及び端子部の間に設けられた折り曲げ部と、
 前記額縁領域に設けられ、前記樹脂基板上に積層された上記TFT層を構成する少なくとも1層の無機絶縁膜と
 を備え、
 前記TFT層は、金属層を有し、
 前記折り曲げ部において、前記少なくとも1層の無機絶縁膜に開口部が形成され、前記開口部に額縁平坦化膜が設けられ、該額縁平坦化膜上に、前記金属層と同一の金属材料により形成された複数の額縁配線が設けられ、
 前記額縁配線が、前記表示領域内の配線に電気的に接続された表示装置の製造方法であって、
 前記折り曲げ部において、前記少なくとも一層の無機絶縁膜に該無機絶縁膜を貫通する開口部を形成する工程と、
 前記開口部において、前記額縁平坦化膜を島状に形成する工程と、
 前記額縁平坦化膜の表面と側面の全面を覆うように、前記金属層を成膜した後、該金属層をドライエッチングによりパターニングすることにより、前記額縁平坦化膜の表面と側面の全面を覆う額縁配線を形成する工程と
 を備えることを特徴とする表示装置の製造方法。
A resin substrate,
A TFT layer having a flattening film provided on the resin substrate,
A light-emitting element provided via the TFT layer and constituting a display area;
A frame area provided around the display area;
A terminal portion provided at an end of the frame region,
A bent portion provided between the display region and the terminal portion,
At least one inorganic insulating film provided in the frame region and constituting the TFT layer laminated on the resin substrate;
The TFT layer has a metal layer,
In the bent portion, an opening is formed in the at least one layer of the inorganic insulating film, a frame flattening film is provided in the opening, and the same metal material as the metal layer is formed on the frame flattening film. A plurality of frame wirings are provided,
A method for manufacturing a display device, wherein the frame wiring is electrically connected to a wiring in the display area,
In the bent portion, a step of forming an opening through the inorganic insulating film in the at least one inorganic insulating film,
Forming the frame flattening film in an island shape in the opening;
After the metal layer is formed so as to cover the entire surface and side surfaces of the frame flattening film, the metal layer is patterned by dry etching to cover the entire surface and side surfaces of the frame flattening film. Forming a frame wiring. A method for manufacturing a display device, comprising:
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