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WO2019058442A1 - Display device and method for driving display device - Google Patents

Display device and method for driving display device Download PDF

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Publication number
WO2019058442A1
WO2019058442A1 PCT/JP2017/033859 JP2017033859W WO2019058442A1 WO 2019058442 A1 WO2019058442 A1 WO 2019058442A1 JP 2017033859 W JP2017033859 W JP 2017033859W WO 2019058442 A1 WO2019058442 A1 WO 2019058442A1
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WO
WIPO (PCT)
Prior art keywords
sub
measurement
pixels
display device
pixel
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
PCT/JP2017/033859
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French (fr)
Japanese (ja)
Inventor
彬 野村
中野 武俊
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Sharp Corp
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Sharp Corp
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Publication date
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Priority to PCT/JP2017/033859 priority Critical patent/WO2019058442A1/en
Publication of WO2019058442A1 publication Critical patent/WO2019058442A1/en
Anticipated expiration legal-status Critical
Ceased legal-status Critical Current

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    • GPHYSICS
    • G09EDUCATION; CRYPTOGRAPHY; DISPLAY; ADVERTISING; SEALS
    • G09GARRANGEMENTS OR CIRCUITS FOR CONTROL OF INDICATING DEVICES USING STATIC MEANS TO PRESENT VARIABLE INFORMATION
    • G09G3/00Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes
    • G09G3/20Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters
    • G09G3/22Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters using controlled light sources
    • G09G3/30Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters using controlled light sources using electroluminescent panels
    • G09G3/32Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters using controlled light sources using electroluminescent panels semiconductive, e.g. using light-emitting diodes [LED]
    • G09G3/3208Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters using controlled light sources using electroluminescent panels semiconductive, e.g. using light-emitting diodes [LED] organic, e.g. using organic light-emitting diodes [OLED]
    • G09G3/3225Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters using controlled light sources using electroluminescent panels semiconductive, e.g. using light-emitting diodes [LED] organic, e.g. using organic light-emitting diodes [OLED] using an active matrix
    • G09G3/3233Control arrangements or circuits, of interest only in connection with visual indicators other than cathode-ray tubes for presentation of an assembly of a number of characters, e.g. a page, by composing the assembly by combination of individual elements arranged in a matrix no fixed position being assigned to or needed to be assigned to the individual characters or partial characters using controlled light sources using electroluminescent panels semiconductive, e.g. using light-emitting diodes [LED] organic, e.g. using organic light-emitting diodes [OLED] using an active matrix with pixel circuitry controlling the current through the light-emitting element

Definitions

  • the present invention relates to a display device and a method of driving the display device.
  • the voltage drop of a self-light-emitting element is measured with a voltage detection circuit, and the voltage applied to the said self-light-emitting element is adjusted based on the said voltage drop.
  • Patent Document 1 does not describe how to provide the voltage detection circuit for measuring the voltage drop of the self light emitting element.
  • a display device includes a plurality of display sub-pixels provided in an active area contributing to the display of an image, and a plurality of measurement sub-pixels outside the active area and not contributing to the display of the image. And the plurality of display sub-pixels are provided with a light-emitting layer, a first electrode provided for each of the plurality of display sub-pixels, and a second electrode disposed opposite to the first electrode with the light-emitting layer interposed therebetween.
  • a plurality of measurement sub-pixels including an electrode, a light emitting layer, a first electrode provided for each of the plurality of measurement sub-pixels, and a first electrode disposed opposite to the first electrode with the light emitting layer interposed therebetween
  • a measurement circuit including two electrodes and measuring a voltage value between the first electrode and the second electrode is connected to each of the plurality of measurement sub-pixels.
  • a method of driving a display device is a method of driving a display device, wherein the display device includes a plurality of display sub-pixels provided in an active region contributing to the display of an image, and the active region And a plurality of measurement sub-pixels that do not contribute to the display of the image, the plurality of display sub-pixels being a light emitting layer, a first electrode provided for each of the plurality of display sub-pixels, and the light emission
  • the plurality of measurement sub-pixels include a light emitting layer, a first electrode provided for each of the plurality of measurement sub-pixels, and a plurality of measurement sub-pixels including a second electrode disposed opposite to the first electrode with a layer interposed therebetween.
  • the voltage applied to the light emitting layer can be adjusted according to the degree of deterioration of the light emitting layer.
  • FIG. 2 is a plan view showing a pixel of the display device of Embodiment 1.
  • FIG. 2 is a diagram illustrating a configuration of a sub-pixel circuit disposed in the sub-pixel of Embodiment 1.
  • FIG. 6 is a diagram illustrating the configuration of a sub-pixel circuit and a measurement circuit arranged in the measurement sub-pixel of Embodiment 1.
  • FIG. 2 is a functional block diagram showing a configuration of a deterioration information generation unit of Embodiment 1.
  • FIG. 7 is a diagram showing an active area and a dummy area of the display device of Embodiment 2.
  • FIG. 6 is a diagram showing a flowchart of voltage compensation operation of the display device of Embodiment 1.
  • FIG. 13 is a diagram illustrating a flowchart of voltage compensation operation of the display device of Embodiment 2.
  • FIG. 6 is a diagram showing the relationship between the gradation voltage applied to the light emitting element of Embodiment 1 and the luminance.
  • FIG. 6 is a graph showing the relationship between the potential difference between both ends of the light emitting element of Embodiment 1 and the luminance.
  • FIG. 7 is a diagram illustrating a configuration of a display device according to a first modified example of the first embodiment.
  • FIG. 16 is a diagram illustrating a configuration of a display device according to a second modified example of the first embodiment.
  • FIG. 1 is a flowchart showing an example of a method of manufacturing a display device.
  • FIG. 2 is a cross-sectional view showing a configuration example of the display unit of the display device 2.
  • FIG. 3 is a plan view showing a configuration example of the display device 2.
  • “same layer” means being formed of the same material in the same process
  • “lower layer” means being formed in a process earlier than the layer to be compared
  • “Upper layer” means that it is formed in a later process than the layer to be compared.
  • the resin layer 12 is formed on a translucent support substrate (for example, a mother glass substrate) (step S1).
  • the barrier layer 3 is formed (step S2).
  • the TFT layer 4 including the terminal TM and the terminal wiring TW is formed (step S3).
  • a top emission type light emitting element layer for example, an OLED element layer
  • the sealing layer 6 is formed (step S5).
  • an upper film is attached on the sealing layer 6 (step S6).
  • the lower surface of the resin layer 12 is irradiated with laser light through the support substrate to reduce the bonding strength between the support substrate and the resin layer 12, and the support substrate is peeled off from the resin layer 12 (step S7).
  • the lower film 10 is attached to the lower surface of the resin layer 12 (step S8).
  • the laminate including the lower surface film 10, the resin layer 12, the barrier layer 3, the TFT layer 4, the light emitting element layer 5, and the sealing layer 6 is divided to obtain a plurality of pieces (step S9).
  • the functional film 39 is attached to the obtained piece (step S10).
  • an electronic circuit board for example, an IC chip
  • step S11 an electronic circuit board
  • edge folding processing to fold the bent portion CL in FIG. 3 by 180 degrees
  • a disconnection inspection is performed, and if there is a disconnection, correction is performed (step S13).
  • the below-mentioned display device manufacturing apparatus performs said each step.
  • Examples of the material of the resin layer 12 include polyimide, epoxy, polyamide and the like. Examples of the material of the lower film 10 include polyethylene terephthalate (PET).
  • the barrier layer 3 is a layer that prevents moisture and impurities from reaching the TFT layer 4 and the light emitting element layer 5 when the display device 2 is used.
  • the TFT layer 4 includes the semiconductor film 15, the inorganic insulating film 16 (gate insulating film) above the semiconductor film 15, the gate electrode GE above the inorganic insulating film 16, and the inorganic insulating layer above the gate electrode GE.
  • the thin film transistor Tr is configured to include the semiconductor film 15, the inorganic insulating film 16 (gate insulating film), and the gate electrode GE.
  • a dummy region DM adjacent to and surrounding the outer periphery of the active region AC is formed.
  • the semiconductor film 15 is made of, for example, low temperature polysilicon (LTPS) or an oxide semiconductor.
  • LTPS low temperature polysilicon
  • FIG. 2 shows a TFT in which the semiconductor film 15 is a channel in a top gate structure, it may have a bottom gate structure (for example, when the channel of the TFT is an oxide semiconductor).
  • Al aluminum
  • tungsten W
  • Mo molybdenum
  • Ta tantalum
  • Cr chromium
  • titanium gate electrode GE, capacitance electrode CE, source wiring SH, terminal wiring TW, and terminal TM
  • It is comprised by the single layer film or laminated film of the metal containing at least one of Ti) and copper (Cu).
  • the inorganic insulating films 16, 18 and 20 can be formed of, for example, a silicon oxide (SiOx) film, a silicon nitride (SiNx) film, or a laminated film thereof formed by a CVD method.
  • SiOx silicon oxide
  • SiNx silicon nitride
  • the planarizing film (interlayer insulating film) 21 can be made of, for example, a coatable photosensitive organic material such as polyimide or acrylic.
  • the light emitting element layer 5 (for example, an organic light emitting diode layer) has an anode 22 (first electrode, second electrode) above the planarization film 21, a bank 23 covering the edge of the anode 22, and an upper layer above the anode 22.
  • anode 22 first electrode, second electrode
  • the cathode 25 second electrode, first electrode
  • an island-shaped anode 22 EL
  • a light emitting element for example, an OLED: organic light emitting diode
  • the anode 22 and the cathode 25 are opposed to each other with the EL layer 24 interposed therebetween.
  • the bank 23 (anode edge cover) can be made of, for example, a coatable photosensitive organic material such as polyimide or acrylic.
  • the EL layer 24 is configured, for example, by laminating a hole injection layer, a hole transport layer, a light emitting layer, an electron transport layer, and an electron injection layer in order from the lower layer side.
  • the light emitting layer is formed in an island shape for each sub-pixel by a vapor deposition method or an ink jet method, but the other layers can also be a solid common layer.
  • the structure which does not form one or more layers among a positive hole injection layer, a positive hole transport layer, an electron carrying layer, and an electron injection layer is also possible.
  • the anode (anode) 22 is formed of, for example, a laminate of ITO (Indium Tin Oxide) and an alloy containing Ag, and has light reflectivity.
  • the cathode 25 can be made of a light-transmitting conductive material such as ITO (Indium Tin Oxide) or IZO (Indium Zincum Oxide).
  • the drive current between the anode 22 and the cathode 25 causes holes and electrons to recombine in the EL layer 24 and the resulting excitons fall to the ground state, whereby light is generated. Released. Since the cathode 25 is translucent and the anode 22 is light reflective, the light emitted from the EL layer 24 is directed upward to be top emission.
  • the light emitting element layer 5 is not limited to forming an OLED element, and may form an inorganic light emitting diode or a quantum dot light emitting diode.
  • the sealing layer 6 is translucent, and the first inorganic sealing film 26 covering the cathode 25, the organic sealing film 27 formed on the upper side of the first inorganic sealing film 26, and the organic sealing film 27. And a second inorganic sealing film 28 covering the The sealing layer 6 covering the light emitting element layer 5 prevents the penetration of foreign matter such as water and oxygen into the light emitting element layer 5.
  • Each of the first inorganic sealing film 26 and the second inorganic sealing film 28 may be formed of, for example, a silicon oxide film, a silicon nitride film, a silicon oxynitride film, or a laminated film thereof formed by CVD. it can.
  • the organic sealing film 27 is a translucent organic film that is thicker than the first inorganic sealing film 26 and the second inorganic sealing film 28, and is made of a coatable photosensitive organic material such as polyimide or acrylic. Can.
  • the lower surface film 10 is for adhering to the lower surface of the resin layer 12 after peeling off the support substrate to realize a display device excellent in flexibility.
  • Examples of the material include PET and the like.
  • the functional film 39 has, for example, an optical compensation function, a touch sensor function, a protection function, and the like.
  • step S5 the case of manufacturing a flexible display device
  • step S9 the process proceeds from step S5 to step S9 in FIG.
  • FIG. 4 is a plan view showing a pixel of the display device 2 in the first embodiment.
  • the display device 2 includes, in the display portion, source wirings SH arranged in parallel to each other and gate wirings GH arranged in parallel to each other. Each source wiring SH and each gate wiring GH are orthogonal to each other. A pixel area is formed in an area divided into each source wiring SH and each gate wiring GH.
  • a source driver 41 connected to each source wiring SH, a gate driver 42 connected to each gate wiring, and a deterioration information generation unit 50 are disposed outside the display unit.
  • the source driver 41 supplies a driving voltage, which is a voltage value corresponding to an image to be displayed, via each source wiring SH to each anode 22 (see FIG. 2), and the gate driver 42 scans each gate wiring GH. Display an image in the active area AC.
  • the details of the deterioration information generation unit 50 will be described later.
  • the display unit of the display device 2 is provided with an active area AC contributing to the display of an image, and a dummy area DM surrounding the outer periphery of the active area AC and not contributing to the display of the image. ing.
  • pixels PIX are provided in a matrix in the active region AC.
  • the pixel PIX has a plurality of sub-pixels SP.
  • the pixel PIX includes a red sub-pixel RSP having a light-emitting layer emitting red light, a green sub-pixel GSP having a light-emitting layer emitting green light, and a blue sub-pixel BSP having a light-emitting layer emitting blue light.
  • the sub-pixels SP are in a stripe arrangement in which the red sub-pixels RSP, the green sub-pixels GSP, and the blue sub-pixels BSP are aligned in a straight line, but the arrangement of the sub-pixels SP is It may be an array.
  • each sub-pixel SP is provided with the light-emitting element including the anode 22, the EL layer 24, and the cathode 25 and the sub-pixel circuit PC including the thin film transistor Tr (TFT).
  • the red sub-pixel RSP is provided with an EL layer 24 for emitting red light
  • the green sub-pixel GSP is provided with an EL layer 24 for emitting green light
  • the blue sub-pixel BSP is provided with an EL layer 24 for emitting blue light. Is provided.
  • the EL layer 24 of each sub-pixel SP is sealed by the sealing layer 6.
  • a plurality of dummy sub-pixels DSP arranged in the same pattern as the sub-pixels SP are arranged in a matrix.
  • the dummy sub-pixel DSP is outside the active area AC and adjacent to the active area AC.
  • the dummy sub-pixel DSP is provided to secure positional accuracy of a mask for forming a vapor deposition film of the sub-pixel SP in the active region AC.
  • the dummy sub-pixel DSP is formed in the same process as the sub-pixel SP. Similar to the sub-pixel SP, the dummy sub-pixel DSP is provided with a light-emitting element including the anode 22, the EL layer 24, and the cathode 25 and a sub-pixel circuit PC including a thin film transistor Tr (TFT).
  • TFT thin film transistor Tr
  • the dummy sub-pixel DSP only needs to be provided with at least the EL layer 24 and the cathode 25, and the dummy sub-pixel DSP may not be provided except the EL layer 24 and the cathode 25.
  • the dummy sub-pixel DSP does not contribute to the display of the image. In the dummy area DM, since a pixel circuit contributing to display is unnecessary, a measurement circuit can be provided in the dummy area DM.
  • a measurement circuit MC is further provided in part of the plurality of dummy sub-pixels DSP.
  • the measurement circuit MSC is a circuit for sensing the degree of deterioration of the EL layer 24 by measuring the voltage value between the anode 22 and the cathode 25 as described later.
  • the dummy sub-pixel DSP to which the measurement circuit MC is connected is referred to as a measurement sub-pixel MSP.
  • the measurement sub-pixel MSP is provided outside the active region AC and adjacent to the active region AC. Further, in the dummy region DM, a region where the measurement sub-pixel MSP is provided is referred to as a measurement region MA.
  • the plurality of measurement sub-pixels MSP are provided for each emission color of the plurality of sub-pixels SP.
  • a plurality of measurement pixels MPIX including a pair of measurement sub-pixels arranged in the same arrangement as the plurality of sub-pixels SP constituting one pixel PIX are provided adjacent to the active region AC.
  • the measurement pixel MPIX has a red measurement sub-pixel RMSP, a green measurement sub-pixel GMSP, and a blue measurement sub-pixel BMSP.
  • the red measurement sub-pixel RMSP has a light emitting layer that emits the same red light as the red sub-pixel RSP.
  • the green measurement sub-pixel GMSP has a light emitting layer that emits the same green light as the green sub-pixel GSP.
  • the blue measurement sub-pixel BMSP has a light emitting layer that emits the same blue light as the blue sub-pixel BSP.
  • the measurement circuit MC provided in the red measurement sub-pixel RMSP is referred to as a red measurement circuit RMC
  • the measurement circuit MC provided in the green measurement sub-pixel GMSP is referred to as a green measurement circuit GMC
  • the measurement provided in the blue measurement sub-pixel BMSP The circuit MC is referred to as the blue measuring circuit BMC.
  • the position where the measurement area MA is provided is not limited to the position adjacent to the four corners of the active area AC, but may be provided adjacent to the side between the corners of the active area AC.
  • the number of measurement areas MA may be one to three, or five or more.
  • the number of measurement pixels MPIX provided in each measurement area MA may be less than three or four or more.
  • the measurement circuit MC may be electrically connected to the dummy sub-pixel DSP (the measurement sub-pixel MSP), and is not provided in the dummy sub-pixel DSP (the measurement sub-pixel MSP). It may be provided outside the measurement area MA and in the dummy area DM.
  • the plurality of measurement sub-pixels MSP are preferably shielded from light in order not to contribute to display.
  • the bent portion CL may be interposed between the measurement area MA (that is, the measurement sub-pixel MSP) and the active area AC.
  • the dummy area DM including the plurality of measurement sub-pixels MSP can be bent by 180 degrees so as not to contribute to the display.
  • FIG. 5 is a diagram showing the configuration of the sub-pixel circuit PC provided in the sub-pixel SP of the first embodiment.
  • FIG. 6 is a diagram showing the configuration of the sub-pixel circuit PC and the measurement circuit MC provided in the measurement sub-pixel MSP of the first embodiment. 5 and 6 show the configuration of the sub-pixel circuit PC corresponding to m columns and n rows.
  • the configuration of the sub-pixel circuit PC described here is an example, and other configurations may be adopted.
  • m source wirings SH [m] and n gate wirings GH [n] orthogonal to these source wirings SH [m] are disposed in the display portion of the display device 2.
  • m and n are arbitrary natural numbers.
  • a light emission control line em [n] is provided to correspond to each gate wiring GH [n] on a one-to-one basis.
  • a power supply line common to the sub-pixel circuits PC is formed. More specifically, a high level power supply line ELVDD for supplying ELVDD (high level power supply voltage) for driving the light emitting element OLED, and a low level power supply for supplying ELVSS (low level power supply voltage) for driving the light emitting element OLED.
  • An initialization power supply line Vini [n] for supplying lines ELVSS and Vini (initialization voltage) is provided.
  • the sub-pixel circuit PC provided in the sub-pixel SP and the sub-pixel circuit PC provided in the measurement sub-pixel MSP have the same configuration. This is to match the degree of deterioration of the measurement sub-pixel MSP with time to the degree of deterioration of the sub-pixel SP.
  • the video signal supplied to the measurement sub-pixel MSP is, for example, an average video signal of all the sub-pixels of each color.
  • the sub-pixel circuit PC is supplied with ELVDD from the high level power supply line ELVDD, and controls the drive voltage applied to the EL layer 24 (see FIG. 2) included in the light emitting element OLED.
  • the sub-pixel circuit PC includes one light emitting element OLED, seven transistors T1 to T7, and one capacitor C1.
  • the transistors T1 to T7 are, for example, p-channel thin film transistors (TFTs).
  • TFTs thin film transistors
  • the capacitor C1 is a capacitive element formed of two electrodes and an insulating film sandwiched therebetween.
  • the light emitting element OLED is a light emitting diode, and corresponds to the light emitting element layer 5 (see FIG. 2). That is, the light emitting device OLED includes an anode 22 (see FIG. 2), an EL layer 24 and a cathode 25. A drive voltage corresponding to an image to be displayed is supplied from the source driver 41 to the anode 22. The cathode 25 is supplied with ELVSS which is a constant voltage different from ELVDD.
  • the transistor T1 is an initialization transistor
  • the transistor T2 is a threshold voltage compensation transistor
  • the transistor T3 is a write control transistor
  • the transistor T4 is a drive transistor
  • the transistor T5 is a power supply control transistor
  • the transistor T6 is a light emission
  • the transistor T7 is a control transistor
  • the transistor T7 is an anode charge discharge transistor of the light emitting element OLED.
  • the high level power supply circuit (not shown) is connected to the capacitor C1 and the transistor T5 via the high level power supply line ELVDD.
  • the gate electrode is connected to the gate wiring GH [n-1], the source electrode is connected to the initialization power supply line Vini [n], and the drain electrode is connected to the capacitor C1 and the gate electrode of the transistor T4. ing.
  • the transistor T2 compensates for the threshold voltage of the transistor T4.
  • the gate electrode is connected to the gate wiring GH [n] and the gate electrode of the transistor T3
  • the source electrode is connected between the drain electrode of the transistor T4 and the source electrode of the transistor T6, and the drain electrode is a transistor It is connected to the gate electrode of T4 and between the capacitor C1 and the drain electrode of the transistor T1.
  • the gate electrode of the transistor T3 is connected to the gate wiring GH [n] and the gate electrode of the transistor T2, the source electrode is connected to the source wiring SH [m], and the drain electrode is connected to the source electrode of the transistor T4 and the transistor It is connected to the drain electrode of T5.
  • the transistor T4 has a gate electrode connected to the drain electrode of the transistor T2 and a capacitor C1 connected between the drain electrodes of the transistor T1, and a source electrode connected between the drain electrode of the transistor T3 and the drain electrode of the transistor T5.
  • the drain electrode is connected to the source electrode of the transistor T2 and the source electrode of the transistor T6.
  • the transistor T5 has a gate electrode connected to the light emission control line em [n] and the gate electrode of the transistor T6, a source electrode connected to the high level power supply line ELVDD and the capacitor C1, and a drain electrode connected to the source of the transistor T4. It is connected to the electrode and the drain electrode of the transistor T3.
  • the gate electrode of the transistor T6 is connected to the light emission control line em [n] and the gate electrode of the transistor T5, the source electrode is connected to the drain electrode of the transistor T4 and the source electrode of the transistor T2, and the drain electrode emits light It is connected to the anode of the element OLED and the drain electrode of the transistor T7.
  • the transistor T7 is a transistor for resetting the charge accumulated in the anode of the light emitting element OLED immediately before writing data in the light emitting element OLED.
  • the gate electrode of the transistor T7 is connected to the gate wiring GH [n]
  • the source electrode is connected to the initialization power supply line Vini [n]
  • the drain electrode is the drain electrode of the transistor T6 and the anode of the light emitting element OLED. Connected with.
  • one end of the measurement circuit MC is connected to the anode of the light emitting element OLED, and the other end is connected to the cathode of the light emitting element OLED.
  • the measurement circuit MC measures the voltage VF between the anode and the cathode of the light emitting element OLED, and outputs the measured voltage value of the voltage VF to the deterioration information generation unit 50 as measurement data.
  • FIG. 7 is a functional block diagram showing the configuration of the deterioration information generation unit 50.
  • FIG. 9 is a diagram illustrating a flowchart of the voltage compensation operation of the display device 2 according to the first embodiment.
  • FIG. 11 is a diagram showing the relationship between the gradation voltage applied to the light emitting element OLED and the luminance.
  • FIG. 12 is a diagram showing the relationship between the potential difference between both ends of the light emitting element OLED and the luminance.
  • the degradation information generation unit 50 includes a red degradation information generation unit 51R, a green degradation information generation unit 51G, a blue degradation information generation unit 51B, and a data storage unit 52.
  • luminance data representing the relationship between the voltage value and the luminance value is stored for each luminescent color.
  • red brightness data indicating the relationship between the voltage value of the light emitting layer emitting red light and the brightness
  • green brightness indicating the relationship between the voltage value of the light emitting layer emitting green light and the brightness
  • blue brightness data indicating the relationship between the voltage value of the light emitting layer that emits blue light and the brightness are stored.
  • FIG. 11 and 12 show an example of the luminance data stored in the data storage unit 52.
  • FIG. 11 and 12 show an example of the luminance data stored in the data storage unit 52.
  • Data 1 to data 6 in FIG. 12 are source signals supplied from the source driver 41 to the respective source electrodes according to the image (according to the gradation).
  • the display device 2 performs a voltage compensation operation.
  • the voltage compensation operation is to adjust the drive voltage supplied to the anode 22 by the source driver 41 in accordance with the deterioration state of the light emitting layer.
  • the degradation information generation unit 50 generates degradation information indicating the degradation state of the light emitting element OLED based on the voltage value measured by the measurement circuit MC, and the source based on the degradation information
  • the driver 41 adjusts the drive voltage to be supplied to the anode 22.
  • the timing at which the display device 2 performs this voltage compensation operation may be performed when the power of the display device 2 is turned on, or may be performed at predetermined intervals (in this case, the output of a normal video signal is stopped) Or when the power of the display device 2 is turned off, it may be other timing.
  • the source driver 41 selects each of the measurement areas MA (four in this embodiment).
  • the measurement voltage is supplied to the measurement sub-pixel MSP (in this embodiment, nine measurement sub-pixels ⁇ 4 in this embodiment) (step T2).
  • the measurement voltage is, for example, a voltage having an arbitrary gradation such as 0 gradation or 255 gradation.
  • each measurement circuit MC in this embodiment, nine measurement sub-pixels ⁇ four in this embodiment
  • each measurement area MA four in the present embodiment
  • ELVSS The voltage VF between the cathodes 25 supplied is output as measurement data to the deterioration information generation unit 50 (step T3).
  • each red measurement circuit RMS (in this embodiment, three red measurement circuits ⁇ 4 locations) is supplied with the anode 22 to which the measurement voltage is supplied, and ELVSS.
  • the voltage VF across the cathode 25 is output to the red degradation information generation unit 51R as red measurement data.
  • each green measuring circuit GMS (three green measuring circuits ⁇ 4 in this embodiment) includes an anode 22 to which a measuring voltage is supplied and a cathode 25 to which ELVSS is supplied in each green measuring sub-pixel GMP. Voltage VF is output to the green deterioration information generation unit 51G as green measurement data.
  • each blue measurement circuit BMS (in this embodiment, three blue measurement circuits ⁇ 4 locations) is between the anode 22 to which the measurement voltage is supplied and the cathode 25 to which ELVSS is supplied.
  • the voltage VF is output to the blue deterioration information generation unit 51B as blue measurement data.
  • the deterioration information generation unit 50 averages the voltage value indicated by the measurement data supplied from each measurement circuit MS for each luminescent color, and calculates the average measurement data for each luminescent color that is the average value (step T4). . Then, the deterioration information generation unit 50 compares the average measurement data with the luminance data stored in the data storage unit 52 for each luminescent color (step T5). Then, the deterioration information generation unit 50 calculates, for each light emission color, the difference value between the voltage value indicated by the average measurement data and the voltage value that achieves the desired luminance, and uses the calculated voltage value as the deterioration information for each light emission color. It outputs to the driver 41 (step T6).
  • the red deterioration information generation unit 51R averages the voltage values indicated by the red measurement data supplied from the respective red measurement circuits RMS (in the present embodiment, an average of three red measurement circuits ⁇ four locations); Average red measurement data, which is an average value, is calculated (step T4). Then, the red deterioration information generation unit 51R compares the average red measurement data with the red luminance data stored in the data storage unit 52 (step T5). Then, the red measurement circuit RMS calculates the difference between the voltage value indicated by the average red measurement data and the voltage value that achieves the desired luminance, and outputs the calculated voltage value as the degradation information to the source driver 41 (step T6). ).
  • the green deterioration information generation unit 51G averages the voltage values indicated by the green measurement data supplied from the respective green measurement circuits GMS (in the present embodiment, an average of three green measurement circuits ⁇ four locations), and A certain average green measurement data is calculated (step T4). Then, the green deterioration information generation unit 51G compares the average green measurement data with the green luminance data stored in the data storage unit 52 (step T5). Then, the green degradation information generation unit 51G calculates the difference value between the voltage value indicated by the average green measurement data and the voltage value that achieves the desired luminance, and outputs the calculated voltage value to the source driver 41 as degradation information ( Step T6).
  • the blue deterioration information generation unit 51B averages the voltage values indicated by the blue measurement data supplied from the respective blue measurement circuits BMS (in the present embodiment, an average of three blue measurement circuits ⁇ four locations), and A certain average blue measurement data is calculated (step T4). Then, the blue deterioration information generation unit 51B compares the average blue measurement data with the blue luminance data stored in the data storage unit 52 (step T5). Then, the blue deterioration information generation unit 51B calculates the difference value between the voltage value indicated by the average blue measurement data and the voltage value that achieves the desired luminance, and outputs the calculated voltage value to the source driver 41 as deterioration information ( Step T6).
  • the source driver 41 sets the anodes of all sub-pixels SP and all measurement sub-pixels MSP for each light emission color included in the active area AC.
  • the driving voltage to be supplied to 22 is adjusted for each luminescent color (step T7).
  • the source driver 41 supplies the anodes 22 of all red sub pixels RSP and all red measurement sub pixels RMSP included in the active area AC. Adjustment is performed by raising and shifting the driving voltage for driving by the value indicated by the deterioration information (step T7).
  • the source driver 41 is for supplying to all the anodes 22 of the all green sub-pixel GSP and the all-green measurement sub-pixel GMSP included in the active region AC based on the deterioration information supplied from the green deterioration information generation unit 51G.
  • the drive voltage is adjusted by raising and shifting only the value indicated by the deterioration information (step T7).
  • the source driver 41 is configured to supply to the respective anodes 22 of the all blue sub-pixels BSP and all blue measurement sub-pixels BMSP included in the active region AC based on the deterioration information supplied from the blue deterioration information generation unit 51B.
  • the drive voltage is adjusted by raising and shifting only the value indicated by the deterioration information (step T7).
  • step T8 the voltage compensation operation ends (step T8).
  • the process may return to step T2, change the measurement voltage, and perform the voltage compensation operation again.
  • the display device 2 has the plurality of measurement sub-pixels MSP outside the active area AC and not contributing to the display of the image.
  • the plurality of measurement sub-pixels MSP include a light-emitting layer, an anode 22 provided for each of the plurality of measurement sub-pixels, and a cathode 25 opposite to the anode 22 with the light-emitting layer interposed therebetween.
  • the measurement sub-pixel MSP is connected to each measurement sub-pixel MSP and includes a measurement circuit MC that measures the voltage value of the voltage VF between the anode 22 and the cathode 25.
  • the drive voltage supplied to the anode 22 can be adjusted in accordance with the degree of deterioration of the light emitting element OLED.
  • the display device 2 further includes a deterioration information generation unit 50 that generates deterioration information indicating a deterioration state of the light emitting layer based on the voltage value measured by the measurement circuit MS. Then, the source driver 41 adjusts the drive voltage to be supplied to each anode 22 based on the deterioration information generated by the deterioration information generation unit 50. Thus, the drive voltage supplied to the anode 22 can be adjusted according to the degree of deterioration of the light emitting layer.
  • the deterioration information generation unit 50 calculates deterioration information for each emission color of the light emitting layer from the voltage value measured by each measurement circuit MC in the plurality of measurement sub-pixels MSP. Then, the source driver 41 adjusts the drive voltage to be supplied to each anode 22 based on the deterioration information for each luminescent color of the luminescent layer. As a result, even if the degree of deterioration is different for each luminescent color of the light emitting layer, it is possible to adjust the optimum drive voltage for each luminescent color.
  • the deterioration information generation unit 50 measures the voltage values measured by the respective measurement circuits MC in the plurality of measurement sub-pixels MSP (in this embodiment, nine measurement sub-pixels ⁇ 4 locations), and the data storage unit.
  • the deterioration information is calculated for each emission color of the light emitting layer by averaging the difference values with the voltage value as the desired luminance stored in 52.
  • the source driver 41 adjusts the drive voltage to be supplied to each sub-pixel SP of the active region AC for each emission color of the emission layer based on the deterioration information for each emission color of the emission layer. Therefore, it is easy to adjust the drive voltage supplied to each sub-pixel SP in the active region AC.
  • the measurement sub-pixel MSP is shielded from light so that the light emission of the measurement sub-pixel MSP outside the active region AC is not viewed by the user during the voltage compensation operation.
  • the measurement sub-pixel MSP may not be shielded from light.
  • step T2 of FIG. 9 the measurement voltage is supplied to each measurement sub-pixel MSP.
  • the measurement voltage not the measurement voltage but the drive voltage of the image to be displayed in the active area AC may be supplied to each measurement sub-pixel MSP.
  • an average voltage of drive voltages of all the display sub-pixels corresponding to the color of the measurement sub-pixel MSP is supplied to the measurement sub-pixel MSP as a drive voltage (step T2).
  • a drive voltage For example, to the red measurement sub-pixel RMP, an average voltage of drive voltages of all the red sub-pixels RSP included in the active region AC is supplied as a drive voltage.
  • an average voltage of the drive voltages of all the green sub-pixels GSP included in the active region AC is supplied as a drive voltage.
  • an average voltage of drive voltages of all blue sub-pixels BSP included in the active area AC is supplied to the blue measurement sub-pixel BMP as a drive voltage.
  • each measurement sub-pixel MP outputs the voltage VF between the anode 22 and the cathode 25 as measurement data to the deterioration information generation unit 50 (step T3).
  • Step T4 and subsequent steps are the same as the steps described using FIG.
  • the voltage compensation operation can be performed without stopping the image displayed in the active area AC.
  • FIG. 8 is a diagram illustrating an active area and a dummy area of the display device 2 according to the second embodiment.
  • FIG. 10 is a diagram illustrating a flowchart of the voltage compensation operation of the display device 2 according to the second embodiment.
  • the display device 2 may virtually divide the active area AC into a plurality of areas, and adjust the drive voltage supplied to each anode 22 for each of the divided areas.
  • the active region AC when performing the voltage compensation operation, for example, the active region AC is virtually divided into four.
  • the upper left region of the paper is referred to as a first active region AC1
  • the upper right region is referred to as a second active region AC2
  • the lower left region is referred to as a third active region AC3
  • the lower right region is a fourth active region AC4. It is called.
  • a measurement area is provided adjacent to each of the divided areas of the active area AC.
  • the first measurement area MA1 is provided adjacent to the first active area AC1
  • the second measurement area MA2 is provided adjacent to the second active area AC2
  • the third measurement is adjacent to the third active area AC3.
  • An area MA3 is provided
  • a fourth measurement area MA4 is provided adjacent to the fourth active area AC4.
  • the number of measurement pixels MPIX provided in each of the first measurement area MA1 to the fourth measurement area MA4 may be only one pixel or may be two or more pixels.
  • Each of the first measurement area MA1 to the fourth measurement area MA4 has a plurality of measurement sub-pixels MSP.
  • the first measurement area MA1 to the fourth measurement area MA4 each include a red measurement sub-pixel RMSP, a green measurement sub-pixel GMSP, and a blue measurement sub-pixel BMSP.
  • the number of divisions of the active area AC is not limited to four, and may be divided into three or less, or five or more. However, one or more measurement areas are provided adjacent to each divided area.
  • the display device 2 When performing the voltage compensation operation, the display device 2 performs the same process from step T1 to T3. The process after step T4 is performed for each of the plurality of divided active areas AC. According to this, the drive voltage supplied to the anode 22 can be adjusted more accurately according to the degree of deterioration of the light emitting element OLED.
  • the display device 2 After the step T3, the display device 2 performs the following processing in place of the steps T4 to T7, and ends the compensation operation (step T8).
  • the degradation information generation unit 50 (the red degradation information generation unit 51R, the green degradation information generation unit 51G, the blue degradation information generation unit 51B) (see FIG. 7)
  • the voltage value indicated by the measurement data supplied from each measurement circuit MC (red measurement circuit RMC, green measurement circuit GMC, blue measurement circuit BMC) in the plurality of measurement sub-pixels MSP included in the first measurement area MA1 adjacent to AC1 Averaging is performed for each luminescent color, and first average measurement data for each luminescent color, which is an average value, is calculated (step T4a).
  • the deterioration information generation unit 50 (red deterioration information generation unit 51R, green deterioration information generation unit 51G, blue deterioration information generation unit 51B) (see FIG. 7) is provided in the second measurement area MA2 adjacent to the second active area AC2.
  • the voltage values indicated by the measurement data supplied from each of the measurement circuits MC (red measurement circuit RMC, green measurement circuit GMC, blue measurement circuit BMC) in the plurality of measurement subpixels included are averaged for each luminescent color and averaged Second average measurement data for each luminescent color is calculated (step T4b).
  • the deterioration information generation unit 50 (red deterioration information generation unit 51R, green deterioration information generation unit 51G, blue deterioration information generation unit 51B) (see FIG. 7) is located in the third measurement area MA3 adjacent to the third active area AC3.
  • the voltage values indicated by the measurement data supplied from each of the measurement circuits MC (red measurement circuit RMC, green measurement circuit GMC, blue measurement circuit BMC) in the plurality of measurement subpixels included are averaged for each luminescent color and averaged
  • the third average measurement data for each luminescent color is calculated (step T4c).
  • the deterioration information generation unit 50 (red deterioration information generation unit 51R, green deterioration information generation unit 51G, blue deterioration information generation unit 51B) (see FIG. 7) is located in the fourth measurement area MA4 adjacent to the fourth active area AC4.
  • the voltage values indicated by the measurement data supplied from each of the measurement circuits MC (red measurement circuit RMC, green measurement circuit GMC, blue measurement circuit BMC) in the plurality of measurement subpixels included are averaged for each luminescent color and averaged
  • the fourth average measurement data for each luminescent color is calculated (step T4d).
  • the deterioration information generation unit 50 (red deterioration information generation unit 51R, green deterioration information generation unit 51G, blue deterioration information generation unit 51B) outputs the first average measurement data and the luminance data stored in the data storage unit 52. Are compared for each luminescent color (step T5a).
  • the deterioration information generation unit 50 (red deterioration information generation unit 51R, green deterioration information generation unit 51G, blue deterioration information generation unit 51B) includes the second average measurement data and the luminance data stored in the data storage unit 52. Are compared for each luminescent color (step T5b).
  • the deterioration information generation unit 50 (red deterioration information generation unit 51R, green deterioration information generation unit 51G, blue deterioration information generation unit 51B) includes the third average measurement data and the luminance data stored in the data storage unit 52. Are compared for each luminescent color (step T5c).
  • the deterioration information generation unit 50 (red deterioration information generation unit 51R, green deterioration information generation unit 51G, blue deterioration information generation unit 51B) includes the fourth average measurement data and the luminance data stored in the data storage unit 52. Are compared for each luminescent color (step T5d).
  • the deterioration information generation unit 50 calculates the voltage value indicated by the first average measurement data and the voltage value that achieves the desired luminance. A difference value is calculated for each luminescent color, and the calculated voltage value is output to the source driver 41 for each luminescent color as first deterioration information (step T6a).
  • the deterioration information generation unit 50 (red deterioration information generation unit 51R, green deterioration information generation unit 51G, blue deterioration information generation unit 51B) generates a voltage value indicated by the second average measurement data and a voltage value that achieves a desired luminance.
  • a difference value is calculated for each luminescent color, and the calculated voltage value is output to the source driver 41 for each luminescent color as second deterioration information (step T6b).
  • the deterioration information generation unit 50 red deterioration information generation unit 51R, green deterioration information generation unit 51G, blue deterioration information generation unit 51B
  • the deterioration information generation unit 50 generates a voltage value indicated by the third average measurement data and a voltage value that achieves a desired luminance.
  • a difference value is calculated for each luminescent color, and the calculated voltage value is output to the source driver 41 for each luminescent color as third deterioration information (step T6c).
  • the deterioration information generation unit 50 (red deterioration information generation unit 51R, green deterioration information generation unit 51G, blue deterioration information generation unit 51B) generates a voltage value indicated by the fourth average measurement data and a voltage value that achieves a desired luminance. A difference value is calculated for each luminescent color, and the calculated voltage value is output to the source driver 41 for each luminescent color as fourth deterioration information (step T6d).
  • the source driver 41 based on the first deterioration information for each luminescent color supplied from the deterioration information generation unit 50 (red deterioration information generation unit 51R, green deterioration information generation unit 51G, and blue deterioration information generation unit 51B), the source driver 41 The drive voltage to be supplied to each anode 22 of all the sub-pixels SP and all the measurement sub-pixels MSP for each luminescent color included in the first active region AC1 is adjusted for each luminescent color (step T7a).
  • the source driver 41 is based on the second deterioration information for each luminescent color supplied from the deterioration information generation unit 50 (red deterioration information generation unit 51R, green deterioration information generation unit 51G, blue deterioration information generation unit 51B).
  • the drive voltages to be supplied to all the sub-pixels SP for each light emission color and each anode 22 of all the measurement sub-pixels MSP included in the second active region AC2 are adjusted for each light emission color (step T7b).
  • the source driver 41 is based on the third deterioration information for each light emission color supplied from the deterioration information generation unit 50 (red deterioration information generation unit 51R, green deterioration information generation unit 51G, blue deterioration information generation unit 51B).
  • the drive voltages to be supplied to all the sub-pixels SP for each light emission color and each anode 22 of all the measurement sub-pixels MSP included in the third active region AC3 are adjusted for each light emission color (step T7c).
  • the source driver 41 is based on the fourth deterioration information for each luminescent color supplied from the deterioration information generation unit 50 (red deterioration information generation unit 51R, green deterioration information generation unit 51G, blue deterioration information generation unit 51B).
  • the drive voltages to be supplied to all the sub-pixels SP for each light-emission color and each anode 22 of all the measurement sub-pixels MSP included in the fourth active region AC4 are adjusted for each light-emission color (step T7d).
  • step T8 the voltage compensation operation ends (step T8).
  • the process may return to step T2, change the measurement voltage, and perform the voltage compensation operation again.
  • the order of steps T4a to T4d is arbitrary and may be processed in parallel
  • the order of steps T5a to T5d may be arbitrary and may be parallel processing
  • the order of steps T6a to T6d is arbitrary and may be processed in parallel
  • the order of steps T7a to T7d is arbitrary and may be processed in parallel.
  • the deterioration degree of the light emitting element included in each sub pixel may be different between the sub pixel at the end of the active region AC and the sub pixel at the center. Therefore, the display device 2 may change the degree of adjusting the drive voltage between the sub-pixels at the end included in the active region AC and the sub-pixels in the center.
  • the voltage compensation operation in the present embodiment is the same as that of the first embodiment (FIG. 9) in steps T1 to T5.
  • the deterioration information generation unit 50 calculates, for each luminescent color, the difference value between the voltage value indicated by the average measurement data and the voltage value that achieves the desired luminance, and further, from the sub-pixel at the end of the active area AC
  • the voltage value calculated so as to increase or decrease the correction amount toward the sub-pixel is output to the source driver 41 for each luminescent color as degradation information (step T6).
  • the subsequent steps T7 to T8 are the same as in the first embodiment (FIG. 9).
  • the drive voltage of the light emitting element can be accurately adjusted between the end and the central part of the active region AC.
  • the electro-optical elements included in the display device according to the present embodiment are not particularly limited.
  • the display device according to the present embodiment includes, for example, an organic EL (Electro Luminescence) display provided with an OLED (Organic Light Emitting Diode) as an electro-optical element, and an inorganic light emitting diode as an electro-optical element Inorganic EL display, a QLED display provided with a QLED (Quantum dot Light Emitting Diode) as an electro-optical element, and the like.
  • a display device includes a plurality of display sub-pixels provided in an active area contributing to the display of an image, and a plurality of measurement sub-pixels outside the active area and not contributing to the display of an image. And the plurality of display sub-pixels are provided with a light-emitting layer, a first electrode provided for each of the plurality of display sub-pixels, and a second electrode disposed opposite to the first electrode with the light-emitting layer interposed therebetween.
  • a plurality of measurement sub-pixels including an electrode, a light emitting layer, a first electrode provided for each of the plurality of measurement sub-pixels, and a first electrode disposed opposite to the first electrode with the light emitting layer interposed therebetween
  • a measurement circuit including two electrodes and measuring a voltage value between the first electrode and the second electrode is connected to each of the plurality of measurement sub-pixels.
  • the deterioration information generation unit generates the deterioration information indicating the deterioration state of the light emitting layer based on the voltage value measured by the measurement circuit; And a source driver for adjusting a drive voltage which is a voltage value according to the display to be supplied to the first electrodes.
  • the plurality of measurement sub-pixels are provided for each light emission color of the plurality of display sub-pixels, and the deterioration information generation unit
  • the deterioration information is calculated for each light emission color from the voltage value measured by each measurement circuit in the measurement sub-pixel, and the source driver adjusts the drive voltage based on the deterioration information for each light emission color.
  • the average voltage of the drive voltages of all the sub-pixels included in the active region corresponding to the color of the measurement sub-pixel It may be supplied.
  • the deterioration information generation unit averages voltage values measured by the respective measurement circuits in the plurality of measurement sub-pixels, and the average is the average value.
  • the degradation information which is the difference between the measurement data and the voltage value that produces the desired luminance, is calculated for each of the luminescent colors, and the source driver supplies the display sub-pixels in the active area based on the degradation information.
  • the drive voltage for adjusting the light emission color is adjusted for each light emission color.
  • the active area has a plurality of areas including a first area and a second area, and the plurality of measurement sub-pixels are the first area.
  • the deterioration information generation unit is configured to measure each of the measurement circuits in the plurality of measurement sub-pixels adjacent to the first area.
  • the first deterioration information which is the difference between the first measurement data, which is the average value of the measured voltage values, and the voltage value that produces the desired brightness, is calculated for each of the luminescent colors.
  • Calculating second degradation information which is a difference value between a second measurement data that is an average value of voltage values measured by each measurement circuit in each of the measurement sub-pixels and a voltage value that achieves a desired luminance
  • the source driver is based on the first deterioration information.
  • the drive voltage to be supplied to each display sub-pixel in the first area is adjusted for each light emission color, and is supplied to each display sub-pixel in the second area based on the second deterioration information.
  • the drive voltage is adjusted for each of the luminescent colors.
  • the deterioration information generation unit determines the voltage value measured by each measurement circuit in the plurality of measurement sub-pixels to the center from the display sub-pixel at the end.
  • the deterioration information is calculated for each of the luminescent colors such that the correction amount increases or decreases toward the display sub-pixel.
  • the plurality of measurement sub-pixels are shielded from light.
  • a plurality of dummy sub-pixels that do not contribute to the display of the image are provided adjacent to the active region.
  • the measurement circuit is configured by being provided in the dummy sub-pixel.
  • the degradation information generation unit when the display device is activated, the degradation information generation unit generates the degradation information, and the source driver performs the driving based on the degradation information. Adjust the voltage.
  • a dummy area is provided around the active area, and the measurement sub-pixel and the measurement circuit are provided in the dummy area.
  • a bending portion which is an area for bending the display device may be provided between the active region and the measurement sub-pixel .
  • the degradation information generation unit generates the degradation information at predetermined time intervals, and the source driver generates the drive voltage based on the degradation information. adjust.
  • the method of driving a display device is a method of driving a display device, wherein the display device includes a plurality of display sub-pixels provided in an active region contributing to the display of an image, and the active region And a plurality of measurement sub-pixels that do not contribute to the display of the image, the plurality of display sub-pixels being a light emitting layer, a first electrode provided for each of the plurality of display sub-pixels, and the light emission
  • the plurality of measurement sub-pixels include a light emitting layer, a first electrode provided for each of the plurality of measurement sub-pixels, and a plurality of measurement sub-pixels including a second electrode disposed opposite to the first electrode with a layer interposed therebetween.

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Abstract

表示デバイス(2)は、アクティブ領域(AC)外であって画像の表示に寄与しない複数の測定サブ画素(MSP)を有し、測定サブ画素(MSP)は、アノード(22)及びカソード(25)間の電圧値を測定する測定回路(MC)と接続されている。これにより、発光層の劣化度合いに応じて、当該発光層への印加電圧を調整する。The display device (2) comprises a plurality of measurement sub-pixels (MSP) outside the active area (AC) and not contributing to the display of the image, the measurement sub-pixels (MSP) comprising an anode (22) and a cathode (25). ) Is connected to a measurement circuit (MC) that measures the voltage value between them). Thus, the voltage applied to the light emitting layer is adjusted in accordance with the degree of deterioration of the light emitting layer.

Description

表示デバイス及び表示デバイスの駆動方法Display device and driving method of display device

 本発明は、表示デバイス及び表示デバイスの駆動方法に関する。 The present invention relates to a display device and a method of driving the display device.

 特許文献1では、自発光素子の電圧降下を電圧検出回路にて測定し、当該電圧降下に基づいて、上記自発光素子に印加する電圧を調整している。 In patent document 1, the voltage drop of a self-light-emitting element is measured with a voltage detection circuit, and the voltage applied to the said self-light-emitting element is adjusted based on the said voltage drop.

日本国公開特許公報「特開2001‐56670号公報」Japanese Patent Publication "Japanese Patent Application Laid-Open No. 2001-56670"

 特許文献1によると、上記自発光素子の電圧降下を測定する上記電圧検出回路をどのように設けるのか記載されていない。 Patent Document 1 does not describe how to provide the voltage detection circuit for measuring the voltage drop of the self light emitting element.

 本発明の一態様に係る表示デバイスは、画像の表示に寄与するアクティブ領域に設けられた複数の表示サブ画素と、上記アクティブ領域外であって画像の表示に寄与しない複数の測定サブ画素とを有し、上記複数の表示サブ画素は、発光層、上記複数の表示サブ画素毎に設けられた第1電極、及び、当該発光層を介在させて上記第1電極と対向配置されている第2電極を含み、上記複数の測定サブ画素は、発光層、上記複数の測定サブ画素毎に設けられた第1電極、及び、当該発光層を介在させて上記第1電極と対向配置されている第2電極を含み、上記複数の測定サブ画素毎に、上記第1電極及び第2電極間の電圧値を測定する測定回路が接続されていることを特徴とする。 A display device according to an aspect of the present invention includes a plurality of display sub-pixels provided in an active area contributing to the display of an image, and a plurality of measurement sub-pixels outside the active area and not contributing to the display of the image. And the plurality of display sub-pixels are provided with a light-emitting layer, a first electrode provided for each of the plurality of display sub-pixels, and a second electrode disposed opposite to the first electrode with the light-emitting layer interposed therebetween. A plurality of measurement sub-pixels including an electrode, a light emitting layer, a first electrode provided for each of the plurality of measurement sub-pixels, and a first electrode disposed opposite to the first electrode with the light emitting layer interposed therebetween A measurement circuit including two electrodes and measuring a voltage value between the first electrode and the second electrode is connected to each of the plurality of measurement sub-pixels.

 本発明の一態様に係る表示デバイスの駆動方法は、表示デバイスの駆動方法であって、上記表示デバイスは、画像の表示に寄与するアクティブ領域に設けられた複数の表示サブ画素と、上記アクティブ領域外であって画像の表示に寄与しない複数の測定サブ画素とを有し、上記複数の表示サブ画素は、発光層、上記複数の表示サブ画素毎に設けられた第1電極、及び、当該発光層を介在させて上記第1電極と対向配置されている第2電極を含み、上記複数の測定サブ画素は、発光層、上記複数の測定サブ画素毎に設けられた第1電極、及び、当該発光層を介在させて上記第1電極と対向配置されている第2電極を含み、上記複数の測定サブ画素毎に接続されたそれぞれの測定回路によって、当該測定サブ画素に含まれる上記第1電極及び第2電極間の電圧値を測定するステップを有することを特徴とする。 A method of driving a display device according to an aspect of the present invention is a method of driving a display device, wherein the display device includes a plurality of display sub-pixels provided in an active region contributing to the display of an image, and the active region And a plurality of measurement sub-pixels that do not contribute to the display of the image, the plurality of display sub-pixels being a light emitting layer, a first electrode provided for each of the plurality of display sub-pixels, and the light emission The plurality of measurement sub-pixels include a light emitting layer, a first electrode provided for each of the plurality of measurement sub-pixels, and a plurality of measurement sub-pixels including a second electrode disposed opposite to the first electrode with a layer interposed therebetween. The first electrode included in the measurement sub-pixel by the respective measurement circuits connected to each of the plurality of measurement sub-pixels including the second electrode arranged to face the first electrode with the light emitting layer interposed therebetween. And Characterized by the step of measuring a voltage value between the electrodes.

 本発明の一態様によれば、発光層の劣化度合いに応じて、当該発光層への印加電圧を調整することができるという効果を奏する。 According to one aspect of the present invention, the voltage applied to the light emitting layer can be adjusted according to the degree of deterioration of the light emitting layer.

表示デバイスの製造方法の一例を示すフローチャートである。It is a flowchart which shows an example of the manufacturing method of a display device. 表示デバイスの表示部の構成例を示す断面図である。It is sectional drawing which shows the structural example of the display part of a display device. 表示デバイスの構成例を示す平面図である。It is a top view which shows the structural example of a display device. 実施形態1の表示デバイスの画素を示す平面図である。FIG. 2 is a plan view showing a pixel of the display device of Embodiment 1. 実施形態1のサブ画素に配置されているサブ画素回路の構成を表す図である。FIG. 2 is a diagram illustrating a configuration of a sub-pixel circuit disposed in the sub-pixel of Embodiment 1. 実施形態1の測定サブ画素に配置されているサブ画素回路及び測定回路の構成を表す図である。FIG. 6 is a diagram illustrating the configuration of a sub-pixel circuit and a measurement circuit arranged in the measurement sub-pixel of Embodiment 1. 実施形態1の劣化情報生成部の構成を表す機能ブロック図である。FIG. 2 is a functional block diagram showing a configuration of a deterioration information generation unit of Embodiment 1. 実施形態2の表示デバイスのアクティブ領域及びダミー領域を表す図である。FIG. 7 is a diagram showing an active area and a dummy area of the display device of Embodiment 2. 実施形態1の表示デバイスの電圧補償動作のフローチャートを表す図である。FIG. 6 is a diagram showing a flowchart of voltage compensation operation of the display device of Embodiment 1. 実施形態2の表示デバイスの電圧補償動作のフローチャートを表す図である。FIG. 13 is a diagram illustrating a flowchart of voltage compensation operation of the display device of Embodiment 2. 実施形態1の発光素子に加えられる階調電圧と輝度との関係を表す図である。FIG. 6 is a diagram showing the relationship between the gradation voltage applied to the light emitting element of Embodiment 1 and the luminance. 実施形態1の発光素子の両端の電位差と輝度との関係を表す図である。FIG. 6 is a graph showing the relationship between the potential difference between both ends of the light emitting element of Embodiment 1 and the luminance. 実施形態1の第1変形例に係る表示デバイスの構成を表す図である。FIG. 7 is a diagram illustrating a configuration of a display device according to a first modified example of the first embodiment. 実施形態1の第2変形例に係る表示デバイスの構成を表す図である。FIG. 16 is a diagram illustrating a configuration of a display device according to a second modified example of the first embodiment.

 図1は表示デバイスの製造方法の一例を示すフローチャートである。図2は表示デバイス2の表示部の構成例を示す断面図である。図3は、表示デバイス2の構成例を示す平面図である。以下においては、「同層」とは同一プロセスにて同材料で形成されていることを意味し、「下層」とは、比較対象の層よりも先のプロセスで形成されていることを意味し、「上層」とは比較対象の層よりも後のプロセスで形成されていることを意味する。 FIG. 1 is a flowchart showing an example of a method of manufacturing a display device. FIG. 2 is a cross-sectional view showing a configuration example of the display unit of the display device 2. FIG. 3 is a plan view showing a configuration example of the display device 2. In the following, “same layer” means being formed of the same material in the same process, and “lower layer” means being formed in a process earlier than the layer to be compared , "Upper layer" means that it is formed in a later process than the layer to be compared.

 フレキシブルな表示デバイスを製造する場合、図1~図3に示すように、まず、透光性の支持基板(例えば、マザーガラス基板)上に樹脂層12を形成する(ステップS1)。次いで、バリア層3を形成する(ステップS2)。次いで、端子TMおよび端子配線TWを含むTFT層4を形成する(ステップS3)。次いで、トップエミッション型の発光素子層(例えば、OLED素子層)5を形成する(ステップS4)。次いで、封止層6を形成する(ステップS5)。次いで、封止層6上に上面フィルムを貼り付ける(ステップS6)。 In the case of manufacturing a flexible display device, first, as shown in FIGS. 1 to 3, the resin layer 12 is formed on a translucent support substrate (for example, a mother glass substrate) (step S1). Next, the barrier layer 3 is formed (step S2). Next, the TFT layer 4 including the terminal TM and the terminal wiring TW is formed (step S3). Next, a top emission type light emitting element layer (for example, an OLED element layer) 5 is formed (step S4). Next, the sealing layer 6 is formed (step S5). Then, an upper film is attached on the sealing layer 6 (step S6).

 次いで、支持基板越しに樹脂層12の下面にレーザ光を照射して支持基板および樹脂層12間の結合力を低下させ、支持基板を樹脂層12から剥離する(ステップS7)。次いで、樹脂層12の下面に下面フィルム10を貼り付ける(ステップS8)。次いで、下面フィルム10、樹脂層12、バリア層3、TFT層4、発光素子層5、封止層6を含む積層体を分断し、複数の個片を得る(ステップS9)。次いで、得られた個片に機能フィルム39を貼り付ける(ステップS10)。次いで、縁部分の端子TMに電子回路基板(例えば、ICチップ)をマウントする(ステップS11)。次いで、縁折り加工(図3の折り曲げ部CLを180度折り曲げる加工)を施し、表示デバイス2とする(ステップS12)。次いで、断線検査を行い、断線があれば修正を行う(ステップS13)。なお、前記各ステップは、後述の表示デバイス製造装置が行う。 Next, the lower surface of the resin layer 12 is irradiated with laser light through the support substrate to reduce the bonding strength between the support substrate and the resin layer 12, and the support substrate is peeled off from the resin layer 12 (step S7). Next, the lower film 10 is attached to the lower surface of the resin layer 12 (step S8). Next, the laminate including the lower surface film 10, the resin layer 12, the barrier layer 3, the TFT layer 4, the light emitting element layer 5, and the sealing layer 6 is divided to obtain a plurality of pieces (step S9). Next, the functional film 39 is attached to the obtained piece (step S10). Next, an electronic circuit board (for example, an IC chip) is mounted on the terminal TM of the edge portion (step S11). Next, edge folding (processing to fold the bent portion CL in FIG. 3 by 180 degrees) is performed to obtain the display device 2 (step S12). Next, a disconnection inspection is performed, and if there is a disconnection, correction is performed (step S13). In addition, the below-mentioned display device manufacturing apparatus performs said each step.

 樹脂層12の材料としては、例えば、ポリイミド、エポキシ、ポリアミド等が挙げられる。下面フィルム10の材料としては、例えばポリエチレンテレフタレート(PET)が挙げられる。 Examples of the material of the resin layer 12 include polyimide, epoxy, polyamide and the like. Examples of the material of the lower film 10 include polyethylene terephthalate (PET).

 バリア層3は、表示デバイス2の使用時に、水分や不純物が、TFT層4や発光素子層5に到達することを防ぐ層であり、例えば、CVDにより形成される、酸化シリコン膜、窒化シリコン膜、あるいは酸窒化シリコン膜、またはこれらの積層膜で構成することができる。 The barrier layer 3 is a layer that prevents moisture and impurities from reaching the TFT layer 4 and the light emitting element layer 5 when the display device 2 is used. For example, a silicon oxide film or a silicon nitride film formed by CVD Or a silicon oxynitride film, or a laminated film of these.

 TFT層4は、半導体膜15と、半導体膜15よりも上層の無機絶縁膜16(ゲート絶縁膜)と、無機絶縁膜16よりも上層のゲート電極GEと、ゲート電極GEよりも上層の無機絶縁膜18と、無機絶縁膜18よりも上層の容量配線CEと、容量配線CEよりも上層の無機絶縁膜20と、無機絶縁膜20よりも上層の、ソース配線SHおよび端子TMと、ソース配線SHおよび端子TMよりも上層の平坦化膜21とを含む。 The TFT layer 4 includes the semiconductor film 15, the inorganic insulating film 16 (gate insulating film) above the semiconductor film 15, the gate electrode GE above the inorganic insulating film 16, and the inorganic insulating layer above the gate electrode GE. Film 18, the capacitive wiring CE above the inorganic insulating film 18, the inorganic insulating film 20 above the capacitive wiring CE, the source wiring SH and the terminal TM above the inorganic insulating film 20, and the source wiring SH And a planarizing film 21 above the terminal TM.

 半導体膜15、無機絶縁膜16(ゲート絶縁膜)、およびゲート電極GEを含むように薄層トランジスタTr(TFT)が構成される。 The thin film transistor Tr (TFT) is configured to include the semiconductor film 15, the inorganic insulating film 16 (gate insulating film), and the gate electrode GE.

 TFT層4の非アクティブ領域NAには、ICチップ、FPC等の電子回路基板との接続に用いられる端子TMと、端子TMとアクティブ領域ACの配線等を繋ぐ端子配線TWと、アクティブ領域ACに隣接しアクティブ領域ACの外周を囲むダミー領域DMとが形成されている。 In the non-active area NA of the TFT layer 4, a terminal TM used for connection with an electronic circuit substrate such as an IC chip, an FPC, etc., a terminal wiring TW connecting the terminal TM and the wiring of the active area AC, etc. A dummy region DM adjacent to and surrounding the outer periphery of the active region AC is formed.

 半導体膜15は、例えば低温ポリシリコン(LTPS)あるいは酸化物半導体で構成される。なお、図2では、半導体膜15をチャネルとするTFTがトップゲート構造で示されているが、ボトムゲート構造でもよい(例えば、TFTのチャネルが酸化物半導体の場合)。 The semiconductor film 15 is made of, for example, low temperature polysilicon (LTPS) or an oxide semiconductor. Although FIG. 2 shows a TFT in which the semiconductor film 15 is a channel in a top gate structure, it may have a bottom gate structure (for example, when the channel of the TFT is an oxide semiconductor).

 ゲート電極GE、容量電極CE、ソース配線SH、端子配線TW、および端子TMは、例えば、アルミニウム(Al)、タングステン(W)、モリブデン(Mo)、タンタル(Ta)、クロム(Cr)、チタン(Ti)、銅(Cu)の少なくとも1つを含む金属の単層膜あるいは積層膜によって構成される。 For example, aluminum (Al), tungsten (W), molybdenum (Mo), tantalum (Ta), chromium (Cr), titanium (gate electrode GE, capacitance electrode CE, source wiring SH, terminal wiring TW, and terminal TM) are used. It is comprised by the single layer film or laminated film of the metal containing at least one of Ti) and copper (Cu).

 無機絶縁膜16・18・20は、例えば、CVD法によって形成された、酸化シリコン(SiOx)膜あるいは窒化シリコン(SiNx)膜またはこれらの積層膜によって構成することができる。 The inorganic insulating films 16, 18 and 20 can be formed of, for example, a silicon oxide (SiOx) film, a silicon nitride (SiNx) film, or a laminated film thereof formed by a CVD method.

 平坦化膜(層間絶縁膜)21は、例えば、ポリイミド、アクリル等の塗布可能な感光性有機材料によって構成することができる。 The planarizing film (interlayer insulating film) 21 can be made of, for example, a coatable photosensitive organic material such as polyimide or acrylic.

 発光素子層5(例えば、有機発光ダイオード層)は、平坦化膜21よりも上層のアノード22(第1電極、第2電極)と、アノード22のエッジを覆うバンク23と、アノード22よりも上層のEL(エレクトロルミネッセンス)層24と、EL層24よりも上層のカソード25(第2電極、第1電極)とを含み、サブ画素(表示サブ画素)SPごとに、島状のアノード22、EL層24、およびカソード25を含む発光素子(例えば、OLED:有機発光ダイオード)と、これを駆動するサブ画素回路とが設けられる。アノード22と、カソード25とは、EL層24を介在させて対向配置されている。 The light emitting element layer 5 (for example, an organic light emitting diode layer) has an anode 22 (first electrode, second electrode) above the planarization film 21, a bank 23 covering the edge of the anode 22, and an upper layer above the anode 22. Of the EL (electroluminescent) layer 24 and the cathode 25 (second electrode, first electrode) above the EL layer 24, and for each sub-pixel (display sub-pixel) SP, an island-shaped anode 22, EL A light emitting element (for example, an OLED: organic light emitting diode) including the layer 24 and the cathode 25 and a sub-pixel circuit for driving the light emitting element are provided. The anode 22 and the cathode 25 are opposed to each other with the EL layer 24 interposed therebetween.

 バンク23(アノードエッジカバー)は、例えば、ポリイミド、アクリル等の塗布可能な感光性有機材料によって構成することができる。 The bank 23 (anode edge cover) can be made of, for example, a coatable photosensitive organic material such as polyimide or acrylic.

 EL層24は、例えば、下層側から順に、正孔注入層、正孔輸送層、発光層、電子輸送層、電子注入層を積層することで構成される。発光層は、蒸着法あるいはインクジェット法によって、サブ画素ごとに島状に形成されるが、その他の層はベタ状の共通層とすることもできる。また、正孔注入層、正孔輸送層、電子輸送層、電子注入層のうち1以上の層を形成しない構成も可能である。 The EL layer 24 is configured, for example, by laminating a hole injection layer, a hole transport layer, a light emitting layer, an electron transport layer, and an electron injection layer in order from the lower layer side. The light emitting layer is formed in an island shape for each sub-pixel by a vapor deposition method or an ink jet method, but the other layers can also be a solid common layer. Moreover, the structure which does not form one or more layers among a positive hole injection layer, a positive hole transport layer, an electron carrying layer, and an electron injection layer is also possible.

 アノード(陽極)22は、例えばITO(Indium Tin Oxide)とAgを含む合金との積層によって構成され、光反射性を有する。カソード25は、ITO(Indium Tin Oxide)、IZO(Indium Zincum Oxide)等の透光性の導電材で構成することができる。 The anode (anode) 22 is formed of, for example, a laminate of ITO (Indium Tin Oxide) and an alloy containing Ag, and has light reflectivity. The cathode 25 can be made of a light-transmitting conductive material such as ITO (Indium Tin Oxide) or IZO (Indium Zincum Oxide).

 発光素子層5がOLED層である場合、アノード22およびカソード25間の駆動電流によって正孔と電子がEL層24内で再結合し、これによって生じたエキシトンが基底状態に落ちることによって、光が放出される。カソード25が透光性であり、アノード22が光反射性であるため、EL層24から放出された光は上方に向かい、トップエミッションとなる。 When the light emitting element layer 5 is an OLED layer, the drive current between the anode 22 and the cathode 25 causes holes and electrons to recombine in the EL layer 24 and the resulting excitons fall to the ground state, whereby light is generated. Released. Since the cathode 25 is translucent and the anode 22 is light reflective, the light emitted from the EL layer 24 is directed upward to be top emission.

 発光素子層5は、OLED素子を構成する場合に限られず、無機発光ダイオードあるいは量子ドット発光ダイオードを構成してもよい。 The light emitting element layer 5 is not limited to forming an OLED element, and may form an inorganic light emitting diode or a quantum dot light emitting diode.

 封止層6は透光性であり、カソード25を覆う第1無機封止膜26と、第1無機封止膜26よりも上側に形成される有機封止膜27と、有機封止膜27を覆う第2無機封止膜28とを含む。発光素子層5を覆う封止層6は、水、酸素等の異物の発光素子層5への浸透を防いでいる。 The sealing layer 6 is translucent, and the first inorganic sealing film 26 covering the cathode 25, the organic sealing film 27 formed on the upper side of the first inorganic sealing film 26, and the organic sealing film 27. And a second inorganic sealing film 28 covering the The sealing layer 6 covering the light emitting element layer 5 prevents the penetration of foreign matter such as water and oxygen into the light emitting element layer 5.

 第1無機封止膜26および第2無機封止膜28はそれぞれ、例えば、CVDにより形成される、酸化シリコン膜、窒化シリコン膜、あるいは酸窒化シリコン膜、またはこれらの積層膜で構成することができる。有機封止膜27は、第1無機封止膜26および第2無機封止膜28よりも厚い、透光性有機膜であり、ポリイミド、アクリル等の塗布可能な感光性有機材料によって構成することができる。 Each of the first inorganic sealing film 26 and the second inorganic sealing film 28 may be formed of, for example, a silicon oxide film, a silicon nitride film, a silicon oxynitride film, or a laminated film thereof formed by CVD. it can. The organic sealing film 27 is a translucent organic film that is thicker than the first inorganic sealing film 26 and the second inorganic sealing film 28, and is made of a coatable photosensitive organic material such as polyimide or acrylic. Can.

 下面フィルム10は、支持基板を剥離した後に樹脂層12の下面に貼り付けることで、柔軟性に優れた表示デバイスを実現するためのものであり、その材料としては、PET等が挙げられる。機能フィルム39は、例えば、光学補償機能、タッチセンサ機能、保護機能等を有する。 The lower surface film 10 is for adhering to the lower surface of the resin layer 12 after peeling off the support substrate to realize a display device excellent in flexibility. Examples of the material include PET and the like. The functional film 39 has, for example, an optical compensation function, a touch sensor function, a protection function, and the like.

 以上、フレキシブルな表示デバイスを製造する場合について説明したが、非フレキシブルな表示デバイスを製造する場合は、基板の付け替え等が不要であるため、例えば、図1のステップS5からステップS9に移行する。 As described above, although the case of manufacturing a flexible display device has been described, in the case of manufacturing a non-flexible display device, for example, the process proceeds from step S5 to step S9 in FIG.

 〔実施形態1〕
 (画素配列)
 図4は、実施形態1における表示デバイス2の画素を示す平面図である。
Embodiment 1
(Pixel array)
FIG. 4 is a plan view showing a pixel of the display device 2 in the first embodiment.

 表示デバイス2は、表示部に、互いに平行に配置されているソース配線SHと、互いに平行に配置されているゲート配線GHとを有する。各ソース配線SHと、各ゲート配線GHとは直交している。各ソース配線SHと各ゲート配線GHとに区画された領域に画素領域が形成されている。 The display device 2 includes, in the display portion, source wirings SH arranged in parallel to each other and gate wirings GH arranged in parallel to each other. Each source wiring SH and each gate wiring GH are orthogonal to each other. A pixel area is formed in an area divided into each source wiring SH and each gate wiring GH.

 表示部の外側には、各ソース配線SHと接続されたソースドライバ41と、各ゲート配線と接続されたゲートドライバ42と、劣化情報生成部50とが配置されている。ソースドライバ41が各ソース配線SHを介して表示する画像に応じた電圧値である駆動電圧をアノード22(図2参照)毎に供給し、ゲートドライバ42が各ゲート配線GHを走査することで、アクティブ領域ACに画像を表示する。なお、劣化情報生成部50の詳細は後述する。 A source driver 41 connected to each source wiring SH, a gate driver 42 connected to each gate wiring, and a deterioration information generation unit 50 are disposed outside the display unit. The source driver 41 supplies a driving voltage, which is a voltage value corresponding to an image to be displayed, via each source wiring SH to each anode 22 (see FIG. 2), and the gate driver 42 scans each gate wiring GH. Display an image in the active area AC. The details of the deterioration information generation unit 50 will be described later.

 図2~図4に示すように、表示デバイス2の表示部には、画像の表示に寄与するアクティブ領域ACと、アクティブ領域ACの外周を囲み画像の表示に寄与しないダミー領域DMとが設けられている。 As shown in FIGS. 2 to 4, the display unit of the display device 2 is provided with an active area AC contributing to the display of an image, and a dummy area DM surrounding the outer periphery of the active area AC and not contributing to the display of the image. ing.

 図2及び図4に示すように、アクティブ領域ACには、画素PIXがマトリクス状に設けられている。画素PIXは複数のサブ画素SPを有する。例えば、画素PIXは、赤色光を発光する発光層を有する赤サブ画素RSPと、緑色光を発光する発光層を有する緑サブ画素GSPと、青色光を発光する発光層を有する青サブ画素BSPとを有する。 As shown in FIG. 2 and FIG. 4, pixels PIX are provided in a matrix in the active region AC. The pixel PIX has a plurality of sub-pixels SP. For example, the pixel PIX includes a red sub-pixel RSP having a light-emitting layer emitting red light, a green sub-pixel GSP having a light-emitting layer emitting green light, and a blue sub-pixel BSP having a light-emitting layer emitting blue light. Have.

 本実施形態では、サブ画素SPは、赤サブ画素RSP、緑サブ画素GSP及び青サブ画素BSPがそれぞれ直線に並ぶストライプ配列となっているが、サブ画素SPの配列は、ペンタイル配列等、他の配列であってもよい。 In the present embodiment, the sub-pixels SP are in a stripe arrangement in which the red sub-pixels RSP, the green sub-pixels GSP, and the blue sub-pixels BSP are aligned in a straight line, but the arrangement of the sub-pixels SP is It may be an array.

 各サブ画素SPには、上述したように、アノード22、EL層24、およびカソード25を含む発光素子と、薄層トランジスタTr(TFT)を含むサブ画素回路PCとが設けられている。赤サブ画素RSPには赤色光を発光するEL層24が設けられ、緑サブ画素GSPには緑色光を発光するEL層24が設けられ、青サブ画素BSPには青色光を発光するEL層24が設けられている。また、各サブ画素SPのEL層24は封止層6によって封止されている。 As described above, each sub-pixel SP is provided with the light-emitting element including the anode 22, the EL layer 24, and the cathode 25 and the sub-pixel circuit PC including the thin film transistor Tr (TFT). The red sub-pixel RSP is provided with an EL layer 24 for emitting red light, the green sub-pixel GSP is provided with an EL layer 24 for emitting green light, and the blue sub-pixel BSP is provided with an EL layer 24 for emitting blue light. Is provided. In addition, the EL layer 24 of each sub-pixel SP is sealed by the sealing layer 6.

 ダミー領域DMには、サブ画素SPと同じパターンで配列された複数のダミーサブ画素DSPがマトリクス状に配置されている。ダミーサブ画素DSPはアクティブ領域AC外であってアクティブ領域ACと隣接している。このダミーサブ画素DSPは、アクティブ領域ACのサブ画素SPの蒸着膜を形成するためのマスクの位置精度を担保するために設けられている。 In the dummy region DM, a plurality of dummy sub-pixels DSP arranged in the same pattern as the sub-pixels SP are arranged in a matrix. The dummy sub-pixel DSP is outside the active area AC and adjacent to the active area AC. The dummy sub-pixel DSP is provided to secure positional accuracy of a mask for forming a vapor deposition film of the sub-pixel SP in the active region AC.

 ダミーサブ画素DSPはサブ画素SPと同一工程にて形成される。ダミーサブ画素DSPには、サブ画素SPと同様に、アノード22、EL層24、およびカソード25を含む発光素子と、薄層トランジスタTr(TFT)を含むサブ画素回路PCとが設けられている。なお、ダミーサブ画素DSPには、少なくともEL層24及びカソード25が設けられていればよく、当該EL層24及びカソード25以外は設けられていなくてもよい。ダミーサブ画素DSPは、画像の表示には寄与しない。ダミー領域DMにおいて、表示に寄与する画素回路は不要であるため、ダミー領域DMに測定回路を設けることができる。 The dummy sub-pixel DSP is formed in the same process as the sub-pixel SP. Similar to the sub-pixel SP, the dummy sub-pixel DSP is provided with a light-emitting element including the anode 22, the EL layer 24, and the cathode 25 and a sub-pixel circuit PC including a thin film transistor Tr (TFT). The dummy sub-pixel DSP only needs to be provided with at least the EL layer 24 and the cathode 25, and the dummy sub-pixel DSP may not be provided except the EL layer 24 and the cathode 25. The dummy sub-pixel DSP does not contribute to the display of the image. In the dummy area DM, since a pixel circuit contributing to display is unnecessary, a measurement circuit can be provided in the dummy area DM.

 また、複数のダミーサブ画素DSPの一部に、発光素子に加え、測定回路MCがさらに設けられている。測定回路MSCは、後述するようにアノード22及びカソード25間の電圧値を測定することでEL層24の劣化具合をセンシングするための回路である。この測定回路MCが接続されているダミーサブ画素DSPを、測定サブ画素MSPと称する。 In addition to the light emitting elements, a measurement circuit MC is further provided in part of the plurality of dummy sub-pixels DSP. The measurement circuit MSC is a circuit for sensing the degree of deterioration of the EL layer 24 by measuring the voltage value between the anode 22 and the cathode 25 as described later. The dummy sub-pixel DSP to which the measurement circuit MC is connected is referred to as a measurement sub-pixel MSP.

 測定サブ画素MSPは、アクティブ領域AC外であってアクティブ領域ACに隣接して設けられている。また、ダミー領域DMのうち、測定サブ画素MSPが設けられた領域を測定領域MAと称する。 The measurement sub-pixel MSP is provided outside the active region AC and adjacent to the active region AC. Further, in the dummy region DM, a region where the measurement sub-pixel MSP is provided is referred to as a measurement region MA.

 複数の測定サブ画素MSPは、複数のサブ画素SPの発光色毎に設けられている。1画素PIXを構成する複数のサブ画素SPと同じ配列で配置された一対の測定サブ画素を含む複数の測定画素MPIXが、アクティブ領域ACに隣接して設けられている。 The plurality of measurement sub-pixels MSP are provided for each emission color of the plurality of sub-pixels SP. A plurality of measurement pixels MPIX including a pair of measurement sub-pixels arranged in the same arrangement as the plurality of sub-pixels SP constituting one pixel PIX are provided adjacent to the active region AC.

 例えば、測定画素MPIXは、赤測定サブ画素RMSPと、緑測定サブ画素GMSPと、青測定サブ画素BMSPとを有する。赤測定サブ画素RMSPは赤サブ画素RSPと同じ赤色光を発光する発光層を有する。緑測定サブ画素GMSPは緑サブ画素GSPと同じ緑色光を発光する発光層を有する。青測定サブ画素BMSPは青サブ画素BSPと同じ青色光を発光する発光層を有する。 For example, the measurement pixel MPIX has a red measurement sub-pixel RMSP, a green measurement sub-pixel GMSP, and a blue measurement sub-pixel BMSP. The red measurement sub-pixel RMSP has a light emitting layer that emits the same red light as the red sub-pixel RSP. The green measurement sub-pixel GMSP has a light emitting layer that emits the same green light as the green sub-pixel GSP. The blue measurement sub-pixel BMSP has a light emitting layer that emits the same blue light as the blue sub-pixel BSP.

 赤測定サブ画素RMSPに設けられた測定回路MCを赤測定回路RMCと称し、緑測定サブ画素GMSPに設けられた測定回路MCを緑測定回路GMCと称し、青測定サブ画素BMSPに設けられた測定回路MCを青測定回路BMCと称する。 The measurement circuit MC provided in the red measurement sub-pixel RMSP is referred to as a red measurement circuit RMC, the measurement circuit MC provided in the green measurement sub-pixel GMSP is referred to as a green measurement circuit GMC, and the measurement provided in the blue measurement sub-pixel BMSP The circuit MC is referred to as the blue measuring circuit BMC.

 測定画素MPIXは、例えば、アクティブ領域ACの4隅に隣接して設けられている。すなわち、本実施形態では、測定領域MAは、アクティブ領域ACの4隅に隣接して4カ所設けられている。例えば、各測定領域MAには、3画素分の測定画素MPIX(すなわち3個×3個=9個の測定サブ画素MSP)が設けられている。 The measurement pixels MPIX are provided, for example, adjacent to four corners of the active region AC. That is, in the present embodiment, four measurement areas MA are provided adjacent to the four corners of the active area AC. For example, each measurement area MA is provided with measurement pixels MPIX for three pixels (that is, 3 × 3 = 9 measurement sub-pixels MSP).

 なお、測定領域MAを設ける位置は、アクティブ領域ACの4隅に隣接する位置に限定されず、アクティブ領域ACの隅間の辺に隣接するように設けられてもよい。また、測定領域MAを設ける個数は、1~3個、又は、5個以上であってもよい。また、各測定領域MAに設ける測定画素MPIXの個数は3個未満又は4個以上であってもよい。 The position where the measurement area MA is provided is not limited to the position adjacent to the four corners of the active area AC, but may be provided adjacent to the side between the corners of the active area AC. The number of measurement areas MA may be one to three, or five or more. In addition, the number of measurement pixels MPIX provided in each measurement area MA may be less than three or four or more.

 また、図13に示すように、測定回路MCは、ダミーサブ画素DSP(測定サブ画素MSP)と電気的に接続されていればよく、ダミーサブ画素DSP(測定サブ画素MSP)内に設けるのではなく、測定領域MA外であってダミー領域DMに設けてもよい。 Further, as shown in FIG. 13, the measurement circuit MC may be electrically connected to the dummy sub-pixel DSP (the measurement sub-pixel MSP), and is not provided in the dummy sub-pixel DSP (the measurement sub-pixel MSP). It may be provided outside the measurement area MA and in the dummy area DM.

 複数の測定サブ画素MSPは、表示に寄与しないようにするために遮光されていることが好ましい。 The plurality of measurement sub-pixels MSP are preferably shielded from light in order not to contribute to display.

 または、図14に示すように、測定領域MA(すなわち、測定サブ画素MSP)と、アクティブ領域ACとの間に折り曲げ部CLが介在する構成としてもよい。これにより、複数の測定サブ画素MSPを含むダミー領域DMを、表示に寄与しないようにするために180度折り曲げることができる。 Alternatively, as shown in FIG. 14, the bent portion CL may be interposed between the measurement area MA (that is, the measurement sub-pixel MSP) and the active area AC. Thereby, the dummy area DM including the plurality of measurement sub-pixels MSP can be bent by 180 degrees so as not to contribute to the display.

 (サブ画素回路及び測定回路)
 図5は、実施形態1のサブ画素SPに設けられたサブ画素回路PCの構成を表す図である。図6は、実施形態1の測定サブ画素MSPに設けられたサブ画素回路PC及び測定回路MCの構成を表す図である。図5及び図6では、m列n行に対応するサブ画素回路PCの構成を示している。なお、ここで説明するサブ画素回路PCの構成は一例であって、他の構成を採用することもできる。
(Sub-pixel circuit and measurement circuit)
FIG. 5 is a diagram showing the configuration of the sub-pixel circuit PC provided in the sub-pixel SP of the first embodiment. FIG. 6 is a diagram showing the configuration of the sub-pixel circuit PC and the measurement circuit MC provided in the measurement sub-pixel MSP of the first embodiment. 5 and 6 show the configuration of the sub-pixel circuit PC corresponding to m columns and n rows. The configuration of the sub-pixel circuit PC described here is an example, and other configurations may be adopted.

 上述のように、表示デバイス2の表示部には、m本のソース配線SH[m]およびこれらに直交するn本のゲート配線GH[n]が配設されている。なお、m、nは任意の自然数である。 As described above, m source wirings SH [m] and n gate wirings GH [n] orthogonal to these source wirings SH [m] are disposed in the display portion of the display device 2. Note that m and n are arbitrary natural numbers.

 表示部には、各ゲート配線GH[n]と1対1で対応するように、発光制御線em[n]が設けられている。また、表示部には、各サブ画素回路PCに共通の電源線が形成されている。より詳細には、発光素子OLEDを駆動するためのELVDD(ハイレベル電源電圧)を供給するハイレベル電源線ELVDD、発光素子OLEDを駆動するためのELVSS(ローレベル電源電圧)を供給するローレベル電源線ELVSS、およびVini(初期化電圧)を供給する初期化電源線Vini[n]が設けられている。 In the display portion, a light emission control line em [n] is provided to correspond to each gate wiring GH [n] on a one-to-one basis. Further, in the display unit, a power supply line common to the sub-pixel circuits PC is formed. More specifically, a high level power supply line ELVDD for supplying ELVDD (high level power supply voltage) for driving the light emitting element OLED, and a low level power supply for supplying ELVSS (low level power supply voltage) for driving the light emitting element OLED. An initialization power supply line Vini [n] for supplying lines ELVSS and Vini (initialization voltage) is provided.

 図5及び図6に示すように、サブ画素SPに設けられたサブ画素回路PCと、測定サブ画素MSPに設けられたサブ画素回路PCとは同じ構成であることが好ましい。これは、測定サブ画素MSPの経時劣化の程度を、サブ画素SPの経時劣化の程度に合せるためである。測定サブ画素MSPに与えられる映像信号は、例えば、各色の全サブ画素の平均の映像信号である。 As shown in FIGS. 5 and 6, preferably, the sub-pixel circuit PC provided in the sub-pixel SP and the sub-pixel circuit PC provided in the measurement sub-pixel MSP have the same configuration. This is to match the degree of deterioration of the measurement sub-pixel MSP with time to the degree of deterioration of the sub-pixel SP. The video signal supplied to the measurement sub-pixel MSP is, for example, an average video signal of all the sub-pixels of each color.

 サブ画素回路PCには、ハイレベル電源線ELVDDからELVDDが供給され、発光素子OLEDに含まれるEL層24(図2参照)に加える駆動電圧を制御する。 The sub-pixel circuit PC is supplied with ELVDD from the high level power supply line ELVDD, and controls the drive voltage applied to the EL layer 24 (see FIG. 2) included in the light emitting element OLED.

 本実施形態においては、サブ画素回路PCは、1個の発光素子OLEDと7個のトランジスタT1~T7と1個のコンデンサC1とを含んでいる。 In the present embodiment, the sub-pixel circuit PC includes one light emitting element OLED, seven transistors T1 to T7, and one capacitor C1.

 トランジスタT1~T7は、例えば、pチャネル型の薄膜トランジスタ(TFT)である。コンデンサC1は、2つの電極およびそれらに挟まれた絶縁膜からなる容量素子である。 The transistors T1 to T7 are, for example, p-channel thin film transistors (TFTs). The capacitor C1 is a capacitive element formed of two electrodes and an insulating film sandwiched therebetween.

 発光素子OLEDは、発光ダイオードであり、発光素子層5(図2参照)に対応する。すなわち、発光素子OLEDは、アノード22(図2参照)、EL層24及びカソード25を含む。アノード22には、ソースドライバ41から、表示する画像に応じた駆動電圧が供給される。カソード25には、ELVDDとは異なる一定電圧であるELVSSが供給される。 The light emitting element OLED is a light emitting diode, and corresponds to the light emitting element layer 5 (see FIG. 2). That is, the light emitting device OLED includes an anode 22 (see FIG. 2), an EL layer 24 and a cathode 25. A drive voltage corresponding to an image to be displayed is supplied from the source driver 41 to the anode 22. The cathode 25 is supplied with ELVSS which is a constant voltage different from ELVDD.

 トランジスタT1は初期化トランジスタであり、トランジスタT2は閾値電圧補償トランジスタであり、トランジスタT3は書き込み制御トランジスタであり、トランジスタT4は駆動トランジスタであり、トランジスタT5は電源供給制御トランジスタであり、トランジスタT6は発光制御トランジスタであり、トランジスタT7は発光素子OLEDの陽極電荷ディスチャージトランジスタである。 The transistor T1 is an initialization transistor, the transistor T2 is a threshold voltage compensation transistor, the transistor T3 is a write control transistor, the transistor T4 is a drive transistor, the transistor T5 is a power supply control transistor, and the transistor T6 is a light emission The transistor T7 is a control transistor, and the transistor T7 is an anode charge discharge transistor of the light emitting element OLED.

 ハイレベル電源回路(不図示)は、ハイレベル電源線ELVDDを介して、コンデンサC1およびトランジスタT5と接続されている。 The high level power supply circuit (not shown) is connected to the capacitor C1 and the transistor T5 via the high level power supply line ELVDD.

 トランジスタT1は、ゲート電極がゲート配線GH[n-1]と接続され、ソース電極が初期化電源線Vini[n]と接続されており、ドレイン電極がコンデンサC1およびトランジスタT4のゲート電極と接続されている。 In the transistor T1, the gate electrode is connected to the gate wiring GH [n-1], the source electrode is connected to the initialization power supply line Vini [n], and the drain electrode is connected to the capacitor C1 and the gate electrode of the transistor T4. ing.

 トランジスタT2は、トランジスタT4の閾値電圧を補償する。トランジスタT2は、ゲート電極がゲート配線GH[n]およびトランジスタT3のゲート電極と接続されており、ソース電極がトランジスタT4のドレイン電極およびトランジスタT6のソース電極間と接続されており、ドレイン電極がトランジスタT4のゲート電極と接続されていると共にコンデンサC1およびトランジスタT1のドレイン電極間と接続されている。 The transistor T2 compensates for the threshold voltage of the transistor T4. In the transistor T2, the gate electrode is connected to the gate wiring GH [n] and the gate electrode of the transistor T3, the source electrode is connected between the drain electrode of the transistor T4 and the source electrode of the transistor T6, and the drain electrode is a transistor It is connected to the gate electrode of T4 and between the capacitor C1 and the drain electrode of the transistor T1.

 トランジスタT3は、ゲート電極がゲート配線GH[n]およびトランジスタT2のゲート電極と接続されており、ソース電極がソース配線SH[m]と接続されており、ドレイン電極がトランジスタT4のソース電極およびトランジスタT5のドレイン電極と接続されている。 The gate electrode of the transistor T3 is connected to the gate wiring GH [n] and the gate electrode of the transistor T2, the source electrode is connected to the source wiring SH [m], and the drain electrode is connected to the source electrode of the transistor T4 and the transistor It is connected to the drain electrode of T5.

 トランジスタT4は、ゲート電極がトランジスタT2のドレイン電極と接続されていると共にコンデンサC1およびトランジスタT1のドレイン電極間と接続されており、ソース電極がトランジスタT3のドレイン電極およびトランジスタT5のドレイン電極間と接続されており、ドレイン電極がトランジスタT2のソース電極およびトランジスタT6のソース電極と接続されている。 The transistor T4 has a gate electrode connected to the drain electrode of the transistor T2 and a capacitor C1 connected between the drain electrodes of the transistor T1, and a source electrode connected between the drain electrode of the transistor T3 and the drain electrode of the transistor T5. The drain electrode is connected to the source electrode of the transistor T2 and the source electrode of the transistor T6.

 トランジスタT5は、ゲート電極が発光制御線em[n]およびトランジスタT6のゲート電極と接続されており、ソース電極がハイレベル電源線ELVDDおよびコンデンサC1と接続されており、ドレイン電極がトランジスタT4のソース電極およびトランジスタT3のドレイン電極と接続されている。 The transistor T5 has a gate electrode connected to the light emission control line em [n] and the gate electrode of the transistor T6, a source electrode connected to the high level power supply line ELVDD and the capacitor C1, and a drain electrode connected to the source of the transistor T4. It is connected to the electrode and the drain electrode of the transistor T3.

 トランジスタT6は、ゲート電極が発光制御線em[n]およびトランジスタT5のゲート電極と接続されており、ソース電極がトランジスタT4のドレイン電極およびトランジスタT2のソース電極と接続されており、ドレイン電極が発光素子OLEDのアノードおよびトランジスタT7のドレイン電極と接続されている。 The gate electrode of the transistor T6 is connected to the light emission control line em [n] and the gate electrode of the transistor T5, the source electrode is connected to the drain electrode of the transistor T4 and the source electrode of the transistor T2, and the drain electrode emits light It is connected to the anode of the element OLED and the drain electrode of the transistor T7.

 トランジスタT7は、発光素子OLEDにデータを書き込む直前に発光素子OLEDの陽極に蓄積した電荷をリセットするためのトランジスタである。トランジスタT7は、ゲート電極がゲート配線GH[n]と接続されており、ソース電極が初期化電源線Vini[n]と接続されており、ドレイン電極がトランジスタT6のドレイン電極および発光素子OLEDのアノード間と接続されている。 The transistor T7 is a transistor for resetting the charge accumulated in the anode of the light emitting element OLED immediately before writing data in the light emitting element OLED. The gate electrode of the transistor T7 is connected to the gate wiring GH [n], the source electrode is connected to the initialization power supply line Vini [n], and the drain electrode is the drain electrode of the transistor T6 and the anode of the light emitting element OLED. Connected with.

 図6に示すように、測定回路MCは、一端が、発光素子OLEDのアノードと接続され、他端が発光素子OLEDのカソードと接続されている。測定回路MCは、発光素子OLEDのアノード及びカソード間の電圧VFを測定し、当該測定した電圧VFの電圧値を測定データとして劣化情報生成部50へ出力する。 As shown in FIG. 6, one end of the measurement circuit MC is connected to the anode of the light emitting element OLED, and the other end is connected to the cathode of the light emitting element OLED. The measurement circuit MC measures the voltage VF between the anode and the cathode of the light emitting element OLED, and outputs the measured voltage value of the voltage VF to the deterioration information generation unit 50 as measurement data.

 (電圧補償動作)
 図7は、劣化情報生成部50の構成を表す機能ブロック図である。図9は、実施形態1に係る表示デバイス2の電圧補償動作のフローチャートを表す図である。図11は、発光素子OLEDに加えられる階調電圧と輝度との関係を表す図である。図12は、発光素子OLEDの両端の電位差と輝度との関係を表す図である。
(Voltage compensation operation)
FIG. 7 is a functional block diagram showing the configuration of the deterioration information generation unit 50. As shown in FIG. FIG. 9 is a diagram illustrating a flowchart of the voltage compensation operation of the display device 2 according to the first embodiment. FIG. 11 is a diagram showing the relationship between the gradation voltage applied to the light emitting element OLED and the luminance. FIG. 12 is a diagram showing the relationship between the potential difference between both ends of the light emitting element OLED and the luminance.

 図7に示すように、劣化情報生成部50は、赤劣化情報生成部51Rと、緑劣化情報生成部51Gと、青劣化情報生成部51Bと、データ記憶部52とを有する。 As shown in FIG. 7, the degradation information generation unit 50 includes a red degradation information generation unit 51R, a green degradation information generation unit 51G, a blue degradation information generation unit 51B, and a data storage unit 52.

 データ記憶部52には、電圧値と輝度値との関係を表す輝度データが発光色毎に記憶されている。例えば、データ記憶部52には、赤色光を発光する発光層の電圧値と輝度との関係を示す赤輝度データと、緑色光を発光する発光層の電圧値と輝度との関係を示す緑輝度データと、青色光を発光する発光層の電圧値と輝度との関係を示す青輝度データとが記憶されている。 In the data storage unit 52, luminance data representing the relationship between the voltage value and the luminance value is stored for each luminescent color. For example, in the data storage unit 52, red brightness data indicating the relationship between the voltage value of the light emitting layer emitting red light and the brightness, and green brightness indicating the relationship between the voltage value of the light emitting layer emitting green light and the brightness Data and blue brightness data indicating the relationship between the voltage value of the light emitting layer that emits blue light and the brightness are stored.

 図11及び図12は、データ記憶部52に記憶する輝度データの一例を示している。 11 and 12 show an example of the luminance data stored in the data storage unit 52. FIG.

 図11の階調Vgs1~Vgs6に示すように、階調が大きくなると、発光素子OLEDの輝度も大きくなる。 As shown by gradations Vgs1 to Vgs6 in FIG. 11, as the gradation becomes larger, the luminance of the light emitting element OLED also becomes larger.

 図12のグラフの横軸は、ELVDD‐ELVSS=発光素子OLEDの両端の電位差(すなわち、発光素子OLEDの電圧VF)を表し、縦軸は発光素子OLEDの輝度を表している。図12のdata1~data6は、画像に応じて(階調に応じて)ソースドライバ41から各ソース電極へ供給されるソース信号である。階調Vgs1=ELVDD-data1であり、階調Vgs2=ELVDD-data2であり、階調Vgs3=ELVDD-data3であり、階調Vgs4=ELVDD-data4であり、階調Vgs5=ELVDD-data5であり、階調電圧Vgs6=ELVDD-data6である。 The horizontal axis of the graph in FIG. 12 represents ELVDD-ELVSS = the potential difference between both ends of the light emitting element OLED (that is, the voltage VF of the light emitting element OLED), and the vertical axis represents the luminance of the light emitting element OLED. Data 1 to data 6 in FIG. 12 are source signals supplied from the source driver 41 to the respective source electrodes according to the image (according to the gradation). The gradation Vgs1 = ELVDD-data1, the gradation Vgs2 = ELVDD-data2, the gradation Vgs3 = ELVDD-data3, the gradation Vgs4 = ELVDD-data4, the gradation Vgs5 = ELVDD-data5, The gradation voltage Vgs6 = ELVDD-data6.

 図7に示すように、表示デバイス2は電圧補償動作を行う。電圧補償動作とは、発光層の劣化状態に応じてソースドライバ41がアノード22に供給する駆動電圧を調整することである。具体的には、電圧補償動作とは、測定回路MCが測定した電圧値に基づいて発光素子OLEDの劣化状態を示す劣化情報を劣化情報生成部50が生成し、当該劣化情報に基づいて、ソースドライバ41がアノード22に供給するための駆動電圧を調整することである。 As shown in FIG. 7, the display device 2 performs a voltage compensation operation. The voltage compensation operation is to adjust the drive voltage supplied to the anode 22 by the source driver 41 in accordance with the deterioration state of the light emitting layer. Specifically, in the voltage compensation operation, the degradation information generation unit 50 generates degradation information indicating the degradation state of the light emitting element OLED based on the voltage value measured by the measurement circuit MC, and the source based on the degradation information The driver 41 adjusts the drive voltage to be supplied to the anode 22.

 表示デバイス2がこの電圧補償動作を行うタイミングは、表示デバイス2の電源起動時に行ってもよいし、所定の周期毎(この場合は通常の映像信号の出力を停止する)に行ってもよいし、表示デバイス2の電源オフ時に行ってもよし、他のタイミングであってもよい。 The timing at which the display device 2 performs this voltage compensation operation may be performed when the power of the display device 2 is turned on, or may be performed at predetermined intervals (in this case, the output of a normal video signal is stopped) Or when the power of the display device 2 is turned off, it may be other timing.

 図9に示すように、表示デバイス2が所定のタイミング又はユーザからの指示により電圧補償動作を開始すると(ステップT1)、ソースドライバ41は、各測定領域MA(本実施形態では4カ所)の各測定サブ画素MSP(本実施形態では9個の測定サブ画素×4カ所)へ測定用電圧を供給する(ステップT2)。測定電圧は、例えば、0階調又は255階調など任意の階調となる電圧である。 As shown in FIG. 9, when the display device 2 starts the voltage compensation operation according to a predetermined timing or an instruction from the user (step T1), the source driver 41 selects each of the measurement areas MA (four in this embodiment). The measurement voltage is supplied to the measurement sub-pixel MSP (in this embodiment, nine measurement sub-pixels × 4 in this embodiment) (step T2). The measurement voltage is, for example, a voltage having an arbitrary gradation such as 0 gradation or 255 gradation.

 すると、次に、各測定領域MA(本実施形態では4カ所)の各測定回路MC(本実施形態では9個の測定サブ画素×4カ所)は、測定電圧が供給されたアノード22と、ELVSSが供給されているカソード25間の電圧VFを測定データとして劣化情報生成部50へ出力する(ステップT3)。 Then, next, each measurement circuit MC (in this embodiment, nine measurement sub-pixels × four in this embodiment) of each measurement area MA (four in the present embodiment), the anode 22 to which the measurement voltage is supplied, and ELVSS The voltage VF between the cathodes 25 supplied is output as measurement data to the deterioration information generation unit 50 (step T3).

 具体的には、各赤測定回路RMS(本実施形態では3個の赤測定回路×4カ所)は、各赤測定サブ画素RMPにおいて、測定電圧が供給されたアノード22と、ELVSSが供給されているカソード25間の電圧VFを赤測定データとして赤劣化情報生成部51Rへそれぞれ出力する。また、各緑測定回路GMS(本実施形態では3個の緑測定回路×4カ所)は、各緑測定サブ画素GMPにおいて、測定電圧が供給されたアノード22と、ELVSSが供給されているカソード25間の電圧VFを緑測定データとして緑劣化情報生成部51Gへそれぞれ出力する。各青測定回路BMS(本実施形態では3個の青測定回路×4カ所)は、各青測定サブ画素BMPにおいて、測定電圧が供給されたアノード22と、ELVSSが供給されているカソード25間の電圧VFを青測定データとして青劣化情報生成部51Bへそれぞれ出力する。 Specifically, in each red measurement sub-pixel RMP, each red measurement circuit RMS (in this embodiment, three red measurement circuits × 4 locations) is supplied with the anode 22 to which the measurement voltage is supplied, and ELVSS. The voltage VF across the cathode 25 is output to the red degradation information generation unit 51R as red measurement data. In addition, each green measuring circuit GMS (three green measuring circuits × 4 in this embodiment) includes an anode 22 to which a measuring voltage is supplied and a cathode 25 to which ELVSS is supplied in each green measuring sub-pixel GMP. Voltage VF is output to the green deterioration information generation unit 51G as green measurement data. In each blue measurement sub-pixel BMP, each blue measurement circuit BMS (in this embodiment, three blue measurement circuits × 4 locations) is between the anode 22 to which the measurement voltage is supplied and the cathode 25 to which ELVSS is supplied. The voltage VF is output to the blue deterioration information generation unit 51B as blue measurement data.

 次に、劣化情報生成部50は、各測定回路MSから供給された測定データが示す電圧値を発光色毎に平均し、平均値である発光色毎の平均測定データを算出する(ステップT4)。そして、劣化情報生成部50は、平均測定データと、データ記憶部52に記憶されている輝度データとを発光色毎に比較する(ステップT5)。そして、劣化情報生成部50は、平均測定データが示す電圧値と所望の輝度となる電圧値との差分値を発光色毎に算出し、当該算出した電圧値を劣化情報として発光色毎にソースドライバ41へ出力する(ステップT6)。 Next, the deterioration information generation unit 50 averages the voltage value indicated by the measurement data supplied from each measurement circuit MS for each luminescent color, and calculates the average measurement data for each luminescent color that is the average value (step T4). . Then, the deterioration information generation unit 50 compares the average measurement data with the luminance data stored in the data storage unit 52 for each luminescent color (step T5). Then, the deterioration information generation unit 50 calculates, for each light emission color, the difference value between the voltage value indicated by the average measurement data and the voltage value that achieves the desired luminance, and uses the calculated voltage value as the deterioration information for each light emission color. It outputs to the driver 41 (step T6).

 具体的には、赤劣化情報生成部51Rは、各赤測定回路RMSから供給された赤測定データが示す電圧値を平均し(本実施形態では3個の赤測定回路×4カ所の平均)、平均値である平均赤測定データを算出する(ステップT4)。そして、赤劣化情報生成部51Rは、平均赤測定データと、データ記憶部52に記憶されている赤輝度データとを比較する(ステップT5)。そして、赤測定回路RMSは、平均赤測定データが示す電圧値と所望の輝度となる電圧値との差分値を算出し、当該算出した電圧値を劣化情報としてソースドライバ41へ出力する(ステップT6)。 Specifically, the red deterioration information generation unit 51R averages the voltage values indicated by the red measurement data supplied from the respective red measurement circuits RMS (in the present embodiment, an average of three red measurement circuits × four locations); Average red measurement data, which is an average value, is calculated (step T4). Then, the red deterioration information generation unit 51R compares the average red measurement data with the red luminance data stored in the data storage unit 52 (step T5). Then, the red measurement circuit RMS calculates the difference between the voltage value indicated by the average red measurement data and the voltage value that achieves the desired luminance, and outputs the calculated voltage value as the degradation information to the source driver 41 (step T6). ).

 また、緑劣化情報生成部51Gは、各緑測定回路GMSから供給された緑測定データが示す電圧値を平均し(本実施形態では3個の緑測定回路×4カ所の平均)、平均値である平均緑測定データを算出する(ステップT4)。そして、緑劣化情報生成部51Gは、平均緑測定データと、データ記憶部52に記憶されている緑輝度データとを比較する(ステップT5)。そして、緑劣化情報生成部51Gは、平均緑測定データが示す電圧値と所望の輝度となる電圧値との差分値を算出し、当該算出した電圧値を劣化情報としてソースドライバ41へ出力する(ステップT6)。 In addition, the green deterioration information generation unit 51G averages the voltage values indicated by the green measurement data supplied from the respective green measurement circuits GMS (in the present embodiment, an average of three green measurement circuits × four locations), and A certain average green measurement data is calculated (step T4). Then, the green deterioration information generation unit 51G compares the average green measurement data with the green luminance data stored in the data storage unit 52 (step T5). Then, the green degradation information generation unit 51G calculates the difference value between the voltage value indicated by the average green measurement data and the voltage value that achieves the desired luminance, and outputs the calculated voltage value to the source driver 41 as degradation information ( Step T6).

 また、青劣化情報生成部51Bは、各青測定回路BMSから供給された青測定データが示す電圧値を平均し(本実施形態では3個の青測定回路×4カ所の平均)、平均値である平均青測定データを算出する(ステップT4)。そして、青劣化情報生成部51Bは、平均青測定データと、データ記憶部52に記憶されている青輝度データとを比較する(ステップT5)。そして、青劣化情報生成部51Bは、平均青測定データが示す電圧値と所望の輝度となる電圧値との差分値を算出し、当該算出した電圧値を劣化情報としてソースドライバ41へ出力する(ステップT6)。 In addition, the blue deterioration information generation unit 51B averages the voltage values indicated by the blue measurement data supplied from the respective blue measurement circuits BMS (in the present embodiment, an average of three blue measurement circuits × four locations), and A certain average blue measurement data is calculated (step T4). Then, the blue deterioration information generation unit 51B compares the average blue measurement data with the blue luminance data stored in the data storage unit 52 (step T5). Then, the blue deterioration information generation unit 51B calculates the difference value between the voltage value indicated by the average blue measurement data and the voltage value that achieves the desired luminance, and outputs the calculated voltage value to the source driver 41 as deterioration information ( Step T6).

 次に、ソースドライバ41は、劣化情報生成部50から供給された発光色毎の劣化情報に基づいて、アクティブ領域ACに含まれる発光色毎の全サブ画素SP及び全測定サブ画素MSPの各アノード22に供給するための駆動電圧を発光色毎に調整する(ステップT7)。 Next, based on the deterioration information for each light emission color supplied from the deterioration information generation unit 50, the source driver 41 sets the anodes of all sub-pixels SP and all measurement sub-pixels MSP for each light emission color included in the active area AC. The driving voltage to be supplied to 22 is adjusted for each luminescent color (step T7).

 具体的には、ソースドライバ41は、赤劣化情報生成部51Rから供給された劣化情報に基づいて、アクティブ領域ACに含まれる全赤サブ画素RSP及び全赤測定サブ画素RMSPの各アノード22に供給するための駆動電圧を、劣化情報が示す値だけかさ上げしてシフトさせることで調整する(ステップT7)
 また、ソースドライバ41は、緑劣化情報生成部51Gから供給された劣化情報に基づいて、アクティブ領域ACに含まれる全緑サブ画素GSP及び全緑測定サブ画素GMSPの各アノード22に供給するための駆動電圧を、劣化情報が示す値だけかさ上げしてシフトさせることで調整する(ステップT7)。
Specifically, based on the deterioration information supplied from the red deterioration information generation unit 51R, the source driver 41 supplies the anodes 22 of all red sub pixels RSP and all red measurement sub pixels RMSP included in the active area AC. Adjustment is performed by raising and shifting the driving voltage for driving by the value indicated by the deterioration information (step T7).
In addition, the source driver 41 is for supplying to all the anodes 22 of the all green sub-pixel GSP and the all-green measurement sub-pixel GMSP included in the active region AC based on the deterioration information supplied from the green deterioration information generation unit 51G. The drive voltage is adjusted by raising and shifting only the value indicated by the deterioration information (step T7).

 また、ソースドライバ41は、青劣化情報生成部51Bから供給された劣化情報に基づいて、アクティブ領域ACに含まれる全青サブ画素BSP及び全青測定サブ画素BMSPの各アノード22に供給するための駆動電圧を、劣化情報が示す値だけかさ上げしてシフトさせることで調整する(ステップT7)。 In addition, the source driver 41 is configured to supply to the respective anodes 22 of the all blue sub-pixels BSP and all blue measurement sub-pixels BMSP included in the active region AC based on the deterioration information supplied from the blue deterioration information generation unit 51B. The drive voltage is adjusted by raising and shifting only the value indicated by the deterioration information (step T7).

 これにより、電圧補償動作は終了する(ステップT8)。なお、ここで、電圧補償動作を終了せず、ステップT2へ戻り、測定用電圧を変更して、再度、電圧補償動作を行ってもよい。 Thus, the voltage compensation operation ends (step T8). Here, without completing the voltage compensation operation, the process may return to step T2, change the measurement voltage, and perform the voltage compensation operation again.

 (主な効果)
 以上のように、表示デバイス2は、アクティブ領域AC外であって画像の表示に寄与しない複数の測定サブ画素MSPを有する。そして、複数の測定サブ画素MSPは、発光層、複数の測定サブ画素毎に設けられたアノード22、及び、当該発光層を介在させてアノード22と対向配置されているカソード25を含む。そして、測定サブ画素MSPは、測定サブ画素MSP毎に接続され、アノード22及びカソード25間の電圧VFの電圧値を測定する測定回路MCと含む。
(Main effect)
As described above, the display device 2 has the plurality of measurement sub-pixels MSP outside the active area AC and not contributing to the display of the image. The plurality of measurement sub-pixels MSP include a light-emitting layer, an anode 22 provided for each of the plurality of measurement sub-pixels, and a cathode 25 opposite to the anode 22 with the light-emitting layer interposed therebetween. The measurement sub-pixel MSP is connected to each measurement sub-pixel MSP and includes a measurement circuit MC that measures the voltage value of the voltage VF between the anode 22 and the cathode 25.

 これにより時間経過によって劣化する、アノード22及びカソード25間の電圧VFの変化をモニタリングすることができる。このため、発光素子OLEDの劣化度合いに応じて、アノード22へ供給する駆動電圧を調整することができる。 Thereby, it is possible to monitor the change of the voltage VF between the anode 22 and the cathode 25 which is deteriorated with the passage of time. Therefore, the drive voltage supplied to the anode 22 can be adjusted in accordance with the degree of deterioration of the light emitting element OLED.

 また、表示デバイス2は、測定回路MSが測定した電圧値に基づいて発光層の劣化状態を示す劣化情報を生成する劣化情報生成部50を有する。そして、ソースドライバ41は、上記劣化情報生成部50が生成した劣化情報に基づいて、各アノード22に供給するための駆動電圧を調整する。このようにして、発光層の劣化度合いに応じて、アノード22へ供給する駆動電圧を調整することができる。 The display device 2 further includes a deterioration information generation unit 50 that generates deterioration information indicating a deterioration state of the light emitting layer based on the voltage value measured by the measurement circuit MS. Then, the source driver 41 adjusts the drive voltage to be supplied to each anode 22 based on the deterioration information generated by the deterioration information generation unit 50. Thus, the drive voltage supplied to the anode 22 can be adjusted according to the degree of deterioration of the light emitting layer.

 また、劣化情報生成部50は、複数の測定サブ画素MSPにおける各測定回路MCが測定した電圧値から、劣化情報を発光層の発光色毎に算出する。そして、ソースドライバ41は、発光層の発光色毎に、劣化情報に基づいて各アノード22に供給する駆動電圧を調整する。これにより、発光層の発光色毎に劣化度合いが異なっても、発光色毎に、最適な駆動電圧の調整を行うことができる。 Further, the deterioration information generation unit 50 calculates deterioration information for each emission color of the light emitting layer from the voltage value measured by each measurement circuit MC in the plurality of measurement sub-pixels MSP. Then, the source driver 41 adjusts the drive voltage to be supplied to each anode 22 based on the deterioration information for each luminescent color of the luminescent layer. As a result, even if the degree of deterioration is different for each luminescent color of the light emitting layer, it is possible to adjust the optimum drive voltage for each luminescent color.

 また、本実施形態では、劣化情報生成部50は、複数の測定サブ画素MSP(本実施形態では9個の測定サブ画素×4カ所)における各測定回路MCが測定した電圧値と、データ記憶部52に記憶されている所望の輝度となる電圧値との差分値を平均することで劣化情報を、発光層の発光色毎に算出する。そして、ソースドライバ41は、発光層の発光色毎の劣化情報に基づいて、アクティブ領域ACの各サブ画素SPに供給するための駆動電圧を、発光層の発光色毎に調整する。このため、アクティブ領域ACの各サブ画素SPへ供給する駆動電圧の調整が容易である。 Further, in the present embodiment, the deterioration information generation unit 50 measures the voltage values measured by the respective measurement circuits MC in the plurality of measurement sub-pixels MSP (in this embodiment, nine measurement sub-pixels × 4 locations), and the data storage unit. The deterioration information is calculated for each emission color of the light emitting layer by averaging the difference values with the voltage value as the desired luminance stored in 52. Then, the source driver 41 adjusts the drive voltage to be supplied to each sub-pixel SP of the active region AC for each emission color of the emission layer based on the deterioration information for each emission color of the emission layer. Therefore, it is easy to adjust the drive voltage supplied to each sub-pixel SP in the active region AC.

 表示デバイス2では、電圧補償動作中に、アクティブ領域AC外の測定サブ画素MSPの発光がユーザに視認されないように、測定サブ画素MSPは遮光されていることが好ましい。 In the display device 2, it is preferable that the measurement sub-pixel MSP is shielded from light so that the light emission of the measurement sub-pixel MSP outside the active region AC is not viewed by the user during the voltage compensation operation.

 但し、電圧補償動作を表示デバイスの起動時に行う場合、アクティブ領域AC外の測定サブ画素MSPの発光がユーザに視認されても、ユーザは、あまり違和感を感じない。このため、電圧補償動作を表示デバイスの起動時に行う場合は、測定サブ画素MSPが遮光されていなくてもよい。 However, when the voltage compensation operation is performed at the time of activation of the display device, the user does not feel much discomfort even if the light emission of the measurement sub-pixel MSP outside the active region AC is visually recognized by the user. Therefore, when the voltage compensation operation is performed at the time of start of the display device, the measurement sub-pixel MSP may not be shielded from light.

 (電圧補償動作の変形例)
 また、図9のステップT2では、測定用電圧を各測定サブ画素MSPへ供給していた。しかし、測定用電圧ではなく、アクティブ領域ACに表示する画像の駆動電圧を各測定サブ画素MSPへ供給してもよい。
(Modified example of voltage compensation operation)
Further, in step T2 of FIG. 9, the measurement voltage is supplied to each measurement sub-pixel MSP. However, not the measurement voltage but the drive voltage of the image to be displayed in the active area AC may be supplied to each measurement sub-pixel MSP.

 この場合、測定サブ画素MSPの色に対応する全表示サブ画素の駆動電圧の平均の電圧が、駆動電圧として当該測定サブ画素MSPに供給される(ステップT2)。例えば、赤測定サブ画素RMPには、アクティブ領域ACに含まれる全赤サブ画素RSPの駆動電圧の平均の電圧が駆動電圧として供給される。また、緑測定サブ画素GMPには、アクティブ領域ACに含まれる全緑サブ画素GSPの駆動電圧の平均の電圧が駆動電圧として供給される。また、青測定サブ画素BMPには、アクティブ領域ACに含まれる全青サブ画素BSPの駆動電圧の平均の電圧が駆動電圧として供給される。 In this case, an average voltage of drive voltages of all the display sub-pixels corresponding to the color of the measurement sub-pixel MSP is supplied to the measurement sub-pixel MSP as a drive voltage (step T2). For example, to the red measurement sub-pixel RMP, an average voltage of drive voltages of all the red sub-pixels RSP included in the active region AC is supplied as a drive voltage. Also, to the green measurement sub-pixel GMP, an average voltage of the drive voltages of all the green sub-pixels GSP included in the active region AC is supplied as a drive voltage. In addition, an average voltage of drive voltages of all blue sub-pixels BSP included in the active area AC is supplied to the blue measurement sub-pixel BMP as a drive voltage.

 そして、ステップT3において、各測定サブ画素MPは、アノード22と、カソード25間の電圧VFを測定データとして劣化情報生成部50へ出力する(ステップT3)。ステップT4以降は、図9を用いて説明したステップと同様である。 Then, in step T3, each measurement sub-pixel MP outputs the voltage VF between the anode 22 and the cathode 25 as measurement data to the deterioration information generation unit 50 (step T3). Step T4 and subsequent steps are the same as the steps described using FIG.

 これにより、アクティブ領域ACに表示している画像を停止することなく、電圧補償動作を実行することができる。 Thus, the voltage compensation operation can be performed without stopping the image displayed in the active area AC.

 〔実施形態2〕
 図8は、実施形態2に係る表示デバイス2のアクティブ領域及びダミー領域を表す図である。図10は、実施形態2に係る表示デバイス2の電圧補償動作のフローチャートを表す図である。
Second Embodiment
FIG. 8 is a diagram illustrating an active area and a dummy area of the display device 2 according to the second embodiment. FIG. 10 is a diagram illustrating a flowchart of the voltage compensation operation of the display device 2 according to the second embodiment.

 表示デバイス2は、電圧補償動作を行う際、アクティブ領域ACを仮想的に複数の領域に分割し、当該分割した領域毎に、各アノード22へ供給する駆動電圧を調整してもよい。 When performing the voltage compensation operation, the display device 2 may virtually divide the active area AC into a plurality of areas, and adjust the drive voltage supplied to each anode 22 for each of the divided areas.

 図8に示すように、電圧補償動作を行う際、例えばアクティブ領域ACは仮想的に4分割される。紙面左上の領域を第1アクティブ領域AC1と称し、紙面右上の領域を第2アクティブ領域AC2と称し、紙面左下の領域を第3アクティブ領域AC3と称し、紙面右下の領域を第4アクティブ領域AC4と称する。 As shown in FIG. 8, when performing the voltage compensation operation, for example, the active region AC is virtually divided into four. The upper left region of the paper is referred to as a first active region AC1, the upper right region is referred to as a second active region AC2, the lower left region is referred to as a third active region AC3, and the lower right region is a fourth active region AC4. It is called.

 アクティブ領域ACが分割された各領域に測定領域が隣接して設けられている。例えば、第1アクティブ領域AC1に隣接して第1測定領域MA1が設けられ、第2アクティブ領域AC2に隣接して第2測定領域MA2が設けられ、第3アクティブ領域AC3に隣接して第3測定領域MA3が設けられ、第4アクティブ領域AC4に隣接して第4測定領域MA4が設けられている。 A measurement area is provided adjacent to each of the divided areas of the active area AC. For example, the first measurement area MA1 is provided adjacent to the first active area AC1, the second measurement area MA2 is provided adjacent to the second active area AC2, and the third measurement is adjacent to the third active area AC3. An area MA3 is provided, and a fourth measurement area MA4 is provided adjacent to the fourth active area AC4.

 第1測定領域MA1~第4測定領域MA4のそれぞれに設けられる測定画素MPIXの個数は、1画素だけであってもよいし、2画素以上であってもよい。 The number of measurement pixels MPIX provided in each of the first measurement area MA1 to the fourth measurement area MA4 may be only one pixel or may be two or more pixels.

 第1測定領域MA1~第4測定領域MA4はそれぞれ、複数の測定サブ画素MSPを有する。例えば、第1測定領域MA1~第4測定領域MA4はそれぞれ、赤測定サブ画素RMSPと、緑測定サブ画素GMSPと、青測定サブ画素BMSPとを含む。 Each of the first measurement area MA1 to the fourth measurement area MA4 has a plurality of measurement sub-pixels MSP. For example, the first measurement area MA1 to the fourth measurement area MA4 each include a red measurement sub-pixel RMSP, a green measurement sub-pixel GMSP, and a blue measurement sub-pixel BMSP.

 なお、アクティブ領域ACの分割数は4個に限定されず、3個以下、又は、5個以上に分割されてもよい。但し、各分割領域に隣接して1箇所以上の測定領域が設けられる。 Note that the number of divisions of the active area AC is not limited to four, and may be divided into three or less, or five or more. However, one or more measurement areas are provided adjacent to each divided area.

 電圧補償動作を行う際、表示デバイス2は、ステップT1~T3まで同じ処理を行う。ステップT4以降の処理は、アクティブ領域ACを複数に分割した領域毎に行う。これによると、より正確に、発光素子OLEDの劣化度合いに応じて、アノード22へ供給する駆動電圧を調整することができる。 When performing the voltage compensation operation, the display device 2 performs the same process from step T1 to T3. The process after step T4 is performed for each of the plurality of divided active areas AC. According to this, the drive voltage supplied to the anode 22 can be adjusted more accurately according to the degree of deterioration of the light emitting element OLED.

 表示デバイス2は、ステップT3の後、ステップT4~T7に換えて以下の処理を行い、補償動作を終了する(ステップT8)。 After the step T3, the display device 2 performs the following processing in place of the steps T4 to T7, and ends the compensation operation (step T8).

 図10に示すように、ステップT3の後、劣化情報生成部50(赤劣化情報生成部51R、緑劣化情報生成部51G、青劣化情報生成部51B)(図7参照)は、第1アクティブ領域AC1に隣接する第1測定領域MA1に含まれる複数の測定サブ画素MSPおける各測定回路MC(赤測定回路RMC、緑測定回路GMC、青測定回路BMC)から供給された測定データが示す電圧値を発光色毎に平均し、平均値である発光色毎の第1平均測定データを算出する(ステップT4a)。また、劣化情報生成部50(赤劣化情報生成部51R、緑劣化情報生成部51G、青劣化情報生成部51B)(図7参照)は、第2アクティブ領域AC2に隣接する第2測定領域MA2に含まれる複数の測定サブ画素MSPおける各測定回路MC(赤測定回路RMC、緑測定回路GMC、青測定回路BMC)から供給された測定データが示す電圧値を発光色毎に平均し、平均値である発光色毎の第2平均測定データを算出する(ステップT4b)。また、劣化情報生成部50(赤劣化情報生成部51R、緑劣化情報生成部51G、青劣化情報生成部51B)(図7参照)は、第3アクティブ領域AC3に隣接する第3測定領域MA3に含まれる複数の測定サブ画素MSPおける各測定回路MC(赤測定回路RMC、緑測定回路GMC、青測定回路BMC)から供給された測定データが示す電圧値を発光色毎に平均し、平均値である発光色毎の第3平均測定データを算出する(ステップT4c)。また、劣化情報生成部50(赤劣化情報生成部51R、緑劣化情報生成部51G、青劣化情報生成部51B)(図7参照)は、第4アクティブ領域AC4に隣接する第4測定領域MA4に含まれる複数の測定サブ画素MSPおける各測定回路MC(赤測定回路RMC、緑測定回路GMC、青測定回路BMC)から供給された測定データが示す電圧値を発光色毎に平均し、平均値である発光色毎の第4平均測定データを算出する(ステップT4d)。 As shown in FIG. 10, after step T3, the degradation information generation unit 50 (the red degradation information generation unit 51R, the green degradation information generation unit 51G, the blue degradation information generation unit 51B) (see FIG. 7) The voltage value indicated by the measurement data supplied from each measurement circuit MC (red measurement circuit RMC, green measurement circuit GMC, blue measurement circuit BMC) in the plurality of measurement sub-pixels MSP included in the first measurement area MA1 adjacent to AC1 Averaging is performed for each luminescent color, and first average measurement data for each luminescent color, which is an average value, is calculated (step T4a). In addition, the deterioration information generation unit 50 (red deterioration information generation unit 51R, green deterioration information generation unit 51G, blue deterioration information generation unit 51B) (see FIG. 7) is provided in the second measurement area MA2 adjacent to the second active area AC2. The voltage values indicated by the measurement data supplied from each of the measurement circuits MC (red measurement circuit RMC, green measurement circuit GMC, blue measurement circuit BMC) in the plurality of measurement subpixels included are averaged for each luminescent color and averaged Second average measurement data for each luminescent color is calculated (step T4b). In addition, the deterioration information generation unit 50 (red deterioration information generation unit 51R, green deterioration information generation unit 51G, blue deterioration information generation unit 51B) (see FIG. 7) is located in the third measurement area MA3 adjacent to the third active area AC3. The voltage values indicated by the measurement data supplied from each of the measurement circuits MC (red measurement circuit RMC, green measurement circuit GMC, blue measurement circuit BMC) in the plurality of measurement subpixels included are averaged for each luminescent color and averaged The third average measurement data for each luminescent color is calculated (step T4c). Further, the deterioration information generation unit 50 (red deterioration information generation unit 51R, green deterioration information generation unit 51G, blue deterioration information generation unit 51B) (see FIG. 7) is located in the fourth measurement area MA4 adjacent to the fourth active area AC4. The voltage values indicated by the measurement data supplied from each of the measurement circuits MC (red measurement circuit RMC, green measurement circuit GMC, blue measurement circuit BMC) in the plurality of measurement subpixels included are averaged for each luminescent color and averaged The fourth average measurement data for each luminescent color is calculated (step T4d).

 次に、劣化情報生成部50(赤劣化情報生成部51R、緑劣化情報生成部51G、青劣化情報生成部51B)は、第1平均測定データと、データ記憶部52に記憶されている輝度データとを発光色毎に比較する(ステップT5a)。また、劣化情報生成部50(赤劣化情報生成部51R、緑劣化情報生成部51G、青劣化情報生成部51B)は、第2平均測定データと、データ記憶部52に記憶されている輝度データとを発光色毎に比較する(ステップT5b)。また、劣化情報生成部50(赤劣化情報生成部51R、緑劣化情報生成部51G、青劣化情報生成部51B)は、第3平均測定データと、データ記憶部52に記憶されている輝度データとを発光色毎に比較する(ステップT5c)。また、劣化情報生成部50(赤劣化情報生成部51R、緑劣化情報生成部51G、青劣化情報生成部51B)は、第4平均測定データと、データ記憶部52に記憶されている輝度データとを発光色毎に比較する(ステップT5d)。 Next, the deterioration information generation unit 50 (red deterioration information generation unit 51R, green deterioration information generation unit 51G, blue deterioration information generation unit 51B) outputs the first average measurement data and the luminance data stored in the data storage unit 52. Are compared for each luminescent color (step T5a). In addition, the deterioration information generation unit 50 (red deterioration information generation unit 51R, green deterioration information generation unit 51G, blue deterioration information generation unit 51B) includes the second average measurement data and the luminance data stored in the data storage unit 52. Are compared for each luminescent color (step T5b). In addition, the deterioration information generation unit 50 (red deterioration information generation unit 51R, green deterioration information generation unit 51G, blue deterioration information generation unit 51B) includes the third average measurement data and the luminance data stored in the data storage unit 52. Are compared for each luminescent color (step T5c). In addition, the deterioration information generation unit 50 (red deterioration information generation unit 51R, green deterioration information generation unit 51G, blue deterioration information generation unit 51B) includes the fourth average measurement data and the luminance data stored in the data storage unit 52. Are compared for each luminescent color (step T5d).

 次いで、劣化情報生成部50(赤劣化情報生成部51R、緑劣化情報生成部51G、青劣化情報生成部51B)は、第1平均測定データが示す電圧値と所望の輝度となる電圧値との差分値を発光色毎に算出し、当該算出した電圧値を第1劣化情報として発光色毎にソースドライバ41へ出力する(ステップT6a)。また、劣化情報生成部50(赤劣化情報生成部51R、緑劣化情報生成部51G、青劣化情報生成部51B)は、第2平均測定データが示す電圧値と所望の輝度となる電圧値との差分値を発光色毎に算出し、当該算出した電圧値を第2劣化情報として発光色毎にソースドライバ41へ出力する(ステップT6b)。また、劣化情報生成部50(赤劣化情報生成部51R、緑劣化情報生成部51G、青劣化情報生成部51B)は、第3平均測定データが示す電圧値と所望の輝度となる電圧値との差分値を発光色毎に算出し、当該算出した電圧値を第3劣化情報として発光色毎にソースドライバ41へ出力する(ステップT6c)。また、劣化情報生成部50(赤劣化情報生成部51R、緑劣化情報生成部51G、青劣化情報生成部51B)は、第4平均測定データが示す電圧値と所望の輝度となる電圧値との差分値を発光色毎に算出し、当該算出した電圧値を第4劣化情報として発光色毎にソースドライバ41へ出力する(ステップT6d)。 Next, the deterioration information generation unit 50 (red deterioration information generation unit 51R, green deterioration information generation unit 51G, blue deterioration information generation unit 51B) calculates the voltage value indicated by the first average measurement data and the voltage value that achieves the desired luminance. A difference value is calculated for each luminescent color, and the calculated voltage value is output to the source driver 41 for each luminescent color as first deterioration information (step T6a). In addition, the deterioration information generation unit 50 (red deterioration information generation unit 51R, green deterioration information generation unit 51G, blue deterioration information generation unit 51B) generates a voltage value indicated by the second average measurement data and a voltage value that achieves a desired luminance. A difference value is calculated for each luminescent color, and the calculated voltage value is output to the source driver 41 for each luminescent color as second deterioration information (step T6b). In addition, the deterioration information generation unit 50 (red deterioration information generation unit 51R, green deterioration information generation unit 51G, blue deterioration information generation unit 51B) generates a voltage value indicated by the third average measurement data and a voltage value that achieves a desired luminance. A difference value is calculated for each luminescent color, and the calculated voltage value is output to the source driver 41 for each luminescent color as third deterioration information (step T6c). In addition, the deterioration information generation unit 50 (red deterioration information generation unit 51R, green deterioration information generation unit 51G, blue deterioration information generation unit 51B) generates a voltage value indicated by the fourth average measurement data and a voltage value that achieves a desired luminance. A difference value is calculated for each luminescent color, and the calculated voltage value is output to the source driver 41 for each luminescent color as fourth deterioration information (step T6d).

 次に、ソースドライバ41は、劣化情報生成部50(赤劣化情報生成部51R、緑劣化情報生成部51G、青劣化情報生成部51B)から供給された発光色毎の第1劣化情報に基づいて、第1アクティブ領域AC1に含まれる発光色毎の全サブ画素SP及び全測定サブ画素MSPの各アノード22に供給するための駆動電圧を発光色毎に調整する(ステップT7a)。また、ソースドライバ41は、劣化情報生成部50(赤劣化情報生成部51R、緑劣化情報生成部51G、青劣化情報生成部51B)から供給された発光色毎の第2劣化情報に基づいて、第2アクティブ領域AC2に含まれる発光色毎の全サブ画素SP及び全測定サブ画素MSPの各アノード22に供給するための駆動電圧を発光色毎に調整する(ステップT7b)。また、ソースドライバ41は、劣化情報生成部50(赤劣化情報生成部51R、緑劣化情報生成部51G、青劣化情報生成部51B)から供給された発光色毎の第3劣化情報に基づいて、第3アクティブ領域AC3に含まれる発光色毎の全サブ画素SP及び全測定サブ画素MSPの各アノード22に供給するための駆動電圧を発光色毎に調整する(ステップT7c)。また、ソースドライバ41は、劣化情報生成部50(赤劣化情報生成部51R、緑劣化情報生成部51G、青劣化情報生成部51B)から供給された発光色毎の第4劣化情報に基づいて、第4アクティブ領域AC4に含まれる発光色毎の全サブ画素SP及び全測定サブ画素MSPの各アノード22に供給するための駆動電圧を発光色毎に調整する(ステップT7d)。 Next, based on the first deterioration information for each luminescent color supplied from the deterioration information generation unit 50 (red deterioration information generation unit 51R, green deterioration information generation unit 51G, and blue deterioration information generation unit 51B), the source driver 41 The drive voltage to be supplied to each anode 22 of all the sub-pixels SP and all the measurement sub-pixels MSP for each luminescent color included in the first active region AC1 is adjusted for each luminescent color (step T7a). In addition, the source driver 41 is based on the second deterioration information for each luminescent color supplied from the deterioration information generation unit 50 (red deterioration information generation unit 51R, green deterioration information generation unit 51G, blue deterioration information generation unit 51B). The drive voltages to be supplied to all the sub-pixels SP for each light emission color and each anode 22 of all the measurement sub-pixels MSP included in the second active region AC2 are adjusted for each light emission color (step T7b). In addition, the source driver 41 is based on the third deterioration information for each light emission color supplied from the deterioration information generation unit 50 (red deterioration information generation unit 51R, green deterioration information generation unit 51G, blue deterioration information generation unit 51B). The drive voltages to be supplied to all the sub-pixels SP for each light emission color and each anode 22 of all the measurement sub-pixels MSP included in the third active region AC3 are adjusted for each light emission color (step T7c). In addition, the source driver 41 is based on the fourth deterioration information for each luminescent color supplied from the deterioration information generation unit 50 (red deterioration information generation unit 51R, green deterioration information generation unit 51G, blue deterioration information generation unit 51B). The drive voltages to be supplied to all the sub-pixels SP for each light-emission color and each anode 22 of all the measurement sub-pixels MSP included in the fourth active region AC4 are adjusted for each light-emission color (step T7d).

 これにより、電圧補償動作は終了する(ステップT8)。なお、ここで、電圧補償動作を終了せず、ステップT2へ戻り、測定用電圧を変更して、再度、電圧補償動作を行ってもよい。また、ステップT4a~T4dの順番は任意であり並行処理してもよく、ステップT5a~T5dの順番は任意であり並行処理してもよく、ステップT6a~T6dの順番は任意であり並行処理してもよく、ステップT7a~T7dの順番は任意であり並行処理してもよい。 Thus, the voltage compensation operation ends (step T8). Here, without completing the voltage compensation operation, the process may return to step T2, change the measurement voltage, and perform the voltage compensation operation again. Further, the order of steps T4a to T4d is arbitrary and may be processed in parallel, the order of steps T5a to T5d may be arbitrary and may be parallel processing, and the order of steps T6a to T6d is arbitrary and may be processed in parallel The order of steps T7a to T7d is arbitrary and may be processed in parallel.

 〔実施形態3〕
 各サブ画素に含まれる発光素子の劣化度合いは、アクティブ領域ACの端のサブ画素と、中央部のサブ画素とでは異なる場合がある。そこで、表示デバイス2は、アクティブ領域ACに含まれる端のサブ画素と、中央部のサブ画素とで、駆動電圧を調整する度合いを変えてもよい。
Third Embodiment
The deterioration degree of the light emitting element included in each sub pixel may be different between the sub pixel at the end of the active region AC and the sub pixel at the center. Therefore, the display device 2 may change the degree of adjusting the drive voltage between the sub-pixels at the end included in the active region AC and the sub-pixels in the center.

 本実施形態における電圧補償動作は、ステップT1~T5までは実施形態1(図9)と同じである。ステップT6において、劣化情報生成部50は、平均測定データが示す電圧値と所望の輝度となる電圧値との差分値を発光色毎に算出し、さらに、アクティブ領域ACの端のサブ画素から中央のサブ画素に向かって、補正量が増加又は減少する値になるように算出した電圧値を、劣化情報として発光色毎にソースドライバ41へ出力する(ステップT6)。この後のステップT7~T8は実施形態1(図9)と同じである。 The voltage compensation operation in the present embodiment is the same as that of the first embodiment (FIG. 9) in steps T1 to T5. In step T6, the deterioration information generation unit 50 calculates, for each luminescent color, the difference value between the voltage value indicated by the average measurement data and the voltage value that achieves the desired luminance, and further, from the sub-pixel at the end of the active area AC The voltage value calculated so as to increase or decrease the correction amount toward the sub-pixel is output to the source driver 41 for each luminescent color as degradation information (step T6). The subsequent steps T7 to T8 are the same as in the first embodiment (FIG. 9).

 上記構成によると、アクティブ領域ACの端と中央部とで発光素子の劣化度合いが異なっていても、正確に、アクティブ領域ACの端と中央部とで発光素子の駆動電圧を調整することができる。 According to the above configuration, even if the deterioration degree of the light emitting element is different between the end and the central part of the active region AC, the drive voltage of the light emitting element can be accurately adjusted between the end and the central part of the active region AC. .

 〔まとめ〕
 本実施形態にかかる表示デバイスが備える電気光学素子(電流によって輝度や透過率が制御される電気光学素子)は特に限定されるものではない。本実施形態にかかる表示装置としては、例えば、電気光学素子としてOLED(Organic Light Emitting Diode:有機発光ダイオード)を備えた有機EL(Electro Luminescence:エレクトロルミネッセンス)ディスプレイ、電気光学素子として無機発光ダイオードを備えた無機ELディスプレイ、電気光学素子としてQLED(Quantum dot Light Emitting Diode:量子ドット発光ダイオード)を備えたQLEDディスプレイ等が挙げられる。
[Summary]
The electro-optical elements (electro-optical elements whose luminance and transmittance are controlled by the current) included in the display device according to the present embodiment are not particularly limited. The display device according to the present embodiment includes, for example, an organic EL (Electro Luminescence) display provided with an OLED (Organic Light Emitting Diode) as an electro-optical element, and an inorganic light emitting diode as an electro-optical element Inorganic EL display, a QLED display provided with a QLED (Quantum dot Light Emitting Diode) as an electro-optical element, and the like.

 〔各態様〕
 本発明の態様1に係る表示デバイスは、画像の表示に寄与するアクティブ領域に設けられた複数の表示サブ画素と、上記アクティブ領域外であって画像の表示に寄与しない複数の測定サブ画素とを有し、上記複数の表示サブ画素は、発光層、上記複数の表示サブ画素毎に設けられた第1電極、及び、当該発光層を介在させて上記第1電極と対向配置されている第2電極を含み、上記複数の測定サブ画素は、発光層、上記複数の測定サブ画素毎に設けられた第1電極、及び、当該発光層を介在させて上記第1電極と対向配置されている第2電極を含み、上記複数の測定サブ画素毎に、上記第1電極及び第2電極間の電圧値を測定する測定回路が接続されていることを特徴とする。
[Aspects]
A display device according to aspect 1 of the present invention includes a plurality of display sub-pixels provided in an active area contributing to the display of an image, and a plurality of measurement sub-pixels outside the active area and not contributing to the display of an image. And the plurality of display sub-pixels are provided with a light-emitting layer, a first electrode provided for each of the plurality of display sub-pixels, and a second electrode disposed opposite to the first electrode with the light-emitting layer interposed therebetween. A plurality of measurement sub-pixels including an electrode, a light emitting layer, a first electrode provided for each of the plurality of measurement sub-pixels, and a first electrode disposed opposite to the first electrode with the light emitting layer interposed therebetween A measurement circuit including two electrodes and measuring a voltage value between the first electrode and the second electrode is connected to each of the plurality of measurement sub-pixels.

 本発明の態様2に係る表示デバイスは、上記態様1において、上記測定回路が測定した電圧値に基づいて上記発光層の劣化状態を示す劣化情報を生成する劣化情報生成部と、上記劣化情報に基づいて、上記各第1電極に供給するための上記表示に応じた電圧値である駆動電圧を調整するソースドライバとを有する。 In the display device according to aspect 2 of the present invention, according to the aspect 1, the deterioration information generation unit generates the deterioration information indicating the deterioration state of the light emitting layer based on the voltage value measured by the measurement circuit; And a source driver for adjusting a drive voltage which is a voltage value according to the display to be supplied to the first electrodes.

 本発明の態様3に係る表示デバイスは、上記態様2において、上記複数の測定サブ画素は、上記複数の表示サブ画素の発光色毎に設けられており、上記劣化情報生成部は、上記複数の測定サブ画素における各測定回路が測定した電圧値から、上記劣化情報を上記発光色毎に算出し、上記ソースドライバは、上記発光色毎に、上記劣化情報に基づいて上記駆動電圧を調整する。 In the display device according to aspect 3 of the present invention, in the aspect 2, the plurality of measurement sub-pixels are provided for each light emission color of the plurality of display sub-pixels, and the deterioration information generation unit The deterioration information is calculated for each light emission color from the voltage value measured by each measurement circuit in the measurement sub-pixel, and the source driver adjusts the drive voltage based on the deterioration information for each light emission color.

 本発明の態様4に係る表示デバイスは、上記態様3において、上記測定サブ画素の色に対応するアクティブ領域に含まれる全サブ画素の駆動電圧の平均の電圧が、駆動電圧として上記測定サブ画素に供給されてもよい。 In the display device according to aspect 4 of the present invention, in the aspect 3, the average voltage of the drive voltages of all the sub-pixels included in the active region corresponding to the color of the measurement sub-pixel It may be supplied.

 本発明の態様5に係る表示デバイスは、上記態様3又は4において、上記劣化情報生成部は、上記複数の測定サブ画素における各測定回路が測定した電圧値を平均し、当該平均値である平均測定データと、所望の輝度となる電圧値との差分値である劣化情報を上記発光色毎に算出し、上記ソースドライバは、上記劣化情報に基づいて、上記アクティブ領域の各表示サブ画素に供給するための上記駆動電圧を、上記発光色毎に調整する。 In the display device according to aspect 5 of the present invention, in the above aspect 3 or 4, the deterioration information generation unit averages voltage values measured by the respective measurement circuits in the plurality of measurement sub-pixels, and the average is the average value. The degradation information, which is the difference between the measurement data and the voltage value that produces the desired luminance, is calculated for each of the luminescent colors, and the source driver supplies the display sub-pixels in the active area based on the degradation information. The drive voltage for adjusting the light emission color is adjusted for each light emission color.

 本発明の態様6に係る表示デバイスは、上記態様3において、上記アクティブ領域は、第1領域と第2領域とを含む複数の領域を有し、上記複数の測定サブ画素は、上記第1領域に隣接する複数の測定サブ画素と、上記第2領域に隣接する複数の測定サブ画素とを有し、上記劣化情報生成部は、上記第1領域に隣接する複数の測定サブ画素おける各測定回路が測定した電圧値の平均値である第1測定データと、所望の輝度となる電圧値との差分値である第1劣化情報を上記発光色毎に算出し、上記第2領域に隣接する複数の測定サブ画素おける各測定回路が測定した電圧値の平均値である第2測定データと、所望の輝度となる電圧値との差分値である第2劣化情報を上記発光色毎に算出し、上記ソースドライバは、上記第1劣化情報に基づいて上記第1領域の各表示サブ画素に供給するための上記駆動電圧を、上記発光色毎に調整し、上記第2劣化情報に基づいて上記第2領域の各表示サブ画素に供給するための上記駆動電圧を、上記発光色毎に調整する。 In the display device according to Aspect 6 of the present invention, in Aspect 3, the active area has a plurality of areas including a first area and a second area, and the plurality of measurement sub-pixels are the first area. , And the deterioration information generation unit is configured to measure each of the measurement circuits in the plurality of measurement sub-pixels adjacent to the first area. The first deterioration information, which is the difference between the first measurement data, which is the average value of the measured voltage values, and the voltage value that produces the desired brightness, is calculated for each of the luminescent colors. Calculating second degradation information, which is a difference value between a second measurement data that is an average value of voltage values measured by each measurement circuit in each of the measurement sub-pixels and a voltage value that achieves a desired luminance, The source driver is based on the first deterioration information. The drive voltage to be supplied to each display sub-pixel in the first area is adjusted for each light emission color, and is supplied to each display sub-pixel in the second area based on the second deterioration information. The drive voltage is adjusted for each of the luminescent colors.

 本発明の態様7に係る表示デバイスは、上記態様3において、上記劣化情報生成部は、上記複数の測定サブ画素における各測定回路が測定した電圧値から、端の上記表示サブ画素から中央の上記表示サブ画素に向かって、補正量が増加又は減少する値になるように、上記劣化情報を、上記発光色毎に算出する。 In the display device according to aspect 7 of the present invention, in the aspect 3, the deterioration information generation unit determines the voltage value measured by each measurement circuit in the plurality of measurement sub-pixels to the center from the display sub-pixel at the end. The deterioration information is calculated for each of the luminescent colors such that the correction amount increases or decreases toward the display sub-pixel.

 本発明の態様8に係る表示デバイスは、上記態様2~7において、上記複数の測定サブ画素は遮光されている。 In the display device according to aspect 8 of the present invention, in the above aspects 2 to 7, the plurality of measurement sub-pixels are shielded from light.

 本発明の態様9に係る表示デバイスは、上記態様2~7において、上記アクティブ領域に隣接して、上記画像の表示に寄与しない複数のダミーサブ画素が設けられており、上記測定サブ画素は、上記測定回路が上記ダミーサブ画素に設けられることで構成されている。 In the display device according to aspect 9 of the present invention, in the above aspects 2 to 7, a plurality of dummy sub-pixels that do not contribute to the display of the image are provided adjacent to the active region. The measurement circuit is configured by being provided in the dummy sub-pixel.

 本発明の態様9に係る表示デバイスは、上記態様2~8において、上記表示デバイスの起動時に、上記劣化情報生成部は上記劣化情報を生成し、上記ソースドライバは当該劣化情報に基づいて上記駆動電圧を調整する。 In the display device according to aspect 9 of the present invention, in the above aspects 2 to 8, when the display device is activated, the degradation information generation unit generates the degradation information, and the source driver performs the driving based on the degradation information. Adjust the voltage.

 本発明の態様10に係る表示デバイスは、上記態様2~9において、上記アクティブ領域の周囲にはダミー領域が設けられており、上記測定サブ画素及び上記測定回路は、上記ダミー領域に設けられていてもよい。 In the display device according to aspect 10 of the present invention, in the above aspects 2 to 9, a dummy area is provided around the active area, and the measurement sub-pixel and the measurement circuit are provided in the dummy area. May be

 本発明の態様11に係る表示デバイスは、上記態様2~10において、上記アクティブ領域と、上記測定サブ画素との間には、上記表示デバイスを折り曲げる領域である折り曲げ部が設けられていてもよい。 In the display device according to aspect 11 of the present invention, in the above aspects 2 to 10, a bending portion which is an area for bending the display device may be provided between the active region and the measurement sub-pixel .

 本発明の態様12に係る表示デバイスは、上記態様2~11において、所定時間間隔で、上記劣化情報生成部は上記劣化情報を生成し、上記ソースドライバは当該劣化情報に基づいて上記駆動電圧を調整する。 In the display device according to aspect 12 of the present invention, in the above aspects 2 to 11, the degradation information generation unit generates the degradation information at predetermined time intervals, and the source driver generates the drive voltage based on the degradation information. adjust.

 本発明の態様13に係る表示デバイスの駆動方法は、表示デバイスの駆動方法であって、上記表示デバイスは、画像の表示に寄与するアクティブ領域に設けられた複数の表示サブ画素と、上記アクティブ領域外であって画像の表示に寄与しない複数の測定サブ画素とを有し、上記複数の表示サブ画素は、発光層、上記複数の表示サブ画素毎に設けられた第1電極、及び、当該発光層を介在させて上記第1電極と対向配置されている第2電極を含み、上記複数の測定サブ画素は、発光層、上記複数の測定サブ画素毎に設けられた第1電極、及び、当該発光層を介在させて上記第1電極と対向配置されている第2電極を含み、上記複数の測定サブ画素毎に接続されたそれぞれの測定回路によって、当該測定サブ画素に含まれる上記第1電極及び第2電極間の電圧値を測定するステップを有することを特徴とする。 The method of driving a display device according to aspect 13 of the present invention is a method of driving a display device, wherein the display device includes a plurality of display sub-pixels provided in an active region contributing to the display of an image, and the active region And a plurality of measurement sub-pixels that do not contribute to the display of the image, the plurality of display sub-pixels being a light emitting layer, a first electrode provided for each of the plurality of display sub-pixels, and the light emission The plurality of measurement sub-pixels include a light emitting layer, a first electrode provided for each of the plurality of measurement sub-pixels, and a plurality of measurement sub-pixels including a second electrode disposed opposite to the first electrode with a layer interposed therebetween. The first electrode included in the measurement sub-pixel by the respective measurement circuits connected to each of the plurality of measurement sub-pixels including the second electrode arranged to face the first electrode with the light emitting layer interposed therebetween. as well as Characterized by the step of measuring a voltage value between the two electrodes.

 本発明の態様15に係る表示デバイスは、上記態様14において、上記測定回路が測定した電圧値に基づいて上記発光層の劣化状態を示す劣化情報を生成するステップと、上記劣化情報に基づいて、上記各第1電極に供給するための上記表示に応じた電圧値である駆動電圧を調整するステップとを有する。 In the display device according to aspect 15 of the present invention, in the aspect 14, the step of generating deterioration information indicating the deterioration state of the light emitting layer based on the voltage value measured by the measurement circuit; Adjusting a driving voltage which is a voltage value according to the display to be supplied to each of the first electrodes.

 本発明は上述した各実施形態に限定されるものではなく、請求項に示した範囲で種々の変更が可能であり、異なる実施形態にそれぞれ開示された技術的手段を適宜組み合わせて得られる実施形態についても本発明の技術的範囲に含まれる。さらに、各実施形態にそれぞれ開示された技術的手段を組み合わせることにより、新しい技術的特徴を形成することができる。 The present invention is not limited to the above-described embodiments, and various modifications can be made within the scope of the claims, and embodiments obtained by appropriately combining the technical means disclosed in the different embodiments. Is also included in the technical scope of the present invention. Furthermore, new technical features can be formed by combining the technical means disclosed in each embodiment.

2 表示デバイス
5 発光素子層
6 封止層
10 下面フィルム
12 樹脂層
15 半導体膜
16・18・20 無機絶縁膜
21 平坦化膜
22 アノード(第1電極)
23 バンク
25 カソード(第2電極)
26 第1無機封止膜
27 有機封止膜
28 第2無機封止膜
39 機能フィルム
41 ソースドライバ
42 ゲートドライバ
50 劣化情報生成部
51B 青劣化情報生成部
51G 緑劣化情報生成部
51R 赤劣化情報生成部
52 データ記憶部
AC1 第1アクティブ領域
AC2 第2アクティブ領域
AC3 第3アクティブ領域
AC4 第4アクティブ領域
C1 コンデンサ
GH ゲート配線
MA1 第1測定領域
MA2 第2測定領域
MA3 第3測定領域
MA4 第4測定領域
SH  ソース配線
T1~T7 トランジスタ
Tr 薄層トランジスタ
Vini 初期化電源線
DESCRIPTION OF SYMBOLS 2 Display device 5 Light emitting element layer 6 Sealing layer 10 Lower surface film 12 Resin layer 15 Semiconductor film 16 18 20 inorganic insulating film 21 flattening film 22 anode (first electrode)
23 banks 25 cathode (second electrode)
26 first inorganic sealing film 27 organic sealing film 28 second inorganic sealing film 39 functional film 41 source driver 42 gate driver 50 deterioration information generation unit 51B blue deterioration information generation unit 51G green deterioration information generation unit 51R red deterioration information generation Data storage unit AC1 first active region AC2 second active region AC3 third active region AC4 fourth active region C1 capacitor GH gate wiring MA1 first measurement region MA2 second measurement region MA3 third measurement region MA4 fourth measurement region SH source wiring T1 to T7 transistor Tr thin layer transistor Vini initialization power supply line

Claims (15)

 画像の表示に寄与するアクティブ領域に設けられた複数の表示サブ画素と、
 上記アクティブ領域外であって画像の表示に寄与しない複数の測定サブ画素とを有し、
 上記複数の表示サブ画素は、発光層、上記複数の表示サブ画素毎に設けられた第1電極、及び、当該発光層を介在させて上記第1電極と対向配置されている第2電極を含み、
 上記複数の測定サブ画素は、発光層、上記複数の測定サブ画素毎に設けられた第1電極、及び、当該発光層を介在させて上記第1電極と対向配置されている第2電極を含み、
 上記複数の測定サブ画素毎に、上記第1電極及び第2電極間の電圧値を測定する測定回路が接続されていることを特徴とする表示デバイス。
A plurality of display sub-pixels provided in an active area contributing to the display of an image;
And a plurality of measurement sub-pixels which do not contribute to the display of the image, which are outside the active area
The plurality of display sub-pixels include a light-emitting layer, a first electrode provided for each of the plurality of display sub-pixels, and a second electrode disposed opposite to the first electrode with the light-emitting layer interposed therebetween. ,
The plurality of measurement sub-pixels include a light emitting layer, a first electrode provided for each of the plurality of measurement sub pixels, and a second electrode disposed opposite to the first electrode with the light emitting layer interposed therebetween. ,
A display device characterized in that a measurement circuit for measuring a voltage value between the first electrode and the second electrode is connected to each of the plurality of measurement sub-pixels.
 上記測定回路が測定した電圧値に基づいて上記発光層の劣化状態を示す劣化情報を生成する劣化情報生成部と、
 上記劣化情報に基づいて、上記各第1電極に供給するための上記表示に応じた電圧値である駆動電圧を調整するソースドライバとを有することを特徴とする請求項1に記載の表示デバイス。
A degradation information generation unit that generates degradation information indicating a degradation state of the light emitting layer based on a voltage value measured by the measurement circuit;
The display device according to claim 1, further comprising: a source driver that adjusts a drive voltage that is a voltage value according to the display to be supplied to the first electrodes based on the deterioration information.
 上記複数の測定サブ画素は、上記複数の表示サブ画素の発光色毎に設けられており、
 上記劣化情報生成部は、上記複数の測定サブ画素における各測定回路が測定した電圧値から、上記劣化情報を上記発光色毎に算出し、
 上記ソースドライバは、上記発光色毎に、上記劣化情報に基づいて上記駆動電圧を調整することを特徴とする請求項2に記載の表示デバイス。
The plurality of measurement sub-pixels are provided for each emission color of the plurality of display sub-pixels,
The deterioration information generation unit calculates the deterioration information for each of the luminescent colors from the voltage values measured by the measurement circuits in the plurality of measurement sub-pixels,
The display device according to claim 2, wherein the source driver adjusts the drive voltage based on the deterioration information for each of the luminescent colors.
 上記測定サブ画素の色に対応するアクティブ領域に含まれる全サブ画素の駆動電圧の平均の電圧が、駆動電圧として上記測定サブ画素に供給されることを特徴とする請求項3に記載の表示デバイス。 The display device according to claim 3, wherein an average voltage of drive voltages of all the sub-pixels included in the active area corresponding to the color of the measurement sub-pixel is supplied to the measurement sub-pixel as a drive voltage. .  上記劣化情報生成部は、上記複数の測定サブ画素における各測定回路が測定した電圧値を平均し、当該平均値である平均測定データと、所望の輝度となる電圧値との差分値である劣化情報を上記発光色毎に算出し、
 上記ソースドライバは、上記劣化情報に基づいて、上記アクティブ領域の各表示サブ画素に供給するための上記駆動電圧を、上記発光色毎に調整することを特徴とする請求項3又は4に記載の表示デバイス。
The deterioration information generation unit averages voltage values measured by each measurement circuit in the plurality of measurement sub-pixels, and deterioration is a difference value between average measurement data as the average value and a voltage value as a desired luminance. Information is calculated for each of the luminescent colors
The said source driver adjusts the said drive voltage for supplying to each display sub-pixel of the said active region for every said luminescent color based on the said degradation information, The said claim 3 or 4 characterized by the above-mentioned. Display device.
 上記アクティブ領域は、第1領域と第2領域とを含む複数の領域を有し、
 上記複数の測定サブ画素は、上記第1領域に隣接する複数の測定サブ画素と、上記第2領域に隣接する複数の測定サブ画素とを有し、
 上記劣化情報生成部は、
  上記第1領域に隣接する複数の測定サブ画素おける各測定回路が測定した電圧値の平均値である第1測定データと、所望の輝度となる電圧値との差分値である第1劣化情報を上記発光色毎に算出し、
  上記第2領域に隣接する複数の測定サブ画素おける各測定回路が測定した電圧値の平均値である第2測定データと、所望の輝度となる電圧値との差分値である第2劣化情報を上記発光色毎に算出し、
 上記ソースドライバは、
  上記第1劣化情報に基づいて上記第1領域の各表示サブ画素に供給するための上記駆動電圧を、上記発光色毎に調整し、
  上記第2劣化情報に基づいて上記第2領域の各表示サブ画素に供給するための上記駆動電圧を、上記発光色毎に調整することを特徴とする請求項3に記載の表示デバイス。
The active area has a plurality of areas including a first area and a second area,
The plurality of measurement sub-pixels include a plurality of measurement sub-pixels adjacent to the first area and a plurality of measurement sub-pixels adjacent to the second area,
The degradation information generation unit
The first deterioration information, which is the difference between the first measurement data, which is the average value of the voltage values measured by the measurement circuits in the plurality of measurement sub-pixels adjacent to the first region, and the voltage value that achieves the desired luminance Calculated for each luminescent color
The second deterioration information, which is a difference value between the second measurement data, which is the average value of the voltage values measured by each measurement circuit in the plurality of measurement sub-pixels adjacent to the second region, and the voltage value that achieves the desired luminance Calculated for each luminescent color
The above source driver is
Adjusting the drive voltage to be supplied to each display sub-pixel of the first area based on the first deterioration information for each of the luminescent colors;
4. The display device according to claim 3, wherein the drive voltage to be supplied to each display sub-pixel in the second area is adjusted for each of the luminescent colors based on the second deterioration information.
 上記劣化情報生成部は、上記複数の測定サブ画素における各測定回路が測定した電圧値から、端の上記表示サブ画素から中央の上記表示サブ画素に向かって、補正量が増加又は減少する値になるように、上記劣化情報を、上記発光色毎に算出することを特徴とする請求項3に記載の表示デバイス。 The deterioration information generation unit is configured to increase or decrease the correction amount from the display sub-pixel at the end to the display sub-pixel at the center from the voltage value measured by each measurement circuit in the plurality of measurement sub-pixels. The display device according to claim 3, wherein the deterioration information is calculated for each of the luminescent colors so as to become.  上記複数の測定サブ画素は遮光されていることを特徴とする請求項2~7の何れか1項に記載の表示デバイス。 The display device according to any one of claims 2 to 7, wherein the plurality of measurement sub-pixels are shielded from light.  上記アクティブ領域に隣接して、上記画像の表示に寄与しない複数のダミーサブ画素が設けられており、
 上記測定サブ画素は、上記測定回路が上記ダミーサブ画素に設けられることで構成されていることを特徴とする請求項2~7の何れか1項に記載の表示デバイス。
Adjacent to the active area, a plurality of dummy sub-pixels that do not contribute to the display of the image are provided;
The display device according to any one of claims 2 to 7, wherein the measurement sub-pixel is configured by providing the measurement circuit in the dummy sub-pixel.
 上記アクティブ領域の周囲にはダミー領域が設けられており、
 上記測定サブ画素及び上記測定回路は、上記ダミー領域に設けられていることを特徴とする請求項2~9の何れか1項に記載の表示デバイス。
A dummy area is provided around the active area,
The display device according to any one of claims 2 to 9, wherein the measurement sub-pixel and the measurement circuit are provided in the dummy area.
 上記アクティブ領域と、上記測定サブ画素との間には、上記表示デバイスを折り曲げる領域である折り曲げ部が設けられていることを特徴とする請求項2~10の何れか1項に記載の表示デバイス。 The display device according to any one of claims 2 to 10, wherein a bending portion which is a region for bending the display device is provided between the active region and the measurement sub-pixel. .  上記表示デバイスの起動時に、上記劣化情報生成部は上記劣化情報を生成し、上記ソースドライバは当該劣化情報に基づいて上記駆動電圧を調整することを特徴とする請求項2~11の何れか1項に記載の表示デバイス。 12. The device according to any one of claims 2 to 11, wherein the deterioration information generation unit generates the deterioration information when the display device is activated, and the source driver adjusts the drive voltage based on the deterioration information. The display device described in the section.  所定時間間隔で、上記劣化情報生成部は上記劣化情報を生成し、上記ソースドライバは当該劣化情報に基づいて上記駆動電圧を調整することを特徴とする請求項2~11の何れか1項に記載の表示デバイス。 12. The device according to any one of claims 2 to 11, wherein the degradation information generation unit generates the degradation information at predetermined time intervals, and the source driver adjusts the drive voltage based on the degradation information. Display device described.  表示デバイスの駆動方法であって、
 上記表示デバイスは、
 画像の表示に寄与するアクティブ領域に設けられた複数の表示サブ画素と、
 上記アクティブ領域外であって画像の表示に寄与しない複数の測定サブ画素とを有し、
 上記複数の表示サブ画素は、発光層、上記複数の表示サブ画素毎に設けられた第1電極、及び、当該発光層を介在させて上記第1電極と対向配置されている第2電極を含み、
 上記複数の測定サブ画素は、発光層、上記複数の測定サブ画素毎に設けられた第1電極、及び、当該発光層を介在させて上記第1電極と対向配置されている第2電極を含み、
 上記複数の測定サブ画素毎に接続されたそれぞれの測定回路によって、当該測定サブ画素に含まれる上記第1電極及び第2電極間の電圧値を測定するステップを有することを特徴とする表示デバイスの駆動方法。
A method of driving a display device,
The display device is
A plurality of display sub-pixels provided in an active area contributing to the display of an image;
And a plurality of measurement sub-pixels which do not contribute to the display of the image, which are outside the active area
The plurality of display sub-pixels include a light-emitting layer, a first electrode provided for each of the plurality of display sub-pixels, and a second electrode disposed opposite to the first electrode with the light-emitting layer interposed therebetween. ,
The plurality of measurement sub-pixels include a light emitting layer, a first electrode provided for each of the plurality of measurement sub pixels, and a second electrode disposed opposite to the first electrode with the light emitting layer interposed therebetween. ,
And measuring the voltage value between the first electrode and the second electrode included in the measurement sub-pixel by each measurement circuit connected to each of the plurality of measurement sub-pixels. How to drive.
 上記測定回路が測定した電圧値に基づいて上記発光層の劣化状態を示す劣化情報を生成するステップと、
 上記劣化情報に基づいて、上記各第1電極に供給するための上記表示に応じた電圧値である駆動電圧を調整するステップとを有することを特徴とする請求項14に記載の表示デバイスの駆動方法。
Generating degradation information indicating a degradation state of the light emitting layer based on a voltage value measured by the measurement circuit;
The drive of the display device according to claim 14, further comprising the step of: adjusting a drive voltage which is a voltage value according to the display to be supplied to the first electrodes based on the deterioration information. Method.
PCT/JP2017/033859 2017-09-20 2017-09-20 Display device and method for driving display device Ceased WO2019058442A1 (en)

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Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN116635926A (en) * 2020-12-29 2023-08-22 夏普株式会社 Display device and method for driving display device
CN116913207A (en) * 2022-04-20 2023-10-20 武汉天马微电子有限公司 Display devices and control methods

Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
JP2002351403A (en) * 2001-05-30 2002-12-06 Toshiba Corp Image display device
JP2007156044A (en) * 2005-12-05 2007-06-21 Sony Corp Self-luminous display device, gradation value / deterioration rate conversion table update device, and program
US7321348B2 (en) * 2000-05-24 2008-01-22 Eastman Kodak Company OLED display with aging compensation
JP2010113228A (en) * 2008-11-07 2010-05-20 Sony Corp Display device and electronic product
JP2011082213A (en) * 2009-10-02 2011-04-21 Sony Corp Display panel, module, and electronic apparatus
WO2016027435A1 (en) * 2014-08-21 2016-02-25 株式会社Joled Display device and display device driving method

Patent Citations (6)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
US7321348B2 (en) * 2000-05-24 2008-01-22 Eastman Kodak Company OLED display with aging compensation
JP2002351403A (en) * 2001-05-30 2002-12-06 Toshiba Corp Image display device
JP2007156044A (en) * 2005-12-05 2007-06-21 Sony Corp Self-luminous display device, gradation value / deterioration rate conversion table update device, and program
JP2010113228A (en) * 2008-11-07 2010-05-20 Sony Corp Display device and electronic product
JP2011082213A (en) * 2009-10-02 2011-04-21 Sony Corp Display panel, module, and electronic apparatus
WO2016027435A1 (en) * 2014-08-21 2016-02-25 株式会社Joled Display device and display device driving method

Cited By (2)

* Cited by examiner, † Cited by third party
Publication number Priority date Publication date Assignee Title
CN116635926A (en) * 2020-12-29 2023-08-22 夏普株式会社 Display device and method for driving display device
CN116913207A (en) * 2022-04-20 2023-10-20 武汉天马微电子有限公司 Display devices and control methods

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