WO2018009314A1 - Circuit intégré monolithique hyperfréquence (mmic) amplifié ayant une section de suppression des oscillations avec un trou d'interconnexion résistif - Google Patents
Circuit intégré monolithique hyperfréquence (mmic) amplifié ayant une section de suppression des oscillations avec un trou d'interconnexion résistif Download PDFInfo
- Publication number
- WO2018009314A1 WO2018009314A1 PCT/US2017/037375 US2017037375W WO2018009314A1 WO 2018009314 A1 WO2018009314 A1 WO 2018009314A1 US 2017037375 W US2017037375 W US 2017037375W WO 2018009314 A1 WO2018009314 A1 WO 2018009314A1
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- substrate
- ing
- resistor
- resistive
- section
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Ceased
Links
Classifications
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03F—AMPLIFIERS
- H03F1/00—Details of amplifiers with only discharge tubes, only semiconductor devices or only unspecified devices as amplifying elements
- H03F1/56—Modifications of input or output impedances, not otherwise provided for
- H03F1/565—Modifications of input or output impedances, not otherwise provided for using inductive elements
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03F—AMPLIFIERS
- H03F3/00—Amplifiers with only discharge tubes or only semiconductor devices as amplifying elements
- H03F3/189—High-frequency amplifiers, e.g. radio frequency amplifiers
-
- H—ELECTRICITY
- H03—ELECTRONIC CIRCUITRY
- H03F—AMPLIFIERS
- H03F3/00—Amplifiers with only discharge tubes or only semiconductor devices as amplifying elements
- H03F3/60—Amplifiers in which coupling networks have distributed constants, e.g. with waveguide resonators
- H03F3/605—Distributed amplifiers
- H03F3/607—Distributed amplifiers using FET's
-
- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10D—INORGANIC ELECTRIC SEMICONDUCTOR DEVICES
- H10D84/00—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers
- H10D84/40—Integrated devices formed in or on semiconductor substrates that comprise only semiconducting layers, e.g. on Si wafers or on GaAs-on-Si wafers characterised by the integration of at least one component covered by groups H10D12/00 or H10D30/00 with at least one component covered by groups H10D10/00 or H10D18/00, e.g. integration of IGFETs with BJTs
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- H10W20/023—
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- H10W20/0234—
-
- H10W20/0242—
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- H10W20/20—
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- H10W44/20—
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- H10W44/401—
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- H10W20/498—
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- H10W72/5453—
Definitions
- a resistive load such as Tantalum Nitride (TaN)
- TaN Tantalum Nitride
- a bias circuit is used to provide a FET used in the amplifier with a proper operating point.
- the bias circuit includes: a Radio Frequency (RF) blocking choke; and a circuit having a dc blocking, or bypass, capacitor and shunt connected resistor.
- the resistor sometimes referred to as a de-Q'ing resistor, is used to suppress or de-Q resonances that may be create between the choke and the bypass capacitor.
- the bottom plate of the bypass capacitor (which is disposed on an upper surface of the MMIC chip is connected through one end of a resistor, also disposed on the upper surface of the chip.
- the opposite end of the resistor is connected to the top of a conductive via which passes vertically though the chip to a ground plane conductor on the bottom surface of the chip as shown in FIGS. 2B and 2C.
- a microwave amplifier having a field effect transistor formed on an upper surface of a substrate and a de-Q'ing section connected to the field effect transistor.
- the de-Q'ing section includes: a de-Quing resistive via that passes through the substrate; and a de-Q'ing capacitor having one plate thereof connected a ground plane conductor through the de-Q'ing resistive via.
- a microwave amplifier is provided having: a substrate; a field effect transistor (FET), formed on an upper surface of the substrate and a de-Q'ing section connected to the field effect transistor.
- FET field effect transistor
- the hole provided by via 32 need not have a circular cross section but rather the cross section can take other shapes such as, for example, oval, rectangular, square, or other regular or irregular closed loop shape.
- FIG. 4 an embodiment is shown where the vias 30' and 32' in FIG. 3B are formed using a laser to produce a cylindrical shaped vias. It is noted that the process steps described above in connection with FIGS. 2C through 21 would be used in processing the structure having cylindrical shaped vias to produce the structure shown in FIG. 4. It is also noted that the resistive material 34' and hence resistor 34 is hollow for both the structure shown in FIG. 3B and the structure shown in FIG. 4. Thus, here again a hollow resistor 34 is formed between the strip conductor 21a and the ground plane conductor 20, such resistor 34 having a length L and a thickness T.
- the de-Q'ing capacitor section 52 includes a capacitor 76 having a top plate 77 connected to the Vdd bus through a microstrip transmission line 80 and a bottom plate 79 connected to one end of a de-Q'ing resistive via; the top plate 77 and bottom plate 79 being separated by a dielectric 81 (FIG. 5B).
- the resistive via 78 is here, for example, TaN, and passes vertically through the chip 50 with the second end of the resistive via 78 being connected to the ground plane conductor 56.
- the resistive via 78 is a hollow resistive via formed using the process described above in connection with FIGS. 3C through 31 and FIG. 4; it should be understood that the resistive via 78 may be a solid resistive material.
Landscapes
- Engineering & Computer Science (AREA)
- Power Engineering (AREA)
- Microwave Amplifiers (AREA)
- Physics & Mathematics (AREA)
- Condensed Matter Physics & Semiconductors (AREA)
- General Physics & Mathematics (AREA)
- Computer Hardware Design (AREA)
- Microelectronics & Electronic Packaging (AREA)
- Amplifiers (AREA)
- Manufacturing & Machinery (AREA)
Abstract
Priority Applications (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP2018568814A JP2019525556A (ja) | 2016-07-05 | 2017-06-14 | 抵抗性ビアを備えたデキューイングセクションを有しながら増幅されるマイクロ波モノリシック集積回路(mmic) |
| EP17734194.8A EP3482494A1 (fr) | 2016-07-05 | 2017-06-14 | Circuit intégré monolithique hyperfréquence (mmic) amplifié ayant une section de suppression des oscillations avec un trou d'interconnexion résistif |
| KR1020197003179A KR20190025690A (ko) | 2016-07-05 | 2017-06-14 | 저항성 비아와 함께 디-큐잉 섹션을 갖는 증폭된 마이크로파 모놀리식 집적 회로(mmic) |
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US15/201,905 | 2016-07-05 | ||
| US15/201,905 US20170271281A1 (en) | 2016-03-21 | 2016-07-05 | Microwave Monolithic Integrated Circuit (MMIC) Amplified Having de-Q'ing Section With Resistive Via |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| WO2018009314A1 true WO2018009314A1 (fr) | 2018-01-11 |
Family
ID=59254026
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| PCT/US2017/037375 Ceased WO2018009314A1 (fr) | 2016-07-05 | 2017-06-14 | Circuit intégré monolithique hyperfréquence (mmic) amplifié ayant une section de suppression des oscillations avec un trou d'interconnexion résistif |
Country Status (4)
| Country | Link |
|---|---|
| EP (1) | EP3482494A1 (fr) |
| JP (1) | JP2019525556A (fr) |
| KR (1) | KR20190025690A (fr) |
| WO (1) | WO2018009314A1 (fr) |
Citations (12)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS63164704A (ja) * | 1986-12-26 | 1988-07-08 | Matsushita Electric Ind Co Ltd | モノリシツクマイクロ波集積回路増幅器 |
| JPS63224508A (ja) * | 1987-03-13 | 1988-09-19 | Matsushita Electric Ind Co Ltd | モノリシツクマイクロ波集積回路多段増幅器 |
| JPH0195602A (ja) * | 1987-10-08 | 1989-04-13 | Nec Corp | チップ化モジュール |
| US4864250A (en) * | 1987-01-29 | 1989-09-05 | Harris Corporation | Distributed amplifier having improved D.C. biasing and voltage standing wave ratio performance |
| JPH06151714A (ja) * | 1992-11-09 | 1994-05-31 | Fujitsu Ltd | 能動デバイスのバイアス電圧供給回路 |
| JPH09307060A (ja) * | 1996-05-16 | 1997-11-28 | Nec Eng Ltd | マイクロ波半導体集積回路 |
| JPH1093019A (ja) * | 1996-09-11 | 1998-04-10 | Denso Corp | モノリシックマイクロ波集積回路 |
| US20020020894A1 (en) * | 2000-08-15 | 2002-02-21 | Masaaki Nishijima | RF passive circuit and RF amplifier with via-holes |
| US7176769B1 (en) * | 2004-11-29 | 2007-02-13 | Hrl Laboratories, Llc | Harmonic termination circuit for medium bandwidth microwave power amplifiers |
| JP2012209907A (ja) * | 2011-03-30 | 2012-10-25 | Furukawa Electric Co Ltd:The | 帰還型発振装置 |
| US8653907B2 (en) * | 2011-07-18 | 2014-02-18 | Raytheon Company | Resonated bypass capacitor for enhanced performance of a microwave circuit |
| WO2016069134A1 (fr) * | 2014-10-31 | 2016-05-06 | Raytheon Company | Réseau d'adaptation de sortie ayant un seul composant condensateur combiné en série et shunt |
Family Cites Families (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH04298106A (ja) * | 1991-03-27 | 1992-10-21 | Toshiba Lighting & Technol Corp | マイクロ波混成集積回路 |
| JP3761729B2 (ja) * | 1998-12-25 | 2006-03-29 | 株式会社ルネサステクノロジ | バイアス回路 |
| JP5547048B2 (ja) * | 2010-12-06 | 2014-07-09 | 株式会社東芝 | 電力増幅器用バイアス回路 |
| JP2013118580A (ja) * | 2011-12-05 | 2013-06-13 | Mitsubishi Electric Corp | 高周波増幅器 |
| JP2015233084A (ja) * | 2014-06-10 | 2015-12-24 | 株式会社日立製作所 | チップモジュールおよび情報処理機器 |
-
2017
- 2017-06-14 KR KR1020197003179A patent/KR20190025690A/ko not_active Ceased
- 2017-06-14 JP JP2018568814A patent/JP2019525556A/ja active Pending
- 2017-06-14 WO PCT/US2017/037375 patent/WO2018009314A1/fr not_active Ceased
- 2017-06-14 EP EP17734194.8A patent/EP3482494A1/fr not_active Withdrawn
Patent Citations (12)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS63164704A (ja) * | 1986-12-26 | 1988-07-08 | Matsushita Electric Ind Co Ltd | モノリシツクマイクロ波集積回路増幅器 |
| US4864250A (en) * | 1987-01-29 | 1989-09-05 | Harris Corporation | Distributed amplifier having improved D.C. biasing and voltage standing wave ratio performance |
| JPS63224508A (ja) * | 1987-03-13 | 1988-09-19 | Matsushita Electric Ind Co Ltd | モノリシツクマイクロ波集積回路多段増幅器 |
| JPH0195602A (ja) * | 1987-10-08 | 1989-04-13 | Nec Corp | チップ化モジュール |
| JPH06151714A (ja) * | 1992-11-09 | 1994-05-31 | Fujitsu Ltd | 能動デバイスのバイアス電圧供給回路 |
| JPH09307060A (ja) * | 1996-05-16 | 1997-11-28 | Nec Eng Ltd | マイクロ波半導体集積回路 |
| JPH1093019A (ja) * | 1996-09-11 | 1998-04-10 | Denso Corp | モノリシックマイクロ波集積回路 |
| US20020020894A1 (en) * | 2000-08-15 | 2002-02-21 | Masaaki Nishijima | RF passive circuit and RF amplifier with via-holes |
| US7176769B1 (en) * | 2004-11-29 | 2007-02-13 | Hrl Laboratories, Llc | Harmonic termination circuit for medium bandwidth microwave power amplifiers |
| JP2012209907A (ja) * | 2011-03-30 | 2012-10-25 | Furukawa Electric Co Ltd:The | 帰還型発振装置 |
| US8653907B2 (en) * | 2011-07-18 | 2014-02-18 | Raytheon Company | Resonated bypass capacitor for enhanced performance of a microwave circuit |
| WO2016069134A1 (fr) * | 2014-10-31 | 2016-05-06 | Raytheon Company | Réseau d'adaptation de sortie ayant un seul composant condensateur combiné en série et shunt |
Also Published As
| Publication number | Publication date |
|---|---|
| EP3482494A1 (fr) | 2019-05-15 |
| JP2019525556A (ja) | 2019-09-05 |
| KR20190025690A (ko) | 2019-03-11 |
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