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WO2016122673A1 - Détection d'un type de connexion - Google Patents

Détection d'un type de connexion Download PDF

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Publication number
WO2016122673A1
WO2016122673A1 PCT/US2015/014002 US2015014002W WO2016122673A1 WO 2016122673 A1 WO2016122673 A1 WO 2016122673A1 US 2015014002 W US2015014002 W US 2015014002W WO 2016122673 A1 WO2016122673 A1 WO 2016122673A1
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WO
WIPO (PCT)
Prior art keywords
connection
diagnostic
pin
coupled
filter circuit
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
PCT/US2015/014002
Other languages
English (en)
Inventor
Benjamin Thomas GAIDE
Dave PRESTON
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Hewlett Packard Enterprise Development LP
Original Assignee
Hewlett Packard Enterprise Development LP
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Hewlett Packard Enterprise Development LP filed Critical Hewlett Packard Enterprise Development LP
Priority to PCT/US2015/014002 priority Critical patent/WO2016122673A1/fr
Publication of WO2016122673A1 publication Critical patent/WO2016122673A1/fr
Anticipated expiration legal-status Critical
Ceased legal-status Critical Current

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Classifications

    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/31712—Input or output aspects
    • G01R31/31713—Input or output interfaces for test, e.g. test pins, buffers
    • G—PHYSICS
    • G01—MEASURING; TESTING
    • G01R—MEASURING ELECTRIC VARIABLES; MEASURING MAGNETIC VARIABLES
    • G01R31/00—Arrangements for testing electric properties; Arrangements for locating electric faults; Arrangements for electrical testing characterised by what is being tested not provided for elsewhere
    • G01R31/28—Testing of electronic circuits, e.g. by signal tracer
    • G01R31/317—Testing of digital circuits
    • G01R31/3181—Functional testing
    • G01R31/319—Tester hardware, i.e. output processing circuits
    • G01R31/31917—Stimuli generation or application of test patterns to the device under test [DUT]
    • G01R31/31924—Voltage or current aspects, e.g. driver, receiver

Definitions

  • a computing device such as server computer, may include a plurality of electronic components.
  • an electronic component may be a storage controller.
  • Some electronic components may include self- debugging capabilities.
  • Some electronic components may be debugged via another device.
  • FIG. 1 is a block diagram of an electronic device with a filter circuit to set a data routing path to an electronic component, according to an example
  • FIG. 2 is a block diagram of an electronic device with a filter circuit to set a data routing path to an electronic component, according to another example
  • FIG. 3 is a block diagram of an electronic device with a filter circuit to set a data routing path to an electronic component, according to another example
  • FIG. 4 is a block diagram of an electronic device with a filter circuit to set a data routing path to an electronic component, according to an example
  • FIG. 5A is a circuit diagram to illustrate voltage level detection at a detection pin of a diagnostic interface, according to an example
  • FIG. 5B is a circuit diagram to illustrate voltage level detection at a detection pin of a diagnostic interface, according to another example
  • FIG. 5C is a circuit diagram to illustrate voltage level detection at a detection pin of a diagnostic interface, according to another example
  • FIG. 5D is a circuit diagram to illustrate voltage level detection at a detection pin of a diagnostic interface, according to another example.
  • FIG. 6 is a circuit diagram of a filter circuit to set a data routing path to an electronic component, according to an example.
  • FIG. 7 is flowchart illustrating a method of operation at an electronic device with a filter circuit to set a data routing path to an electronic
  • Some electronic components of an electronic device may be debugged via a diagnostic device external to the electronic device, such as a notebook computer.
  • the electronic device may include a diagnostic interface to establish a connection with a diagnostic device so that an electronic component may communicate with the diagnostic device during debugging.
  • the diagnostic interface may be a serial interface.
  • Some diagnostic devices may use a more recently developed communication interface, such as an Ethernet interface, for debugging.
  • an electronic device may include a plurality of diagnostic interfaces. However, the electronic device may have room on the chassis or enclosure to support a single diagnostic interface due to space restrictions. Thus, design complexity of the electronic device may be increased.
  • an electronic device may include a diagnostic interface to establish a connection with a diagnostic device via a host cable.
  • the diagnostic interface may include a detection pin and a data pin.
  • the electronic device may also include a power source coupled to the detection pin.
  • the electronic device may further include a filter circuit coupled to the data pin.
  • the electronic device may further include an electronic component coupled to the filter circuit.
  • the electronic device may further include a detection circuit, coupled to the detection pin, the filter circuit, and the power source. The detection circuit may detect a voltage level of the detection pin to determine a connection type of the connection.
  • the voltage level may be generated via the power source and the host cable.
  • the detection circuit may also set a passing frequency of the filter circuit based on the voltage level.
  • the filter circuit may set a data routing path from the data pin to the electronic component based on the passing frequency. In this manner, examples described herein may reduce design complexity of an electronic device.
  • FIG. 1 is a block diagram of an electronic device 100 with a filter circuit to set a data routing path to an electronic component, according to an example.
  • Electronic device 100 may be a web-based server, a local area network server, a cloud- based server, a notebook computer, a desktop computer, an all-in-one system, a tablet computing device, a mobile phone, an electronic book reader, or any other electronic device suitable for interfacing with a diagnostic device to debug an electronic component internal to electronic device 100.
  • Electronic device 100 may include a diagnostic interface 1 02, a detection circuit 104, a filter circuit 1 06, a first electronic component 108, and a power source 1 10.
  • Diagnostic interface 102 may be a connector that is compliant with an Institute of Electrical and Electronics Engineers (IEEE) 802.3 family of protocols, such as the IEEE 802.3u protocol.
  • diagnostic interface 102 may be an Ethernet connector, such as a register jack (RJ)-45 connector.
  • Diagnostic interface 102 may include a plurality of pins, such as a first pin and a second pin. The first pin may be a detection pin 1 12 and the second pin may be a data pin 1 14.
  • Detection circuit 104 may be coupled to detection pin 1 12 via an electrical connection 1 16. Detection circuit 104 may also be coupled to filter circuit 106 via an electrical connection 1 18. As described in more detail below, detection circuit 104 may detect a voltage level of detection pin 1 1 2 to determine a connection type of a connection with a diagnostic device 120. Detection circuit 104 may also set a passing frequency of filter circuit 106 based on the connection type. Detection circuit 104 may be implemented using at least one logic gate. In some examples, diagnostic device 1 20 may be any computing device that tests functionalities of an electronic component, such as first electronic component 108. Diagnostic device 120 may be a notebook computer, a desktop computer, an all-in-one system, a tablet computing device, a mobile phone, etc.
  • Filter circuit 106 may be coupled to data pin 1 14 via an electrical connection 1 22. Filter circuit 106 may be coupled to first electronic
  • Filter circuit 106 may set one of electrical connection 124 and 126 to be a data routing path for data from diagnostic interface 1 02 to first electronic component 108 based on the passing frequency.
  • Filter circuit 1 06 may be implemented using at least one capacitor and at least one inductor. An example of filter circuit 106 is described in more detail in FIG. 6.
  • First electronic component 108 may a device or a circuit that can be debugged using a diagnostic device external to electronic device 100.
  • first electronic component 1 08 may be a storage array controller.
  • first electronic component 108 may be an enclosure management controller.
  • Power source 1 10 may be coupled to detection pin 1 12 via an electrical connection 128. Power source 1 10 may help generate a voltage level detected at detection pin 1 12.
  • power source 1 10 may be a weak current source.
  • power source 1 1 0 may be implemented using a 12 volts voltage source connected to a resistor with a 5000 ohm resistance value.
  • Electrical connections 1 1 6, 1 18, and 122-128 may be implemented using metal traces or metal wires.
  • electronic device 100 may establish a connection with diagnostic device 120 via a host cable 130 having a first end 132 and a second end 134.
  • diagnostic interface 102 may receive first end 132 and diagnostic device 120 may receive second end 1 34 via a communication interface (not shown in FIG. 1 ).
  • detection pin 1 12 and data pin 1 14 may be coupled to first end 132.
  • first end 1 32 and second end 134 may be Ethernet connectors (e.g., RJ-45 connectors).
  • first end 132 may be an Ethernet connector and second end 134 may be a serial connector, such as a D-sub 9-pin (DE-9) connector that is compliant with the RS-232 protocol.
  • DE-9 D-sub 9-pin
  • detection circuit 1 04 may detect a voltage level at detection pin 1 1 2 to determine a connection type of the connection (i.e., an Ethernet connection or a serial connection).
  • the voltage level may be set based on power source 1 10 and diagnostic device 120 before any data is transmitted from diagnostic device 120. Voltage level generation at detection pin 1 12 is described in more detail in FIGs. 5A-5D.
  • detection circuit 104 may determine that the connection type is an Ethernet connection.
  • the threshold may be 70% of a voltage level of power source 1 1 0.
  • detection circuit 104 may determine that the connection type is a serial connection.
  • detection circuit 104 may determine that the connection type is a serial connection.
  • the connection type is a serial connection.
  • detection circuit 104 may detect a logic state at detection pin 1 12. When the logic state is a first logic state (e.g., a high logic state), detection circuit 104 may determine that the connection type is an Ethernet connection. When the logic state is a second logic state (e.g., a low logic state) that is opposite to the first logic state, detection circuit 104 may determine that the connection type is a serial connection.
  • the logic state may correspond to the voltage level of detection pin 1 12. For example, when the voltage level is equal to or greater than a threshold (e.g., 70% of a voltage level of power source 1 1 0), the voltage level may indicate the first logic state. When the voltage level is below the threshold (e.g., an electrically grounded connection), the voltage level may indicate the second logic state.
  • a threshold e.g. 70% of a voltage level of power source 1 1 0
  • detection circuit 104 may set a passing frequency of filter circuit 106 so that data transmitted using an Ethernet protocol may pass through filter circuit 106.
  • the passing frequency may be a frequency range of above 10 Megahertz (MHz).
  • filter circuit 106 may block any data transmitted with a frequency below the passing frequency from passing through filter circuit 106.
  • filter circuit 1 06 may set a first data routing path from data pin 1 14 to first electronic component 108 based on the passing frequency.
  • the first data routing path may include electrical connection 1 26.
  • filter circuit 1 06 may route data from diagnostic device 120 to first electronic component 108 or vice versa via data pin 1 14 and electrical connection 126.
  • detection circuit 104 may set a passing frequency of filter circuit 106 so that data transmitted using a serial protocol (e.g., the RS-232 protocol) may pass through filter circuit 1 06.
  • the passing frequency may be a frequency range of 200 Kilohertz (KHz).
  • filter circuit 106 may block any data transmitted with a frequency outside the passing frequency from passing through filter circuit 106.
  • filter circuit 106 may set a second data routing path from data pin 1 14 to first electronic component 108 based on the passing frequency.
  • the second data routing path may include electrical connection 124.
  • filter circuit 106 may route data from diagnostic device 1 20 to first electronic component 108 or vice versa via data pin 1 14 and electrical connection 124.
  • first electronic component 108 may be achieved.
  • LAN wake-on-local area network
  • management during sleep mode may be achieved.
  • detection pin 1 12 is not be used to route data.
  • first electronic component 1 08 may communicate with diagnostic device 120 via a serial connection or an Ethernet connection with a data transfer rate of up to 100 megabits per second with power-over-Ethernet (PoE) capability.
  • PoE power-over-Ethernet
  • detection pin 1 12 may be used to route data when an Ethernet connection with a data transfer rate of 1000 megabits (gigabit) or more is used.
  • FIG. 2 is a block diagram of an electronic device 200 with a filter circuit to set a data routing path to an electronic component, according to another example. Electronic device 200 may be similar to electronic device 100.
  • Electronic device 200 may include diagnostic interface 1 02, detection circuit 104, filter circuit 106, first electronic component 108, and power source 1 10.
  • Detection pin 1 1 2 may be coupled to filter circuit 106 via an electrical connection 202.
  • Electrical connection 202 may be coupled to electrical connection 1 18 via filter circuit 106.
  • detection circuit 1 04 may be coupled to detection pin 1 12.
  • Electronic device 200 may use detection circuit 104 to determine a connection type in the manner described in FIG. 1 . However, unlike electronic device 200, electronic device 200 may use detection pin 1 12 and data pin 1 14 to route data between first electronic component 108 and diagnostic device 120. Thus, electronic device 200 may be compatible with an Ethernet connection with a data transfer rate of 1000 megabits or more.
  • FIG. 3 is a block diagram of an electronic device 300 with a filter circuit to set a data routing path to an electronic component, according to another example.
  • Electronic device 300 may be used to implement electronic device 100 of FIG. 1 .
  • Electronic device 300 may include an Ethernet connector 302, a detection circuit 304, a filter circuit 306, a protocol conversion circuit 308, a first magnetic coupling circuit 310, a first Ethernet interface 312, first electronic component 108, a second electronic component 314, a third electronic component 316, and power source 1 10.
  • First Ethernet interface 312 may be implemented using an Ethernet transceiver.
  • Electronic components 314 and 31 6 may be similar to first electronic component 108.
  • Protocol conversion circuit 308 may be similar to first electronic component 108.
  • Ethernet connector 302 may include a plurality of pins, such as pins 1 -8. Pin 8 may be grounded to an Earth ground or a metal chassis (not shown in FIG. 3) of electronic device 300. Pin 4 may correspond to detection pin 1 12 of FIGs. 1 -2. Pin 4 may be coupled to detection circuit 304 via an electrical connection 320. Power source 1 1 0 may also be coupled to pin 4 via an electrical connection 322.
  • pins 1 -3 and 5-7 may correspond to data pin 1 14.
  • pins 1 and 2 may correspond to data pin 1 14.
  • Pins 3 and 6 may correspond to a second data pin.
  • Pins 5 and 7 may correspond to a third data pin.
  • Pins 1 -3 and 6 may be coupled to filter circuit 306.
  • Pins 4-5 and 7-8 may be coupled to detection circuit 304.
  • electronic device 300 is coupled to a diagnostic device, such as diagnostic device 1 20, via an Ethernet connection, at least one pair of pins from pins 1 -3 and 6 may be used to route data between the diagnostic device and any combination of electronic components 108, 314, and 316.
  • pins 1 -3 and 5-7 may be used to route data between the diagnostic device and electronic components 108, 314, and 31 6.
  • pins 1 and 2 may route data between the diagnostic device and first electronic component 108.
  • pins 3 and 6 may route data between the diagnostic device and second electronic component 314.
  • Pins 5 and 7 may route data between the diagnostic device and third electronic component 316.
  • Pin 4 is not used to route data.
  • electronic device 300 may establish a connection via diagnostic device 120 when host cable 130.
  • detection circuit 304 may detect a voltage level of pin 4 to determine a connection type of the connection to diagnostic device 120.
  • the voltage level of pin 4 may be generated when Ethernet connector 302 receives host cable 1 30 that is coupled to diagnostic device 120.
  • the voltage level of pin 4 may be generated using power source 1 10 and diagnostic device 120.
  • detection circuit 304 may couple an electrical connection 324 to an electrical contact 326 that is floating.
  • Filter circuit 306 may be coupled to detection circuit 304 via electrical connection 324.
  • detection circuit 304 may set a passing frequency of filter circuit 306 for data transmitted using an Ethernet protocol.
  • Filter circuit 306 may set a first data routing path based on the passing frequency that includes protocol conversion circuit 308.
  • electronic device 300 may receive a diagnostic command 328 from diagnostic device 120 at pins 1 and 2 of Ethernet connector 302 as a differential signal. Based on the data routing path set via the passing frequency, filter circuit 306 may route diagnostic command 328 from pins 1 and 2 to first magnetic coupling circuit 31 0 via electrical connections 330 and 332, respectively. Electrical connection 332 may be coupled to electrical connection 324.
  • First magnetic coupling circuit 310 may route diagnostic command 328 to first Ethernet interface 312 via magnetic coupling.
  • Protocol conversion circuit 308 may receive diagnostic command 328 via first Ethernet interface 312.
  • Protocol conversion circuit 308 may transmit diagnostic command 328 to first electronic component 108 using serial transceiver 318 via electrical connections 334 and 336.
  • first electronic component 108 may generate diagnostic data 338 that corresponds to an operational status of first electronic component 108, configuration information of first electronic component 108, or a combination thereof.
  • First electronic component 108 may transmit diagnostic data 338 to diagnostic device 120 via the first data path.
  • protocol conversion circuit may receive diagnostic data 338 from first electronic component 108 via serial transceiver 318 and may transmit diagnostic data 338 to filter circuit 306 via first Ethernet interface 312 and first magnetic coupling circuit 310.
  • Filter circuit 306 may route diagnostic data 338 to diagnostic device 120 via pins 1 and 2.
  • detection circuit 304 may couple electrical connection 324 to an electrical contact 340 that is grounded. Thus, by grounding electrical connection 324, detection circuit 304 may set a passing frequency of filter circuit 306 for data transmitted using a serial protocol. Filter circuit 306 may set a second data routing path based on the passing frequency that bypasses protocol conversion circuit 308.
  • electronic device 300 may receive a diagnostic command 328 from diagnostic device 120 at pins 1 and 2 of Ethernet connector 302 as serial data.
  • Filter circuit 306 may route diagnostic command 328 to electronic component 108 via electrical connections 342 and 344.
  • protocol conversion circuit 308 is bypassed during routing of diagnostic command 328.
  • filter circuit 306 may also use the second data routing path.
  • diagnostic command 328 is destined for electronic component 36 and the connection type is a serial connection
  • diagnostic command 328 is routed to third electronic component 316 via detection circuit 304.
  • Diagnostic data 338 may also be routed from third electronic component 316 to diagnostic device 1 20 via detection circuit 304.
  • pins 5 and 7 may be coupled to detection circuit 304 via electrical connections 346 and 348, respectively.
  • detection circuit 304 may couple electrical connections 346 and 348 to electrical contacts 350 and 352, respectively.
  • Electrical contacts 350 and 352 may be coupled to third electronic component 31 6 via electrical connections 354 and 356, respectively.
  • detection circuit 304 may route diagnostic command 328 to third electronic component 31 6.
  • Detection circuit 304 may also route diagnostic data 338 from third electronic component 316 to diagnostic device 120 using the same data routing path.
  • electronic device 300 may communicate with diagnostic device 120 via a serial connection or an
  • Ethernet connection with a data transfer rate of up to 100 megabits per second with PoE capability may be used to route data when an Ethernet connection with a data transfer rate of 1000 megabits or more is used.
  • FIG. 4 is a block diagram of an electronic device 400 with a filter circuit to set a data routing path to an electronic component, according to an example.
  • Electronic device 400 may be used to implement electronic device 200 of FIG. 2.
  • Electronic device 400 may include Ethernet connector 302, detection circuit 304, filter circuit 306, protocol conversion circuit 308, first magnetic coupling circuit 310, a first Ethernet interface 312, first electronic component 108, second electronic component 314, third electronic
  • electronic device 400 may also include a second Ethernet interface 402 and a second magnetic coupling circuit 404.
  • pins 1 -8 may be coupled to filter circuit 306 to route data.
  • Detection circuit 304 may detect a voltage level of pin 4 via filter circuit 306.
  • first Ethernet interface 312 and/or second Ethernet interface 402 may be used to route data to any of electronic components 108, 314, and 316.
  • filter circuit 306 may route the data to protocol conversion circuit 308 via first Ethernet interface 312 and first magnetic coupling circuit 310.
  • filter circuit 306 may route the data to protocol conversion circuit 308 via second Ethernet interface 402 and second magnetic coupling circuit 404.
  • connection type is a serial connection
  • filter circuit 306 may route data between any of electronic component 108, 314, and 31 6 to a diagnostic device in a manner described in FIG. 3.
  • electronic device 400 may communicate with an Ethernet connection with a data transfer rate of 1000 megabits or more.
  • FIG. 5A is a circuit diagram to illustrate voltage level detection at a detection pin of a diagnostic interface, such as pin 4 of Ethernet connector 302 of FIGs. 3-4, according to an example.
  • diagnostic device 120 may a gigabit Ethernet host. That is, diagnostic device 1 20 may communicate via host cable 130 at a data transfer rate of up to 1 000 megabits (1 gigabit) per second.
  • Power source 1 10 may be implemented using a voltage source 502 and a resistor 504.
  • Voltage source 502 may be a direct current voltage source.
  • Diagnostic device 1 20 may include a magnetic coupling circuit 506 to transfer data to Ethernet connector 302 via magnetic coupling.
  • detection circuit 304 may detect the voltage level at a measuring point 508. Resistor 504 may act as a pull-up resistor so that the voltage level of pin 4 may be pulled up to or close to a voltage level of voltage source 502. Thus, detection circuit 304 may determine that the connection type is an Ethernet connection when the detected voltage level of pin 4 is at or close to the voltage level of voltage source 502. Also, by setting the voltage level of pin 4 to or close to the voltage level of voltage source 502, resistor 504 may ensure that a logic state of pin 4 is a high logic state to indicate an Ethernet connection.
  • FIG. 5B is a circuit diagram to illustrate voltage level detection at a detection pin of a diagnostic interface, such as pin 4 of Ethernet connector 302 of FIGs. 3-4, according to another example.
  • diagnostic device 120 may a 1 00 megabit Ethernet host. That is, diagnostic device 120 may communicate via host cable 130 at a data transfer rate of up to 100 megabits per second.
  • Electrical connections 510 and 512 may be coupled to pins 4 and 5 of Ethernet connector 302 via host cable 1 30, respectively. Electrical connections 510 and 512 may be floating as electrical connections 510 and 512 are not used to transmit data.
  • resistor 504 may act as a pull-up resistor so that the voltage level of pin 4 may be pulled up to or close to a voltage level of voltage source 502.
  • detection circuit 304 may determine that the connection type is an Ethernet connection.
  • FIG. 5C is a circuit diagram to illustrate voltage level detection at a detection pin of a diagnostic interface, such as pin 4 of Ethernet connector 302 of FIGs. 3-4, according to another example.
  • diagnostic device 120 may a 1 00 megabit Ethernet host with PoE capability.
  • diagnostic device 120 may supply power to a device via an Ethernet connection, such as electronic device 300.
  • electrical connections 510 and 512 may be coupled to a voltage source 514.
  • voltage source 514 may have a voltage value of 25 volts.
  • voltage source 514 may have a voltage value of 100 volts.
  • Voltage source 514 may be used to supply power to a device coupled to diagnostic device 120 via an Ethernet connection.
  • Voltage sources 502 and 514 may provide a voltage to pin 4 to generate a voltage level for detection circuit 304 to measure. Thus, pin 4 may be pulled-up by voltage sources 502 and 514. Detection circuit 304 may determine that the connection type is an Ethernet connection based on the voltage level of pin 4.
  • FIG. 5D is a circuit diagram to illustrate voltage level detection at a detection pin of a diagnostic interface, such as pin 4 of Ethernet connector 302 of FIGs. 3-4, according to another example.
  • diagnostic device 120 may a serial host. That is, diagnostic device 120 may
  • FIG. 6 is a circuit diagram of a filter circuit 600 to set a data routing path to an electronic component, according to an example. Filter circuit 600 may be used to implement filter circuit 106 of FIGs. 1 -2 and/or filter circuit 306 of FIGs. 3-4. For purpose of clarity and brevity, operations of filter circuit 600 are described with reference to pins 1 and 2 of Ethernet connector 302.
  • Filter circuit 600 may include a plurality of capacitors and a plurality of inductors.
  • filter circuit 600 may include capacitors 602-608 and inductors 61 0-612.
  • Pin 1 may be coupled to capacitor 602 and inductor 610.
  • Capacitor 602 may also be coupled to detection circuit 304 via an electrical connection 614.
  • Pin 2 may be coupled to capacitor 604 and inductor 612.
  • Inductor 610 may be coupled to capacitor 606 that is coupled to ground.
  • Inductor 612 may be coupled to capacitor 608 that is coupled to ground.
  • Capacitors 602 and 604 may be coupled to first magnetic coupling circuit 310.
  • connection type is an Ethernet connection
  • detection circuit 304 may set connection 614 to a floating connection.
  • Inductors 610 and 612 may block any Ethernet data, such as diagnostic command 328, transmitted/received via pins 1 and 2 from passing through.
  • capacitors 606 and 608 may dissipate any noise that passes capacitors 606 and 608.
  • the Ethernet data may travel through capacitors 602 and 604 to protocol conversion circuit 308 via first magnetic coupling circuit 31 0.
  • connection type is a serial connection
  • detection circuit 304 may ground connection 614.
  • connections to protocol conversion circuit 308 are grounded.
  • Serial data transmitted/received via pins 1 and 2 may travel through inductors 610 and 612 to reach an electronic component, such as electronic component 108.
  • filter circuit 600 is described with reference to pins 1 and 2 of Ethernet connector 302, it should be understood that each pin of Ethernet connector 302 that is used to routed data may be coupled to filter circuit 600 in a similar manner.
  • FIG. 7 is flowchart illustrating a method 700 of operation at an electronic device with a filter circuit to set a data routing path to an electronic component, according to an example.
  • Method 700 may be implemented using electronic device 100 of FIG. 1 , electronic device 200 of FIG. 2, electronic device 300 of FIG. 3, and/or electronic device 400 of FIG. 4.
  • Method 700 includes receiving, at an Ethernet connector of an electronic device, a host cable from a diagnostic device to establish a connection with the diagnostic device, where the Ethernet connector includes a detection pin, at 702.
  • diagnostic interface 102 may receive first end 132 and diagnostic device 120 may receive second end 134 via a communication interface (not shown in FIG. 1 ).
  • Method 700 also includes in response to receiving the host cable, setting a voltage level of the detection pin based on the diagnostic device and a power source of the electronic device, where the power source is coupled to the detection pin, 704.
  • the voltage level may be set based on power source 1 10 and diagnostic device 120 before any data is transmitted from diagnostic device 1 20.
  • Method 700 further includes detecting, at a detection circuit coupled to the detection pin, the voltage level to determine a connection type of the connection prior to receiving data from the diagnostic device, at 706.
  • detection circuit 104 may detect a voltage level at detection pin 1 12 to determine a connection type of the connection (i.e., an Ethernet connection or a serial connection).
  • Method 700 further includes setting, via the detection circuit, a passing frequency of a filter circuit coupled to the detection circuit based on voltage level, at 708. For example, referring to FIG. 1 , in response to determining that the connection type is an Ethernet connection, detection circuit 104 may set a passing frequency of filter circuit 106 so that data transmitted using an Ethernet protocol may pass through filter circuit 106.
  • Method 700 further includes routing a diagnostic command received from the diagnostic device to an electronic component coupled to the filter circuit based on the passing frequency, at 710.
  • electronic device 300 may receive a diagnostic command 328 from diagnostic device 120 at pins 1 and 2 of Ethernet connector 302 as a differential signal.
  • filter circuit 306 may route diagnostic command 328 from pins 1 and 2 to first magnetic coupling circuit 310 via electrical connections 330 and 332, respectively.

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Abstract

Selon un exemple, un dispositif électronique comprend une interface de diagnostic servant à établir une connexion avec un dispositif de diagnostic par l'intermédiaire d'un câble hôte. L'interface de diagnostic comprend une broche de détection et une broche de données. Le dispositif électronique comporte également une source d'alimentation électrique, un circuit filtrant, un composant électronique et un circuit de détection. Le circuit de détection est couplé à la broche de détection, au circuit filtrant et à la source d'alimentation électrique. Le circuit de détection est destiné à détecter le niveau de tension de la broche de détection afin de déterminer le type de la connexion et de régler la fréquence de passage du circuit filtrant sur la base du niveau de tension. Le niveau de tension est généré en fonction de la source d'alimentation électrique et du dispositif de diagnostic. Le circuit filtrant est prévu pour établir un trajet d'acheminement de données depuis la broche de données jusqu'au composant électronique selon la fréquence de passage.
PCT/US2015/014002 2015-01-30 2015-01-30 Détection d'un type de connexion Ceased WO2016122673A1 (fr)

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