WO2016181646A1 - 金属化フィルムコンデンサ - Google Patents
金属化フィルムコンデンサ Download PDFInfo
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- WO2016181646A1 WO2016181646A1 PCT/JP2016/002283 JP2016002283W WO2016181646A1 WO 2016181646 A1 WO2016181646 A1 WO 2016181646A1 JP 2016002283 W JP2016002283 W JP 2016002283W WO 2016181646 A1 WO2016181646 A1 WO 2016181646A1
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- electrode
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- film
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01G—CAPACITORS; CAPACITORS, RECTIFIERS, DETECTORS, SWITCHING DEVICES, LIGHT-SENSITIVE OR TEMPERATURE-SENSITIVE DEVICES OF THE ELECTROLYTIC TYPE
- H01G4/00—Fixed capacitors; Processes of their manufacture
- H01G4/002—Details
- H01G4/005—Electrodes
- H01G4/015—Special provisions for self-healing
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01G—CAPACITORS; CAPACITORS, RECTIFIERS, DETECTORS, SWITCHING DEVICES, LIGHT-SENSITIVE OR TEMPERATURE-SENSITIVE DEVICES OF THE ELECTROLYTIC TYPE
- H01G4/00—Fixed capacitors; Processes of their manufacture
- H01G4/002—Details
- H01G4/005—Electrodes
- H01G4/008—Selection of materials
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01G—CAPACITORS; CAPACITORS, RECTIFIERS, DETECTORS, SWITCHING DEVICES, LIGHT-SENSITIVE OR TEMPERATURE-SENSITIVE DEVICES OF THE ELECTROLYTIC TYPE
- H01G4/00—Fixed capacitors; Processes of their manufacture
- H01G4/002—Details
- H01G4/018—Dielectrics
- H01G4/06—Solid dielectrics
- H01G4/14—Organic dielectrics
- H01G4/18—Organic dielectrics of synthetic material, e.g. derivatives of cellulose
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01G—CAPACITORS; CAPACITORS, RECTIFIERS, DETECTORS, SWITCHING DEVICES, LIGHT-SENSITIVE OR TEMPERATURE-SENSITIVE DEVICES OF THE ELECTROLYTIC TYPE
- H01G4/00—Fixed capacitors; Processes of their manufacture
- H01G4/002—Details
- H01G4/228—Terminals
- H01G4/252—Terminals the terminals being coated on the capacitive element
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- Y—GENERAL TAGGING OF NEW TECHNOLOGICAL DEVELOPMENTS; GENERAL TAGGING OF CROSS-SECTIONAL TECHNOLOGIES SPANNING OVER SEVERAL SECTIONS OF THE IPC; TECHNICAL SUBJECTS COVERED BY FORMER USPC CROSS-REFERENCE ART COLLECTIONS [XRACs] AND DIGESTS
- Y02—TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMATE CHANGE
- Y02T—CLIMATE CHANGE MITIGATION TECHNOLOGIES RELATED TO TRANSPORTATION
- Y02T10/00—Road transport of goods or passengers
- Y02T10/60—Other road transportation technologies with climate change mitigation effect
- Y02T10/70—Energy storage systems for electromobility, e.g. batteries
Definitions
- the present invention relates to a metallized film capacitor used for various electronic equipment, electrical equipment, industrial equipment, automobile electrical equipment and the like.
- Metallized film capacitors are generally classified into those using metal foil as an electrode and those using vapor-deposited metal provided on a dielectric film as an electrode.
- the metalized film capacitor which uses the metal vapor deposition electrode which consists of vapor deposition metal as an electrode has a small volume which an electrode occupies compared with what uses metal foil, and can achieve weight reduction.
- the metal deposition electrode is evaporated and scattered by the short circuit energy to insulate and insulate, and the function of the capacitor is restored. High reliability against breakdown due to recovery performance. For these reasons, metal vapor deposition electrodes have been widely used.
- FIG. 10 is a top view of the metallized film 100 used in the metallized film capacitor disclosed in Patent Document 1.
- FIG. 10 is a top view of the metallized film 100 used in the metallized film capacitor disclosed in Patent Document 1.
- the metallized film 100 includes a dielectric film 101 and a metal vapor-deposited electrode 102 formed by vapor-depositing metal on the surface of the dielectric film 101.
- the metal vapor deposition electrode 102 is divided into a non-divided electrode portion 104 and a divided electrode portion 106 by a slit 103 extending in the longitudinal direction of the dielectric film 101 (left and right direction in FIG. 10).
- the inside of the divided electrode unit 106 is divided into a plurality of small divided electrode units 105.
- the non-divided electrode portion 104 and the divided electrode portion 106 are electrically connected by a fuse 107 provided in the slit 103.
- the adjacent subdivided electrode portions 105 are electrically connected to each other by a fuse 108.
- the fuse 107 or the fuse 108 is cut by the current flowing into the small divided electrode part 105.
- the subdivided electrode portion 105 including the insulation defect portion is electrically disconnected, and defects such as a short circuit of the metallized film capacitor can be prevented in advance.
- the conventional metallized film capacitor realizes the self-safety function by the fuse 107 and the fuse 108 provided in the metallized film 100.
- Patent Document 2 discloses a metallized film capacitor using an aluminum core zinc layer.
- the metallized film capacitor includes a dielectric film, a first metal film electrode provided on the surface of the dielectric film, and a second metal film electrode facing the first metal film electrode through the dielectric film.
- the first metal film electrode is connected to the first large electrode portion and the second large electrode portion provided in the slit, the first large electrode portion and the second large electrode portion separated from each other by the slit. Fuse.
- the first metal film electrode has an aluminum part containing substantially only aluminum and an aluminum core zinc part mainly containing zinc and further containing aluminum.
- the aluminum core zinc part is disposed at least around the fuse.
- FIG. 1A is a cross-sectional view of a metallized film capacitor according to Embodiment 1.
- FIG. 1B is a plan view of a metallized film of the metallized film capacitor in Embodiment 1.
- FIG. 2 is a plan view of another metallized film in the first embodiment.
- FIG. 3 is a plan view of a metallized film of the metallized film capacitor according to the second embodiment.
- FIG. 4 is a plan view of a metallized film of the metallized film capacitor according to the third embodiment.
- FIG. 5 is a plan view of another metallized film of the metallized film capacitor according to the third embodiment.
- FIG. 6 is a plan view of still another metallized film of the metallized film capacitor according to the third embodiment.
- FIG. 7 is a plan view of a metallized film of the metallized film capacitor according to the fourth embodiment.
- FIG. 8 is a plan view of another metallized film of the metallized film capacitor according to the fourth embodiment.
- FIG. 9 is a plan view of the metallized film of the metallized film capacitor according to the fifth embodiment.
- FIG. 10 is a plan view of a metallized film of a conventional metallized film capacitor.
- FIG. 1A is a cross-sectional view of the metallized film capacitor 1 in Embodiment 1, and conceptually shows the structure of the metallized film capacitor 1.
- the metallized film capacitor 1 includes a capacitor element 91 and external electrodes 4 a and 4 b provided on both end faces 91 a and 91 b of the capacitor element 91.
- Capacitor element 91 includes metallized film 2 and metallized film 3 stacked on metallized film 2.
- the metallized films 2 and 3 are wound.
- the external electrodes 4a and 4b are metallicon electrodes.
- FIG. 1B is a plan view of the metallized film 2.
- the metallized film 2 has a dielectric film 5 and a metal film electrode 6 provided on the surface 5 a of the dielectric film 5.
- a polypropylene film having a thickness of 2.8 ⁇ m is used.
- a polyethylene terephthalate film, a polyethylene naphthalate film, a polyphenyl sulfide film, a polystyrene film, or the like having an appropriate thickness may be used. Further, the thickness may be changed as appropriate.
- the metal film electrode 6 has an aluminum portion 6a substantially made of aluminum and an aluminum core zinc portion 6b mainly containing zinc and further containing aluminum.
- the aluminum portion 6 a is formed by evaporating a vapor deposition material formed of aluminum to scatter aluminum metal vapor and depositing the metal vapor on the surface 5 a of the dielectric film 5.
- the aluminum part 6a in Embodiment 1 is formed of the vapor deposition material formed with aluminum, it is substantially made of only aluminum, that is, the component constituting the aluminum part 6a is of course the largest proportion of aluminum. Occupy.
- the aluminum portion 6a is formed using a vapor deposition material formed of aluminum. However, for example, a small amount of metal other than aluminum such as magnesium may be added to the vapor deposition material. Further, the aluminum portion 6a may contain a small amount of impurities other than aluminum or a metal added intentionally.
- the aluminum portion 6a may be formed by simultaneously depositing a plurality of vapor deposition materials. That is, a small amount of metal other than aluminum and aluminum may be vaporized at the same time to form the aluminum portion 6a with a plurality of metal vapors including aluminum metal vapor. However, even in this case, it is necessary to appropriately adjust the amount of each vapor deposition material so that aluminum accounts for the largest proportion of the components constituting the aluminum portion 6a.
- End portions 5c and 5d opposite to each other in the width direction D1 of the dielectric film 5 constitute end portions 2c and 2d opposite to each other in the width direction D1 of the metallized film 2, respectively.
- the metallized films 2 and 3 overlapped with each other are wound in a longitudinal direction D2 perpendicular to the width direction D1 around a winding axis extending in the width direction D1.
- An insulating margin 7 where the metal film electrode 6 does not exist is provided at the end 2 d of the metallized film 2.
- the surface 5 a of the dielectric film 5 is exposed from the metal film electrode 6.
- the insulation margin 7 ensures insulation between the metal film electrode 6 and the external electrode 4b.
- the metallized film 3 has the same configuration as the metallized film 2. That is, the metallized film 3 includes the dielectric film 8 and the metal film electrode 9 having the same configuration as the dielectric film 5 and the metal film electrode 6 of the metallized film 2, respectively. Therefore, the metal film electrode 9 has an aluminum part and an aluminum core zinc part.
- the metallized film 3 is provided with an insulation margin 10 similar to the insulation margin 7 of the metallized film 2.
- the capacitor element 91 is formed by overlappingly winding the metallized film 2 and the metallized film 3 so as to be slightly shifted along the winding axis extending in the width direction D1. At this time, the metallized films 2 and 3 are wound with the respective insulation margin 7 and the insulation margin 10 disposed so as to be opposite to each other in the width direction D1.
- the metallized film capacitor 1 is completed by spraying zinc on both ends of the capacitor element 91 thus produced in the width direction D1 to form the external electrodes 4a and 4b. As shown in FIG. 1A, the metal film electrode 6 of the metallized film 2 is not in contact with the external electrode 4b by the insulation margin 7.
- the metal film electrode 9 of the metallized film 3 is not in contact with the external electrode 4 a due to the insulation margin 10.
- condenser element 91 of the metallized film capacitor 1 in Embodiment 1 although the metallized films 2 and 3 are wound, you may laminate
- the metal film electrode 9 is shown in FIG. 1A apart from the surface 5b opposite to the surface 5a of the dielectric film 5 of the metallized film 3. Actually, the metallized film 3 is in contact with the surface 5 b of the dielectric film 5.
- the metallized film capacitor 1 has one of the metal film electrode 6 of the metallized film 2 and the metal film electrode 9 of the metallized film 3 functioning as a positive electrode and the other functioning as a negative electrode. Specifically, when the metallized film capacitor 1 is connected to an external device, of the metal film electrode 6 and the metal film electrode 9, the metal film electrode connected to the positive electrode side of the external device functions as a positive electrode. The metal film electrode connected to the negative electrode side of the device functions as a negative electrode.
- the structure of the metallized film 2 and the metallized film 3 will be described in detail with a focus on the aluminum core zinc part 6b.
- the metallized film 3 has the same configuration as that of the metallized film 2, only the configuration of the metallized film 2 will be described below.
- the metal film electrode 6 formed on the surface of the dielectric film 5 has an aluminum portion 6a and an aluminum core zinc portion 6b.
- the aluminum core zinc portion 6b is electrically continuous with the aluminum portion 6a.
- the aluminum core zinc part 6b is formed by evaporating a deposition material formed of zinc on a core made of aluminum.
- an aluminum layer having the same components as the aluminum part 6a is formed at the same time as the aluminum part 6a at the position where the aluminum core zinc part 6b is disposed, and then the aluminum layer is overlaid with zinc. Formed by vapor deposition.
- an aluminum layer is once formed on substantially the entire surface of the surface 5a of the dielectric film 5 where the metal film electrode 6 is to be formed, zinc is deposited and deposited only at a predetermined position, so that aluminum is formed at the predetermined position.
- a nuclear zinc portion 6b is disposed.
- the metal film electrode 6 in which the aluminum portion 6a is disposed at a portion other than the predetermined position is completed.
- the aluminum core zinc portion 6b is formed by further overlapping the zinc layer on the aluminum layer.
- the aluminum and zinc are passed over time. Move between the aluminum layer and the zinc layer by diffusion or the like, and are mixed.
- the portion of the aluminum core zinc portion 6b that contacts the dielectric film 5 contains a relatively large amount of aluminum, and the opposite portion of the dielectric film 5 contains a larger amount of zinc. Therefore, the aluminum core zinc portion 6b is not clearly divided into an aluminum layer and a zinc layer.
- FIG. 1A in order to show the structure of the metallized film 2 simply, the boundary between the aluminum part 6a and the aluminum core zinc part 6b is clearly shown, but in actuality, between the aluminum part 6a and the aluminum core zinc part 6b. However, each component moves to each other by diffusion or the like. Therefore, in reality, the boundary between the aluminum portion 6a and the aluminum core zinc portion 6b is not always clearly shown.
- the aluminum layer for forming the aluminum portion 6a and the aluminum core zinc portion 6b only the portion of the aluminum layer where the aluminum core zinc portion 6b is formed may be locally thinner than the other portions. .
- the supply rate of the aluminum vapor deposition material that is, the rate of feeding the aluminum wire is slowed down to reduce the amount of aluminum metal particles generated per unit time. The method of doing is mentioned.
- the aluminum layer may be formed thin by other methods.
- the aluminum core zinc part 6b is also formed with zinc and aluminum which are metals, it functions as an electrode of the metallized film capacitor 1 similarly to the aluminum part 6a.
- the slit 12 is a portion where the metal film electrode 6 does not exist and the surface 5 a of the dielectric film 5 is exposed from the metal film electrode 6.
- oil is applied in advance to the positions where the slits 12 on the dielectric film 5 are to be formed, and the metal particles of the vapor deposition material adhere to the positions during the vapor deposition step. By preventing it, the slit 12 is formed.
- the metal film electrode 6 is divided into three large electrode portions 13 arranged in the width direction D1 of the dielectric film 5 by the slit 12.
- Each of the three large electrode portions 13 is divided into a plurality of small electrode portions 15 by slits 14 arranged in the width direction D1 of the dielectric film 5.
- the slit 14 is formed by applying oil to the dielectric film 5 before the vapor deposition step.
- the metallized film 2 has three large electrode portions 13, but may have two large electrode portions 13, or four or more large electrode portions 13.
- the small electrode portion 15 has a rectangular shape, but is not limited thereto, and may have another shape such as a rhombus.
- the plurality of small electrode portions 15 need not have the same shape, and may have different shapes.
- the fuse 16 provided in the slit 12 electrically connects the large electrode portions 13 adjacent to each other. More precisely, among the plurality of small electrode portions 15 constituting each of the large electrode portions 13, the small electrode portions 15 adjacent to each other in the width direction D1 are electrically connected by the fuse 16.
- the oil for forming the slit 12 is not applied to the portion where the fuse 16 is provided in the portion where the slit 12 is formed, and the fuse 16 is formed by attaching metal particles to the portion in the vapor deposition process.
- the aluminum core zinc portion 6b is provided around the fuse 16 as shown in FIGS. 1A and 1B. As shown in FIG. 1B, the aluminum core zinc portion 6 b may be provided in the fuse 16. Specifically, as shown in FIG. 1B, the aluminum core zinc portions 6b are provided on both sides of the slit 12 so as to face the slit 12 and extend straight along the slit 12 in the longitudinal direction D2. In Embodiment 1, the aluminum core zinc part 6b is formed in the range of about 2 mm from both ends of the slit 12.
- Aluminum is used as the material of the metal deposition electrode 102 of the conventional metallized film capacitor disclosed in Patent Document 1.
- a metallized film capacitor using aluminum as the metal vapor deposition electrode 102 is a commercial power source such as AC 100V for general household appliances, or a circuit before smoothing of a single-phase rectifier circuit of an inverter, that is, between voltage waveform peaks.
- a circuit having a large potential difference Vp ⁇ p so-called “electrode receding”, in which oxidation is generated and promoted particularly from the end portion of the metal deposition electrode 102 due to corona discharge, may result in a decrease in capacity.
- the capacity is likely to decrease due to electrode retreat.
- the metallized film capacitor 1 can suppress the capacity reduction by the aluminum core zinc portion 6b.
- the aluminum core zinc portion 6b provided in the periphery of the fuse 16 contains zinc that is not easily oxidized. Therefore, electrode receding does not easily occur and progress in the portion of the metal film electrode 6 around the fuse 16 provided with the aluminum core zinc portion 6b. As a result, it is possible to prevent the fuse 16 from being cut due to electrode retreat, and to suppress a decrease in capacity. Therefore, the metallized film capacitor 1 can maintain characteristics over a long period of time and is excellent in reliability.
- the entire metal film electrode is composed of an aluminum core zinc layer. Since zinc has a higher ionization tendency than aluminum, it reacts with external moisture and oxygen and is easily oxidized. When zinc is oxidized, the film resistance value of the entire metal film electrode increases and tan ⁇ may increase. Therefore, it is not preferable to use zinc over the entire metal film electrode. Also, since zinc is inferior in self-healing performance compared to aluminum, if zinc is used for the entire metal film electrode, the high self-healing performance of aluminum cannot be fully utilized, and the reliability as a metallized film capacitor is reduced. There is a risk that.
- an aluminum core zinc portion 6 b is selectively disposed in a part of the metal film electrode 6. For this reason, the metallized film capacitor 1 can suppress the capacity
- the aluminum core zinc portions 6 b are provided on both sides of the slit 12 along the slit 12.
- the electrode retraction of the metal film electrode 6 occurs not only in the peripheral portion of the fuse 16 but also in the peripheral portion of the slit 12.
- aluminum core zinc parts 6 b are provided on both sides of the slit 12 to suppress electrode retreat in the metal film electrode 6 around the slit 12. Therefore, the metallized film capacitor 1 according to the first embodiment can further suppress the capacity reduction.
- a method for producing the metallized film 2 having the aluminum core zinc portion 6b provided along the slit 12 will be briefly described below. In the following description, the entire process for producing the metallized film 2 is not described, but only the process of forming the aluminum core zinc portion 6b along the slit 12 will be described.
- an aluminum layer is formed on the surface 5a of the dielectric film 5 by continuously conveying the dielectric film 5 in the longitudinal direction D2 over the vapor port from which the metal vapor of aluminum is released. .
- the aluminum core zinc part 6b is formed by spraying the metal vapor
- An aluminum portion 6a is formed in a portion of the aluminum layer other than a predetermined position where zinc metal vapor is sprayed.
- a steam port for discharging the metal vapor of zinc at a position corresponding to the slit 12.
- zinc metal vapor is continuously discharged from the vapor port, and this metal vapor is sprayed onto the aluminum layer, whereby the aluminum core zinc portion 6b can be formed along the slit 12.
- FIG. 2 is a plan view of another metallized film 71 of the metallized film capacitor 1 according to the first embodiment.
- the same reference numerals are assigned to the same parts as those of the metallized film 2 shown in FIG. 1A.
- the aluminum core zinc portion 6 b faces the slits 12 and 14 and is disposed along the slits 12 and 14.
- Electrode retraction also occurs at the metal film electrode 6 portions on both sides of the slit 14.
- the capacity reduction of the metallized film capacitor 1 can be further suppressed.
- the manufacturing method of arranging the aluminum core zinc portion 6b along the slit 12 is the same as the manufacturing method described above. Further, in order to form the aluminum core zinc portion 6 b along the slit 14, first, another vapor port of zinc having a width equal to the length of the slit 14 is prepared, and the vapor is aligned with the position of the slit 14. Place the mouth. When the dielectric film 5 is transported in the longitudinal direction D2, the shutter of the steam port is opened when the slit 14 passes through the upper part of the steam port, and the shutter of the steam port is closed at other times. By depositing zinc on the dielectric film 5 continuously conveyed while repeating the opening and closing operation of the shutter, the aluminum core zinc portion 6 b can be selectively disposed along the slit 14.
- both the metallized film 2 and the metallized film 3 have the aluminum nucleus zinc part 6b, it is not restricted to this, either of the metallized films 2 and 3
- the aluminum core zinc portion 6b may be formed only on one metallized film 2.
- FIG. 3 is a plan view of the metallized film 21 of the metallized film capacitor according to the second embodiment.
- the same reference numerals are given to the same portions as those of the metallized film 2 in Embodiment 1 shown in FIGS. 1A and 1B.
- the metallized film capacitor in the second embodiment differs from the metallized film capacitor 1 in the first embodiment in the position of the aluminum core zinc portion 6b.
- the metallized film 3 has the same configuration as the metallized film 21.
- the metallized film 21 is provided with an aluminum core zinc portion 6 b only around the fuse 16.
- the aluminum core zinc portion 6 b is provided only in the fuse 16 and a substantially circular portion centering on the fuse 16.
- the aluminum core zinc portion 6 b is provided only in the periphery of the fuse 16 and the fuse 16 that cause this significant capacity reduction, and is provided along the slit 12 and the slit 14. It is not done.
- the portion where the aluminum core zinc portion 6b is disposed is limited only to the fuse 16 and the periphery of the fuse 16 which are the main causes of the capacity reduction of the metallized film capacitor.
- the proportion of aluminum on 5 is as large as possible. Therefore, the metallized film capacitor according to Embodiment 2 further effectively has the high self-healing performance of aluminum.
- the zinc vapor port shutter provided at a position corresponding to the position of the fuse 16 is opened and closed when the fuse 16 passes in the zinc vapor deposition process. To do.
- FIG. 4 is a plan view of the metallized film 31 of the metallized film capacitor according to the third embodiment.
- the same reference numerals are assigned to the same parts as those of the metallized film 2 in the first embodiment shown in FIGS. 1A and 1B.
- the metallized film 3 has the same configuration as the metallized film 31.
- the metallized film 31 in the third embodiment has a metal film electrode 34 provided on the surface 5a of the dielectric film 5 instead of the metal film electrode 6 of the metallized film 2 in the first embodiment.
- a slit 33 is provided at the approximate center in the width direction D ⁇ b> 1 of the dielectric film 5.
- the metal film electrode 34 is divided into a non-divided electrode portion 35 and a divided electrode portion 36 arranged in the width direction D 1 of the dielectric film 5.
- the non-divided electrode portion 35 is disposed continuously in the longitudinal direction D2 of the dielectric film 5, and has a long side extending in the longitudinal direction D2 and a short side extending in the width direction D1.
- the non-divided electrode portion 35 is in direct contact with the external electrode 4a. Therefore, the current flowing from the external device to the metallized film capacitor first flows into the non-divided electrode portion 35 via the external electrode 4a.
- the divided electrode portion 36 is divided into a plurality of small electrode portions 39 in a grid pattern by two slits 37 extending straight in the longitudinal direction D2 and a plurality of slits 38 extending straight in the width direction D1. Is done.
- Each of the plurality of small electrode portions 39 has a rectangular shape.
- the plurality of small electrode portions 39 are arranged via the slits 38 that are straight in the longitudinal direction D2. Three columns each composed of a plurality of small electrode portions 39 and separated by the slits 37 are arranged in the width direction D1.
- each of the plurality of small electrode portions 39 has a rectangular shape, but may have another shape such as a rhombus.
- the plurality of small electrode portions 39 need not have the same shape, and may have different shapes.
- three rows each composed of a plurality of small electrode portions 39 arranged in the longitudinal direction D2 are arranged in the width direction D1, but not limited to this, a plurality of rows arranged in the longitudinal direction D2 are arranged.
- Two rows each composed of the small electrode portions 39 may be arranged in the width direction D1, or four or more rows each composed of a plurality of small electrode portions 39 arranged in the longitudinal direction D2 are arranged in the width direction D1. May be.
- the non-divided electrode part 35 and the divided electrode part 36 are electrically connected through fuses 40 provided in the plurality of slits 33. Specifically, among the plurality of small electrode portions 39 in each of the plurality of rows constituting the divided electrode portion 36, the small electrode portion 39 constituting the row closest to the non-divided electrode portion 35 is the non-divided electrode portion 35.
- the fuse 40 is connected.
- the small electrode portions 39 adjacent to each other in the width direction D1 are connected to each other by a fuse 41 provided in the slit 37.
- the current flowing from the external device to the metallized film capacitor first flows into the non-divided electrode portion 35 and then flows through the fuse 40 to the small electrode portion 39 in the row closest to the non-divided electrode portion 35. Then, the current flowing through the small electrode portions 39 in the column closest to the non-divided electrode portion 35 finally flows into the small electrode portions 39 in the column farthest from the non-divided electrode portion 35 through the fuse 41.
- the aluminum core zinc portion 34 b is disposed in the fuse 40 and the periphery of the fuse 40.
- the slit 33 is provided on the both sides of the slit 33 so as to face the slit 33 and to extend straight along the slit 33 in the longitudinal direction D2.
- the aluminum core zinc part 34b is arrange
- the aluminum portion 34a is disposed in a portion of the metal film electrode 34 other than the aluminum core zinc portion 34b, that is, a portion other than the portion including both ends of the slit 33 between the non-divided electrode portion 35 and the divided electrode portion 36.
- the aluminum part 34a and the aluminum core zinc part 34b have the same structure as the aluminum part 6a and the aluminum core zinc part 6b in the first embodiment.
- the metallized film capacitor using the metallized film 31 according to the third embodiment can prevent the fuse 40 from being cut by suppressing electrode receding in the vicinity of the fuse 40, and can suppress a decrease in capacitance. it can.
- the non-divided electrode portion 35 occupies substantially half the area of the surface 5a of the dielectric film 5, and the slit 33 is formed at the approximate center in the width direction D1 of the surface 5a of the dielectric film 5. Is provided. In this configuration, when two metallized films are overlaid to form a capacitor element, the respective slits 33 of the metallized film overlap each other or are located very close to each other.
- the fuses 40 arranged in the slits 33 of the two metallized films have a high density of current flowing together, and are likely to generate heat. Therefore, the capacitor element according to the third embodiment has a remarkable temperature rise at the central portion, and oxidation degradation is easily promoted at this location. That is, as shown in FIG. 4, in the metallized film 31 in which the slit 33 and the fuse 40 are arranged at the approximate center in the width direction D1 of the dielectric film 5, electrode retraction around the fuse 40 is suppressed, and the fuse 40 is It is particularly important to keep the initial state as much as possible, and the selective provision of the aluminum core zinc portion 34b is particularly useful for the metallized film 31 of the third embodiment.
- the aluminum core zinc portion 34 b is provided on both sides of the slit 33 along the slit 33. Therefore, the electrode retreat of the metal film electrode 34 around the slit 33 can be suppressed, and the capacity reduction can be further suppressed.
- the method similar to the method of forming the aluminum nucleus zinc part 6b along the slit 12 of the metallized film 2 in Embodiment 1 is used. Can do.
- FIG. 5 is a plan view of another metallized film 31a according to the third embodiment.
- the same reference numerals are assigned to the same portions as those of the metallized film 31 shown in FIG.
- the aluminum core zinc portion 34 b faces the slit 33 and is provided along the slit 33, and further faces the slit 37 and is provided along the slit 37.
- FIG. 6 is a plan view of still another metallized film 31b according to the third embodiment.
- the aluminum core zinc portion 34 b is provided along the slits 33, 37, 38 so as to face the slit 33, the slit 37, and the slit 38.
- electrode receding at the metal film electrode 34 at both ends of the slit 38 can also be suppressed, and the capacity reduction of the metallized film capacitor in the third embodiment can be further suppressed.
- the same method as the method for forming the aluminum core zinc portion 6b along the slit 14 of the metallized film 2 in the first embodiment is used. Can do.
- the slit 33 is provided in the approximate center of the dielectric film 5 in the width direction D1, and the area of approximately half of the surface 5a of the dielectric film 5 is divided into electrode portions. 36 occupies. Not only this but the position which provides the slit 33 may be changed, and the area which the division
- FIG. 7 is a plan view of a metallized film 51 used in the metallized film capacitor according to the fourth embodiment.
- the same reference numerals are assigned to the same portions as those of the metallized film 31 in the third embodiment shown in FIG.
- the positions where the metallized film 31 according to the third embodiment and the aluminum core zinc portion 34b are provided are different.
- the metallized film 3 (FIG. 1A) has the same configuration as the metallized film 51.
- the metallized film 51 is provided with the aluminum core zinc part 34b only in the fuse 40 and the periphery of the fuse 40.
- the aluminum core zinc portion 34 b is provided in a substantially circular portion centering on the fuse 40.
- the aluminum core zinc portion 34 b is provided only in the fuse 40 that causes a significant capacity reduction, and the aluminum core zinc portion 34 b is provided along the slit 33, the slit 37, and the slit 38.
- the formation of the aluminum core zinc portion 34b is limited only to the position that is the main cause of the decrease in the capacitance of the metallized film capacitor, and the proportion of aluminum on the dielectric film 5 is increased as much as possible, so A metallized film capacitor having effective recovery performance is obtained.
- the amount of current flowing in depending on the fuse 40 may locally increase. If the thickness is reduced due to electrode retraction, the fuse 40 is easily cut, and as a result, the capacity is reduced. Therefore, keeping the fuse 40 in the initial state is important for the metallized film 51 having the electrode pattern in the fourth embodiment.
- FIG. 8 is a plan view of another metallized film 51a according to the fourth embodiment.
- the aluminum core zinc portion 34 b is provided on the fuse 40 and the periphery of the fuse 40, and further provided on the fuse 41 and the periphery of the fuse 41. With this configuration, it is possible to suppress electrode retraction generated in the fuse 41.
- FIG. 9 is a plan view of a metallized film 61 used in the metallized film capacitor according to the fifth embodiment.
- the same reference numerals are assigned to the same portions as those of the metallized film 31 in the third embodiment shown in FIG.
- the other metallized film 3 has the same configuration as that of the metallized film 61.
- the metallized film 61 in the fifth embodiment has a metal film electrode 62 provided on the surface 5a of the dielectric film 5 instead of the metal film electrode 34 of the metallized film 31 in the third embodiment.
- the metal film electrode 62 has the same structure as the non-divided electrode part 35, the divided electrode part 36, the slits 33, 37, 38 and the fuses 40, 41 of the metal film electrode 34 of the metallized film 31 in the third embodiment.
- the divided electrode portion 64, the divided electrode portion 63, slits 66, 68, and 69 and fuses 65 and 65a are provided.
- the fuse 65 connects the divided electrode portion 63 and the non-divided electrode portion 64.
- the entire divided electrode portion 63 is formed of the aluminum core zinc portion 62b among the divided electrode portion 63 and the non-divided electrode portion 64 of the metal film electrode 62. More specifically, an aluminum core zinc portion 62 b is formed at the end along the slit 66 facing the slit 66 of the divided electrode portion 63, the fuse 65, and the non-divided electrode portion 64.
- the end portion along the slit 66 of the non-divided electrode portion 64 is a region extending from the left end of the slit 66 shown in FIG. 9 to about 2 mm and extending straight along the slit 66 in the longitudinal direction D2.
- the portion other than the end portion along the slit 66 of the non-divided electrode portion 64 is constituted by an aluminum portion 62a substantially made of only aluminum.
- the slit 66, the slit 68, and the slit 69 are each surrounded by the aluminum core zinc portion 62b, and the aluminum core zinc portion 62b is disposed in all the portions where the electrode retreat may occur.
- the electrode retreat of the metallized film 61 can be generally suppressed, and the capacity reduction of the metallized film capacitor can be suppressed.
- the vapor port is adjusted so that the metal vapor of zinc is emitted to the portion where the aluminum core zinc portion 62b is provided, that is, approximately half of the width direction D1.
- the aluminum core zinc part 62b of the metallized film 61 in the fifth embodiment can be formed by continuously spraying a metal vapor of zinc on a portion corresponding to substantially half of the width direction D1. Therefore, it is not necessary to control the opening / closing of the deposition port shutter with high accuracy, and the deposition apparatus can be controlled relatively easily. Therefore, the metallized film capacitor in Embodiment 5 has high productivity. Moreover, the dispersion
- a pair of metallized films having metal film electrodes formed on only one surface 5a of the dielectric film 5 are overlaid.
- a metallized film capacitor may be constituted using the double-sided metallized film which formed the metal film electrode in each of both surfaces 5a and 5b of dielectric film 5.
- This metallized film capacitor is manufactured by winding a double-sided metallized film together with a laminated film for insulating opposing metal film electrodes.
- the aluminum core zinc part is disposed on the metal film electrodes on both surfaces or one of the surfaces of the double-sided metallized film.
- the metallized film capacitor according to the present invention can maintain characteristics over a long period of time and has excellent reliability, it is useful for electronic and electrical equipment in a wide range of fields such as for automobile electrical equipment.
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Abstract
Description
図1Aは実施形態1における金属化フィルムコンデンサ1の断面図であり、金属化フィルムコンデンサ1の構造を概念的に示す。
図3は実施形態2における金属化フィルムコンデンサの金属化フィルム21の平面図である。図3において、図1Aと1Bに示す実施形態1における金属化フィルム2と同じ部分には同じ参照番号を付す。実施形態2における金属化フィルムコンデンサは、実施形態1における金属化フィルムコンデンサ1とアルミニウム核亜鉛部6bの位置が異なる。実施形態2における金属化フィルムコンデンサでは、金属化フィルム3も金属化フィルム21と同様の構成を有する。
図4は実施形態3における金属化フィルムコンデンサの金属化フィルム31の平面図である。図4において、図1Aと1Bに示す実施形態1における金属化フィルム2と同じ部分には同じ参照番号を付す。実施形態3における金属化フィルムコンデンサでは、金属化フィルム3も金属化フィルム31と同様の構成を有する。
図7は、実施形態4における金属化フィルムコンデンサに用いる金属化フィルム51の平面図である。図7において、図4に示す実施形態3における金属化フィルム31と同じ部分には同じ参照番号を付す。実施形態4における金属化フィルムコンデンサでは実施形態3の金属化フィルム31とアルミニウム核亜鉛部34bを設ける位置が異なる。実施形態3における金属化フィルムコンデンサでは、金属化フィルム3(図1A)も金属化フィルム51と同様の構成を有する。
図9は実施形態5における金属化フィルムコンデンサに用いる金属化フィルム61の平面図である。図9において、図4に示す実施形態3における金属化フィルム31と同じ部分には同じ参照番号を付す。実施形態5における金属化フィルムコンデンサでは、他方の金属化フィルム3(図1A参照)も金属化フィルム61と同様の構成を有する。
2 金属化フィルム(第1の金属化フィルム)
3 金属化フィルム(第2の金属化フィルム)
4a 外部電極(第1の外部電極)
4b 外部電極(第2の外部電極)
5 誘電体フィルム
6 金属膜電極(第1の金属膜電極)
6a アルミニウム部
6b アルミニウム核亜鉛部
7 絶縁マージン
8 誘電体フィルム
9 金属膜電極(第2の金属膜電極)
10 絶縁マージン
12 スリット(第1のスリット)
13 大電極部(第1の大電極部、第2の大電極部)
14 スリット(第2のスリット)
15 小電極部
16 ヒューズ(第1のヒューズ、第2のヒューズ)
21 金属化フィルム
31 金属化フィルム
33 スリット(第1のスリット)
34 金属膜電極(第1の金属膜電極)
34a アルミニウム部
34b アルミニウム核亜鉛部
35 非分割電極部
36 分割電極部
37 スリット(第2のスリット)
38 スリット(第3のスリット)
39 小電極部
40 ヒューズ
41 ヒューズ
51 金属化フィルム
61 金属化フィルム
62 金属膜電極
62a アルミニウム部
62b アルミニウム核亜鉛部
63 分割電極部
64 非分割電極部
65 ヒューズ
66 スリット(第1のスリット)
68 スリット(第2のスリット)
69 スリット(第3のスリット)
Claims (13)
- 誘電体フィルムと、
前記誘電体フィルムの表面に設けられた第1の金属膜電極と、
前記誘電体フィルムを介して前記第1の金属膜電極に対向する第2の金属膜電極と、
を有するコンデンサ素子と、
前記コンデンサ素子に設けられて前記第1の金属膜電極に接続された第1の外部電極と、
前記コンデンサ素子に設けられて前記第2の金属膜電極に接続された第2の外部電極と、
を備え、
前記第1の金属膜電極は、
第1のスリットにより互いに分離された第1の大電極部と第2の大電極部と、
前記第1のスリットに設けられて前記第1の大電極部と前記第2の大電極部とに接続された第1のヒューズと、
を有し、
前記第1の金属膜電極は、実質的にアルミニウムのみを含有するアルミニウム部と、亜鉛を主に含有してアルミニウムをさらに含有するアルミニウム核亜鉛部とを有し、
前記アルミニウム核亜鉛部は少なくとも前記第1のヒューズの周辺に配置されている、金属化フィルムコンデンサ。 - 前記アルミニウム核亜鉛部は、前記第1スリットに面して前記第1スリットの両側に配置されている、請求項1に記載の金属化フィルムコンデンサ。
- 前記アルミニウム核亜鉛部は前記ヒューズに直接繋がっている、請求項2に記載の金属化フィルムコンデンサ。
- 前記第2の大電極部は、
複数の第2のスリットにより互いに分離された複数の小電極部と、
前記複数の第2のスリットにそれぞれ設けられて、前記複数の小電極部のうち前記複数の第2のスリットを介して互いに対向する複数の小電極部を接続する複数の第2のヒューズと、
を有し、
前記アルミニウム核亜鉛部は、前記複数の第2スリットに面して前記第2スリットの両側に配置されている、請求項1または2に記載の金属化フィルムコンデンサ。 - 前記アルミニウム核亜鉛部は前記複数の第2のヒューズに直接繋がっている、請求項4に記載の金属化フィルムコンデンサ。
- 前記アルミニウム核亜鉛部は前記第1のヒューズの周辺にのみ配置されている、請求項1に記載の金属化フィルムコンデンサ。
- 誘電体フィルムと、
前記誘電体フィルムの表面に設けられた第1の金属膜電極と、
前記誘電体フィルムを介して前記第1の金属膜電極に対向する第2の金属膜電極と、
を有するコンデンサ素子と、
前記コンデンサ素子に設けられて前記第1の金属膜電極に接続された第1の外部電極と、
前記コンデンサ素子に設けられて前記第2の金属膜電極に接続された第2の外部電極と、
を備え、
前記第1の金属膜電極は、
前記第1の外部電極に繋がる非分割電極部と、
第1のスリットにより前記非分割電極部から分離する分割電極部と、
前記第1のスリットに設けられて前記非分割電極部と前記分割電極部とを接続する第1のヒューズと、
を有し、
前記第1の金属膜電極は、実質的にアルミニウムのみよりなるアルミニウム部と、亜鉛を主に含有してアルミニウムをさらに含有するアルミニウム核亜鉛部とを有し、
前記分割電極部は、互いに分割された複数の小電極部を有し、
前記アルミニウム核亜鉛部は少なくとも前記第1のヒューズの周辺に配置されている、金属化フィルムコンデンサ。 - 前記アルミニウム核亜鉛部は前記第1スリットに面して前記第1スリットの両側に配置されている、請求項7に記載の金属化フィルムコンデンサ。
- 前記分割電極部の前記複数の小電極部は第2のスリットにより互いに分割されており、
前記アルミニウム核亜鉛部は前記第1のスリットと前記第2のスリットに面して前記第1のスリットと前記第2のスリットとのそれぞれの両側に配置されている、請求項7または8に記載の金属化フィルムコンデンサ。 - 前記分割電極部の前記複数の小電極部は前記第2のスリットにより前記誘電体フィルムの幅方向に互いに分割され、かつ第3のスリットにより前記誘電体フィルムの長手方向に分割されており、
前記アルミニウム核亜鉛部は前記第1のスリットと前記第2のスリットと前記第3のスリットとに面して前記第1のスリットと前記第2のスリットと前記第3のスリットとのそれぞれの両側に配置されている、請求項7から9のいずれか一項に記載の金属化フィルムコンデンサ。 - 前記アルミニウム核亜鉛部は、前記第1のヒューズの周辺にのみ配置されている、請求項7に記載の金属化フィルムコンデンサ。
- 前記分割電極部は、前記複数の小電極部を互いに接続する第2のヒューズをさらに有し、
前記アルミニウム核亜鉛部は、前記第1のヒューズと前記第2のヒューズの周辺にのみに配置されている、請求項7に記載の金属化フィルムコンデンサ。 - 誘電体フィルムと、
前記誘電体フィルムの表面に設けられた第1の金属膜電極と、
前記誘電体フィルムを介して前記第1の金属膜電極に対向する第2の金属膜電極と、
を有するコンデンサ素子と、
前記コンデンサ素子に設けられて前記第1の金属膜電極に接続された第1の外部電極と、
前記コンデンサ素子に設けられて前記第2の金属膜電極に接続された第2の外部電極と、
を備え、
前記第1の金属膜電極は、
前記第1の外部電極に繋がる非分割電極部と、
第1のスリットにより前記非分割電極部から分離する分割電極部と、
前記第1のスリットに設けられて前記非分割電極部と前記分割電極部とを接続する第1のヒューズと、
を有し、
前記第1の金属膜電極は、実質的にアルミニウムよりなるアルミニウム部と、亜鉛を主に含有しアルミニウムをさらに含有するアルミニウム核亜鉛部とを有し、
前記アルミニウム核亜鉛部は、前記非分割電極部の前記第1スリットに面する端部と、前記分割電極部と、前記第1のヒューズとを構成し、
前記アルミニウム部は、前記非分割電極部の前記端部以外の部分を構成する、金属化フィルムコンデンサ。
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| DE112016002158.5T DE112016002158T5 (de) | 2015-05-11 | 2016-05-10 | Metallisierter folienkondensator |
| US15/553,255 US10083794B2 (en) | 2015-05-11 | 2016-05-10 | Metallized film capacitor |
| CN201680016372.0A CN107408456B (zh) | 2015-05-11 | 2016-05-10 | 金属化薄膜电容器 |
| JP2017517612A JP6748851B2 (ja) | 2015-05-11 | 2016-05-10 | 金属化フィルムコンデンサ |
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| CN109461581B (zh) * | 2018-11-05 | 2020-10-27 | 铜陵市超越电子有限公司 | 一种抗涌流抗谐波金属化薄膜 |
| CN113972070B (zh) * | 2021-11-04 | 2023-01-06 | 南通新江海动力电子有限公司 | 一种方便调整的金属化安全型薄膜镀层结构 |
Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH03211809A (ja) * | 1990-01-17 | 1991-09-17 | Matsushita Electric Ind Co Ltd | 金属化フィルムコンデンサ |
| JPH08288171A (ja) * | 1995-04-19 | 1996-11-01 | Matsushita Electric Ind Co Ltd | 金属化フィルムコンデンサ |
| JPH10189382A (ja) * | 1996-12-20 | 1998-07-21 | Mitsubishi Shindoh Co Ltd | 亜鉛蒸着フィルムおよび金属化フィルムコンデンサ |
| JP2004087648A (ja) * | 2002-08-26 | 2004-03-18 | Matsushita Electric Ind Co Ltd | 蒸着フィルムとそのフィルムを用いたフィルムコンデンサとそのコンデンサを用いたインバータ装置 |
| JP2009164328A (ja) * | 2008-01-07 | 2009-07-23 | Panasonic Corp | 金属化フィルムコンデンサ |
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| WO2011055517A1 (ja) * | 2009-11-04 | 2011-05-12 | パナソニック株式会社 | 金属化フィルムコンデンサ及びこれを用いたケースモールド型コンデンサ |
| US9281123B2 (en) * | 2011-05-30 | 2016-03-08 | Panasonic Intellectual Property Management Co., Ltd. | Metalized film capacitor |
| JP2013219400A (ja) | 2013-07-29 | 2013-10-24 | Nichicon Corp | 金属化フィルムコンデンサ |
-
2016
- 2016-05-10 WO PCT/JP2016/002283 patent/WO2016181646A1/ja not_active Ceased
- 2016-05-10 JP JP2017517612A patent/JP6748851B2/ja active Active
- 2016-05-10 DE DE112016002158.5T patent/DE112016002158T5/de active Pending
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Patent Citations (5)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH03211809A (ja) * | 1990-01-17 | 1991-09-17 | Matsushita Electric Ind Co Ltd | 金属化フィルムコンデンサ |
| JPH08288171A (ja) * | 1995-04-19 | 1996-11-01 | Matsushita Electric Ind Co Ltd | 金属化フィルムコンデンサ |
| JPH10189382A (ja) * | 1996-12-20 | 1998-07-21 | Mitsubishi Shindoh Co Ltd | 亜鉛蒸着フィルムおよび金属化フィルムコンデンサ |
| JP2004087648A (ja) * | 2002-08-26 | 2004-03-18 | Matsushita Electric Ind Co Ltd | 蒸着フィルムとそのフィルムを用いたフィルムコンデンサとそのコンデンサを用いたインバータ装置 |
| JP2009164328A (ja) * | 2008-01-07 | 2009-07-23 | Panasonic Corp | 金属化フィルムコンデンサ |
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| US10083794B2 (en) | 2018-09-25 |
| DE112016002158T5 (de) | 2018-01-18 |
| US20180047506A1 (en) | 2018-02-15 |
| JPWO2016181646A1 (ja) | 2018-03-01 |
| CN107408456B (zh) | 2019-08-16 |
| CN107408456A (zh) | 2017-11-28 |
| JP6748851B2 (ja) | 2020-09-02 |
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