WO2016170998A1 - 電荷輸送性膜の製造方法、電荷輸送性膜、有機エレクトロルミネッセンス素子、有機エレクトロルミネッセンス素子の製造方法、電荷輸送性膜の電荷輸送性の向上方法 - Google Patents
電荷輸送性膜の製造方法、電荷輸送性膜、有機エレクトロルミネッセンス素子、有機エレクトロルミネッセンス素子の製造方法、電荷輸送性膜の電荷輸送性の向上方法 Download PDFInfo
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K50/00—Organic light-emitting devices
- H10K50/10—OLEDs or polymer light-emitting diodes [PLED]
- H10K50/14—Carrier transporting layers
- H10K50/15—Hole transporting layers
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- H—ELECTRICITY
- H05—ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
- H05B—ELECTRIC HEATING; ELECTRIC LIGHT SOURCES NOT OTHERWISE PROVIDED FOR; CIRCUIT ARRANGEMENTS FOR ELECTRIC LIGHT SOURCES, IN GENERAL
- H05B33/00—Electroluminescent light sources
- H05B33/10—Apparatus or processes specially adapted to the manufacture of electroluminescent light sources
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K85/00—Organic materials used in the body or electrodes of devices covered by this subclass
- H10K85/60—Organic compounds having low molecular weight
- H10K85/631—Amine compounds having at least two aryl rest on at least one amine-nitrogen atom, e.g. triphenylamine
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K85/00—Organic materials used in the body or electrodes of devices covered by this subclass
- H10K85/60—Organic compounds having low molecular weight
- H10K85/631—Amine compounds having at least two aryl rest on at least one amine-nitrogen atom, e.g. triphenylamine
- H10K85/633—Amine compounds having at least two aryl rest on at least one amine-nitrogen atom, e.g. triphenylamine comprising polycyclic condensed aromatic hydrocarbons as substituents on the nitrogen atom
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K50/00—Organic light-emitting devices
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K50/00—Organic light-emitting devices
- H10K50/10—OLEDs or polymer light-emitting diodes [PLED]
- H10K50/17—Carrier injection layers
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- H—ELECTRICITY
- H10—SEMICONDUCTOR DEVICES; ELECTRIC SOLID-STATE DEVICES NOT OTHERWISE PROVIDED FOR
- H10K—ORGANIC ELECTRIC SOLID-STATE DEVICES
- H10K71/00—Manufacture or treatment specially adapted for the organic devices covered by this subclass
Definitions
- the present invention relates to a method for producing a charge transporting film, a charge transporting film, and a method for improving the charge transporting property of the charge transporting film.
- organic electroluminescence element In an organic electroluminescence (hereinafter referred to as organic EL) element, a charge transporting film made of an organic compound is used as a light emitting layer or a charge injection layer.
- the hole injection layer is responsible for charge transfer between the anode and the hole transport layer or the light emitting layer, and plays an important function to achieve low voltage driving and high luminance of the organic EL element.
- the method of forming the hole injection layer is roughly divided into a dry process typified by vapor deposition and a wet process typified by spin coating. Compared with these processes, the wet process is flatter in a larger area. A highly efficient thin film can be produced efficiently. Therefore, at the present time when the area of the organic EL display is being increased, a hole injection layer that can be formed by a wet process is desired.
- the present inventors are applicable to various wet processes and have a charge transport property that provides a thin film that can realize excellent EL element characteristics when applied to a hole injection layer of an organic EL element.
- Compounds having good solubility in materials and organic solvents used therefor have been developed (see, for example, Patent Documents 1 to 4).
- Patent Documents 1 to 4 there is a constant demand for improvements in wet process materials for hole injection layers, and in particular, there is a need for wet process materials that provide thin films with excellent charge transport properties.
- the structure of an organic EL element can be divided roughly into a bottom emission structure and a top emission structure.
- a transparent anode is used on the substrate side, and light is extracted from the substrate side.
- a top emission structure element a reflective anode made of metal is used, which is transparent in the direction opposite to the substrate. Light is extracted from the electrode (cathode) side. Since the top emission structure element does not extract light from the substrate side unlike the bottom emission structure element, there is no problem that light from the light emitting layer is blocked by the TFT. There is an advantage that a high aperture ratio can be maintained. As a result, the light extraction efficiency is improved, and the power consumption and the life of the element can be reduced. In recent years, an element having a top emission structure has attracted attention.
- an element having such a top emission structure can improve the light extraction efficiency by an interference effect when the optical distance from the light emitting surface of the light emitting layer to the reflective anode satisfies a predetermined condition (for example, patents) Reference 5). Therefore, while an attempt is made to set the optical distance from the light emitting surface to the reflective anode in accordance with the light emission wavelength for the purpose of improving the light extraction efficiency by the interference effect, the length is sufficient to realize the optimum condition. Therefore, there has been a demand for a charge transporting film such as a hole injection layer having a thickness for securing the above optical distance.
- the present invention has been made in view of the above circumstances, and exhibits high charge transportability even when the film thickness is large, and realizes excellent characteristics when applied to a hole injection layer of an organic EL element. It is an object to provide a method for producing a charge transporting film, a charge transporting film, an organic electroluminescence element, a method for producing an organic electroluminescence element, and a method for improving the charge transporting property of the charge transporting film.
- the present inventors applied a varnish containing a charge transporting substance, a dopant substance and an organic solvent consisting only of an N, N′-diarylbenzidine derivative on a substrate, and thus obtained.
- a varnish containing a charge transporting substance, a dopant substance and an organic solvent consisting only of an N, N′-diarylbenzidine derivative By baking the coating film at a predetermined temperature or higher, a charge transporting film excellent in charge transporting property can be obtained even in the case of a thick film, and by applying the charge transporting film to an organic EL element
- the present inventors have found that excellent luminance characteristics can be realized and completed the present invention.
- the first aspect of the present invention is a method for producing a charge transporting film having a film thickness in the range of 50 nm to 300 nm, the charge transporting substance comprising only an N, N′-diarylbenzidine derivative, A step of applying a charge transporting film-forming varnish containing a dopant substance and an organic solvent on a substrate, and a step of baking the obtained coating film at a baking temperature represented by the formula (S1).
- S1 A method for producing a charge transporting film. Firing temperature> [232.5 ° C. + (The film thickness / 20 nm) ⁇ 5 ° C.] (S1)
- a second aspect of the present invention is the method for producing a charge transporting film according to the first aspect, wherein the firing temperature is represented by the formula (S2). Firing temperature> [237.5 ° C. + (The film thickness / 20 nm) ⁇ 5 ° C.] (S2)
- a third aspect of the present invention is the method for producing a charge transport film according to the first or second aspect, wherein the dopant substance contains an aryl sulfonic acid compound.
- a fourth aspect of the present invention is the method for producing a charge transporting film according to any one of the first to third aspects, wherein the dopant substance contains a heteropolyacid.
- a fifth aspect of the present invention is the method for producing a charge transporting film according to any one of the first to fourth aspects, wherein the N, N′-diarylbenzidine derivative is N, N′-diphenylbenzidine.
- a sixth aspect of the present invention is a charge transport film characterized by being manufactured by the method for manufacturing a charge transport film according to any one of the first to fifth aspects.
- a seventh aspect of the present invention is an organic electroluminescence element characterized by having the charge transporting film described in the sixth aspect.
- the eighth aspect of the present invention is the organic electroluminescence device according to the seventh aspect, wherein the charge transporting film is a hole injection layer, a hole transport layer or a hole injection transport layer.
- an organic electroluminescent element manufacturing method comprising the charge transporting film manufacturing method according to any one of the first to fifth aspects.
- a charge transporting film-forming varnish comprising a charge transporting substance comprising only an N, N′-diarylbenzidine derivative, a dopant substance, and an organic solvent.
- a method for improving the charge transport property of a charge transport film having a film thickness within a range the step of firing a coating film obtained from the charge transport film forming varnish at a firing temperature represented by formula (S1);
- An eleventh aspect of the present invention is the method for improving charge transportability of a charge transportable film according to the tenth aspect, wherein the firing temperature is represented by the formula (S2). Firing temperature> [237.5 ° C. + (The film thickness / 20 nm) ⁇ 5 ° C.] (S2)
- the production method of the present invention it is possible to obtain a film that is excellent in charge transporting property even when the film thickness is large and that can realize excellent characteristics when used as a hole injection layer of an organic EL element. Therefore, by using the film obtained by the manufacturing method as a hole injection layer, it is possible to ensure a sufficient distance from the light emitting surface to the reflective anode in the organic EL element having the top emission structure while maintaining excellent characteristics. For this reason, the manufacturing method of the present invention is a film such as a top emission type organic EL element that may cause a problem of a decrease in light emission efficiency caused by interference caused by a thin functional film in the element.
- the charge transport property of the thick charge transport film can be effectively improved.
- the charge transporting film according to the present invention is excellent not only in charge transporting but also in uniformity, a capacitor electrode protective film, an antistatic film, and a hole collection layer (anode buffer) of an organic thin film solar cell. Application to the layer) is also expected.
- a charge transporting film forming varnish containing a charge transporting substance composed only of an N, N′-diarylbenzidine derivative, a dopant substance, and an organic solvent is used.
- Examples of the aryl group at the N-position and N′-position in the N, N′-diarylbenzidine derivative include aryl groups having 6 to 20 carbon atoms. Specific examples include a phenyl group, a 1-naphthyl group, and a 2-naphthyl group. 1-anthryl group, 2-anthryl group, 9-anthryl group, 1-phenanthryl group, 2-phenanthryl group, 3-phenanthryl group, 4-phenanthryl group, 9-phenanthryl group and the like.
- the N-position aryl group and the N′-position aryl group are preferably the same group.
- N, N′-diarylbenzidine derivatives include N, N′-diphenylbenzidine, N, N′-di (1-naphthyl) benzidine, N, N′-di (2-naphthyl) benzidine, N— Examples include (1-naphthyl) -N ′-(2-naphthyl) benzidine, but are not limited thereto.
- N, N′-diphenylbenzidine, N, N′-di (1-naphthyl) benzidine, and N, N′-di (2-naphthyl) benzidine are preferable, and considering the transparency of the resulting film, N, N′-diphenylbenzidine is most suitable.
- the dopant substance is not particularly limited as long as it dissolves in at least one solvent used for the varnish, and any of inorganic dopant substances and organic dopant substances can be used.
- a heteropolyacid is preferable.
- the heteropolyacid has a structure in which a hetero atom is located at the center of a molecule, which is typically represented by a Keggin type represented by the formula (D1) or a Dawson type chemical structure represented by the formula (D2), and vanadium ( V), molybdenum (Mo), tungsten (W), and other polyacids such as isopolyacids that are oxygen acids and oxygenates of different elements are condensed.
- the oxygen acid of such a different element mainly include silicon (Si), phosphorus (P), and arsenic (As) oxygen acids.
- heteropolyacid examples include phosphomolybdic acid, silicomolybdic acid, phosphotungstic acid, silicotungstic acid, and lintongue molybdic acid. These may be used alone or in combination of two or more. Good.
- the heteropolyacid used by this invention is available as a commercial item, and can also be synthesize
- the one kind of heteropolyacid is preferably phosphotungstic acid or phosphomolybdic acid, and phosphotungstic acid is most suitable.
- one of the two or more types of heteropolyacids is preferably phosphotungstic acid or phosphomolybdic acid, and more preferably phosphotungstic acid.
- Heteropolyacids are those obtained as commercially available products or known syntheses even if the number of elements in the quantitative analysis such as elemental analysis is large or small from the structure represented by the general formula As long as it is appropriately synthesized according to the method, it can be used in the present invention. That is, for example, in general, phosphotungstic acid is represented by the chemical formula H 3 (PW 12 O 40 ) ⁇ nH 2 O, and phosphomolybdic acid is represented by the chemical formula H 3 (PMo 12 O 40 ) ⁇ nH 2 O, respectively.
- the mass of the heteropolyacid defined in the present invention is not the mass of pure phosphotungstic acid (phosphotungstic acid content) in the synthesized product or commercially available product, but a commercially available form and a known synthesis. In a form that can be isolated by the method, it means the total mass in a state containing hydration water and other impurities.
- arylsulfonic acid is particularly suitable as the organic dopant substance.
- One example thereof is an aryl sulfonic acid represented by the formula (1) or (2).
- a 1 represents —O— or —S—, preferably —O—.
- a 2 represents a naphthalene ring or an anthracene ring, and a naphthalene ring is preferable.
- a 3 represents a divalent to tetravalent perfluorobiphenyl group, j 1 represents the number of bonds between A 1 and A 3, is an integer satisfying 2 ⁇ j 1 ⁇ 4, A 3 is a divalent par It is preferably a fluorobiphenyl group and j 1 is 2.
- j 2 represents the number of sulfonic acid groups bonded to A 2 and is an integer satisfying 1 ⁇ j 2 ⁇ 4, but 2 is preferable.
- a 4 to A 8 are independently of each other a hydrogen atom, a halogen atom, a cyano group, an alkyl group having 1 to 20 carbon atoms, a halogenated alkyl group having 1 to 20 carbon atoms or a carbon number of 2 Represents a halogenated alkenyl group of ⁇ 20, and at least three of A 4 to A 8 are halogen atoms.
- k represents the number of sulfonic acid groups bonded to the naphthalene ring and is an integer satisfying 1 ⁇ k ⁇ 4, preferably 2 to 4, and more preferably 2.
- Examples of the halogenated alkyl group having 1 to 20 carbon atoms include trifluoromethyl group, 2,2,2-trifluoroethyl group, 1,1,2,2,2-pentafluoroethyl group, 3,3,3- Trifluoropropyl group, 2,2,3,3,3-pentafluoropropyl group, 1,1,2,2,3,3,3-heptafluoropropyl group, 4,4,4-trifluorobutyl group, 3,3,4,4,4-pentafluorobutyl group, 2,2,3,3,4,4,4-heptafluorobutyl group, 1,1,2,2,3,3,4,4, Examples include 4-nonafluorobutyl group.
- Examples of the halogenated alkenyl group having 2 to 20 carbon atoms include perfluorovinyl group, 1-perfluoropropenyl group, perfluoroallyl group, perfluorobutenyl group and the like.
- halogen atom and the alkyl group having 1 to 20 carbon atoms include the same ones as described above, but the halogen atom is preferably a fluorine atom.
- a 4 to A 8 are a hydrogen atom, a halogen atom, a cyano group, an alkyl group having 1 to 10 carbon atoms, a halogenated alkyl group having 1 to 10 carbon atoms, or a halogenated alkenyl group having 2 to 10 carbon atoms.
- at least three of A 4 to A 8 are preferably fluorine atoms, hydrogen atom, fluorine atom, cyano group, alkyl group having 1 to 5 carbon atoms, and alkyl fluoride having 1 to 5 carbon atoms.
- a alkenyl fluoride group having 2 to 5 carbon atoms, and at least three of A 4 to A 8 are more preferably a fluorine atom, a hydrogen atom, a fluorine atom, a cyano group, or 1 to 5 carbon atoms. It is even more preferable that the perfluoroalkyl group or the perfluoroalkenyl group having 1 to 5 carbon atoms and A 4 , A 5 and A 8 are fluorine atoms.
- the perfluoroalkyl group is a group in which all hydrogen atoms of the alkyl group are substituted with fluorine atoms
- the perfluoroalkenyl group is a group in which all hydrogen atoms of the alkenyl group are substituted with fluorine atoms.
- the varnish for forming a charge transporting film used in the present invention is used for the purpose of adjusting the physical properties of the charge transporting film obtained from the varnish and other organic silane compounds such as alkoxysilanes such as trimethoxysilane and triethoxysilane. Ingredients may be included.
- the organic solvent contained in the varnish for forming a charge transport film used in the present invention a good solvent that can dissolve the charge transport substance and the dopant substance satisfactorily can be used.
- Examples of such a good solvent include N, N-dimethylformamide, N, N-dimethylacetamide, N, N-dimethylbutyramide, N, N-diethylbutyramide, N, N-methylethylbutyramide, N , N-dimethylisobutyramide, N, N-diethylisobutyramide, N-ethyl-N-methylisobutyramide, N-methylpyrrolidone, 1,3-dimethyl-2-imidazolidinone, and the like, It is not limited to these. These solvents can be used singly or in combination of two or more, and the amount used can be 5 to 100% by mass with respect to the total solvent used. Note that it is preferable that the charge transporting substance, the dopant substance, and the like are completely dissolved in the solvent.
- organic solvents may be included in addition to the above organic solvents for the purpose of improving wettability to the substrate, adjusting the surface tension of the solvent, adjusting the polarity, adjusting the boiling point, and the like.
- Such other organic solvents preferably include glycols, triols, alkylene glycol monoalkyl ethers, alkylene glycol dialkyl ethers, dialkylene glycol monoalkyl ethers, dialkylene glycol dialkyl ethers, glycols , Alkylene glycol monoalkyl ethers, dialkylene glycol monoalkyl ethers and the like, but are not limited thereto.
- These solvents can be used alone or in combination of two or more, and the amount used is determined by the amount of good solvent used together.
- organic solvents other than good solvents include diethylene glycol, triethylene glycol, dipropylene glycol, 1,2-ethanediol, 1,2-propanediol, 1,2-butanediol, and 2,3-butanediol.
- 1,3-butanediol, 1,4-butanediol ethylene glycol monomethyl ether, ethylene glycol monoethyl ether, ethylene glycol propyl ether, ethylene glycol isopropyl ether, ethylene glycol monobutyl ether, ethylene glycol monoisobutyl ether, propylene glycol monomethyl Ether, propylene glycol monoethyl ether, propylene glycol monopropyl ether, propylene glycol monoisopropyl ether, propylene Recall monobutyl ether, propylene glycol monoisobutyl ether diethylene glycol monomethyl ether, diethylene glycol monoethyl ether, diethylene glycol propyl ether, diethylene glycol isopropyl ether, diethylene glycol monobutyl ether, diethylene glycol monoisobutyl ether, dipropylene glycol monomethyl ether, dipropylene glycol monoethyl ether,
- Diethylene glycol triethylene glycol, dipropylene glycol, 1,2- Tandiol, 1,2-propanediol, 1,2-butanediol, 2,3-butanediol, 1,3-butanediol, 1,4-butanediol, ethylene glycol monomethyl ether, propylene glycol monomethyl ether, diethylene glycol monomethyl ether Dipropylene glycol monomethyl ether is more preferable.
- a varnish having desired liquid properties can be easily prepared by selecting a solvent to be used from such solvents while considering the type and amount of the charge transporting material and the dopant material.
- the viscosity of the charge transporting film-forming varnish used in the present invention is appropriately set according to the thickness of the film to be produced and the solid content concentration, but is usually 1 to 50 mPa ⁇ s at 25 ° C., The surface tension is usually 20 to 50 mN / m.
- the solid content concentration for forming the charge transporting film used in the present invention is appropriately set in consideration of the viscosity and surface tension of the varnish, the thickness of the thin film to be produced, etc. In consideration of improving the coatability of the varnish, it is preferably about 0.5 to 10.0% by mass, more preferably about 1.0 to 5.0% by mass.
- solid content here means the charge transport substance and dopant substance contained in the varnish for charge transport film formation used by this invention.
- the content of the dopant substance in the charge transporting film-forming varnish used in the present invention is appropriately set in consideration of the type and amount of the charge transporting substance.
- the amount of the heteropolyacid can be about 0.01 to 50 with respect to the charge transporting substance 1 in terms of mass ratio, preferably 0.1 to 10
- about 1.0, preferably about 1.0 to 5.0 the amount of aryl sulfonic acid can be about 0.1 to 10 with respect to the charge transporting substance 1 in terms of molar ratio, but preferably 1.0.
- the method for preparing the charge transporting film-forming varnish is not particularly limited.
- a method of dissolving a charge transporting substance in a solvent first and adding a dopant substance thereto, a charge transporting substance, A technique for dissolving a mixture of dopant substances in a solvent is mentioned.
- these may be first dissolved in a solvent that dissolves the charge transporting substance and the dopant substance, and another solvent may be added thereto, or a mixed solvent of a plurality of organic solvents.
- the charge transporting substance and the dopant substance may be dissolved sequentially or simultaneously.
- the charge transporting film-forming varnish is prepared by dissolving a charge transporting substance, a dopant substance, etc. in an organic solvent, It is desirable to use and filter.
- the varnish for forming a charge transport film used in the present invention contains only an N, N′-diarylbenzidine derivative as a charge transport material as described above, in other words, the varnish used in the present invention.
- the contained charge transport material component is composed only of N, N′-diarylbenzidine derivatives. In this way, by using only the N, N′-diarylbenzidine derivative, a charge transporting film having excellent charge transportability can be obtained with good reproducibility even in the case of a thick film.
- the production method of the present invention comprises a step of applying the above-described varnish for forming a charge transport film on a substrate.
- a base material means what a varnish is apply
- the varnish coating method include, but are not limited to, a dipping method, a spin coating method, a transfer printing method, a roll coating method, a brush coating method, an ink jet method, a spray method, and a slit coating method. In consideration of obtaining a charge transport film with high reproducibility and high flatness, a spin coating method, an ink jet method, and a spray method are preferable. In addition, it is preferable to adjust the viscosity and surface tension of a varnish according to the coating method.
- the manufacturing method of this invention is equipped with the process of baking the coating film obtained at the above-mentioned process at the baking temperature shown by a following formula (S1).
- a thick charge transporting film can be obtained with good reproducibility regardless of the thickness of the film.
- an organic EL element having excellent durability can be obtained with good reproducibility.
- paragraphs or more in order to express a higher uniform film formability or to advance reaction on a base material.
- the heating may be performed using an appropriate device such as a hot plate or an oven.
- drying temporary firing may be performed at a temperature lower than the firing temperature represented by the above formula mainly for the purpose of removing the solvent.
- the method for producing a charge transporting film of the present invention comprising the steps described above is particularly suitable for producing a charge transporting film having a film thickness in the range of 50 nm to 300 nm. According to the manufacturing method of the present invention, even with such a thickness, a film that has excellent flatness and charge transportability and can realize excellent luminance characteristics when used as a hole injection layer of an organic EL element. It can be obtained with good reproducibility.
- a baking temperature higher than 245 ° C., preferably higher than 250 ° C. is necessary, and when 300 nm, the temperature is higher than 307.5 ° C., preferably higher than 312.5 ° C. A firing temperature is required.
- the lower limit of the film thickness is preferably 70 nm or more, more preferably from the viewpoint of obtaining a film having excellent charge transportability with higher reproducibility than when baking at a temperature lower than the baking temperature represented by the above formula.
- the charge transport film of the present invention can be suitably used as a hole injection layer in an organic EL device, but can also be used as a charge transport function layer such as a hole injection transport layer.
- the organic EL device of the present invention has a pair of electrodes, and has the above-described charge transport film of the present invention between these electrodes.
- Typical configurations of the organic EL element include (a) to (f) below, but are not limited thereto.
- an electron blocking layer or the like can be provided between the light emitting layer and the anode
- a hole (hole) blocking layer or the like can be provided between the light emitting layer and the cathode.
- the hole injection layer, the hole transport layer, or the hole injection transport layer may have a function as an electron block layer or the like
- the electron injection layer, the electron transport layer, or the electron injection transport layer is a hole. It may have a function as a block layer or the like.
- A Anode / hole injection layer / hole transport layer / light emitting layer / electron transport layer / electron injection layer / cathode
- b Anode / hole injection layer / hole transport layer / light emission layer / electron injection transport layer / Cathode
- c anode / hole injection transport layer / light emitting layer / electron transport layer / electron injection layer / cathode
- d anode / hole injection transport layer / light emitting layer / electron injection transport layer / cathode
- e anode / positive Hole injection layer / hole transport layer / light emitting layer / cathode
- f anode / hole injection transport layer / light emitting layer / cathode
- “Hole injection layer”, “hole transport layer” and “hole injection transport layer” are layers formed between a light emitting layer and an anode, and transport holes from the anode to the light emitting layer. It has a function. When only one layer of a hole transporting material is provided between the light emitting layer and the anode, it is a “hole injection transporting layer”, and a layer of the hole transporting material is provided between the light emitting layer and the anode. When two or more layers are provided, the layer close to the anode is a “hole injection layer”, and the other layers are “hole transport layers”.
- the hole injecting layer and the hole injecting and transporting layer are films that are excellent not only in accepting holes from the anode but also injecting holes into the hole transporting layer and the light emitting layer, respectively.
- Electrode “Electron injection layer”, “electron transport layer” and “electron injection transport layer” are layers formed between a light emitting layer and a cathode, and have a function of transporting electrons from the cathode to the light emitting layer. It is. When only one layer of the electron transporting material is provided between the light emitting layer and the cathode, it is an “electron injecting and transporting layer”, and two layers of the electron transporting material are provided between the light emitting layer and the cathode. When provided as described above, the layer close to the cathode is an “electron injection layer”, and the other layers are “electron transport layers”.
- the “light emitting layer” is an organic layer having a light emitting function, and includes a host material and a dopant material when a doping system is employed.
- the host material mainly has a function of encouraging recombination of electrons and holes and confining excitons in the light emitting layer, and the dopant material efficiently emits excitons obtained by recombination. It has a function.
- the host material mainly has a function of confining excitons generated by the dopant in the light emitting layer.
- Examples of materials used and methods for producing an organic EL device having the charge transport film of the present invention include the following, but are not limited thereto.
- the electrode substrate to be used is preferably cleaned in advance by cleaning with a liquid such as a detergent, alcohol, or pure water.
- a liquid such as a detergent, alcohol, or pure water.
- the anode substrate is subjected to surface treatment such as UV ozone treatment or oxygen-plasma treatment immediately before use. It is preferable.
- the surface treatment may not be performed.
- An example of the method for producing the organic EL element of the present invention when the charge transporting film of the present invention is a hole injection layer is as follows.
- a charge transporting film-forming varnish is applied onto the anode substrate and baked to form a hole injection layer on the electrode.
- a hole transport layer, a light emitting layer, an electron transport layer, an electron injection layer, and a cathode are provided in this order.
- the hole transport layer, the light emitting layer, the electron transport layer, and the electron injection layer may be formed by either a vapor deposition method or a coating method (wet process) depending on the characteristics of the material used.
- anode material examples include transparent electrodes typified by indium tin oxide (ITO) and indium zinc oxide (IZO), metal anodes typified by aluminum, alloys thereof, and the like. What performed the chemical conversion process is preferable. Polythiophene derivatives and polyaniline derivatives having high charge transporting properties can also be used.
- metals constituting the metal anode include scandium, titanium, vanadium, chromium, manganese, iron, cobalt, nickel, copper, zinc, gallium, yttrium, zirconium, niobium, molybdenum, ruthenium, rhodium, palladium, cadmium.
- Materials for forming the hole transport layer include (triphenylamine) dimer derivatives, [(triphenylamine) dimer] spirodimers, N, N′-bis (naphthalen-1-yl) -N, N′-bis (Phenyl) -benzidine ( ⁇ -NPD), N, N′-bis (naphthalen-2-yl) -N, N′-bis (phenyl) -benzidine, N, N′-bis (3-methylphenyl)- N, N′-bis (phenyl) -benzidine, N, N′-bis (3-methylphenyl) -N, N′-bis (phenyl) -9,9-spirobifluorene, N, N′-bis ( Naphthalen-1-yl) -N, N′-bis (phenyl) -9,9-spirobifluorene, N, N′-bis (3-methylphenyl) -N, N′-bis (phenyl) -9,9-s
- Materials for forming the light emitting layer include tris (8-quinolinolato) aluminum (III) (Alq 3 ), bis (8-quinolinolato) zinc (II) (Znq 2 ), bis (2-methyl-8-quinolinolato)- 4- (p-phenylphenolate) aluminum (III) (BAlq), 4,4′-bis (2,2-diphenylvinyl) biphenyl, 9,10-di (naphthalen-2-yl) anthracene, 2-t -Butyl-9,10-di (naphthalen-2-yl) anthracene, 2,7-bis [9,9-di (4-methylphenyl) -fluoren-2-yl] -9,9-di (4- Methylphenyl) fluorene, 2-methyl-9,10-bis (naphthalen-2-yl) anthracene, 2- (9,9-spirobifluoren-2-yl) -9,9-spir
- cathode material examples include aluminum, magnesium-silver alloy, aluminum-lithium alloy, lithium, sodium, potassium, cesium and the like.
- the charge transport of the present invention is performed by sequentially forming the hole transport layer and the light emitting layer instead of performing the vacuum deposition operation of the hole transport layer, the light emitting layer, the electron transport layer and the electron injection layer.
- An organic EL element having a conductive film can be manufactured. Specifically, a varnish for forming a charge transporting film is applied on an anode substrate, a hole injection layer is prepared by the above-described method, a hole transport layer and a light emitting layer are sequentially formed thereon, and a cathode electrode is further formed. Is evaporated to obtain an organic EL element.
- the same materials as described above can be used, and the same cleaning treatment and surface treatment can be performed.
- a hole transporting polymer material or a light emitting polymer material, or a material obtained by adding a dopant to these materials is dissolved or uniformly dispersed.
- coating on a positive hole injection layer or a positive hole transport layer is mentioned.
- Examples of the light-emitting polymer material include polyfluorene derivatives such as poly (9,9-dialkylfluorene) (PDAF), poly (2-methoxy-5- (2′-ethylhexoxy) -1,4-phenylenevinylene) (MEH). -PPV) and the like, polythiophene derivatives such as poly (3-alkylthiophene) (PAT), polyvinylcarbazole (PVCz) and the like.
- PDAF poly (9,9-dialkylfluorene)
- MEH 2-methoxy-5- (2′-ethylhexoxy) -1,4-phenylenevinylene
- PVT polythiophene derivatives
- PVCz polyvinylcarbazole
- Examples of the solvent include toluene, xylene, chloroform and the like.
- Examples of the dissolution or uniform dispersion method include methods such as stirring, heating and stirring, and ultrasonic dispersion.
- the coating method is not particularly limited, and examples thereof include an inkjet method, a spray method, a dip method, a spin coating method, a transfer printing method, a roll coating method, and a brush coating.
- the application is preferably performed under an inert gas such as nitrogen or argon.
- the firing method a method of heating with an oven or a hot plate under an inert gas or in a vacuum can be mentioned.
- An example of the method for producing the organic EL device of the present invention when the charge transporting film of the present invention is a hole injection transport layer is as follows.
- a hole injection transport layer is formed on the anode substrate, and a light emitting layer, an electron transport layer, an electron injection layer, and a cathode are provided in this order on the hole injection transport layer. Examples of the formation method and specific examples of the light emitting layer, the electron transport layer, and the electron injection layer are the same as described above.
- Examples of the anode material, the light emitting layer, the luminescent dopant, the material for forming the electron transport layer and the electron block layer, and the cathode material include the same materials as described above.
- a hole block layer, an electron block layer, or the like may be provided between the electrode and any of the layers as necessary.
- a material for forming the electron blocking layer tris (phenylpyrazole) iridium and the like can be given.
- the materials that make up the anode and cathode and the layer formed between them differ depending on whether a device having a bottom mission structure or a top emission structure is manufactured. .
- a transparent anode is used on the substrate side, and light is extracted from the substrate side
- a reflective anode made of metal is used in the opposite direction to the substrate.
- Light is extracted from a certain transparent electrode (cathode) side. Therefore, for example, regarding the anode material, a transparent anode such as ITO is used when manufacturing an element having a bottom emission structure, and a reflective anode such as Al / Nd is used when manufacturing an element having a top emission structure.
- the organic EL device of the present invention may be sealed together with a water catching agent or the like according to a standard method in order to prevent deterioration of characteristics.
- Example 1-1 Fabrication and evaluation of EL element
- the varnish obtained in Preparation Example 1 was coated on the ITO substrate, dried at 120 ° C. for 1 minute, and further baked at 255 ° C. for 15 minutes to form a uniform film having a thickness of 80 nm on the ITO substrate.
- As the ITO substrate a glass substrate of 25 mm ⁇ 25 mm ⁇ 0.7 t in which indium tin oxide (ITO) is patterned on the surface with a film thickness of 150 nm is used, and an O 2 plasma cleaning apparatus (150 W, 30 seconds) before use. To remove impurities on the surface.
- ITO indium tin oxide
- N, N′-di (1-naphthyl) -N, N′-diphenylbenzidine was applied to the ITO substrate on which the film was formed using a vapor deposition apparatus (vacuum degree: 1.0 ⁇ 10 ⁇ 5 Pa).
- NPD tris (8-quinolinolato) aluminum (III) (Alq 3 ), lithium fluoride, and aluminum thin films were sequentially laminated to obtain an organic EL device.
- the deposition rate is 0.2 nm / second for ⁇ -NPD, Alq 3 and aluminum, and 0.02 nm / second for lithium fluoride, and the film thicknesses are 30 nm, 40 nm, and 0.2 nm, respectively.
- Samples 1-2 to 1-4 A device was obtained in the same manner as Sample 1-1 except that the firing temperature was 260 ° C., 265 ° C., and 270 ° C., respectively.
- Example 2-1 to 2-3 A device was obtained in the same manner as Comparative Sample 1 except that the firing temperature was 260 ° C., 265 ° C., and 270 ° C., respectively.
- Examples 3-1 and 3-2 A device was obtained in the same manner as in Comparative Sample 2, except that the firing temperature was 265 ° C. and 270 ° C., respectively.
- the luminance was measured when the obtained element was driven at 5V. The results are shown in Table 1.
- the luminance half-life (initial luminance: 5000 cd / m 2 ) of the obtained device was measured. The results are shown in Table 2.
- the above-described varnish for forming a charge transport film used in the present invention has a firing temperature satisfying the formula of firing temperature> [232.5 ° C. + (The film thickness / 20 nm) ⁇ 5 ° C.].
- firing temperature is 255 ° C.
- the initial luminance characteristics are excellent when the thickness of the hole injection layer is 80 nm, but the initial luminance characteristics are inferior when the thickness is 100 nm.
- the firing temperature was 260 ° C.
- the initial luminance characteristics were excellent when the thickness was 80 nm and 100 nm, but the initial luminance characteristics were inferior when the thickness was 120 nm.
- the initial luminance characteristics were excellent when the thickness was 80 nm and 100 nm, and the luminance characteristics were good when the thickness was 120 nm.
- the firing temperature was 270 ° C.
- the luminance characteristics were excellent when the thickness was 80 nm, 100 nm, or 120 nm.
- Table 2 in particular, when firing at a firing temperature satisfying the formula: firing temperature> [237.5 ° C. + (The film thickness / 20 nm) ⁇ 5 ° C.], an element excellent in luminance life is obtained. I was able to get it. That is, when the firing temperature is 260 ° C.
- the thickness is 80 nm
- the firing temperature is 265 ° C. and the thickness is 80 nm and 100 nm
- the firing temperature is 270 ° C. and the thickness is 80 nm, 100 nm, and 120 nm
- the initial luminance An element having excellent characteristics and luminance life was obtained.
- the firing temperature was 255 ° C. and the thickness was 80 nm
- the firing temperature was 260 ° C. and the thickness was 100 nm
- the firing temperature was 265 ° C. and the thickness was 120 nm. In this case, as described above, only an element having excellent initial luminance characteristics but inferior luminance life was obtained.
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Abstract
Description
しかし、正孔注入層用のウェットプロセス材料に関しては常に改善が求められており、特に、電荷輸送性に優れた薄膜を与えるウェットプロセス材料が求められている。
トップエミッション構造の素子は、ボトムエミッション構造の素子のように基板側から光が取り出されるものではないため、発光層からの光がTFTで遮られるという問題がなく、したがって、トップエミッション構造の素子では高い開口率を保持できるという利点がある。その結果、光取り出し効率が向上し、素子の低消費電力化や長寿命化が図れることから、近年、トップエミッション構造の素子が注目を集めている。
焼成温度>[232.5℃+(前記膜厚/20nm)×5℃] (S1)
焼成温度>[237.5℃+(前記膜厚/20nm)×5℃] (S2)
焼成温度>[232.5℃+(前記膜厚/20nm)×5℃] (S1)
焼成温度>[237.5℃+(前記膜厚/20nm)×5℃] (S2)
本発明に係る電荷輸送性膜の電荷輸送性の向上方法によれば、厚膜の電荷輸送性膜の電荷輸送性を、効果的に向上させることができる。
本発明の電荷輸送性膜の製造方法では、N,N’-ジアリールベンジジン誘導体のみからなる電荷輸送性物質と、ドーパント物質と、有機溶媒とを含む電荷輸送性膜形成用ワニスを用いる。
N,N’-ジアリールベンジジン誘導体におけるN位のアリール基およびN'位のアリール基は、同一の基であることが好ましい。
これらの中でも、N,N’-ジフェニルベンジジン、N,N’-ジ(1-ナフチル)ベンジジン、N,N’-ジ(2-ナフチル)ベンジジンが好ましく、得られる膜の透明性を考慮すると、N,N’-ジフェニルベンジジンが最適である。
特に無機系のドーパント物質としては、ヘテロポリ酸が好ましい。
ヘテロポリ酸とは、代表的に式(D1)で示されるKeggin型あるいは式(D2)で示されるDawson型の化学構造で示される、ヘテロ原子が分子の中心に位置する構造を有し、バナジウム(V)、モリブデン(Mo)、タングステン(W)等の酸素酸であるイソポリ酸と、異種元素の酸素酸とが縮合してなるポリ酸である。このような異種元素の酸素酸としては、主にケイ素(Si)、リン(P)、ヒ素(As)の酸素酸が挙げられる。
特に、1種類のヘテロポリ酸を用いる場合、その1種類のヘテロポリ酸は、リンタングステン酸またはリンモリブデン酸が好ましく、リンタングステン酸が最適である。また、2種類以上のヘテロポリ酸を用いる場合、その2種類以上のヘテロポリ酸の1つは、リンタングステン酸またはリンモリブデン酸が好ましく、リンタングステン酸がより好ましい。
すなわち、例えば、一般的には、リンタングステン酸は化学式H3(PW12O40)・nH2Oで、リンモリブデン酸は化学式H3(PMo12O40)・nH2Oでそれぞれ示されるが、定量分析において、この式中のP(リン)、O(酸素)またはW(タングステン)もしくはMo(モリブデン)の数が多いもの、または少ないものであっても、それが市販品として入手したもの、あるいは、公知の合成方法にしたがって適切に合成したものである限り、本発明において用いることができる。この場合、本発明に規定されるヘテロポリ酸の質量とは、合成物や市販品中における純粋なリンタングステン酸の質量(リンタングステン酸含量)ではなく、市販品として入手可能な形態および公知の合成法にて単離可能な形態において、水和水やその他の不純物等を含んだ状態での全質量を意味する。
なお、電荷輸送性物質、ドーパント物質等は、いずれも上記溶媒に完全に溶解していることが好ましい。
特に、ドーパント物質としてヘテロポリ酸が含まれる場合、ヘテロポリ酸の量は、質量比で、電荷輸送性物質1に対して0.01~50程度とすることができるが、好ましくは0.1~10程度、より好ましくは1.0~5.0程度である。また、ドーパント物質としてアリールスルホン酸が含まれる場合、アリールスルホン酸の量は、モル比で、電荷輸送性物質1に対して0.1~10程度とすることができるが、好ましくは1.0~5.0程度である。
また、例えば、有機溶媒が複数ある場合は、電荷輸送性物質およびドーパント物質をよく溶解する溶媒に、まずこれらを溶解させ、そこへその他の溶媒を加えてもよく、複数の有機溶媒の混合溶媒に、電荷輸送性物質およびドーパント物質を順次、あるいはこれらを同時に溶解させてもよい。
ワニスの塗布方法としては、ディップ法、スピンコート法、転写印刷法、ロールコート法、刷毛塗り、インクジェット法、スプレー法、スリットコート等が挙げられるが、これらに限定されない。塗布方法は、再現性よく平坦性の高い電荷輸送膜を得ることを考慮すると、スピンコート法、インクジェット法、スプレー法が好ましい。なお、塗布方法に応じて、ワニスの粘度及び表面張力を調節することが好ましい。
焼成温度>[232.5℃+(膜厚/20nm)×5℃] (S1)
焼成温度>[237.5℃+(膜厚/20nm)×5℃] (S2)
また、上記式で示される焼成温度で焼成する前に、上記式で示される焼成温度よりも低い温度で、主に溶媒の除去等を目的として、乾燥(仮焼成)をしてもよい。
(a)陽極/正孔注入層/正孔輸送層/発光層/電子輸送層/電子注入層/陰極
(b)陽極/正孔注入層/正孔輸送層/発光層/電子注入輸送層/陰極
(c)陽極/正孔注入輸送層/発光層/電子輸送層/電子注入層/陰極
(d)陽極/正孔注入輸送層/発光層/電子注入輸送層/陰極
(e)陽極/正孔注入層/正孔輸送層/発光層/陰極
(f)陽極/正孔注入輸送層/発光層/陰極
(1)基板洗浄:長州産業(株)製 基板洗浄装置(減圧プラズマ方式)
(2)ワニスの塗布:ミカサ(株)製 スピンコーターMS-A100
(3)膜厚測定:(株)小坂研究所製 微細形状測定機サーフコーダET-4000
(4)EL素子の作製:長州産業(株)製 多機能蒸着装置システムC-E2L1G1-N
(5)EL素子の輝度等の測定:(有)テック・ワールド製 I-V-L測定システム
(6)EL素子の寿命測定(半減期の測定):(株)イーエッチシー製 有機EL輝度寿命評価システムPEL-105S
[調製例1]
N,N'-ジフェニルベンジジン 0.851gと、式(b-1)で表されるアリールスルホン酸化合物 1.191gと、リンタンクグステン酸(関東化学(株)製) 0.511gとを、N,N'-ジメチルイミダゾリジノン 20gに溶解させた。得られた溶液に、トリエチレングリコールモノメチルエーテル 12gと、へキシレングリコール 8gとを加えて撹拌し、ワニスを得た。なお、当該アリールスルホン酸は、国際公開第2006/025342号に従って合成した。
[サンプル1-1]
調製例1で得られたワニス、ITO基板上に塗布した後、120℃で1分間乾燥し、更に、255℃で15分間焼成し、ITO基板上に厚さ80nmの均一な膜を形成した。ITO基板としては、インジウム錫酸化物(ITO)が表面上に膜厚150nmでパターニングされた25mm×25mm×0.7tのガラス基板を用い、使用前にO2プラズマ洗浄装置(150W、30秒間)によって表面上の不純物を除却した。
次いで、膜を形成したITO基板に対し、蒸着装置(真空度1.0×10-5Pa)を用いてN,N'-ジ(1-ナフチル)-N,N'-ジフェニルベンジジン(α-NPD)、トリス(8-キノリノラート)アルミニウム(III)(Alq3)、フッ化リチウム、及びアルミニウムの薄膜を順次積層し、有機EL素子を得た。この際、蒸着レートは、α-NPD、Alq3及びアルミニウムについては0.2nm/秒、フッ化リチウムについては0.02nm/秒の条件でそれぞれ行い、膜厚は、それぞれ30nm、40nm、0.5nm及び100nmとした。
なお、空気中の酸素、水等の影響による特性劣化を防止するため、EL素子は封止基板により封止した後、その特性を評価した。封止は、以下の手順で行った。
酸素濃度2ppm以下、露点-85℃以下の窒素雰囲気中で、EL素子を封止基板の間に収め、封止基板を接着材((株)MORESCO製モレスコモイスチャーカットWB90US(P))により貼り合わせた。この際、捕水剤(ダイニック(株)製HD-071010W-40)をEL素子と共に封止基板内に収めた。貼り合わせた封止基板に対し、UV光を照射(波長365nm、照射量6,000mJ/cm2)した後、80℃で1時間、アニーリング処理して接着材を硬化させた。
焼成温度を、それぞれ260℃、265℃、270℃とした以外は、サンプル1-1と同様の方法で素子を得た。
ITO基板上に形成する膜の厚さを100nmとした以外は、サンプル1-1と同様の方法で素子を得た。
焼成温度を、それぞれ260℃、265℃、270℃とした以外は、比較サンプル1と同様の方法で素子を得た。
焼成温度を260℃とし、ITO基板上に形成する膜の厚さを120nmとした以外は、サンプル1-1と同様の方法で素子を得た。
焼成温度を、それぞれ265℃、270℃とした以外は、比較サンプル2と同様の方法で素子を得た。
この中でも、表2に示される通り、特に、焼成温度>[237.5℃+(前記膜厚/20nm)×5℃]という式を満たす焼成温度で焼成した場合、輝度寿命にも優れる素子を得ることができた。すなわち、焼成温度が260℃で厚さが80nmの場合、焼成温度が265℃で厚さが80nm及び100nmの場合、並びに焼成温度が270℃で厚さが80nm、100nm及び120nmの場合、初期輝度特性と輝度寿命に優れる素子を得られたが、焼成温度が255℃で厚さが80nmの場合、焼成温度が260℃で厚さが100nmの場合、並びに焼成温度が265℃で厚さが120nmの場合、上述の通りに初期輝度特性には優れるが、輝度寿命は劣る素子しか得られなかった。
Claims (11)
- 50nm~300nmの範囲内の膜厚を有する電荷輸送性膜の製造方法であって、
N,N’-ジアリールベンジジン誘導体のみからなる電荷輸送性物質と、ドーパント物質と、有機溶媒とを含む電荷輸送性膜形成用ワニスを基材上に塗布する工程と、
得られた塗膜を式(S1)で示される焼成温度で焼成する工程と、を備えることを特徴とする電荷輸送性膜の製造方法。
焼成温度>[232.5℃+(前記膜厚/20nm)×5℃] (S1) - 前記焼成温度が、式(S2)で示される請求項1に記載の電荷輸送性膜の製造方法。
焼成温度>[237.5℃+(前記膜厚/20nm)×5℃] (S2) - 前記ドーパント物質が、アリールスルホン酸化合物を含む請求項1又は2記載の電荷輸送性膜の製造方法。
- 前記ドーパント物質が、ヘテロポリ酸を含む請求項1~3のいずれか1項記載の電荷輸送性膜の製造方法。
- 前記N,N’-ジアリールベンジジン誘導体が、N,N’-ジフェニルベンジジンである請求項1~4のいずれか1項記載の電荷輸送性膜の製造方法。
- 請求項1~5のいずれか1項記載の電荷輸送性膜の製造方法で製造されたことを特徴とする電荷輸送性膜。
- 請求項6記載の電荷輸送性膜を有することを特徴する有機エレクトロルミネッセンス素子。
- 前記電荷輸送性膜が、正孔注入層、正孔輸送層または正孔注入輸送層である請求項7記載の有機エレクトロルミネッセンス素子。
- 請求項1~5のいずれか1項記載の電荷輸送性膜の製造方法を含むことを特徴とする有機エレクトロルミネッセンス素子の製造方法。
- N,N’-ジアリールベンジジン誘導体のみからなる電荷輸送性物質と、ドーパント物質と、有機溶媒とを含む電荷輸送性膜形成用ワニスから得られる、50nm~300nmの範囲内の膜厚を有する電荷輸送性膜の電荷輸送性の向上方法であって、
前記電荷輸送性膜形成用ワニスから得られる塗膜を式(S1)で示される焼成温度で焼成する工程と、を備えることを特徴する電荷輸送性膜の電荷輸送性の向上方法。
焼成温度>[232.5℃+(前記膜厚/20nm)×5℃] (S1) - 前記焼成温度が、式(S2)で示される請求項10に記載の電荷輸送性膜の電荷輸送性の向上方法。
焼成温度>[237.5℃+(前記膜厚/20nm)×5℃] (S2)
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| JP2017514062A JP6521270B2 (ja) | 2015-04-22 | 2016-04-07 | 電荷輸送性膜の製造方法、電荷輸送性膜、有機エレクトロルミネッセンス素子、有機エレクトロルミネッセンス素子の製造方法 |
| KR1020177032776A KR102355334B1 (ko) | 2015-04-22 | 2016-04-07 | 전하 수송성막의 제조 방법, 전하 수송성막, 유기 일렉트로루미네선스 소자, 유기 일렉트로루미네선스 소자의 제조 방법, 전하 수송성막의 전하 수송성의 향상 방법 |
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| CN107535031B (zh) | 2019-03-01 |
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| JP6521270B2 (ja) | 2019-05-29 |
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