WO2016070739A1 - 多能谱x射线光栅成像系统与成像方法 - Google Patents
多能谱x射线光栅成像系统与成像方法 Download PDFInfo
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- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
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- G01N23/046—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and forming images of the material using tomography, e.g. computed tomography [CT]
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- A61B6/00—Apparatus or devices for radiation diagnosis; Apparatus or devices for radiation diagnosis combined with radiation therapy equipment
- A61B6/42—Arrangements for detecting radiation specially adapted for radiation diagnosis
- A61B6/4208—Arrangements for detecting radiation specially adapted for radiation diagnosis characterised by using a particular type of detector
- A61B6/4241—Arrangements for detecting radiation specially adapted for radiation diagnosis characterised by using a particular type of detector using energy resolving detectors, e.g. photon counting
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- A—HUMAN NECESSITIES
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- A61B6/00—Apparatus or devices for radiation diagnosis; Apparatus or devices for radiation diagnosis combined with radiation therapy equipment
- A61B6/42—Arrangements for detecting radiation specially adapted for radiation diagnosis
- A61B6/4291—Arrangements for detecting radiation specially adapted for radiation diagnosis the detector being combined with a grid or grating
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- A—HUMAN NECESSITIES
- A61—MEDICAL OR VETERINARY SCIENCE; HYGIENE
- A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
- A61B6/00—Apparatus or devices for radiation diagnosis; Apparatus or devices for radiation diagnosis combined with radiation therapy equipment
- A61B6/48—Diagnostic techniques
- A61B6/482—Diagnostic techniques involving multiple energy imaging
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- A—HUMAN NECESSITIES
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- A61B6/00—Apparatus or devices for radiation diagnosis; Apparatus or devices for radiation diagnosis combined with radiation therapy equipment
- A61B6/48—Diagnostic techniques
- A61B6/484—Diagnostic techniques involving phase contrast X-ray imaging
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- G—PHYSICS
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- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N23/00—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00
- G01N23/02—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material
- G01N23/06—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption
- G01N23/083—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the radiation being X-rays
- G01N23/087—Investigating or analysing materials by the use of wave or particle radiation, e.g. X-rays or neutrons, not covered by groups G01N3/00 – G01N17/00, G01N21/00 or G01N22/00 by transmitting the radiation through the material and measuring the absorption the radiation being X-rays using polyenergetic X-rays
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- A—HUMAN NECESSITIES
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- A61B—DIAGNOSIS; SURGERY; IDENTIFICATION
- A61B6/00—Apparatus or devices for radiation diagnosis; Apparatus or devices for radiation diagnosis combined with radiation therapy equipment
- A61B6/02—Arrangements for diagnosis sequentially in different planes; Stereoscopic radiation diagnosis
- A61B6/03—Computed tomography [CT]
- A61B6/032—Transmission computed tomography [CT]
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- A61B6/40—Arrangements for generating radiation specially adapted for radiation diagnosis
- A61B6/4035—Arrangements for generating radiation specially adapted for radiation diagnosis the source being combined with a filter or grating
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- A61B6/46—Arrangements for interfacing with the operator or the patient
- A61B6/461—Displaying means of special interest
- A61B6/463—Displaying means of special interest characterised by displaying multiple images or images and diagnostic data on one display
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- G01N2223/40—Imaging
- G01N2223/401—Imaging image processing
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- G—PHYSICS
- G01—MEASURING; TESTING
- G01N—INVESTIGATING OR ANALYSING MATERIALS BY DETERMINING THEIR CHEMICAL OR PHYSICAL PROPERTIES
- G01N2223/00—Investigating materials by wave or particle radiation
- G01N2223/40—Imaging
- G01N2223/408—Imaging display on monitor
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- G—PHYSICS
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- G01N2223/60—Specific applications or type of materials
- G01N2223/605—Specific applications or type of materials phases
Definitions
- the invention relates to an X-ray grating imaging technology, in particular to a multi-energy spectral X-ray grating imaging system and an imaging method.
- Phase contrast imaging reveals the internal structure of an object by capturing the phase shift information of the X-rays to observe changes in the electron density inside the object.
- phase contrast imaging methods have emerged to enhance the low contrast resolution of a radiation image by utilizing interference or diffraction phenomena of coherent or partially coherent X-rays.
- the publication number is "CN101532969A”
- the name is "X-ray grating phase contrast imaging system and method” (Patent Document 1)
- Patent Document 1 the publication number is "CN101726503A”
- the invention name is "X-ray phase contrast chromatography”.
- Dark field imaging is a technique of imaging a material using indirect light such as scattered light, diffracted light, refracted light, and fluorescence, and imaging the internal structure of the substance by utilizing the difference in X-ray scattering ability of the substance.
- dark field imaging due to the unique optical properties of hard X-rays, the required optical components are very difficult to fabricate, so hard field imaging of hard X-rays has been difficult to achieve better.
- the hard-field X-ray field imaging technique has unique advantages over brightfield imaging and phase contrast imaging in the ability to resolve and detect fine structures inside the material.
- X-rays are emitted to the object to be measured; one of the two absorption gratings is stepped in at least one cycle; in each step, the detector receives the X-rays and converts them into electrical signals; after at least one cycle Stepping, the X-ray intensity at each pixel on the detector is expressed as a light intensity curve; according to the light intensity curve at each pixel point on the detector and the light intensity curve in the absence of the detected object Contrast, the second moment of the scattering angle distribution of each pixel is calculated; the image of the object is taken at multiple angles, and then the scattering information image of the object can be obtained according to the CT reconstruction algorithm.
- the aforementioned raster imaging technique it is necessary to measure the light intensity curve of each detecting unit (pixel point) on the detector by using a stepping technique.
- the basic principle of the stepping technique utilized is that after the source grating is fixed next to the X-ray source, in the technique based on the Talbot-Lau interferometry, the phase grating or the analytic grating moves relatively parallel in a grating period. In the technique based on the classical optical method, the two absorption gratings move relatively in parallel for several steps in one grating period. One image is captured for each translation of the detector.
- the refractive image information, the attenuation image information, and the dark field image information can be calculated by comparing the difference between the sample intensity curve and the background light intensity curve corresponding to each pixel point.
- Conventional stepping techniques are generally flat shift phase gratings or analytical or absorption gratings.
- the public number was "CN102221565A”, the patent name of which is the "X-ray source grating stepping imaging system and imaging method" (Patent Document 4), the entire contents of which are hereby incorporated by reference in its entirety in the application, A method of stepping the X-ray source grating is proposed.
- the period of the source grating is on the order of several tens of micrometers, the stepping accuracy requirement is greatly reduced compared to the conventional stepping method.
- a conventional energy deposition type X-ray detector which has a wide energy for a conventional X-ray source (for example, a conventional X-ray machine, a distributed X-ray source, an X-ray accelerator, etc.).
- Spectral X-rays can only obtain the energy response in the weighted average sense of the scanned object, and will cause problems such as ray hardening, and at the same time can not effectively identify the material composition.
- the embodiment of the present application proposes a multi-energy spectral X-ray grating imaging realized by a non-coherent method.
- System and imaging method which uses a spectrally resolved X-ray detector to detect different energy segments of a broad spectrum X-ray energy range produced by a conventional X-ray source (X-ray energy range is 0 to beam energy) Value).
- X-ray energy range is 0 to beam energy
- the embodiments of the present application can improve the problem of energy spectrum hardening, and can image objects of different energy segments, obtain information of energy dimensions, and realize recognition of material components.
- One aspect of the present invention provides a multi-spectral X-ray raster imaging system having:
- An incoherent X-ray source for emitting X-rays for illuminating an object to be detected
- a grating module comprising a first absorption grating and a second absorption grating arranged in parallel with each other and sequentially arranged in an X-ray propagation direction;
- a spectrally resolved X-ray detector for receiving X-rays passing through the first and second absorption gratings.
- the grating module is configured such that one of the first absorption grating and the second absorption grating performs a phase stepping operation in at least one period of time .
- the incoherent X-ray source emits X-rays to illuminate an object to be detected
- the energy spectrum-resolving X-ray detector receives X-rays X-ray energy spectrum resolution.
- the intensity of the X-rays of each energy segment at each pixel point of the energy spectrum resolved X-ray detector is represented as a light intensity curve.
- the invention innovatively combines a spectrally resolved X-ray detection technique with a raster imaging technique.
- the invention can fully utilize the superiority of the grating imaging technology, for example, obtaining three kinds of information indicating attenuation, dark field and phase contrast of the internal information of the substance in one scanning process, and can more comprehensively reflect the internal structure information and composition information of the object.
- the invention can combine the pluripotency spectrum analysis technology to eliminate the deficiencies in the original imaging mode, and at the same time exert the advantages of the multi-energy spectrum to bring more information, realize the recognition of the material components, and thus can be used in medical imaging, security inspection, etc.
- a multifaceted field plays a huge role.
- the invention can eliminate the adverse influence of the wide-spectrum X-ray source on the grating imaging technology, solve the inherent problems such as the radiation hardening, greatly improve the signal-to-noise ratio of the image, and at the same time realize the recognition of the material composition.
- the present invention enables high-contrast imaging of weakly absorbing substances (for example, soft tissues such as breast, blood vessels, and muscles, fibrous materials, insects, etc.).
- the invention can greatly improve the image signal-to-noise ratio and solve the problem of the radiation hardening, and can simultaneously realize the linear attenuation coefficient, the phase factor and the generalized scattering coefficient of the scanned sample with the change of the X-ray energy. Identification of material components.
- the invention will open up new ideas and approaches for phase contrast imaging in the fields of medicine, biology and industrial materials, and has great practical significance and application value.
- a source grating disposed between the incoherent X-ray source and the detected object near the incoherent X-ray source The position is movable in a direction parallel to the first and second absorption gratings.
- the grating module is configured such that the first and second absorption gratings are stationary, and the source grating is configured to be capable of performing a stepping motion over at least one period of time.
- the incoherent X-ray source emits X-rays to illuminate the detected object
- the spectrally resolved X-ray detector receives X-rays and spectrally resolves the X-rays.
- the intensity of the X-rays of each energy segment at each pixel point of the energy spectrum resolved X-ray detector is represented as a light intensity curve.
- the actuating device is capable of rotating the detected object relative to the multi-spectral X-ray raster imaging system by a certain angle.
- a phase stepping process of one cycle is repeated, and then the image is reconstructed according to a predetermined CT image reconstruction algorithm. Detect an image of an object.
- the multi-spectral X-ray raster imaging system is provided with a computer workstation, and the computer workstation is provided with: a data processing module for processing data information. And calculating a pixel value of each point on the detected object; an image reconstruction module, configured to reconstruct an image of the detected object according to the calculated pixel value; and a control module, configured to control the non-coherent An X-ray source, a grating module, and the energy spectrum resolved X-ray detector.
- the computer workstation is provided with a display unit for displaying an image of the detected object.
- the computer workstation is capable of comparing a light intensity curve of the detected object from a background light intensity curve of the object to be detected The refraction information of the X-ray at a predetermined point on the detected object is calculated, and the corresponding pixel value is calculated therefrom.
- the computer workstation is capable of comparing a light intensity curve of the detected object from a background light intensity curve of the object to be detected The scattering information of the X-ray at a predetermined point on the detected object is calculated, and the corresponding pixel value is calculated therefrom.
- the computer workstation is capable of comparing a light intensity curve of the detected object from a background light intensity curve of the object to be detected The attenuation information of the predetermined point of the X-ray on the detected object is calculated, and the corresponding pixel value is calculated therefrom.
- an aspect of the present invention provides an X-ray raster imaging method having the following steps:
- One of the first absorption grating and the second absorption grating arranged in parallel with each other and sequentially arranged in the X-ray propagation direction performs a phase stepping operation in at least one period of time, wherein each phase a stepping process in which an X-ray is irradiated to an object to be detected by an incoherent X-ray source, and X-rays passing through the first and second absorption gratings are received by an energy spectrum-resolving X-ray detector and spectrally resolved by energy spectrum ;
- the intensity of the X-rays of each energy segment at each pixel point of the energy spectrum resolved X-ray detector is represented as a light intensity curve
- Image information of the detected object is obtained based on the pixel value.
- the object to be detected is rotated, and the phase stepping action is repeated at each of the rotation angles, and then reconstructed according to a predetermined CT image reconstruction algorithm. An image of the detected object.
- X-rays are calculated from the comparison of the light intensity curve of the detected object and the background light intensity curve of the object not detected. Refraction information of a predetermined point on the detected object, and thereby calculating a corresponding pixel value.
- X-rays are calculated from the comparison of the light intensity curve of the detected object and the background light intensity curve of the object not detected. Scattering information of a predetermined point on the detected object, and thereby calculating a corresponding pixel value.
- X-rays are calculated from the comparison of the light intensity curve of the detected object and the background light intensity curve of the object not detected. Attenuation information of a predetermined point on the detected object, and thereby calculating a corresponding pixel value.
- a multi-spectral X-ray grating imaging system is implemented by a non-coherent method, and a spectrally resolved X-ray detector is used to detect different energy segments of a broad spectrum X-ray energy range generated by a conventional X-ray source.
- the X-ray energy range is from 0 to the set value of the beam energy.
- the invention transforms the disadvantage of the multi-energy spectrum in the imaging of the energy deposition detector into the advantage of the image spectrum detector, and takes advantage of the more information brought by the multi-energy spectrum to realize the identification of the material composition. It has high practical value in medical imaging, safety inspection and other fields.
- FIG. 1 is a schematic diagram of a multi-energy spectral X-ray raster imaging system in accordance with one embodiment of the present invention.
- FIG. 2 is a schematic diagram of a light intensity curve obtained by a step-and-scan process, in accordance with one embodiment of the present invention.
- Figure 3 is a graph showing the relationship between the phase factor of water and polypropylene interacting with X-rays and X-ray energy.
- FIG. 5 is a flow chart of a method of imaging detection of an object using X-rays, in accordance with an embodiment of the present invention.
- FIG. 6 is a schematic illustration of an application example in accordance with the present invention.
- Fig. 7 is a schematic view showing another application example according to the present invention.
- FIG. 8 is a schematic illustration of another application example in accordance with the present invention.
- a multi-spectral X-ray grating imaging system includes an X-ray source S, a grating module P, and a spectrally resolved X-ray detector.
- the X-ray source S is for emitting an X-ray beam (for example, a broad spectrum X-ray) to the object to be detected (ie, the scanning object W in FIG. 1).
- a multi-slot collimator ie, source grating G0
- source grating G0 may be disposed to generate a set of small focus line sources to generate an object to be detected when the X-ray source is a large focus source.
- Shoot the X-ray beam As shown in FIG. 1, in the case where the source grating G0 is disposed, the source grating G0 is disposed at a position close to the X-ray source S between the X-ray source S and the detected object.
- the grating module P comprises a first absorption grating G1 and a second absorption grating G2, which are parallel to each other and are sequentially located in the X-ray propagation direction.
- X-rays that are refracted and scattered by the detected object form an X-ray signal of varying intensity via the first absorption grating G1 and the second absorption grating G2.
- the energy spectrum resolved X-ray detector is configured to receive the above-mentioned intensity-changing X-ray signal (for example, broad-spectrum X-ray), convert the X-ray signal into an electrical signal, and realize the resolution of the X-ray energy to obtain a plurality of energies. Information.
- the X-ray source S may be an incoherent X-ray source.
- the object to be detected i.e., the scanning object W in Fig. 1
- the object to be detected is disposed between the X-ray source S and the first absorption grating G1.
- the detected object is disposed between the source grating G0 and the first absorption grating G1.
- the multi-spectral X-ray raster imaging system of the present invention may also include a computer workstation.
- the computer workstation controls the X-ray source, the grating module, and the spectrally resolved X-ray detector to implement a process in which the grating module performs a phase stepping process (ie, the first absorption grating G1 and the second absorption grating G2 perform phase steps)
- a phase stepping process ie, the first absorption grating G1 and the second absorption grating G2 perform phase steps
- X-rays are emitted from the X-ray source at each step, X-rays are received by the energy-resolving X-ray detector, the received X-rays are converted into electrical signals, and the energy spectrum is resolved by X-rays.
- the intensity of the X-rays of each energy segment at each pixel point of the spectrally resolved X-ray detector can be expressed as A light intensity curve (shown in Figure 2, the light intensity curve for a certain energy segment is shown in Figure 2). Comparing the intensity curve at each pixel point of the spectrally resolved X-ray detector with the intensity curve in the absence of the detected object (wherein the intensity curve in the absence of the detected object is known) The pixel value of each pixel is calculated from the change of the light intensity curve, thereby obtaining three kinds of information of the attenuation image, the phase contrast image and the dark field image reflecting the structure information of the substance.
- the phase stepping operation of the grating module P can be performed in the same manner as in the related art (for example, Patent Documents 1 to 3). Further, the process of performing the phase stepping operation by the source grating G0 can also be performed in the same manner as in the related art (for example, Patent Document 4).
- the first absorption grating G1 and the second absorption grating G2 may be fixed, so that the source grating G0 enters at least one period. The stepping action is performed.
- each phase stepping process the X-ray source S emits X-rays to illuminate the detected object, and the spectrally resolved X-ray detector receives the X-rays and performs energy spectrum discrimination on the X-rays, after one cycle.
- the phase stepping process and data acquisition the intensity of the X-rays of each energy segment at each pixel point of the spectrally resolved X-ray detector is expressed as a light intensity curve.
- the first absorption grating G1 and the second absorption grating G2 may be parallel to each other with a distance D therebetween, and the distance between the X-ray source S and the grating G1 is L.
- the periods of the first absorption grating G1 and the second absorption grating G2 are generally between 0.1 and 30 ⁇ m.
- the grating uses heavy metals as the absorbing material, such as gold (Au).
- Au gold
- the height of gold as the absorbing material is determined by the energy of the X-rays used, and is usually between 10 and 100 microns. For example, for 20 keV X-rays, gold can block 90% of X-rays when the height is greater than 16 microns.
- the detector used in the present invention is a spectrally resolved X-ray detector capable of receiving a broad-spectrum X-ray of varying intensity, converting an X-ray signal into an electrical signal, and realizing X-ray energy. Distinguish and obtain information under multiple energies.
- the discrimination of wide-spectrum X-rays can be performed by the same method as in the prior art. However, it is not limited thereto, and other types of X-ray detectors may be used as long as the above functions can be realized.
- control, data transmission, image reconstruction, and data processing of the entire imaging system can be performed by a computer workstation.
- Scanning control information, position information, projection data, and the like are input to a computer workstation through a data acquisition system.
- the computer workstation completes the extraction of various information of the object, data preprocessing and image reconstruction, and finally displays it on the display.
- the computer workstation can include a data processing module.
- the data processing module can be configured to calculate a change in light intensity (curve) of the X-ray after passing the detected object through the digitally processable electrical signal output from the spectrally resolved X-ray detector, and pass the light
- the strong (curve) change calculates the absorption information, the scattering information, or the refraction information of the X-ray at a certain point on the detected object, and uses the information to calculate the pixel information of the detected object.
- These functions can also be implemented by programmed software or, alternatively, by a dedicated hardware chipset.
- the computer workstation may further include a control module (not shown in FIG. 1) for controlling the X-ray source S, the detected object W, the first and second absorption gratings G1, G2, and the energy spectrum resolution type. Operation of an X-ray detector or the like, such as relative rotation, X-ray emission, and information acquisition.
- the control module and the data processing module can be integrated into one, implemented by a single general purpose or special purpose processor.
- the computer workstation may further include an imaging module (not shown in FIG. 1) that reconstructs an image of the detected object based on the obtained pixel information and outputs the display.
- the imaging module can be implemented by a processor that is also a data processing module.
- the multi-spectral X-ray raster imaging system of the present invention may further comprise an actuating device capable of rotating the detected object relative to the multi-spectral X-ray raster imaging system at an angle under the control of the computer workstation. At each rotation angle, the phase stepping process is repeated to derive X-ray imaging pixel values at a plurality of angles, and then the stereoscopic image of the detected object is reconstructed according to a predetermined CT image reconstruction algorithm.
- the actuating device has a structure capable of achieving relative rotation of the detected object.
- the computer workstation can include a display unit for displaying the reconstructed image.
- the display unit can be implemented by a universal display.
- ⁇ is called the phase factor and is related to the phase shifting cross section of the substance; ⁇ is called the absorption factor and is related to the linear attenuation coefficient of the matter to the ray. Both ⁇ and ⁇ are related to X-ray energy.
- Fig. 3 and Fig. 4 the relationship between phase factor and polypropylene interacting with X-ray and X-ray energy.
- Figure 4 is a graph showing the relationship between the absorption factor of water and polypropylene interacting with X-rays and X-ray energy.
- both the phase factor and the absorption factor decrease as the X-ray energy increases.
- the traditional energy deposition type X-ray detector can not reflect this energy correlation, and obtains the average value under the broad energy spectrum, and there are problems such as X-ray energy spectrum hardening, which further affects the imaging effect.
- the energy spectrum resolved X-ray detector can realize X-ray energy By distinguishing, the phase factor and the absorption factor of the corresponding energy can be obtained, so that a more accurate value and better image quality can be obtained, and problems such as spectrum hardening can be prevented.
- FIG. 5 illustrates a flow chart of a method of imaging detection of an object using X-rays, in accordance with an embodiment of the present invention.
- a method for imaging detection of an object using X-rays includes the steps of: at step 501, causing one of the first absorption grating and the second absorption grating to be in at least one period Performing a phase stepping motion in which, in each phase stepping process, an X-ray is irradiated to the detected object by an incoherent X-ray source, and the first absorption grating G1 and the second absorption are received by the energy spectrum resolved X-ray detector.
- the X-rays of the grating G2 are converted into electrical signals to achieve energy spectrum resolution for the X-rays.
- the intensity of the X-rays of each energy segment at each pixel point of the spectrally resolved X-ray detector is represented as a light intensity curve after a period of phase stepping process and data acquisition.
- the light intensity curve at each pixel point on the spectrally resolved X-ray detector is compared with the light intensity curve in the absence of the detected object, and the pixel value of each pixel is calculated.
- image information of the detected object is obtained based on the obtained pixel values. Further, an image of the detected object can be reconstructed based on the obtained image information.
- the first absorption grating G1 and the second absorption grating G2 may be fixed, and the source grating G0 may be stepped in at least one period;
- the X-ray source S emits X-rays to illuminate the detected object;
- the spectrally resolved X-ray detector receives X-rays and performs X-ray energy spectrum resolution; after one cycle of phase stepping process and data acquisition, energy spectrum
- the intensity of the X-rays of each energy segment at each pixel point on the resolved X-ray detector is represented as a light intensity curve; then, an image of the detected object is obtained as described above.
- the invention can be applied to a CT imaging system.
- One aspect of the present invention can provide a multi-spectral X-ray grating CT imaging system that can include a rotating structure in addition to a multi-spectral X-ray raster imaging system in accordance with an embodiment of the present invention.
- the rotating structure is for rotating the detected object relative to the X-ray source and the grating, the X-ray detector, and the like. This relative rotation may be accomplished by rotating the object to cause other components to be stationary, or by rotating the object to rotate the X-ray source together with the grating, X-ray detector, or the like.
- the multi-spectral X-ray grating CT imaging system can obtain the refraction angle information, the small angle scattering information and the corresponding planar pixel information at each projection angle, and then use a predetermined algorithm to reconstruct the object.
- the invention can eliminate the adverse influence of the wide-spectrum X-ray source on the grating imaging technology, solve the inherent problems such as the radiation hardening, greatly improve the signal-to-noise ratio of the image, and at the same time realize the recognition of the material composition.
- the present invention enables high-contrast imaging of weakly absorbing substances (for example, soft tissues such as breast, blood vessels, and muscles, fibrous materials, insects, etc.).
- the invention can greatly improve the image signal-to-noise ratio and solve the problem of the radiation hardening, and can simultaneously realize the linear attenuation coefficient, the phase factor and the generalized scattering coefficient of the scanned sample with the change of the X-ray energy. Identification of material components.
- the invention will open up new ideas and approaches for phase contrast imaging in the fields of medicine, biology and industrial materials, and has great practical significance and application value.
- Fig. 6 is a schematic view of Application Example 1 of the present invention.
- Application Example 1 shows a multi-spectral X-ray raster imaging system according to an embodiment of the present invention for X-ray photography.
- the multi-spectral X-ray raster imaging system can simultaneously acquire three images of attenuation, phase contrast and dark field after one scan, which can be used in applications such as a new generation of mammography machines.
- the source grating G0 in the drawing is optional, that is, the source grating G0 may or may not be provided.
- Fig. 7 is a schematic diagram of Application Example 2 of the present invention.
- Application Example 2 shows a multi-spectral X-ray raster imaging system according to an embodiment of the present invention for X-ray CT imaging.
- the scanned sample i.e., the scanned object W in Fig. 7
- the scanned sample can be rotated in a direction perpendicular to the optical path, thereby enabling three-dimensional information of the substance structure to be acquired, and substance identification based on the energy spectrum information.
- the source grating G0 in the drawing is optional, that is, the source grating G0 may or may not be provided.
- FIG. 8 is a schematic diagram of Application Example 3 of the present invention.
- Application Example 3 shows a multi-spectral X-ray raster imaging system according to an embodiment of the present invention for X-ray CT imaging.
- the overall mechanical structure of the multi-spectral X-ray grating imaging system can be rotated in a direction perpendicular to the optical path, so that three-dimensional information of the material structure can be obtained, and substance identification can be performed based on the energy spectrum information.
- the source grating G0 in the drawing is optional, that is, the source grating G0 may or may not be provided.
- the multi-spectral X-ray raster imaging system proposed by the present invention is implemented using a non-coherent method (i.e., an incoherent X-ray source is employed in the present invention).
- the invention adopts a spectrally resolved X-ray detector to detect different energy segments of a broad spectrum X-ray energy range generated by a conventional X-ray source (the X-ray energy range is 0 to the set value of the beam energy).
- This not only preserves the original advantages of the grating imaging technology, such as obtaining three kinds of information of attenuation, phase contrast and dark field in one imaging process, and can solve the problems existing in the existing grating imaging technology, including the ray hardening problem.
- the invention transforms the disadvantage of the multi-energy spectrum in the imaging of the energy deposition detector into the advantage of the image spectrum detector, and takes advantage of the more information brought by the multi-energy spectrum to realize the identification of the material composition. It has high practical value in medical imaging, safety inspection and other fields.
- the invention innovatively combines a spectrally resolved X-ray detection technique with a raster imaging technique.
- the invention can fully utilize the superiority of the grating imaging technology, for example, obtaining three kinds of information indicating attenuation, dark field and phase contrast of the internal information of the substance in one scanning process, and can more comprehensively reflect the internal structure information and composition information of the object.
- the invention can combine the pluripotency spectrum analysis technology to eliminate the deficiencies in the original imaging mode, and at the same time exert the advantages of the multi-energy spectrum to bring more information, realize the recognition of the material components, and thus can be used in medical imaging, security inspection, etc.
- a multifaceted field plays a huge role.
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Abstract
一种多能谱X射线光栅成像系统与成像方法。该多能谱X射线光栅成像系统具备发射对被检测物体进行照射的X射线的非相干X射线源(S)、由彼此平行配置且依次布置在X射线传播方向上的第一吸收光栅(G1)和第二吸收光栅(G2)组成的光栅模块(P)以及接收通过了第一以及第二吸收光栅的X射线的能谱分辨型X射线探测器。第一吸收光栅(G1)和第二吸收光栅(G2)之一在至少一个周期范围内进行相位步进动作;在每个相位步进过程,非相干X射线源(S)发射X射线对被检测物体(W)进行照射;能谱分辨型X射线探测器接收X射线并对X射线进行能谱分辨;经过一个周期的相位步进过程和数据采集,能谱分辨型X射线探测器上每个像素点处每个能量段的X射线的光强表示为一个光强曲线。
Description
本发明涉及X射线光栅成像技术,特别是涉及一种多能谱X射线光栅成像系统与成像方法。
在现有技术中,例如CT扫描设备等中,利用X射线对物体进行扫描成像得到了广泛地应用。传统的X射线扫描成像一般利用被测材料对X射线的衰减特性来以非破坏性方式检查物体的内部结构。物体内部的各部分组成结构的密度差异越明显,则传统的X射线成像技术的效果越显著。但轻元素构成的物质对X射线来说是弱吸收物质,所以用传统的X射线成像技术几乎看不到它们内部的具体结构。即使用其它辅助的手段,例如给生物组织打上造影剂,也很难得到清晰的图像,这造成了很多的缺憾。在上世纪九十年代,出现了X射线相衬成像技术。相衬成像是通过捕捉X射线的相移信息来观察物体内部的电子密度变化,从而揭示物体的内部结构。开始时,出现的相衬成像方法一般通过利用相干或者部分相干的X射线的干涉或衍射现象来增强辐射图像的低对比度分辨率。而在此基础上,在公开号为“CN101532969A”、名称为“X射线光栅相衬成像系统及方法”(专利文献1)以及公开号为“CN101726503A”、发明名称为“X射线相衬层析成像”(专利文献2)的专利申请中,其中该专利申请的全部内容在此通过参照引入到本申请中,黄志峰等人提出了非相干光栅相衬成像的新技术构思和方案。具体地,使用两块吸收光栅在一个光栅周期范围内相对地平行移动若干步,每平移一步探测器采集一张图像;在完成一个光栅周期内的采集过程后,通过比较每个像素点对应的样品光强曲线与背景光强曲线的差异而计算出被检测物体的折射图像信息。这取得了较好的相衬成像效果。该方法可以工作在多色、非相干的射线源下,实现简单可行的
装置。
另外,在X射线成像的技术发展过程中,还出现了暗场成像的技术。暗场成像是利用非直射光,例如散射光、衍射光、折射光和荧光等,对物质材料进行成像的技术,并且利用物质对X射线散射能力的差异来对物质内部结构进行成像。对于暗场成像,由于硬X射线独特的光学性质,所需的光学元件制作非常困难,所以硬X射线的暗场成像一直难以较佳地实现。然而,硬X射线的暗场成像技术在对物质内部微细结构分辨和探测能力上相对于明场成像和相衬成像具有独到的优势。由于硬X射线的散射在微米量级或甚至纳米量级尺度,因而硬X射线暗场成像技术能够看到硬X射线明场成像和相衬成像都无法分辨出的物质内部超微细结构。在2009年,在公开号为“CN101943668A”、发明名称为“X射线暗场成像系统和方法”(专利文献3)的专利申请中,其中该专利申请的全部内容在此通过参照引入到本申请,黄志峰等人提出了利用X射线对物体进行暗场成像的技术方案。具体地,向被测物体发射X射线;使得两块吸收光栅之一在至少一个周期内进行步进;在每个步进步骤,探测器接收X射线,并转化为电信号;经过至少一个周期的步进,探测器上每个像素点处的X射线光强表示为一个光强曲线;根据探测器上每个像素点处的光强曲线与不存在被检测物体情况下的光强曲线的对比度,计算得到每个像素的散射角分布的二阶矩;在多个角度拍摄物体的图像,然后根据CT重建算法可以得物体的散射信息图像。
在前述的光栅成像技术中,都需要采用步进技术测量出探测器上每个探测单元(像素点)的光强曲线。所利用的步进技术的基本原理为:源光栅紧邻X光机源固定不动后,在基于Talbot-Lau干涉法的技术中,位相光栅或者解析光栅在一个光栅周期范围内相对平行移动若干步;而在基于经典光学方法的技术中,两块吸收光栅在一个光栅周期范围内相对平行移动若干步。每平移一步探测器采集一张图像。完成一个光栅周期内的采集过程后,通过比较每个像素点对应的样品光强曲线与背景光强曲线的差异可计算出折射图像信息、衰减图像信息和暗场图像信息。传统的步进技术一般是平移位相光栅或者解析光栅或吸收光栅。在2010年,在公开号为
“CN102221565A”、发明名称为“X射线源光栅步进成像系统与成像方法”(专利文献4)的专利申请中,其中该专利申请的全部内容在此通过参照引入到本申请,黄志峰等人提出了X射线源光栅步进的方法。具体地,由于源光栅的周期在几十微米级,相对于传统的步进方法大大降低了步进精度要求。
在前述的光栅成像技术中,均采用传统的能量沉积型X射线探测器,其对于常规X射线光源(例如,常规X射线光机、分布式X射线源、X射线加速器等)产生的宽能谱X射线仅能获取扫描物体的加权平均意义下的能量响应,且会产生射线硬化等问题,同时不能实现对物质成分的有效识别。
发明内容
在已有的X射线光栅相衬成像和暗场成像以及X射线源光栅步进成像系统等技术的基础上,本申请的实施例提出了一种非相干方法实现的多能谱X射线光栅成像系统与成像方法,其采用能谱分辨型X射线探测器,实现对常规X射线光源产生的宽能谱X射线能量范围的不同能量段的探测(X射线能量范围是0到出束能量的设定值)。本申请的实施例可以改善能谱硬化等问题,并能对不同能量段的物体成像,获得能量维度的信息,实现对物质成分的识别。
本发明的一个方面提供一种多能谱X射线光栅成像系统,具备:
非相干X射线源,用于发射用于对被检测物体进行照射的X射线;
光栅模块,包括彼此平行配置且依次布置在X射线传播方向上的第一吸收光栅和第二吸收光栅;以及
能谱分辨型X射线探测器,用于接收通过了所述第一以及第二吸收光栅的X射线。
此外,在本发明的实施例的多能谱X射线光栅成像系统中,光栅模块构造成使得所述第一吸收光栅和所述第二吸收光栅之一在至少一个周期范围内进行相位步进动作。在每个相位步进过程,所述非相干X射线源发射X射线对被检测物体进行照射,所述能谱分辨型X射线探测器接收X射线
并对X射线进行能谱分辨。经过一个周期的相位步进过程和数据采集,所述能谱分辨型X射线探测器上每个像素点处每个能量段的X射线的光强表示为一个光强曲线。
本发明创新地将能谱分辨型X射线探测技术与光栅成像技术相结合。本发明可以充分发挥光栅成像技术的优越性,例如在一次扫描过程中同时获得体现物质内部信息的衰减、暗场和相衬三种信息,并且可以更加全面地反映物体的内部结构信息以及组成信息。同时,本发明可以结合多能谱分析技术,消除原有成像方式中的不足,同时发挥多能谱带来更多信息的优势,实现对物质成分的识别,从而可以在医疗成像、安全检查等多方面的领域中发挥巨大的作用。
本发明能够消除宽能谱X射线源对于光栅成像技术的不利影响,解决射线硬化等固有问题,大大提升图像的信噪比,同时能够实现对物质成分的识别。与传统的X射线成像相比,本发明能够对弱吸收物质(例如,乳腺、血管和肌肉等软组织、纤维材料、昆虫等)进行高对比度的成像。与现有光栅成像技术相比,本发明能够大大提升图像信噪比,解决射线硬化的问题,同时能够利用扫描样品的线性衰减系数、相位因子和广义散射系数随X射线能量的变化而实现对物质成分的识别。本发明将为相衬成像应用于医学、生物学、工业材料等领域开拓崭新的思路和途径,具有重大的实际意义和应用价值。
此外,在本发明的实施例的多能谱X射线光栅成像系统中,还具备:源光栅,配置在所述非相干X射线源与被检测物体之间的靠近所述非相干X射线源的位置并且能够在平行于所述第一以及第二吸收光栅的方向上移动。所述光栅模块构造成使得所述第一以及第二吸收光栅固定不动,并且所述源光栅构造成能够在至少一个周期范围内进行步进动作。在每个相位步进过程,所述非相干X射线源发射X射线对被检测物体进行照射,所述能谱分辨型X射线探测器接收X射线并对X射线进行能谱分辨。经过一个周期的相位步进过程和数据采集,所述能谱分辨型X射线探测器上每个像素点处每个能量段的X射线的光强表示为一个光强曲线。
此外,在本发明的实施例的多能谱X射线光栅成像系统中,还具备:
致动装置,能够使被检测物体相对于所述多能谱X射线光栅成像系统整体旋转一定角度。
此外,在本发明的实施例的多能谱X射线光栅成像系统中,在每个所述旋转角度下,重复进行一个周期的相位步进过程,然后根据预定CT图像重建算法来重建所述被检测物体的图像。
此外,在本发明的实施例的多能谱X射线光栅成像系统中,所述多能谱X射线光栅成像系统具备计算机工作站,所述计算机工作站具备:数据处理模块,用于进行数据信息的处理,并从中计算得出所述被检测物体上各点的像素值;图像重建模块,用于根据计算得出的像素值重建所述被检测物体的图像;控制模块,用于控制所述非相干X射线源、光栅模块以及所述能谱分辨型X射线探测器。
此外,在本发明的实施例的多能谱X射线光栅成像系统中,所述计算机工作站具备:显示单元,用于显示所述被检测物体的图像。
此外,在本发明的实施例的多能谱X射线光栅成像系统中,所述计算机工作站能够从存在所述被检测物体的光强曲线和不存在所述被检测物体的背景光强曲线的对比中计算出X射线在所述被检测物体上预定点的折射信息,并由此计算出相应的像素值。
此外,在本发明的实施例的多能谱X射线光栅成像系统中,所述计算机工作站能够从存在所述被检测物体的光强曲线和不存在所述被检测物体的背景光强曲线的对比中计算出X射线在所述被检测物体上预定点的散射信息,并由此计算出相应的像素值。
此外,在本发明的实施例的多能谱X射线光栅成像系统中,所述计算机工作站能够从存在所述被检测物体的光强曲线和不存在所述被检测物体的背景光强曲线的对比中计算出X射线在所述被检测物体上预定点的衰减信息,并由此计算出相应的像素值。
此外,本发明的一个方面提供一种X射线光栅成像方法,具有如下步骤:
使彼此平行且依次布置在X射线传播方向上的第一吸收光栅和第二吸收光栅之一在至少一个周期范围内进行相位步进动作,其中,在每个相位
步进过程,利用非相干X射线源对被检测物体照射X射线,并且由能谱分辨型X射线探测器接收通过了所述第一以及第二吸收光栅的X射线并对其进行能谱分辨;
经过一个周期的相位步进过程和数据采集,将所述能谱分辨型X射线探测器上每个像素点处每个能量段的X射线的光强表示为一个光强曲线;
将所述能谱分辨型X射线探测器上每个像素点处的光强曲线与不存在被检测物体的情况下的光强曲线进行比较,计算得出每个像素点的像素值;并且
根据所述像素值得到被检测物体的图像信息。
此外,在本发明的实施例的X射线光栅成像方法中,使所述被检测物体旋转,在每个所述旋转角度下,重复所述相位步进动作,然后根据预定CT图像重建算法来重建所述被检测物体的图像。
此外,在本发明的实施例的X射线光栅成像方法中,从存在所述被检测物体的光强曲线和不存在所述被检测物体的背景光强曲线的对比中计算出X射线在所述被检测物体上预定点的折射信息,并由此计算出相应的像素值。
此外,在本发明的实施例的X射线光栅成像方法中,从存在所述被检测物体的光强曲线和不存在所述被检测物体的背景光强曲线的对比中计算出X射线在所述被检测物体上预定点的散射信息,并由此计算出相应的像素值。
此外,在本发明的实施例的X射线光栅成像方法中,从存在所述被检测物体的光强曲线和不存在所述被检测物体的背景光强曲线的对比中计算出X射线在所述被检测物体上预定点的衰减信息,并由此计算出相应的像素值。
根据本发明,多能谱X射线光栅成像系统采用非相干方法实现,并且采用能谱分辨型X射线探测器,实现对常规X射线光源产生的宽能谱X射线能量范围的不同能量段的探测(X射线能量范围是0到出束能量的设定值)。这既保留光栅成像技术的原有优点,例如一次成像过程中同时获得衰减、相衬、暗场三种信息,又能够解决现有光栅成像技术存在的问
题,包括射线硬化问题等。同时,本发明将能量沉积型探测器成像中多能谱的劣势转化为能谱分辨型探测器成像中的优势,发挥多能谱带来的更多信息的优势,实现对物质成分的识别,在医疗成像、安全检查等领域都具有很高的实用价值。
图1是根据本发明一个实施例的多能谱X射线光栅成像系统的示意图。
图2是根据本发明一个实施例的由步进扫描过程获得的光强曲线的示意图。
图3是示出水和聚丙烯与X射线相互作用的相位因子与X射线能量的关系的示图。
图4是示出水和聚丙烯与X射线相互作用的吸收因子与X射线能量的关系的示图。
图5是根据本发明实施例的利用X射线对物体进行成像检测的方法的流程图。
图6是根据本发明的一个应用示例的示意图。
图7是根据本发明的另一应用示例的示意图。
图8是根据本发明的另一应用示例的示意图。
以下,参照附图详细地对本发明进行说明。
图1是根据本发明的一个实施例的多能谱X射线光栅成像系统的示意图。本发明的多能谱X射线光栅成像系统能够用于对物体进行成像检测。如图1所示,本发明的一个示例性实施例的多能谱X射线光栅成像系统包括:X射线源S、光栅模块P和能谱分辨型X射线探测器。X射线源S用于向被检测物体(即,图1中的扫描物体W)发射X射线束(例如,宽能谱X射线)。可选地,在X射线源是大焦点光源情况下可以设置一个多缝准直器(即,源光栅G0)来产生一组小焦点线光源,以向被检测物体发
射X射线束。如图1所示,在配置了源光栅G0的情况下,源光栅G0被配置在X射线源S和被检测物体之间的靠近X射线源S的位置。光栅模块P包括第一吸收光栅G1和第二吸收光栅G2,这两个吸收光栅G1、G2彼此平行且依次位于X射线传播方向上。在操作中,经被检测物体折射与散射的X射线经由第一吸收光栅G1和第二吸收光栅G2形成强度变化的X射线信号。能谱分辨型X射线探测器用于接收上述的强度变化的X射线信号(例如,宽能谱X射线),将X射线信号转换为电信号,并实现X射线能量的分辨,获得多种能量下的信息。此外,根据本发明的一个实施例,X射线源S可以是非相干X射线源。
此外,在进行成像检测的情况下,将被检测物体(即,图1中的扫描物体W)配置在X射线源S和第一吸收光栅G1之间。可选地,在设置了源光栅G0的情况下,被检测物体配置在源光栅G0和第一吸收光栅G1之间。此外,本发明的多能谱X射线光栅成像系统还可以包括计算机工作站。计算机工作站对X射线源、光栅模块和能谱分辨型X射线探测器进行控制来实现下述过程:光栅模块进行相位步进过程(即,第一吸收光栅G1和第二吸收光栅G2进行相位步进动作),在每一步X射线源都发射X射线,由能谱分辨型X射线探测器接收X射线,将所接收到的X射线转换为电信号,并对X射线实现能谱分辨。经过一组相位步进过程(即,一个周期的相位步进过程)和数据采集,能谱分辨型X射线探测器上每个像素点处每个能量段的X射线的光强均可表示为一个光强曲线(如图2所示,在图2中示出了某个能量段的光强曲线)。将能谱分辨型X射线探测器上每个像素点处的光强曲线与不存在被检测物体情况下的光强曲线相比较(其中,不存在被检测物体情况下的光强曲线是已知的);由光强曲线的变化计算得出每个像素点的像素值,由此,能够得到反映物质结构信息的衰减像、相衬像和暗场像三种信息。此外,在本发明中,能够以与现有技术(例如,专利文献1~3)相同的方式进行光栅模块P的相位步进动作。此外,关于利用源光栅G0进行相位步进动作的过程,也能够以与现有技术(例如,专利文献4)相同的方式进行。例如,第一吸收光栅G1和第二吸收光栅G2可以固定不动,使源光栅G0在至少一个周期范围内进
行步进动作,在每个相位步进过程,X射线源S发射X射线对被检测物体进行照射,能谱分辨型X射线探测器接收X射线并对X射线进行能谱分辨,经过一个周期的相位步进过程和数据采集,能谱分辨型X射线探测器上每个像素点处每个能量段的X射线的光强表示为一个光强曲线。
此外,在本发明中,第一吸收光栅G1和第二吸收光栅G2可以彼此平行,它们之间的距离为D,并且,X射线源S与光栅G1之间的距离为L。
此外,优选地,第一吸收光栅G1和第二吸收光栅G2的周期一般在0.1~30微米之间。光栅使用重金属作为吸收材料,例如金(Au)。例如,作为吸收材料的金的高度由所使用的X射线的能量决定,通常在10~100微米之间。例如,对20keV的X射线来说,金的高度大于16微米时能阻挡90%的X射线。
上文描述,在本发明中所使用的探测器是能谱分辨型X射线探测器,其能够接收强度变化的宽能谱X射线,将X射线信号转换为电信号,并实现X射线能量的分辨,获得多种能量下的信息。在本发明中,能够利用与现有技术相同的方法进行宽能谱X射线的分辨。但并不限于此,只要是能够实现上述功能,也可以是其它类型的X射线探测器。
此外,在本发明的多能谱X射线光栅成像系统中,整个成像系统的控制、数据传输、图像重建以及数据处理等均可由计算机工作站完成。扫描控制信息、位置信息、投影数据等通过数据采集系统输入到计算机工作站中。由计算机工作站完成物体多种信息的提取、数据预处理及图像重建的工作,最后在显示器上显示出来。
此外,计算机工作站可包括数据处理模块。数据处理模块可设置成用于从能谱分辨型X射线探测器输出的可数字处理的电信号,计算得出X射线经过被检测物体后的光强(曲线)的变化,并且通过所述光强(曲线)变化计算出被检测物体上某个点处对X射线的吸收信息、散射信息或折射信息,以及利用这些信息计算出被检测物体的像素信息。这些功能也可以通过编程的软件来实现,或者可替换地,也可以通过专用的硬件芯片组来实现。
此外,计算机工作站还可包括控制模块(在图1中未示出),控制模块用于控制X射线源S、被检测物体W、第一以及第二吸收光栅G1、G2、以及能谱分辨型X射线探测器等的操作,例如相对转动、X射线发射和信息采集等。优选地,控制模块和数据处理模块可以集成为一体,由单个通用或专用处理器来实现。
此外,计算机工作站还可包括成像模块(在图1中未示出),成像模块根据得到的像素信息重建被检测物体的图像并输出显示。并且,成像模块可以由兼为数据处理模块的处理器实现。
此外,本发明的多能谱X射线光栅成像系统还可包括致动装置,其能够在计算机工作站的控制下,使被检测物体相对于多能谱X射线光栅成像系统整体旋转一定角度。在每个旋转角度下,重复相位步进过程,从而得出多个角度下的X射线成像像素值,然后,根据预定CT图像重建算法来重建被检测物体的立体图像。该致动装置具有能够实现相对转动被检测物体的结构。
此外,计算机工作站可包括显示单元,用于显示所重建的图像。该显示单元可由通用的显示器来实现。
下面,从X射线与物质相互作用的角度来看能谱分辨的重要意义。X射线与物质的相互作用可以用物质对X射线的复折射率n来表示,n以如下的式(1)示出,
n=1-δ-iβ……(1),
其中,δ称之为相位因子,与物质的相移截面有关;β称之为吸收因子,与物质对射线的线性衰减系数有关。这里的δ和β均与X射线能量相关。例如,水和聚丙烯的相位因子和吸收因子与X射线能量的关系曲线如图3和图4所示,图3是水和聚丙烯与X射线相互作用的相位因子与X射线能量的关系,图4是水和聚丙烯与X射线相互作用的吸收因子与X射线能量的关系。从图3和图4中可以看出,相位因子和吸收因子均随着X射线能量升高而减小。传统的能量沉积型X射线探测器并不能体现这种能量相关性,获得的是宽能谱下的平均值,同时存在X射线能谱硬化等问题,进一步影响成像效果。而能谱分辨型X射线探测器能够实现X射线能量的
分辨,能够获得对应能量的相位因子和吸收因子,因此可以获得更为准确的值和更好的图像质量,并可以防止能谱硬化等问题。
图5示出根据本发明实施例的利用X射线对物体进行成像检测的方法的流程图。如图5所示,根据本发明的一个实施例的利用X射线对物体进行成像检测的方法包括如下步骤:在步骤501,使第一吸收光栅和第二吸收光栅之一在至少一个周期范围内进行相位步进运动,其中在每个相位步进过程,利用非相干X射线源对被检测物体照射X射线,利用能谱分辨型X射线探测器接收通过了第一吸收光栅G1和第二吸收光栅G2的X射线并将其转换为电信号,实现针对X射线的能谱分辨。在步骤502,经过一个周期的相位步进过程和数据采集,将能谱分辨型X射线探测器上每个像素点处每个能量段的X射线的光强表示为一个光强曲线。在步骤503,将能谱分辨型X射线探测器上每个像素点处的光强曲线与不存在被检测物体的情况下的光强曲线进行比较,计算得出每个像素点的像素值。在步骤504,根据所得到像素值得到被检测物体的图像信息。进而,根据所得到的图像信息能够重建被检测物体的图像。此外,在设置了源光栅G0的情况下,可以使第一吸收光栅G1和第二吸收光栅G2固定不动,使源光栅G0在至少一个周期范围内进行步进动作;在每个相位步进过程,X射线源S发射X射线对被检测物体进行照射;能谱分辨型X射线探测器接收X射线并对X射线进行能谱分辨;经过一个周期的相位步进过程和数据采集,能谱分辨型X射线探测器上每个像素点处每个能量段的X射线的光强表示为一个光强曲线;然后,如上述那样得到被检测物体的图像。
本发明能够应用于CT成像系统。本发明的一个方面能够提供一种多能谱X射线光栅CT成像系统,该系统除了包括根据本发明的实施例的多能谱X射线光栅成像系统之外,还可以包括一个旋转结构。该旋转结构用于使得被检测物体相对于X射线源和光栅、X射线探测器等进行相对旋转。这种相对旋转的实现方式可以是使物体旋转而使其他部件静止,也可以是使物体静止而使X射线源和光栅、X射线探测器等一起旋转。多能谱X射线光栅CT成像系统在CT模式下,能够获得各个投影角度下的折射角信息、小角散射信息及相应的平面像素信息,进而利用预定算法来重构物
体内部的断层图像。
本发明能够消除宽能谱X射线源对于光栅成像技术的不利影响,解决射线硬化等固有问题,大大提升图像的信噪比,同时能够实现对物质成分的识别。与传统的X射线成像相比,本发明能够对弱吸收物质(例如,乳腺、血管和肌肉等软组织、纤维材料、昆虫等)进行高对比度的成像。与现有光栅成像技术相比,本发明能够大大提升图像信噪比,解决射线硬化的问题,同时能够利用扫描样品的线性衰减系数、相位因子和广义散射系数随X射线能量的变化而实现对物质成分的识别。本发明将为相衬成像应用于医学、生物学、工业材料等领域开拓崭新的思路和途径,具有重大的实际意义和应用价值。
(应用示例)
以下说明本发明的几个应用例。
图6是本发明的应用示例1的示意图。如图6所示,应用示例1示出将根据本发明的实施例的多能谱X射线光栅成像系统用于X射线摄影。多能谱X射线光栅成像系统可以一次扫描后同时获得衰减、相衬和暗场三种图像,从而可以用于新一代乳腺机等应用。此外,如图6所示那样,图中的源光栅G0是可选的,即,可以设置源光栅G0,也可以不设置。
此外,图7是本发明的应用示例2的示意图。如图7所示,应用示例2示出将根据本发明的实施例的多能谱X射线光栅成像系统用于X射线CT成像。扫描样品(即,图7中的扫描物体W)能够沿垂直于光路的方向旋转,从而能够获取物质结构的三维信息,基于能谱信息可以进行物质识别。此外,如图7所示那样,同样地,图中的源光栅G0是可选的,即,可以设置源光栅G0,也可以不设置。
此外,图8是本发明的应用示例3的示意图。如图8所示,应用示例3示出将根据本发明的实施例的多能谱X射线光栅成像系统用于X射线CT成像。多能谱X射线光栅成像系统的整体机械结构可以沿垂直于光路的方向旋转,从而可以获取物质结构的三维信息,基于能谱信息可以进行物质识别。此外,如图8所示那样,同样地,图中的源光栅G0是可选的,即,可以设置源光栅G0,也可以不设置。
如上所述,本发明所提出的多能谱X射线光栅成像系统采用非相干方法实现(即,在本发明中采用了非相干X射线源)。本发明采用能谱分辨型X射线探测器,实现对常规X射线光源产生的宽能谱X射线能量范围的不同能量段的探测(X射线能量范围是0到出束能量的设定值)。这既保留光栅成像技术的原有优点,例如一次成像过程中同时获得衰减、相衬、暗场三种信息,又能够解决现有光栅成像技术存在的问题,包括射线硬化问题等。同时,本发明将能量沉积型探测器成像中多能谱的劣势转化为能谱分辨型探测器成像中的优势,发挥多能谱带来的更多信息的优势,实现对物质成分的识别,在医疗成像、安全检查等领域都具有很高的实用价值。
本发明创新地将能谱分辨型X射线探测技术与光栅成像技术相结合。本发明可以充分发挥光栅成像技术的优越性,例如在一次扫描过程中同时获得体现物质内部信息的衰减、暗场和相衬三种信息,并且可以更加全面地反映物体的内部结构信息以及组成信息。同时,本发明可以结合多能谱分析技术,消除原有成像方式中的不足,同时发挥多能谱带来更多信息的优势,实现对物质成分的识别,从而可以在医疗成像、安全检查等多方面的领域中发挥巨大的作用。
以上对本发明进行了说明,但是本领域技术人员应该理解的是,对于目前所给出的公开内容,在不脱离这里所描述的本发明技术思想的范围内可以进行各种变形。因此,并不意味着本发明局限于所示出的和所描述的特定实施例。
Claims (15)
- 一种多能谱X射线光栅成像系统,具备:非相干X射线源,用于发射用于对被检测物体进行照射的X射线;光栅模块,包括彼此平行配置且依次布置在X射线传播方向上的第一吸收光栅和第二吸收光栅;以及能谱分辨型X射线探测器,用于接收通过了所述第一以及第二吸收光栅的X射线。
- 如权利要求1所述的多能谱X射线光栅成像系统,其中,所述光栅模块构造成,使得所述第一吸收光栅和所述第二吸收光栅之一在至少一个周期范围内进行相位步进动作,其中,在每个相位步进过程,所述非相干X射线源发射X射线对被检测物体进行照射,所述能谱分辨型X射线探测器接收X射线并对X射线进行能谱分辨,并且其中,经过一个周期的相位步进过程和数据采集,所述能谱分辨型X射线探测器上每个像素点处每个能量段的X射线的光强表示为一个光强曲线。
- 如权利要求1所述的多能谱X射线光栅成像系统,还具备:源光栅,配置在所述非相干X射线源与被检测物体之间的靠近所述非相干X射线源的位置并且能够在平行于所述第一以及第二吸收光栅的方向上移动,所述光栅模块构造成使得所述第一以及第二吸收光栅固定不动,并且所述源光栅构造成能够在至少一个周期范围内进行步进动作,其中,在每个相位步进过程,所述非相干X射线源发射X射线对被检测物体进行照射,所述能谱分辨型X射线探测器接收X射线并对X射线进行能谱分辨,并且其中,经过一个周期的相位步进过程和数据采集,所述能谱分辨型X射线探测器上每个像素点处每个能量段的X射线的光强表示为一个光强曲 线。
- 如权利要求1~3的任意一项所述的多能谱X射线光栅成像系统,还具备:致动装置,能够使被检测物体相对于所述多能谱X射线光栅成像系统整体旋转一定角度。
- 如权利要求4所述的多能谱X射线光栅成像系统,其中,在每个所述旋转角度下,重复进行一个周期的相位步进过程,然后根据预定CT图像重建算法来重建所述被检测物体的图像。
- 如权利要求1~3的任意一项所述的多能谱X射线光栅成像系统,其中,所述多能谱X射线光栅成像系统具备计算机工作站,所述计算机工作站具备:数据处理模块,用于进行数据信息的处理,并从中计算得出被检测物体上各点的像素值;图像重建模块,用于根据计算得出的像素值重建被检测物体的图像;和控制模块,用于控制所述非相干X射线源、所述光栅模块以及所述能谱分辨型X射线探测器。
- 如权利要求6所述的多能谱X射线光栅成像系统,其中,所述计算机工作站具备:显示单元,用于显示所述被检测物体的图像。
- 如权利要求6所述的多能谱X射线光栅成像系统,其中,所述计算机工作站能够从存在被检测物体的光强曲线和不存在被检测物体的背景光强曲线的对比中计算出X射线在被检测物体上预定点的折射信息,并由此计算出相应的像素值。
- 如权利要求6或8所述的多能谱X射线光栅成像系统,其中,所述计算机工作站能够从存在被检测物体的光强曲线和不存在被检测物体的背景光强曲线的对比中计算出X射线在被检测物体上预定点的散射信息,并由此计算出相应的像素值。
- 如权利要求6、8和9中任一项所述的X射线成像系统,其中,所述计算机工作站能够从存在被检测物体的光强曲线和不存在被检测物体的背景光强曲线的对比中计算出X射线在被检测物体上预定点的衰减信息,并由此计算出相应的像素值。
- 一种X射线光栅成像方法,具有如下步骤:使彼此平行且依次布置在X射线传播方向上的第一吸收光栅和第二吸收光栅之一在至少一个周期范围内进行相位步进动作,其中,在每个相位步进过程,利用非相干X射线源对被检测物体照射X射线,并且由能谱分辨型X射线探测器接收通过了所述第一以及第二吸收光栅的X射线并对其进行能谱分辨;经过一个周期的相位步进过程和数据采集,将所述能谱分辨型X射线探测器上每个像素点处每个能量段的X射线的光强表示为一个光强曲线;将所述能谱分辨型X射线探测器上每个像素点处的光强曲线与不存在所述被检测物体的情况下的光强曲线进行比较,计算得出每个像素点的像素值;和根据所述像素值得到被检测物体的图像信息。
- 如权利要求11所述的X射线光栅成像方法,还包括:使所述被检测物体旋转,其中,在每个所述旋转角度下,重复所述相位步进动作,并且根据预定CT图像重建算法来重建所述被检测物体的图像。
- 如权利要求11所述的X射线光栅成像方法,其中,从存在所述被检测物体的光强曲线和不存在所述被检测物体的背景光强曲线的对比中计算出X射线在所述被检测物体上预定点的折射信息,并由此计算出相应的像素值。
- 如权利要求11或13所述的X射线光栅成像方法,其中,从存在所述被检测物体的光强曲线和不存在所述被检测物体的背景光强曲线的对比中计算出X射线在所述被检测物体上预定点的散射信息,并由此计算出相应的像素值。
- 如权利要求11、13和14中任一项所述的X射线光栅成像方法,其中,从存在所述被检测物体的光强曲线和不存在所述被检测物体的背景光强曲线的对比中计算出X射线在所述被检测物体上预定点的衰减信息,并由此计算出相应的像素值。
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