WO2016043540A1 - Composition for forming conductive patterns and resin structure having conductive pattern - Google Patents
Composition for forming conductive patterns and resin structure having conductive pattern Download PDFInfo
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- WO2016043540A1 WO2016043540A1 PCT/KR2015/009784 KR2015009784W WO2016043540A1 WO 2016043540 A1 WO2016043540 A1 WO 2016043540A1 KR 2015009784 W KR2015009784 W KR 2015009784W WO 2016043540 A1 WO2016043540 A1 WO 2016043540A1
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- conductive pattern
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01B—CABLES; CONDUCTORS; INSULATORS; SELECTION OF MATERIALS FOR THEIR CONDUCTIVE, INSULATING OR DIELECTRIC PROPERTIES
- H01B1/00—Conductors or conductive bodies characterised by the conductive materials; Selection of materials as conductors
- H01B1/20—Conductive material dispersed in non-conductive organic material
- H01B1/22—Conductive material dispersed in non-conductive organic material the conductive material comprising metals or alloys
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01B—CABLES; CONDUCTORS; INSULATORS; SELECTION OF MATERIALS FOR THEIR CONDUCTIVE, INSULATING OR DIELECTRIC PROPERTIES
- H01B13/00—Apparatus or processes specially adapted for manufacturing conductors or cables
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- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01B—CABLES; CONDUCTORS; INSULATORS; SELECTION OF MATERIALS FOR THEIR CONDUCTIVE, INSULATING OR DIELECTRIC PROPERTIES
- H01B5/00—Non-insulated conductors or conductive bodies characterised by their form
- H01B5/14—Non-insulated conductors or conductive bodies characterised by their form comprising conductive layers or films on insulating-supports
Definitions
- Resin structure which has composition for electroconductive pattern formation and electroconductive pattern [cross-reference with related application (s)]
- the present invention relates to a resin structure having a conductive pattern forming composition and a conductive pattern capable of forming a fine conductive pattern on a variety of polymer resin products or resin layers by a simplified process, and exhibiting excellent heat dissipation characteristics.
- a method of forming a conductive pattern by forming a metal layer on the surface of the polymer resin substrate and then applying photolithography or printing a conductive paste may be considered.
- a conductive pattern according to this technique there is a disadvantage that the required process or equipment is too complicated, or difficult to form a good and fine conductive pattern.
- the present invention can form a fine conductive pattern on a variety of polymer resin products or resin layers by a simplified process, and provides a composition for forming a conductive pattern exhibiting excellent heat dissipation characteristics.
- the present invention also provides a resin structure having a conductive pattern formed from the composition for forming a conductive pattern through a conductive pattern forming method.
- a polymer resin A non-conductive metal compound comprising at least one phosphate selected from the group consisting of phosphates represented by Formulas 1 to 4 below;
- the heat dissipating material includes a carbide, a carbon-based material, a nitride-based material, a metal oxide, or a mixture thereof, and a composition for forming a conductive pattern by electromagnetic wave irradiation in which metal nuclei are formed from the non-conductive metal compound by electromagnetic wave irradiation.
- X is a free number between 0.5 and 1
- A is at least one metal selected from the group consisting of Li, Na, Cu, kg, and Au
- B is 1 selected from the group consisting of Sn, Ti, Zn, and Hf. More than one metal,
- y is a ratio of 0 to less than 3
- M 1 is Ti, V, Cr, Mn, Fe, Co, Ni, Y, Zn, Nb, Ma, Tc, Pd, Ag, Ta, W, Pt
- at least one metal selected from the group consisting of Au
- z is 0 or more and less than 2
- M 2 is at least one metal selected from the group consisting of Zn, Mg, Ca, Sr, and Ba.
- a phosphate having a 3c space group having a trigonal structure may be used.
- the phosphate of Formula 1 may be a P1 space group having a triclinic structure or a monoclinic structure. Phosphates with Cc or C2 / c space groups can be used. '
- a phosphate having a P1 space group having a triclinic structure may be used, and as the phosphate of Chemical Formula 3, Cu or M 2 may be in the form of a distorted square pyramid in which five oxygen atoms are distorted. Enclosed structure; Or a structure surrounding Cu or M in the form of a distorted octahedron with six oxygen atoms .
- Phosphate may be used, and as the phosphate of Chemical Formula 4, a phosphate having a P1 space group having a tetragonal structure or a Prima space group having a tetragonal structure may be used.
- non-conductive metal oxides may have an average particle size of 0.1-6.
- the heat dissipating material includes silicon carbide as carbide; Carbon based materials include carbon blocks, carbon nanotubes, abyss, graphene or a mixture thereof; Boron nitride, silicon nitride, aluminum nitride, or a combination thereof;
- the black metal oxide may include magnesium oxide, aluminum oxide, beryllium oxide, zinc oxide or a combination thereof.
- the polymer resin may include a thermosetting resin or a thermoplastic resin, for example, ABS (Acryl oni tile poly-butadiene styrene) resin, polyalkylene terephthalate resin, polyamide resin, polyphenylether resin, polyphenylene sulfide resin, polycarbonate resin, polypropylene resin and polyphthalamide resin It may include one or more selected from.
- composition for forming a conductive pattern according to the embodiment includes the non-conductive metal compound described above in an amount of 0.01 to 10% by weight based on the total composition, and the heat dissipating material in an amount of 1 to 50% by weight based on the total composition It may include, and the remaining amount of polymer resin.
- the conductive pattern forming composition according to the embodiment is one or more additives selected from the group consisting of flame retardants, heat stabilizers, UV stabilizers, lubricants, antioxidants, inorganic fillers, color additives, layer reinforcing agents and functional reinforcing agents It may further include.
- a polymer resin substrate A non-conductive metal compound comprising at least one phosphate selected from the group consisting of phosphates represented by the following Chemical Formulas 1 to 4 dispersed on a polymer resin substrate;
- heat dissipating materials dispersed in a polymer resin substrate include carbides, carbon-based materials, nitride-based materials, metal oxides, or mixtures thereof;
- An adhesive active surface comprising a metal nucleus exposed to a surface of a polymer resin substrate in a predetermined region; And a conductive pattern including a conductive metal layer formed on the adhesive active surface.
- X is a free number between 0.5 and 1
- A is at least one metal selected from the group consisting of Li, Na, Cu, Ag and Au
- B is selected from the group consisting of Sn, Ti, Zn and Hf At least one metal
- y is 0 or more and less than 3
- M 1 is Ti, V, Cr, Mn,
- At least one metal selected from the group consisting of Fe, Co, Ni, Y, Zn, Nb, Mo, Tc, Pd, Ag ⁇ Ta, W, Pt and Au,
- z is a free number less than 0 and less than 2
- M 2 is at least one metal selected from the group consisting of Zn, Mg, Ca, Sr, and Ba.
- the predetermined region in which the adhesive active surface and the conductive metal layer are formed may correspond to a region in which electromagnetic waves are irradiated onto the polymer resin substrate.
- a composition for forming a conductive pattern which enables to form a fine conductive pattern on a polymer resin substrate such as various polymer resin products or resin layers by a very simplified process of irradiating electromagnetic waves such as a laser, and formed therefrom A resin structure having a conductive pattern can be provided.
- the composition for forming a conductive pattern it is possible to mold a resin structure in which the heat dissipation structure is integrated, and meet the needs of those skilled in the art to realize various colors of the resin structure (various polymer resin products or resin layers, etc.). It is possible to easily form a good conductive pattern on such a resin structure while effectively stratifying.
- 1 is a view schematically showing a nasicon three-dimensional structure of an example of the phosphate represented by the formula (1) contained in the composition for forming a conductive pattern according to an embodiment.
- 2 is a view schematically showing a three-dimensional structure belonging to the P 1 space group of the triclinic structure of the phosphate represented by the formula (1) contained in the composition for forming a conductive pattern according to another embodiment.
- FIG 3 is a view schematically showing a three-dimensional structure belonging to the P 1 space group of the triclinic structure of the phosphate represented by the formula (2) contained in the composition for forming a conductive pattern according to another embodiment.
- Figure 4 is a graph showing the absorbance according to the wavelength (nm) of the phosphate represented by the formula (2) of one embodiment. Absorbance is calculated by (lR% * 0.01) 2 /(2ra*0.01) according to Kubelka-Munk equation, and R% is di f fuse reflectance which can be measured by Uv-Vi spectroscopy. .
- FIG 5 is a view schematically showing a three-dimensional structure of Cu 2 P 2 0 7 in the phosphate represented by Formula 3 included in the composition for forming a conductive pattern according to another embodiment.
- FIG. 6 is a view schematically showing a three-dimensional structure belonging to the P 1 space group of the phosphate represented by the formula (4) contained in the composition for forming a conductive pattern according to another embodiment.
- FIG. 7 is a diagram schematically showing a three-dimensional structure belonging to a Pnma space group of phosphates represented by Formula 4 included in a composition for forming a conductive pattern according to another embodiment.
- FIG. 8 is a diagram schematically showing the structure of a conventional electronic component substrate.
- 9 is a view schematically showing the structure of an electronic component substrate manufactured using the composition for forming a conductive pattern according to an embodiment of the present invention.
- FIG. 10 is a view briefly showing an example of a method of forming a conductive pattern by using the composition for forming a conductive pattern according to an embodiment of the present invention.
- compositions for forming a conductive pattern and a resin structure having a conductive pattern formed therefrom according to a specific embodiment of the present invention will be described.
- polymer resin A non-conductive metal compound comprising at least one phosphate selected from the group consisting of phosphates represented by Formulas 1 to 4 below;
- a composition for forming a conductive pattern by electromagnetic wave irradiation including a carbide, carbon-based material, nitride-based material, metal oxide or a mixture thereof as a heat dissipation material, the metal nucleus is formed from the non-conductive metal compound by electromagnetic wave irradiation do.
- X is a free number between 0.5 and 1
- A is at least one metal selected from the group consisting of Li, Na, Cu, kg and Au
- B is selected from the group consisting of Sn, Ti, Zn and Hf At least one metal
- y is 0 or more and less than 3
- M 1 is Ti, V, Cr, Mn,
- At least one metal selected from the group consisting of Fe, Co, Ni, Y, Zn, Nb, Mo, Tc, Pd, Ag, Ta, W, Pt and Au,
- z is a free number less than 0 and less than 2
- M 2 is at least one metal selected from the group consisting of Zn, Mg, Ca, Sr, and Ba.
- a metal nucleus may be formed from the non-conductive metal compound.
- the metal nucleus may be selectively exposed in a predetermined region irradiated with electromagnetic waves to form an adhesive active surface of the polymer resin substrate surface.
- electroless plating with a plating solution containing conductive metal ions, etc., using the metal core as a seed, a conductive metal layer may be formed on an adhesive active surface including the metal core.
- the conductive metal layer that is, the fine conductive pattern may be selectively formed only on the polymer resin substrate of the predetermined region irradiated with the electromagnetic wave.
- the unique three-dimensional structure of the non-conductive metal compound included in the composition of one embodiment Can be mentioned.
- the steric structure of the phosphate which can be used as the non-conductive metal compound according to the embodiment and the optical characteristics according to these structural characteristics will be described in detail.
- Phosphate of the formula (1) while the P0 4 tetrahedral and octahedral B0 6 shared oxygen Depending on the position of the A metal in the three-dimensionally connected basic structure, it may have a space group on various crystal structures.
- the phosphate having X of Formula 1 may have a R?> C space group (nacicon stereostructure) of a trigonal structure as shown in FIG. 1.
- the phosphate of the nacicon structure is three-dimensionally connected while the octahedron of B0 6 and the tetrahedron of P0 4 share oxygen (that is, the three-dimensional solid structure of the entire nacicon structure). And a metal A or ions thereof in a channel formed by the crystal lattice arrangement of the octahedron and tetrahedron.
- the channel may be formed at a position surrounded by six oxygens along the c-axis of the crystal lattice, and the position may be partially filled by the metal A or its ion.
- the metal of A may be freely present in the bondage of any crystal lattice in the three-dimensional structure, so that when the non-conductive metal compound having such a three-dimensional structure is exposed to the stimulation of electromagnetic waves of a specific wavelength, the metal of A or its subsequent release from the material It is expected to be easily separated.
- non-conductive metal compound such as CuSn 2 (P0 4 ) 3
- it is basically chemically stable, but when exposed to electromagnetic waves such as a laser, Cu or Cu 1+ may be easily separated to form a metal nucleus. It has been confirmed that this can be expected to be due to the three-dimensional structure peculiar to the above-described Nasicon solid structure. '
- the pT transition can receive a space group of triclinic structures or a Cc or C2 / c space group of a ⁇ 1 "monolithic structure. 2 is shown.
- 44 442 is changed to 44 442 and element A is located sharing 4 oxygen Can be. However, not all A elements exist in these positions, and may exist only in some positions.
- the 4 4 442 site may be an M2 site that shares four oxygens, such as C2 / c.
- the A element is located only in a part of the M2 site.
- the oxidation number may be changed from monovalent to divalent.
- X in Formula 1 will have a value between 0.5 and 1.
- the crystal structure of the phosphate represented by Chemical Formula 1 may be determined according to the type of metal included in the phosphate and the phase transition that occurs according to the firing temperature in the synthesis of the phosphate.
- a non-conductive metal compound having a group of 8 ′′ 3 spaces of a trigonal structure, which is a stable phase may be obtained.
- the phosphate of formula (1) belonging to the ri space group of the triclinic structure is lower than the trigonal structure is obtained
- Phosphates of formula (1) belonging to the Cc or C2 / c space group of the monoclinic structure, which is black or black can be obtained.
- non-conductive metal compounds having R3C space groups of some trigonal structures may be synthesized even when low temperature calcining is used, or P1 space groups or monoclinic structures of some triclinic structures when high temperature firing is used.
- a non-conductive metal compound having a Cc or C2 / c space group of: can be synthesized.
- the phosphate of formula (1) having such a P1 , Cc or C2 / c space group like the phosphate of formula (1) of the nacicon structure described above, was formed by molding a polymer resin product or a resin layer using a composition for forming a conductive pattern including the same. Afterwards, when electromagnetic waves such as a laser are irradiated to a predetermined region, a metal nucleus is released from the phosphate having the above structure. Can be formed.
- the phosphate of Formula 1 having the ri , Cc or C2 / c space group is chemically stable in a general environment, but in a region exposed to electromagnetic waves of a specific wavelength, the metal or its ions present in the Si te from the material It can be easily separated. Therefore, the metal nucleus can be more easily formed by irradiation of the electromagnetic waves.
- the phosphate represented by Chemical Formula 2 may have a tr i cl ini c system structure having the least symmetry among 7 crystal systems.
- the phosphate of Chemical Formula 2 may belong to the ri space group. 3, the triclinic system structure of such a nonconductive metal compound is schematically shown.
- the non-conductive metal compound having a triclinic structure may be positioned at two kinds of sites.
- the non-conductive metal compound may include a Ml site in which one Cu or M 1 is coordinated by four oxygen to form a local symmetry of a square plane or square pl anar.
- One Cu or M 1 may be located at the M2 site coordinated by five oxygens to achieve local symmetry of the trigonal bipyramid.
- the non-conductive metal compound may include a tetrahedron of P0 4 in which one P is coordinated by four oxygen to form local symmetry.
- Such local symmetric parts may be connected in three dimensions while sharing oxygen as shown in FIG. 3 to form a triclinic system.
- the non-conductive metal compound is a square planar Cu0 4 or M0 4 as shown in Figure 3; Cu0 5 or M0 5 of trigonal bipyramids; And it may have a three-dimensional structure in which the tetrahedron P0 4 is three-dimensionally connected while sharing oxygen.
- the phosphate of Chemical Formula 2 has a low absorbance in the visible region (about 300 Hz to 700 nm) as shown in FIG. 4 (horizontal axis: wavelength (nm), vertical axis: absorbance), and in the near infrared to infrared region (about 700 nm to 3000 nm).
- High absorbance causes a strong absorption in the near infrared region of the phosphate is teurigo Cu0 5 the forming due to the local symmetry of the day-by-pyramid (tr igonal bypyramid). For that reason, firstly, Cu 2+ present in the center of the trigonal bipyramid has a central symmetry.
- the transition between energy levels resulting from this crystal structure includes less visible light region (about 300 nm to 700 nm) and a considerable portion of near infrared to infrared region (about 700 nm to 3000 nm). Accordingly, the non-conductive metal compound has low absorbance in the visible light region and high absorbance in the near infrared to infrared region, and can easily form a metal nucleus by reacting well to the stimulation of electromagnetic waves having a near infrared wavelength while having a bright color.
- the optical properties of compounds containing transition metals are related to the energy levels of d-orbitals.
- the energy level of the d-orbital of the transition metal depends on the local symmetry of the metal atom and the ligand. Is divided into several (crystal field theory).
- a dd transition of a transition metal is transferred to high energy levels, which is called a dd transition of a transition metal.
- the phosphate of Formula 3 may exhibit optical properties due to dd transition.
- the transition between energy levels resulting from the structure of Chemical Formula 3 includes less visible light region (about 300 nm to 700 nm) and a substantial portion of near infrared to infrared region (about 700 nm to 3000 nm).
- the absorbance of the silver visible region (about 300 nm to 700 nm) is low, and the absorbance of the near infrared to infrared region (about 700 nm to 3000 nm) may exhibit high characteristics.
- the structure formed by M 2 and the ligand may be modified.
- X in Formula 3 satisfies a condition of 0 ⁇ x ⁇ 2, and M 2 is at least one metal selected from the group consisting of Ca, Sr, and Ba; Or when X is 0, the phosphate of Formula 3 surrounds Cu or M 2 , the central atom of local symmetry, in the form of a distorted square pyramid with five oxygen atoms distorted. It may include a structure.
- FIG. 5 schematically shows the structure of Cu 2 P 2 0 7 as an example of the phosphate salt represented by Chemical Formula 3.
- FIG. 5 schematically shows the structure of Cu 2 P 2 0 7 as an example of the phosphate salt represented by Chemical Formula 3.
- the phosphate of Formula 3 when X in Formula 3 satisfies the condition of 0 ⁇ x ⁇ 2 and M 2 is at least one metal selected from the group consisting of Zn and Mg, the phosphate of Formula 3 is the center of local symmetry. It may include a structure surrounding the atoms Cu or M in the form of distorted octahedral six oxygen atoms.
- the d-orbital energy level of Cu 2+ may be formed to absorb electromagnetic waves in the near infrared region. Therefore, the phosphate of Chemical Formula 3 can easily form a metal core by electromagnetic waves in the near infrared region.
- Cu 2+ in the center of the distorted square pyramid is located at a non-centrosymmetric site, allowing Laporte allowed transition in the d_orbital of Cu 2+ . .
- X is 0;
- M 2 is at least one metal selected from the group consisting of Ca, Sr and Ba, the phosphate of formula 3 exhibits a strong absorption band in the near infrared region to show electromagnetic waves in the near infrared region It is possible to form a metal nucleus more easily by.
- phosphate it may be used that has a three-dimensional structure belonging to the space group of the Prima triclinic crystal system (Triclinic) rJ structure of the space group (space group) or orthorhombic (Orthorhombic) structure.
- the P1 space group structure and the Pima space group structure according to one example of Cu 4 P 2 0 9 are schematically shown in FIGS. 6 and 7, respectively.
- copper ions may be located at Ml, M2, M3, and M4 sites, and copper ions located at Ml and M3 sites may be formed by five oxygens. Coordination results in local symmetry of pentaedron, and copper ions located at M2 and M4 sites are coordinated by four oxygens to achieve local symmetry of the square plane. P can then achieve local symmetry of tetrahedron with four oxygens. remind
- Cu 4 P 2 0 9 may have a three-dimensional structure in which Cu0 5 of the pentaheadone, Cu0 4 of the square plane, and P0 4 of the tetrahedron share oxygen and are three-dimensionally connected to each other.
- This steric structure may be referred to as a ⁇ 1 space group structure.
- Cu 4 P 2 0 9 copper ions may be located at Ml, M2, and M3 sites, and copper ions located at Ml, M2, and M3 sites may be coordinated by five oxygen groups to pentahead. Local symmetry of the pentahedron can be achieved. P can then achieve local symmetry of tetrahedron with four oxygens.
- the Cu 4 P 2 0 9 may have a three-dimensional structure in which Cu0 5 of the pentaheadone and P0 4 of the tetrahedron share oxygen with each other and are three-dimensionally connected, and the three-dimensional structure is referred to as a Pnma space group structure. Can be.
- the P 1 black or Pnma space group structure of the phosphate represented by Formula 4 includes the local symmetry of the pentaheadron formed by Cu0 5 as described above, and the local symmetry site is a site having no central symmetry (non- Because of the cent rosymmetr icsi te, the copper ions located at this site are capable of Laporte al lowed transit ion.
- the transition between energy levels due to this crystal structure of C114P2O9 mostly occurs in the near infrared to infrared region.
- the phosphates of Formulas 1 to 4 have excellent compatibility with the polymer resin, and have a property of maintaining chemical conductivity by being chemically stable with respect to the solution used for the reduction or plating treatment. Therefore, in the region where electromagnetic waves are not irradiated, the non-conductive metal compound may be chemically stable while being uniformly dispersed in the polymer resin substrate, thereby exhibiting non-conductivity. From the malleable metal compound, the metal nucleus is easily formed on the principle described above, and thus a fine conductive pattern can be easily formed.
- composition of the embodiment described above it is possible to form a fine conductive pattern in a very simplified process of irradiating electromagnetic waves, such as a laser, on a high-polymer resin substrate such as various polymer resin products or resin layers.
- the non-conductive metal compound included in the composition according to one embodiment Since it shows a bright color, it is possible to stably implement a polymer resin product or a resin layer of various colors such as white or gray even with the use of relatively few color additives. For example, as a compound such as CuCr 2 O 4 having a spinel structure exhibits a dark black color, a composition including such a non-conductive metal compound is not suitable for implementing polymer resin products or resin layers of various colors. You may not.
- the phosphate of Formulas 1 to 4 since the phosphate of Formulas 1 to 4 has a bright color, it is possible to more stably implement polymer resin products of various colors such as white or gray with the addition of less color additives. Therefore, when using the phosphate represented by the above-described three-dimensional structure of the three-dimensional structure as the non-conductive metal compound can satisfy the needs of the art to implement a variety of colors, such as various polymer resin products.
- one or more black or two kinds of phosphates represented by Chemical Formulas 1 to 4 may be used.
- CuSn 2 ( P0 4 ) 3 , Cu 3 P 2 O 8 , Cu 2 P 2 O 7 , CU 4 P 2 O 9 , and the like may be used.
- the average particle size of the non-conductive metal compound included in the composition according to the embodiment may be adjusted to about 0.01 to 6 / / / 1.
- Such a non-conductive metal compound exhibits excellent compatibility with the polymer resin, exhibits non-conductivity in the region where electromagnetic waves are not irradiated, and can form a fine conductive pattern evenly by selectively forming metal ⁇ only in the irradiated region of electromagnetic waves.
- the non-conductive metal compound may be included in an amount of about 0.01 wt% to 10 wt% based on the total composition. According to this content range, while maintaining the basic physical properties such as the mechanical properties of the polymer resin product or the resin layer formed from the composition, it can preferably exhibit the characteristics of forming a conductive pattern in a certain region by electromagnetic wave irradiation.
- the composition according to the embodiment may exhibit excellent thermal conductivity and thermal diffusivity, including heat radiation. Accordingly, using the composition according to the embodiment can omit the heat dissipation structure such as the existing heat dissipator black heat dissipation layer. Thereby, a simplified electronic product can be provided.
- the conventional electronic component substrate essentially employs a heat sink 3 to prevent the temperature rise of the PCB substrate 1 as shown in FIG. 8.
- the composition according to the embodiment can be integrated to the existing PCB substrate 1, the heat shank 3 and the blanket (4).
- the composition according to the embodiment may include carbide, carbon-based material, nitride-based material, metal oxide or a combination thereof as the heat dissipating material. More specifically, silicon carbide (SiC) or the like is included, or carbon black (carbon bl ack), carbon nanotube (carbon nanotube, CNT), graphi te, graphene (graphene) or the like as a carbon-based material
- SiC silicon carbide
- CNT carbon nanotube
- graphene graphene
- These mixtures include boron nitride (BN), silicon nitride (Si 3 B 4 ), aluminum nitride (A1N) or a mixture thereof, or the like, or as a metal oxide, magnesium oxide (MgO). ), Aluminum oxide (A1 2 0 3 ), beryllium oxide (BeO), zinc oxide (ZnO), or a combination thereof.
- Such a heat dissipating material is excellent in compatibility with polymer resins without affecting the formation of metal nuclei by electromagnetic wave irradiation of a non-conductive metal compound, thereby providing a resin product black resin layer having excellent heat dissipation characteristics in which a good conductive pattern is formed.
- the heat dissipating material in the composition according to the embodiment may be included in the range of about 0.01 to about 50% by weight based on the total composition to exhibit a desired level of heat dissipation characteristics.
- the heat dissipation material is a carbide or carbon-based material
- the content of the heat dissipation material may be adjusted to 0.01 to 20% by weight in order to maintain insulation characteristics. According to this content range, while maintaining the basic physical properties of the polymer resin product or the resin layer formed from the composition, it may preferably exhibit a certain level of heat diffusion and thermal conductivity.
- the polymer resin any heat that can form a variety of polymer resin products or resin layers Curable resins or thermoplastic resins can be used without particular limitation.
- the non-conductive metal compound described above may exhibit excellent compatibility and uniform dispersibility with various polymer resins, and the composition of one embodiment may be molded into various resin products or resin layers including various polymer resins.
- polymer resins include polyalkylene terephthalate resins such as ABS (Acrylonitile poly-butadiene styrene) resins, polybutylene terephthalate resins or polyethylene terephthalate resins, polyamide resins, polyphenylether resins, and polyphenylenes. Sulfide resins, polycarbonate resins, polypropylene resins, polyphthalamide resins, and the like. In addition, various polymer resins may be included.
- ABS Acrylonitile poly-butadiene styrene
- polybutylene terephthalate resins or polyethylene terephthalate resins polyamide resins
- polyphenylether resins polyphenylether resins
- Sulfide resins polycarbonate resins
- polypropylene resins polypropylene resins
- polyphthalamide resins and the like.
- various polymer resins may be included.
- the non-conductive metal compound may be included in about 0.1 to 10% by weight based on the total composition
- the heat dissipating material may be included in about 1 to 50 weight 3 ⁇ 4 of the total composition
- the remaining amount of polymer resin may be included.
- the heat dissipation material is a carbide and / or carbon-based material
- the heat dissipation material is included in about 1 to 20% by weight based on the total composition, the remaining content may be replaced by a polymer resin.
- the content range while maintaining the basic physical properties such as the mechanical properties of the polymer resin product or the resin layer formed from the composition as appropriate, it can preferably exhibit the characteristics and heat dissipation characteristics to form a conductive pattern in a certain region by electromagnetic wave irradiation.
- the conductive pattern forming composition may be used as a flame retardant, a heat stabilizer, a UV stabilizer, a lubricant, an antioxidant, an inorganic filler, a color additive, a layer reinforcing agent, and a functional reinforcing agent, in addition to the polymer resin and the predetermined non-conductive metal compound and the heat dissipating material. It may further comprise one or more additives selected from the group consisting of. By the addition of such additives, it is possible to appropriately reinforce the physical properties of the obtained resin structure by the composition of the embodiment. Among these additives, in the case of the color additive, for example, a pigment, etc., it may be included in an amount of about 0.1 to 10% by weight or about 1 to 10% by weight, to impart a desired color to the resin structure.
- color additives such as pigments include white pigments such as ZnO, ZnS, Talc, Ti0 2 , Sn0 2 , or BaS0 4 .
- color additives such as pigments of various kinds and colors known to be usable in the composition can be used.
- the flame retardant may include a phosphorus-based flame retardant and an inorganic flame retardant. More specifically, the phosphorus flame retardant may be triphenyl phosphate (tr iphenyl phosphate, TPP), trixylenyl phosphate (tr ixylenyl phosphate, TXP), tricresyl phosphate (tr i cresyl phosphate, TCP), or triisophenyl Phosphate ester flame retardants, including phosphate (tr ii sophenyl phosphate, RE0F0S); Aromatic polyphosphate-based flame retardants; Polyphosphate flame retardants; Alternatively, red phosphorus-based flame retardants may be used, and various phosphorus-based flame retardants known to be usable in the resin composition may be used without any particular limitation.
- TPP triphenyl phosphate
- TXP trixylenyl phosphate
- TXP trixylenyl
- the inorganic flame retardant may include aluminum hydroxide, magnesium hydroxide, zinc borate, molybdenum oxide (Mo0 3 ), molybdenum peroxide salt (Mo 2 0 7 2 —), chamomile-zinc-molybdate, antimony trioxide (Sb 2 0 3 ) Or antimony pentoxide (Sb 2 0 5 ) and the like.
- examples of the inorganic flame retardant are not limited thereto, and various inorganic flame retardants known to be usable in other resin compositions may be used without any particular limitation.
- a layer reinforcing agent etc., it is included in an amount of about 1 to 12 wt. 3 ⁇ 4, and in the case of a heat stabilizer UV stabilizer, a lubricant or an antioxidant, it is included in an amount of about 0.05 to 5 wt%, and the desired physical properties of the resin structure. It can express suitably.
- a method of forming a conductive pattern by direct irradiation of electromagnetic waves on a polymer resin substrate such as a resin product or a resin layer using the composition for forming a conductive pattern according to the above-described embodiment will be described in detail. .
- Such a method of forming a conductive pattern may include forming the resin layer by molding the above-described composition for forming a conductive pattern into a resin product or by applying it to another product; Irradiating an electromagnetic wave to a predetermined region of the resin product or the resin layer to generate metal nuclei from the non-conductive metal compound particles; And chemically reducing or plating the region generating the metal nucleus to form a conductive metal layer.
- the above-described composition for forming a conductive pattern may be molded into a resin product or applied to another product to form a resin layer.
- a product molding method or a resin layer forming method using the phosphorus polymer resin composition may be applied without particular limitation.
- the composition for forming the conductive pattern is extruded and engraved, and then formed into pellets or particles, and then injection molded into a desired form to produce various polymer resin products. Can be.
- the polymer resin product or the resin layer thus formed may have a form in which the specific non-conductive metal compound and the heat dissipating material described above are uniformly dispersed on the resin substrate formed from the polymer resin.
- the phosphate of Chemical Formulas 1 to 4 since the phosphate of Chemical Formulas 1 to 4 have excellent compatibility and chemical stability with various polymer resins, the phosphate of Chemical Formulas 1 to 4 may be uniformly dispersed throughout the entire region of the resin substrate and maintained in a non-conductive state.
- electromagnetic waves such as a laser may be irradiated to a predetermined region of the resin product or the resin layer to form the conductive pattern. .
- metal nuclei can be easily generated from the non-conductive metal compound (see the second drawing of FIG. 10).
- the metal nucleus generation step is performed by the electromagnetic wave irradiation, a portion of the non-conductive metal compound is exposed to the surface of a predetermined region of the resin product or the resin layer, and a metal nucleus is generated therefrom. It is possible to form an adhesively active surface activated to have. As the adhesion-activated surface is selectively formed only in a predetermined region irradiated with electromagnetic waves, when the reduction or plating step described below is performed, the metal nucleus and the conductive metal ions included in the adhesion-activated surface are chemically reduced, and thus the conductivity The metal layer may be selectively formed on the polymer resin substrate in the predetermined region.
- laser electromagnetic waves in the near infrared region can be irradiated, for example, from about 100 to Laser electromagnetic waves having a wavelength of 1200 nm, or about 1060 nm to 1070 nm, or about 1064 nm may be irradiated with an average power of about 1 to 20 W, or about 3 to 10 W.
- the irradiation conditions of electromagnetic waves such as lasers are controlled in this range, a metal core and an adhesive active surface including the same can be better formed from the non-conductive metal compound, thereby enabling formation of a better conductive pattern.
- the electromagnetic wave irradiation conditions for forming the metal nucleus may be controlled differently depending on the specific types of the non-conductive metal compounds and the polymer resins actually used or their composition, the electromagnetic wave irradiation conditions for forming the metal nucleus may be controlled differently.
- the conductive metal layer may be formed by chemically reducing or plating the region where the metal nucleus is generated.
- the conductive metal layer may be selectively formed in a predetermined region where the metal nucleus and the adhesive active surface are exposed, and the chemically stable non-conductive metal compound may maintain the non-conductivity as it is. have. Accordingly, a fine conductive pattern may be selectively formed only in a predetermined region on the polymer resin substrate.
- the resin product or the resin layer which generated the metal nucleus may be treated with an acidic or basic solution including a reducing agent, and such a solution may be formaldehyde, hypophosphite, dimethylaminoborane (DMAB) as a reducing agent. It may include one or more selected from the group consisting of, diethylaminoborane (DEAB) and hydrazine.
- the resin product or resin layer generating the metal core may be treated with an electroless plating solution containing a reducing agent and conductive metal ions.
- the metal silver contained in the metal core is reduced, or the conductive metal ions contained in the electroless plating solution are chemically reduced by using the seed as a seed in a region where the metal core is formed.
- Optionally good conductive patterns can be formed in the region.
- the metal nucleus and the adhesion-activated surface may form strong bonds with the chemically reduced conductive metal ions, and as a result, a conductive pattern may be more easily formed in a predetermined region.
- a resin structure having a conductive pattern obtained by the above-described composition for forming a conductive pattern and a conductive pattern forming method.
- Such a resin structure includes a polymer resin substrate; A non-conductive metal compound comprising at least one phosphate selected from the group consisting of phosphates represented by Formulas 1 to 4 dispersed in a polymer resin substrate; Examples of heat dissipating materials dispersed in a polymer resin substrate include carbides, carbon-based materials, nitride-based materials, metal oxides, or mixtures thereof; An adhesive active surface comprising a metal nucleus exposed to a surface of a polymer resin substrate in a predetermined region; And it may include a conductive metal layer formed on the adhesive active surface.
- a predetermined region in which the adhesive active surface and the conductive metal layer are formed may correspond to a region in which electromagnetic waves are irradiated onto the polymer resin substrate.
- the metal contained in the metal nucleus on the adhesion-activated surface or its ions may be derived from the non-conductive metal compound.
- the conductive metal layer may be derived from the metal contained in the non-conductive metal compound, or may be derived from the conductive metal ions contained in the electroless plating solution.
- the resin structure may further include a residue derived from ' , the non-conductive metal compound.
- a residue may have a structure * in which at least a part of the metal included in the non-conductive metal compound is released, and vacancy is formed in at least part of the site.
- the resin structure described above is a mobile phone or tablet having a conductive pattern for an antenna
- Polybutylene terephthalate resin, a basic resin, and Cu 3 P 2 0 8 were used as a graphi te and a non-conductive metal compound as a heat dissipating material, and heat stabilizers (IR1076, PEP36) as additives for process and stabilization.
- a UV stabilizer (UV329), a lubricant (EP184) and a layer reinforcement (S2001) were used together to prepare a composition for forming a conductive pattern by electromagnetic wave irradiation. Specifically, the composition was obtained by mixing 69% by weight of polybutylenecerephthalate resin, 5% by weight of a non-conductive metal compound> 15% by weight, 10% by weight of impact modifier and 1% by weight of other additives including lubricant.
- composition prepared above was extruded through an extruder at a temperature of 260 to 280 ° C.
- the composition in the form of extruded pellets was injection molded into a 100 mm diameter, 2 mm thick substrate at about 260 to 270 ° C.
- the surface was activated by irradiating a laser of 1064 nm wavelength under the conditions of 40 kHz. Then, the electroless plating process was performed on the resin structure whose surface was activated by the laser irradiation as follows.
- Plating solution was prepared using MSMID-70 provided by MS Co., Ltd.
- the manufacturing process is as follows. 40 ml of Cu solution (MSMID-70A), 120 ml of complexing agent (MSMID-70B), 3.5 ml of co-complexing agent (MSMID-70C), 2 ml of stabilizer (MSMID-70D) in 700 ml of deionized water
- the solution was prepared. 45 ml of 23 ⁇ 4 NaOH and 12 ml of 37% formaldehyde were added to 1 L of the prepared plating solution.
- the resin structure whose surface was activated with a laser was immersed in the plating solution for 3 to 5 hours, and then washed with distilled water.
- the resin structure irradiated with the laser formed a good conductive pattern (or plating layer) on the adhesion-activated surface containing the metal nucleus through electroless plating.
- Example 3 Formation of Conductive Pattern by Laser Direct Irradiation
- Example 1 Except for using Cu 4 P 2 0 9 instead of Cu 3 P 2 0 8 as a non-conductive metal compound in Example 1 to prepare a composition for forming a conductive pattern in the same manner as in Example 1, having a conductive pattern therefrom The resin structure was prepared. Comparative Example 1: Formation of a Conductive Pattern by Laser Direct Irradiation
- Example 2 Formation of Conductive Pattern by Laser Direct Irradiation
- Example 3 Formation of Conductive Pattern by Laser Direct Irradiation
- Example 1 In a non as conductive metal compound Cu 3 P 2 0 8 instead of Cu 2 (0H) conductive pattern except that the P0 4, and preparing the composition for conductive pattern forming in the same i way as in Example 1, and from which A resin structure having was prepared.
- the adhesion performance of the conductive patterns (or plating layers) formed on the resin structures of Examples and Comparative Examples was evaluated by a cross-cut test by the ISO 2409 standard method.
- the cl ass 0 grade means that the peeling area of the conductive pattern is 0% of the conductive pattern area to be evaluated
- the cl ass 1 rating indicates that the peeling area of the conductive pattern is the conductive pattern area to be evaluated.
- 0% of It means more than 5%.
- the cl ass 2 grade means that the peeling area of the conductive pattern is greater than 5% and 15% or less of the conductive pattern area to be evaluated.
- the class 3 grade means that the peeling area of the conductive pattern is more than 15% and 35% or less of the conductive pattern area to be evaluated.
- c lass 4 means that the peeling area of the conductive pattern is greater than 35% and less than or equal to 65% of the conductive pattern area to be evaluated.
- the cl ass 5 grade means that the peeling area of the conductive pattern is greater than 65% of the conductive pattern area to be evaluated.
- a load determined according to the size of the specimen was applied to the specimen (in this example, a load of 4.6 kgf / cm 2 ), the specimen was immersed in oil, preheated for 3 to 5 minutes and the oil was heated to 120 ° C / hour. Heated at rate. As the oil silver is raised, the specimen sags. The temperature at 0.254 mm sag was measured and defined as the heat deflection temperature.
- the peeling area of the conductive patterns (black plating layer) formed according to Examples 1 to 3 and Comparative Example 1 is about the area of the conductive pattern to be tested. At 0% (IS0 cl ass 0), it was confirmed that the conductive pattern showing high adhesion to the laser irradiation area was formed satisfactorily.
- the peeling area of the conductive pattern formed according to Comparative Example 2 is greater than 65% (ISO cl ass 5) of the conductive pattern to be tested, and the peeling area of the conductive pattern formed according to Comparative Example 3 is more than 15% of the conductive pattern to be tested At 35% or less (ISO cl ass 3), it is confirmed that the adhesion of the conductive pattern to the resin structure is remarkably low compared with Examples 1 to 3.
- the resin structure of Comparative Example 1 in which Cu 3 P 2 O 8 was added as a non-conductive metal compound but no heat-dissipating material was formed, had a good conductive pattern by electromagnetic wave irradiation, but the thermal conductivity and thermal deformation temperature of the resin were very high. The results were low.
- the resin structures of Examples 1 to 3 using Cu 3 P 2 0 8 or Cu 4 P 2 0 9 as the non-conductive metal compound and graphi te or BN as the heat dissipating material form satisfactorily a conductive pattern by electromagnetic wave irradiation.
- the resin structure of Comparative Example 3 to which the non-conductive metal compound and the heat dissipating material which do not belong to the non-conductive metal compound of the present invention exhibited lower thermal conductivity than the resin structure of Comparative Example 2 using only the heat dissipating material.
- the non-conductive metal compound proposed in the present invention exhibits a more improved heat dissipation effect than the heat dissipation effect of the heat dissipation material itself while maintaining high adhesion of the conductive pattern in combination with the heat dissipation material.
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Abstract
Description
【명세서】 【Specification】
【발명의 명칭】 [Name of invention]
도전성 패턴 형성용 조성물 및 도전성 패턴을 가지는 수지 구조체 【관련 출원 (들)과의 상호 인용】 Resin structure which has composition for electroconductive pattern formation and electroconductive pattern [cross-reference with related application (s)]
본 출원은 2014년 9월 17일자 한국 특허 출원 제 10-2014-0123893 호 및 This application is filed with Korean Patent Application No. 10-2014-0123893 filed Sep. 17, 2014 and
2015년 9월 16일자 한국 특허 출원 제 10-2015-0130982 호에 기초한 우선권의 이익을 주장하며, 해당 한국 특허 출원의 문헌에 개시된 모든 내용은 본 명세서의 일부로서 포함된다. Claims the benefit of priority based on Korean Patent Application No. 10-2015-0130982 filed on September 16, 2015, and all the contents disclosed in the documents of that Korean Patent Application are incorporated as part of this specification.
【기술분야】 Technical Field
본 발명은 각종 고분자 수지 제품 또는 수지층 상에 단순화된 공정으로 미세한 도전성 패턴을 형성할 수 있으며, 우수한 방열 특성을 나타내는 도전성 패턴 형성용 조성물 및 도전성 패턴을 가지는수지 구조체에 관한 것이다. The present invention relates to a resin structure having a conductive pattern forming composition and a conductive pattern capable of forming a fine conductive pattern on a variety of polymer resin products or resin layers by a simplified process, and exhibiting excellent heat dissipation characteristics.
【배경기술】 Background Art
최근 들어 미세 전자 기술이 발전함에 따라, 각종 수지 제품 또는 수지층 등의 고분자 수지 기재 (또는 제품) 표면에 미세한 도전성 패턴이 형성된 구조체에 대한 요구가 증대되고 있다. 이러한 고분자 수지 기재 표면의 도전성 패턴은 전자 기기 케이스에 일체화된 안테나, 각종 센서, MEMS 구조체, RFID 태그 또는 각종 회로 기판 등의 다양한 대상물을 형성하는데 적용될 수 있다. 이와 같이, 고분자 수지 기재 표면에 도전성 패턴을 형성하는 기술에 대한 관심이 증가하면서, 이에 관한 몇 가지 기술이 제안된 바 있다. 그러나, 아직까지 이러한 기술을 보다 효과적으로 이용할 수 있는 방법은 제안되지 못하고 있는 실정이다. In recent years, with the development of fine electronic technology, there is an increasing demand for structures in which fine conductive patterns are formed on the surface of polymer resin substrates (or products) such as various resin products or resin layers. The conductive pattern on the surface of the polymer resin substrate may be applied to form various objects such as antennas, various sensors, MEMS structures, RFID tags, or various circuit boards integrated in an electronic device case. As such, as the interest in the technology of forming the conductive pattern on the surface of the polymer resin substrate increases, some techniques related thereto have been proposed. However, there is no proposal to use such technology more effectively.
예를 들어, 이전에 알려진 기술에 따르면, 고분자 수지 기재 표면에 금속층을 형성한 후 포토리소그라피를 적용하여 도전성 패턴을 형성하거나, 도전성 페이스트를 인쇄하여 도전성 패턴을 형성하는 방법 등이 고려될 수 있다. 그러나, 이러한 기술에 따라 도전성 패턴을 형성할 경우, 필요한 공정 또는 장비가 지나치게 복잡해지거나, 양호하고도 미세한 도전성 패턴을 형성하기가 어려워지는 단점이 있다. For example, according to a known technique, a method of forming a conductive pattern by forming a metal layer on the surface of the polymer resin substrate and then applying photolithography or printing a conductive paste may be considered. However, when forming a conductive pattern according to this technique, there is a disadvantage that the required process or equipment is too complicated, or difficult to form a good and fine conductive pattern.
이에 보다 단순화된 공정으로 고분자 수지 기재 표면에 미세한 도전성 패턴을 보다 효과적으로 형성할 수 있는 기술의 개발이 이전부터 요구되고 있는 실정이다. Therefore, the development of a technology that can more effectively form a fine conductive pattern on the surface of the polymer resin substrate in a simplified process has been required before. It is true.
한편, 각종 전기 /전자 제품 및 자동차용 부품의 경우 소자의 고집적화 및 발열 소자의 채용 등으로 인해 도전성 회로 기판의 온도를 상승시켜 제반 성능을 악화시키고 안전성 및 수명을 저하시키는 문제가 있었다. 이에, 이러한 문제를 해결하기 위해 각종 전기 /전자 제품 및 자동차용 부품에 고방열 구초체가 필수적으로 채용되고 있다. 그러나, 통상적으로 사용되는 금속 알루미늄과 같은 방열판으로 인해 최근 전자 기기의 소형화 및 경량화 추세를 따라가지 못하고 있으며, 제조 공정이 복잡하다는 문제가 발생되고 있다. 이에 따라, 전자 기기의 기존의 기능을 그대로 발현하면서도 경량화 및 소형화하기 위한 기술 깨발이 요구되고 있는 실정이다. On the other hand, in the case of various electrical / electronic products and automotive parts, there is a problem of increasing the temperature of the conductive circuit board due to the high integration of the device and the adoption of the heat generating device to deteriorate overall performance and to reduce safety and lifespan. Accordingly, in order to solve such a problem, high heat dissipation spheres are indispensably employed in various electric / electronic products and automobile parts. However, due to heat sinks such as metal aluminum, which are commonly used, recent trends of miniaturization and light weight of electronic devices have not been made, and a problem arises in that the manufacturing process is complicated. Accordingly, there is a demand for technology development to reduce weight and size while expressing existing functions of electronic devices.
[발명의 내용] [Content of invention]
【해결하려는 과제】 [Problem to solve]
본 발명은 각종 고분자 수지 제품 또는 수지층 상에 단순화된 공정으로 미세한 도전성 패턴을 형성할 수 있으며, 우수한 방열 특성을 나타내는 도전성 패턴 형성용 조성물을 제공한다. The present invention can form a fine conductive pattern on a variety of polymer resin products or resin layers by a simplified process, and provides a composition for forming a conductive pattern exhibiting excellent heat dissipation characteristics.
본 발명의 또한, 상기 도전성 패턴 형성용 조성물로부터 도전성 패턴 형성 방법을 통해 형성된 도전성 패턴을 가지는 수지 구조체를 제공하는 것이다. 【과제의 해결 수단】 The present invention also provides a resin structure having a conductive pattern formed from the composition for forming a conductive pattern through a conductive pattern forming method. [Measures of problem]
발명의 일 구현예에 따르면, 고분자 수지; 하기 화학식 1 내지 4로 표시되는 인산염으로 이루어진 군에서 선택된 1종 이상의 인산염을 포함하는 비도전성 금속 화합물; 방열 소재로서 탄화물, 탄소계 소재, 질화계 소재, 금속 산화물 또는 이들의 흔합물을 포함하고, 전자기파 조사에 의해, 상기 비도전성 금속 화합물로부터 금속핵이 형성되는 전자기파 조사에 의한 도전성 패턴 형성용 조성물이 제공된다. According to one embodiment of the invention, a polymer resin; A non-conductive metal compound comprising at least one phosphate selected from the group consisting of phosphates represented by Formulas 1 to 4 below; The heat dissipating material includes a carbide, a carbon-based material, a nitride-based material, a metal oxide, or a mixture thereof, and a composition for forming a conductive pattern by electromagnetic wave irradiation in which metal nuclei are formed from the non-conductive metal compound by electromagnetic wave irradiation. Is provided.
[화학식 1] [화학식 2] [Formula 1] [Formula 2]
[화학식 3] [Formula 3]
Cu2-zM2 zP207 [화학식 4] Cu 2 - z M 2 z P 2 0 7 [Formula 4]
Cu4P209 Cu 4 P 2 0 9
상기 화학식 1에서 X는 0.5 내지 1 사이의 유리수이고 A는 Li, Na, Cu, kg 및 Au로 이루어진 군에서 선택된 1종 이상의 금속이고, B는 Sn, Ti, Zn 및 Hf로 이루어진 군에서 선택된 1종 이상의 금속이고, In Formula 1, X is a free number between 0.5 and 1, and A is at least one metal selected from the group consisting of Li, Na, Cu, kg, and Au, and B is 1 selected from the group consisting of Sn, Ti, Zn, and Hf. More than one metal,
상기 화학식 2에서 y는 0 이상 3 미만의 유리수이고, M1은 Ti, V, Cr, Mn, Fe, Co, Ni, Y, Zn, Nb, Ma, Tc, Pd, Ag, Ta, W, Pt 및 Au로 이루어진 군에서 선택돤 1종 이상의 금속이고, In Formula 2, y is a ratio of 0 to less than 3, M 1 is Ti, V, Cr, Mn, Fe, Co, Ni, Y, Zn, Nb, Ma, Tc, Pd, Ag, Ta, W, Pt And at least one metal selected from the group consisting of Au,
상기 화학식 3에서 z는 0 이상 2 미만의 유리수이고, M2는 Zn, Mg, Ca, Sr 및 Ba으로 이루어진 군에서 선택된 1종 이상의 금속이다. In Chemical Formula 3, z is 0 or more and less than 2, and M 2 is at least one metal selected from the group consisting of Zn, Mg, Ca, Sr, and Ba.
일 예로, 상기 화학식 1의 인산염으로는 삼방정계 구조의 3c 공간군을 갖는 인산염이 사용될 수 있다」 또한, 다른 일 예로, 상기 화학식 1의 인산염으로는 삼사정계 구조의 P1 공간군 또는 단사정계 구조의 Cc 또는 C2/c 공간군을 갖는 인산염이 사용될 수 있다. ' For example, as the phosphate of Formula 1, a phosphate having a 3c space group having a trigonal structure may be used. In addition, as another example, the phosphate of Formula 1 may be a P1 space group having a triclinic structure or a monoclinic structure. Phosphates with Cc or C2 / c space groups can be used. '
한편, 상기 화학식 2의 인산염으로는 삼사정계 구조의 P1 공간군을 갖는 인산염이 사용될 수 있고, 상기 화학식 3의 인산염으로는 Cu 또는 M2을 5개의 산소 원자가 왜곡된 스퀘어 피라미드 (distorted square pyramid) 형태로 둘러싸는 구조; 또는 Cu 또는 M을 6개의 산소 원자가 왜곡된 옥타헤드론 (distorted octahedron) 형태로 둘러싸는 구조를 포함하는. 인산염이 사용될 수 있으며, 상기 화학식 4의 인산염으로는 삼사정계 구조의 P1 공간군 또는 사방정계 구조의 Prima 공간군을 갖는 인산염이 사용될 수 있다. Meanwhile, as the phosphate of Chemical Formula 2, a phosphate having a P1 space group having a triclinic structure may be used, and as the phosphate of Chemical Formula 3, Cu or M 2 may be in the form of a distorted square pyramid in which five oxygen atoms are distorted. Enclosed structure; Or a structure surrounding Cu or M in the form of a distorted octahedron with six oxygen atoms . Phosphate may be used, and as the phosphate of Chemical Formula 4, a phosphate having a P1 space group having a tetragonal structure or a Prima space group having a tetragonal structure may be used.
이러한 비도전성 금속 산화물은 평균 입도가 0.1 내지 6 내일 수 있다. 한편, 상기 방열 소재는 탄화물로서 탄화규소를 포함하거나; 탄소계 소재로서 카본블택, 카본나노튜브, 혹연, 그래핀 또는 이들의 흔합물을 포함하거나; 질화계 소재로서 질화붕소, 질화규소, 질화알루미늄 또는 이들의 흔합물을 포함하거나; 흑은 금속 산화물로서 산화마그네슘, 산화알루미늄, 산화베릴륨, 산화아연 또는 이들의 흔합물을 포함할 수 있다. Such non-conductive metal oxides may have an average particle size of 0.1-6. On the other hand, the heat dissipating material includes silicon carbide as carbide; Carbon based materials include carbon blocks, carbon nanotubes, abyss, graphene or a mixture thereof; Boron nitride, silicon nitride, aluminum nitride, or a combination thereof; The black metal oxide may include magnesium oxide, aluminum oxide, beryllium oxide, zinc oxide or a combination thereof.
상기 일 구현예에 따른 도전성 패턴 형성용 조성물에서 상기 고분자 수지는 열 경화성 수지 또는 열 가소성 수지를 포함할 수 있으며, 일 예로, ABS (Acryl oni t i l e poly-but adi ene styrene) 수지, 폴리알킬렌테레프탈레이트 수지, 폴리아미드 수지, 폴리페닐에테르 수지, 폴리페닐렌 설파이드 수지, 폴리카보네이트 수지, 폴리프로필렌 수지 및 폴리프탈아미드 수지로 이루어진 군에서 선택된 1종 이상을 포함할 수 있다. In the composition for forming a conductive pattern according to the embodiment the polymer resin may include a thermosetting resin or a thermoplastic resin, for example, ABS (Acryl oni tile poly-butadiene styrene) resin, polyalkylene terephthalate resin, polyamide resin, polyphenylether resin, polyphenylene sulfide resin, polycarbonate resin, polypropylene resin and polyphthalamide resin It may include one or more selected from.
또한, 상기 일 구현예에 따른 도전성 패턴 형성용 조성물은 상술한 비도전성 금속 화합물을 전체 조성물에 대해 0. 1 내지 10 중량 %로 포함하고, 상기 방열 소재를 전체 조성물에 대해 1 내지 50 중량 %로 포함하며 , 나머지 함량의 고분자 수지를 포함할 수 있다. In addition, the composition for forming a conductive pattern according to the embodiment includes the non-conductive metal compound described above in an amount of 0.01 to 10% by weight based on the total composition, and the heat dissipating material in an amount of 1 to 50% by weight based on the total composition It may include, and the remaining amount of polymer resin.
부가하여, 상기 일 구현예에 따른 도전성 패턴 형성용 조성물은 난연제, 열 안정게, UV 안정게, 활제, 항산화제, 무기 충전제, 색 첨가제, 층격 보강제 및 기능성 보강제로 이루어진 군에서 선택된 1종 이상의 첨가제를 더 포함할 수 있다. In addition, the conductive pattern forming composition according to the embodiment is one or more additives selected from the group consisting of flame retardants, heat stabilizers, UV stabilizers, lubricants, antioxidants, inorganic fillers, color additives, layer reinforcing agents and functional reinforcing agents It may further include.
한편, 발명의 다른 일 구현예에 따르면, 고분자 수지 기재; 고분자 수지 기재에 분산되어 있는 하기 화학식 1 내지 4로 표시되는 인산염으로 이루어진 군에서 선택된 1종 이상의 인산염을 포함하는 비도전성 금속 화합물; 고분자 수지 기재에 분산되어 있는 방열 소재로서 탄화물, 탄소계 소재, 질화계 소재, 금속 산화물 또는 이들의 흔합물; 소정 영역의 고분자 수지 기재 표면에 노출된 금속핵을 포함하는 접착활성 표면; 및 상기 접착활성 표면 상에 형성된 도전성 금속층을 포함하는 도전성 패턴을 가지는 수지 구조체가 제공된다. On the other hand, according to another embodiment of the invention, a polymer resin substrate; A non-conductive metal compound comprising at least one phosphate selected from the group consisting of phosphates represented by the following Chemical Formulas 1 to 4 dispersed on a polymer resin substrate; Examples of heat dissipating materials dispersed in a polymer resin substrate include carbides, carbon-based materials, nitride-based materials, metal oxides, or mixtures thereof; An adhesive active surface comprising a metal nucleus exposed to a surface of a polymer resin substrate in a predetermined region; And a conductive pattern including a conductive metal layer formed on the adhesive active surface.
[화학식 1] [화학식 2] [Formula 1] [Formula 2]
CU3— ytfyP CU 3 — ytfyP
[화학식 3] [Formula 3]
[화학식 4] [Formula 4]
Cu4P209 Cu 4 P 2 0 9
상기 화학식 1에서 X는 0.5 내지 1 사이의 유리수이고, A는 Li , Na , Cu , Ag 및 Au로 이루어진 군에서 선택된 1종 이상의 금속이고, B는 Sn , Ti, Zn 및 Hf로 이루어진 군에서 선택된 1종 이상의 금속이고, 상기 화학식 2에서 y는 0 이상 3 미만의 유리수이고, M1은 Ti , V, Cr , Mn,In Formula 1, X is a free number between 0.5 and 1, A is at least one metal selected from the group consisting of Li, Na, Cu, Ag and Au, B is selected from the group consisting of Sn, Ti, Zn and Hf At least one metal, In Formula 2, y is 0 or more and less than 3, M 1 is Ti, V, Cr, Mn,
Fe , Co , Ni , Y, Zn, Nb , Mo , Tc , Pd, Agᅳ Ta , W, Pt 및 Au로 이루어진 군에서 선택된 1종 이상의 금속이고, At least one metal selected from the group consisting of Fe, Co, Ni, Y, Zn, Nb, Mo, Tc, Pd, Ag ᅳ Ta, W, Pt and Au,
상기 화학식 3에서 z는 0 이상 2 미만의 유리수이고, M2는 Zn, Mg, Ca , Sr 및 Ba으로 이루어진 군에서 선택된 1종 이상의 금속이다. In Chemical Formula 3, z is a free number less than 0 and less than 2, and M 2 is at least one metal selected from the group consisting of Zn, Mg, Ca, Sr, and Ba.
상기 다른 일 구현예에 따른 수지 구조체에서 접착활성 표면 및 도전성 금속층이 형성된 소정 영역은 상기 고분자 수지 기재에 전자기파가 조사된 영역에 대응할 수 있다. In the resin structure according to another exemplary embodiment, the predetermined region in which the adhesive active surface and the conductive metal layer are formed may correspond to a region in which electromagnetic waves are irradiated onto the polymer resin substrate.
【발명의 효과】 【Effects of the Invention】
본 발명에 따르면, 각종 고분자 수지 제품 또는 수지층 등의 고분자 수지 기재 상에, 레이저 등 전자기파를 조사하는 매우 단순화된 공정으로 미세한 도전성 패턴을 형성할 수 있게 하는 도전성 패턴 형성용 조성물과, 이로부터 형성된 도전성 패턴을 가지는 수지 구조체가 제공될 수 있다. According to the present invention, a composition for forming a conductive pattern which enables to form a fine conductive pattern on a polymer resin substrate such as various polymer resin products or resin layers by a very simplified process of irradiating electromagnetic waves such as a laser, and formed therefrom A resin structure having a conductive pattern can be provided.
특히, 상기 도전성 패턴 형성용 조성물을 사용하면, 방열 구조체가 일체화된 수지 구조체를 성형할 수 있으며, 수지 구조체 (각종 고분자 수지 제품 또는 수지층 등)의 다양한 색상을 구현하고자 하는 당업계의 요구를 보다 효과적으로 층족시키면서도, 이러한 수지 구조체 상에 양호한 도전성 패턴을 용이하게 형성할 수 있다. In particular, by using the composition for forming a conductive pattern, it is possible to mold a resin structure in which the heat dissipation structure is integrated, and meet the needs of those skilled in the art to realize various colors of the resin structure (various polymer resin products or resin layers, etc.). It is possible to easily form a good conductive pattern on such a resin structure while effectively stratifying.
따라서, 이러한 도전성 패턴 형성용 조성물 등을 이용해, 전기 /전자 제품 및 자동차용 부품 등 각종 수지 제품 상의 도전성 회로 패턴, RFID 태그, 각종 센서, MEMS 구조체 등을 매우 효과적으로 형성할 수 있게 된다. Therefore, using such a composition for forming a conductive pattern, conductive circuit patterns, RFID tags, various sensors, MEMS structures, etc. on various resin products such as electric / electronic products and automobile parts can be formed very effectively.
【도면의 간단한 설명】 [Brief Description of Drawings]
도 1은 일 구현예에 따른 도전성 패턴 형성용 조성물에 포함되는 화학식 1로 표시되는 인산염의 일 예의 나시콘 입체 구조를 모식적으로 나타낸 도면이다. 도 2는 다른 일 구현예에 따른 도전성 패턴 형성용 조성물에 포함되는 화학식 1로 표시되는 인산염의 삼사정계 구조의 P 1 공간군에 속하는 입체 구조를 모식적으로 나타내는 도면이다. 1 is a view schematically showing a nasicon three-dimensional structure of an example of the phosphate represented by the formula (1) contained in the composition for forming a conductive pattern according to an embodiment. 2 is a view schematically showing a three-dimensional structure belonging to the P 1 space group of the triclinic structure of the phosphate represented by the formula (1) contained in the composition for forming a conductive pattern according to another embodiment.
도 3은 또 다른 일 구현예에 따른 도전성 패턴 형성용 조성물에 포함되는 화학식 2로 표시되는 인산염의 삼사정계 구조의 P 1 공간군에 속하는 입체 구조를 모식작으로 나타내는 도면이다. 도 4는 일 구현예의 화학식 2로 표시되는 인산염의 파장 (nm)에 따른 흡광도를 나타낸 그래프이다. 흡광도 (absorbance)는 Kubelka-Munk 방정식에 따라 ( l-R%*0.01)2/(2ra*0.01)로 계산한 값이며, R%는 Uv-Vi sibl e spectroscopy로 측정할 수 있는 di f fuse ref lectance이다. 3 is a view schematically showing a three-dimensional structure belonging to the P 1 space group of the triclinic structure of the phosphate represented by the formula (2) contained in the composition for forming a conductive pattern according to another embodiment. Figure 4 is a graph showing the absorbance according to the wavelength (nm) of the phosphate represented by the formula (2) of one embodiment. Absorbance is calculated by (lR% * 0.01) 2 /(2ra*0.01) according to Kubelka-Munk equation, and R% is di f fuse reflectance which can be measured by Uv-Vi spectroscopy. .
도 5는 또 다른 일 구현예에 따른 도전성 패턴 형성용 조성물에 포함되는 화학식 3으로 표시되는 인산염 중 Cu2P207의 입체 구조를 모식적으로 나타낸 도면이다. 5 is a view schematically showing a three-dimensional structure of Cu 2 P 2 0 7 in the phosphate represented by Formula 3 included in the composition for forming a conductive pattern according to another embodiment.
도 6은 또 다른 일 구현예에 따른 도전성 패턴 형성용 조성물에 포함되는 화학식 4로 표시되는 인산염의 P 1 공간군에 속하는 입체 구조를 모식적으로 나타낸 도면이다. 6 is a view schematically showing a three-dimensional structure belonging to the P 1 space group of the phosphate represented by the formula (4) contained in the composition for forming a conductive pattern according to another embodiment.
도 7은 또 다른 일 구현예에 따른 도전성 패턴 형성용 조성물에 포함되는 화학식 4로 표시되는 인산염의 Pnma 공간군에 속하는 입체 구조를 모식적으로 나타낸 도면이다. FIG. 7 is a diagram schematically showing a three-dimensional structure belonging to a Pnma space group of phosphates represented by Formula 4 included in a composition for forming a conductive pattern according to another embodiment.
도 8은 기존의 전자 부품 기판의 구조를 모식적으로 나타낸 도면이다. 도 9는 발명의 일 구현예에 따른 도전성 패턴 형성용 조성물을 이용해 제조한 전자 부품 기판의 구조를 모식적으로 나타낸 도면이다. 8 is a diagram schematically showing the structure of a conventional electronic component substrate. 9 is a view schematically showing the structure of an electronic component substrate manufactured using the composition for forming a conductive pattern according to an embodiment of the present invention.
도 10는 발명의 일 구현예에 따른 도전성 패턴 형성용 조성물을 사용하여 도전성 패턴을 형성하는 방법의 일 예를 공정 단계별로 간략화하여 나타낸 도면이다. 10 is a view briefly showing an example of a method of forming a conductive pattern by using the composition for forming a conductive pattern according to an embodiment of the present invention.
【발명을 실시하기 위한 구체적인 내용】 [Specific contents to carry out invention]
이하 발명의 구체적인 구현예에 따른 도전성 패턴 형성용 조성물과, 이로부터 형성된 도전성 패턴을 갖는 수지 구조체 등에 대해 설명하기로 한다. 발명의 일 구현예에 따르면 고분자 수지 ; 하기 화학식 1 내지 4로 표시되는 인산염으로 이루어진 군에서 선택된 1종 이상의 인산염을 포함하는 비도전성 금속 화합물; 방열 소재로서 탄화물, 탄소계 소재, 질화계 소재, 금속 산화물 또는 이들의 흔합물을 포함하고, 전자기파 조사에 의해, 상기 비도전성 금속 화합물로부터 금속핵이 형성되는 전자기파 조사에 의한 도전성 패턴 형성용 조성물 제공된다. Hereinafter, a composition for forming a conductive pattern and a resin structure having a conductive pattern formed therefrom according to a specific embodiment of the present invention will be described. According to one embodiment of the invention polymer resin; A non-conductive metal compound comprising at least one phosphate selected from the group consisting of phosphates represented by Formulas 1 to 4 below; Provides a composition for forming a conductive pattern by electromagnetic wave irradiation, including a carbide, carbon-based material, nitride-based material, metal oxide or a mixture thereof as a heat dissipation material, the metal nucleus is formed from the non-conductive metal compound by electromagnetic wave irradiation do.
[화학식 1] [Formula 1]
AxB2P3012 [화학식 2] A x B 2 P 3 0 12 [Formula 2]
Cu3-yM1 yP208 Cu 3 - y M 1 y P 2 08
[화학식 3] [Formula 3]
[화학식 4] [Formula 4]
Cu4P209 Cu 4 P 2 0 9
상기 화학식 1에서 X는 0.5 내지 1 사이의 유리수이고, A는 Li , Na , Cu , kg 및 Au로 이루어진 군에서 선택된 1종 이상의 금속이고, B는 Sn , Ti , Zn 및 Hf로 이루어진 군에서 선택된 1종 이상의 금속이고, In Formula 1, X is a free number between 0.5 and 1, A is at least one metal selected from the group consisting of Li, Na, Cu, kg and Au, B is selected from the group consisting of Sn, Ti, Zn and Hf At least one metal,
상기 화학식 2에서 y는 0 이상 3 미만의 유리수이고, M1은 Ti , V, Cr , Mn,In Formula 2, y is 0 or more and less than 3, M 1 is Ti, V, Cr, Mn,
Fe , Co , Ni , Y, Zn , Nb , Mo , Tc , Pd , Ag, Ta , W, Pt 및 Au로 이루어진 군에서 선택된 1종 이상의 금속이고, At least one metal selected from the group consisting of Fe, Co, Ni, Y, Zn, Nb, Mo, Tc, Pd, Ag, Ta, W, Pt and Au,
상기 화학식 3에서 z는 0 이상 2 미만의 유리수이고, M2는 Zn, Mg, Ca , Sr 및 Ba으로 이루어진 군에서 선택된 1종 이상의 금속이다. In Chemical Formula 3, z is a free number less than 0 and less than 2, and M 2 is at least one metal selected from the group consisting of Zn, Mg, Ca, Sr, and Ba.
이러한 비도전성 금속 화합물을 포함한 도전성 패턴 형성용 조성물을 사용해 고분자 수지 제품 또는 수지층을 성형한 후, 레이저 등 전자기파를 조사하면, 상기 비도전성 금속 화합물로부터 금속핵이 형성될 수 있다. 이러한 금속핵은 전자기파가 조사된 소정 영역에서 선택적으로 노출되어 고분자 수지 기재 표면의 접착활성 표면을 형성할 수 있다. 이후, 상기 금속핵 등을 seed로 하여 도전성 금속 이온 등을 포함하는 도금 용액으로 무전해 도금하면, 상기 금속핵을 포함하는 접착활성 표면 상에 도전성 금속층이 형성될 수 있다. 이러한 과정을 통해, 상기 전자기파가 조사된 소정 영역의 고분자 수지 기재 상에만 선택적으로 도전성 금속층, 다시 말해서 미세한 도전성 패턴이 형성될 수 있다. 특히, 이와 같이 금속핵 및 접착활성 표면이 형성되어 전자기파 조사에 의해 보다 양호한 도전성 패턴의 형성이 가능하게 되는 주된 요인 중 하나로서, 일 구현예의 조성물에 포함되는 비도전성 금속 화합물이 갖는 특이한 입체 구조를 들 수 있다. 이하 일 구현예에 따른 비도전성 금속 화합물로 사용될 수 있는 인산염의 입체 구조와 이러한 구조적 특성에 따른 광학 특성을 구체적으로 설명하기로 한다. After forming a polymer resin product or a resin layer using the composition for forming a conductive pattern including the non-conductive metal compound, and irradiating electromagnetic waves such as a laser, a metal nucleus may be formed from the non-conductive metal compound. The metal nucleus may be selectively exposed in a predetermined region irradiated with electromagnetic waves to form an adhesive active surface of the polymer resin substrate surface. Subsequently, electroless plating with a plating solution containing conductive metal ions, etc., using the metal core as a seed, a conductive metal layer may be formed on an adhesive active surface including the metal core. Through this process, the conductive metal layer, that is, the fine conductive pattern may be selectively formed only on the polymer resin substrate of the predetermined region irradiated with the electromagnetic wave. Particularly, as one of the main factors in which the metal nucleus and the adhesion-activated surface are formed and thus the formation of a better conductive pattern by electromagnetic wave irradiation, the unique three-dimensional structure of the non-conductive metal compound included in the composition of one embodiment Can be mentioned. Hereinafter, the steric structure of the phosphate which can be used as the non-conductive metal compound according to the embodiment and the optical characteristics according to these structural characteristics will be described in detail.
상기 화학식 1의 인산염은 P04 사면체와 B06 팔면체가 산소를 공유하면서 3차원적으로 연결된 기본 구조 내에서 A 금속의 위치에 따라 다양한 결정 구조 상의 공간군 (space group)을 가질 수 있다. Phosphate of the formula (1), while the P0 4 tetrahedral and octahedral B0 6 shared oxygen Depending on the position of the A metal in the three-dimensionally connected basic structure, it may have a space group on various crystal structures.
일 예로, 화학식 1의 X가 1인 인산염은 도 1에 도시된 바와 같이 삼방정계 구조 (trigonal structure)의 R?>C 공간군 (나시콘 입체 구조)을 가질 수 있다. For example, the phosphate having X of Formula 1 may have a R?> C space group (nacicon stereostructure) of a trigonal structure as shown in FIG. 1.
도 1을 참고하면, 상기 나시콘 구조의 인산염은 B06의 8면체와, P04의 4면체가 산소를 공유하면서 3차원적으로 연결되어 있고 (즉, 전체 나시콘 구조의 3차원적인 입체 구조 골격을 형성하고 있고), 상기 8면체와 4면체의 결정 격자 배열에 의해 생기는 채널에 금속 A 또는 그 이온이 위치하는 입체 구조를 가질 수 있다. Referring to FIG. 1, the phosphate of the nacicon structure is three-dimensionally connected while the octahedron of B0 6 and the tetrahedron of P0 4 share oxygen (that is, the three-dimensional solid structure of the entire nacicon structure). And a metal A or ions thereof in a channel formed by the crystal lattice arrangement of the octahedron and tetrahedron.
보다 구체적으로 7 상기 나시콘 입체 구조에서, 상기 채널은 결정 격자의 c축을 따라 6개의 산소로 둘러싸인 자리에 형성될 수 있으며, 그 자리를 상기 금속 A 또는 그 이온이 부분적으로 채우고 있을 수 있다. 이에 따라, A의 금속이 입체 구조 중의 어떠한 결정 격자의 속박에서도 자유롭게 존재할 수 있으므로, 이러한 입체 구조를 갖는 비도전성 금속 화합물이 특정 파장의 전자기파의 자극에 노출되면 A의 금속 또는 그 이은이 상기 물질로부터 쉽게 분리될 수 있을 것으로 예측된다. 구체적인 일 예에서, CuSn2(P04)3와 같은 비도전성 금속 화합물의 경우, 기본적으로 화학적 안정성을 가지나 레이저 등 전자기파에 노출되었을 때, Cu 또는 Cu1+가 쉽게 분리되어 금속핵을 형성할 수 있는 것으로 확인되었으며, 이는 상술한 나시콘 입체 구조 특유의 3차원 구조에 기인한 것으로 예측될 수 있다. ' More specifically, in the Nasicon solid structure, the channel may be formed at a position surrounded by six oxygens along the c-axis of the crystal lattice, and the position may be partially filled by the metal A or its ion. Accordingly, the metal of A may be freely present in the bondage of any crystal lattice in the three-dimensional structure, so that when the non-conductive metal compound having such a three-dimensional structure is exposed to the stimulation of electromagnetic waves of a specific wavelength, the metal of A or its subsequent release from the material It is expected to be easily separated. In a specific example, in the case of a non-conductive metal compound such as CuSn 2 (P0 4 ) 3 , it is basically chemically stable, but when exposed to electromagnetic waves such as a laser, Cu or Cu 1+ may be easily separated to form a metal nucleus. It has been confirmed that this can be expected to be due to the three-dimensional structure peculiar to the above-described Nasicon solid structure. '
한편, 이러한 나시콘 입체 구조를 가지는 화학식 1의 인산염은 On the other hand, the phosphate of the formula (1) having such a nasicone steric structure
pT 전이 (phase transition)에 의해 삼사정계 구조 (triclinic structure)의 공간군 (space group) 또는 단 Λ1"정계 구조 (monocl inic structure)의 Cc 또는 C2/c 공간군을 ^질 수 있으며, 이를 도 2에 도시하였다. The pT transition can receive a space group of triclinic structures or a Cc or C2 / c space group of a Λ 1 "monolithic structure. 2 is shown.
R3c 구조에서 P04 사면체 2개와 B06 팔면체 4개가 이루는 채널의 증앙을 0 0 0 이라고 할 때, 결정 구조의 대칭성이 C2/c로 낮아지면 이 자리는 In the R3c structure, the amplification of the channel formed by two P0 4 tetrahedrons and four B0 6 octahedrons is 0 0 0. When the symmetry of the crystal structure is reduced to C2 / c, the position becomes
11 311 33 131 11 311 33 131
--0,---,--0,--- --0, ---,-0, ---
44 442 44 442 로 변화하면서 A 원소가 4 개의 산소를 공유하면서 위치할 수 있다. 그러나 이러한 자리에 모두 A 원소가 존재하는 것은 아니며, 일부 자리에만 존재할 수 있다. 44 442 is changed to 44 442 and element A is located sharing 4 oxygen Can be. However, not all A elements exist in these positions, and may exist only in some positions.
또한 결정 구조가 Cc가 되면, 2-fold에 의한 대칭성이 사라지는 Also, when the crystal structure becomes Cc, symmetry due to 2-fold disappears.
11 311 11 311
—ᅳ 0, — ᅳ 0,
44 442 자리는 2개의 산소를 공유할 수 있는 Ml site가 되고,44 442 digits, and the Ml site to share two oxygen,
33 131 33 131
ᅳᅳ 0, ᅳ ᅳ 0,
44 442 자리는 C2/c의 ^우와 같이 4개의 산소를 공유하는 M2 site가 될 수 있다. 그리고, 대부분의 P1 구조에서는 M2 site의 일부에만 A 원소가 위치하게 된다. 또한, A 원소가 Cu와 같은 전이금속 원소인 경우 산화수가 1가에서 2가로 변화할 수도 있다. 이에 화학식 1에서 X는 0.5 내지 1 사이의 값을 가지게 된다. 화학식 1로 표시되는 인산염의 결정 구조는 상기 인산염의 합성 시 소성 온도에 따라 발생하는 상 전이와 인산염에 포함된 금속의 종류에 따라 결정될 수 있다. The 4 4 442 site may be an M2 site that shares four oxygens, such as C2 / c. In most P1 structures, the A element is located only in a part of the M2 site. In addition, when the A element is a transition metal element such as Cu, the oxidation number may be changed from monovalent to divalent. X in Formula 1 will have a value between 0.5 and 1. The crystal structure of the phosphate represented by Chemical Formula 1 may be determined according to the type of metal included in the phosphate and the phase transition that occurs according to the firing temperature in the synthesis of the phosphate.
일반적으로 화학식 1의 인산염을 합성하기 위하여 약 loocrc 이상의 고온에서 소성하는 경우, 안정상인 삼방정계 구조 (trigonal structure)의 八"3 공간군을 갖는 비도전성 금속 화합물을 앋을 수 있다. In general, when fired at a high temperature of about loocrc or more to synthesize the phosphate of Formula 1, a non-conductive metal compound having a group of 8 ″ 3 spaces of a trigonal structure, which is a stable phase, may be obtained.
반면, 화학식 1의 인산염을 합성하기 위하여 약 10Q0°C의 이하의 저온에서 소성하는 경우에는, 삼방정계 구조보다 대칭성이 낮은 삼사정계 구조 (triclinic structure)의 ri 공간군에 속하는 화학식 1의 인산염이 얻어지거나 흑은 단사정계 구조 (monoclinic structure)의 Cc 또는 C2/c 공간군에 속하는 화학식 1의 인산염이 얻어질 수 있다. 一 그러나, 저온 소성올 이용하는 경우에도 일부 삼방정계 구조의 R3C 공간군을 가지는 비도전성 금속 화합물이 _합성될 수 있고, 혹은 고온 소성을 이용하는 경우에 일부 삼사정계 구조의 P1 공간군, 또는 단사정계 구조의 Cc 또는 C2/c 공간군 : 가지는 비도전성 금속 화합물이 합성될 수 있다. 이러한 P1 , Cc 또는 C2/c 공간군을 갖는 화학식 1의 인산염도, 상술한 나시콘 구조의 화학식 1의 인산염과 마찬가지로, 이를 포함하는 도전성 패턴 형성용 조성물을 사용해 고분자 수지 제품 또는 수지층을 성형한 후, 소정 영역에 레이저 등 전자기파를 조사하면, 상기 구조의 인산염으로부터 금속핵이 형성될 수 있다. 상기 r i , Cc 또는 C2/c 공간군을 갖는 화학식 1의 인산염은 일반적인 환경에서는 화학적으로 안정하나, 특정 파장의 전자기파에 노출된 영역에서는, 상기 A si te에 존재하는 금속 또는 그 이온이 상기 물질로부터 쉽게 분리될 수 있다. 따라서, 상기 전자기파의 조사에 의해, 상기 금속핵이 보다 용이하게 형성될 수 있다. On the other hand, when firing at a low temperature of about 10Q0 ° C or less to synthesize the phosphate of formula (1), the phosphate of formula (1) belonging to the ri space group of the triclinic structure is lower than the trigonal structure is obtained Phosphates of formula (1) belonging to the Cc or C2 / c space group of the monoclinic structure, which is black or black, can be obtained. However, non-conductive metal compounds having R3C space groups of some trigonal structures may be synthesized even when low temperature calcining is used, or P1 space groups or monoclinic structures of some triclinic structures when high temperature firing is used. A non-conductive metal compound having a Cc or C2 / c space group of: can be synthesized. The phosphate of formula (1) having such a P1 , Cc or C2 / c space group, like the phosphate of formula (1) of the nacicon structure described above, was formed by molding a polymer resin product or a resin layer using a composition for forming a conductive pattern including the same. Afterwards, when electromagnetic waves such as a laser are irradiated to a predetermined region, a metal nucleus is released from the phosphate having the above structure. Can be formed. The phosphate of Formula 1 having the ri , Cc or C2 / c space group is chemically stable in a general environment, but in a region exposed to electromagnetic waves of a specific wavelength, the metal or its ions present in the Si te from the material It can be easily separated. Therefore, the metal nucleus can be more easily formed by irradiation of the electromagnetic waves.
다음으로, 화학식 2로 표시되는 인산염은 7 결정계 (7 crystal system) 중 가장 대칭성이 적은 삼사정계 (tr i cl ini c system) 구조를 가질 수 있다. 삼사정계 구조에서는 단위포를 이루는 3개의 백터 길이가 모두 다를 뿐만 아니라 (a≠b≠c) 백터가 이루는 각도 서로 다르며 직각이 아니다 ( α≠β≠ γ≠90) . 또한, 상기 화학식 2의 인산염은 r i 공간군 (space group)에 속하는 것일 수 있다. 도 3에는 이러한 비도전성 금속 화합물의 삼사정계 구조를 모식적으로 나타내고 있다. Next, the phosphate represented by Chemical Formula 2 may have a tr i cl ini c system structure having the least symmetry among 7 crystal systems. In the triclinic system, not only are all three vectors (a ≠ b ≠ c) different from each other, but also the angles formed by the vectors are different and not right angles ( α ≠ β ≠ γ ≠ 90). In addition, the phosphate of Chemical Formula 2 may belong to the ri space group. 3, the triclinic system structure of such a nonconductive metal compound is schematically shown.
도 3을 참고하면, 삼사정계 구조를 갖는 비도전성 금속 화합물에서 Cu와 M1은 2종의 부위에 위치할 수 있다. 구체적으로, 상기 비도전성 금속 화합물은 1개의 Cu 또는 M1이 4개의 산소에 의해 배위되어 사각 평면 (square plane 또는 square pl anar )의 국소 대칭 ( local symmetry)을 이루는 Ml 부위 (Ml si te)와 1개의 Cu 또는 M1이 5개의 산소에 의해 배위되어 트리고날 바이피라미드 (tr igonal bipyramid)의 국소 대칭을 이루는 M2 부위에 위치할 수 있다. 또한, 비도전성 금속 화합물은 1개의 P가 4개의 산소에 의해 배위되어 국소 대칭을 이루는 P04의 사면체 (tetrahedron)를 포함할 수 있다. 이러한 국소 대칭을 이루는 부위들은 도 3과 같이 산소를 공유하면서 3차원적으로 연결되어 삼사정계 구조를 이를 수 있다. 구체적으로, 상기 비도전성 금속 화합물은 도 3과 같이 사각 평면형 Cu04 혹은 M04 ; 트리고날 바이피라미드 (tr igonal bipyramid)의 Cu05 혹은 M05 ; 및 사면체의 P04가 산소를 공유하면서 3차원적으로 연결되어 있는 입체 구조를 가질 수 있다. Referring to FIG. 3, in the non-conductive metal compound having a triclinic structure, Cu and M 1 may be positioned at two kinds of sites. Specifically, the non-conductive metal compound may include a Ml site in which one Cu or M 1 is coordinated by four oxygen to form a local symmetry of a square plane or square pl anar. One Cu or M 1 may be located at the M2 site coordinated by five oxygens to achieve local symmetry of the trigonal bipyramid. In addition, the non-conductive metal compound may include a tetrahedron of P0 4 in which one P is coordinated by four oxygen to form local symmetry. Such local symmetric parts may be connected in three dimensions while sharing oxygen as shown in FIG. 3 to form a triclinic system. Specifically, the non-conductive metal compound is a square planar Cu0 4 or M0 4 as shown in Figure 3; Cu0 5 or M0 5 of trigonal bipyramids; And it may have a three-dimensional structure in which the tetrahedron P0 4 is three-dimensionally connected while sharing oxygen.
또한, 상기 화학식 2의 인산염은 도 4(가로축: 파장 (nm) , 세로축: 흡광도)와 같이 가시광선 영역 (약 300皿 내지 700nm)의 흡광도가 낮고, 근적외선 내지 적외선 영역 (약 700nm 내지 3000nm)에서 높은 흡광도를 보인다. 상기 인산염의 근적외선 영역의 강한 흡광도의 원인은 Cu05가 이루는 트리고날 바이피라미드 (tr igonal bypyramid)의 국소 대칭에 기인한다. 그 이유로는 첫째로, 상기 트리고날 바이피라미드의 중심에 존재하는 Cu2+는 중심 대칭성을 가지지 않는 부위 (non-centrosymmetr i c si te)에 위치하여 Cu2+의 d_오비탈에서 라포르테 허용 전이 (Laporte al lowed transi t ion)가 가능하기 때문이다. 둘째로, 이 결정 구조에서 기인하는 에너지 준위 간의 전이는 가시광선 영역 (약 300nm 내지 700nm)을 적게 포함하고, 근적외선 내지 적외선 영역 (약 700nm 내지 3000nm)을 상당 부분 포함하기 때문이다. 따라서, 상기 비전도성 금속 화합물이 가시광선 영역의 흡광도는 낮으면서 근적외선 내지 적외선 영역의 흡광도가 높아, 밝은 색상을 가지면서도 근적외선 파장의 전자기파의 자극에 잘 반웅하여 금속핵을 용이하게 형성할 수 있다. In addition, the phosphate of Chemical Formula 2 has a low absorbance in the visible region (about 300 Hz to 700 nm) as shown in FIG. 4 (horizontal axis: wavelength (nm), vertical axis: absorbance), and in the near infrared to infrared region (about 700 nm to 3000 nm). High absorbance Causes a strong absorption in the near infrared region of the phosphate is teurigo Cu0 5 the forming due to the local symmetry of the day-by-pyramid (tr igonal bypyramid). For that reason, firstly, Cu 2+ present in the center of the trigonal bipyramid has a central symmetry. This is because Laporte al lowed transiton is possible in the d_orbital of Cu 2+ due to its location in the non-centrosymmetric acid. Secondly, the transition between energy levels resulting from this crystal structure includes less visible light region (about 300 nm to 700 nm) and a considerable portion of near infrared to infrared region (about 700 nm to 3000 nm). Accordingly, the non-conductive metal compound has low absorbance in the visible light region and high absorbance in the near infrared to infrared region, and can easily form a metal nucleus by reacting well to the stimulation of electromagnetic waves having a near infrared wavelength while having a bright color.
다음으로, 화학식 3으로 표시되는 인산염의 입체 구조와 광학 특성을 설명한다 . 일반적으로 전이금속을 포함하는 화합물의 광학적 특성은 d-오비탈의 에너지 준위와 관련이 있다. 전이 금속이 자유 원자로 존재하는 경우 전이금속의 d-오비탈은 모두 동등한 에너지 준위를 가지나, 리간드가 존재하는 경우 금속 원자와 리간드가 이루는 국소 대칭 ( local symmetry)에 따라 전이금속의 d- 오비탈의 에너지 준위가 여러 개로 나뉘게 된다 (결정장 이론) . 이때, 전이금속 원자의 d-오비탈이 모두 전자로 채워진 상태가 아니라면, 낮은 에너지 레벨에 있는 전자가 높은 에너지 레벨로 전이가 가능하며, 이를 전이금속의 d-d 전이 (d- d transi t ion)라고 한다. Next, the three-dimensional structure and optical properties of the phosphate represented by the formula (3) will be described. In general, the optical properties of compounds containing transition metals are related to the energy levels of d-orbitals. When the transition metal is present as a free atom, all of the d-orbitals of the transition metal have the same energy level, but in the presence of the ligand, the energy level of the d-orbital of the transition metal depends on the local symmetry of the metal atom and the ligand. Is divided into several (crystal field theory). At this time, if all of the d-orbitals of the transition metal atoms are not filled with electrons, electrons at low energy levels can be transferred to high energy levels, which is called a dd transition of a transition metal. .
상기 화학식 3의 인산염은 d-오비탈의 일부에 전자가 채워진 Cu2+를 포함하므로, 상기 화학식 3의 인산염은 d-d 전이에 의한 광학적 특성을 나타낼 수 있다. 특히, 상기 화학식 3의 구조에서 기인하는 에너지 준위 간의 전이는 가시광선 영역 (약 300nm 내지 700nm)을 적게 포함하고, 근적외선 내지 적외선 영역 (약 700nm 내지 3000nm)을 상당 부분 포함하므로, 상기 화학식 3의 인산염은 가시광선 영역 (약 300nm 내지 700nm)의 흡광도는 낮고, 근적외선 내지 적외선 영역 (약 700nm 내지 3000nm)의 흡광도는 높은 특성을 보일 수 있다. Since the phosphate of Formula 3 includes Cu 2+ filled with a portion of the d-orbital, the phosphate of Formula 3 may exhibit optical properties due to dd transition. In particular, the transition between energy levels resulting from the structure of Chemical Formula 3 includes less visible light region (about 300 nm to 700 nm) and a substantial portion of near infrared to infrared region (about 700 nm to 3000 nm). The absorbance of the silver visible region (about 300 nm to 700 nm) is low, and the absorbance of the near infrared to infrared region (about 700 nm to 3000 nm) may exhibit high characteristics.
구체적으로, 화학식 3의 M2에 따라 Cu 또는 M2의 리간드 수; 및 Cu 또는Specifically, the number of ligands of Cu or M 2 according to M 2 of Formula 3; And Cu or
M2와 리간드가 이루는 구조가 변형될 수 있다. The structure formed by M 2 and the ligand may be modified.
일 예로 화학식 3의 X가 0<x<2의 조건을 만족하고 M2가 Ca , Sr 및 Ba으로 이루어진 군에서 선택된 1종 이상의 금속이거나; 또는 X가 0인 경우, 화학식 3의 인산염은 국소 대칭 ( local symmetry)의 중심 원자인 Cu 또는 M2을 5개의 산소 원자가 왜곡된 스퀘어 피라미드 (di storted square pyramid) 형태로 둘러싸는 구조를 포함할 수 있다. 도 5는 화학식 3으로 표시되는 인산염의 일 예인 Cu2P207의 구조를 모식적으로 보여주고 있다. For example, X in Formula 3 satisfies a condition of 0 <x <2, and M 2 is at least one metal selected from the group consisting of Ca, Sr, and Ba; Or when X is 0, the phosphate of Formula 3 surrounds Cu or M 2 , the central atom of local symmetry, in the form of a distorted square pyramid with five oxygen atoms distorted. It may include a structure. FIG. 5 schematically shows the structure of Cu 2 P 2 0 7 as an example of the phosphate salt represented by Chemical Formula 3. FIG.
또한, 다른 일 예로 화학식 3의 X가 0<x<2의 조건을 만족하고 M2가 Zn 및 Mg으로 이루어진 군에서 선택된 1종 이상의 금속이라면, 화학식 3의 인산염은 국소 대칭 (local symmetry)의 중심 원자인 Cu 또는 M을 6개의 산소 원자가 왜곡된 옥타헤드론 (distorted octahedral) 형태로 둘러싸는 구조를 포함할 수 있다. As another example, when X in Formula 3 satisfies the condition of 0 <x <2 and M 2 is at least one metal selected from the group consisting of Zn and Mg, the phosphate of Formula 3 is the center of local symmetry. It may include a structure surrounding the atoms Cu or M in the form of distorted octahedral six oxygen atoms.
상기와 같은 구조들에서 Cu2+의 d-오비탈 에너지 준위는 근적외선 영역의 전자기파를 흡수할 수 있도록 형성될 수 있다. 따라서, 상기 화학식 3의 인산염은 근적외선 영역의 전자기파에 의하여 금속핵을 용이하게 형성할 수 있다. 특히, 왜곡된 스퀘어 피라미드의 중심에 존재하는 Cu2+는 증심 대칭성을 가지지 않는 부위 (non-centrosymmetric site)에 위치하여 Cu2+의 d_오비탈에서 라포르테 허용 전이 (Laporte allowed transition)가 가능하다. 그 결과, 화학식 3에서 X가 0이거나; 또는 X가 0<x<2의 조건을 만족하되 M2가 Ca, Sr 및 Ba으로 이루어진 군에서 선택된 1종 이상의 금속인 경우, 화학식 3의 인산염은 근적외선 영역에서 강한 흡수 밴드를 보여 근적외선 영역의 전자기파에 의하여 더욱 용이하게 금속핵을 형성할 수 있다. In such structures, the d-orbital energy level of Cu 2+ may be formed to absorb electromagnetic waves in the near infrared region. Therefore, the phosphate of Chemical Formula 3 can easily form a metal core by electromagnetic waves in the near infrared region. In particular, Cu 2+ in the center of the distorted square pyramid is located at a non-centrosymmetric site, allowing Laporte allowed transition in the d_orbital of Cu 2+ . . As a result, in Formula 3, X is 0; Alternatively, when X satisfies the condition of 0 <x <2, but M 2 is at least one metal selected from the group consisting of Ca, Sr and Ba, the phosphate of formula 3 exhibits a strong absorption band in the near infrared region to show electromagnetic waves in the near infrared region It is possible to form a metal nucleus more easily by.
다음으로, 상기 화학식 4의 인산염의 입체 구조를 설명한다. 상기 화학식 Next, the steric structure of the phosphate of Chemical Formula 4 will be described. Chemical formula
4의 인산염으로는 삼사정계 (Triclinic) 구조의 rJ 공간군 (space group) 또는 사방정계 (Orthorhombic) 구조의 Prima 공간군에 속하는 입체 구조를 가지는 것을 사용할 수 있다. 이러한 Cu4P209의 일 예에 따른 P1 공간군 구조 및 Pima 공간군 구조는 각각 도 6 및 도 7에 모식적으로 나타나 있다. In 4 phosphate it may be used that has a three-dimensional structure belonging to the space group of the Prima triclinic crystal system (Triclinic) rJ structure of the space group (space group) or orthorhombic (Orthorhombic) structure. The P1 space group structure and the Pima space group structure according to one example of Cu 4 P 2 0 9 are schematically shown in FIGS. 6 and 7, respectively.
도 6을 참조하면, 화학식 4의 Cu4P209에서 구리 이온은 Ml, M2, M3 및 M4 부위 (site)에 위치할 수 있으며, Ml 및 M3 부위에 위치한 구리 이온은 5개의 산소에 의해 배위되어 펜타헤드론 (pentahedron)의 국소 대칭 (local symmetry)을 이루고, M2 및 M4 부위에 위치한 구리 이온은 4개의 산소에 의해 배위되어 스퀘어 플래인 (square plane)의 국소 대칭을 이를 수 밌다. 그리고, P는 4개의 산소와 함께 테트라헤드론 (tetrahedron)의 국소 대칭을 이를 수 있다. 상기Referring to FIG. 6, in Cu 4 P 2 0 9 of Formula 4, copper ions may be located at Ml, M2, M3, and M4 sites, and copper ions located at Ml and M3 sites may be formed by five oxygens. Coordination results in local symmetry of pentaedron, and copper ions located at M2 and M4 sites are coordinated by four oxygens to achieve local symmetry of the square plane. P can then achieve local symmetry of tetrahedron with four oxygens. remind
Cu4P209은 상기 펜타헤드론의 Cu05, 스퀘어 플래인의 Cu04 및 테트라헤드론의 P04들이 서로 산소를 공유하며 3차원적으로 연결된 입체 구조를 가질 수 있으며, 이러한 입체 구조가 Γ 1 공간군 구조로 지칭될 수 있다. Cu 4 P 2 0 9 may have a three-dimensional structure in which Cu0 5 of the pentaheadone, Cu0 4 of the square plane, and P0 4 of the tetrahedron share oxygen and are three-dimensionally connected to each other. This steric structure may be referred to as a Γ 1 space group structure.
한편, 도 7을 참조하면, Cu4P209에서 구리 이온은 Ml , M2 및 M3 부위에 위치할 수 있으며, Ml , M2 및 M3 부위에 위치한 구리 이온은 5개의 산소에 의해 배위되어 펜타헤드론 (pentahedron)의 국소 대칭을 이를 수 있다. 그리고, P는 4개의 산소와 함께 테트라헤드론의 국소 대칭을 이를 수 있다. 상기 Cu4P209은 상기 펜타헤드론의 Cu05와 테트라헤드론의 P04들이 서로 산소를 공유하며 3차원적으로 연결된 입체 구조를 가질 수 있으며, 이러한 입체 구조가 Pnma 공간군 구조로 지칭될 수 있다. _ 이러한 화학식 4로 표시되는 인산염의 P 1 흑은 Pnma 공간군 구조는 전술한 바와 같이 Cu05가 이루는 펜타헤드론의 국소 대칭을 포함하는데, 상기 국소 대칭 부위는 중심 대칭성을 가지지 않는 부위 (non-cent rosymmetr i c s i te)이기 때문에 상기 부위에 위치하는 구리 이온은 라포르테 허용 전이 (Laporte al lowed transi t ion)가 가능하다. C114P2O9의 이러한 결정 구조에 기인하는 에너지 준위 간의 전이는 대부분 근적외선 내지 적외선 영역에서 일어나게 된다. 따라서, 상기 비도전성 금속 화합물은 가시광선 영역의 흡광도가 낮으면서 근적외선 내지 적외선 영역의 흡광도가 높아, 밝은 색상을 가지면서도 근적외선 영역의 파장의 전자기파에 민감하게 반응하여 금속핵을 보다 잘 형성할 수 있다. Meanwhile, referring to FIG. 7, in Cu 4 P 2 0 9 , copper ions may be located at Ml, M2, and M3 sites, and copper ions located at Ml, M2, and M3 sites may be coordinated by five oxygen groups to pentahead. Local symmetry of the pentahedron can be achieved. P can then achieve local symmetry of tetrahedron with four oxygens. The Cu 4 P 2 0 9 may have a three-dimensional structure in which Cu0 5 of the pentaheadone and P0 4 of the tetrahedron share oxygen with each other and are three-dimensionally connected, and the three-dimensional structure is referred to as a Pnma space group structure. Can be. The P 1 black or Pnma space group structure of the phosphate represented by Formula 4 includes the local symmetry of the pentaheadron formed by Cu0 5 as described above, and the local symmetry site is a site having no central symmetry (non- Because of the cent rosymmetr icsi te, the copper ions located at this site are capable of Laporte al lowed transit ion. The transition between energy levels due to this crystal structure of C114P2O9 mostly occurs in the near infrared to infrared region. Accordingly, the non-conductive metal compound may have a low absorbance in the visible light region and high absorbance in the near infrared to infrared regions, and may react with electromagnetic waves of a wavelength in the near infrared region while having a bright color, thereby forming a metal core better. .
이러한 화학식 1 내지 화학식 4의 인산염은 고분자 수지와 우수한 상용성을 가지며, 상기 환원 또는 도금 처리 등에 사용되는 용액에 대해서도 화학적으로 안정하여 비도전성을 유지하는 특성을 갖는다. 따라서, 전자기파가 조사되지 않은 영역에서는 상기 비도전성 금속 화합물이 고분자 수지 기재 내에 균일하게 분산된 상태로 화학적으로 안정하게 유지되어 비도전성을 나타낼 수 있다ᅳ 이에 비해, 전자기파가 조사된 소정 영역에서는 상기 비도전성 금속 화합물로부터 이미 상술한 원리로 금속핵이 용이하게 형성되며 이에 따라 미세한 도전성 패턴을 쉽게 형성할 수 있다. The phosphates of Formulas 1 to 4 have excellent compatibility with the polymer resin, and have a property of maintaining chemical conductivity by being chemically stable with respect to the solution used for the reduction or plating treatment. Therefore, in the region where electromagnetic waves are not irradiated, the non-conductive metal compound may be chemically stable while being uniformly dispersed in the polymer resin substrate, thereby exhibiting non-conductivity. From the malleable metal compound, the metal nucleus is easily formed on the principle described above, and thus a fine conductive pattern can be easily formed.
따라서, 상술한 일 구현예의 조성물을 사용하면, 각종 고분자 수지 제품 또는 수지층 등의 고분챠 수지 기재 상에, 레이저 등 전자기파를 조사하는 매우 단순화된 공정으로 미세한 도전성 패턴을 형성할 수 있다. Therefore, by using the composition of the embodiment described above, it is possible to form a fine conductive pattern in a very simplified process of irradiating electromagnetic waves, such as a laser, on a high-polymer resin substrate such as various polymer resin products or resin layers.
부가하여, 일 구현예에 따른 조성물에 포함되는 비도전성 금속 화합물은 밝은 색을 나타내므로, 상대적으로 적은 색 첨가제의 사용으로도 백색 혹은 회색 등 다양한 색상의 고분자 수지 제품 또는 수지층을 안정적으로 구현할 수 있다. 일 예로, 스피넬 구조를 갖는 CuCr204 등의 화합물은 어두운 혹색 (dark black)을 나타냄에 따라, 이러한 비도전성 금속 화합물을 포함하는 조성물은 다양한 색채의 고분자 수지 제품 또는 수지층을 구현하는데 적합하지 않을 수 있다. 이에 비해, 상기 화학식 1 내지 4의 인산염은 밝은 색을 띠므로 적은 색 첨가제의 추가로도 백색 혹은 회색 등 다양한 색상의 고분자 수지 제품을 보다 안정적으로 구현할 수 있다. 따라서, 비도전성 금속 화합물로 상술한 입체 구조의 화학식 1 내지 4로 표시되는 인산염을 사용할 경우 각종 고분자 수지 제품 등에 다양한 색상을 구현하고자 하는 당업계의 요구를 보다 효과적으로 충족시킬 수 있다. In addition, the non-conductive metal compound included in the composition according to one embodiment Since it shows a bright color, it is possible to stably implement a polymer resin product or a resin layer of various colors such as white or gray even with the use of relatively few color additives. For example, as a compound such as CuCr 2 O 4 having a spinel structure exhibits a dark black color, a composition including such a non-conductive metal compound is not suitable for implementing polymer resin products or resin layers of various colors. You may not. On the other hand, since the phosphate of Formulas 1 to 4 has a bright color, it is possible to more stably implement polymer resin products of various colors such as white or gray with the addition of less color additives. Therefore, when using the phosphate represented by the above-described three-dimensional structure of the three-dimensional structure as the non-conductive metal compound can satisfy the needs of the art to implement a variety of colors, such as various polymer resin products.
상기 일 구현예에 따른 조성물에 포함되는 비도전성 금속 화합물로는 상기 화학식 1 내지 4로 표시되는 인산염 중 1종 흑은 2종 이상이 사용될 수 있다. 이 중에서도 보다 용이하게 금속핵 및 접착활성 표면을 형성하며, 다양한 색상의 수지 제품 혹은 수지층을 제공하고, 방열 소재를 단독으로 사용할 때보다 우수한 방열 효과를 통한 열 안정성을 확보하기 위해, CuSn2(P04)3 , Cu3P208 , Cu2P207 , CU4P2O9 등이 사용될 수 있다. As the non-conductive metal compound included in the composition according to the embodiment, one or more black or two kinds of phosphates represented by Chemical Formulas 1 to 4 may be used. Among them, in order to form metal cores and adhesive active surfaces more easily, to provide resin products or resin layers of various colors, and to secure thermal stability through heat dissipation effect better than using heat dissipating materials alone, CuSn 2 ( P0 4 ) 3 , Cu 3 P 2 O 8 , Cu 2 P 2 O 7 , CU 4 P 2 O 9 , and the like may be used.
상기 일 구현예에 따른 조성물에 포함되는 비도전성 금속 화합물의 평균 입도는 약 0. 1 내지 6//Π1 정도로 조절될 수 있다. 이러한 비도전성 금속 화합물은 고분자 수지와 우수한 상용성을 나타내 전자기파가 조사되지 않은 영역에서는 비도전성을 나타내며, 전자기파의 조사된 영역에만 선택적으로 금속첵을 형성시켜 미세한 도전성 패턴을 고르게 형성할 수 있다. The average particle size of the non-conductive metal compound included in the composition according to the embodiment may be adjusted to about 0.01 to 6 / / / 1. Such a non-conductive metal compound exhibits excellent compatibility with the polymer resin, exhibits non-conductivity in the region where electromagnetic waves are not irradiated, and can form a fine conductive pattern evenly by selectively forming metal 에만 only in the irradiated region of electromagnetic waves.
상기 일 구현예에 따른 조성물에서 상기 비도전성 금속 화합물은 전체 조성물에 대해 약 0. 1 내지 10 중량 %로 포함될 수 있다. 이러한 함량 범위에 따라, 상기 조성물로부터 형성된 고분자 수지 제품 또는 수지층의 기계적 물성 등 기본적인 물성을 적절히 유지하면서도, 전자기파 조사에 의해 일정 영역에 도전성 패턴을 형성하는 특성을 바람직하게 나타낼 수 있다. In the composition according to the embodiment, the non-conductive metal compound may be included in an amount of about 0.01 wt% to 10 wt% based on the total composition. According to this content range, while maintaining the basic physical properties such as the mechanical properties of the polymer resin product or the resin layer formed from the composition, it can preferably exhibit the characteristics of forming a conductive pattern in a certain region by electromagnetic wave irradiation.
한편, 상기 일 구현예에 따른 조성물은 방열 소^를 포함하여 우수한 열 전도도 및 열 확산성을 나타낼 수 있다. 이에 따라, 상기 일 구현예에 따른 조성물을 이용하면 기존의 방열체 흑은 방열층과 같은 방열 구조체를 생략할 수 있어 단순화된 전자 제품 등을 제공할 수 있다. On the other hand, the composition according to the embodiment may exhibit excellent thermal conductivity and thermal diffusivity, including heat radiation. Accordingly, using the composition according to the embodiment can omit the heat dissipation structure such as the existing heat dissipator black heat dissipation layer. Thereby, a simplified electronic product can be provided.
보다 구체적으로, 기존의 전자 부품 기판은 도 8과 같이 PCB 기판 ( 1)의 온도 상승을 방지하기 위해 히트 싱크 (heat sink, 3)를 필수적으로 채용하였다. More specifically, the conventional electronic component substrate essentially employs a heat sink 3 to prevent the temperature rise of the PCB substrate 1 as shown in FIG. 8.
' 그러나, 일 구현예에 따른 조성물을 이용하여 기존의 블탱킷 (4) 형상의 고분자 수지 제품을 성형한 후, 레이저 등 전자기파를 조사하고 환원 또는 도금 등을 진행하면 우수한 방열 특성을 나타내면서도 미세한 도전성 패턴 (2)이 형성된 전자 부품 기판 (5)을 제공할 수 있다. 이에 따라, 일 구현예에 따른 조성물을 이용하여 기존의 PCB 기판 ( 1), 히트 성크 (3) 및 블탱킷 (4)을 일체화할 수 있다. 'However, after molding the polymer resin product in the shape of the conventional blanket (4) using the composition according to the embodiment, and irradiated with electromagnetic waves, such as a laser and proceeds to reduction or plating, it exhibits excellent heat dissipation characteristics and fine conductivity The electronic component board | substrate 5 in which the pattern 2 was formed can be provided. Accordingly, the composition according to the embodiment can be integrated to the existing PCB substrate 1, the heat shank 3 and the blanket (4).
상기 일 구현예에 따른 조성물에는 상기 방열 소재로서 탄화물, 탄소계 소재, 질화계 소재, 금속 산화물 또는 이들의 흔합물이 포함될 수 있다. 보다 구체적으로, 탄화물로서 탄화규소 (SiC) 등이 포함되거나, 탄소계 소재로서 카본블랙 (carbon bl ack) , 카본나노튜브 (carbon nanotube , CNT) , 혹연 (graphi te), 그래핀 (graphene) 또는 이들꾀 흔합물 등이 포함되거나, 질화계 소재로서 질화붕소 (BN) , 질화규소 (Si3B4) , 질화알루미늄 (A1N) 또는 이들의 흔합물 등이 포함되거나, 혹은 금속 산화물로서 산화마그네슘 (MgO) , 산화알루미늄 (A1203) , 산화베릴륨 (BeO) , 산화아연 (ZnO) 또는 이들의 흔합물 등이 포함될 수 있다. The composition according to the embodiment may include carbide, carbon-based material, nitride-based material, metal oxide or a combination thereof as the heat dissipating material. More specifically, silicon carbide (SiC) or the like is included, or carbon black (carbon bl ack), carbon nanotube (carbon nanotube, CNT), graphi te, graphene (graphene) or the like as a carbon-based material These mixtures include boron nitride (BN), silicon nitride (Si 3 B 4 ), aluminum nitride (A1N) or a mixture thereof, or the like, or as a metal oxide, magnesium oxide (MgO). ), Aluminum oxide (A1 2 0 3 ), beryllium oxide (BeO), zinc oxide (ZnO), or a combination thereof.
이러한 방열 소재는 비도전성 금속 화합물의 전자기파 조사에 의한 금속핵 형성에 영향을 미치지 않으면서도 고분자 수지와 상용성이 우수하여 양호한 도전성 패턴이 형성되어 있는 우수한 방열 특성의 수지 제품 흑은 수지층을 제공할 수 있다. Such a heat dissipating material is excellent in compatibility with polymer resins without affecting the formation of metal nuclei by electromagnetic wave irradiation of a non-conductive metal compound, thereby providing a resin product black resin layer having excellent heat dissipation characteristics in which a good conductive pattern is formed. Can be.
상기 일 구현예에 따른 조성물에서 상기 방열 소재는 목적하는 수준의 방열 특성을 나타내도록 전체 조성물에 대해 약 0. 1 내지 약 50 중량 %의 범위 내로 포함될 수 있다. 이때, 방열 소재가 탄화물이나 탄소계 소재인 경우에는 절연 특성 유지를 위해 방열 소재의 함량이 0. 1 내지 20 중량 %로 조절될 수 있다. 이러한 함량 범위에 따라, 상기 조성물로부터 형성된 고분자 수지 제품 또는 수지층의 기본적인 물성을 적절히 유지하면서도, 일정 수준의 열 확산성 및 열 전도성을 바람직하게 나타낼 수 있다. The heat dissipating material in the composition according to the embodiment may be included in the range of about 0.01 to about 50% by weight based on the total composition to exhibit a desired level of heat dissipation characteristics. In this case, when the heat dissipation material is a carbide or carbon-based material, the content of the heat dissipation material may be adjusted to 0.01 to 20% by weight in order to maintain insulation characteristics. According to this content range, while maintaining the basic physical properties of the polymer resin product or the resin layer formed from the composition, it may preferably exhibit a certain level of heat diffusion and thermal conductivity.
한편, 상술한 일 구현예의 도전성 패턴 형성용 조성물에서, 상기 고분자 수지로는 다양한 고분자 수지 제품 또는 수지층을 형성할 수 있는 임의의 열 경화성 수지 또는 열 가소성 수지를 별다른 제한 없이 사용할 수 있다. 특히, 상술한 비도전성 금속 화합물은 다양한 고분자 수지와 우수한 상용성 및 균일한 분산성을 나타낼 수 있으며, 일 구현예의 조성물은 다양한 고분자 수지를 포함하여 여러 가지 수지 제품 또는 수지층으로 성형될 수 있다. 이러한 고분자 수지의 구체적인 예로는, ABS (Acrylonitile poly-butadiene styrene) 수지, 폴리부틸렌테레프탈레이트 수지 또는 폴리에틸렌테레프탈레이트 수지 등의 폴리알킬렌테레프탈레이 수지, 폴리아미드 수지, 폴리페닐에테르 수지, 폴리페닐렌 설파이드 수지, 폴리카보네이트 수지, 폴리프로필렌 수지 또는 폴리프탈아미드 수지 등을 들 수 있고, 이외에도 다양한 고분자 수지를 포함할 수 있다. On the other hand, in the composition for forming a conductive pattern of the embodiment described above, as the polymer resin any heat that can form a variety of polymer resin products or resin layers Curable resins or thermoplastic resins can be used without particular limitation. In particular, the non-conductive metal compound described above may exhibit excellent compatibility and uniform dispersibility with various polymer resins, and the composition of one embodiment may be molded into various resin products or resin layers including various polymer resins. Specific examples of such polymer resins include polyalkylene terephthalate resins such as ABS (Acrylonitile poly-butadiene styrene) resins, polybutylene terephthalate resins or polyethylene terephthalate resins, polyamide resins, polyphenylether resins, and polyphenylenes. Sulfide resins, polycarbonate resins, polypropylene resins, polyphthalamide resins, and the like. In addition, various polymer resins may be included.
또한, 상기 도전성 패턴 형성용 조성물에서, 상기 비도전성 금속 화합물은 전체 조성물에 대해 약 0.1 내지 10 중량 %로 포함될 수 있으며, 상기 방열 소재는 전체 조성물에 대해 약 1 내지 50 중량 ¾로 포함될 수 있고, 나머지 함량의 고분자 수지가 포함될 수 있다. 이때, 방열 소재가 탄화물 및 /또는 탄소계 소재인 경우 방열 소재는 전체 조성물에 대해 약 1 내지 20 중량 %로 포함되며, 나머지 함량은 고분자 수지로 대체될 수 있다. In addition, in the composition for forming a conductive pattern, the non-conductive metal compound may be included in about 0.1 to 10% by weight based on the total composition, the heat dissipating material may be included in about 1 to 50 weight ¾ of the total composition, The remaining amount of polymer resin may be included. In this case, when the heat dissipation material is a carbide and / or carbon-based material, the heat dissipation material is included in about 1 to 20% by weight based on the total composition, the remaining content may be replaced by a polymer resin.
이러한 함량 범위에 따라, 상기 조성물로부터 형성된 고분자 수지 제품 또는 수지층의 기계적 물성 등 기본적인 물성을 적절히 유지하면서도, 전자기파 조사에 의해 일정 영역에 도전성 패턴을 형성하는 특성과 방열 특성을 바람직하게 나타낼 수 있다. According to this content range, while maintaining the basic physical properties such as the mechanical properties of the polymer resin product or the resin layer formed from the composition as appropriate, it can preferably exhibit the characteristics and heat dissipation characteristics to form a conductive pattern in a certain region by electromagnetic wave irradiation.
그리고, 상기 도전성 패턴 형성용 조성물은 상술한 고분자 수지 및 소정의 비도전성 금속 화합물 및 방열 소재 외에, 난연제, 열 안정제, UV 안정제, 활제, 항산화제, 무기 충전제, 색 첨가제, 층격 보강제 및 기능성 보강제로 이루어진 군에서 선택된 1종 이상의 첨가제를 더 포함할 수도 있다. 이러한 첨가제의 부가로, 일 구현예의 조성물로부타 얻어진 수지 구조체의 물성을 적절히 보강할 수 있다. 이러한 첨가제 중, 상기 색 첨가제, 예를 들어, 안료 등의 경우에는, 약 0.1 내지 10 증량 % 혹은 약 1 내지 10 중량 >의 함량으로 포함되어, 상기 수지 구조체에 원하는 색상을 부여할 수 있다. The conductive pattern forming composition may be used as a flame retardant, a heat stabilizer, a UV stabilizer, a lubricant, an antioxidant, an inorganic filler, a color additive, a layer reinforcing agent, and a functional reinforcing agent, in addition to the polymer resin and the predetermined non-conductive metal compound and the heat dissipating material. It may further comprise one or more additives selected from the group consisting of. By the addition of such additives, it is possible to appropriately reinforce the physical properties of the obtained resin structure by the composition of the embodiment. Among these additives, in the case of the color additive, for example, a pigment, etc., it may be included in an amount of about 0.1 to 10% by weight or about 1 to 10% by weight, to impart a desired color to the resin structure.
이러한 안료 등 색 첨가제의 대표적인 예로는, ZnO, ZnS, Talc, Ti02, Sn02, 또는 BaS04 등의 백색 안료가 있으며, 이외에도 이전부터 고분자 수지 조성물에 사용 가능한 것으로 알려진 다양한 종류 및 색상의 안료 등 색 첨가제를 사용할 수 있음은 물론이다. Representative examples of color additives such as pigments include white pigments such as ZnO, ZnS, Talc, Ti0 2 , Sn0 2 , or BaS0 4 . Of course, color additives such as pigments of various kinds and colors known to be usable in the composition can be used.
상기 난연제는 인계 난연제 및 무기 난연제를 포함하는 것일 수 있다. 보다 구체적으로, 상기 인계 난연제로는 트리페닐 포스페이트 (tr iphenyl phosphate , TPP), 트리자일레닐 포스페이트 (tr ixylenyl phosphate , TXP), 트리크레실 포스페이트 (tr i cresyl phosphate , TCP) , 또는 트리이소페닐 포스페이트 (tr i i sophenyl phosphate , RE0F0S) 등을 포함하는 인산 에스테르계 난연제; 방향족 폴리포스페이트 (aromat i c polyphosphate)계 난연제; 폴리인산염계 난연제; 또는 적린계 난연제 등을 사용할 수 있으며, 이외에도 수지 조성물에 사용 가능한 것으로 알려진 다양한 인계 난연제를 별다른 제한 없이 모두 사용할 수 있다. 또한, 상기 무기 난연제로는 수산화 알루미늄, 수산화 마그네슘, 붕산 아연, 몰리브덴 산화물 (Mo03) , 몰리브덴 과산화물 염 (Mo207 2— ), 칼슴-아연-몰리브산염, 삼산화 안티몬 (Sb203) , 또는 오산화 안티몬 (Sb205) 등을 들 수 있다. 다만, 무기 난연제의 예가 이에 한정되는 것은 아니며, 기타 수지 조성물에 사용 가능한 것으로 알려진 다양한 무기 난연제를 별다른 제한 없이 모두 사용할 수 있다. The flame retardant may include a phosphorus-based flame retardant and an inorganic flame retardant. More specifically, the phosphorus flame retardant may be triphenyl phosphate (tr iphenyl phosphate, TPP), trixylenyl phosphate (tr ixylenyl phosphate, TXP), tricresyl phosphate (tr i cresyl phosphate, TCP), or triisophenyl Phosphate ester flame retardants, including phosphate (tr ii sophenyl phosphate, RE0F0S); Aromatic polyphosphate-based flame retardants; Polyphosphate flame retardants; Alternatively, red phosphorus-based flame retardants may be used, and various phosphorus-based flame retardants known to be usable in the resin composition may be used without any particular limitation. In addition, the inorganic flame retardant may include aluminum hydroxide, magnesium hydroxide, zinc borate, molybdenum oxide (Mo0 3 ), molybdenum peroxide salt (Mo 2 0 7 2 —), chamomile-zinc-molybdate, antimony trioxide (Sb 2 0 3 ) Or antimony pentoxide (Sb 2 0 5 ) and the like. However, examples of the inorganic flame retardant are not limited thereto, and various inorganic flame retardants known to be usable in other resin compositions may be used without any particular limitation.
또, 층격 보강제 등의 경우 약 1 내지 12 증량 ¾의 함량으로 포함되고, 열 안정제 UV 안정제, 활제 또는 항산화제 등의 경우 약 0.05 내지 5 중량 %의 함량으로 포함되어, 상기 수지 구조체에 원하는 물성을 적절히 발현시킬 수 있다. 한편, 이하에서는 상술한 일 구현예의 도전성 패턴 형성용 조성물을 사용하여, 수지 제품 또는 수지층 등의 고분자 수지 기재 상에, 전자기파의 직접 조사에 의해 도전성 패턴을 형성하는 방법을 구체적으로 설명하기로 한다. 이러한 도전성 패턴의 형성 방법은, 상술한 도전성 패턴 형성용 조성물을 수지 제품으로 성형하거나, 다른 제품에 도포하여 수지층을 형성하는 단계; 상기 수지 제품 또는 수지층의 소정 영역에 전자기파를 조사하여 상기 비도전성 금속 화합물 입자로부터 금속핵을 발생시키는 단계; 및 상기 금속핵을 발생시킨 영역을 화학적으로 환원 또는 도금시켜 도전성 금속층을 형성하는 단계를 포함할 수 있다. In addition, in the case of a layer reinforcing agent, etc., it is included in an amount of about 1 to 12 wt. ¾, and in the case of a heat stabilizer UV stabilizer, a lubricant or an antioxidant, it is included in an amount of about 0.05 to 5 wt%, and the desired physical properties of the resin structure. It can express suitably. Meanwhile, hereinafter, a method of forming a conductive pattern by direct irradiation of electromagnetic waves on a polymer resin substrate such as a resin product or a resin layer using the composition for forming a conductive pattern according to the above-described embodiment will be described in detail. . Such a method of forming a conductive pattern may include forming the resin layer by molding the above-described composition for forming a conductive pattern into a resin product or by applying it to another product; Irradiating an electromagnetic wave to a predetermined region of the resin product or the resin layer to generate metal nuclei from the non-conductive metal compound particles; And chemically reducing or plating the region generating the metal nucleus to form a conductive metal layer.
이러한 도전성 패턴의 형성 방법을 첨부한 도면을 참고하여 각 단계별로 설명하면 이하와 같다. 참고로, 도 10에서는 상기 도전성 패턴 형성 방법의 일 예를 공정 단계별로 간략화하여 나타내고 있다. Referring to the accompanying drawings, a method of forming the conductive pattern is described in each step as follows. For reference, in Figure 10 one of the conductive pattern forming method An example is shown by the process step by step.
상기 도전성 패턴 형성 방법에서는, 먼저, 상술한 도전성 패턴 형성용 조성물을 수지 제품으로 성형하거나, 다른 제품에 도포하여 수지층을 형성할 수 있다ᅳ 이러한 수지 제품의 성형 또는 수지층의 형성에 있어서는, 통상적인 고분자 수지 조성물을 사용한 제품 성형 방법 또는 수지층 형성 방법이 별다른 제한 없이 적용될 수 있다. 예를 들어, 상기 조성물을 사용하여 수지 제품을 성형함에 있어서는, 상기 도전성 패턴 형성용 조성물을 압출 및 넁각한 후 펠릿 또는 입자 형태로 형성하고, 이를 원하는 형태로 사출 성형하여 다양한 고분자 수지 제품을 제조할 수 있다. In the method for forming a conductive pattern, first, the above-described composition for forming a conductive pattern may be molded into a resin product or applied to another product to form a resin layer. A product molding method or a resin layer forming method using the phosphorus polymer resin composition may be applied without particular limitation. For example, in molding a resin product using the composition, the composition for forming the conductive pattern is extruded and engraved, and then formed into pellets or particles, and then injection molded into a desired form to produce various polymer resin products. Can be.
이렇게 형성된 고분자 수지 제품 또는 수지층은 상기 고분자 수지로부터 형성된 수지 기재 상에, 상술한 특정 비도전성 금속 화합물 및 방열 소재가 균일하게 분산된 형태를 가질 수 있다. 특히, 상기 화학식 1 내지 4의 인산염은 다양한 고분자 수지와 우수한 상용성 및 화학적 안정성을 가지므로, 상기 수지 기재 상의 전 영역에 걸쳐 균일하게 분산되어 비도전성을 갖는 상태로 유지될 수 있다. The polymer resin product or the resin layer thus formed may have a form in which the specific non-conductive metal compound and the heat dissipating material described above are uniformly dispersed on the resin substrate formed from the polymer resin. In particular, since the phosphate of Chemical Formulas 1 to 4 have excellent compatibility and chemical stability with various polymer resins, the phosphate of Chemical Formulas 1 to 4 may be uniformly dispersed throughout the entire region of the resin substrate and maintained in a non-conductive state.
이러한 고분자 수지 제품 또는 수지층을 형성한 후에는, 도 10의 첫 번째 도면에 도시된 바와 같이, 도전성 패턴을 형성하고자 하는 상기 수지 제품 또는 수지층의 소정 영역에, 레이저 등 전자기파를 조사할 수 있다. 이러한 전자기파를 조사하면, 상기 비도전성 금속 화합물로부터 금속핵을 용이하게 발생시킬 수 있다 (도 10의 두 번째 도면 참조) . After forming the polymer resin product or the resin layer, as shown in the first drawing of FIG. 10, electromagnetic waves such as a laser may be irradiated to a predetermined region of the resin product or the resin layer to form the conductive pattern. . By irradiating such electromagnetic waves, metal nuclei can be easily generated from the non-conductive metal compound (see the second drawing of FIG. 10).
보다 구체적으로, 상기 전자기파 조사에 의한 금속핵 발생 단계를 진행하면, 상기 비도전성 금속 화합물의 일부가 상기 수지 제품 또는 수지층의 소정 영역 표면으로 노출되면서 이로부터 금속핵이 발생되고, 보다 높은 접착성을 갖도록 활성화된 접착활성 표면을 형성할 수 있다. 이러한 접착활성 표면이 전자기파가 조사된 일정 영역에서만 선택적으로 형성됨에 따라, 후술하는 환원 또는 도금 단계 등을 진행하면, 상기 금속핵 및 접착활성 표면에 포함된 도전성 금속 이온 등이 화학적 환원됨으로써, 상기 도전성 금속층이 소정 영역의 고분자 수지 기재 상에 선택적으로 형성될 수 있다. More specifically, when the metal nucleus generation step is performed by the electromagnetic wave irradiation, a portion of the non-conductive metal compound is exposed to the surface of a predetermined region of the resin product or the resin layer, and a metal nucleus is generated therefrom. It is possible to form an adhesively active surface activated to have. As the adhesion-activated surface is selectively formed only in a predetermined region irradiated with electromagnetic waves, when the reduction or plating step described below is performed, the metal nucleus and the conductive metal ions included in the adhesion-activated surface are chemically reduced, and thus the conductivity The metal layer may be selectively formed on the polymer resin substrate in the predetermined region.
한편, 상술한 금속핵 발생 단계에 있어서는, 전자기파 중에서도, 근적외선 영역의 레이저 전자기파가 조사될 수 있고, 예를 들어, 약 lOOOnm 내지 1200nm, 혹은 약 1060nm 내지 1070nm , 혹은 약 1064nm의 파장을 갖는 레이저 전자기파가 약 1 내지 20W , 혹은 약 3 내지 10W의 평균 파워로 조사될 수 있다. 이러한 범위로 레이저 등 전자기파의 조사 조건이 제어됨에 따라, 비도전성 금속 화합물로부터 금속핵 및 이를 포함하는 접착활성 표면 등이 더욱 잘 형성될 수 있으며, 이로써 보다 양호한 도전성 패턴의 형성이 가능해 진다. 다만, 실제 사용되는 비도전성 금속 화합물 및 고분자 수지의 구체적인 종류나 이들의 조성에 따라, 금속핵 등의 형성을 가능케 하는 전자기파 조사 조건이 다르게 제어될 수도 있다. On the other hand, in the above-described metal nucleation step, among the electromagnetic waves, laser electromagnetic waves in the near infrared region can be irradiated, for example, from about 100 to Laser electromagnetic waves having a wavelength of 1200 nm, or about 1060 nm to 1070 nm, or about 1064 nm may be irradiated with an average power of about 1 to 20 W, or about 3 to 10 W. As the irradiation conditions of electromagnetic waves such as lasers are controlled in this range, a metal core and an adhesive active surface including the same can be better formed from the non-conductive metal compound, thereby enabling formation of a better conductive pattern. However, depending on the specific types of the non-conductive metal compounds and the polymer resins actually used or their composition, the electromagnetic wave irradiation conditions for forming the metal nucleus may be controlled differently.
한편 상술한 금속핵 발생 단계를 진행한 후에는, 도 10의 세 번째 도면에 도시된 바와 같이, 상기 금속핵을 발생시킨 영역을 화학적으로 환원 또는 도금시켜 도전성 금속층을 형성하는 단계를 진행할 수 있다. 이러한 환원 또는 도금 단계를 진행한 결과, 상기 금속핵 및 접착활성 표면이 노출된 소정 영역에서 선택적으로 도전성 금속층이 형성될 수 있고, 나머지 영역에서는 화학적으로 안정한 비도전성 금속 화합물이 그대로 비도전성을 유지할 수 있다. 이에 따라, 고분자 수지 기재 상의 소정 영역에만 선택적으로 미세한 도전성 패턴이 형성될 수 있다. Meanwhile, after the above-described metal nucleus generation step, as shown in the third drawing of FIG. 10, the conductive metal layer may be formed by chemically reducing or plating the region where the metal nucleus is generated. As a result of the reduction or plating step, the conductive metal layer may be selectively formed in a predetermined region where the metal nucleus and the adhesive active surface are exposed, and the chemically stable non-conductive metal compound may maintain the non-conductivity as it is. have. Accordingly, a fine conductive pattern may be selectively formed only in a predetermined region on the polymer resin substrate.
이러한 환원 또는 도금 단계에서는 상기 금속핵을 발생시킨 수지 제품 또는 수지층을 환원제를 포함한 산성 또는 염기성 용액으로 처리할 수 있으며, 이러한 용액은 환원제로서, 포름알데히드, 차아인산염, 디메틸아미노보레인 (DMAB) , 디에틸아미노보레인 (DEAB) 및 히드라진으로 이루어진 군에서 선택된 1종 이상을 포함할 수 있다. 다른 예에서, 상기 환원 또는 도금 단계에서는 상기 금속핵을 발생시킨 수지 제품 또는 수지층을 환원제 및 도전성 금속 이온을 포함한 무전해 도금 용액 등으로 처리할 수도 있다. In this reduction or plating step, the resin product or the resin layer which generated the metal nucleus may be treated with an acidic or basic solution including a reducing agent, and such a solution may be formaldehyde, hypophosphite, dimethylaminoborane (DMAB) as a reducing agent. It may include one or more selected from the group consisting of, diethylaminoborane (DEAB) and hydrazine. In another example, in the reducing or plating step, the resin product or resin layer generating the metal core may be treated with an electroless plating solution containing a reducing agent and conductive metal ions.
이와 같은 환원 또는 도금 단계의 진행으로, 상기 금속핵에 포함된 금속 이은이 환원되거나, 상기 금속핵이 형성된 영역에서 이를 seed로 하여 상기 무전해 도금 용액에 포함된 도전성 금속 이온이 화학적 환원되어, 소정 영역에 선택적으로 양호한 도전성 패턴이 형성될 수 있다. 이때, 상기 금속핵 및 접착활성 표면은 상기 화학적으로 환원되는 도전성 금속 이온과 강한 결합을 형성할 수 있고, 그 결과 소정 영역에 선택적으로 도전성 패턴이 보다 용이하게 형성될 수 있다. 한편, 발명의 다른 구현예에 따르면, 상술한 도전성 패턴 형성용 조성물 및 도전성 패턴 형성 방법에 의해 얻어진 도전성 패턴을 갖는 수지 구조체가 제공된다. 이러한 수지 구조체는 고분자 수지 기재; 고분자 수지 기재에 분산되어 있는 상기 화학식 1 내지 4로 표시되는 인산염으로 이루어진 군에서 선택된 1종 이상의 인산염을 포함하는 비도전성 금속 화합물; 고분자 수지 기재에 분산되어 있는 방열 소재로서 탄화물, 탄소계 소재, 질화계 소재, 금속 산화물 또는 이들의 흔합물; 소정 영역의 고분자 수지 기재 표면에 노출된 금속핵을 포함하는 접착활성 표면; 및 상기 접착활성 표면 상에 형성된 도전성 금속층을 포함할 수 있다. As the reduction or plating step proceeds, the metal silver contained in the metal core is reduced, or the conductive metal ions contained in the electroless plating solution are chemically reduced by using the seed as a seed in a region where the metal core is formed. Optionally good conductive patterns can be formed in the region. In this case, the metal nucleus and the adhesion-activated surface may form strong bonds with the chemically reduced conductive metal ions, and as a result, a conductive pattern may be more easily formed in a predetermined region. On the other hand, according to another embodiment of the invention, there is provided a resin structure having a conductive pattern obtained by the above-described composition for forming a conductive pattern and a conductive pattern forming method. Such a resin structure includes a polymer resin substrate; A non-conductive metal compound comprising at least one phosphate selected from the group consisting of phosphates represented by Formulas 1 to 4 dispersed in a polymer resin substrate; Examples of heat dissipating materials dispersed in a polymer resin substrate include carbides, carbon-based materials, nitride-based materials, metal oxides, or mixtures thereof; An adhesive active surface comprising a metal nucleus exposed to a surface of a polymer resin substrate in a predetermined region; And it may include a conductive metal layer formed on the adhesive active surface.
이러한 수지 구조체에서, 상기 접착활성 표면 및 도전성 금속층이 형성된 소정 영역은 상기 고분자 수지 기재에 전자기파가 조사된 영역에 대응할 수 있다. 또, 상기 접착활성 표면의 금속핵에 포함된 금속이나 그 이온은 상기 비도전성 금속 화합물에서 유래한 것으로 될 수 있다. 한편, 상기 도전성 금속층은 상기 비도전성 금속 화합물에 포함된 금속에서 유래하거나, 무전해 도금 용액에 포함된 도전성 금속 이온에서 유래한 것으로 될 수 있다. In such a resin structure, a predetermined region in which the adhesive active surface and the conductive metal layer are formed may correspond to a region in which electromagnetic waves are irradiated onto the polymer resin substrate. The metal contained in the metal nucleus on the adhesion-activated surface or its ions may be derived from the non-conductive metal compound. On the other hand, the conductive metal layer may be derived from the metal contained in the non-conductive metal compound, or may be derived from the conductive metal ions contained in the electroless plating solution.
또한, 상기 수지 구조체는', 상기 비도전성 금속 화합물에서 유래한 잔류물을 더 포함할 수 있다. 이러한 잔류물은 상기 비도전성 금속 화합물에 포함된 금속 중 적어도 일부가 방출되어, 그 자리의 적어도 일부에 vacancy가 형성된 구조 * 가질 수 있다. In addition, the resin structure may further include a residue derived from ' , the non-conductive metal compound. Such a residue may have a structure * in which at least a part of the metal included in the non-conductive metal compound is released, and vacancy is formed in at least part of the site.
상술한 수지 구조체는 안테나용 도전성 패턴을 갖는 휴대폰 또는 타블렛 The resin structure described above is a mobile phone or tablet having a conductive pattern for an antenna
PC 케이스, 자동차용 부품 등 각종 수지 제품 또는 수지층으로 되거나, 기타Made of various resin products such as PC cases, automotive parts, or resin layers, etc.
RFID 태그, 각종 센서 또는 MEMS 구조체 등의 도전성 패턴을 갖는 다양한 수지 제품 또는 수지층으로 될 수 있다. It can be made of various resin products or resin layers having conductive patterns such as RFID tags, various sensors, or MEMS structures.
상술한 바와 같이, 발명의 구현예들에 따르면, 우수한 방열 특성을 나타내면서, 레이저 등 전자기파를 조사하고 환원 또는 도금하는 매우 단순화된 방법으로, 각종 미세 도전성 패턴을 갖는 다양한 수지 제품을 양호하고도 용이하게 형성할 수 있다. 이하 발명의 구체적인 실시예를 통해 발명의 작용, 효과를 보다 구체적으로 설명하기로 한다. 다만, 이는 발명의 예시로서 제시된 것으로 이에 의해 발명의 권리범위가 어떠한 의미로든 한정되는 것은 아니다. 실시예 1 : 레이저 직접 조사에 의한 도전성 패턴의 형성 As described above, according to the embodiments of the present invention, it is a very simplified method of irradiating, reducing or plating electromagnetic waves such as a laser while showing excellent heat dissipation characteristics, and it is possible to easily and easily various resin products having various fine conductive patterns. Can be formed. Hereinafter, the operation and effects of the invention will be described in more detail with reference to specific examples. However, this is presented as an example of the invention and thus The scope of the invention is not limited in any way. Example 1 Formation of Conductive Patterns by Laser Direct Irradiation
기본 수지인 폴리부틸렌테레프탈레이트 수지 및 방열 소재로 혹연 (graphi te)과 비도전성 금속 화합물로 Cu3P208를 사용하였으며, 공정 및 안정화를 위한 첨가제들로서 열 안정화제 ( IR1076 , PEP36) , UV 안정제 (UV329) , 활제 (EP184) 및 층격 보강제 (S2001)들을 함께 사용하여 전자기파 조사에 의한 도전성 패턴 형성용 조성물을 제조하였다. 구체적으로, 폴리부틸렌쎄레프탈레이트 수지 69 중량 %, 비도전성 금속 화합물 5 중량 ¾>, 혹연 15 증량 %, 충격 보강제 10 중량 % 및 활제 포함 기타 첨가제 1 증량 %를 흔합하여 조성물을 얻었다. Polybutylene terephthalate resin, a basic resin, and Cu 3 P 2 0 8 were used as a graphi te and a non-conductive metal compound as a heat dissipating material, and heat stabilizers (IR1076, PEP36) as additives for process and stabilization. A UV stabilizer (UV329), a lubricant (EP184) and a layer reinforcement (S2001) were used together to prepare a composition for forming a conductive pattern by electromagnetic wave irradiation. Specifically, the composition was obtained by mixing 69% by weight of polybutylenecerephthalate resin, 5% by weight of a non-conductive metal compound> 15% by weight, 10% by weight of impact modifier and 1% by weight of other additives including lubricant.
상기에서 제조한 조성물을 260 내지 280 °C의 온도에서 압출기를 통해 압출하였다. 압출된 펠렛 형태의 조성물을 약 260 내지 270°C에서 직경 100 画, 두께 2 隱 기판으로 사출 성형하였다. The composition prepared above was extruded through an extruder at a temperature of 260 to 280 ° C. The composition in the form of extruded pellets was injection molded into a 100 mm diameter, 2 mm thick substrate at about 260 to 270 ° C.
한편, 위에서 제조된 수지 기판에 대해, Nd-YAG laser 장치를 이용하여, On the other hand, using the Nd-YAG laser device for the resin substrate manufactured above,
40kHz , 의 조건 하에 1064 nm 파장대의 레이저를 조사하여 표면을 활성화시켰다. 그리고, 상기 레이저 조사에 의해 표면이 활성화된 수지 구조체에 대하여 다음과 같이 무전해 도금 공정을 실시하였다. The surface was activated by irradiating a laser of 1064 nm wavelength under the conditions of 40 kHz. Then, the electroless plating process was performed on the resin structure whose surface was activated by the laser irradiation as follows.
도금 용액은 (주)엠에스씨에서 제공되는 MSMID-70을 이용하여 제조되었으며 제조공정은 다음과 같다. Cu 용액 (MSMID-70A) 40 ml , 착화제 (MSMID-70B) 120 ml , 보조착화제 (MSMID-70C) 3.5 ml , 안정제 (MSMID— 70D) 2 ml를 700 ml의 탈이온수에 용해시켜 Cu 도금 용액을 제조하였다. 제조된 도금 용액 1L에 2¾ NaOH 45 ml , 37% 포름알데하이드 12 ml를 첨가하였다. 레이저로 표면이 활성화된 수지 구조체를 3 내지 5 시간 동안 도금 용액에 담지시킨 후, 증류수로 세척하였다. 상기 레이저를 조사한 수지 구조체는 무전해 도금을 통하여 금속핵을 포함하는 접착활성 표면에 양호한 도전성 패턴 (혹은 도금층)을 형성하였다. 실시예 2 : 레이저 직접 조사에 의한 도전성 패턴의 형성 Plating solution was prepared using MSMID-70 provided by MS Co., Ltd. The manufacturing process is as follows. 40 ml of Cu solution (MSMID-70A), 120 ml of complexing agent (MSMID-70B), 3.5 ml of co-complexing agent (MSMID-70C), 2 ml of stabilizer (MSMID-70D) in 700 ml of deionized water The solution was prepared. 45 ml of 2¾ NaOH and 12 ml of 37% formaldehyde were added to 1 L of the prepared plating solution. The resin structure whose surface was activated with a laser was immersed in the plating solution for 3 to 5 hours, and then washed with distilled water. The resin structure irradiated with the laser formed a good conductive pattern (or plating layer) on the adhesion-activated surface containing the metal nucleus through electroless plating. Example 2 Formation of Conductive Patterns by Laser Direct Irradiation
실시예 1에서 방열 소재로서 흑연 (graphi te) 대신 질화붕소 (BN)을 사용한 것을 제외하고, 실시예 1과 동일한 방법으로 도전성 패턴 형성용 조성물을 제조하고, 이로부터 도전성 패턴을 갖는 수지 구조체를 제조하였다. 실시예 3 : 레이저 직접 조사쎄 의한 도전성 패턴의 형성 Except for using boron nitride (BN) instead of graphite (graphi te) as a heat radiation material in Example 1, the composition for forming a conductive pattern in the same manner as in Example 1 And a resin structure having a conductive pattern was prepared therefrom. Example 3 Formation of Conductive Pattern by Laser Direct Irradiation
실시예 1에서 비도전성 금속 화합물로서 Cu3P208 대신 Cu4P209를 사용한 것을 제외하고, 실시예 1과 동일한 방법으로 도전성 패턴 형성용 조성물을 제조하고, 이로부터 도전성 패턴을 갖는 수지 구조체를 제조하였다. 비교예 1 : 레이저 직접 조사에 의한 도전성 패턴의 형성 Except for using Cu 4 P 2 0 9 instead of Cu 3 P 2 0 8 as a non-conductive metal compound in Example 1 to prepare a composition for forming a conductive pattern in the same manner as in Example 1, having a conductive pattern therefrom The resin structure was prepared. Comparative Example 1: Formation of a Conductive Pattern by Laser Direct Irradiation
실시예 1에서 방열 소재를 첨가하지 않아 폴리부틸렌테레프탈레이트 수지의 함량이 84 중량 %인 것을 제외하고, 실시예 1과 동일한 방법으로 도전성 패턴 형성용 조성물을 제조하고, 이로부터 도전성 패턴을 갖는 수지 구조체를 제조하였다. 비교예 2 : 레이저 직접 조사에 의한 도전성 패턴의 형성 Except that the heat radiation material is not added in Example 1, except that the content of the polybutylene terephthalate resin is 84% by weight, to prepare a composition for forming a conductive pattern in the same manner as in Example 1, a resin having a conductive pattern therefrom The structure was prepared. Comparative Example 2: Formation of Conductive Pattern by Laser Direct Irradiation
실시예 1에서 비도전성 금속 화합물을 첨가하지 않아 폴리부틸렌테레프탈레이트 수지의 함량이 74 중량 %인 것을 제외하고, 실시예 1과 동일한 방법으로 도전성 패턴 형성용 조성물을 제조하고, 이로부터 도전성 패턴을 갖는 수지 구조체를 제조하였다. 비교예 3 : 레이저 직접 조사에 의한 도전성 패턴의 형성 Except for the addition of the non-conductive metal compound in Example 1, except that the content of the polybutylene terephthalate resin is 74% by weight, a composition for forming a conductive pattern is prepared in the same manner as in Example 1, and a conductive pattern is prepared therefrom. A resin structure having was prepared. Comparative Example 3 Formation of Conductive Pattern by Laser Direct Irradiation
실시예 1에서 비도전성 금속 화합물로서 Cu3P208 대신 Cu2(0H)P04를 사용한 것을 제외하고, 실시예 1과 동일한ᅵ 방법으로 도전성 패턴 형성용 조성물을 제조하고, 이로부터 도전성 패턴을 갖는 수지 구조체를 제조하였다. 시험예: 도전성 패턴을 갖는 수지 구조체의 물성 평가 Example 1 In a non as conductive metal compound Cu 3 P 2 0 8 instead of Cu 2 (0H) conductive pattern except that the P0 4, and preparing the composition for conductive pattern forming in the same i way as in Example 1, and from which A resin structure having was prepared. Test Example: Evaluation of Physical Properties of Resin Structure Having Conductive Pattern
( 1) 실시예 및 비교예의 수지 구조체에 형성된 도전성 패턴 (혹은 도금층)의 접착 성능은 ISO 2409 표준 방법에 의한 Cross-cut 시험에 의해 평가되었다. ISO 2409 표준 방법에 의한 접착성 평가에서, c l ass 0 등급은 도전성 패턴의 박리 면적이 평가 대상 도전성 패턴 면적의 0%임을 의미하고, c l ass 1 등급은 도전성 패턴의 박리 면적이 평가 대상 도전성 패턴 면적의 0% 초과 5%이하를 의미한다. cl ass 2 등급은 도전성 패턴의 박리 면적이 평가 대상 도전성 패턴 면적의 5% 초과 15% 이하를 의미한다. class 3 등급은 도전성 패턴의 박리 면적이 평가 대상 도전성 패턴 면적의 15% 초과 35% 이하를 의미한다. c lass 4 등급은 도전성 패턴의 박리 면적이 평가 대상 도전성 패턴 면적의 35% 초과 65% 이하를 의미한다. c l ass 5 등급은 도전성 패턴의 박리 면적이 평가 대상 도전성 패턴 면적의 65% 초과를 의미한다. (1) The adhesion performance of the conductive patterns (or plating layers) formed on the resin structures of Examples and Comparative Examples was evaluated by a cross-cut test by the ISO 2409 standard method. In the adhesion evaluation by the ISO 2409 standard method, the cl ass 0 grade means that the peeling area of the conductive pattern is 0% of the conductive pattern area to be evaluated, and the cl ass 1 rating indicates that the peeling area of the conductive pattern is the conductive pattern area to be evaluated. 0% of It means more than 5%. The cl ass 2 grade means that the peeling area of the conductive pattern is greater than 5% and 15% or less of the conductive pattern area to be evaluated. The class 3 grade means that the peeling area of the conductive pattern is more than 15% and 35% or less of the conductive pattern area to be evaluated. c lass 4 means that the peeling area of the conductive pattern is greater than 35% and less than or equal to 65% of the conductive pattern area to be evaluated. The cl ass 5 grade means that the peeling area of the conductive pattern is greater than 65% of the conductive pattern area to be evaluated.
(2) 실시예 및 비교예의 수지 구조체의 열전도도는 ASTM E1461 표준 방법에 의해 평가되었으며 시험 장비는 LFA447 l aser f lash(Netzsch)를 이용하였다. 시편을 시험 장비 내부에 위치시키고 시편 아래쪽에서 Laser pul se를 이용하여 열을 발생시켰다. 이후, 시편 반대편의 온도를 IR 센서를 이용하여 측정하는 방식으로 열 확산도를 측정한 후 이로부터 열전도도를 계산하였다. (3) 실시예 및 비교예의 수지 구조체의 열변형 온도는 6M-2 (Toyoseiki ) 시험 장비를 이용하여 평가되었다. 시편의 크기에 따라 결정되는 하중을 시편에 가한 다음 (본 시험예에서는 4.6 kgf/cm2의 하중을 가함) 시편을 오일에 침적하여 3 내지 5분 동안 예열을 하고 오일을 120°C /시간의 속도로 가열하였다. 오일 은도가 상승됨에 따라 시편이 처지게 되는데 0.254 mm 처질 때의 온도를 측정하여 열변형 온도로 규정하였다. (2) The thermal conductivity of the resin structures of Examples and Comparative Examples was evaluated by the ASTM E1461 standard method and the test equipment used LFA447 l aser f lash (Netzsch). The specimen was placed inside the test equipment and heat was generated by using a laser pulse under the specimen. Thereafter, the thermal diffusivity was measured by measuring the temperature on the opposite side of the specimen using an IR sensor, and then thermal conductivity was calculated therefrom. (3) The heat deformation temperature of the resin structures of Examples and Comparative Examples was evaluated using a 6M-2 (Toyoseiki) test equipment. A load determined according to the size of the specimen was applied to the specimen (in this example, a load of 4.6 kgf / cm 2 ), the specimen was immersed in oil, preheated for 3 to 5 minutes and the oil was heated to 120 ° C / hour. Heated at rate. As the oil silver is raised, the specimen sags. The temperature at 0.254 mm sag was measured and defined as the heat deflection temperature.
【표 11Table 11
상기 표 1을 참조하면, 실시예 1 내지 3과 비교예 1에 따라 형성된 도전성 패턴 (흑은 도금층)의 박리 면적은 테스트 대상 도전성 패턴 면적의 약 0%( IS0 c l ass 0)로, 레이저 조사 영역에 높은 접착성을 나타내는 도전성 패턴 양호하게 형성되었음이 확인된다. 반면, 비교예 2에 따라 형성된 도전성 패턴의 박리 면적은 테스트 대상 도전성 패턴의 65% 초과 ( ISO c l ass 5)이며, 비교예 3에 따라 형성된 도전성 패턴의 박리 면적은 테스트 대상 도전성 패턴의 15% 초과 35% 이하 ( ISO c l ass 3)로, 수지 구조체에 대해 도전성 패턴의 접착력이 실시예 1 내지 3에 비해 현저하게 낮은 것으로 확인된다. Referring to Table 1 above, the peeling area of the conductive patterns (black plating layer) formed according to Examples 1 to 3 and Comparative Example 1 is about the area of the conductive pattern to be tested. At 0% (IS0 cl ass 0), it was confirmed that the conductive pattern showing high adhesion to the laser irradiation area was formed satisfactorily. On the other hand, the peeling area of the conductive pattern formed according to Comparative Example 2 is greater than 65% (ISO cl ass 5) of the conductive pattern to be tested, and the peeling area of the conductive pattern formed according to Comparative Example 3 is more than 15% of the conductive pattern to be tested At 35% or less (ISO cl ass 3), it is confirmed that the adhesion of the conductive pattern to the resin structure is remarkably low compared with Examples 1 to 3.
한편, 비도전성 금속 화합물로서 Cu3P208을 첨가하되 방열 소재를 첨가하지 않은 비교예 1의 수지 구조체는 전자기파 조사에 의해 양호하게 도전성 패턴을 형성하였으나, 수지의 열전도도와 열변형 온도가 매우 낮은 결과를 보였다. 이에 반해, 비도전성 금속 화합물로서 Cu3P208 또는 Cu4P209과 방열 소재로서 graphi te 또는 BN을 사용한 실시예 1 내지 3의 수지 구조체는 전자기파 조사에 의해 양호하게 도전성 패턴을 형성하면서도, 방열 소재만 사용한 비교예 2의 수지 구조체 보다 우수한 열전도도 및 증가된 열변형 온도를 나타내었다. 또한, 본 발명의 비도전성 금속 화합물에 속하지 않는 비도전성 금속 화합물과 방열 소재를 첨가한 비교예 3의 수지 구조체는 방열 소재만 사용한 비교예 2의 수지 구조체에 비해 더 낮은 열전도도를 나타내었다. 이로써, 본 발명에서 제시한 비도전성 금속 화합물은 방열 소재와 조합되어 도전성 패턴의 높은 접착성을 유지하면서 방열 소재 자체의 방열 효과 보다 더욱 향상된 방열 효과를 나타냄이 확인된다. Meanwhile, the resin structure of Comparative Example 1, in which Cu 3 P 2 O 8 was added as a non-conductive metal compound but no heat-dissipating material was formed, had a good conductive pattern by electromagnetic wave irradiation, but the thermal conductivity and thermal deformation temperature of the resin were very high. The results were low. In contrast, the resin structures of Examples 1 to 3 using Cu 3 P 2 0 8 or Cu 4 P 2 0 9 as the non-conductive metal compound and graphi te or BN as the heat dissipating material form satisfactorily a conductive pattern by electromagnetic wave irradiation. On the other hand, it showed better thermal conductivity and increased heat deflection temperature than the resin structure of Comparative Example 2 using only a heat dissipating material. In addition, the resin structure of Comparative Example 3 to which the non-conductive metal compound and the heat dissipating material which do not belong to the non-conductive metal compound of the present invention exhibited lower thermal conductivity than the resin structure of Comparative Example 2 using only the heat dissipating material. Thus, it is confirmed that the non-conductive metal compound proposed in the present invention exhibits a more improved heat dissipation effect than the heat dissipation effect of the heat dissipation material itself while maintaining high adhesion of the conductive pattern in combination with the heat dissipation material.
【부호의 설명】 [Explanation of code]
1: PCB 기판 1 : PCB Board
2 : 도전성 패턴 (회로 패턴) 2: conductive pattern (circuit pattern)
3: 히트 싱크 3 : heat sink
4: 블탱킷 4: Blanket
5: 전자 부품 기판 5: Electronic component board
Claims
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| CN201580049872.XA CN106688048B (en) | 2014-09-17 | 2015-09-17 | Composition for forming conductive pattern and resin structure with conductive pattern |
| EP15841594.3A EP3168844B1 (en) | 2014-09-17 | 2015-09-17 | Composition for forming conductive patterns and resin structure having conductive pattern |
| JP2017513224A JP6515181B2 (en) | 2014-09-17 | 2015-09-17 | Composition for forming conductive pattern and resin structure having conductive pattern |
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| KR100716486B1 (en) * | 2001-07-05 | 2007-05-10 | 엘피케이에프 레이저 앤드 일렉트로닉스 악티엔게젤샤프트 | Conductor track structure and method of manufacturing the structure |
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| US20130136869A1 (en) * | 2010-01-26 | 2013-05-30 | Macdermid Acumen, Inc. | Method for Improving Plating on Non-Conductive Substrates |
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| KR101399979B1 (en) * | 2013-01-04 | 2014-06-30 | 하이쎌(주) | Heat-dissipating flexible module for led using printed electronics technology and method for manufacturing the same |
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| Publication number | Priority date | Publication date | Assignee | Title |
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| KR100716486B1 (en) * | 2001-07-05 | 2007-05-10 | 엘피케이에프 레이저 앤드 일렉트로닉스 악티엔게젤샤프트 | Conductor track structure and method of manufacturing the structure |
| KR20110112860A (en) * | 2009-12-17 | 2011-10-13 | 비와이디 컴퍼니 리미티드 | Surface metallization method, plastic product manufacturing method and plastic product produced therefrom |
| US20130136869A1 (en) * | 2010-01-26 | 2013-05-30 | Macdermid Acumen, Inc. | Method for Improving Plating on Non-Conductive Substrates |
| KR101399979B1 (en) * | 2013-01-04 | 2014-06-30 | 하이쎌(주) | Heat-dissipating flexible module for led using printed electronics technology and method for manufacturing the same |
| KR101391187B1 (en) * | 2013-01-24 | 2014-05-07 | 하이쎌(주) | Flexible module with enhanced radiating ability and method for manufacturing the same |
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