WO2014035899A8 - A method of controlling the switched mode ion energy distribution system - Google Patents
A method of controlling the switched mode ion energy distribution system Download PDFInfo
- Publication number
- WO2014035899A8 WO2014035899A8 PCT/US2013/056659 US2013056659W WO2014035899A8 WO 2014035899 A8 WO2014035899 A8 WO 2014035899A8 US 2013056659 W US2013056659 W US 2013056659W WO 2014035899 A8 WO2014035899 A8 WO 2014035899A8
- Authority
- WO
- WIPO (PCT)
- Prior art keywords
- substrate
- periodic voltage
- voltage function
- controlling
- distribution system
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Ceased
Links
Classifications
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32009—Arrangements for generation of plasma specially adapted for examination or treatment of objects, e.g. plasma sources
- H01J37/32082—Radio frequency generated discharge
- H01J37/32137—Radio frequency generated discharge controlling of the discharge by modulation of energy
- H01J37/32146—Amplitude modulation, includes pulsing
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C14/00—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material
- C23C14/22—Coating by vacuum evaporation, by sputtering or by ion implantation of the coating forming material characterised by the process of coating
- C23C14/54—Controlling or regulating the coating process
-
- C—CHEMISTRY; METALLURGY
- C23—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; CHEMICAL SURFACE TREATMENT; DIFFUSION TREATMENT OF METALLIC MATERIAL; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL; INHIBITING CORROSION OF METALLIC MATERIAL OR INCRUSTATION IN GENERAL
- C23C—COATING METALLIC MATERIAL; COATING MATERIAL WITH METALLIC MATERIAL; SURFACE TREATMENT OF METALLIC MATERIAL BY DIFFUSION INTO THE SURFACE, BY CHEMICAL CONVERSION OR SUBSTITUTION; COATING BY VACUUM EVAPORATION, BY SPUTTERING, BY ION IMPLANTATION OR BY CHEMICAL VAPOUR DEPOSITION, IN GENERAL
- C23C16/00—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes
- C23C16/44—Chemical coating by decomposition of gaseous compounds, without leaving reaction products of surface material in the coating, i.e. chemical vapour deposition [CVD] processes characterised by the method of coating
- C23C16/52—Controlling or regulating the coating process
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32009—Arrangements for generation of plasma specially adapted for examination or treatment of objects, e.g. plasma sources
- H01J37/32082—Radio frequency generated discharge
- H01J37/32091—Radio frequency generated discharge the radio frequency energy being capacitively coupled to the plasma
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32009—Arrangements for generation of plasma specially adapted for examination or treatment of objects, e.g. plasma sources
- H01J37/32422—Arrangement for selecting ions or species in the plasma
-
- H—ELECTRICITY
- H01—ELECTRIC ELEMENTS
- H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
- H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
- H01J37/32—Gas-filled discharge tubes
- H01J37/32431—Constructional details of the reactor
- H01J37/32697—Electrostatic control
- H01J37/32706—Polarising the substrate
Landscapes
- Chemical & Material Sciences (AREA)
- Engineering & Computer Science (AREA)
- Physics & Mathematics (AREA)
- Plasma & Fusion (AREA)
- Analytical Chemistry (AREA)
- Chemical Kinetics & Catalysis (AREA)
- Materials Engineering (AREA)
- Mechanical Engineering (AREA)
- Metallurgy (AREA)
- Organic Chemistry (AREA)
- General Chemical & Material Sciences (AREA)
- Plasma Technology (AREA)
- Chemical Vapour Deposition (AREA)
- Drying Of Semiconductors (AREA)
- Spectroscopy & Molecular Physics (AREA)
Abstract
Priority Applications (3)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| KR1020157007771A KR101952563B1 (en) | 2012-08-28 | 2013-08-26 | A method of controlling the switched mode ion energy distribution system |
| CN201380056070.2A CN104782233B (en) | 2012-08-28 | 2013-08-26 | The method of control switch mode ion energy distribution system |
| JP2015529906A JP6329543B2 (en) | 2012-08-28 | 2013-08-26 | Method for controlling a switched-mode ion energy distribution system |
Applications Claiming Priority (2)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| US13/597,050 US9362089B2 (en) | 2010-08-29 | 2012-08-28 | Method of controlling the switched mode ion energy distribution system |
| US13/597,050 | 2012-08-28 |
Publications (2)
| Publication Number | Publication Date |
|---|---|
| WO2014035899A1 WO2014035899A1 (en) | 2014-03-06 |
| WO2014035899A8 true WO2014035899A8 (en) | 2014-06-19 |
Family
ID=50184210
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| PCT/US2013/056659 Ceased WO2014035899A1 (en) | 2012-08-28 | 2013-08-26 | A method of controlling the switched mode ion energy distribution system |
Country Status (4)
| Country | Link |
|---|---|
| JP (1) | JP6329543B2 (en) |
| KR (1) | KR101952563B1 (en) |
| CN (1) | CN104782233B (en) |
| WO (1) | WO2014035899A1 (en) |
Families Citing this family (11)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| US12505980B2 (en) | 2009-05-01 | 2025-12-23 | Advanced Energy Industries, Inc. | Apparatus to produce a waveform |
| US10312048B2 (en) * | 2016-12-12 | 2019-06-04 | Applied Materials, Inc. | Creating ion energy distribution functions (IEDF) |
| KR20180077392A (en) * | 2016-12-28 | 2018-07-09 | 삼성전자주식회사 | apparatus for processing plasma and method for manufacturing semiconductor device using the same |
| US10396601B2 (en) | 2017-05-25 | 2019-08-27 | Mks Instruments, Inc. | Piecewise RF power systems and methods for supplying pre-distorted RF bias voltage signals to an electrode in a processing chamber |
| US12505986B2 (en) | 2017-11-17 | 2025-12-23 | Advanced Energy Industries, Inc. | Synchronization of plasma processing components |
| KR102877884B1 (en) * | 2017-11-17 | 2025-11-04 | 에이이에스 글로벌 홀딩스 피티이 리미티드 | Improved Application of Modulation Supplies in Plasma Processing Systems |
| JP7289313B2 (en) * | 2017-11-17 | 2023-06-09 | エーイーエス グローバル ホールディングス, プライベート リミテッド | Spatial and temporal control of ion bias voltage for plasma processing |
| NL2022999B1 (en) * | 2019-04-24 | 2020-11-02 | Prodrive Tech Bv | Voltage waveform generator for plasma processing apparatuses |
| JP7234036B2 (en) | 2019-05-28 | 2023-03-07 | 東京エレクトロン株式会社 | Plasma processing method and plasma processing apparatus |
| NL2023935B1 (en) | 2019-10-02 | 2021-05-31 | Prodrive Tech Bv | Determining an optimal ion energy for plasma processing of a dielectric substrate |
| US11967483B2 (en) | 2021-06-02 | 2024-04-23 | Applied Materials, Inc. | Plasma excitation with ion energy control |
Family Cites Families (12)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS60126832A (en) * | 1983-12-14 | 1985-07-06 | Hitachi Ltd | Dry etching method and device thereof |
| JPS62125626A (en) * | 1985-11-27 | 1987-06-06 | Hitachi Ltd | dry etching equipment |
| US6201208B1 (en) * | 1999-11-04 | 2001-03-13 | Wisconsin Alumni Research Foundation | Method and apparatus for plasma processing with control of ion energy distribution at the substrates |
| JP4319514B2 (en) * | 2002-11-29 | 2009-08-26 | 株式会社日立ハイテクノロジーズ | Plasma processing apparatus having high frequency power supply with sag compensation function |
| US7615132B2 (en) * | 2003-10-17 | 2009-11-10 | Hitachi High-Technologies Corporation | Plasma processing apparatus having high frequency power source with sag compensation function and plasma processing method |
| US7838430B2 (en) * | 2003-10-28 | 2010-11-23 | Applied Materials, Inc. | Plasma control using dual cathode frequency mixing |
| US8475673B2 (en) * | 2009-04-24 | 2013-07-02 | Lam Research Company | Method and apparatus for high aspect ratio dielectric etch |
| US9287086B2 (en) * | 2010-04-26 | 2016-03-15 | Advanced Energy Industries, Inc. | System, method and apparatus for controlling ion energy distribution |
| US9287092B2 (en) * | 2009-05-01 | 2016-03-15 | Advanced Energy Industries, Inc. | Method and apparatus for controlling ion energy distribution |
| US9435029B2 (en) * | 2010-08-29 | 2016-09-06 | Advanced Energy Industries, Inc. | Wafer chucking system for advanced plasma ion energy processing systems |
| CN201465987U (en) * | 2009-07-03 | 2010-05-12 | 中微半导体设备(上海)有限公司 | Plasma treatment device |
| CN101835334B (en) * | 2010-01-19 | 2013-01-30 | 大连理工大学 | A Control Method for Resonant Coupling of Cross-Field Discharge |
-
2013
- 2013-08-26 CN CN201380056070.2A patent/CN104782233B/en active Active
- 2013-08-26 KR KR1020157007771A patent/KR101952563B1/en active Active
- 2013-08-26 JP JP2015529906A patent/JP6329543B2/en active Active
- 2013-08-26 WO PCT/US2013/056659 patent/WO2014035899A1/en not_active Ceased
Also Published As
| Publication number | Publication date |
|---|---|
| KR20150047599A (en) | 2015-05-04 |
| KR101952563B1 (en) | 2019-02-27 |
| CN104782233B (en) | 2018-12-25 |
| WO2014035899A1 (en) | 2014-03-06 |
| CN104782233A (en) | 2015-07-15 |
| JP6329543B2 (en) | 2018-05-23 |
| JP2015534718A (en) | 2015-12-03 |
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