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WO2014078402A1 - Procédé de formation d'une connexion électrique à un support d'échantillon dans un porte-échantillon de microscope électronique - Google Patents

Procédé de formation d'une connexion électrique à un support d'échantillon dans un porte-échantillon de microscope électronique Download PDF

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Publication number
WO2014078402A1
WO2014078402A1 PCT/US2013/069876 US2013069876W WO2014078402A1 WO 2014078402 A1 WO2014078402 A1 WO 2014078402A1 US 2013069876 W US2013069876 W US 2013069876W WO 2014078402 A1 WO2014078402 A1 WO 2014078402A1
Authority
WO
WIPO (PCT)
Prior art keywords
sample support
sample
electrical connector
electrical
holder
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
PCT/US2013/069876
Other languages
English (en)
Inventor
Jr. John Damiano
David P. Nackashi
Daniel Stephen GARDINER
Franklin Stampley WALDEN II
William Bradford Carpenter
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Protochips Inc
Original Assignee
Protochips Inc
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Protochips Inc filed Critical Protochips Inc
Priority to EP13855383.9A priority Critical patent/EP2920807A4/fr
Priority to JP2015542746A priority patent/JP2016501428A/ja
Publication of WO2014078402A1 publication Critical patent/WO2014078402A1/fr
Anticipated expiration legal-status Critical
Ceased legal-status Critical Current

Links

Classifications

    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R13/00—Details of coupling devices of the kinds covered by groups H01R12/70 or H01R24/00 - H01R33/00
    • H01R13/02—Contact members
    • H01R13/22—Contacts for co-operating by abutting
    • H01R13/24—Contacts for co-operating by abutting resilient; resiliently-mounted
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/02—Details
    • H01J37/20—Means for supporting or positioning the object or the material; Means for adjusting diaphragms or lenses associated with the support
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J37/00—Discharge tubes with provision for introducing objects or material to be exposed to the discharge, e.g. for the purpose of examination or processing thereof
    • H01J37/26—Electron or ion microscopes; Electron or ion diffraction tubes
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R12/00—Structural associations of a plurality of mutually-insulated electrical connecting elements, specially adapted for printed circuits, e.g. printed circuit boards [PCB], flat or ribbon cables, or like generally planar structures, e.g. terminal strips, terminal blocks; Coupling devices specially adapted for printed circuits, flat or ribbon cables, or like generally planar structures; Terminals specially adapted for contact with, or insertion into, printed circuits, flat or ribbon cables, or like generally planar structures
    • H01R12/70—Coupling devices
    • H01R12/77—Coupling devices for flexible printed circuits, flat or ribbon cables or like structures
    • H01R12/79—Coupling devices for flexible printed circuits, flat or ribbon cables or like structures connecting to rigid printed circuits or like structures
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
    • H01J2237/20—Positioning, supporting, modifying or maintaining the physical state of objects being observed or treated
    • H01J2237/2002—Controlling environment of sample
    • H01J2237/2003—Environmental cells
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
    • H01J2237/20—Positioning, supporting, modifying or maintaining the physical state of objects being observed or treated
    • H01J2237/2007—Holding mechanisms
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
    • H01J2237/20—Positioning, supporting, modifying or maintaining the physical state of objects being observed or treated
    • H01J2237/2008—Positioning, supporting, modifying or maintaining the physical state of objects being observed or treated specially adapted for studying electrical or magnetical properties of objects
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01J—ELECTRIC DISCHARGE TUBES OR DISCHARGE LAMPS
    • H01J2237/00—Discharge tubes exposing object to beam, e.g. for analysis treatment, etching, imaging
    • H01J2237/20—Positioning, supporting, modifying or maintaining the physical state of objects being observed or treated
    • H01J2237/206—Modifying objects while observing
    • H—ELECTRICITY
    • H01—ELECTRIC ELEMENTS
    • H01R—ELECTRICALLY-CONDUCTIVE CONNECTIONS; STRUCTURAL ASSOCIATIONS OF A PLURALITY OF MUTUALLY-INSULATED ELECTRICAL CONNECTING ELEMENTS; COUPLING DEVICES; CURRENT COLLECTORS
    • H01R12/00—Structural associations of a plurality of mutually-insulated electrical connecting elements, specially adapted for printed circuits, e.g. printed circuit boards [PCB], flat or ribbon cables, or like generally planar structures, e.g. terminal strips, terminal blocks; Coupling devices specially adapted for printed circuits, flat or ribbon cables, or like generally planar structures; Terminals specially adapted for contact with, or insertion into, printed circuits, flat or ribbon cables, or like generally planar structures
    • H01R12/70—Coupling devices
    • H01R12/71—Coupling devices for rigid printing circuits or like structures
    • H01R12/72—Coupling devices for rigid printing circuits or like structures coupling with the edge of the rigid printed circuits or like structures
    • H01R12/721—Coupling devices for rigid printing circuits or like structures coupling with the edge of the rigid printed circuits or like structures cooperating directly with the edge of the rigid printed circuits

Definitions

  • the present invention relates generally to an electrical connector for use in an electron microscope holder, wherein the electrical connector efficiently and consistently ensures an electrical connection between a sample support and the dedicated electrical source.
  • Said electrical connector is generally constructed using semiconductor materials and semiconductor manufacturing processes.
  • the sample holder is a component of an electron microscope providing the physical support for specimens under observation.
  • the sample holder provides an interface between the inside of the instrument (i.e., a vacuum environment) and the outside world.
  • sample holder To use the sample holder, one or more samples are first placed on a support device. The support device is then mechanically fixed in place at the sample tip, and the sample holder is inserted into the electron microscope through a load-lock. During insertion, the sample holder is pushed into the electron microscope until it stops, which results in the tip of the sample holder being located in the column of the microscope. At this point, the barrel of the sample holder bridges the space between the inside of the microscope and the outside of the load lock, and the end of the sample holder is outside the microscope. To maintain an ultra-high vacuum environment inside the electron microscope, flexible o-rings are typically found along the barrel of the sample holder, and these o-rings seal against the microscope when the sample holder is inserted. The exact shape and size of the sample holder varies with the type and manufacturer of the electron microscope, but each holder contains these three key regions.
  • the sample holder can also be used to provide stimulus to the specimen, and this stimulus can include temperature, electrical current, electrical voltage, mechanical strain, etc.
  • One type of sample support is a semiconductor device.
  • the semiconductor device can be designed to have an array of electrical contact pads on it, and the sample holder can be designed to transfer electrical signals from an external source, through the holder, to the semiconductor device.
  • Existing devices use delicate wires or clips to create the contact between the holder and the device.
  • Electron Beam Induced Current requires an electrical contact between a sample and the sample holder itself. Typically, this is done using a simple screw and metallic clip, which is gently pressed down onto the sample by tightening the screw (see, X. Zhang and D. Joy, "A simple specimen holder for EBIC imaging on the Hitachi S800," J. Microscopy Res. and Techn., Vol. 26(2), pp. 182-183, 1993). A wire is either soldered to the clip or looped around the screw head to provide an electrical path from the sample, through the clip, and to the sample holder which routes the wire outside of the instrument.
  • a frame (generally U-shaped) aligns the device and baseplate with electrical spring contact fingers and provides a rigid surface against which the device is pressed, providing stability and forming electrical contacts between the device and the specimen holder.
  • the baseplate is the component of the specimen tip that provides a stable surface upon which the device can be mounted, and contains electrical spring contact fingers in complementary positions to the device, which when aligned using the frame, make contacts simultaneously between the baseplate and the device.
  • spring contact fingers such as these are delicate and more difficult to manufacture. Removing the device from the baseplate completely exposes the spring clips and presents an opportunity to accidentally bend or break these fingers, compromising the electrical connections.
  • a novel electrical connector is needed, wherein said electrical connector provides a simple method for repeatedly mounting and exchanging devices, e.g., semiconductor devices having an array of electrical contact pads, without disassembly or soldering.
  • the electrical connector can be designed to transfer electrical signals from the semiconductor device through the holder to an external source.
  • the present invention relates generally to an electrical connector for sample support devices, wherein the electrical connector can be easily integrated into a sample holder and is designed to create a reliable contact between the sample holder and the sample support device.
  • an apparatus for an electron microscope comprising a sample holder and a barrel, wherein said sample holder comprises a holder body that comprises at least one recess for accommodating at least one sample support device, wherein the at least one sample support device has at least one sample support contact pad, wherein the apparatus further comprises: a holder lid, and an electrical connector having a first end and a second end, wherein the first end has at least one electrical contact pad and the second end is insertable into and runs down at least a portion of the length of the barrel, wherein the at least one electrical contact pad of the first end of the electrical connector and the at least one sample support contact pad of the sample support device are in contact in the holder body.
  • Figure 1A illustrates a sample holder (100) including the electrical connector (110).
  • Figure IB illustrates the sample holder (100) with the holder lid (101) positioned in the holder body (105).
  • Figure 2A is a plan view of the electrical connector.
  • Figure 2B illustrates the contact of the electrical pads of the electrical connector (110) with the pads of a sample support device (103).
  • FIGS 2C-2F illustrate different electrical connector contact variations.
  • Figures 3A-3E illustrate the loading of the sample holder having a first embodiment of the electrical connector.
  • Figures 4A-4D illustrate the loading of the sample holder having a second embodiment of the electrical connector.
  • Figure 5A is a cross-sectional view of the loaded sample holder having the first embodiment of the electrical connector.
  • Figure 5B is a cross-sectional view of the loaded sample holder having the second embodiment of the electrical connector.
  • Figures 6A-6D illustrate the loading of the sample holder having a third embodiment of the electrical connector.
  • Figure 7 is a cross-sectional view of the loaded sample holder having the third embodiment of the electrical connector.
  • the present invention relates generally to an electrical connector for sample support devices, wherein the electrical connector can be easily integrated into a sample holder and is designed to create a reliable contact between the sample holder and the sample support device.
  • the electrical connector described herein is compatible with and may be interfaced with the semiconductor sample support devices disclosed in U.S. Patent Application No. 12/599,339 filed on December 8, 2010 in the name of John Damiano, Jr., et al. and entitled "MICROSCOPY SUPPORT STRUCTURES,” which is hereby incorporated by reference in its entirety.
  • alternative sample support devices may be interfaced with the electrical connectors described herein.
  • the electrical connector can be manufactured in various shapes and sizes such that the electrical connector fits any manufacturer's sample holder.
  • semiconductor means a material, such as silicon, that is intermediate in electrical conductivity between conductors and insulators.
  • sample support device means a structure used to support a sample and control the environment of the sample.
  • the sample support device can contain gases or liquids, can contain electrochemical experiments, and/or control temperatures around a sample and includes, but is not limited to, an electrical device and a temperature control device.
  • a sample support device can provide electrical contacts and/or an experimental region. Devices may include one, more than one or even an array of experimental regions and may include integrated features such as electrodes, thermocouples, and/or calibration sites, as readily determined by one skilled in the art.
  • One preferred embodiment includes sample support devices made with MEMS technology and with thin membranes (continuous or perforated) for supporting a sample in the experimental region.
  • the sample support devices can provide electrical contacts or electrodes for connection to electrical leads.
  • the sample support devices can also contain features to route electrical signals to the experimental region(s).
  • sample means the object being studied in the electron microscope, typically placed within or on the sample support device in the region which is at least partially electron transparent.
  • sample holder means a precision-machined piece of equipment used to hold and secure one or more sample support devices either individually, as a collection, or arranged as an E- cell, and to provide an interface between the sample support device(s) and the outside world.
  • window device means a device used to create a physical, electron transparent barrier on one boundary and the vacuum environment of the electron microscope and is generally a silicon nitride-based semiconductor micro-machined part, although other semiconductor materials are contemplated.
  • temperature control device means a device used to control the temperature around the specimen either individually or within an E-cell and is generally a semiconductor micro- machined part, e.g., a silicon carbide-based material.
  • the temperature control device comprises a membrane comprising at least one membrane region and at least one conductive element in contact with the membrane forming a heatable region of the membrane.
  • a “membrane” on the sample support device corresponds to unsupported material compring, consisting of, or consisting essentially of carbon, silicon nitride, SiC or other thin films generally 1 micron or less having a low tensile stress ( ⁇ 500 MPa), and providing a region at least partially electron transparent region for supporting the at least one sample.
  • the membrane may include holes or be hole-free.
  • the membrane may be comprised of a single material or a layer of more than one material and may be either uniformly flat or contain regions with varying thicknesses.
  • elastomeric corresponds to any material that is able to resume its original shape when a deforming force is removed.
  • Elastomers are polymeric and have a low Young's modulus and a high yield point. At room temperature, elastomers tend to be soft and flexible.
  • the present application improves on the prior art in several ways including, but not limited to: (1) eliminating the required use of a delicate spring contact fingers, and (2) providing a simple method for mounting and exchanging devices and making electrical contacts to devices without the need for partially disassembling the sample tip (e.g., removing screws or other small parts).
  • the electrical connector described herein includes electrical contact pads that match those on the sample support device.
  • the electrical connector can be constructed using semiconductor materials using semiconductor manufacturing processes (e.g., lithography) and the electrical connector can be readily interchanged with another electrical connector (e.g., one having a different electrical pad pattern or a replacement electrical connector).
  • the electrical connector (110) is generally illustrated in Figure 2A, wherein the electrical connector comprises at least one electrical contact pad (120) located at the sample support end (150) of the electrical connector.
  • the electrical connector (110) further comprises at least one barrel contact point (130) located in the barrel end (140) of the electrical connector, wherein the barrel end (140) is positioned distally from the sample support end (150).
  • the at least one electrical contact pad (120) can be manufactured various ways.
  • the at least one electrical contact pad can have a raised contact surface (Figure 2C), a biforcated contact (Figure 2D), a coined surface contact (Figure 2E), or a deflective contact (Figure 2F).
  • Figure 2C a raised contact surface
  • Figure 2D a biforcated contact
  • Figure 2E a coined surface contact
  • Figure 2F deflective contact
  • the positioning of the at least one electrical contact pad (120) on the electrical connector (110) can vary depending on the number of contact pads, the size of the electrical connector, and the position of the matching sample support pads (160) on a sample support device (103).
  • the electrical connector (110) is readily manufactured such that the at least one electrical contact pad (120) will come into contact with the sample support pads (160) on the sample support device (103). It should be appreciated that the teachings herein are not intended to exclude the possibility that additional components may be present between, and/or operatively associated or engaged with, the electrical connector and the sample support device.
  • the electrical connector is preferably a thin board comprising a material selected from the group consisting of fiberglass, composite epoxy, polyimide, PTFE, and other laminate materials on which interconnected circuits can be laminated or etched.
  • Conductive pathways connect the at least one electrical contact pad (120) with the at least one barrel contact point (130).
  • the conductive pathways comprise copper.
  • the at least one electrical contact pad (120) and the at least one barrel contact point (130) include a coating such as solder, nickel/gold, or some other anti-corrosive coating.
  • the "male" end of the electrical connector (110) is inserted into the "female" barrel (200) of the holder body (105).
  • One end of the electrical connector (110) has at least one barrel contact point (130) located in the barrel end (140) for connection to wires in the barrel.
  • the other end of the electrical connector (110) has at least one electrical contact pad (120) exposed to form electrical contacts with the sample support device (103) when the sample support device is loaded into the holder body (105).
  • the holder lid (101) When the holder lid (101) is placed atop the holder body (105) and affixed thereto (for example, with screws or some other affixation means), the holder lid (101) pushes the sample support device (103) on to the electrical connector (1 10), forming an electrical connection between the sample support pads (160) of the sample support device (103) and the contact pads (120) of the electrical connector (110) (see, e.g., Figure IB, whereby the holder lid is outlined but transparent).
  • "proud” corresponds to the sample holder prior to insertion of the sample support device (1 10), whereby the electrical connector (1 10) is slightly elevated relative to the bottom surface of the holder body (105) where the sample support device (103) rests.
  • the sample holder (105) includes an elastomeric pad (170).
  • the electrical connector (1 10) is inserted into the holder body (105) as described hereinabove.
  • a window device (107) can be optionally positioned in the holder body (105). Thereafter the sample support device (103) is positioned in the sample body (105), such that the optional window device (107) is covered and the at least one electrical contact pad (120) of the electrical connector (1 10) comes into contact with the sample support pads (160) on the sample support device (103) (e.g., as shown in Figure 2B).
  • the sample support device can be larger, smaller, or the same dimensions as the window device, when present.
  • An o-ring (180) is preferably present in the sample holder (105). Thereafter, the holder lid (101) is affixed to the holder body (105). It should be appreciated that the elastomeric pad (170) has a thickness such that it applies force to the electrical connector (1 10) when the holder lid (101) is placed on the holder body (105) and affixed. The force applied to the electrical connector (1 10) ensures contact between the at least one electrical contact pad (120) of the electrical connector (1 10) with the sample support pads (160) on the sample support device (103).
  • an elastomeric pad (170) consists of a small rectangular piece of vacuum-compatible elastomeric material, such as EPDM (ethylene propylene diene monomer), a thermoset elastomer. It should be appreciated that the elastomeric material is not limited to thermoset elastomers, as readily determined by the skilled artisan.
  • a cross-section of Figure 3E is shown in Figure 5A. It should be appreciated by the person skilled in the art that the sample to be viewed is positioned between the window device (107) and the sample support device (103) or if no window device is used, on the sample support device (103).
  • the window device is used and a gas cell (i.e., one temperature control device plus one window device) or an electrochemical cell (i.e., one electrical device plus one window device) is produced.
  • a gas cell i.e., one temperature control device plus one window device
  • an electrochemical cell i.e., one electrical device plus one window device
  • the contact pads on the sample support device provide voltage or current to the sample (e.g., current is forced through the heating chip to provide heat or current or voltage bias is applied to the sample using the electrical chip).
  • a cantilever beam or spring is positioned under the electrical connector (110) or the electrical connector is used as a flat spring with one fixed end.
  • the electrical connector (110) is inserted into the holder body (105) as described hereinabove.
  • a window device (107) can be optionally positioned in the holder body (105). Thereafter the sample support device (103) is positioned in the sample body (105), such that the optional window device (107) is covered and the at least one electrical contact pad (120) of the electrical connector (110) comes into contact with the sample support pads (160) on the sample support device (103) (e.g., as shown in Figure 2B).
  • sample support device can be larger, smaller, or the same dimensions as the window device, when present.
  • An o-ring (180) is preferably present in the sample holder (105). Thereafter, the holder lid (101) is affixed to the holder body (105). It should be appreciated that the sample support end (150) of the electrical connector (110) in the second embodiment is elevated relative to the bottom surface of the holder body (105) where the sample support device (103) rests and has a spring constant. The force applied to the electrical connector (110) when the holder lid (101) is affixed ensures contact between the at least one electrical contact pad (120) of the electrical connector (110) with the sample support pads (160) on the sample support device (103).
  • FIG. 5B A cross-section of Figure 4D is shown in Figure 5B.
  • the sample to be viewed is positioned between the window device (107) and the sample support device (103) or if no window device is used, on the sample support device (103).
  • the window device is used and a gas cell (i.e., one temperature control device plus one window device) or an electrochemical cell (i.e., one electrical device plus one window device) is produced.
  • the contact pads on the sample support device provide voltage or current to the sample (e.g., current is forced through the heating chip to provide heat or current or voltage bias is applied to the sample using the electrical chip).
  • the contact pads (120) of the electrical connector (110) are deflective in nature (for example, as shown in Figure 2F).
  • the electrical connector (110) is inserted into the holder body (105) as described hereinabove.
  • a window device (107) can be optionally positioned in the holder body (105).
  • the sample support device (103) is positioned in the sample body (105), such that the optional window device (107) is covered and the at least one electrical contact pad (120) of the electrical connector (110) comes into contact with the sample support pads (160) on the sample support device (103) (e.g., as shown in Figure 2B).
  • the sample support device can be larger, smaller, or the same dimensions as the window device, when present.
  • An o-ring (180) is preferably present in the sample holder (105). Thereafter, the holder lid (101) is affixed to the holder body (105). It should be appreciated that the contact pads (120) of the electrical connector (110) in the third embodiment are elevated relative to the bottom surface of the holder body (105) where the sample support device (103) rests and have a spring constant. The force applied to the electrical connector (110) when the holder lid (101) is affixed ensures contact between the at least one electrical contact pad (120) of the electrical connector (110) with the sample support pads (160) on the sample support device (103).
  • a cross-section of Figure 6D is shown in Figure 7.
  • the sample to be viewed is positioned between the window device (107) and the sample support device (103) or if no window device is used, on the sample support device (103).
  • the window device is used and a gas cell (i.e., one temperature control device plus one window device) or an electrochemical cell (i.e., one electrical device plus one window device) is produced.
  • the contact pads on the sample support device provide voltage or current to the sample (e.g., current is forced through the heating chip to provide heat or current or voltage bias is applied to the sample using the electrical chip).
  • the electrical connector is a conductive circuit on a rigid or a flexible substrate with one or more exposed contact pads (120). The precise distances and sizes of said contacts allows for a consistent point of electrical conductivity to the sample support device (103).
  • the electrical connector (110) can be a single layer of conductive circuitry on at least one layer of insulating substrate or it can be multi-layered with at least two insulating layers of substrate and at least two conductive circuits connected by vias through the substrate, the manufacture of which is understood by the person skilled in the art.

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  • Chemical & Material Sciences (AREA)
  • Analytical Chemistry (AREA)
  • Sampling And Sample Adjustment (AREA)
  • Analysing Materials By The Use Of Radiation (AREA)

Abstract

La présente invention concerne un appareil destiné à un microscope électronique, qui comprend un porte-échantillon et un canon, ledit porte-échantillon comprenant un corps de porte-échantillon qui comporte au moins un évidement afin de loger au moins un dispositif support d'échantillon, le au moins un dispositif support d'échantillon ayant au moins un plot de contact support d'échantillon ; l'appareil comprend en outre : un couvercle de porte-échantillon et un connecteur électrique ayant une première extrémité et une seconde extrémité, la première extrémité ayant au moins un plot de contact électrique et la seconde extrémité pouvant s'insérer dans au moins une partie de la longueur du canon et descendre le long de celle-ci, le au moins un plot de contact électrique de la première extrémité du connecteur électrique et le au moins un plot de contact support d'échantillon du dispositif support d'échantillon étant en contact dans le corps de porte-échantillon.
PCT/US2013/069876 2012-11-16 2013-11-13 Procédé de formation d'une connexion électrique à un support d'échantillon dans un porte-échantillon de microscope électronique Ceased WO2014078402A1 (fr)

Priority Applications (2)

Application Number Priority Date Filing Date Title
EP13855383.9A EP2920807A4 (fr) 2012-11-16 2013-11-13 Procédé de formation d'une connexion électrique à un support d'échantillon dans un porte-échantillon de microscope électronique
JP2015542746A JP2016501428A (ja) 2012-11-16 2013-11-13 電子顕微鏡ホルダにおいて試料支持体への電気的接続を形成する方法

Applications Claiming Priority (4)

Application Number Priority Date Filing Date Title
US201261727367P 2012-11-16 2012-11-16
US61/727,367 2012-11-16
US201361779294P 2013-03-13 2013-03-13
US61/779,294 2013-03-13

Publications (1)

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WO2014078402A1 true WO2014078402A1 (fr) 2014-05-22

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US (3) US9437393B2 (fr)
EP (1) EP2920807A4 (fr)
JP (1) JP2016501428A (fr)
WO (1) WO2014078402A1 (fr)

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US10256563B2 (en) 2012-11-16 2019-04-09 Protochips, Inc. Method for forming an electrical connection to a sample support in an electron microscope holder

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USD794816S1 (en) * 2013-10-24 2017-08-15 Hitachi High-Technologies Corporation Sample holder for an electron microscope
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US9837746B2 (en) 2017-12-05
JP2016501428A (ja) 2016-01-18
US20180097307A1 (en) 2018-04-05
US20140138558A1 (en) 2014-05-22
US9437393B2 (en) 2016-09-06
EP2920807A4 (fr) 2016-07-13
US10256563B2 (en) 2019-04-09
US20170054239A1 (en) 2017-02-23
EP2920807A1 (fr) 2015-09-23

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