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WO2013006579A3 - Atténuation d'erreurs dans des mémoires non volatiles - Google Patents

Atténuation d'erreurs dans des mémoires non volatiles Download PDF

Info

Publication number
WO2013006579A3
WO2013006579A3 PCT/US2012/045306 US2012045306W WO2013006579A3 WO 2013006579 A3 WO2013006579 A3 WO 2013006579A3 US 2012045306 W US2012045306 W US 2012045306W WO 2013006579 A3 WO2013006579 A3 WO 2013006579A3
Authority
WO
WIPO (PCT)
Prior art keywords
volatile memory
memory error
error mitigation
level
llr
Prior art date
Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
Ceased
Application number
PCT/US2012/045306
Other languages
English (en)
Other versions
WO2013006579A2 (fr
Inventor
Ravi H. Motwani
Current Assignee (The listed assignees may be inaccurate. Google has not performed a legal analysis and makes no representation or warranty as to the accuracy of the list.)
Intel Corp
Original Assignee
Intel Corp
Priority date (The priority date is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the date listed.)
Filing date
Publication date
Application filed by Intel Corp filed Critical Intel Corp
Priority to KR1020137034873A priority Critical patent/KR101576721B1/ko
Priority to GB1323101.4A priority patent/GB2505841B/en
Publication of WO2013006579A2 publication Critical patent/WO2013006579A2/fr
Publication of WO2013006579A3 publication Critical patent/WO2013006579A3/fr
Anticipated expiration legal-status Critical
Ceased legal-status Critical Current

Links

Classifications

    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C29/00—Checking stores for correct operation ; Subsequent repair; Testing stores during standby or offline operation
    • G11C29/04—Detection or location of defective memory elements, e.g. cell constructio details, timing of test signals
    • G11C29/08—Functional testing, e.g. testing during refresh, power-on self testing [POST] or distributed testing
    • G11C29/12—Built-in arrangements for testing, e.g. built-in self testing [BIST] or interconnection details
    • G11C29/38—Response verification devices
    • G11C29/42—Response verification devices using error correcting codes [ECC] or parity check
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C16/00—Erasable programmable read-only memories
    • G11C16/02—Erasable programmable read-only memories electrically programmable
    • G11C16/06—Auxiliary circuits, e.g. for writing into memory
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/07—Responding to the occurrence of a fault, e.g. fault tolerance
    • G06F11/08—Error detection or correction by redundancy in data representation, e.g. by using checking codes
    • G06F11/10—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's
    • G06F11/1008—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's in individual solid state devices
    • G06F11/1048—Adding special bits or symbols to the coded information, e.g. parity check, casting out 9's or 11's in individual solid state devices using arrangements adapted for a specific error detection or correction feature
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/07—Responding to the occurrence of a fault, e.g. fault tolerance
    • G06F11/0703—Error or fault processing not based on redundancy, i.e. by taking additional measures to deal with the error or fault not making use of redundancy in operation, in hardware, or in data representation
    • G06F11/0706—Error or fault processing not based on redundancy, i.e. by taking additional measures to deal with the error or fault not making use of redundancy in operation, in hardware, or in data representation the processing taking place on a specific hardware platform or in a specific software environment
    • G06F11/073—Error or fault processing not based on redundancy, i.e. by taking additional measures to deal with the error or fault not making use of redundancy in operation, in hardware, or in data representation the processing taking place on a specific hardware platform or in a specific software environment in a memory management context, e.g. virtual memory or cache management
    • G—PHYSICS
    • G06—COMPUTING OR CALCULATING; COUNTING
    • G06F—ELECTRIC DIGITAL DATA PROCESSING
    • G06F11/00—Error detection; Error correction; Monitoring
    • G06F11/07—Responding to the occurrence of a fault, e.g. fault tolerance
    • G06F11/0703—Error or fault processing not based on redundancy, i.e. by taking additional measures to deal with the error or fault not making use of redundancy in operation, in hardware, or in data representation
    • G06F11/0751—Error or fault detection not based on redundancy
    • G06F11/0754—Error or fault detection not based on redundancy by exceeding limits
    • G06F11/076—Error or fault detection not based on redundancy by exceeding limits by exceeding a count or rate limit, e.g. word- or bit count limit
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C16/00—Erasable programmable read-only memories
    • G11C16/02—Erasable programmable read-only memories electrically programmable
    • G11C16/04—Erasable programmable read-only memories electrically programmable using variable threshold transistors, e.g. FAMOS
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C16/00—Erasable programmable read-only memories
    • G11C16/02—Erasable programmable read-only memories electrically programmable
    • G11C16/06—Auxiliary circuits, e.g. for writing into memory
    • G11C16/08—Address circuits; Decoders; Word-line control circuits
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C16/00—Erasable programmable read-only memories
    • G11C16/02—Erasable programmable read-only memories electrically programmable
    • G11C16/06—Auxiliary circuits, e.g. for writing into memory
    • G11C16/34—Determination of programming status, e.g. threshold voltage, overprogramming or underprogramming, retention
    • G—PHYSICS
    • G11—INFORMATION STORAGE
    • G11C—STATIC STORES
    • G11C7/00—Arrangements for writing information into, or reading information out from, a digital store
    • G11C7/10—Input/output [I/O] data interface arrangements, e.g. I/O data control circuits, I/O data buffers
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M13/00—Coding, decoding or code conversion, for error detection or error correction; Coding theory basic assumptions; Coding bounds; Error probability evaluation methods; Channel models; Simulation or testing of codes
    • H03M13/03—Error detection or forward error correction by redundancy in data representation, i.e. code words containing more digits than the source words
    • H03M13/05—Error detection or forward error correction by redundancy in data representation, i.e. code words containing more digits than the source words using block codes, i.e. a predetermined number of check bits joined to a predetermined number of information bits
    • H—ELECTRICITY
    • H03—ELECTRONIC CIRCUITRY
    • H03M—CODING; DECODING; CODE CONVERSION IN GENERAL
    • H03M13/00—Coding, decoding or code conversion, for error detection or error correction; Coding theory basic assumptions; Coding bounds; Error probability evaluation methods; Channel models; Simulation or testing of codes
    • H03M13/03—Error detection or forward error correction by redundancy in data representation, i.e. code words containing more digits than the source words
    • H03M13/05—Error detection or forward error correction by redundancy in data representation, i.e. code words containing more digits than the source words using block codes, i.e. a predetermined number of check bits joined to a predetermined number of information bits
    • H03M13/11—Error detection or forward error correction by redundancy in data representation, i.e. code words containing more digits than the source words using block codes, i.e. a predetermined number of check bits joined to a predetermined number of information bits using multiple parity bits
    • H03M13/1102—Codes on graphs and decoding on graphs, e.g. low-density parity check [LDPC] codes
    • H03M13/1105—Decoding
    • H03M13/1111—Soft-decision decoding, e.g. by means of message passing or belief propagation algorithms

Landscapes

  • Engineering & Computer Science (AREA)
  • Theoretical Computer Science (AREA)
  • Physics & Mathematics (AREA)
  • Quality & Reliability (AREA)
  • General Engineering & Computer Science (AREA)
  • General Physics & Mathematics (AREA)
  • Probability & Statistics with Applications (AREA)
  • Microelectronics & Electronic Packaging (AREA)
  • Read Only Memory (AREA)
  • Techniques For Improving Reliability Of Storages (AREA)
  • Error Detection And Correction (AREA)

Abstract

Techniques de décodage de niveaux dans une mémoire non volatile. Un niveau d'une cellule dans une mémoire non volatile multi-bits est lu. Une valeur minimale du logarithme de rapport de vraisemblance (LRV) et un LRV modifié sont utilisés pour décoder le niveau, le LRV modifié dépendant d'une probabilité d'erreur de placement. Une valeur correspondant au niveau décodé est écrite dans une mémoire volatile.
PCT/US2012/045306 2011-07-01 2012-07-02 Atténuation d'erreurs dans des mémoires non volatiles Ceased WO2013006579A2 (fr)

Priority Applications (2)

Application Number Priority Date Filing Date Title
KR1020137034873A KR101576721B1 (ko) 2011-07-01 2012-07-02 비휘발성 메모리의 에러 경감
GB1323101.4A GB2505841B (en) 2011-07-01 2012-07-02 Non-volatile memory error mitigation

Applications Claiming Priority (2)

Application Number Priority Date Filing Date Title
US13/175,459 2011-07-01
US13/175,459 US8549380B2 (en) 2011-07-01 2011-07-01 Non-volatile memory error mitigation

Publications (2)

Publication Number Publication Date
WO2013006579A2 WO2013006579A2 (fr) 2013-01-10
WO2013006579A3 true WO2013006579A3 (fr) 2013-03-07

Family

ID=47391972

Family Applications (1)

Application Number Title Priority Date Filing Date
PCT/US2012/045306 Ceased WO2013006579A2 (fr) 2011-07-01 2012-07-02 Atténuation d'erreurs dans des mémoires non volatiles

Country Status (4)

Country Link
US (1) US8549380B2 (fr)
KR (1) KR101576721B1 (fr)
GB (1) GB2505841B (fr)
WO (1) WO2013006579A2 (fr)

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KR101612202B1 (ko) 2011-09-28 2016-04-12 인텔 코포레이션 동기화를 위한 메모리 컨트롤러 내의 최대 공산 디코더
US9136011B2 (en) * 2012-04-26 2015-09-15 Hgst Technologies Santa Ana, Inc. Soft information module
US9135106B2 (en) * 2012-05-22 2015-09-15 Hgst Technologies Santa Ana, Inc. Read level adjustment using soft information
JP6367562B2 (ja) * 2013-01-31 2018-08-01 エルエスアイ コーポレーション 選択的なバイナリ復号および非バイナリ復号を用いるフラッシュ・メモリ内の検出および復号
US8924824B1 (en) 2013-03-12 2014-12-30 Western Digital Technologies, Inc. Soft-decision input generation for data storage systems
US9135113B2 (en) * 2013-10-08 2015-09-15 Apple Inc. Recovery from programming failure in non-volatile memory
US9535777B2 (en) 2013-11-22 2017-01-03 Intel Corporation Defect management policies for NAND flash memory
US9396792B2 (en) 2014-02-26 2016-07-19 Seagate Technology Llc Adjusting log likelihood ratio values to compensate misplacement of read voltages
KR102247087B1 (ko) * 2014-07-08 2021-05-03 삼성전자주식회사 스토리지 장치 및 스토리지 장치의 동작 방법
US9489257B2 (en) 2014-09-28 2016-11-08 Apple Inc. Correcting soft reliability measures of storage values read from memory cells
CN105204958B (zh) * 2015-10-19 2018-03-13 哈尔滨工业大学 一种延长NAND Flash数据可靠存储时间的编码方法
US10033411B2 (en) 2015-11-20 2018-07-24 Intel Corporation Adjustable error protection for stored data
TWI684106B (zh) * 2018-09-28 2020-02-01 大陸商深圳衡宇芯片科技有限公司 訓練人工智慧更正儲存裝置的對數概度比的方法
US10891189B2 (en) * 2019-01-28 2021-01-12 Seagate Technology Llc Customized parameterization of read parameters after a decoding failure for solid state storage devices
US20250130725A1 (en) * 2023-10-18 2025-04-24 Apple Inc. Low complexity crosstalk mitigation in a nonvolatile memory

Citations (4)

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US20090199074A1 (en) * 2008-02-05 2009-08-06 Anobit Technologies Ltd. Parameter estimation based on error correction code parity check equations
WO2009116718A1 (fr) * 2008-03-17 2009-09-24 Samsung Electronics Co., Ltd. Dispositifs de mémoire et procédés de décision de données
US7656707B2 (en) * 2007-12-14 2010-02-02 Intel Corporation Systems and methods for discrete channel decoding of LDPC codes for flash memory
US20100034018A1 (en) * 2008-08-08 2010-02-11 Xueshi Yang Accessing memory using fractional reference voltages

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US20090199075A1 (en) * 2002-11-25 2009-08-06 Victor Demjanenko Array form reed-solomon implementation as an instruction set extension
US8059763B1 (en) * 2006-11-09 2011-11-15 Marvell International Ltd. Approximate soft-information computation in multi-level modulation signaling schemes
US7975209B2 (en) * 2007-03-31 2011-07-05 Sandisk Technologies Inc. Non-volatile memory with guided simulated annealing error correction control
US7876784B1 (en) * 2007-09-27 2011-01-25 Marvell International Ltd. Methods and apparatus for providing receivers for use in superposition coded multi-user systems
KR101626631B1 (ko) 2008-07-01 2016-06-01 엘에스아이 코포레이션 플래시 메모리 디바이스 기록 방법 및 시스템
US8953696B2 (en) * 2008-08-05 2015-02-10 Intel Corporation Signal decoding systems
CN102203876B (zh) 2008-09-30 2015-07-15 Lsi公司 用于存储器器件的软数据生成的方法和装置
US8301979B2 (en) * 2008-10-07 2012-10-30 Sandisk Il Ltd. Low density parity code (LDPC) decoding for memory with multiple log likelihood ratio (LLR) decoders
US8239734B1 (en) * 2008-10-15 2012-08-07 Apple Inc. Efficient data storage in storage device arrays
US20100251069A1 (en) 2009-03-31 2010-09-30 Qualcomm Incorporated Method and apparatus for efficient memory allocation for turbo decoder input with long turbo codeword
US8930791B2 (en) * 2009-12-23 2015-01-06 Intel Corporation Early stop method and apparatus for turbo decoding

Patent Citations (4)

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Publication number Priority date Publication date Assignee Title
US7656707B2 (en) * 2007-12-14 2010-02-02 Intel Corporation Systems and methods for discrete channel decoding of LDPC codes for flash memory
US20090199074A1 (en) * 2008-02-05 2009-08-06 Anobit Technologies Ltd. Parameter estimation based on error correction code parity check equations
WO2009116718A1 (fr) * 2008-03-17 2009-09-24 Samsung Electronics Co., Ltd. Dispositifs de mémoire et procédés de décision de données
US20100034018A1 (en) * 2008-08-08 2010-02-11 Xueshi Yang Accessing memory using fractional reference voltages

Also Published As

Publication number Publication date
US20130007559A1 (en) 2013-01-03
GB2505841A (en) 2014-03-12
GB2505841B (en) 2015-02-25
WO2013006579A2 (fr) 2013-01-10
US8549380B2 (en) 2013-10-01
GB201323101D0 (en) 2014-02-12
KR101576721B1 (ko) 2015-12-10
KR20140018412A (ko) 2014-02-12

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